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MR2A16A Rev. 10.1, 7/2013 1 Copyright © Everspin Technologies 2013 MR2A16A 256K x 16 MRAM Memory FEATURES • Fast 35 ns Read/Write Cycle • SRAM Compatible Timing, Uses Existing SRAM Controllers Without Redesign • Unlimited Read & Write Endurance • Data Non-volatile for >20 years at Temperature • One Memory Replaces Flash, SRAM, EEPROM and BBSRAM in System for Simpler, More Efficient Design • Replace battery-backed SRAM solutions with MRAM to improve reliability • 3.3 Volt Power Supply • Automatic Data Protection on Power Loss • Commercial, Industrial, Extended Temperatures • RoHS-Compliant SRAM TSOP2 and BGA Packages - MSL Level 3 • AEC-Q100 Grade 1 option INTRODUCTION The MR2A16A is a 4,194,304-bit magnetoresistive random access memory (MRAM) device organized as 262,144 words of 16 bits. The MR2A16A offers SRAM compatible 35 ns read/write timing with unlimited endurance. Data is always non-volatile for greater than 20 years. Data is automatically protected on power loss by low-voltage inhibit circuitry to prevent writes with voltage out of specification. The MR2A16A is the ideal memory solution for applications that must permanently store and retrieve critical data and programs quickly. The M24A16B is available in a small footprint 48-pin ball grid array (BGA) package and a 44-pin thin small outline package (TSOP Type 2). These packages are compatible with similar low-power SRAM products and other nonvolatile RAM products. The MR2A16A provides highly reliable data storage over a wide range of temperatures. The product is offered with commercial (0 to +70 °C), industrial (-40 to +85 °C), extended (-40 to +105 °C) and AEC-Q100 Grade 1 (-40 to +125 °C) operating temperature range options. RoHS CONTENTS 1. DEVICE PIN ASSIGNMENT ......................................................................... 2 2. ELECTRICAL SPECIFICATIONS................................................................. 4 3. TIMING SPECIFICATIONS.......................................................................... 7 4. ORDERING INFORMATION....................................................................... 12 5. MECHANICAL DRAWING.......................................................................... 13 6. REVISION HISTORY ...................................................................................... 15 How to Reach Us.......................................................................................... 15
Transcript
Page 1: 4Mb 256K x 16 MRAM Memory - Farnell · PDF fileopyright v Technolog 1 1 1 ev 11 1 MR2A16A FEATURES 256K x 16 MRAM Memory • Fast 35 ns Read/Write Cycle • SRAM Compatible Timing,

MR2A16A Rev. 10.1, 7/20131 Copyright © Everspin Technologies 2013

MR2A16A256K x 16 MRAM MemoryFEATURES

• Fast35nsRead/WriteCycle• SRAMCompatibleTiming,UsesExistingSRAMControllersWithoutRedesign

• UnlimitedRead&WriteEndurance• DataNon-volatilefor>20yearsatTemperature• OneMemoryReplacesFlash,SRAM,EEPROMandBBSRAMinSystemforSimpler,MoreEfficientDesign

• Replacebattery-backedSRAMsolutionswithMRAMtoimprovereliability

• 3.3VoltPowerSupply• AutomaticDataProtectiononPowerLoss• Commercial,Industrial,ExtendedTemperatures• RoHS-CompliantSRAMTSOP2andBGAPackages-MSLLevel3• AEC-Q100Grade1option

INTRODUCTIONTheMR2A16Aisa4,194,304-bitmagnetoresistiverandomaccessmemory(MRAM)deviceorganizedas262,144wordsof16bits.TheMR2A16AoffersSRAMcompatible35nsread/writetimingwithunlimitedendurance.Dataisalwaysnon-volatileforgreaterthan20years.Dataisautomaticallyprotectedonpowerlossbylow-voltageinhibitcircuitrytopreventwriteswithvoltageoutofspecification.TheMR2A16Aistheidealmemorysolutionforapplicationsthatmustpermanentlystoreandretrievecriticaldataandprogramsquickly.

TheM24A16Bisavailableinasmallfootprint48-pinballgridarray(BGA)packageanda44-pinthinsmalloutlinepackage(TSOPType2).Thesepackagesarecompatiblewithsimilarlow-powerSRAMproductsandothernonvolatileRAMproducts.

