Post on 24-Jul-2020
transcript
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June 12 to 15, 2011San Diego, CA
Probe Card Cost Drivers from Architecture to Zero Defects
Ira FeldmanFeldman Engineering Corp.
Overview• Cost, Price, & Cost Drivers
• Serial Processing – Drilling Example
NRE• NRE
• Advanced Process Technology
• Profitless Prosperity
• Cost Savings
June 12 to 15, 2011 IEEE SW Test Workshop 2
• Summary
Note: price/cost examples are approximate and from multiple vendors not necessarily those identified or shown.
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Price
CostValue
Cost
June 12 to 15, 2011 IEEE SW Test Workshop 3
Gross Profit = Price – CostGross Margin = Gross Profit / Price
Vertical Probe Head
Printed Circuit Board
Space Transformer
BGA (Solder Attach)
Upper Guide Plate
Spacer
June 12 to 15, 2011 IEEE SW Test Workshop 4
MicroProbe Apollo
Lower Guide Plate
Spacer
Probes
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Machine ShopCost DriversCost DriversProgramming
MaterialSetup TimeRun Time
June 12 to 15, 2011 IEEE SW Test Workshop 5
Run TimeInspection
Yield
June 12 to 15, 2011 IEEE SW Test Workshop 6
Don’t bother… “Ferrari”
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June 12 to 15, 2011 IEEE SW Test Workshop 7
Don’t bother… “Ferrari”
Machine Cost $300,000 Annual Maintenance 7%
Useful Life 7 yearsTotal Cost $447,000
Facilities Annual Cost $35,000 Total Annual Cost $68,857
Machine Cost25% utilization $31.44 /hr85% utilization $9.25 /hr
Tooling per hole $ 0.05
Make vs. Buy
UtilizationLead Time
Quality
June 12 to 15, 2011 IEEE SW Test Workshop 8
Fixed vs. Variable CostCost (Make) vs. Price (Buy)
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Non Recurring EngineeringExpense
Architecture Design Tester CustomerR&D NRE NRE NRE
Design Input X XProbes ?
Guide Plates XSpace Transformer X
Interposer ?PCB Design X (External?) X ?
PCB Fab External ? ?M h i l H/W ? X ?
June 12 to 15, 2011 IEEE SW Test Workshop 9
NREMechanical H/W ? X ?
Electronics ? ? ?Metrology X X ?Packaging X ?
Outgoing Metrology
June 12 to 15, 2011 IEEE SW Test Workshop 10
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Interposers ISC
Spring Pin Elastomeric Molded Frame
Small Area NRE $.5 - 1 K $2 - 3 K $20 - 30 K
$ / contact $1 - 10 $ 50 - 60 < $ 20 - 40$ / contact $1 10 $.50 .60 < $.20 .40
Large Area(1/4 wafer +)
NRE $10 - 15 K $100 - 150 K
$ / contact $.40 - . 50 < $.10 - .20
June 12 to 15, 2011 IEEE SW Test Workshop 11
www.ksdk.co.jp ISC InterCon Systems
SequentialPunch
Space Transformers
SequentialPunch
Material & Material & Processing
June 12 to 15, 2011 IEEE SW Test Workshop 12
Processing
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Advanced Process TechnologyCost DriversProcess StepsMasksSubstrates
MaterialActive Area
YieldDefect Density
June 12 to 15, 2011 IEEE SW Test Workshop 13
Defect DensityLayers
EquipmentRework / Repair
Whitespace
Design 1 Design 2
Design 1 Design 2
June 12 to 15, 2011 IEEE SW Test Workshop 14
FormFactor Harmony XP
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Solution
June 12 to 15, 2011 IEEE SW Test Workshop 15
FormFactor Smart Matrix
ars;
VR
GY
-7 y
ears
rs
; MJC
–5
year
s; J
EM
-5 y
e
June 12 to 15, 2011 IEEE SW Test Workshop 16
FOR
M –
9 ye
a
9
Costs Savings
STANDARDSInput Data Formats
Probe DepthTesthead Configurations
Specifications
June 12 to 15, 2011 IEEE SW Test Workshop 17
Summary
• Understand true cost of architectures– Beware of NRE
– New architectures needed for cost reductions
• Maintain sufficient Gross Margin– Company health
– Funding for R&D
• Honest supplier – customer partnerships
June 12 to 15, 2011 IEEE SW Test Workshop 18
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Acknowledgments• Amphenol InterCon Systems
• BucklingBeam
• FormFactor• FormFactor
• ISC
• Kern
• Robin McAdams
• MicroProbe
• Sergio Perez
• SV Probe
• Frank Swiatowiec
June 12 to 15, 2011 IEEE SW Test Workshop 19
Thank You!Ira Feldman
ira@feldmanengineering.com
Visit my blog
www.hightechbizdev.comwww.hightechbi dev.com
for my summary of SWTW
June 12 to 15, 2011 IEEE SW Test Workshop 20