3070 User Group

Meeting 2012

IMPROVING THROUGHPUT

ON THE 3070

Agilent Measurement System

Division

Rodrigo Cantu

Applications Engineer

September 14, 2012

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2

Agenda

1. What takes time on the 3070.

2. Analog test time improvements

3. ASRU-N

4. BT-Basic testplan synchronisation

5. Series 5 Digital throughput

6. PC and Icap card

7. Large Board Example

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Pins Test

•Pins test or Chekpoint verifies that there is good contact between the

Board under Test and the test fixture.

•To improve throughput it should only be run on failures.

•If the board passes then Pins Test does not need to be run.

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Shorts Test

•Original Shorts test algorithm is inefficient.

•A very simple algorithm is used to generate the test.

•There is no logical grouping of the nodes tested

•Settling delays are not optimized.

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New Shorts Test

•At software revision 7.20 the test generation algorithm was rewritten.

•Nodes are now placed in logical groups in the shorts test.

•Settling delays are optimized.

•Debug is minimized.

•Test time is improved.

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Revised Capacitor test

Capacitor test generation modified to reduce the use of the

fr128 option and therefore the ed option.

If fr1024 is used more often, ed is not required, tests run faster.

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ASRU N

•ASRU N speeds up test time for analog tests

•Capacitor and inductor tests run faster

•Wait statements in other tests are optimized to run faster

•ASRU N uses a Digital Measurement Circuit

•Tests using „as‟ option should be regenerated to ensure the correct test

options are selected to maximize analog throughput.

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Effect of "en" & "ed" options on Analog Unpowered Test Time: up to 25x slower tests

1. FETs, Jumpers, etc.

(There is no adaptive algorithm applied for these tests)

Asru C(2nd run)ASRU-N MCU (2nd

run)

No en, no ed 5.9ms 3.8ms

En only 17ms 3.8ms

Ed only 23ms 20.5ms

En, ed 155ms 20.5ms

En/ed effect 25x 6x

2. Resistors

Asru C (2nd run)ASRU-N MCU (2nd

run)

No en, no ed 3.57ms 3.8ms

En only 4.3ms 3.8ms

Ed only 21.3ms 20.5ms

En, ed 21.5ms 20.5ms

En/ed effect 6x 6x

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3. Capacitors

128Hz (this frequency always comes with ED option)

Asru C(2nd run) ASRU-N MCU (2nd run)

Ed only 35.8 20.6ms

En, ed 53.5 20.5ms

En/ed effect 1.5x 1x

Capacitor – 1024Hz

Asru C (2nd run) ASRU-N MCU (2nd run)

No en, no ed 5.7 5.6ms

En only 7.1 5.6ms

Ed only 24.3 12.9ms

En, ed 44.3 12.9ms

En/ed effect 7.5x 2x

Capacitor – 8192Hz

Asru C (2nd run) ASRU-N MCU (2nd run)

No en, no ed 5.4 4ms

En only 7.3 4ms

Ed only 24 12ms

En, ed 44.3 12ms

En/ed effect 8x 3x

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Auto Optimizer

•Available from software revision 7.00.

•Should be used after Auto Analog debug to optimize analog test time

•Rules based optimizer configured by user

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I3070 GUI – Testtime column

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Testplan Optimization

•All statements except for „test‟ are inefficient

•BT-Basic commands force a testhead sync

•Parallel DUT supplies should use the “optimize” statement

•Powered tests should NOT be safeguard inhibited

•Safeguard cool enforces delays between tests

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Series 5 Digital Speedup

•Series 5 allows 12Mbit/s digital testing

•Default digital vector cycle time is 2MBits/s

•Large Boundary Scan and Silicon nail tests run quicker

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PC Hardware and Icap card

•Latest testhead hardware has benefits for large tests

•Large Boundary Scan tests, silicon nails, run faster

•Device programming tests (Flash, ISP) run faster

•Flash/ISP software will bring maximum throughput.

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Unix to PC conversion

•Converting from Unix to PC is just the first step

•For best results test should be regenerated

•Old tests use old test methods and are not optimized

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82%

0%

20%

40%

60%

80%

100%

120%

0

50

100

150

200

250

Time (seconds)

Acc %

Large Board Test Time Pareto Analysis

Large Board Test Time Comparison

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Section Series 3

Series5

Initial Test

Series5Optimized

Pins 12.625 12.625 0

PreShorts 35.8 19.016 7.782

Shorts 5.97 5.984 8.671

VTEP 3.81 4.063 4.047

Aunpowered 154.89 111.937 29.531

Stage Ch to FCT 6.828 5.453 5.375

PS1 4.55 3.86 3.875

BS Interconnect 0 0 8.125

Stage Ch to ICT 14.532 13.453 15.969

Psupply 4.77 3.703 3.844

Bscan ICT 32.11 26.469 29.078

Digital ICT 14.47 9.718 12

Analog FCT 4.332 0.985 1.062

High Freq Osc 8.212 8.212 8.172

LED 35.656 35.656 22.313

EEPROM 13.06 10.297 10.125

Total (Seconds) 351.615 271.431 169.969

Total (Minutes) 05:51.6 04:31.4 02:50.0