TheMR2A16Aprovideshighlyreliabledatastorageoverawiderangeoftemperatures.Theproductisofferedwithcommercial(0to+70°C),industrial(-40to+85°C),extended(-40to+105°C)andAEC-Q100Grade1(-40to+125°C)operatingtemperaturerangeoptions.

RoHS

CONTENTS1.DEVICEPINASSIGNMENT.........................................................................22.ELECTRICALSPECIFICATIONS.................................................................43.TIMINGSPECIFICATIONS.......................................................................... 74.ORDERINGINFORMATION.......................................................................125.MECHANICALDRAWING..........................................................................136.REVISIONHISTORY......................................................................................15HowtoReachUs..........................................................................................15

Page 2: 4Mb 256K x 16 MRAM Memory - Farnell · PDF fileopyright v Technolog 1 1 1 ev 11 1 MR2A16A FEATURES 256K x 16 MRAM Memory • Fast 35 ns Read/Write Cycle • SRAM Compatible Timing,

MR2A16A Rev. 10.1, 7/20132 Copyright © Everspin Technologies 2013

1. DEVICE PIN ASSIGNMENT

Figure 1.1 Block Diagram

Table 1.1 Pin Functions

MR2A16A

Signal Name Function A AddressInput

E ChipEnable

W WriteEnable

G OutputEnable

UB UpperByteEnable

LB LowerByteEnable

DQ DataI/O

VDD PowerSupply

VSS Ground

DC DoNotConnect

NC NoConnection

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MR2A16A Rev. 10.1, 7/20133 Copyright © Everspin Technologies 2013

A0A1A2A3

DQL0DQL1

VDD

E

VSS

DQL2DQL3

W

A7A8A9

A4

22212019181716151413121110987654321

A6A5

23242526272829303132333435363738394041424344

A15G

DQL7DQL6

VSS

VDD

DQL5DQL4

A14 A13A12A11A10

DC

A17A16

UB LBDQU15DQU14DQU13DQU12

DQU11DQU10DQU9DQU8

1 2 3 4 5 6

LB G A0 A1 A2 NC A

DQU8 UB A3 A4 E DQL0 B

DQU9 DQU10 A5 A6 DQL1 DQL2 C

VSS DQU11

A15

DQL3 VDD D

VDD DQU12 NC A16 DQL4 VSS E

DQU14 DQU13 A14

A13

DQL5 DQL6 F

DQU15 NC

A10

A17

A11

W DQL7 G

NC

A7

A9A8

A12

DC H

Figure 1.2 Pin Diagrams for Available Packages (Top View)

44-Pin TSOP Type2 48-Pin BGA

Table 1.2 Operating Modes

DEVICE PIN ASSIGNMENT MR2A16A

E 1 G 1 W 1 LB 1 UB 1 Mode VDD Current DQL[7:0]2 DQU[15:8]2

H X X X X Notselected ISB1,ISB2 Hi-Z Hi-Z

L H H X X Outputdisabled IDDR Hi-Z Hi-Z

L X X H H Outputdisabled IDDR Hi-Z Hi-Z

L L H L H LowerByteRead IDDR DOut Hi-Z

L L H H L UpperByteRead IDDR Hi-Z DOut

L L H L L WordRead IDDR DOut DOut

L X L L H LowerByteWrite IDDW Din Hi-Z

L X L H L UpperByteWrite IDDW Hi-Z Din

L X L L L WordWrite IDDW Din Din

1H=high,L=low,X=don’tcare2Hi-Z=highimpedance

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MR2A16A Rev. 10.1, 7/20134 Copyright © Everspin Technologies 2013

2. ELECTRICAL SPECIFICATIONSAbsolute Maximum RatingsThisdevicecontainscircuitrytoprotecttheinputsagainstdamagecausedbyhighstaticvoltagesorelectricfields;however,itisadvisedthatnormalprecautionsbetakentoavoidapplicationofanyvoltagegreaterthanmaximumratedvoltagestothesehigh-impedance(Hi-Z)circuits.

Thedevicealsocontainsprotectionagainstexternalmagneticfields.Precautionsshouldbetakentoavoidapplicationofanymagneticfieldmoreintensethanthemaximumfieldintensityspecifiedinthemaximumratings.

