Post on 07-Apr-2018
transcript
8/3/2019 Electron Micros Coup
1/23
Abadan Institute of 4/28/12
Click to edit Master subtitle style4/28/12
Abadan Institute of Technology
Failure Analysis
instruments:electron microscope
Abadan institute of technologyOctober 2011
Instructor:
Dr. Ashrafi
Presented by:
Elahe Shekari
8/3/2019 Electron Micros Coup
2/23
Abadan Institute of 4/28/124/28/12
Agenda
Secondary electron image
Back scatter electron image
Energy dispersive spectrum (EDS)
Wavelength dispersive spectrum (WDS)
22
8/3/2019 Electron Micros Coup
3/23
Abadan Institute of 4/28/124/28/12
Agenda
Secondary electron image
Back scatter electron image
Energy dispersive spectrum (EDS)
Wavelength dispersive spectrum (WDS)
33
8/3/2019 Electron Micros Coup
4/23
Abadan Institute of 4/28/12
What are SE and BSE?
Secondary electrons are low energy electrons formedby inelastic scattering and have energy of less than50eV.
Backscattered (BS)electrons are high-energyelectrons (>50 eV) fromthe primary incident
beam that are ejectedback out from thesamples.
44
http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit28/3/2019 Electron Micros Coup
5/23
Abadan Institute of 4/28/12
SE image
The low energy ofthese electrons allowsthem to be collected
easily. This is achievedby placing a positivelybiased grill on thefront of the SE
detector, which ispositioned off to oneside of the specimen.
The major influence on-
55
Failure analysis
of a riverwatercirculatingpump shaft
http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit28/3/2019 Electron Micros Coup
6/23
Abadan Institute of 4/28/124/28/12
Agenda
Secondary electron image
Back scatter electron image
Energy dispersive spectrum (EDS)
Wavelength dispersive spectrum (WDS)
66
8/3/2019 Electron Micros Coup
7/23Abadan Institute of 4/28/12
BSE image
These BSE are used toproduce a differentkind of image. Such
an image usescontrast to tell usabout the averageatomic number of the
sample.The higher the
average atomic
number, the more
77
8/3/2019 Electron Micros Coup
8/23Abadan Institute of 4/28/12
SE and BSE images88
FOR YBCOHTSC
8/3/2019 Electron Micros Coup
9/23Abadan Institute of 4/28/12
4/28/12
Agenda
Secondary electron image
Back scatter electron image
Energy dispersive spectrum (EDS)
Wavelength dispersive spectrum (WDS)
99
8/3/2019 Electron Micros Coup
10/23Abadan Institute of 4/28/12
Energy Dispersive Analysis
Energy dispersive analysis, also knownas EDS, is a technique used to identifythe elemental composition of a sample
or small area of interest on the sample.
1010
8/3/2019 Electron Micros Coup
11/23Abadan Institute of 4/28/12
1111
During EDS, a sample is exposed toan electron beam inside a scanningelectron microscope (SEM).
These electrons collide with theelectrons within the sample, causingsome of them to be knocked out of
their orbits.The vacated positions are filled by
higher energy electrons which emit
x-rays in the process.
EDS
8/3/2019 Electron Micros Coup
12/23Abadan Institute of 4/28/12
1212
EDS analysis
By analyzing the emitted x-rays, the elementalcomposition of the sample can be determined.
8/3/2019 Electron Micros Coup
13/23Abadan Institute of 4/28/12
4/28/12
Agenda
Secondary electron image
Back scatter electron image
Energy dispersive spectrum (EDS)
Wavelength dispersive spectrum (WDS)
1313
8/3/2019 Electron Micros Coup
14/23
Abadan Institute of 4/28/12
WDS
Of the two X-raymicroanalysistechniques for
qualitative analysis,Wavelength DispersiveSpectrometry (WDS)analysis is distinctly
different from energydispersive (EDS)analysis.
WDS identifies the
1414
8/3/2019 Electron Micros Coup
15/23
Abadan Institute of 4/28/12
1515
WDS analysis
8/3/2019 Electron Micros Coup
16/23
Abadan Institute of 4/28/12
EDS is first used forelement identification,
for fast analysis of theentire spectrum
Using EDS, all of theenergies of the
characteristic X-raysincident on the detectorare measuredsimultaneously and dataacquisition is therefore
very rapid across theentire s ectrum
WDS is used to solvevarious spectralproblems describedelsewhere in thismodule
the resolution of anWDS detector isconsiderably betterthan that of a EDSspectrometer.
1616
EDS WDS
The comparison between EDSand WSD?
8/3/2019 Electron Micros Coup
17/23
Abadan Institute of 4/28/12
1717
The presence of tungsten in the ED spectrum(yellow) is masked by the Si K lines while the
two are clearly distinguishable in the WD
spectrum (blue).
The comparison between ESD andWSD
8/3/2019 Electron Micros Coup
18/23
Abadan Institute of 4/28/12
1818
The comparison between ESD andWSD
EDS and
WDS in PbS
8/3/2019 Electron Micros Coup
19/23
Abadan Institute of 4/28/12
1919
FOR YBCO HTSC
SE, BSE and EDS mappingmodes
8/3/2019 Electron Micros Coup
20/23
Abadan Institute of 4/28/12
2020
EDS mapping and lineanalysis
8/3/2019 Electron Micros Coup
21/23
Abadan Institute of 4/28/12
21
21 Severin, Kenneth P., 2004, Energy
Dispersive Spectrometry of CommonRock Forming Minerals. Kluwer Academic
Publishers, 225 p.--Highly recommendedreference book of representative EDSspectra of the rock-forming minerals, aswell as practical tips for spectral
acquisition and interpretation. Goldstein, J. (2003) Scanning electron
microscopy and x-ray microanalysis.
Kluwer Adacemic/Plenum Pulbishers, 689
References
8/3/2019 Electron Micros Coup
22/23
Abadan Institute of 4/28/12
22
22 Petroglyph--An atlas of images using electronmicroscope, backscattered electron images,element maps, energy dispersive
x-ray spectra, and petrographic microscope ( Thissite may be offline. ) -- Eric Chrisensen, Brigham
Young University
http://serc.carleton.edu/research_education/geochemsheets/eds.html
http://www.x-raymicroanalysis.com/x-ray-microanalysis-explained/pages/tutorial2/comparisonedswds.htm
http://www.ehow.com/about_5147224_resolution-
References
http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit28/3/2019 Electron Micros Coup
23/23
Abadan Institute of 4/28/12
23
23 Krinsley, David H., 1998, Backscattered scanningelectron microscopy and image analysis ofsediments and sedimentary rocks,CambridgeUniversity Press
M Lancha, M Serrano, J Lapea, D Gmez-Briceo ,Failure analysis of a river watercirculating pump shaft
http://www.tau.ac.il/institutes/wamrc/Zahava/ZahavaSEMExamples.pdf
References
http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit2