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a profile of the experimental facilities and the expertise

accessible at/through

UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH, INDORE CENTRE

www.csr.res.in

University Campus, Khandwa Road, Indore 452001

Contents

Indore Centre Pulsed Laser Deposition (PLD) lab .................................................................................................................................1

Sputtering Lab: Thin Film Deposition Systems ..............................................................................................................2

UHV rapid thermal annealing laboratory ......................................................................................................................3

High resolution thin film X-ray diffraction lab ...............................................................................................................4

In-situ X-ray scattering lab .............................................................................................................................................5

X-ray diffraction laboratory ...........................................................................................................................................6

Low-Temperature High-Magnetic Field XRD Laboratory .......................................................................................7

Ferroelectric and piezoelectric measurements .............................................................................................................8

Novel Materials lab ........................................................................................................................................................9

Multiferroic Laboratory ...............................................................................................................................................10

Magneto-Optical Kerr Effect (MOKE) lab .....................................................................................................................11

Transmission Electron Microscopy Laboratory............................................................................................................12

SEM and EDAX Laboratory. ..........................................................................................................................................13

Scanning Probe Microscopy lab ...................................................................................................................................14

Low temperature laboratory(LTL)................................................................................................................................15

Magnetism Laboratory ................................................................................................................................................16

Magneto Transport and Calorimetry Lab ....................................................................................................................17

Electrical Transport laboratory ....................................................................................................................................18

Thermodynamics Lab ...................................................................................................................................................19

SQUIDVSM Lab.............................................................................................................................................................20

9T Magneto Transport Lab ..........................................................................................................................................21

Mossbauer spectroscopy lab .......................................................................................................................................22

Soft X-ray absorption spectroscopy (XAS) beamline @ Indus-2 synchrotron radiation source, RRCAT ......................23

Surface Physics Laboratory ..........................................................................................................................................24

Raman Laboratory .......................................................................................................................................................25

ESCA Laboratory ..........................................................................................................................................................26

Molecular Spectroscopy Laboratory ............................................................................................................................27

Sputtering laboratory: SIMS system ............................................................................................................................28

Cryoprocess Control and Instrumentation Laboratory ................................................................................................29

Electronics and Instrumentation Lab ...........................................................................................................................30

Electronics & Instrumentation Laboratory (E&I) .........................................................................................................31

Computational Modelling and Simulations Laboratory ...............................................................................................33

Sample Preparation

1

Pulsed Laser Deposition (PLD) lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/pulsed_laser_deposition.html

group members

Dr. D. M. Phase, Dr. R. J. Choudhary, Mr. Manoj Kumar

contact Dr. D. M. Phase, mob no. 9826369050, e-mail: dmphase@csr.res.in Dr. R. J. Choudhary, mob no.9893849446, e-mail: ram@csr.res.in

keywords Laser ablation, thin films, epitaxial thin films

facilities & expertise

Energetic laser pulses hit the target and evaporate material from the surface of the target and the emitted particles condense on the substrate surface. Excimer laser KrF (248 nm) is used for ablating the targets with repetition rate of 1-10Hz, maximum pulse energy 600 mJ. The technique has several advantages that include:

It preserves the stoichiometry of the target material.

Best technique to prepare epitaxial films of oxides.

Some of the phases that are difficult to obtain in conventional methods could also be stabilized.

Expertise in growing epitaxial thin films on various single crystal substrates.

Sample Preparation

2

Sputtering Lab: Thin Film Deposition Systems

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/sputter_deposition_lab.html

group members

Dr. Mukul Gupta, Mr. Layanta Behera

contact Dr. Mkul Gupta, ph no. 2463913 ext. 165; e-mail: mgupta@csr.res.in

keywords Thin film deposition, sputtering, co-sputtering, confocal sputtering, high power impulse magnetron sputtering, HiPIMS, ion beam sputtering, reactive sputtering.

facilities & expertise

Thin film deposition using dc, rf, high power impulse magnetron sputtering

from different sized magnetron target of sizes 1, 2, and 3 inch & 10 cm

10 cm for IBS. Base pressure ~210-8 mbar, operating pressure about

310-3 mbar to 210-5 mbar (IBS), substrate temperature 100-1000 K. Possibility of planar, co-sputtering. In-situ substrate cleaning by rf bias, in-situ thickness & RHEED measurements. Typical materials that have been synthesized include:

Pure elements like C, Mg, Al, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Y, Zr, Nb, Mo, Rh, Pd, Ag, Hf, Ta, W, Pt, Au, Sm, etc.

Metal nitrides e.g. FeN, Fe4N, Co4N, CoN, TiN, CrN, NbN, ScN etc.

Multilayers e.g. Co/Gd, FePt/Cu, W/C, Fe-X/57Fe-X, Ti/Ni etc.

Oxides e.g. TiO2, NiO, Fe3O4, CoO, MgO, HfO2 etc. Alloys e.g. TiNi, FeRh, FePt, CoPt, CoFeB, FePd, FeNi etc.

