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CERN Div./Group or Supplier/Contractor Document No.
TE/MSC/MDT
EDMS Document No.
1264529
Date: 2013-01-29
the
Large Hadron Collider project
CERN CH-1211 Geneva 23 Switzerland
Design and test guidelines
TE-MSC group
GUIDELINES FOR THE INSULATION DESIGN
AND ELECTRICAL TEST OF SUPERCONDUCTING ACCELERATOR
MAGNETS DURING DESIGN ASSEMBLY AND TEST PHASE.
Abstract
This document summarises the guidelines to be taken into account dimensioning the
insulation for a new superconducting magnet and it provides a template for the test
sequence to be applied. The test sequence and the acceptance values can be modified
by the project engineers, but reasons for the change shall be clearly motivated by
written in the QC documents and they shall guarantee the magnets are compatible with
LHC quality standards and test levels (i.e. EDMS 788197).
Prepared by :
P. Fessia G. Kirby J.C. Perez
F.O. Pincot
Checked by :
L. Grand-Clement R. Lopez
D. Tommasini
R. Mompo G. Dangelo
K. Dahlerup-Petersen
Approved by :
Amalia Ballarino
Davide Tommasini
Frederic Savary
Gijs De Rijk
Jean Philippe Tock
Marta Bajko
Paolo Fessia
Stephan Russenschuck
Vittorio Parma Ludovic Grand-
Clement
Roberto Lopez
Juan Carlos Perez
Glyn Kirby
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History of Changes
Rev. No. Date Pages Description of Changes
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Table of Contents
1. INTRODUCTION ....................................................................................... 5
2. AVAILABLE TECHNICAL DOCUMENTATION .............................................. 5
3. DEFINITIONS OF KEY PARAMETERS AND APPROACH TO THE TEST PLAN5 3.1.1 MAXIMUM MAGNET QUENCH VOLTAGE (Vq) ........................................................... 5 3.1.2 EXTRACTION VOLTAGE (Vee) ................................................................................ 6 3.1.3 MAXIMUM VOLTAGE REACHED DURING A QUENCH (Veeq) ........................................ 6 3.1.4 VOLTAGE REACHED DURING GENERAL POWER ABORT (VGPA) .................................. 6 3.1.5 MAXIMUM REFERENCE VOLTAGE (Vmaxr) ................................................................ 7 3.1.6 DESIGN WITHSTAND VOLTAGE (Vds) .................................................................... 7 3.1.7 TEST VOLTAGE FOR CIRCUIT QUALIFICATION (Vtql) ................................................ 7 3.1.8 TEST VOLTAGE FOR MAGNET FINAL QUALIFICATION (Vtaf) ...................................... 7 3.1.9 TEST VOLTAGE FOR MAGNET DURING ASSEMBLY .................................................. 8 3.1.10 VOLTAGE COMPARISONS .................................................................................. 9
4. DISCHARGE TEST (VdisBA, VdisAC) ............................................................. 10
4.1 OBSERVATIONS CONCERNING THE INTER-LAYER VOLTAGE .......................... 10
5. QUENCH HEATERS (Q.H.) TEST .............................................................. 10
5.1 Q.H.: HIGH VOLTAGE TEST TO THE COIL .................................................... 10
5.2 Q.H.: DISCHARGE TEST ............................................................................ 12
6. USEFUL INFORMATIONS ........................................................................ 13
7. TEST SEQUENCE .................................................................................... 16
7.1 LEGEND AND TERMINOLOGY ..................................................................... 16
7.2 LAW FOR VOLTAGE REDUCTION ALONG THE TEST CHAIN. ............................ 16
8. IDENTIFICATION CODES FOR TEST EQUIPEMENT ................................. 17
9. OTHER REMARKS ................................................................................... 17
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1. INTRODUCTION
This document summarises
1) The reference value of breakdown voltage to be taken into account in designing
new magnet insulations/components/assembly (according to the LHC
specifications)
2) The sequence of tests to be adopted to perform the electrical qualification of the
magnets during its assembly. This document provides reference test voltages.
2. AVAILABLE TECHNICAL DOCUMENTATION
The following documents have to be taken as valid specification till new documents are
published:
1) Engineering Specification “GENERAL PARAMETERS FOR ENERGY
EXTRACTION OF THE LHC SUPERCONDUCTING CIRCUITS”. LHC-DQ-ES-
0001, EDMS 338035
2) Engineering specification “Voltage Withstand Levels for Electrical
Insulation Tests on Components and Bus Bar Cross Sections for the
Different LHC Machine Circuits”, LHC-PM-ES-0001, EDMS 90327
3) Engineering Specification GENERAL PARAMETERS FOR EQUIPMENT
INSTALLED IN THE LHC”, LHC-PM-ES-0002, EDMS 100513
4) Test Procedure “ELQA QUALIFICATION OF THE SUPERCONDUCTING
CIRCUITS DURING HARDWARE COMMISSIONNING”, LHC-DE-TP-0007 rev
1.2, EDMS 788197
3. DEFINITIONS OF KEY PARAMETERS AND APPROACH TO THE
TEST PLAN
Figure 1 provides a schematic how to deduce the various voltage levels described in
this chapter
3.1.1 MAXIMUM MAGNET QUENCH VOLTAGE (Vq)
Vq is the maximum voltage developed in the superconducting magnet during quench.
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Figure 1: schematic of the High Voltage test chain
3.1.2 EXTRACTION VOLTAGE (Vee)
When a quench is detected, the QPS system will open the circuit interlock loop and the
energy extraction switches. The maximum voltage seen in the circuit versus ground
will be at the extremity of the electric chain Vee.
3.1.3 MAXIMUM VOLTAGE REACHED DURING A QUENCH (Veeq)
Veeq=Vq+Vee. If there is no energy extraction Veeq=Vq. If not known Vee is to be
assumed to be equal to 450 V. This value is based on present LHC design practice.
3.1.4 VOLTAGE REACHED DURING GENERAL POWER ABORT (VGPA)
In the case of a global power abort, all the circuits of a powering sector are switched
off almost simultaneously and the energy extraction (ee) is activated in the entire
subsector. The maximum voltage, between two circuits running along the same path,
is reached at the bus-bars and may be the sum of the individual voltages for both
circuits Vee. In this document it is assumed that the voltage rises during a magnet
quench is not propagated through the bus-bar lines and it is limited to the magnet.
