Post on 05-Jan-2016
transcript
Apr, 2014
TE-EPC-CCE Radiation Tests2012-2013
slawosz.uznanski@cern.ch
CERN
slawosz.uznanski@cern.ch CERN 2013
Outline
2
Summary
1. H4IRRAD 20121. May: ADS1281, DS18B20, DS2401, SPLargeUHD92. Jul: MAX5541, MIC373023. Nov: MIC37302, FGClite
2. ANDI Batch Tester 1. ADS1271B (PSI – Apr/Oct 2013, TRIUMF – Dec 2013)2. ADS1281 (PSI –Oct 2013)3. MAX5541 (PSI –Oct 2013)
3. HIDE Batch Tester1. R1LV1616R Renesas SRAM (PSI – Oct 2013, TRIUMF – Dec 2013)2. A3P250, A3P400, A3P1000, A3PE1500 (PSI –Oct 2013)3. FGClite Analogue Filter Design (PSI –Oct 2013)
RadWG Oct 2012
CERN
slawosz.uznanski@cern.ch CERN 2013
H4IRRAD Nov 2012 – MIC37302
3
Components Identification and test setup description
Results
DUT name DUT type Test Type
Samples tested
Package Date code Lot code
MIC37302 Low-dropout voltage
regulator
TID, SEE 15 S-Pak-5 unknown unknown
Test time (min)
Outp
ut V
olta
ge (V
)
-1.5
-1.49
-1.48
-1.47
-1.46
-1.45
-1.44
0 5000 10000 15000 20000 25000 30000
DUT1 1V5DUT2 1V5DUT3 1V5DUT4 1V5DUT5 1V5
Test time (min)
Outp
ut V
olta
ge (V
)
-3.3
-3.27
-3.24
-3.21
-3.18
-3.15
0 5000 10000 15000 20000 25000 30000
DUT1 3V3DUT2 3V3DUT3 3V3DUT4 3V3DUT5 3V3
Test time (min)
Outp
ut V
olta
ge (V
)
-1.25
-1.2
-1.15
-1.1
-1.05
-1
0 5000 10000 15000 20000 25000 30000
DUT1 1V5 1.24ADUT2 1V5 0.91ADUT3 1V5 0.38ADUT4 1V5 0.64ADUT5 1V5 0.83A
Low cost COTS adjustable low-dropout voltage regulator (RadDIM project)SEE and TID test for different output voltages 1V5 and 3V3 and different loads 0.1-1.2A
No SEL detected: SEL cross-section upper level (90%) < 6.6e-13 cm2
Voltage out degradation as a function of dose (irradiated up to ~90Gy/component): 0.360mV/Gy (1V5, 183mA of load)0.920mV/Gy (3V3, 100mA of load)0.160mV/Gy (1V5, variable load)
PSI tests Sep 2013 done by EN-STI confirmed these results(no SEL detected, regulation ok until 300Gy, enable pin fails at 150Gy)
CERN
slawosz.uznanski@cern.ch CERN 2013
H4IRRAD Nov 2012 – FGClite Prototype
4
FGCµlite
GPI
B co
mm
unic
tatio
n Power SupplyAgilent 3633A
Power+measurement
GatewayKontron cfc-866-rfip8
≈ 40m
≈ 40m
H4IRRAD AreaHall
Test Barrack
Power SupplyAgilent 3633A
Power SupplyAgilent 3633A
PCABPC11505
Ethernet TN
Ethernet GPN
0887 R-R001 outlet 0808/01
0887 R-001 outlet 0708/02
5V
15V
-15V
Test setup
No SEL detected: SEL cross-section upper level (90%) < 1.6e-11 cm2
No radiation-induced effect were identified. No observable TID power consuption increase.System has shown significant level of noise, Spikes in measurements >550ppm (spec <50ppm), not correlated with the
beam (we suspect the EMC-induced noise)
Results
CERN
slawosz.uznanski@cern.ch CERN 2013
CERN
slawosz.uznanski@cern.ch 5Monthly 2013
ANDI Batch Tester (1/4)
1. ADS12812. MAX55413. ADS1271B4. Others…
1. Generates input for DUTs2. Analyses the outputs from DUTs3. Actively performs the power cycle (SEL)4. Records all measurements from DUTs
Allows the real time data analysis during the test
PCTEPC23114
LOW RADIATION AREA
4x Cards16x DUTs
3x digital