HiPIMS system HiPIMS with RHEED

MS system IBS system

Sample Preparation

3

UHV rapid thermal annealing laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/rta_lab.html

group members

Dr. Mukul Gupta and Mr. Layanta Behera

contact Dr. Mukul Gupta, ph no. 2463913 ext. 233; e-mail: mgupta@csr.res.in

keywords Rapid Thermal Annealing, Rapid Thermal Processing, UHV-RTA, UHV-RTP

facilities & expertise

UHV Rapid Thermal Annealing/Processing System: Ramp rate: 100 K/s,

Base pressure (process chamber): 110-9 mbar,

Base pressure (load lock chamber) 510-8 mbar, Load lock with pre-heating (to remove moisture), Maximum temperature: 1273 K, thermocouple and pyrometer for temperature measurement and control, fully automated computer controlled system for state of art rapid thermal processing/annealing

UHV-RTA system

Sample Characterisation

4

High resolution thin film X-ray diffraction lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/high_resolution_xray_diffraction_system.html

group members

Dr. V. R. Reddy, Mr. Anil Gome, Ms. Anjali Panchwanee, Ms. Zaineb Hussain, Mr. Akash Surampalli, Mr. Manik Kuila and Mr. Deepak Prajapat

contact Dr. V. R. Reddy,+917312463913-122; e-mail: vrreddy@csr.res.in

keywords X-ray reflectivity, Thin films, surface and interface roughness, film thickness, epitaxial thin films

facilities & expertise

HRXRD system equipped with - goniometer, copper x-ray source, Gobel mirror, double crystal monochromator and Lynxeye 1-D fast detector. Typical width of Si(111) peak ~26 arc.sec at 22.4o. X-ray reflectivity / scattering is the ideal technique to study thin film / surface coatings. One can obtain the information such as:

uniformity of the deposition, layer thickness (upper limit 200 nm), layer density, surface roughness etc.

could be effectively used to obtain quantitative information in terms of surface roughens of optical coatings, elements etc., to optimize the process of surface polishing, preparation etc.

quality of single crystal substrates with reciprocal space mapping measurements

Expertise in recording and analyzing various x-ray scattering data viz., x-ray reflectivity, grazing incidence x-ray diffraction, rocking curves, reciprocal space map etc., from polycrystalline and epitaxial thin films.

Sample Characterisation

5

In-situ X-ray scattering lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/insitu.html

group members

Dr. Dileep Kumar (Gupta), Ms. Sadhana Singh, Mr. Arun Singh Dev, Mr. Anup Kumar Bera, Mr. Avinash and Mr. Shahid

contact Dr. Dileep Kumar (Gupta), mob no.9407423560; e-mail: dkumar@csr.res.in

keywords Magnetic thin film, Uniaxial Magnetic anisotropy, Exchange Bias, Perpendicular magnetic anisotropy, Magneto-optical Kerr Effect (MOKE), Reflection high energy electron diffraction (RHEED), Electron beam evaporation, Four probe resistivity, thin film growth and in-situ investigation, and in-situ X-ray reflectivity (XRR)

facilities & expertise

Chamber is equipped with a facility for thin film deposition using electron beam evaporation with in-situ measurement of magneto optical Kerr effect (MOKE), reflection high energy electron diffraction (RHEED) and magneto-resistance (MR) measurements.

Whole set-up is attached with a lab x-ray source coupled with a multilayer optics, which provides a beam of sufficient collimation and Intensity to perform in-situ small angle x-ray reflectivity (XRR) experiments in the laboratory.

All the measurements in the present system can be done simultaneously during and after the deposition of the film, thus making it possible to study the evolution of magnetic, transport and structural properties with parameter such as film thickness, annealing temperature etc.

Sample Characterisation

6

X-ray diffraction laboratory

(D8 Advance XRD)

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/d8adv_xrd_lab.html

group members

Dr. Mukul Gupta and Mr. Layanta Behera

contact Dr. Mukul Gupta, ph no. 2463913 ext. 180; e-mail: mgupta@csr.res.in

keywords x-ray diffraction

facilities & expertise

D8 advance XRD system is powder diffraction system using a 9 sample holder and a 1D position sensitive detector. System uses a 2.2 kW sealed tube of Cu as x-ray source and operates in Theta-2Theta geometry. Powder, pellets and thin film samples can be measured on this system. The 1D PSD detector (LynxEye) uses 192 Si strips giving a gain of similar amount as compared to a point detector. Since this system is in heavy demand, it is suggested to apply in advance to get time for XRD measurements.

d8 advance XRD

PSD detector

9 sample holder

Sample Characterisation

7

Low-Temperature High-Magnetic Field XRD Laboratory

Location UGC DAE CSR, DAVV Campus, Indore

Web link http://www.csr.res.in/ csr_indore_facilities.html

Group members

Dr. N.P. Lalla, JEr. Preeti Bharadwaj, Ms. Poonam Yadav and Ms. Tusita Sau.