Vq • Starting point: quench voltage
Vmaxr
• Maximum reference voltage: assumed to be Vq plus 450 V+150 V (difference voltage between circuits/and or extraction voltage)
Vtql • Voltage for test qualification in liquid helium =1.2 Vmaxr
Vtqgas • Voltage for test qualification in He gas = 0.5 X Vtql
Vtfdel • Voltage in air equivalent to Vtqgas: Vtfdel = 3 X Vtqgas
ΔVcryo, ΔVcold
• Difference in voltage between 1st and last test during cold test and cryostating =0.1 X Vmaxr
Vtaf • voltage for final assembly test= Vtfdel+ ΔVcryo+ ΔVcold
Vtai • Voltage for initial assembly test= Vtaf+ 0.2 X Vmaxr
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This voltage can be calculated directly by the ultimate current and the value of the ee
resistors. The max voltage reached during the General Power Abort is referred here as
VGPA. As for magnets under development it is not possible to determine the proximity
of other circuits, it is proposed here to increase the Veeq of an average constant value
(ΔVGPA). According to the present LHC experience (Table 6, page 23 of EDMS 788197)
in the worst cases the increase of test voltage, due the proximity of another circuit,
are of 200 V for the MQ circuit and more frequently 120 V for many N line circuits.
Therefore, on the base of the data reported in the previous mentioned document, it is
proposed here to assume constant value ΔVGPA equal to 150 V.
3.1.5 MAXIMUM REFERENCE VOLTAGE (Vmaxr)
The maximum reference voltage (Vmaxr) is therefore Vmaxr= Vq+Vee+ ΔVGPA . If the Vee
and ΔVGPA are not known, applying the assumptions proposed in the previous
paragraphs we get Vmaxr= Vq + 450 V+150 V. It has to be underlined that in this
scenario no faults of the QPS or of extraction system are taken into consideration,
faults that could bring to a further increase of the maximum reference voltage.
3.1.6 DESIGN WITHSTAND VOLTAGE (Vds)
The Design Withstand Voltage Vds is the reference minimum breakdown voltage for
which all magnet components, the magnets and their assembly (including later on
cryostat) shall be designed for. It shall be assumed that the voltage Vds shall be
withstood in pure He atmosphere, pressure 1 bar absolute and temperature 75 K.
The temperature has been assumed looking at which typical temperature the
maximum voltage is reached. Two cases (MQXC and HQ, Glyn Kirby and E. Todesco
private communications) have been taken into account. They provide a window
between 60 K and 90 K.
Single components shall be possibly tested in respect with this design value.
Vds=3 X Vmaxr +500 V (EDMS 90327)
In practice a single component (and not a magnet) to withstand Vds, in the above
mentioned He conditions, shall be able to withstand a breakdown voltage in air equal
to Vdsair=3.5 X Vds. Vdsair is therefore Design Withstand Voltage in Air
3.1.7 TEST VOLTAGE FOR CIRCUIT QUALIFICATION (Vtql)
Vtql is the test voltage chosen as test voltage in the document LHC-DE-TP-0007 for the
LHC circuit qualification in the step TP4-E (liquid Helium). Vtql=1.2 X Vmaxr
For the TP4-B and the TP4-D (He gas 5.5 bar 293 K and 80 K respectively) the test
voltage in gas (Vtqgas) is Vtqgas≤0.5 X Vtql. In order to be conservative we assume here
Vtqgas=0.5 X Vtql (coefficient applied for the presently installed Low Beta Quads)
3.1.8 TEST VOLTAGE FOR MAGNET FINAL QUALIFICATION (Vtaf)
As the magnets are tested in air, for their final qualification at the end of assembly,
(before delivery to cryostating and later to the cold test station), the final voltage test
after assembly Vtaf (Voltage test assembly final) shall be at least as severe, in air
condition, as the most severe test performed during the LHC qualification. The most
severe test in the machine is performed at a pressure of 5.5 bar pure He gas at 293 K.
The ratio between the dielectric strength of the He in that condition and air at 1 bar
293 K is 3.
As consequence Vtaf>=3 X Vtqgas.
It shall be taken into account that
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1) after final magnet assembly the unit is submitted to cold test and possibly
cryostating
2) it is normal procedure to have the voltage test performed step after step at
decreasing voltage
In this document 3 main range of voltage are specified:
a) Vtai and Vtaf are respectively the initial test voltage during magnet assembly and
the final test voltage during magnet assembly. Vtai> Vtaf
b) ΔVcryo is the range of voltage between the first and the last voltage test during
cryostating
c) ΔVcold is the range of voltage between the first and the last voltage test during cold
testing
We propose to assume
1) Vtaf=3 X Vtqgas + ΔVcryo + ΔVcold
2) ΔVcryo = ΔVcold = 10% Vmaxr
3.1.9 TEST VOLTAGE FOR MAGNET DURING ASSEMBLY
During magnet assembly several high voltage tests are repeated and they shall be
performed at decreasing voltage. It is assumed that the 1st initial assembly test is
performed at Vtai= Vtaf+20% Vmaxr
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3.1.10 VOLTAGE COMPARISONS
The following lines demonstrate that the test voltage is just a fraction of the design
voltage in air
Vtaf= 3 X Vtqgas + ΔVcryo + ΔVcold= 3X 0.5 X Vtql + ΔVcryo + ΔVcold =3 X 0.5 X 1.2 X Vmaxr +
0.1 Vmaxr + 0.1 Vmaxr =
= 2 Vmaxr= 2 X Vdsair/10.5 -2 X 500/3≈ 0.19X Vdsair -340
Vtai= Vtaf+0.2 Vmaxr= 2.2 X Vmaxr= 0.21 X Vdsair-340
Here below a table for few selected cases for Vq and the conceptual scheme to
extrapolate the various test voltages. Test voltages are underlined.
Vq Vq Vq Vq Vq Vq
250 V 350 V 500 V 1000 V 1500 V 2000 V
Vee 450 450 450 450 450 450
Veeq 700 800 950 1450 1950 2450
Vmaxr 850 950 1100 1600 2100 2600
Vtql 1020 1140 1320 1920 2520 3120
Vtqgas 510 570 660 960 1260 1560
Vtfdel 1530 1710 1980 2880 3780 4680
ΔVcryo,
ΔVcold 85 95 110 160 210 260
Vtaf 1700 1900 2200 3200 4200 5200
Vtai 1870 2090 2420 3520 4620 5720
Table I: Magnet key and test voltages computed in function of different Vq
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4. DISCHARGE TEST (VdisBA, VdisAC)
The aim of the discharge test is to locate possible inter-turn weaknesses. It has to be
taken into account that, under the effect of the magnetic forces, the coil turns will be
compressed. This could lead to the deterioration into short of weak insulations spots
with large induced damages (see case of MB 3004).
In this document we propose to use the following indicative test voltage per coil turn
1) Single coil, pole and any tests before mechanical assembly of the coils:
a. 120 V/Turn if NturnX120V/Turn= VdisBA <5KV.
b. 5kV/Nturn if NturnX120V/Turn>5KV then we assume a global discharge
voltage of VdisBA=5 kV.
2) Pole before collaring with structure around poles and poles after collaring:
a. 100 V/Turn if NturnX100V/Turn= VdisAC <4.25KV.
b. 4.25 kV/Nturn if NturnX100V/Turn=VdisAC >4.25KV
It is important to perform coil tests at VdisAC also in the previous stages and before
applying VdisBA. This will allow recording the discharge curves, useful for the
understanding of later tests.
The test voltage decreases from step 1 to step 2 in order to perform tests at
decreasing voltages during the magnet assembly history.
4.1 OBSERVATIONS CONCERNING THE INTER-LAYER VOLTAGE
In a typical multi-layers cosΘ pole the coils are counter wounded. This brings in
contacts, near the pole mid plane, the first and the last turn of the winding. The
voltage difference during the discharge test in this point will be equal to the full
discharge voltage (2 layers pole). This implies that, when poles are tested, it is
mandatory to verify that all the components that are foreseen in the magnet
assembly, to insulate the inner from the outer layer, are already assembled and if not,
to add an extra layer of insulation during the test. Reducing the discharge voltage is
not an option because it would reduce the inter-turn test voltage making the test
useless (Chart IV: air dielectric). It has to be remarked that during quench the same
turns will also see the maximum voltage difference Vq. If between the layers there is
not extra insulation foreseen in the design the discharge test shall be reduced to a
value comparable to Vq scaled to air: typically Vdis=3.5 (ratio dielectric air/He gas)X
1.2 (safety factor) X Vq. i.e. for Vq=250 V, Vdis= 1kV. Max value 5 kV
5. QUENCH HEATERS (Q.H.) TEST
5.1 Q.H.: HIGH VOLTAGE TEST TO THE COIL
According to the document EDMS 788197 the voltage for the High voltage test of the
Quench Heaters vs. coil on liquid helium Vmic-c is given by
Vmic-c=1.2X(Vq+900V)
In this test coil and ground are shortened together
The Vmic-c value is limited for practical reasons to a max level of 2 kV
The indicated 900 V is the voltage provided by standard LHC Q.H. power supply (The
voltage seen by a quench heater in case of a discharge is +/- 450 V, but in case of
failure of a DQHDS, it could be 900 V and this value it has been assumed as reference
for the tests).
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For the warm test in He atmosphere, 5.5 bar, 293 K the value Vmic-w is limited to 600 V
and generally is 1/3 of the Vmic-c.
The test value in air shall therefore be 3.5 time the test value Vmic-w. This value is
reported below as VQH-coil.
Following the same scheme applied before this test voltage shall be increased in order
to cover the full assembly chain. Following this scheme it is possible to build the table
here below where (starting from the last test and coming back on the magnet
assembly line)
VtfQHdel : is the test voltage applied to the cryo-assembly before delivery to the
installation. It is assumed to be equal to VQH-coil
ΔVcryo, ΔVcold: these are the difference in voltage between the 1st and the last test
during cryostating and cold test respectively. They are assumed to be 10% of the
voltage applied by the Q.H. power supply and therefore 90 V
VtQHaf: this is the voltage to be applied for the last test along the magnet assembly
chain
VtQHai: this is the voltage to be applied for the 1st test along the magnet assembly
chain (VtQHaf- VtQHai is twice the ΔVcryo or ΔVcold therefore equal to 180 V)
Vq Vq Vq Vq Vq Vq
250 V 350 V 500 V 1000 V 1500 V 2000 V
Vmic-c 1380 1500 1680 2000 2000 2000
Vmic-w 455 495 554 660 660 660
VQH-coil 1366 1485 1663 1980 1980 1980
VtfQHdel 1366 1485 1663 1980 1980 1980
ΔVcryo, ΔVcold 90 90 90 90 90 90
VtQHaf 1546 1665 1843 2160 2160 2160
VtQHai 1726 1845 2023 2340 2340 2340
Table II: Quench Heaters Key and test voltages computed in function of different Vq
We assume
ΔVcryo= ΔVcold= 0.5X(VtQHaf- VtQHai)=10%(900V)
In addition we propose to assume the design voltage and the component test voltage for the quench heaters as it follows:
1) Maximum test voltage at 5.5 bar 293 K: 660 V
2) Equivalent voltage to be withstood at 1 bar 75 K: 1000 V
3) Equivalent voltage to be withstood in air 1 bar: 3500 V (3.5 X 1000 V)
4) Design voltage in air: 2 times the voltage to be withstood in air: 7000 V
5) Component test voltage 5000 V
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5.2 Q.H.: DISCHARGE TEST
The Q.H shall be discharged with the same power supply as foreseen for the future
magnet operation. If the foreseen discharge voltage is higher than 900 V to be added
to the Vq then the voltage test of point 5.1 shall be accordingly increased.
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6. USEFUL INFORMATIONS
Useful information to compare He dielectric behaviours between room and cryogenic
temperature and in function of pressure are reported in the following attached charts
I, II and III. These charts are derived from the curve of the He breakdown voltage in
function of the product density by distance [“Paschen Curve of Helium” J. Gerhold
T.W. Dakin Electra, Vol. 52, pages 80-86 1977]. Then the density is derived in
function temperature and pressure from the He phase diagram, no approximation of
the ideal gas equation is used here. In the following table please find the He gas
density in a selected series of temperature and pressure pairs. In green the area
where the ideal gas approximation would be applicable.
Density [g/cm^3]
T [K] P 0.1 bar P 0.5 bar P 1 bar P 2 bar P 5 bar P 6 bar P 10 bar
4.5 1.09 6.00 14.23
10 0.48 2.40 4.95 10.20 28.00 34.00 61.00
20 0.24 1.20 2.40 4.82 12.11 14.55 24.28
75 0.06 0.32 0.64 1.28 3.18 3.81 6.30
275 0.02 0.09 0.17 0.35 0.87 1.05 1.74
300 0.02 0.08 0.16 0.32 0.80 0.96 1.60
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Chart I Helium breakdown voltage vs. electrode distance at 275 K and with varying pressure
Chart II Helium breakdown voltage vs. electrode distance at 10 K and with varying pressure
100
1000
10000
0.001 0.01 0.1 1 10 100 1000
Bre
kad
wo
wn
vo
ltag
e [
V]
Electrode distance [mm]
Helium Breakdown voltage in function of electrode distance at 275 K and varying pressure
275 K P 0.5 bar
275 K P 0.1 bar
275 K P 1 bar
275 K P 2 bar
275 K P 5 bar
275 K 6 bar
275 K 10 bar
P 293 1 bar other source
100
1000
10000
0.00001 0.0001 0.001 0.01 0.1 1 10 100
Bre
kad
wo
wn
vo
ltag
e [V
]
Electrode distance [mm]
Helium Breakdown voltage in function of electrode distance at 10 K and varying pressure
10 K P 0.1 bar
10 K P 0.5 bar
10 K P 1 bar
10 K P 2 bar
10 K P 5 bar
10 K 6 bar
10 K 10 bar
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Chart III Helium breakdown voltage vs. electrode distance at 75 K and with varying
pressure
Chart IV Helium and Air breakdown voltage vs. electrode distance in selected conditions
100
1000
10000
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
Bre
kad
wo
wn
vo
ltag
e [
V]
Electrode distance [mm]
Helium Breakdown voltage in function of electrode distance at 75 K and varying pressure
75 K P 0.1 bar
75 K P 0.5 bar
75 K P 1 bar
75 K P 2 bar
75 K P 5 bar
75 K 6 bar
75 K 10 bar
100
1000
10000
0.001 0.01 0.1 1 10 100
Bre
kad
wo
wn
vo
ltag
e [
V]
Electrode distance [mm]
Helium and Air Breakdown voltage in function of electrode distance in few selected pressure and temperature conditions
275 K P 1 bar
75 K P 1 bar
275 K P 5 bar
275 K AIR 1 bar
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7. TEST SEQUENCE
7.1 LEGEND AND TERMINOLOGY
1) TEST CODE : an identification code for the test
2) TITLE : Test short name
3) TYPE : Type of measure
4) OBJECT : component tested
SH = spot heater, BSH = beam simulation heater, QH = quench heater, TT =
temperature sensor
5) SHORT DESCRIPTION: short description of test if necessary
6) PRIORITY of test :
a. Mandatory Q.C. [MQC]: the test shall be performed
b. Optional [Opt] : the test can be performed
c. Investigative [Inv]: the test shall be performed as preparatory test of a
mandatory Q.C.
7) TEST CONDITION: i.e. voltage. Two values will be given a set value and a formula
to compute the voltage according to previous philosophy above
8) TIME: duration of test if necessary
9) TOLERANCE: values inside which the test is considered to be ok
10) EQUIPMENT: equipment used for the test
7.2 LAW FOR VOLTAGE REDUCTION ALONG THE TEST CHAIN.
Values shall be rounded to the nearest upper decade
Vtaf : voltage for final assembly test
Vtai : Voltage for initial assembly test
Vtaf < Vtai
N : number of test serie
n є [0;N]
During a test serie Vtestn = Vtai - n(Vtai-Vtaf)/N = Ttestn-1 - (Vtai-Vtaf)/N
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8. IDENTIFICATION CODES FOR TEST EQUIPEMENT
Electrical test Equipment
A DMM as KEITHLEY 2000 multimeter
B Stabilized DC current supply as Agilent 6631B
C MEGGER BM21 / MEGGER S1-1052
D Oscilloscope as Tektronix TDS 3014
E LCR Meter 879B BK Precision / equipment F
F LCR meter as HP 4263B LCR meter
G SEITZ Impulse tester
H EFACEC Heater discharge Power Supply
I Labview data transfert software
J Press of Young modulus
K Tektronix probe P6015A
L Connection cable and/or specific rack
9. OTHER REMARKS
1) RDC: resistance measurement in direct current shall be always reported at values
scaled to 20º C
2) All instrumentation tests are submitted to the verification that the instrumentation
to be tested (i.e. temperature probes) would withstand the test current and
voltages
CERN Div./Group or Supplier/Contractor Document No.
TE/MSC/MDT
EDMS Document No.
1264529
Date: 2013-01-29
the
Large Hadron Collider project
CERN CH-1211 Geneva 23 Switzerland
Summary of tests and of voltages to be applied
type of magnet
test phase code
Coil/Pole/Aperture Insulation and
dielectric to ground
Q.H. Insulation and dielectric to pole and to ground together
Insulation/dielectric instrumentation
Pole Discharge Q.H. discharge
Serie
s o
f te
st
Nb-T
i
L 200 V NA >=1 kV 120V/turn 5kVmax NA
BYM NA VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A
AYM NA VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A
P 200 V VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A
Nb
3S
n
PBR 50 V VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A
PAR 50 V VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A
PBI 50 V VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A
PAIM VT[i] Table I VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A
PAI VT[i] Table I VQH[i] Table II >=1 kV 120V/turn 5kVmax 900V 80A
PHE NA From VQH[i] /10 to VQH[i] /3 >=1 kV 120V/turn 5kVmax 900V 80A
All
ma
gnets
BC VT[i] Table I VQH[i] Table II >=1 kV 100V/turn 4.25kVmax 900V 80A
APC VT[i] Table I VQH[i] Table II >=1 kV 100V/turn 4.25kVmax 900V 80A
AC VT[i] Table I VQH[i] Table II >=1 kV 100V/turn 4.25kVmax 900V 80A
AI VT[i] Table I VQH[i] Table II >=1 kV 100V/turn 4.25kVmax 900V 80A
FINAL Vtaf Table I VtQHaf Table II >=1 kV 100V/turn 4.25kVmax 900V 80A
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L : Test of single layer, Nb-Ti, after curing splice version - L
BYM : Test of pole : 2 layers, Nb-Ti, splice version, before Young modulus – BYM
AYM : Test of pole : 2 layers, Nb-Ti, splice version, after Young modulus – AYM
P : Test of pole : 1 layer test, Nb-Ti, no splice version – P
PBR : Test of pole : Nb3Sn, before reaction – PBR
PAR : Test of pole : Nb3Sn, after reaction – PAR
PBI : Test of pole : Nb3Sn, before impregnation – PBI
PAIM : Test of pole : Nb3Sn, after impregnation still in the mould - PAIM
PAI : Test of pole : Nb3Sn, after impregnation still out of the mould – PAI
PHE : Test of pole : Nb3Sn, after impregnation still out of the mould 0.1 bar He – PHE
BC : Test of collared coil before collaring or pre-collaring – BC
APC : Test of collared coil after pre-collaring – APC
AC : Test of collared coil after collaring – AC
AI : Test of the magnet after interconnection – AI
FINAL : Final Test of the magnet before delivery – FINAL
VQH[i]: Test voltage for the High Voltage test of the Quench Heater to be applied to the ith test
VT[i] : Test voltage for the High Voltage test of the windings to be applied to the ith test
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Test of single layer, Nb-Ti, after curing splice version - L
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
Lop1 Coil to copper wedge
Insulation Coil Insulation coil to copper wedge Opt 200 V 60 sec C
L1 Coil to ground Insulation Coil Insulation of the coil in its curing mould to ground
MQC 200 V 60 sec > 1000 MΩ C
L2 RDC Resistance Coil Resistance measurement of coil MQC 6A NA Ref coil +/- 3% A, B
L2_XXXX RDC Resistance Resistance measurement of instrumentation