FGC2H4IRRAD tests (boot program)
8x Det +/-15V8x Ctrl4x Det +5V
1x analogue
TARGET AREA
~12m
FPGAMicroSemi P3A1500
SEL Detector2x Bipolar +/-15V
SEL DetectorUnipolar +5V
PSUAgilent E3631A
PSUAgilent E3631A
DataLoggerAgilent 34970A
Mlt-Lnk & Buffer Card
~20m
CONTROL
8x +5V, 8x +15V, 8x -15V
1x Analogue IN (DAC)
8x Digital OUT (M0/M1)
4x Digital IN (RST)
3 x digital IN (DATA/CS/CLK)
RS232
RS232
RS232 DataLoggerAgilent 34970A
DB-25 #1
DB-25 #2
coax
DB-25 #2
coax
PC ABPC11505
4x Cards
EthernetLocal
CERN
slawosz.uznanski@cern.ch CERN 2013 6
PSI Apr/Oct 2013 & TRIUMF Dec 2013 – ADS1271B (2/4)
Context
Test results
SEL study and influence of high-Z materials on SEL cross-section Significance of cross-section increase with energy
Margins to be applied on the 230MeV data when assessing the error rate in the LHC
1E-13
1E-12
0 100 200 300 400 500
SEL c
ross
-sec
tion
(cm
2/de
v)
Energy (MeV)
XS
XS LL
XS UL
Measurable SEL cross-section in range 1e-13 to 1e-12 cm2
Increase of the cross-section with energy attributed to tungstenSEL current between 50 to 300mA (16mA nominal)
TID limit >2kGy
CERN
slawosz.uznanski@cern.ch CERN 2013 7
PSI Oct 2013 – ADS1281 (3/4)
Context
Test results
High precision delta-sigma ADC for FGCliteCERN Batch yielded from 3 Si wafers (4500 IC)
0.00E+00
1.00E+00
2.00E+00
3.00E+00
4.00E+00
0.00E+00 2.00E+02 4.00E+02 6.00E+02 8.00E+02 1.00E+03 1.20E+03
Curr
ent c
onsu
mpti
on (A
)
Dose (Gy)
DUT1 I_AVDD (A)
DUT1 I_DVDD (A)
DUT2 I_AVDD (A)
DUT2 I_DVDD (A)
DUT3 I_AVDD (A)
DUT3 I_DVDD (A)
DUT4 I_AVDD (A)
DUT4 I_DVDD (A)
No SEL detected: SEL cross-section upper level (90%) < 7.2e-14 cm2
Modulator SEFI cross-section = 8.1e-13 cm2 TID limit > 1kGy
Test Set DUT name DUT type Test Type
Samples tested Package Date/lot code
#1 ADS1281x4
DUT 1 High-Res
ADC SEL, SEFI
4x packaged TSSOP-24 CERN reference
#2 ADS1281x4
DUT 2 High-Res
ADC SEL, SEFI
4x packaged TSSOP-24 CERN reference
#3 ADS1281x4
DUT 3 High-Res
ADC SEL, SEFI
4x packaged TSSOP-24 CERN reference
#4 ADS1281x4
DUT 4 High-Res
ADC SEL, SEFI
4x packaged TSSOP-24 CERN reference
CERN
slawosz.uznanski@cern.ch CERN 2013 8
Test Set DUT name DUT type Test Type
Samples tested Package Date/lot code
#1 MAX5541x4
DUT 1 DAC
SEL, SEFI
4x packaged 8-SO 1592369
#2 MAX5541x4
DUT 2 DAC
SEL, SEFI
4x packaged 8-SO 1592369
#3 MAX5541x4
DUT 3 DAC
SEL, SEFI
4x packaged 8-SO 1592369
#4 MAX5541x4
DUT 4 DAC
SEL, SEFI
4x packaged 8-SO 1592369
PSI Oct 2013 – MAX5541 (4/4)
Context
Test results
16-bit DAC for FGClite
No SEL detected: SEL cross-section upper level (90%) < 7.2e-14 cm2
No SEFI detected: SEFI cross-section upper level (90%) < 7.2e-14 cm2
TID limit > 1kGy-1.20E-02
-1.00E-02
-8.00E-03
-6.00E-03
-4.00E-03
-2.00E-03
0.00E+000 200 400 600 800 1000 1200
Curr
ent c
onsu
mpti
on (A
)
Dose (Gy)
120 (VDC)
210 (VDC)
220 (VDC)
110 (VDC)
CERN
slawosz.uznanski@cern.ch CERN 2013
CERN
slawosz.uznanski@cern.ch 9Monthly 2013
HIDE Batch Tester (1/4)
1. FPGA2. Memories (SRAM)3. Others…