Table 2.1 Absolute Maximum Ratings1

MR2A16A

Symbol Parameter Temp Range Package Value Unit

VDD Supplyvoltage2 - - -0.5to4.0 V

VIN Voltageonanypin2 - - -0.5toVDD+0.5 V

IOUT Outputcurrentperpin - - ±20 mA

PD Packagepowerdissipation3 - Note3 0.600 W

TBIAS Temperatureunderbias

Commercial - -10to85

°CIndustrial - -45to95

Extended - -45to110

AEC-Q100Grade1 - -45to130

Tstg StorageTemperature - - -55to150 °C

TLeadLeadtemperatureduringsolder(3minutemax) - - 260 °C

Hmax_writeMaximummagneticfieldduringwrite

Commercial TSOP2,BGA 2,000

A/mIndustrial,ExtendedBGA 2,000

TSOP2 10,000

AEC-Q100Grade1 TSOP2 2,000

Hmax_readMaximummagneticfieldduringreadorstandby

Commercial TSOP2,BGA 8,000

A/mIndustrial,ExtendedBGA 8,000

TSOP2 10,000

AEC-Q100Grade1 TSOP2 8,000

Notes:1. Permanentdevicedamagemayoccurifabsolutemaximumratingsareexceeded.Functionaloperationshouldberestricted

torecommendedoperatingconditions.Exposuretoexcessivevoltagesormagneticfieldscouldaffectdevicereliability.2. AllvoltagesarereferencedtoVSS.3. Powerdissipationcapabilitydependsonpackagecharacteristicsanduseenvironment.

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MR2A16A Rev. 10.1, 7/20135 Copyright © Everspin Technologies 2013

Parameter Symbol Min Typical Max UnitPowersupplyvoltage1 VDD 3.0 3.3 3.6 V

Writeinhibitvoltage VWI 2.5 2.7 3.01 V

Inputhighvoltage VIH 2.2 - VDD+0.32 V

Inputlowvoltage VIL -0.53 - 0.8 V

TemperatureunderbiasMR2A16A(Commercial)MR2A16AC(Industrial)MR2A16AV(Extended)MR2A16AM(AEC-Q100Grade1)4

TA

0-40-40-40

7085105125

°C

1 Thereisa2msstartuptimeonceVDDexceedsVDD,(max).SeePower Up and Power Down Sequencing below.2 VIH(max)=VDD+0.3VDC;VIH(max)=VDD+2.0VAC(pulsewidth≤10ns)forI≤20.0mA.3 VIL(min)=-0.5VDC;VIL(min)=-2.0VAC(pulsewidth≤10ns)forI≤20.0mA.4AEC-Q100Grade1temperatureprofileassumes10%dutycycleatmaximumtemperature(2yearsoutof20yearslife.)

Table 2.2 Operating Conditions

Power Up and Power Down Sequencing

TheMRAMisprotectedfromwriteoperationswheneverVDDislessthanVWI.AssoonasVDDexceedsVDD(min),thereisastartuptimeof2msbeforereadorwriteoperationscanstart.Thistimeallowsmemorypowersuppliestostabilize.

TheEand W controlsignalsshouldtrackVDDonpoweruptoVDD-0.2VorVIH(whicheverislower)andremainhighforthestartuptime.Inmostsystems,thismeansthatthesesignalsshouldbepulledupwitharesistorsothatsignalremainshighifthedrivingsignalisHi-Zduringpowerup.AnylogicthatdrivesEandWshouldholdthesignalshighwithapower-onresetsignalforlongerthanthestartuptime.

DuringpowerlossorbrownoutwhereVDDgoesbelowVWI,writesareprotectedandastartuptimemustbeobservedwhenpowerreturnsaboveVDD(min).

Figure 2.1 Power Up and Power Down Diagram

MR2A16AElectrical Specifications

BROWNOUT or POWER LOSS

NORMAL OPERATION

VDD

READ/WRITE INHIBITED

VWI

2 ms

READ/WRITE INHIBITED

VIH

STARTUP

NORMAL OPERATION

2 ms

E

W

RECOVER

VIH

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MR2A16A Rev. 10.1, 7/20136 Copyright © Everspin Technologies 2013

Parameter Symbol Min Typical Max Unit

Inputleakagecurrent Ilkg(I) - - ±1 μA

Outputleakagecurrent Ilkg(O) - - ±1 μA

Outputlowvoltage(IOL=+4mA)(IOL=+100μA)

VOL - - 0.4VSS+0.2

V

Outputhighvoltage(IOH=-4mA)(IOH=-100μA)