MQC 1A / 4 wires NA Reference value for future measurements
A, B
L3 Inductance Inductance Coil Coil inductance test MQC 100 Hz, 1 KHz,
10 KHz
NA L[ref coil] +/- 2% E
L4 Coil inter-turn discharge
Discharge Coil Discharge test to identify turn to turn problems
Inv 30 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
Inv 60 V/turn
MQC 120 V/turn
Lop2 Discharge under stress SP
Discharge Coil Discharge while putting the straight part in an insulation mould at P=80MPa
Opt 120 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
Lop3 Discharge under stress ends
Discharge Coil Discharge while putting the ends in an insulation mould at P=80MPa decreasing to 0 MPa over the heads
Opt 120 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
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Test of pole : 2 layers, Nb-Ti, splice version, Before Young Modulus measurements - BYM
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
BYM 1 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled
BYM 2_XXXX RDC instrumentation
Resistance RDC of each component MQC 1A / 4 wires NA Compare to previous component measurement +/- 2%
A, B
BYM 3 Inductance Inductance Pole Pole inductance measurement MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref pole] +/- 2% E
BYM 4 Dielectric Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VQH[i] /2 30 sec 5 min
>1000 MΩ; < (2 × VQH[i]/900)μA
C
MQC VQH[i] >500 MΩ; < (5 × VQH[i]/900) μA
BYM 5 Coil discharge
test
Discharge Pole Discharge test to identify turn to
turn problems
INV 30 V 10 puls Ref coil τ +/- 1% D, G, I, K
INV 60 V
MQC 120 V
BYM 6 Q.H. discharge Discharge QH To be applied if Q.H are between
coils and already assembled
INV 450 V (or 40A) Compare initial I and
tau with reference
D, H, I
MQC 900 V (or 80A)
BYM 7 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled
BYM 8 Dielectric Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VQH[i]/2 5 min < (2 × VQH[i]/900) μA C
MQC VQH[i] < (5 × VQH[i]/900) μA
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Test of pole : 2 layers, Nb-Ti, splice version, after Young modulus - AYM
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
AYM1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Inner layer +outer layer +/- 2%
A, B
AYM2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled
AYM3_XXXX RDC instrumentation
Resistance RDC of each component MQC 1A / 4 wires NA Compare to previous component measurement +/- 2%
A, B
AYM4 Inductance Inductance Pole Pole inductance measurement MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref pole] +/- 2% E
AYM5 Dielectric Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VQH[i] /2 30 sec 5 min
>1000 MΩ; < (2 × VQH[i]/900) μA
C
MQC VQH[i] >500 MΩ; < (5 × VQH[i]/900) μA
AYM6 Coil discharge test
Discharge Pole Discharge test to identify turn to turn problems
INV 30 V 10 puls Ref coil τ +/- 1% D, G, I, K
INV 60 V
MQC 120 V
AYM7 Q.H. discharge Discharge QH To be applied if Q.H are between coils and already assembled
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
AYM8 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled
AYM9 Dielectric Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VQH[i]/2 5 min < (2 × VQH[i]/900) μA C
MQC VQH[i] < (5 × VQH[i]/900) μA
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Test of pole : 1 layer test, Nb-Ti, no splice version - P
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
Pop1 Pole to copper wedge
Insulation Pole Insulation pole to copper wedge Opt 200 V 30 sec > 1000 MΩ C
P1 Pole to ground
Insulation Pole Insulation of the pole in its curing mould to ground
MQC 200 V 30 sec > 1000 MΩ C
P2 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B
P3 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled
P4_XXXX RDC Resistance Resistance measurement of instrumentation
MQC 1A / 4 wires NA Reference value for future measurements
A, B
P5 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref coil] +/- 2% E
P6 Coil inter-turn discharge
Discharge Pole Discharge test to identify turn to turn problems
Inv 30 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
Inv 60 V/turn
MQC 120 V/turn
Pop2 Discharge under stress SP
Discharge Pole Discharge while putting the straight part in an insulation mould at P=80MPa
Opt 120 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
Pop3 Discharge under stress ends
Discharge Pole Discharge while putting the ends in an insulation mould at P=80MPa decreasing to 0 MPa over the ehads
Opt 120 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
P7 Dielectric Q.H. to coil pre-test
Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VQH[i] /4 V 30 sec. 5 min
>1000 MΩ; <
(VQH[i]/900) μA
C
INV VQH[i] /2 V >1000 MΩ; < (2 × VQH[i]/900) μA
MQC VQH[i] V >500 MΩ; < (5 × VQH[i]/900) μA
P8 Q.H. discharge
Discharge QH To be applied if Q.H are between coils and already assembled
INV Max [(850V, 80A)/2]
Compare initial I and tau with reference
D, H, I
MQC Max [850V, 80A]
P9 Dielectric Q.H. to coil
Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH->
INV VQH[i] /4 V 30 sec. 5 min
>1000 MΩ; <
(VQH[i]/900) μA
C
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pre-test coil INV VQH[i] /2 V >1000 MΩ; < (2 ×
VQH[i]/900) μA
MQC VQH[i] V >500 M0Ω; < (5 VQH[i]/900) μA
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Test of pole : Nb3Sn, before reaction - PBR
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
PBR1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B
PBR2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled before reaction
PBR3_XXXX RDC Resistance Resistance measurement of instrumentation
MQC 1A / 4 wires NA Reference value for future measurements
A, B
PBR4 Pole to ground
Insulation Pole Insulation of the pole in its reaction mould to ground
Inv 50 V 60 sec > 1000 MΩ C
PBR5 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref coil] +/- 2% E
PBR6 Insulation resistance Q.H. to coil
Insulation Pole, QH To be applied if Q.H are between coils and already assembled and completed before reaction
Inv VQ[i] 30 sec. 5 min
>1000 MΩ; < (2X VQH[i]/900) µA
C
PBR7 Q.H. discharge
Discharge QH To be applied if Q.H are between coils and already assembled and completed before reaction
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
PBR8 Insulation resistance Q.H. to coil
Insulation Pole, QH To be applied if Q.H are between coils and already assembled before reaction
MQC VQ[i] 30 sec. 5 min
>1000 MΩ; < (2 × VQH[i]/900]) µA
C
PBR9 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled before reaction
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Test of pole : Nb3Sn, after reaction - PAR
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
PAR1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B
PAR2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled after reaction
PAR2_XXXX RDC Resistance Resistance measurement of instrumentation
MQC 1A / 4 wires NA Reference value for future measurements
A, B
PAR3 Pole to ground
Insulation Pole Insulation of the pole in its reaction mould to ground
Inv 50 V 60 sec > 1000 MΩ C
PAR4 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref coil] +/- 2% E
