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TEST REPORT NUMBER:379-17-12164

DATE:4-3-2012

REPORT OF TEST ON

600 Amp Surge Arrester

Statements made and data shown are, to the best of our knowledge and belief,correct and within the usual limits of commercial testing practices.

Prepared by Jeff Gieger Approved by Dan Gardner

Title .Product Engineer Title Director of Engineering

This information is transmitted subject to the following understanding and agreement: Byacceptance of this document you agree that all rights to the information contained herein, as wellas the proprietary novel features of the subject matter are reserved by Thomas and BettsCorporation and that devices embodying such features or information derived from thesedisclosures will not be manufactured by or for you, or disclosed to others without our expresswritten consent. This test report and other information are and remain the property of Thomasand Betts Corporation and are not to be copied, reproduced or disclosed to others without ourexpress written consent.

R&D Center497 Schooley’s Mountain RoadHackettstown, NJ 07840-3906Tele: 908- 852-1122 Fax: 908-813-2091

Test Report No.

379-17-12164

ADMINISTRATIVE DATA

1.0 Purpose of Test To verify the Arrester meets testing as outlined inC62.11

2.0 Manufacturer Elastimold

3.0 Type, Part or Model No. 755ESA

4.0 Drawing, Specification or Exhibit

5.0 Quantity or Items Tested 6

6.0 Security Classification of Items

7.0 Date(s) Test(s) Conducted 1=30-12 to 2-21-12, 3-30-12

8.0 Place(s) Test(s) Conducted Garwood Labs,San Clemente, Ca 1-30-12 / 2-21-12Powertech Labs, VanCouver,BC 3-30-2012

9.0 Disposition of SpecimensScrap

10.0 References

11.0 Report Distribution Product Management/ Product Engineering

Test Report No.

379-17-12164

PURPOSE:To Verify the 600 Amp Surge Arrester meets the design tests outlined in

IEEE standard C62.11.

TESTS PERORMED:Discharge Voltage Characteristic Test: Section 8.3 of C62.11-2005(Refer to attached Test Report EMC4082 Garwood Labs)

High Current Short Duration withstand Test: Section 8.12.2 of C62.11-2005(Refer to attached Test Report EMC4082 Garwood Labs)

Low Current Long Duration withstand Test: Section 8.13.2 of C62.11-2005(Refer to attached Test Report EMC4082 Garwood Labs)

Duty Cycle Test: Section 8.14 of C62.11-2005(Refer to attached Test Report EMC4082 Garwood Labs)

Dead Front Arrester Failure Mode Testing( Refer to attached Test Report 21594-26 Powertech Labs Inc.)

TEST SET-UP:Attached Garwood Lab Report: EMC4082Attached Powertech Report: 21594-26

CONCLUSION:

The 755ESA passed the following tests when test to IEEE C62.11Discharge Voltage CharacteristicsHigh Current Short Duration Withstand TestingLow Current Long Duration Withstand TestingDuty Cycle TestingTemporary Overvoltage TestingFailure Mode Testing

EMI/EMC TEST REPORT

Report Number: EMC4082 Revision: NC FOR

THOMAS & BETTS 497 Schooley’s Mtn Rd Hackettstown, NJ 07840

ON ARRESTERS

Part Number: 755ESA-6 Serial Numbers: 4-6 Part Number: 755ESA-10 Serial Numbers: 1-3 & 7-16

PERFORMED BY:

GARWOOD LABORATORIES, INC. 143 Calle Iglesia

San Clemente, CA 92672

Garwood Laboratories, Inc., does hereby certify that all inspections and tests have been performed in accordance with the documents referenced herein with exceptions as noted in this report. The results in this report pertain to the specified equipment tested. This report shall not be reproduced, except in full, without the written authorization of Garwood Laboratories, Inc.

