Update on Analysis of FNAL TB09 Jianchun Wang for the group Syracuse Univesity Jan 29 th,2010.

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Update on Analysis of

FNAL TB09

Jianchun Wang

for the group

Syracuse UnivesityJan 29th ,2010

Testbeam Team at FNAL

June 2008: Tony Affolder, Marina Artuso, Alessandra Borgia, Lars Eklund, Karol Hennessy, Gwen Lefeuvre, Ray Mountain, Abdi Noor, Chris Parkes, Sheldon Stone, Jianchun Wang

April 2009: Marina Artuso, Alessandra Borgia, Torkjell Huse, David Hutchcroft, Ray Mountain, Jianchun Wang

Pixel system: David Christian (FNAL), Bruce Knapp (Nevis Lab), Jianchun Wang

More from remote

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Introduction

PixelVELO

120 GeV proton beam

RR( )F

The system and analysis procedure: Independent DAQ systems for Pixel & VELO, sharing trigger signals. Events are matched offline. Tracks are reconstructed from pixel hits and fit to straight lines, multiple scattering is treated

separately. Pixel stations/modules are aligned within its own system. Velo sensors are aligned with respect to the pixel tracks. Tracks, corresponding Velo event IDs and alignment

parameters are saved in tracking data files. Pixel tracking data are fed to Vetra for VELO analysis.

Non-irradiated N-type R sensor (R/ f pair) Charge sharing & resolution for different pitches and track angles. Presented at 10/19/09 TREC meeting. Some plots are included here for comparison.

Differentially irradiated N-type & P-type R sensors (RR pair) Most probable charge vs irradiation particle fluence ( presented at 12/07/09 VELO meeting), some are updated

here. Most probable charge for different bias HVs. Detection efficiency and resolution.

Basic on Charge Distributions

The FE electronics were under-powered, resulting in low gain. Most probable charge ~16 ADC instead of ~40.

Constant thresholds (seed=3.6, inclusion=1.8) are used (noise ~ 0.9 ADC counts). Thresholds are low enough to study irradiated sensors.

Gain differences are partially corrected using header heights.

Only hits that match with pixel tracks are looked at, to reduce the influence from uncertainty of noise hits.

Charge distributions are fit to Landau convoluted with Gaussian. The width of Gaussian is fixed to an average value so as to reduce the uncertainty on Landau MP.

In some cases there are shoulders/tails on low side that were not well understood. Fits are at peak areas. Fit range affects MP obtained from fit. MP represents, but not completely, the charge collection efficiency.

Charge (ADC counts)

Sensor Charge Collection

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Tracks at 0-8 degrees, detector biased at 500 V.Hit map determined by pixel tracks that matche with VELO hits.

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= – Y

N-type

P-type

MP Charge At Different HVs

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Bias Voltage (V)

500 400 300200 100 50

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N-type P-type

No HV scanned for middle part due to tight schedule.

It is difficult to extract correct MP when MP is close to threshold.

Comparing Different Electronics Settings

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N-typeKazu setting

P-typeKazu setting

N-typeChris setting

P-typeChris setting

optimized for sensors after irradiation.

Optimized for current running in the pit.

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biased at 500 V

Detection Efficiency

Due to the trigger scheme and different DAQ clock frequencies for the two systems, tracks seen by pixel and VELO are not necessarily the same.

Pixel tracks are matched with hits from one sensor (± 200 mm) to ensure this is a real track and seen by VELO.

We then look at the other sensor to see if there is hit that matches the track. The detection efficiencies are thus determined.

Beam profiles are not guaranteed to be the same for different conditions so the weight of dead areas changes for different condition runs.

A dead chip and few dead strips and certain border areas are removed.

In this way, the detection efficiencies reflect more precisely the effect of irradiation fluences and/or bias voltages.

Cleanup of Dead Strip & Borders

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X (mm)

N-sensor

P-sensor

N-sensor

P-sensor

Remove 6 bad

strips & borders

Remove 4 bad

strips & borders

hit position expectation that are unmatched

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N-typeKazu setting

P-typeKazu setting

Normal incident tracks

Biased at 500 V

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Not from 0

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N-typeKazu setting

P-typeKazu setting

All angles

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Bias Voltage (V)

500 400 300200 100 50

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N-typeChris setting

P-typeChris setting

All angles

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For Resolution Study

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Track Effective Angle (degree)

Select regions Y< –16 mm & Y > 16 mm.

Angles: 0-2, 2-4, 6-8 degrees

Pitches: 64-70, 70-80, 80-90, 90-100 mm

Y (mm)

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Resolution vs Pitch

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Normal Incidence (0.5)

R of R/ f pairN-type

0-2 degree

P-type0-2 degree

Fully irradiated (Kazu)

Fully irradiated (Chris)

Non-irradiated (Kazu)

Non-irradiated (Chris)

Error not fully estimated

R of R/f pair (Chris, 0 degree)

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Resolutions are obtained through Gaussian fit to residual distributions, not just RMS due to bkg hits.

Tracking errors are removed.

Charge Sharing vs Pitch

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R of R/ f pair

N-type0-2 degree

P-type0-2 degree

Fully irradiated (Chris)

Non-irradiated (Chris)

Error not estimated

R of R/f pair (Chris, 0 degree)

Angle ( )-0.5 – 0.52.5 – 3.56.5 – 7.5

10.5 – 11.5

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Resolution vs Pitch

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N-type

P-type

Error not fully estimated

R of R/ f pair

Angle ( )- 0.5 – 0.52.5 – 3.56.5 – 7.5

10.5 – 11.5

Irradiated Fully None

Angle (degree)0-22-46-8

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Center of Residual vs HV

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N-typefully-irradiated6-8 degree tracks

64 – 70 mm

90 – 100 mm

80-90 mm

70 – 80 mm

Naïve interpretationMax difference ~150tan(8) = 21 mm

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Center of Residual vs HV

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64 – 70 mm

90 – 100 mm80-90 mm

70 – 80 mm

P-typenon-irradiated6-8 degree tracks

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Full depletion voltage ~ 110 V

Summary

Data on irradiated sensors are analyzed.

Most probable charge, detection efficiency, charge sharing and resolution are measured for different pitch, HV and irradiation dose.

Paper draft is on the way.

More ideas may come up while producing paper draft.

Some systematic errors already added, more will be included.

Suggests and contributions are welcome.

Comparison Between N- and P-type Sensor

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P-type

N-type

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Update on Analysis of FNAL TB09 Jianchun Wang for the group Syracuse Univesity Jan 29 th,2010.

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