PAR5 Insulation resistance Q.H. to coil
Insulation Pole, QH To be applied if Q.H are between coils and already assembled and completed before reaction
Inv VQ[i] 30 sec. 5 min
>1000 MΩ; < (2 × VQH[i]/900) µA
C
PAR6 Q.H. discharge
Discharge QH To be applied if Q.H are between coils and already assembled and completed before reaction
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
PAR7 Insulation resistance Q.H. to coil
Insulation Pole, QH To be applied if Q.H are between coils and already assembled and completed before reaction
MQC VQ[i] 30 sec. 5 min
>1000 MΩ; < (2 × VQH[i]/900) µA
C
PAR8 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are between coils and already assembled and completed before reaction
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Test of pole : Nb3Sn, before impregnation - PBI
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
PBI1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B
PBI2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled before impregnation
PBI2_XXXX RDC Resistance Resistance measurement of instrumentation
MQC 1A / 4 wires NA Reference value for future measurements
A, B
PBI3 Pole to ground
Insulation Pole Insulation of the pole in its impregnation mould to ground
Inv 50 V 60 sec > 1000 MΩ C
PBI4 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref coil] +/- 2% E
PBI5 Insulation resistance Q.H. to coil
Insulation Pole, QH To be applied if Q.H are between coils and already assembled and completed before impregnation
Inv VQ[i] 30 sec. 5 min
>1000 MΩ; < (2 × VQH[i]/900) µA
C
PBI6 Q.H. discharge
Discharge QH To be applied if Q.H are between coils and already assembled and completed before impregnation
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
PBI7 Insulation resistance Q.H. to coil
Insulation Pole, QH To be applied if Q.H are between coils and already assembled and completed before impregnation
MQC VQ[i] 30 sec. 5 min
>1000 MΩ; < (2 × VQH[i]/900) µA
C
PBI8 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are between coils and already assembled and completed before impregnation
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Test of pole : Nb3Sn, after impregnation still in the mould - PAIM
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
PAIM1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B
PAIM2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled before impregnation
PAIM2_XXXX RDC Resistance Resistance measurement of instrumentation
MQC 1A / 4 wires NA Reference value for future measurements
A, B
PAIM3 Pole to ground
Insulation Pole Insulation of the pole in its impregnation mould to ground
Inv VT[i] 30 sec > 1000 MΩ C
PAIM4 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref coil] +/- 2% E
PAIM5 Insulation resistance Q.H. to coil
Insulation Pole, QH To be applied if Q.H are between coils and already assembled before impregnation
Inv VQ[i] 30 sec. 5 min
>1000 MΩ; < (2 × VQH[i]/900) µA
C
PAIM6 Q.H. discharge
Discharge QH To be applied if Q.H are between coils and already assembled before impregnation
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
PAIM7 Insulation resistance Q.H. to coil
Insulation Pole, QH To be applied if Q.H are between coils and already assembled before impregnation
MQC VQ[i] 30 sec. 5 min
>1000 MΩ; < (2 × VQH[i]/900) µA
C
PAIM8 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled before impregnation
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Test of pole : Nb3Sn, after impregnation out of the mould - PAI
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
PAI1 RDC Resistance Pole Resistance measurement of pole MQC 6A NA Ref coil +/- 3% A, B
PAI2 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
To be applied if Q.H are under coils and already assembled before
impregnation
PAI2_XXXX RDC Resistance Resistance measurement of instrumentation
MQC 1A / 4 wires NA Reference value for future measurements
A, B
PAI3 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref coil] +/- 2% E
PAI4 Pole inter-turn discharge
Discharge Pole Discharge test to identify turn to turn problems
Inv 30 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
Inv 60 V/ turn
MQC 120 V/turn
PAI5 Dielectric Q.H. to coil pre-test
Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VQ[i]/4 30 sec. 5 min
>1000 MΩ; < (2X VQH[i]/900) μA
C
INV VQ[i]/2 >1000 MΩ; < (5 × VQH[i]/900) μA
MQC VQ[i] >500 MΩ; < (10 × VQH[i]/900) μA
PAI6 Q.H. discharge
Discharge QH To be applied if Q.H are between coils and already assembled before impregnation
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
PAI7 RDC Q.H. Resistance QH Measurement of Q.H. RDC after assembly
MQC 1A NA Compare to previous component measurement +/- 2%
A, B
PAI8 Dielectric Q.H. to coil pre-test
Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VQ[i]/4 30 sec. 5 min
>1000 MΩ; < (2 × VQH[i]/900) μA
C
INV VQ[i]/2 >1000 MΩ; < (5 × VQH[i]/900) μA
MQC VQ[i] >500 MΩ; < (10 × VQH[i]/900) μA
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Test of pole : Nb3Sn, after impregnation 0.1 bar He - PHE
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
PHE1 Inductance Inductance Pole Pole inductance test MQC 100 Hz, 1 KHz, 10 KHz
NA L[ref coil] +/- 2% E
PHE5 Dielectric Q.H. to coil pre-test
Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VT[i]/10 30 sec. 5 min
>1000 MΩ; < 1 μA C
INV VT[i]/5 >1000 MΩ; < 2.5 μA
MQC VT[i]/3 >500 MΩ; < 10 μA
PHE2 Pole inter-turn discharge
Discharge Pole Discharge test to identify turn to turn problems
MQC 10 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
MQC 20 V/turn
MQC 40 V/turn
PHE3 Pole inter-turn discharge
Discharge Pole Discharge test to identify turn to turn problems
MQC 60 V/turn 10 puls Ref coil τ +/- 1% D, G, I, K
PHE5 Dielectric Q.H. to coil pre-test
Current leakage
Pole, QH To be applied if Q.H are between coils and already assembled QH-> coil
INV VT[i]/10 30 sec. 5 min
>1000 MΩ; < 1 μA C
INV VT[i]/5 >1000 MΩ; < 2.5 μA
MQC VT[i]/3 >500 MΩ; < 10 μA
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Test of collared coil before collaring or pre-collaring - BC
Test code Title Type Object Short description Priority
Test condition Time [sec]
Tolerances Equipment
BC1 RDC Resistance Pole RDC of each poles and Vtaps MQC 6 A NA Previous measured value +/- 1%
A, B
BC2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%
A, B
BC3_XXXX RDC instrumentation
Resistance RDC of instrumentation MQC 1A / 4 wires NA Previous measured value +/- 1%
A, B
BC4 Capacitance Capacitance Pole, QH
Q.H. to its pole on which they are assembled
MQC NA NA Compare single poles among them and to previous assembly
E
Single pole to ground
Single pole to single pole
All poles to ground
BC5_XXXX Capacitance Capacitance Instrumentation to poles between which they are
MQC NA NA Compare single result among them and to previous assembly
E
BC6 Inductance Inductance Pole L of each poles MQC 100 Hz, 1 KHz, 10 KHz
Compare single poles among them and to previous assembly
E
L of all poles temporarily in series
BC7 Dielectric Current leakage
Pole, QH
Poles + Q.H to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 × VQH[i]/900) μA
C
All poles to all Q.H.
