Input Signal and Sampling Frequencies Requirements for ...

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Input Signal and Sampling Frequencies

Requirements for Efficient ADC Testing with

Histogram Method

Yujie Zhao, A. Kuwana, S. Yamamoto, Y. Sasaki

H. Kobayashi, S. Katayama, J. Wei

T. Nakatani, K. Hatayama

K. Sato, T. Ishida,

T. Okamoto, T. Ichikawa

Division of Electronics and Informatics

Gunma University

ROHM Semiconductor

June 28,2021

The 36th International Technical Conference on Circuits/Systems, Computers and Communications

2/27

Outline

• Objective

• ADC Test with Histogram Method

• Input Sine Wave and Sampling Frequencies

Relationship in ADC Histogram Test Method

➢Sine Wave Histogram and Waveform Missing

➢Golden Ratio Sampling

➢Metallic Ratio Sampling

➢Prime Number Ratio Sampling

• Conclusion

3/27

Outline

• Objective

• ADC Test with Histogram Method

• Input Sine Wave and Sampling Frequency

Relationship in ADC Histogram Test Method

➢Sine Wave Histogram and Waveform Missing

➢Golden Ratio Sampling

➢Metallic Ratio Sampling

➢Prime Number Ratio Sampling

• Conclusion

4/27

Background

IoT era is coming !

High quality & Low cost ADC test is required

ADC is a key component

◆Analog signal ◆Digital signalSampling

A/D

Conversion

01010101110

10101010111

11101101010

5/27

Research Objective & Approach

SAR ADC linearity test takes a long time

● low-speed sampling

● high-resolution

ADC linearity test with histogram method:Investigation of "high efficiency relationship" between input and sampling frequencies

This Work

Test cost is proportional to test time

6/27

Outline

• Objective

• ADC Test with Histogram Method

• Input Sine Wave and Sampling Frequency

Relationship in ADC Histogram Test Method

➢Sine Wave Histogram and Waveform Missing

➢Golden Ratio Sampling

➢Metallic Ratio Sampling

➢Prime Number Ratio Sampling

• Conclusion

7/27

■Histogram method (Ramp wave input)

7

⚫ Highly linear ramp signal generation is difficult

(limitation up to 14-bit ADC)

⚫ ADC output histograms for all bins are equal

if ADC is perfectly linear

t

Ramp wave

ADC

DUT

001010011100101110111

Output

Code

Number

of Samples

INL

DNL

Conventional Linearity Testing 1

DNL

INL

8/27

Conventional Linearity Testing 2

8

■Histogram method(Single sine wave input)

⚫ Low distortion sine using an analog filter

⚫ Number of samples is small around the middle of

output range Many samples required (long test time)

t

Sine wave

Sine wave

GeneratorBPF ADC

DUT

Output

Code

Number

of Samples

INL

DNL

f

Remove

DNL

INL

9/27

DNL & INL

9

001 010 011 100 101 110 111

Output

Code

Number

of Samples

DNL

⚫ Important ADC testing items

DNL : Difference between

actual step width and ideal value

INL : Deviation from ideal conversion line

=

=k

i

iDNLkINL1

)()(

10/27

Outline

• Objective

• ADC Test with Histogram Method

• Input Sine Wave and Sampling Frequencies

Relationship in ADC Histogram Test Method

➢Sine Wave Histogram and Waveform Missing

➢Golden Ratio Sampling

➢Metallic Ratio Sampling

➢Prime Number Ratio Sampling

• Conclusion

11/27

Repetitive waveform sampled asynchronously

Sampling CLK

Measured waveform

Reconstruct a 1-period waveform0

50

100

150

200

250

0 128 256 384 512 640 768 896 1024N

um

ber

of

Sam

ple

s

Output Code

PDF:

Probability Distribution Function

𝑝 𝑣 =1

𝜋𝐴2−𝑣2

- Sampled histogram

is compared with PDF.

- Histogram is obtained. -

DNL , INL are calculated.

Sine Wave Histogram

12/27

A large amount of data is required to reconstruct the waveform Test time: long

Waveform Missing

𝑻𝑪𝑳𝑲

TSIG

Waveform missing occurs

at special ratio (TCLK / Tsig)

Sampling CLK

Measured waveform

Repetitive waveform sampled asynchronously

Reconstruct a 1-period waveform

13/27

𝛼 = 1,1

2,1

3,2

3,⋯ ,

1

6,⋯

Τ1 6

1

Τ1 1024

CLK

sig

Waveform Missing

𝑓𝐶𝐿𝐾 ≈1

𝛼𝑓𝑠𝑖𝑔𝑓𝐶𝐿𝐾 ≫ 𝑓𝑠𝑖𝑔

𝑓𝐶𝐿𝐾 ≈ 𝑓𝑠𝑖𝑔

Yuto Sasaki, Yujie Zhao, Anna Kuwana and Haruo Kobayashi, "Highly Efficient Waveform Acquisition Condition in

Equivalent-Time Sampling System", 27th IEEE Asian Test Symposium, Hefei, Anhui, China (Oct. 2018)