Prepared By:

Date: March 8, 2012

STEPHEN HEYMAN, Technical Writer

Approved By:

Date: March 8, 2012

RICHARD SANCHEZ, Lab Manager, San Clemente

Approved By: For Lisa Contreras Date: March 8, 2012

LISA CONTRERAS, Quality Manager

EAR-Controlled Data - This document contains technical data whose export and re-export/retransfer is subject to control by the U.S. Department of Commerce under the Export Administration Act and the Export Administration Regulations. The Department of Commerce’s prior written approval is required for the export or re-export/retransfer of such technical data to any foreign person, foreign entity or foreign organization whether in the United States or abroad.

143 Calle Iglesia, San Clemente, CA 92672 Phone: 949-361-9189 Fax: 949-361-9597 Report No: EMC4082

Revision No: NC Page No: 2 of 67

EMI/EMC TEST REPORT FOR THOMAS & BETTS

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Document History Revision Creation Date Description Of Modifications Revised

By Approved

NC March 7, 2012 Initial release

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CLIENT INFORMATION Purchase OrderQuote Number

EUT Arrival Date

P93847 GAR004082P February 1, 2012

Company NameAddress

City, State Zip

Thomas & Betts 497 Schooley’s Mtn Rd Hackettstown, NJ 07840

Contact NamePhone

Jeff Gieger 908-813-2066 N/A

GARWOOD INFORMATION Test Laboratory

AddressCity, State, Zip Code

PhoneFax

Web Site

Garwood Laboratories, Inc. 143 Calle Iglesia San Clemente, CA 92672 (949) 361-9189 (949) 361-9597 www.garwoodlabs.com

Contact NameTitle

E-Mail Address

Richard Sanchez Laboratory Manager – San Clemente richs@garwoodlabs.com

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TABLE OF CONTENTS

PARA. DESCRIPTION PAGE

SUMMARY OF TESTS PERFORMED ............................................................................. 6 1.0 PURPOSE ............................................................................................................................... 7 2.0 PRELIMINARY INFORMATION ...................................................................................... 8

2.1 References .................................................................................................................... 8 2.2 Test Locations .............................................................................................................. 8 2.3 Test Conditions and Equipment ................................................................................... 8

3.0 DISCHARGE VOLTAGE CHARACTERISTICS TEST RESULTS ............................ 10 3.1 Discharge Voltage Characteristics Test Summary .................................................... 10 3.2 Test Photographs ........................................................................................................ 11 3.3 Discharge Voltage Characteristics Detailed Test Results .......................................... 12 3.4 Discharge Voltage Characteristics Test Log .............................................................. 24 3.5 Discharge Voltage Characteristics Equipment List ................................................... 25

4.0 HIGH CURRENT SHORT DURATION WITHSTAND TEST RESULTS .................. 26 4.1 High Current Short Duration Withstand Test Summary ............................................ 26 4.2 Test Photographs ........................................................................................................ 27 4.3 High Current Short Duration Withstand Detailed Test Results ................................. 28 4.4 High Current Short Duration Withstand Test Log ..................................................... 33 4.5 High Current Short Duration Withstand Test Equipment List .................................. 34

5.0 LOW CURRENT LONG DURATION WITHSTAND TEST RESULTS ..................... 35 5.1 Low Current Long Duration Withstand Test Summary ............................................ 35 5.2 Test Photographs ........................................................................................................ 36 5.3 Low Current Long Duration Withstand Detailed Test Results .................................. 37 5.4 Low Current Long Duration Withstand Test Log ...................................................... 41 5.5 Low Current Long Duration Withstand Test Equipment List ................................... 42

6.0 DUST CYCLE TEST RESULTS ....................................................................................... 43 6.1 Dust Cycle Test Summary ......................................................................................... 43 6.2 Test Photographs ........................................................................................................ 44 6.3 Dust Cycle Test Detailed Results .............................................................................. 45 6.4 Dust Cycle Test Log .................................................................................................. 52 6.5 Dust Cycle Test Equipment List ................................................................................ 53