VOH 2.4VDD-0.2

- - V

Table 2.3 DC Characteristics

Table 2.4 Power Supply Characteristics

Parameter Symbol Typical Max Unit

ACactivesupplycurrent-readmodes1

(IOUT=0mA,VDD=max) IDDR 55 80 mA

ACactivesupplycurrent-writemodes1

(VDD=max)CommercialGradeIndustrialGradeExtendedGradeAEC-Q100Grade

IDDW

105105105105

155165165165

mA

ACstandbycurrent(VDD=max,E=VIH)no other restrictions on other inputs

ISB1 18 28 mA

CMOSstandbycurrent(E≥VDD-0.2VandVIn≤VSS+0.2Vor≥VDD-0.2V)(VDD=max,f=0MHz)

ISB2 9 12 mA

1 Allactivecurrentmeasurementsaremeasuredwithoneaddresstransitionpercycleandatminimumcycletime.

MR2A16AElectrical Specifications

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MR2A16A Rev. 10.1, 7/20137 Copyright © Everspin Technologies 2013

MR2A16A3. TIMING SPECIFICATIONS

Table 3.1 Capacitance1

Parameter Symbol Typical Max UnitAddressinputcapacitance CIn - 6 pF

Controlinputcapacitance CIn - 6 pF

Input/Outputcapacitance CI/O - 8 pF

1 f=1.0MHz,dV=3.0V,TA=25°C,periodicallysampledratherthan100%tested.

Table 3.2 AC Measurement Conditions

Figure 3.1 Output Load Test Low and High

Figure 3.2 Output Load Test All Others

Parameter Value UnitLogicinputtimingmeasurementreferencelevel 1.5 V

Logicoutputtimingmeasurementreferencelevel 1.5 V

Logicinputpulselevels 0or3.0 V

Inputrise/falltime 2 ns

Outputloadforlowandhighimpedanceparameters SeeFigure3.1

Outputloadforallothertimingparameters SeeFigure3.2

V

Output

L = 1.5 V

RL = 50 Ω

ZD= 50 Ω

Output

435 Ω

590 Ω

5 pF

3.3 V

Page 8: 4Mb 256K x 16 MRAM Memory - Farnell · PDF fileopyright v Technolog 1 1 1 ev 11 1 MR2A16A FEATURES 256K x 16 MRAM Memory • Fast 35 ns Read/Write Cycle • SRAM Compatible Timing,

MR2A16A Rev. 10.1, 7/20138 Copyright © Everspin Technologies 2013

MR2A16ATiming Specifications

Parameter Symbol Min Max Unit

Readcycletime tAVAV 35 - ns

Addressaccesstime tAVQV - 35 ns

Enableaccesstime2 tELQV - 35 ns

Outputenableaccesstime tGLQV - 15 ns

Byteenableaccesstime tBLQV - 15 ns

Outputholdfromaddresschange tAXQX 3 - ns

Enablelowtooutputactive3 tELQX 3 - ns

Outputenablelowtooutputactive3 tGLQX 0 - ns

Byteenablelowtooutputactive3 tBLQX 0 - ns

EnablehightooutputHi-Z3 tEHQZ 0 15 ns

OutputenablehightooutputHi-Z3 tGHQZ 0 10 ns

BytehightooutputHi-Z3 tBHQZ 0 10 ns1 Wishighforreadcycle.Powersuppliesmustbeproperlygroundedanddecoupled,andbuscontentionconditionsmustbeminimizedoreliminatedduringreadorwritecycles.

2 Addressesvalidbeforeoratthesametime Egoeslow.3 Thisparameterissampledandnot100%tested.Transitionismeasured±200mVfromthesteady-statevoltage.

Table 3.3 Read Cycle Timing1

Read Mode

Figure 3.3A Read Cycle 1

Figure 3.3B Read Cycle 2

A (ADDRESS)

Q (DATA OUT)

tAVAV

tAXQX

tAVQV

Previous Data Valid

Note: Device is continuously selected (E ≤ VIL, G ≤ VIL).