Special ratio

TCLK and Tsig , 𝑓𝐶𝐿𝐾 and 𝑓𝑠𝑖𝑔

14/27

Waveform Missing for Saw Signal

Normal situation Waveform Missing

15/27

Outline

• Objective

• ADC Test with Histogram Method

• Input Sine Wave and Sampling Frequency

Relationship in ADC Histogram Test Method

➢Sine Wave Histogram and Waveform Missing

➢Golden Ratio Sampling

➢Metallic Ratio Sampling

➢Prime Number Ratio Sampling

• Conclusion

16/27

Golden Ratio

Golden Ratio: 𝐥𝐢𝐦𝒏→∞

𝑭𝒏

𝑭𝒏−𝟏= 𝟏. 𝟔𝟏𝟖𝟎𝟑𝟑𝟗𝟖𝟖𝟕𝟒𝟗𝟖𝟗𝟓 = 𝝋

The most beautiful ratio

17/27

Yuto Sasaki, Yujie Zhao, Anna Kuwana and Haruo Kobayashi, "Highly Efficient Waveform

Acquisition Condition in Equivalent-Time Sampling System", 27th IEEE Asian Test Symposium,

Hefei, Anhui, China (Oct. 2018)

Τ1 𝜑

CLK

Golden Ratio 𝝋

𝒇𝑪𝑳𝑲 = 𝝋 × 𝒇𝒔𝒊𝒈𝝋 = 1.6180339887…

Golden Ratio Sampling

Proposal of sampling conditions for the highest waveform acquisition efficiency

18/27

Outline

• Objective

• ADC Test with Histogram Method

• Input Sine Wave and Sampling Frequency

Relationship in ADC Histogram Test Method

➢Sine Wave Histogram and Waveform Missing

➢Golden Ratio Sampling

➢Metallic Ratio Sampling

➢Prime Number Ratio Sampling

• Conclusion

19/27

Metallic Ratio

Golden Ratio: 𝐥𝐢𝐦𝒏→∞

𝑭𝒏

𝑭𝒏−𝟏= 𝟏. 𝟔𝟏𝟖𝟎𝟑𝟑𝟗𝟖𝟖𝟕𝟒𝟗𝟖𝟗. . = 𝝋

n Decimal

0 1

11 + 5

21.6180339887… Golden Ratio

2 1 + 2 2.4142135623… Silver Ratio

33 + 13

23.3027756377… Bronze Ratio

4 2 + 5 4.2360679774…

… …

n𝑛 + 𝑛2 + 4

2

Generalization of Golden Ratio

20/27

Histogram of Saw Signal

𝑇𝑠𝑖𝑔

ℎ𝑖 𝑘 =𝑀

𝑁, 𝑘 = 1,2,3, . . . , 𝑁ideal value error 𝑒 𝑘 =

𝑁 ∙ ℎ 𝑘

𝑀− 1

ideal value ℎ𝑖 𝑘 =𝑀

𝑁

Output Code

Number of

Samples

Total number of samples: M

ADC resolution :N.

ℎ 𝑘

21/27

RMS Error Calculation

Root mean square error

between actual and ideal histograms 𝑅𝑀𝑆 =σ ⅇ 𝑘

2

𝑁

Total number of samples: M=65536

0

10

20

30

40

50

60

0 32 64 96 128 160 192 224 256

RM

S

N

golden ratio sliver ratio bronze ratio

22/27

Outline

• Objective

• ADC Test with Histogram Method

• Input Sine Wave and Sampling Frequency

Relationship in ADC Histogram Test Method

➢Sine Wave Histogram and Waveform Missing

➢Golden Ratio Sampling

➢Metallic Ratio Sampling

➢Prime Number Ratio Sampling

• Conclusion

23/27

RMS of Prime Number Sampling

RATIO with two large prime numbers ⇒ Small RMS

In contrast, Golden Ratio has a smaller RMS

𝒇𝑪𝑳𝑲 = 𝒇𝒔𝒊𝒈 × 𝑹𝑨𝑻𝑰𝑶 Total number of samples: M=65536

24/27

RMS of Prime Number Sampling: Big Number Case

𝒇𝑪𝑳𝑲 :Big prime number 997

𝒇𝑺𝑰𝑮 :Some prime numbers 389,599,751,853,907,953,991

→ almost the same

Total number of samples: M=65536

25/27

RMS ComparisonTotal number of samples: M=65536

Increasing N to 16384,

Bronze ratio result is better (RMS range is smaller)

26/27

Outline

• Objective

• ADC Test with Histogram Method

• Input Sine Wave and Sampling Frequency

Relationship in ADC Histogram Test Method

➢Sine Wave Histogram and Waveform Missing

➢Golden Ratio Sampling

➢Metallic Ratio Sampling

➢Prime Number Ratio Sampling

• Conclusion

27/27

Conclusion

27

⚫ Like the golden ratio

Find conditions for efficient sampling

at a specific location

(ADC resolution N=256,512,1024,2048,4096)

Next work

Golden Ratio sampling

Efficiency: high

Sampling frequency: low

Metallic ratio sampling

Efficiency: high

Sampling frequency: high

Prime number ratio sampling

Efficiency:Not good

Sampling frequency: low

Thanks for your attention.