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7.0 TEMPORARY OVERVOLTAGE TEST RESULTS ...................................................... 54 7.1 Temporary Overvoltage Test Summary ..................................................................... 54 7.2 Test Photographs ........................................................................................................ 55 7.3 Temporary Overvoltage Detailed Test Results .......................................................... 56 7.4 Temporary Overvoltage Test Log .............................................................................. 65 7.5 Temporary Overvoltage Test Equipment List ........................................................... 66

8.0 CONCLUSION .................................................................................................................... 67

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SUMMARY OF TESTS PERFORMED

Test Name Test Personnel Date Tested Results Discharge Voltage

Characteristics Aaron Vu February 1 & 2, 2012 Complied

High Current Short Duration Withstand Test Aaron Vu February 18 to 22, 2012 Complied

Low Current Long Duration Withstand Test Aaron Vu February 6 to 9, 2012 Complied

Dust Cycle Test Aaron Vu February 14 to 17, 2012 Complied

Temporary Overvoltage Test Aaron Vu February 21 to 23, 2012 Complied

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1.0 PURPOSE 1.1 The purpose of this report is to present the procedures employed and results obtained

while conducting the EMI/EMC tests on sixteen Arresters, Part Number: 755ESA-6, Serial Numbers: 4-6 and Part Number: 755ESA-10, Serial Numbers: 1-3 & 7-16, which is hereinafter, referred to as the equipment under test (EUT).

1.2 The sixteen Arresters were submitted by Thomas & Betts. 1.3 The EMI/EMC tests, as specified in this report were performed in accordance with

IEEE STD C62.11-2005, dated March 22, 2006. 1.4 The test result summarizes, test setup photographs, detailed test data sheets and/or

plots, and test equipment lists are included in the specific test section as numbered and summarized in the Table of Contents.

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2.0 PRELIMINARY INFORMATION

2.1 REFERENCES • IEEE STD C62.11-2005 IEEE Standard for Metal-Oxide Surge Arresters for

AC Power Circuits (>1 kV), IEEE Power Engineering Society, Sponsored by the Surge Protective Devices Committee, dated March 22, 2006.

• ANSI/NCSL Z540-1-1994 Calibration Laboratories and Measuring and Test

Equipment -- General Requirements 2.2 TEST LOCATION

Testing was performed at the Orange County facility of Garwood Laboratories, Incorporated, located at 143 Calle Iglesia, San Clemente, California, 92672. All tests were performed using the test set-ups of the relevant standards for tests performed in laboratory conditions.

2.3 TEST CONDITIONS AND EQUIPMENT 2.3.1 AMBIENT CONDITIONS:

• Temperature: +65ºF ± 20º F • Relative Humidity: Not greater than 85% • Barometric Pressure: Station (site) pressure (84kPa to 107 kPa)

2.3.2 INSTRUMENTATION AND EQUIPMENT:

2.3.2.1 Measuring and test equipment, utilized in the performance of these

tests, was calibrated in accordance with ANSI/NCSL Z540-1-1994, by Garwood Laboratories, Inc., or a commercial facility, utilizing reference standards (or interim standards) whose calibrations have been certified as being traceable to the National Institute of Standards & Technology (NIST). All reference standards utilized in the above calibration system are supported by certificates, reports, or data sheets attesting to the date, accuracy, and conditions under which the results furnished were obtained. All subordinate standards, measuring and test equipment are supported by like data, when such information is essential to achieve the accuracy control required by the procedure.

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2.3.2.2 Garwood Laboratories, Inc., attests that the commercial sources providing calibration services on the above referenced equipment, other than the NIST Standards are in fact capable of performing the required services to the satisfaction of Garwood Laboratories, Inc., Quality Assurance. Certifications of all calibrations performed are retained on file in the Garwood Laboratories, Inc., Quality Assurance Department, and are available for inspection upon request by customer representatives.