Single pole to each other pole VT[i]
BC8_XXXX Dielectric Current leakage
All Poles + instrumentation to ground MQC VT[i]
30 sec. 5 min
>1000 MΩ; < (
10 × VQH[i]/900) μA
C
All poles to instrumentation
BC9 Discharge test Discharge Pole Single poles all poles temporarily in series
INV 30 V/turn Previous test D, G, I, K
INV 60 V/turn
MQC 100 V/turn
BC10 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B
BC11 Q.H. Dielectric Current leakage
QH Q.H. to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 × VQH[i]/900) μA
C
Q.H. to poles
Strip to strip if on different circuits
BC12_XXXX insulation Insulation instrumentation to ground MQC 1000 V 30 sec. > 1000 MΩ C
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resistance instrumentation to its poles
BC13 Q.H. discharge Discharge QH To be applied if Q.H are between coils and already assembled
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
BC14 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with BC10 results
A, B
BC15 Q.H. Dielectric Current leakage
QH Q.H. to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 × VQH[i]/900) μA
C
Q.H. to poles
Strip to strip if on different circuits
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Test of collared coil after pre-collaring - APC
Test code Title Type Object Short description Priority
Test condition Time [sec]
Tolerances Equipment
APC1 RDC Resistance Pole RDC of each poles and Vtaps MQC 6 A NA Previous measured value +/- 1%
A, B
APC2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%
A, B
APC 3_XXXX RDC instrumentation
Resistance RDC of instrumentation MQC 1A / 4 wires NA Previous measured value +/- 1%
A, B
APC 4 Capacitance Capacitance Pole, QH
Q.H. to its pole on which they are assembled
MQC NA NA Compare single poles among them and to previous assembly
E
Single pole to ground
Single pole to single pole
All poles to ground
APC 5_XXXX Capacitance Capacitance Instrumentation to poles between which they are
MQC NA NA Compare single result among them and to previous assembly
E
APC 6 Inductance Inductance Pole L of each poles MQC 100 Hz, 1 KHz, 10 KHz
Compare single poles among them and to previous assembly
E
L of all poles temporarily in series
APC 7 Dielectric Current leakage
Pole, QH
Poles + Q.H to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 X VQH[i]/900) μA
C
All poles to all Q.H.
APC 8 Dielectric Current leakage
Pole, QH
Single pole to each other pole MQC VT[i] 30 sec. 5 min
>1000 MΩ; < (10 X VT[i]/5000) μA
C
APC 9_XXXX Dielectric Current leakage
All Poles + instrumentation to ground MQC VT[i]
30 sec. 5 min
>1000 MΩ; < (10 X VT[i]/5000) μA
C
All poles to instrumentation
APC 10 Discharge test Discharge Pole Single poles all poles temporarily in series
INV 30 V/turn Previous test D, G, I, K
INV 60 V/turn
MQC 100 V/turn
APC 11 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B
APC 12 Q.H. Dielectric Current leakage
QH Q.H. to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 x VQH[i]/900) μA
C
Q.H. to poles
Strip to strip if on different circuits
APC insulation Insulation instrumentation to ground MQC 1000 V 30 sec. > 1000 MΩ C
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13_XXXX resistance instrumentation to its poles
APC 14 Q.H. discharge Discharge QH To be applied if Q.H are between coils and already assembled
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
APC 15 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with APC11 A, B
APC 16 Q.H. Dielectric Current leakage
QH Q.H. to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 x VQH[i]/900) μA
C
Q.H. to poles
Strip to strip if on different circuits
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Test of collared coil after collaring - AC
Test code Title Type Object Short description Priority
Test condition Time [sec]
Tolerances Equipment
AC1 RDC Resistance Pole RDC of each poles and Vtaps MQC 6 A NA Previous measured value +/- 1%
A, B
AC2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%
A, B
AC 3_XXXX RDC instrumentation
Resistance RDC of instrumentation MQC 1A / 4 wires NA Previous measured value +/- 1%
A, B
AC 4 Capacitance Capacitance Pole, QH
Q.H. to its pole on which they are assembled
MQC NA NA Compare single poles among them and to previous assembly
E
Single pole to ground
Single pole to single pole
All poles to ground
AC 5_XXXX Capacitance Capacitance Instrumentation to poles between which they are
MQC NA NA Compare single result among them and to previous assembly
E
AC 6 Inductance Inductance Pole L of each poles MQC 100 Hz, 1 KHz, 10 KHz
Compare single poles among them and to previous assembly
E
L of all poles temporarily in series
AC 7 Dielectric Current leakage
Pole, QH
Poles + Q.H to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 × VQH[i]/900) μA
C
All poles to all Q.H.