Contact Dr. N. P. Lalla, mob no. 9329233812; e-mail: nplalla@csr.res.in

Keywords Low-temperature and High-Magnetic field XRD, Field induced phase transitions, low-temperature phase transitions studies, Gobel mirror, 18 kW Rigaku Rotating anode, Parallel beam Bragg Brentano diffractometer.

Facilities & expertise

LTHM-XRD

18 kW, rotating anode, Cu K source, 8 T magnetic fields, 300-2 K sample temperature,

angular range 2 (5-115o). Structural studies, Rietveld refinement, Phase transition (with field and temperature) studies.

LTHM XRD

Sample holder

Sample Characterisation

8

Ferroelectric and piezoelectric measurements

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/pe_loop_tracer.html

group members

Dr. V. R. Reddy, Mr. Anil Gome, Ms. Anjali Panchwanee, Ms. Zaineb Hussain, Mr. Akash Surampalli, Mr. Manik Kuila and Mr. Deepak Prajapat

contact Dr. V. R. Reddy,+917312463913-122; e-mail: vrreddy@csr.res.in

keywords Ferroelectric capacitors, dielectric break down, fatigue, piezo ceramics

facilities & expertise

Ferroelectric properties (P-E) as a function of applied high electric field are carried out using Sawyer-Tower circuit principle. PE measurements as a function of temperature (4.2 – 573 K), different frequency are possible. Piezo displacement of ceramics (S-E) using Fiber-optic based non-interferometry techniques at room temperature are possible.

Ferroelectric polarization values of ceramics (4.2 – 573 K) and thin films (4.2 – 300 K)

Piezo displacement values of ferroelectric ceramics

Dielectric breakdown of ferroelectric ceramics (4.2 – 573 K)

Fatigue measurements of ferroelectric ceramics (4.2 – 573 K) Expertise in recording and analyzing the ferroelectric piezo electric properties of various ceramics. Expertise in the preparation of lead-free ferroelectric ceramics such as BaTiO3.

Sample Characterisation

9

Novel Materials lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/

group members

Dr. D.K.Shukla, Ms. Kamini Gautam, Mr. Koushik Dey, Ms. Sikha Sahu, Mr. Abinash Tripathy

contact Dr. D. K. Shukla, mob no. 9754787525; e-mail: dkshukla@csr.res.in

keywords Experimental condensed matter physics, Strongly correlated electron system, Multiferroics, Lead-free ferroelectrics, Energy harvesting, Resonant and non-resonant X-ray scattering, X-ray spectroscopy, Electrical transport measurements

facilities & expertise

Temperature dependent (80 - 525 K)

dielectric spectroscopy (4 Hz - 1 MHz). The Novel Materials Laboratory at Indore is mainly dedicated to design, growth and characterizations of multifunctional oxide materials for energy harvesting and for advanced technological applications. The emphasis is mainly on understandings of structure-property relationships. .

Sample Characterisation

10

Multiferroic Laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/multiferroics_lab.html

group members

Dr. Kiran Singh, Mr.Mohit Chandra, Mr.Satish Yadav, Ms.Sophia Sahoo

contact Dr. Kiran Singh, mob no. 9893134824; Ext. 176 (Lab.), 235 (Off.) e-mail: ksingh@csr.res.in;kpatyal@gmail.com

keywords Multiferroics, Magnetoelectric coupling, Dielectric Spectroscopy, Ferroelectrics, Piezoelectric, Phase transition

facilities & expertise

Investigating multiferroicity, magnetoelectric coupling and ferroelectric properties in different materials and understanding their correlations with magnetic and structural properties. Developed multiferroics and magnetoelectric properties including pyroelectric measurements facilities (polycrystalline, thin film and single crystal) at wide temperature (2-350K) and magnetic field (0-14T) using Agilent (Keysight) LCR meter and electrometer coupled with PPMS or any high magnetic field magnet. Dielectric Measurements (Keysight E4980A LCR): Home-made temperature dependent dielectric measurement set up Temperature Range: 80-410 K (controlled cooling and warming) Capacitance vs T; Capacitance vs frequency Frequency Range: 20 Hz to 2 MHz Sample type: Different types of samples i.e. polycrystalline, thin film and single crystal Fully computer interfaced using LabVIEW. Ferroelectric loop Measurements (Radiant Technologies): Voltage: 10kV Temperature Range: 300-450K (Home-made) Sample Type: polycrystalline, thin film and single crystal

Microscopy

11

Magneto-Optical Kerr Effect (MOKE) lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/magneto-optic_kerr_effect_system.html

group members

Dr. V. R. Reddy, Mr. Anil Gome, Ms. Anjali Panchwanee, Ms. Zaineb Hussain, Mr. Akash Surampalli, Mr. Manik Kuila and Mr. Deepak Prajapat

contact Dr. V. R. Reddy,+917312463913-122; e-mail: vrreddy@csr.res.in

keywords Kerr effect, Magnetic domains, magnetic coatings, surface magnetism, non-contact and non-destructive

facilities & expertise

Magneto-optical Kerr effect is an excellent technique to study surface magnetism of thin films down to few nm (10-9 m) thicknesses. The technique is non-contact and non-destructive. Longitudinal, Transverse and Polar geometries are possible to measure all the components of magnetization. Temperature range is 4.2 – 300 K & 300 - 600 K; Magnetic Field for In-plane: 1 Tesla (at RT) & 0.32 Tesla (for temp variation) & Out-of plane: 1 Tesla (at RT) & 100 mT (for temp variation). Objective Lens: 5x0.13, 20x0.5, 100x1.3 (oil) for RT & 50x0.75, 20x0.22 for Temp variation. Some of the potential applications of MOKE include:

Real time observation of magnetic domains with a spatial resolution of few microns

Surface magnetism of thin magnetic coatings

Study and characterization of Grain-Oriented Electrical Steel (GOES) Expertise in recording and analyzing the magnetic domains and M-H loops of various magnetic thin films, multilayers and micron size magnetic patterns.

Microscopy

12

Transmission Electron Microscopy Laboratory

Location UGC DAE CSR, DAVV Campus, Indore

Web link http://www.csr.res.in/ transmission_electron_microscope.html

Group members

Dr. N.P. Lalla, JEr. Preeti Bharadwaj, Ms. Poonam Yadav and Ms. Tusita Sau.

Contact Dr. N. P. Lalla, mob no. 9329233812; e-mail: nplalla@csr.res.in

Keywords TEM machine, Microstructure Imaging, Electron Diffraction, nano particle, TEM sample preparation, X-TEM sample preparation and imaging of thin films and multilayers.

facilities & expertise

TEM (200 kV, LaB6 side mount and bottom mount CCDs) Microstructural studies of bulk, nano and thin film/multilayer samples, Diffraction studies resulting crystallographic analysis for space group determination. Low temperature (100 K) and High temperature (1000 K) phase transition studies of bulk and thin films. EDS analysis X-TEM sample preparation and imaging of thin films and multilayers .

Microscopy

13

SEM and EDAX Laboratory.

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/scanning_electron_microscope_with_edax.html

group members

Dr. D. M. Phase, V. K. Ahire.

contact D. M. Phase. mob no. 9826369050, e-mail: dmphase@csr.res.in

keywords Maintenance, operation, Scanning electron microscope, EDS system, cold stage module, liquid nitrogen cooled EDS detector

facilities & expertise

JEOL Scanning electron microscope ( liquid nitrogen cooled EDS detector up to -196oC): JEOL Scanning electron microscope there are two imaging mode by secondary electron image detector and backscattered electron image detector for various categories of samples like metals, insulators, semiconductors and superconductors, polymers compatible with 10 -3 mbar Operation and maintenance of the facility in done by junior engineer in the laboratory .Possible applications of facility- (i) Microstructure features in condensed matter like crack, particles, and grain morphology (ii) Elemental composition in material up to one percent relative accuracy, (iii) Grain size or structure variation after heat treatment /cooling of sample up to liquid nitrogen temperature i.e. -196 0 Kelvin temperature accomplished by cold stage module attached with this microscope.

Microscopy

14

Scanning Probe Microscopy lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/lt_and_high_field_scanning_probe_microscope.html

group members

Dr. Rajeev Rawat, Mr.Sachin Kumar, Mr.Vikram singh, Mr.Saroj Kumar Mishra, Ms.Pampi Saha,

contact Dr. Rajeev Rawat, mob no. 9893025025, e-mail: rrawat@csr.res.in

keywords Surface morphology, AFM, MFM, SPM, Hall

facilities & expertise

Scanning probe microscopy measures surface property by scanning a physical probe across the sample surface. Magnetic probes like Hall probe in Scanning Hall Microscopy (SHPM) or magnetic cantilever in Magnetic Force Microscopy (MFM) provide magnetic profile of the sample surface. These magnetic images can be used for studying magnetic domain, magnetic phase separation and vortices in superconductor etc. The length scale which can be probed using these techniques is limited by the probe size which is ~1 micro-meter for SHPM and few tens of nm for MFM. The capability to vary temperature down to 5 K and magnetic field up to 9 Tesla provides an opportunity to study the evolution of co-existing magnetic states over a wide temperature and magnetic field range. Expertise in recording and analyzing the x-ray diffraction data of various materials at low temperature and high magnetic fields.

Low Temperature & High Magnetic Field

15

Low temperature laboratory(LTL)

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/quantum_design_ppms_with_resistivity_specific_heat.html

group members

Dr. V.Ganesan, Dr.G.S.Okram, Dr.R.Venkatesh, Mr.Durgesh Singh, Mrs.Manju Mishra, Mr.Krishnan, Mr.Ashish,

contact Dr. V.Ganesan, mob no. 9893342597, e-mail: vganesan@csr.res.in

keywords Low temperature, liquid helium, heat capacity, confocal microscope, phase transition, AFM, LFM

facilities & expertise

Magnetic field: 14/16 Tesla, .05/.3/4.2 K. Heat capacity of samples can be

performed from room temperature to mK range with a field of up to 16T. Magneto resistance of samples from 4 Mohm to superconducting states could be measured. The laser confocal scanning optical microscope is used to visualise the phase transition at microscopic level. AFM is used to see the surface morphology at nano meter range. Magneto resistance of various samples like metals, semiconductors and insulators could be measured with varying temperature and field.

Low Temperature & High Magnetic Field

16

Magnetism Laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/vibrating_sample_magnetometer.html

group members

Dr. Alok Banerjee

contact Dr. Alok Banerjee, mob no. 9329233812, e-mail: alok@csr.res.in

keywords VSM,SQUID,DC magnetisation, ac- susceptibility,

facilities & expertise

dc magnetization

VSM SQUID

ac- susceptibility

Low Temperature & High Magnetic Field

17

Magneto Transport and Calorimetry Lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/magnetoresistance.html

group members

Dr. Rajeev Rawat, Sachin Kumar, Vikram singh, Saroj Kumar Mishra, Pampi Saha,

contact Dr. Rajeev Rawat, mob no. 9893025025, e-mail: rrawat@csr.res.in

keywords Magneto resistance, SPM, Specific heat

facilities & expertise

First order magnetic transition, magneto caloric effect, magneto transport.

Low Temperature & High Magnetic Field

18

Electrical Transport laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/liquid_he_based_resistivity.html

group members

Dr. G. S. Okram (student: Mr. Tarachand, Mr. Vikash Sharma, Mr. Chanderbhan Chotia, Ms. Monika Saxena, Mr. Bodhoday Mukherjee)

contact Dr. G. S. Okram, Mob no. 9981484117; e-mail: okram@csr.res.in

keywords Electrical resistivity/ conductivity, thermopower/ Seebeck coefficient (all ~5-330K), liquid helium, semiconductor, superconductor, metal, chalcogenide nanoparticles, Zeta potential and particle size analyser, autotitrator, fumehood, deionised water, probe sonicator, centrifuge, vacuum oven, electronic chemical balance, temperature controller, electrometer, source-meter, source-meter, scanner.

facilities & expertise

Rho & S set ups measure the electrical resistivity/ conductivity, Seebeck coefficient/ thermopower (~5-330K) of varieties of materials including superconductors, semiconductors and even insulating ones in bulk pellet, chunk, or thin film forms. Zeta and particle size analyser measures the zeta potential produced in a selected liquid medium like deionised water to find out the surface charge state or electrical potential, dispersibility and particle size of nanoparticles. Fumehood sucks out the fumes, if any, produced during preparation of samples/ nanoparticles and others, from experimental chamber. Probe Sonicator is used for uniform distribution, disintegrate agglomerated particles into smaller or individual nanoparticles or cleaning of surfaces including those of as-prepared nanoparticles. Centrifuge is used for separation of nanoparticles dispersed in supernatant from the latter. Characterizations of (nano)materials; physics and materials science of thermoelectricity.

Low Temperature & High Magnetic Field

19

Thermodynamics Lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/low_temperature_thermal_conductivity.html

group members

Dr. A.M.Awasthi, Mr.Suresh Bharadwaj, Mr.Amit Naiya, Ms.Pooja

contact Dr.A.M.Awasthi, mob no. 9329233812, e-mail: ama@csr.res.in

keywords Thermal conductivity, DSC

facilities & expertise

It provides relaxation rates, mean free paths, scattering/dissipation

mechanisms, and identification of thermal carriers in the materials. Thermal analysis (TA) is used in Materials Science, Electronics, Polymers, Pharmaceuticals, Geology, and Quality Control. Often the information gained here is impossible to obtain by other analytical methods. TA comprises of a group of techniques monitoring a sample property vs. temp and/or time, temp being programmed. Differential Scanning Calorimeter (DSC) measures the heat flows associated with transitions/processes in materials as a function of time and temperature in a controlled atmosphere. The measurements provide both quantitative and qualitative information about physico-chemical changes that involve endo/exothermic processes, or changes in heat capacity. Expertise in thermal conductivity measurements and analysis down to liquid helium temperature with 8T magnetic field.

Low Temperature & High Magnetic Field

20

SQUIDVSM Lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/vsm_squid.html

group members

Dr. R.J.Choudhary

contact Dr. R.J.Choudhary, mob no. 9893849446, e-mail: ram@csr.res.in

keywords SQUID,VSM

facilities & expertise

Provides faster and accurate dc-magnetization measurements, especially for thin films. In the SQUID VSM measurement technique, the sample vibrates at a known frequency and SQUID detection system is employed for signal detection. Expertise in magnetic measurements of materials especially thin films.