2.3.2.3 The test equipment utilized during this test program is listed following the Detailed Test Results of each applicable section.

2.3.3 TOLERANCES: Unless otherwise stated, test conditions were maintained within the tolerances specified with the documents in section 2.1.

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3.0 DISCHARGE VOLTAGE CHARACTERISTICS TEST RESULTS

3.1 DISCHARGE VOLTAGE CHARACTERISTICS TEST SUMMARY 3.1.1 The Discharge Voltage Characteristics test was conducted on three Arresters,

part number: 755ESA-10, serial numbers: 1, 2, and 3, in accordance with Section 8.3 of IEEE STD C62.11-2005, dated March 22, 2006.

3.1.2 The three Arresters were subjected to surge levels of 1,500 Amperes, 3,000

Amperes, 5,000 Amperes, 10,000 Amperes, and 20,000 Amperes. 3.1.3 The three Arresters were non-operational during testing. 3.1.4 No anomalies were observed. The three Arresters were subjected to the

prescribed conditions and did not exhibit any functional or physical degradation.

3.1.5 The three Arresters, part number: 755ESA-10, serial numbers: 1, 2, and 3, met

the requirements of the Discharge Voltage Characteristics test in accordance with Section 8.3 of IEEE STD C62.11-2005. Final disposition will be determined by the customer.

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3.2 TEST PHOTOGRAPHS

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3.3 DISCHARGE VOLTAGE CHARACTERISTICS DETAILED TEST RESULTS

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3.4 DISCHARGE VOLTAGE CHARACTERISTICS TEST LOG

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3.5 DISCHARGE VOLTAGE CHARACTERISTICS EQUIPMENT LIST

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4.0 HIGH CURRENT SHORT DURATION WITHSTAND TEST RESULTS 4.1 HIGH CURRENT SHORT DURATION WITHSTAND TEST SUMMARY

4.1.1 The High Current Short Duration Withstand test was conducted on three

Arresters, part number: 755ESA-10, serial numbers: 14, 15, and 16, in accordance with Section 8.12.2 of IEEE STD C62.11-2005, dated March 22, 2006.

4.1.2 Two pulses applied to each test sample. The Discharge voltage at the

Lightning Current (5kA) was measured before and after the test. 4.1.3 The three Arresters were non-operational during testing. 4.1.4 No anomalies were observed. The three Arresters were subjected to the

4.1.5 The three Arresters, part number: 755ESA-10, serial numbers: 14, 15, and 16,

met the requirements of the High Current Short Duration Withstand test in accordance with Section 8.12.2 of IEEE STD C62.11-2005. Final disposition will be determined by the customer.

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4.3 HIGH CURRENT SHORT DURATION WITHSTAND DETAILED TEST RESULTS

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4.4 HIGH CURRENT SHORT DURATION WITHSTAND TEST LOG

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4.5 HIGH CURRENT SHORT DURATION WITHSTAND TEST EQUIPMENT LIST

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5.0 LOW CURRENT LONG DURATION WITHSTAND TEST RESULTS

5.1 LOW CURRENT LONG DURATION WITHSTAND TEST SUMMARY 5.1.1 The Low Current Long Duration Withstand test was conducted on three

Arresters, part number: 755ESA-6, serial numbers: 4, 5, and 6, in accordance with Section 8.13.2 of IEEE STD C62.11-2005, dated March 22, 2006.

5.1.2 Twenty pulses applied to each test sample. The Discharge voltage at the

the requirements of the Low Current Long Duration Withstand test in accordance with Section 8.13.2 of IEEE STD C62.11-2005. Final disposition will be determined by the customer.

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5.3 LOW CURRENT LONG DURATION WITHSTAND DETAILED TEST RESULTS

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5.4 LOW CURRENT LONG DURATION WITHSTAND TEST LOG

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5.5 LOW CURRENT LONG DURATION WITHSTAND TEST EQUIPMENT LIST

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6.0 DUTY CYCLE TEST RESULTS

6.1 DUTY CYCLE TEST SUMMARY 6.1.1 The Duty Cycle test was conducted on three Arresters, part number: 755ESA-

10, serial numbers: 1, 2, and 3, in accordance with Section 8.14 of IEEE STD C62.11-2005, dated March 22, 2006.

6.1.2 Twenty pulses applied to each test sample. The Discharge voltage at the

the requirements of the Duty Cycle test in accordance with Section 8.14 of IEEE STD C62.11-2005. Final disposition will be determined by the customer.

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6.3 DUTY CYCLE DETAILED TEST RESULTS

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6.4 DUTY CYCLE TEST LOG

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6.5 DUTY CYCLE TEST EQUIPMENT LIST

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7.0 TEMPORARY OVERVOLTAGE TEST RESULTS

7.1 TEMPORARY OVERVOLTAGE TEST SUMMARY 7.1.1 The Temporary Overvoltage test was conducted on seven Arresters, part

number: 755ESA-10, serial numbers: 7, 8, 9, 10, 11, 12, and 13, in accordance with Section 8.15 of IEEE STD C62.11-2005, dated March 22, 2006.

3.1.2 The Discharge voltage at the Lightning Current (5kA) was measured before

and after the test. 3.1.3 The three Arresters were non-operational during testing. 3.1.4 No anomalies were observed. The seven Arresters were subjected to the

3.1.5 The seven Arresters, part number: 755ESA-10, serial numbers: 7, 8, 9, 10, 11,

12, and 13, met the requirements of the Temporary Overvoltage test in accordance with Section 8.15 of IEEE STD C62.11-2005. Final disposition will be determined by the customer.

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7.3 TEMPORARY OVERVOLTAGE DETAILED TEST RESULTS

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7.4 TEMPORARY OVERVOLTAGE TEST LOG

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7.5 TEMPORARY OVERVOLTAGE TEST EQUIPMENT LIST

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8.0 CONCLUSION

EMI/EMC Test Performed:

• Discharge Voltage Characteristics • High Current Short Duration Withstand Test • Low Current Long Duration Withstand Test • Dust Cycle Test • Temporary Overvoltage Test

Results: The sixteen Arresters, Part Number: 755ESA-6, Serial

Numbers: 4-6 and Part Number: 755ESA-10, Serial Numbers: 1-3 & 7-16, met the requirements of IEEE STD C62.11-2005, dated March 22, 2006.

Completion: The sixteen Arresters were returned to the Thomas & Betts’

representative after completion of the EMI/EMC tests.

This report shall not be reproduced except in full, without the written approval of Powertech Labs Inc.

Test Report #21594-26 Page 1 of 17

Powertech Labs Inc. • 12388 - 88th Avenue, Surrey, B.C. Canada • V3W 7R7

POWERTECH LABS INC

Test Report Nº 21594-26

SHORT CIRCUIT TESTS ON DEADFRONT ARRESTERS

MANUFACTURED BY THOMAS & BETTS CORPORATION

ABSTRACT

At the request of Thomas & Betts Corporation, Deadfront Arresters,

Catalog № 755 ESA, manufactured by Thomas & Betts, were subjected to

failure mode tests in accordance with IEEE Standard C62.11-2005,

Section 8.20. The arresters passed the tests.

Prepared by: T. Stefanski M.Sc., P. Eng. May 2012

Test Report #21594 –26

The tests were performed in accordance with Section 8.20 of IEEE Standard C62.11-2005.

Manufacturer: Thomas & Betts Corporation

497 Schooley’s Mountain Road

Hackettstown, NJ, USA

Project №: 21594-26 Test Date: 30 March 2012

Product: Elbow arresters, Units #1 to #6.