AC 8 Dielectric Current leakage
Pole, QH
Single pole to each other pole MQC VT[i] 30 sec. 5 min
>1000 MΩ; < (10 ×5000/ VT[i]) μA
C
AC 9_XXXX Dielectric Current leakage
All Poles + instrumentation to ground MQC VT[i]
30 sec. 5 min
>1000 MΩ; < (10 ×5000/ VT[i]) μA
C
All poles to instrumentation
AC 10 Discharge test Discharge Pole Single poles all poles temporarily in series
INV 30 V/turn Previous test D, G, I, K
INV 60 V/turn
MQC 100 V/turn
AC 11 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B
AC 12 Q.H. Dielectric Current leakage
QH Q.H. to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 × VQH[i]/900) μA
C
Q.H. to poles
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Strip to strip if on different circuits
AC 13_XXXX insulation resistance
Insulation BSH instrumentation to ground MQC 1000 V 30 sec. > 1000 MΩ C
instrumentation to its poles
AC 14 Q.H. discharge Discharge QH To be applied if Q.H are between coils and already assembled
INV 450 V (or 40A) Compare initial I and tau with reference
D, H, I
MQC 900 V (or 80A)
AC 15 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with AC11 results
A, B
AC 16 Q.H. Dielectric Current leakage
QH Q.H. to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 × VQH[i]/900) μA
C
Q.H. to poles
Strip to strip if on different circuits
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Test of the magnet after interconnection - AI
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
AI1 RDC Resistance Pole RDC of poles in serie and Vtaps MQC 6 A NA Previous measured value +/- 1%
A, B
AI2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%
A, B
AI3_XXXX RDC instrumentation
Resistance RDC of instrumentation MQC 1A / 4 wires NA Previous measured value +/- 1%
A, B
AI4 Capacitance Capacitance Pole, QH Q.H. to poles MQC NA NA Compare to previous assembly
E
All poles to ground
AI5_XXXX Capacitance Capacitance Instrumentation to poles between which they are
MQC NA NA Compare to previous assembly
E
AI6 Inductance Inductance Pole L of all poles in series MQC 100 Hz, 1 KHz, 10 KHz
Compare to previous assembly
E
AI7 Dielectric Current leakage
Pole, QH Poles + Q.H to ground MQC VQH[i] 30 sec. 5 min
>1000 MΩ; < (10 × VQH[i]/900) μA
C
All poles to all Q.H.
AI8 Dielectric Current leakage
Pole, QH All Poles to ground MQC VT[i] 30 sec. 5 min
>1000 MΩ; < (10 × VT[i]/5000) μA
C
AI9_XXXX Dielectric Current leakage
All Poles + All instrumentation to ground
MQC VT[i] 30 sec. 5 min
>1000 MΩ; < (10 × VQH[i]/5000) μA
C
AI10 Discharge test Discharge Pole All poles in series INV 60 V/ turn Previous test D, G, I, K
MQC 100 V/ turn
AI11 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B
AI12 Q.H. insulation resistance
Insulation QH Q.H. to ground MQC VQH[i] 30 sec. > 1000 MΩ C
Q.H. to poles
Strip to strip if on different circuits
AI13_XXXX Insulation resistance
Insulation instrumentation to ground MQC 1 kV 30 sec. > 1000 MΩ C
instrumentation to poles
AI14 Q.H. discharge Discharge QH Discharge each single Q.H. MQC 900 V (or 80A) Compare initial I and tau with reference
D, H, I
TE-MSC-MDT EDMS No:1264529
Page 38 of 40
AI15 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with AI11 A, B
AI16 Q.H. insulation resistance
Insulation QH Q.H. to ground MQC VQH[i] 30 sec. Compare with AI12 C
Q.H. to poles
Strip to strip if on different circuits
TE-MSC-MDT EDMS No:1264529
Page 39 of 40
Final Test of the magnet before delivery - FINAL
Test code Title Type Object Short description Priority Test condition Time [sec]
Tolerances Equipment
FINAL 1 RDC Resistance Pole RDC of poles in serie and Vtaps MQC 6 A NA Previous measured value +/- 1%
A, B
FINAL 2 RDC QH Resistance QH RDC of each Q.H. MQC 1 A NA Previous measured value +/- 1%
A, B
FINAL 3_XXXX
RDC instrumentation
Resistance RDC of instrumentation MQC 1A / 4 wires NA Previous measured value +/- 1%
A, B
FINAL 4 Capacitance Capacitance Pole, QH Q.H. to poles MQC NA NA Compare to previous assembly
E
All poles to ground
FINAL 5_XXXX
Capacitance Capacitance Instrumentation to poles between which they are
MQC NA NA Compare to previous assembly
E
FINAL 6 Inductance Inductance Pole L of all poles in series MQC 100 Hz, 1 KHz, 10 KHz
Compare to previous assembly
E
FINAL 7 Dielectric Current leakage
Pole, QH Poles + Q.H to ground MQC VtQHaf 30 sec. 5 min
>1000 MΩ; < (10 ×
VtQHaf /900) μA
C
All poles to all Q.H.
FINAL 8 Dielectric Current leakage
Pole, QH All poles to ground MQC VTaf 30 sec. 5 min
>1000 MΩ; < (10 ×
VTaf /5000) μA
C
FINAL 9_XXXX
Dielectric Current leakage
All Poles + All instrumentation to ground
MQC VTaf 30 sec. 5 min
>1000 MΩ; < (10 ×
VTaf /5000) μA
C
FINAL 10 Discharge test Discharge Pole All poles in series INV 60 V/ turn Previous test D, G, I, K
MQC 100 V/ turn
FINAL 11 Q.H. RDC Resistance QH Resistance each Q.H. Opt 1 A Previous tests A, B
FINAL 12 Q.H. insulation resistance
Insulation QH Q.H. to ground MQC VtQHaf 30 sec. > 1000 MΩ
< (10 × VtQHaf /900)
μA
C
Q.H. to poles
Strip to strip if on different circuits
FINAL Insulation Insulation instrumentation to ground MQC 1 kV 30 sec. > 1000 MΩ C
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Page 40 of 40
13_XXXX resistance instrumentation to poles
FINAL 14 Q.H. discharge Discharge QH Discharge each single Q.H. MQC 900 V Compare initial I and tau with reference
D, H, I
FINAL 15 Q.H. RDC Resistance QH Resistance each Q.H. MQC 1 A Compare with FINAL 11
A, B
FINAL 16 Q.H. insulation resistance
Insulation QH Q.H. to ground MQC VtQHaf 30 sec. Compare with FINAL 12
C
Q.H. to poles
Strip to strip if on different circuits