Low Temperature & High Magnetic Field

21

9T Magneto Transport Lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/

group members

Dr. Archana Lakhani, Mr. Rudra Prasad Jena, Mr. Sumesh Rana, Mr. Mukesh Dasaundhi, Ms. Sonali Baral and Ms. Indu Rajput.

contact Dr. Archana Lakhani, Mob no. 9981686570; e-mail: archana@csr.res.in, and archnalakhani@gmail.com

keywords Condensed Matter Physics, Magneto transport measurements, Low temperature, Magnetism, Strongly correlated electron systems, Heusler alloys, topological Insulators.

facilities & expertise

A 9T PPPMS for Resistivity, Magnetoresistance and Hall effect measurements Temperature range of 2-350 K Magnetic field up to 9 Tesla Bulk and thin film samples Expertise in transport and magnetic measurements at Low temperature and High fields. Studies of strongly correlated electron systems, Functional magnetic materials like Heusler alloys and topological Insulators.

Low Temperature & High Magnetic Field

22

Mossbauer spectroscopy lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/mossbauer_spectroscopy.html

group members

Dr. V. R. Reddy, Mr. Anil Gome, Ms. Anjali Panchwanee, Ms. Zaineb Hussain, Mr. Akash Surampalli, Mr. Manik Kuila and Mr. Deepak Prajapat

contact Dr. V. R. Reddy, +917312463913-122; e-mail: vrreddy@csr.res.in

keywords Mossbauer spectroscopy, Local probe of magnetism, soft ferrites

facilities & expertise

The Mossbauer spectroscopy is a very useful method in studying the structural and magnetic environment of Mossbauer atoms on a nearest-neighbor length scale allowing the analysis of that particular atom containing phases (local probe). Measurements can be done for Fe and Sn based compounds at low temperatures and high magnetic fields (4.2 K & 7 Tesla), high temperatures (1000 K), in reflection geometry for the characterization of surface coatings etc. Some of the potential applications of Mossbauer spectroscopy include:

Study of Fe- based magnetic materials

Fe based pharmaceuticals (to know the quantitative information about the Fe oxidation states, co-ordination chemistry etc.)

study of float glasses (using 119Sn Mossbauer spectroscopy to find out quantitatively the percentage of Sn2+ an Sn4+)

Expertise in recording and analyzing the Mossbauer data of different materials / samples.

-10 -5 0 5 10

0.90

0.95

1.00

Rel T

ransm

issi

on

Velocity (mm/s)

Data Fit

Fe3+

:27.2%

Fe2+

:43.8%

Fe2+

:14.5%

Fe2+

:14.5%

Spectroscopy

23

Soft X-ray absorption spectroscopy (XAS) beamline @ Indus-2 synchrotron radiation source, RRCAT

location Indus-2, RRCAT, Indore

web link http://www.csr.res.in/bl1_indus2_lab.html

group members

Dr. D. M. Phase, Dr. Mukul Gupta, Mr. A. Wadikar, Mr. Rakesh Sah and Mr. Ravindra Bhimgade

contact Dr. D. M. Phase, ph. no.: 2442501, email: dmphase@csr.res.in Dr. Mukul Gupta, ph no. 2442501, e-mail: mgupta@csr.res.in

keywords soft x-ray absorption, XAS, x-ray absorption near edge spectroscopy

facilities & expertise

Source -Bending magnet of Indus-2, BL01, Energy: 100-1200 eV, Beam size:

~0.5 mm × 0.5 mm, Acceptance: 5 mrad (h) 1.5 mrad (v), Polarization selection : 0.2 mm polarization selection aperture, Monochroator: 3 Spherical gratings, Experiments: XAS, (XMCD*,XMLD* -under development) , multi-sample holder; in-situ sample cleaning with ion source; in-situ film deposition (test); UHV chamber – operational, Soft XAS measurements down to 10 K and with H=2 T (soon); magnet up to 2 Tesla and CCR down to 10 K tested. Absorption edges: Low Z elements: Be, B, C, N, O, F, Ne, Na…..K edges 3d transition metals: Cr, Mn, … L-edges 4d transition metals: Mo,.., Ru ,… M-edges, 5d transition metals: Re, Os, Ir, … N-edges Rare earths (4f-metals): Eu, Gd, Tb, … M-edges, N-edges

Spectroscopy

24

Surface Physics Laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/

group members

Dr. Sudipta Roy Barman

contact Dr. Sudipta Roy Barman, mob no. 98263 36110; e-mail: barman@csr.res.in

keywords Photoelectron spectroscopy, inverse photoemission spectroscopy, scanning tunnelling microscopy

facilities & expertise

Photoelectron spectrometer, inverse photoemission spectroscopy, scanning tunnelling microscopy. Study of states above Fermi level (LUMO states), Dispersion of unoccupied bands

PES/IPS system

Knudsen cell

Spectroscopy

25

Raman Laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/micro_raman_spectrometer.html

group members

Dr. Vasant Sathe, Mr. Ajay Kumar Rathore, Mr. Gaurav Sharma, Mr. Shekhar Tyagi, Mr. Vivek Dwij, Mr. Binoy Krishna De

contact Dr. Vasant Sathe, 0731-2762267 Ext: 232; e-mail: vasant@csr.res.in

keywords Raman spectroscopy, Micro Raman facility, Raman microscopy, pressure and temperature dependent Raman spectroscopy

facilities & expertise

Raman spectroscopy is widely used to study the phonons in solids, liquids and gases. Our micro-Raman spectrometer has been extensively used by many researchers across the country for characterization of nano particles, films, solids, liquids and identifying different phases and to elucidate physical phenomena like, spin-phonon, electron-phonon, orbital-lattice interactions and phase transitions. The results from this system contributed in nearly 150 publications in international journals.

Micro Raman system from Jobin Yvon Horibra LABRAM-HR 800 visible (400 - 1100 nm)

Raman spectra can be recorded from 50 cm-1 to 4000 cm-1 of Raman shift.

Excitation Laser Sources - He-Ne 632.8 nm and Diode Laser 473 nm

Optics: high stability confocal Microscope for Micro Raman 10x, 50x, 100x objective lens. The laser can be focused on to a spot from ~1micron to 5 microns by choosing suitable objective lens.

Polarization analysis of samples can be carried out.

Automated XY sample stage for Raman mapping. Sample can be scanned with an accuracy of 1 micron in lateral direction i.e. Raman imaging of smooth surfaces is possible.

A lateral resolution of 1 micron and an axial resolution of 2 microns can be achieved with confocal optics

A white light with a video camera for viewing sample. Sample can be viewed optically using microscope and Raman spectra can be recorded on any desired portion of sample.

Dispersive geometry

600 and 1800 lines/mm gratings - Detector: CCD detector

Spectral Resolution of the order of 1 cm-1 Low temperature measurements upto 4 K

Spectroscopy

26

ESCA Laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/electron_spectroscopy_for_chemical_analysis.html

group members

V. Ganesan, U.P. Deshpande

contact V. Ganesan, e-mail: vganesan@csr.res.in; U. P. Deshpande, email: uday@csr.res.in

keywords Photoelectron Spectroscopy, oxidation state, core level, Valance band, Auger peak, XPS, UPS, AES, Sputter cleaning.

facilities & expertise

X-ray photoelectron spectroscopy (XPS) using twin anode AlK and MgK x-rays, Auger electron spectroscopy (AES) using 0-5 KeV electron energy, ultraviolet photoelectron spectroscopy (UPS) using He-I and He-II source, low and high temperature attachment 10-1050 K, Sample scraper and cleaver, sample surface cleaning using Ar ion sputtering (0-3 KeV).

XPS system

Spectroscopy

27

Molecular Spectroscopy Laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/uv_visible_spectroscopy.html http://www.csr.res.in/ftir.html

group members

V. Ganesan, U.P. Deshpande

contact V. Ganesan, e-mail: vganesan@csr.res.in; U. P. Deshpande, email: uday@csr.res.in

Keywords

facilities & expertise

Absorbance, transmittance, specular reflectance, diffuse reflectance, band gap, Vibrational bands, modes, functional groups.

UV-Vis-NIR spectrometer: wavelength range 175 to 3300 nm. Attachments: Transmittance, diffuse reflectance for powder samples,

specular reflectance with 8 to 68 angle of incidence, variable temperature 95-875 K in diffuse reflectance, 95-500 K in transmittance. FTIR spectrometer: wavenumber range: 50 to 50000 cm-1. Attachments:

transmittance, diffuse reflectance, specular reflectance at 30 and 80, high temperature high pressure (HTHP) cell 1000 psi, 1070 K, Attenuated Total Reflectance (ATR).

FTIR Spectrometer

UV-Vis-NIR Spectrometer

Spectroscopy

28

Sputtering laboratory: SIMS system

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/sims_lab.html

group members

Dr. Mukul Gupta and Mr. Layanta Behera

contact Dr. Mukul Gupta, ph no. 2463913 ext. 165; e-mail: mgupta@csr.res.in

keywords secondary ion mass spectroscopy, SIMS, depth profiling, static SIMS, dynamic SIMS, SIMS imaging, secondary neutral mass spectroscopy, SNMS

facilities & expertise

Gas and Cs primary ion guns, energy range 2-5 keV, quadruple mass analyzer, mass range 1-300 amu possibilities for static and dynamic sims/snms, sims imaging base pressure 2×10-10 mbar, working pressure 1×10-8 mbar, load lock system to mount up to 10 samples

SIMS System

SIMS depth profile of a 2nm 57Fe layer sandwhiched

between 100 nm Fe layers

0 50 100 150 200 250

103

104

105

106

Co

un

ts

Depth (nm)

54Fe

57Fe

30Si

Fe(100nm)/57

Fe(2nm)/Fe100(nm)/Si(Sub.)

Cryogenics

29

Cryoprocess Control and Instrumentation Laboratory

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/cryogenic_lab.html

group members

Er. M. P. Saravanan, Mr. N. Vijaya Kumar, Mr. Sanjay Shrivastava, Mr. Vinod Savaner, Mr. S. Thilagaraj Kumar, Mr. Sushil Kumar Sharma

contact Er. M. P. Saravanan, Tel. +917312463913,Ext:323; e-mail: sar@csr.res.in

keywords Maintenance, operation, liquid helium plant, liquid nitrogen plants, helium recovery system, cooling the superconducting magnets, cooling through evaporative cooling below 4K, Helium leak detection, Microcontroller based Pressure and Level Monitoring/Control systems, SCADA based systems automation

facilities & expertise

Liquid nitrogen plant (supply of liquid nitrogen -196oC): There are two LN2 plants operated by the group on a round the clock basis producing approximately 200,000 lites of LN2 per annum. Possible applications of LN2- (i) shrink fittings, (ii) expansion joints, (iii) cryo surgery, (iv) cryo treatment of tools, (v) cryo grinding etc Liquid helium plant (supply of liquid helium -269oC): There are two LHe plants operated by the group on a round the clock basis producing approximately 50,000 litres of LHe per annum. LHe may be used as refrigerant for MRI machines. Helium leak detection facility: Leak detection of pressure and vacuum vessels up to 1x10-7 mbar lt/sec

Liquid Nitrogen Plant

Liquid Helium Plant

Electronics & Instrumentation

30

Electronics and Instrumentation Lab

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/electronics_and_instrumentation_laboratory.html

group members

Mr.Sadhan Chandra Das

contact Mr.S.C.Das, mob no: 9329846723, e-mail: scdas@csr.res.in

keywords electron beam assisted annealing in ultrahigh vacuum system Control/Maintenance of WAN/LAN networks, Installation/ Management of the Internet and Website, Configuring Firewall with the Unified Threat Management, Maintenance of integrated CCTV based security system for the two campuses of the institute. Design and development of Measurement/ Control instruments for research laboratories; instruments with computer interfacings. Typical uncommon fault finding, repairing and restoring of advanced modern instruments.

facilities & expertise

facilities & expertise

Plasma jet at atmospheric pressure

IEEE Xplore Electronic ISBN: 978-9-3805-4421-2

UV lamp power supply for uv photo-elctron spectroscopy DOI: 10.1103/PhysRevB.77.195103

Electronics & Instrumentation

31

Electronics & Instrumentation Laboratory (E&I)

location UGC DAE CSR, DAVV Campus, Indore

web link http://www.csr.res.in/electronics_and_instrumentation_laboratory.html http://www.csr.res.in/elec_and_inst_lab_nkghodke.html

group members Nandkishor Ghodke

contact Nandkishor Ghodke, nand@csr.res.in, 9407119616

keywords Techno Know How/ Application Oriented Technical Solution/ Design/ Development/ Scientific Research Instrumentation/ Test & Measuring Instrumentation/ Interfacing/ Automation/ USB/ Serial/ Parallel/ GPIB/ Industrial Process & Control Automation/ Prototype/ Hardware/ PCB Layout & Artwork/ Software/ Programming/ C/ C++/ VB/ LabVIEW/ Electronics & Instrumentation/ Data Acquisition/ Vendor Development/ Technical Documentation/ Specification Configuration/ Circuit Diagram Drafting/ Trouble Shooting/ Rectification/ Fault Finding.

facilities & expertise

PCCS: Programmable Constant Current Sources (PCCS4A) for

Inductive Load⬆

Demo Software (LabVIEW) ➡

Electronics & Instrumentation

32

Interfacing / Automation /Process

Control / Relay / Prototype⬆

Demo Software (LabVIEW) ➡

Stepper Motor Controller / Driver /

2-Phase / Prototype ⬆

(5-Phase Stepper Motor Controller / Driver is also available)

Demo Software (LabVIEW) ➡

Piezo Wideband High Power MOSFET Driver / Amplifier

64Vpp@1A, 1MHz

Piezo Driver: Calibration Set-up

Design & Development of Scientific Research Instruments. Design & Development of Test & Measuring Instruments. Techno Know How / Application Oriented Technical Solutions. Interfacing & Automation: USB / Serial / Parallel / GPIB. Industrial Process & Control Automation. Hardware: PCB: Layout Design / Artwork / Mechanical Design. Software: Programming in C / C++ / VB / LabVIEW. Prototype: Assembly / Wiring / Testing / Calibration / Installation. Vendor Development & Technical Documentation. Trouble Shooting / Rectification / Fault Finding

Computational Methods

33

Computational Modelling and Simulations Laboratory

location UGC-DAE CSR, DAVV Campus, Indore

web link https://rajamaniraghu.wixsite.com/cmsl

group members

Dr. Rajamani Raghunathan

contact Dr. Rajamani, Tel.: +91-731-2463913 (Ext.: 174) Mobile no. 90821 91005; e-mail: rajamani@csr.res.in

keywords Computational design of functional materials; Magnetism in molecules and materials; Materials for energy and sensing applications.

facilities & expertise

Expertise: Many-body model Hamiltonians; first-principles modelling and Molecular Dynamics (MD) simulations.