Crystallographic Orientation of Epitaxial Transition Observed for Nb (bcc) on MgO and Cu (fcc)
Single-crystalsKang Seo*, Norfolk State University (NSU), Norfolk, Virginia 23504
Mahadevan Krishnan, Enrique Valderrama, Alameda Applied Sciences Corporation (AASC), San Leandro, California 94577
Xin Zhao, Anne-Marie Valente-Feliciano, Joshua Spradlin, Larry Phillips, Charles Reece, Thomas Jefferson National Accelerator Facility (JLAB), Newport News, Virginia 23606
SummaryNiobium thin films were grown on (001) MgO single-crystal using a
coaxial energetic deposition. The quality of the substrate surface and
epitaxial Nb layers were investigated by XRD Bragg-Brentano and
pole figure measurements. Depending on growth temperature, in-plane
XRD show Kurdjumov-Sachs (KS) as well as Nishiyama-Wassermann
(NW) epitaxial relationships for (110) and (001) Nb on (001) MgO.
Calculation of the interface energy in rigid lattice models finds one KS
and two NW minima. For the NW case the optimal atomic diameter
ratio dbcc/dfcc=0.866 and 1.061, whereas for the KS case it is at
dbcc/dfcc=0.919. Transitions of this type are usually induced by a change
in the lattice parameter ratio resulting from a relaxation process in the
early stage of the growth.
X-ray Analysis
S
iK
dK
2
1
S
1
Rocking curve
X-ray diffraction is one of the most powerful and widely used
techniques for accurate characterization of the lattice parameters,
mismatch, and thickness of epitaxial materials.
Schematic of scan vector of
2theta-omega scan and rocking
curve in reciprocal space
Schematic of scan vector of pole
figure measurement in reciprocal
space
Out-of-plane XRD
Phi scan {110} for (110) Nb on (111) Cu at Ts=500°C
The center spot indicates
the grains oriented with
(110) planes parallel to
the substrate, while four
spots at 60 of tilt
correspond to diffraction
intensities from {110} in-
plane texture. The angle
between (110) and (100)
in cubic materials is 45°
that those four peaks
emanate from Nb with
(001)Nb ‖ (001)MgO.
Conclusions
Bragg-Brentano XRD revealed that epitaxial (110) Nb films on MgO
substrate were grown under 400°C of deposition temperature and (001)
Nb films at higher 600°C, while the diffraction peaks of Nb films were
changed from single orientation to a mixed state (110) and (001) plane
of 500°C. In-plane XRD (110) and (001) Nb/MgO phi scan with a
variety of different NW (Nishiyama-Wasserman) -KS (Kurdjumov-
Sachs) states that show the transition independently from substrate
temperature. In this state of the transition the NW at orientation θ= 0°
one-peak structure is superposed by the two KS peaks appearing at
about ±10° relative to the NW direction. For (110) Nb on (111) Cu
substrate, optimal ratio is very close to the KS minimum with
orientation θ = 5.3°. Clearly, the lattice parameter ratio is an important
variable in the epitaxial growth.
* e-mail: [email protected]
+ The financial support of this investigation by the #DE-FG02-07ER84741 to
AASC is gratefully acknowledged.
Ts (°C) Substrate RRR Tc (K) B-B XRD
DOE146-0702-4 RT/150 (001) MgO 7 9.0 (110) Nb
CED-080510-26 300/300 (001) MgO 48 9.24-9.26 (110) Nb
CED-072210-10 500/500 (001) MgO 181 9.25 (110) & (002) Nb
CED-071410-3 700/700 (001) MgO 316 9.22-9.25 (002) Nb
Sample Information
30 35 40 45 50 55 60 65
(002
) N
b
(110
) N
b
(002
) M
gO
(d)
(c)
(b)
(a)
Inte
nsi
ty (
arb. un
it;
cps)
2theta-theta (degree)
Bragg-Brentano XRD patterns of Nb films on (001) MgO obtained as a
function of substrate temperatures of (a) 150C, (b) 300C, (c) 500C, and
(d) 700C.
In-plane (texture) XRD
Phi scan {110} for (110) Nb on (100) MgO at Ts=300°C
50 100 150 200 250 300 350Phi (°)
0
400
1600
3600
Inte
nsity (
counts
)
4.3°
94.1° 185.3
°
275.9
°
39.6
°
149.4
°
220.7
°
330.1
°
58.9
°
129.8
°
239.9
°
310.5
°
35.3°
35.2 °35.7 °
19.3
°
Phi scan {110} for (100) Nb on (100) MgO at Ts=700°C
0 50 100 150 200 250 300 350Phi (°)
0
2500
10000
22500
Inte
nsity (
counts
)
0.5°
89.5°
181.1°
271.5°
44.7°
135.3°
226.3°
315.7°
44.8°
Mg
O
Nb
45°
Mg
O
Nb (1st stage)
Nb (2nd stage)
35.3°
19.3°
50 100 150 200 250 300 350Phi (°)
0
1000
2000
3000
4000
5000
6000
7000
Inte
nsity (
counts
)
5.3°
Cu
Nb
(a) (b)
(c) (d)