1. Generates input for DUTs2. Analyses the outputs from DUTs3. Actively performs the power cycle (SEL)4. Records all measurements from DUTs
Allows the real time data analysis during the test
PCTEPC23114
LOW RADIATION AREA
TCC8x Det +/-15V8x Ctrl4x Det +5V
TARGET AREA
~12m
FPGAMicroSemi P3A1500
SEL Detector2x Bipolar +/-15V
SEL DetectorUnipolar +5V
PSUAgilent E3631A
PSUAgilent E3631A
DataLoggerAgilent 34970A
Mlt-Lnk & Buffer Card
~20m
CONTROL
8x +5V, 8x +15V, 8x -15V
4x digital coax (RS485)
RS232
RS232 DataLoggerAgilent 34970A
PC ABPC11505
4x Cards
EthernetLocal
8x DUTManchesterLocal power
CERN
slawosz.uznanski@cern.ch CERN 2013 10
PSI Apr/Oct 2013 & TRIUMF Dec 2013 R1LV1616R (2/4)
Context
Test results
16-Mbit SRAM memory for the FGCliteTFT + DRAM bit cell architecture
No SEL possible, very low SEU cross-section
1E-19
1E-18
1E-17
1E-16
0 200 400 600
SEU
cro
ss-s
ectio
n (c
m2/
bit)
Energy (MeV)
TRIUMF CERN
PSI CERN
IUCF NASA
1.00E-18
1.00E-17
1.00E-16
1.00E-15
1.00E-14
50 500 5000
Prot
on S
EU c
ross
-sec
tion
(cm
²/bi
t)
Energy (MeV)
ExperimentalSim:Std. SRAMSim:TFTSim:TFT+DRAM230MeV
Test Set DUT name DUT type
Test Type Package Lot Date Code (MSC batch)
#1 R1LV1616R
DUT 1 SRAM SEU/MBU 48-pin
TSOP 1343
(2013430001)
#2 R1LV1616R
DUT 2 SRAM SEU/MBU 48-pin
TSOP 1328
(2013280004)
#3 R1LV1616R
DUT 3 SRAM SEU/MBU 48-pin
TSOP 1343
(2013430002)
#4 R1LV1616R
DUT 4 SRAM SEU/MBU 48-pin
TSOP 1343
(2013430002)
#5 R1LV1616R
DUT 5 SRAM SEU/MBU 48-pin
TSOP 1328
(2013280003)
#6 R1LV1616R
DUT 6 SRAM SEU/MBU 48-pin
TSOP 1343
(2013430001)
CERN
slawosz.uznanski@cern.ch CERN 2013 11
PSI Oct 2013 ProASIC-3 (3/4)
Context
Test results
Well-known ProASIC-3 radiation data (A3PE3000L published by ESA)Different FPGA sizes = Same radiation response?FF/block RAM SEU cross-section measurement
FF tests: 90% of all FF in each FPGA was used (shift registers)Test pattern influence <30% (all‘0’ most sensitive, all‘1’ least sensitive)
Size influence <20% (250 most sensitive, A3PE1500 least sensitive)Frequency influence <15% (1kHz most sensitive, 1Hz least sensitive)
DUT FPGA Package
1 A3P250 VQ100
2 A3P250 VQ100
3 A3P250 VQ100
4 A3P250 VQ100
5 A3P400 PQ208
6 A3P400 PQ208
7 A3P1000 PQ208
8 A3PE1500 PQ208
1.00E-14
1.00E-13
0 50 100 150 200 250
SEU
cro
ss-s
ectio
n (c
m2/
bit)
Proton Energy (MeV)
PSI RAM CERNPSI RAM ESAPSI FF CERNPSI FF ESA
RAM tests: 100% of all blocks in each FPGA was usedTest pattern influence <40% (all‘0’ most sensitive, all‘1’ least sensitive) Size influence <30% (250 most sensitive, A3PE1500 least sensitive)
CERN
slawosz.uznanski@cern.ch CERN 2013 12
FGClite Analogue Filter (4/4)
Context
DUT number Size DesignRun1
1e11 p/cm2Run2
5e12 p/cm2DUT0 1000 noTMRDUT1 1000 TMRDUT2 1500E noTMR 1DUT3 1500E TMRDUT4 400 noTMR 1 2DUT5 400 TMRDUT6 400 noTMR 4DUT7 400 TMR 1 2
Design Logic Cells Usage (A3P400)3 CHs 3,937 42.72 %
3 CHs w/ TMR 6,642 72.07 %
Test results
We observed errors with TMR : Test setup limitation, TMR failing due to latching of SET, TID limit of components (400-500Gy)Further irradiations needed!