Catalog №: 755 ESA

Design Type: Deadfront

Rated Voltage: 40 kVrms, 33 kV MCOV

Test Voltage: 33 kVrms

Rated Current: 600 Arms

Tests Performed: Failure mode tests in accordance with Section 8.20 of IEEE Standard

C62.11-2005

Test Witness: Mr. Jeffrey Gieger Thomas & Betts Corporation

Remarks: Identification of the tested arresters was provided by the customer. The

arresters passed the tests.

Tested by: Reviewed by:

T. Stefanski M.Sc., P. Eng. J.A. Zawadzki M.Sc., P. Eng.

Head of High Power Lab Director, Power Engineering Labs

SUMMARY

Deadfront arresters Catalog № 755 ESA, manufactured by Thomas & Betts Corporation, were

subjected to Deadfront arrester failure mode tests at the High Power Laboratory of Powertech

Labs Inc. The tests and the assessment of the tests were performed in accordance with

Section 8.20 of IEEE Standard C62.11-2005.

The arresters were mounted on a standard load-break interface to simulate normal service

conditions. As required by Section 8.20.2 arrester samples #1 to #3 were tested at 10 kArms and

arrester samples #4 to #6 were tested at 500 Arms nominal. All tested arresters were prefaulted

with an overvoltage applied to the arrester with a low-current source.

The simplified diagram of the test setup is shown in Figure 1. The tests were performed at

33 kVrms and 60 Hz. The tests were recorded with a high speed digital video system. The test

results are shown in the following Table #1. Test waveforms are shown in Figures 2 and 7.

Photographs of the test setup and the arresters before and after the short-circuit tests are shown in

Figures 8 to 19.

All tested arresters satisfied evaluation criteria of Section 8.20.3.

TABLE 1

Results of short circuit tests performed on deadfront arresters Catalog № 755 ESA

manufactured by Thomas & Betts

Test № 1 2 3 4 5 6

Arrester № 1 2 3 4 5 6

Current kArms 10.2 10.2 10.2 0.503 0.497 0.500

Duration ms 182 184 185 319 320 323

Result - Pass

1) Pass

1) Pass Pass Pass

Note: 1)

Arresters blocks were ejected through the opening created when the grounded bottom cup was

released. No valve elements were ejected through the arrester housing.

CONCLUSION

Deadfront arresters Catalog № 755 ESA manufactured by Thomas & Betts Corporation, passed

the failure mode tests.

Tests and assessment of the tests were performed in accordance with IEEE Standard

C62.11-2005, Section 8.20.

Three arrester samples passed tests at 10 kArms and another three samples passed tests at

500 Arms.

All tested arresters satisfied the evaluation criteria of Section 8.20.3.

Source

MakeSwitch

SShunt

Tested

Arrester

Notes:

1. XS - source reactance

2. PT - Potential transformer for source voltage measurements

3. Drawing not to scale.

Figure 1. Test circuit.

-0 50 100 150 200 250ms

kAs003ih

-0 50 100 150 200 250ms

kVs003us

Current

Source

voltage

Figure 2. Test #1. Test waveforms.

-0 50 100 150 200 250ms

kAs005ih

-0 50 100 150 200 250ms

kVs005us

Current

Source

voltage

300 350 400 450 500 550ms

kAs006ih

300 350 400 450 500 550ms

kVs006us

Current

Source

voltage

700 800 900 1000 1100 1200ms

kAs008ih

700 800 900 1000 1100 1200ms

kVs008us

Current

Source

voltage

500 600 700 800 900 1000ms

kAs009ih

500 600 700 800 900 1000ms

kVs009us

Current

Source

voltage

1300 1400 1500 1600 1700 1800ms

kAs010ih

1300 1400 1500 1600 1700 1800ms

kVs010us

Current

Source

voltage

Figure 8. Components of the tested arrester, before the tests.

Figure 9. Components of the tested arrester, before the tests.

Figure 10. Overall view of test setup

Figure 11. Markings on the tested arrester.

Figure 12. Arrester #1, before Test #1

Figure 13. Arrester #1, after Test #1

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