Data Valid

A (ADDRESS)

E (CHIP ENABLE)

G (OUTPUT ENABLE)

Q (DATA OUT) Data Valid

tAVAV

tAVQVtELQV

tELQX

tBHQZ

tGHQZ

tEHQZ

tBLQVtBLQX

tGLQVtGLQX

LB, UB (BYTE ENABLE)

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MR2A16A Rev. 10.1, 7/20139 Copyright © Everspin Technologies 2013

MR2A16ATiming Specifications

Table 3.4 Write Cycle Timing 1 (W Controlled)1

Parameter Symbol Min Max Unit

Writecycletime2 tAVAV 35 - ns

Addressset-uptime tAVWL 0 - ns

Addressvalidtoendofwrite(Ghigh) tAVWH 18 - ns

Addressvalidtoendofwrite(Glow) tAVWH 20 - ns

Writepulsewidth(Ghigh) tWLWHtWLEH

15 - ns

Writepulsewidth(Glow) tWLWHtWLEH

15 - ns

Datavalidtoendofwrite tDVWH 10 - ns

Dataholdtime tWHDX 0 - ns

WritelowtodataHi-Z3 tWLQZ 0 12 ns

Writehightooutputactive3 tWHQX 3 - ns

Writerecoverytime tWHAX 12 - ns

1 AllwriteoccursduringtheoverlapofElowandWlow.Powersuppliesmustbeproperlygroundedanddecoupledandbuscontentionconditionsmustbeminimizedoreliminatedduringreadandwritecycles.IfGgoeslowatthesametimeorafterWgoeslow,theoutputwillremaininahighimpedancestate.AfterW,EorUB/LBhasbeenbroughthigh,thesignalmustremaininsteady-statehighforaminimumof2ns.TheminimumtimebetweenEbeingassertedlowinonecycletoEbeingassertedlowinasubsequentcycleisthesameastheminimumcycletimeallowedforthedevice.

2 Allwritecycletimingsarereferencedfromthelastvalidaddresstothefirsttransitionaddress.3 Thisparameterissampledandnot100%tested.Transitionismeasured±200mVfromthesteady-statevoltage.Atanygivenvoltageortemperate,tWLQZ(max)<tWHQX(min)

W (WRITE ENABLE)

A (ADDRESS)

E (CHIP ENABLE)

t AVAV

t AVWH t WHAX

t AVWL

t WLEHt WLWH

DATA VALID

t DVWH t WHDX

Q (DATA OUT)

D (DATA IN)

t WLQZ

t WHQX

Hi -Z Hi -Z

Figure 3.4 Write Cycle Timing 1 (W Controlled)

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MR2A16A Rev. 10.1, 7/201310 Copyright © Everspin Technologies 2013

MR2A16ATiming Specifications

Table 3.5 Write Cycle Timing 2 (E Controlled)1

Figure 3.5 Write Cycle Timing 2 (E Controlled)1

Parameter Symbol Min Max Unit

Writecycletime2 tAVAV 35 - ns

Addressset-uptime tAVEL 0 - ns

Addressvalidtoendofwrite(Ghigh) tAVEH 18 - ns

Addressvalidtoendofwrite(Glow) tAVEH 20 - ns

Enabletoendofwrite(Ghigh) tELEHtELWH

15 - ns

Enabletoendofwrite(Glow)3 tELEHtELWH

15 - ns

Datavalidtoendofwrite tDVEH 10 - ns

Dataholdtime tEHDX 0 - ns

Writerecoverytime tEHAX 12 - ns1 AllwriteoccursduringtheoverlapofElowandWlow.Powersuppliesmustbeproperlygroundedanddecoupledandbuscontentionconditionsmustbeminimizedoreliminatedduringreadandwritecycles.IfGgoeslowatthesametimeorafterWgoeslow,theoutputwillremaininahighimpedancestate.AfterW,EorUB/LBhasbeenbroughthigh,thesignalmustremaininsteady-statehighforaminimumof2ns.TheminimumtimebetweenEbeingassertedlowinonecycletoEbeingassertedlowinasubsequentcycleisthesameastheminimumcycletimeallowedforthedevice.

2 Allwritecycletimingsarereferencedfromthelastvalidaddresstothefirsttransitionaddress.3 IfEgoeslowatthesametimeorafterWgoeslow,theoutputwillremaininahigh-impedancestate.IfEgoeshighatthesametimeorbeforeWgoeshigh,theoutputwillremaininahigh-impedancestate.

