electron microscopes re-visioned

15201 NW Greenbrier Parkway, Suite C-7 • Beaverton, OR 97006

+1 503 616 4710 • info@tssmicroscopy.com

Make:JEOL

Model:2100F

Condition:TobeRemanufactured

Availability:InStock

Warranty/Installation:Yes

Location:USAInquiry:5036164710

JEOL 2100F TEM

JEM2100FTransmissionElectronMicroscope200kVmaximumacceleratingvoltage·ElectronGunAssembly:SchottkyFEGEmission-Zr/W·SpecimenAnti-contaminationTrap·HighTiltAnalyticalPolePiece(HTP)·Point-to-pointresolution:0.25nm,stagetiltangle:+/-45

degreesforX,+/-30degreesforYtiltaxes,EDSsolidangle:0.13sr

·Cryoholder·DoubletiltHolder(Lowbackground)·STEM(ScaningTransmissionElectronMicroscope)·ImageResolution:1.5nmwithHTP(BrightFieldSTEMat

200kV)·LowMag:100xto15,000x·HighMag:20,000xto15,000,000x·JEOLbrightfielddetector·Gatanhighangleannulardarkfield(HAADF)detector·GatanTridiempostcolumnparalleldetectionEELSwith

2kx2kPIXELULTRASCAN1000CCDCAMERA·NANOTRACEEDSDETECTORWITHNORVARWINDOWfor

detectionoflightelements,30mmstraightSi(Li)crystal