A (ADDRESS)

E (CHIP ENABLE)

W (WRITE ENABLE)

Q (DATA OUT)

D (DATA IN)

tAVAV

tAVEH tEHAX

tELEH

tEHDXtDVEH

tAVEL

Hi-Z

tELWH

Data Valid

UB, LB (BYTE ENABLE)

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MR2A16A Rev. 10.1, 7/201311 Copyright © Everspin Technologies 2013

Parameter Symbol Min Max Unit

Writecycletime2 tAVAV 35 - ns

Addressset-uptime tAVBL 0 - ns

Addressvalidtoendofwrite(Ghigh) tAVBH 18 - ns

Addressvalidtoendofwrite(Glow) tAVBH 20 - ns

Writepulsewidth(G high) tBLEHtBLWH

15 - ns

Writepulsewidth(Glow) tBLEHtBLWH

15 - ns

Datavalidtoendofwrite tDVBH 10 - ns

Dataholdtime tBHDX 0 - ns

Writerecoverytime tBHAX 12 - ns

1 AllwriteoccursduringtheoverlapofElowandWlow.Powersuppliesmustbeproperlygroundedanddecoupledandbuscontentionconditionsmustbeminimizedoreliminatedduringreadandwritecycles.IfGgoeslowatthesametimeorafterWgoeslow,theoutputwillremaininahighimpedancestate.AfterW,Eor LB/UBhasbeenbroughthigh,thesignalmustremaininsteady-statehighforaminimumof2ns.Ifbothbytecontrolsignalsareasserted,thetwosignalsmusthavenomorethan2nsskewbetweenthem.TheminimumtimebetweenEbeingassertedlowinonecycletoEbeingassertedlowinasubsequentcycleisthesameastheminimumcycletimeallowedforthedevice.

2 Allwritecycletimingsarereferencedfromthelastvalidaddresstothefirsttransitionaddress.

Timing Specifications

Table 3.6 Write Cycle Timing 3 (LB / UB Controlled)1

Figure 3.6 Write Cycle Timing 3 (LB / UB Controlled)

W (WRITE ENABLE)

A (ADDRESS)

E (CHIP ENABLE)

UB, LB (BYTE ENABLED)

t AVAV

t AVEH t BHAX

t AVBL t BLEHt BLWH

Data Valid

t DVBH t BHDX

Q (DATA OUT)

D (DATA IN)

Hi -Z Hi -Z

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MR2A16A Rev. 10.1, 7/201312 Copyright © Everspin Technologies 2013

MR2A16A4. ORDERING INFORMATION

Figure 4.1 Part Numbering System

Carrier Blank = Tray, R = Tape & ReelSpeed 35 nsPackage (YS = TSOP2, MA = FBGA)Temperature RangeBlank = Commercial 0 to + 70 °C

C = Industrial -40 to + 85°C V = Extended -40 to +105 °CM = AEC-Q100 Grade 1 -40 to +125 °C

Die Revision08 = 8-Bit, 16 = 16-bit

A = 3.3v VDD , D = 3.3v VDD and 1.8v. VDDQ

Density 256 = 256 Kb, 0 = 1Mb, 1 =2Mb, 2 =4Mb, 4 =16MbMagnetoresistive RAM (MR)

MR 2 A 16 A V YS 35 R

Part Number Description - Operating Temperature Grade Package Ship Pack Temp Range

MR2A16AYS35 3.3v256Kx16MRAMCommercial 44-TSOP2 Tray 0to+70°C

MR2A16ACYS35 3.3v256Kx16MRAMIndustrial 44-TSOP2 Tray -40to+85°C

MR2A16AVYS35 3.3v256Kx16MRAMExtended 44-TSOP2 Tray -40to+105°C

MR2A16AMYS351 3.3v256Kx16MRAMAEC-Q100Grade1 44-TSOP2 Tray -40to+125 °C

MR2A16AYS35R 3.3v256Kx16MRAMCommercial 44-TSOP2 Tape&Reel 0to+70°C

MR2A16ACYS35R 3.3v256Kx16MRAMIndustrial 44-TSOP2 Tape&Reel -40to+85°C

MR2A16AVYS35R 3.3v256Kx16MRAMExtended 44-TSOP2 Tape&Reel -40to+105°C

MR2A16AMYS35R1 3.3v256Kx16MRAMAEC-Q100Grade1 44-TSOP2 Tape&Reel -40to+125 °C

MR2A16AMA35 3.3v256Kx16MRAMCommercial 48-BGA Tray 0to+70°C

MR2A16ACMA35 3.3v256Kx16MRAMIndustrial 48-BGA Tray -40to+85°C

MR2A16AVMA35 3.3v256Kx16MRAMExtended 48-BGA Tray -40to+105°C

MR2A16AMA35R 3.3v256Kx16MRAMCommercial 48-BGA Tape&Reel 0to+70°C

MR2A16ACMA35R 3.3v256Kx16MRAMIndustrial 48-BGA Tape&Reel -40to+85°C

MR2A16AVMA35R 3.3v256Kx16MRAMExtended 48-BGA Tape&Reel -40to+105°C1 Preliminary Products: These products are classified as Preliminary until the completion of all qualification tests. The specifications in this data sheet are intended to be final but are subject to change. Please check the Everspin web site www.everspin.com for the latest information on product status.

Table 4.1 Available Parts

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MR2A16A Rev. 10.1, 7/201313 Copyright © Everspin Technologies 2013

Figure 5.1 44-TSOP2

MR2A16A5. MECHANICAL DRAWING

44 PLACES

44 PLACES

Print Version Not To Scale1. DimensionsandtolerancesperASMEY14.5M-1994.2. DimensionsinMillimeters.3. Dimensionsdonotincludemoldprotrusion.4. DimensiondoesnotincludeDAMbarprotrusions. DAMBarprotrusionshallnotcausetheleadwidthtoexceed0.58.

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MR2A16A Rev. 10.1, 7/201314 Copyright © Everspin Technologies 2013

Figure 5.2 48-FBGA

MR2A16AMechanical Drawings

Notes:1. Dimensions in Millimeters.2. Dimensions and tolerances per ASME Y14.5M

- 1994.3. Maximum solder ball diameter measured parallel

to DATUM A4. DATUM A, the seating plane is determined by the

spherical crowns of the solder balls.5. Parallelism measurement shall exclude any effect

of mark on top surface of package.

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MR2A16A Rev. 10.1, 7/201315 Copyright © Everspin Technologies 2013

MR2A16A

Revision Date Description of Change

5 Sept21,2007

ChangedMR2A16ATS35CproductdescriptiontoLegacyCommercial.AddedtheNewCom-mericaltemperatureproduct(MR2A16AYS35)information.Table3:MR2A16AYS35Hmax-write=25Oe.Table4:MR2A16AYS35hasa2mspowerupwaitingperiod.Table6:AppliedvaluestoTBD’sinIDDspecifications.

6 Nov12,2007Table2:ChangedIDDAtoIDDRorIDDW.Table13:AddednoteindicatingthatTSandYSarebothvalidpackagecodes.CurrentPartNumberingSystem:Addedcommercial(missinglet-ter)temperaturerange.

7 Sep12,2008ReformatDatasheetforEverSpin,AddBGAPackagingInformation,AddTape&ReelPartNumbers,AddPowerSequencingInfo,CorrectIOHspecofVOHto-100uA,CorrectacTestConditions.

8 July22,2009 AddTSOP2LeadCross-Section,AddProductionNote.Convertedtonewdocumentformat.

9 Dec16,2011 AddedAEC-Q100Grade1productoptionforTSOP2packagetoTable4.1.RevisedTables2.1,2.2and4.1toincludeAEC-Q100Grade1specifications.Newlogodesign.

10 August29,2012 CorrectederrorinTable1.1.CorrectedFigure2.1.ImprovedmagneticimmunityforIndus-trialandExtendedGrades.CorrectedminorerrorsinTable4.1ProductNumbering.

10.1 July30,2013 CorrectedGtoreadGfor44-TSOPType2inFigure1.2.

6. REVISION HISTORY

Information in this document is provided solely to enable system and software implementers to use Everspin Technologies products. There are no express or implied licenses granted hereunder to design or fabricate any integrated circuit or circuits based on the information in this document. Everspin Technolo-gies reserves the right to make changes without further notice to any products herein. Everspin makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Everspin Technologies assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or inci-dental damages. “Typical” parameters, which may be provided in Everspin Technologies data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters including “Typicals” must be validated for each customer application by customer’s technical experts. Everspin Technologies does not convey any license under its patent rights nor the rights of others. Everspin Technologies products are not designed, intended, or authorized for use as compo-nents in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Everspin Technologies product could create a situation where personal injury or death may occur. Should Buyer purchase or use Everspin Technologies products for any such unintended or unauthorized application, Buyer shall indemnify and hold Everspin Technologies and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Everspin Technologies was negligent regarding the design or manufacture of the part. Everspin™ and the Everspin logo are trademarks of Everspin Technologies, Inc. All other product or service names are the property of their respective owners.

©Everspin Technologies, Inc. 2012

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Filename: EST00193_MR2A16B_Datasheet_Rev10.pdf


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