I International Workshop on Challenges and Trends Beyond LTE-A
Presentation:
Carrier Aggregation: LTE-A New
Challenges for Lab and Field
Speaker: Adryele Neves
Title: Account Manager of Anritsu Brazil (focus on Wireless UEs Manufacturers and R&D
Laboratories in Brazil)
Date: November 6th, 2013
I International Workshop on Challenges and Trends Beyond LTE-A
Table of Contents
• Anritsu – Global Company
• Market trend/ Technology Background
• Anritsu Conformance Wireless Portfolio • MT8820C
• MD8430/MD8480
• MD8475A
• Conformance Test System
• Challenges in the Lab • Powerful Hardware
• Further Applications • Server, IMS/VoLTE
• IPv6 / Wi-fi Applications
• Audio Quality
• Batery Test
• Challenges in the Field
• Anritsu Handhelds Portfolio
• Precision vs. Handheld
• New Challenges
• Anritsu e-Learning (Free)
I International Workshop on Challenges and Trends Beyond LTE-A
2005.05.10 MXR
Europe
Asia & Pacific
North & South America
Japan
Anritsu Global Company
• Europe : 5 Subsidiaries
• Asia & Pacific : 5 Subsidiaries
• North & South America : 4 Subsidiaries
Sales Office Development & manufacturing
Engineering
& Services
I International Workshop on Challenges and Trends Beyond LTE-A
2005.05.10 MXR
Anritsu’s Global Network
Anritsu U.S. Holding Inc.
Holding Company
ˆ
Anritsu Company (U.S.A.)
Anritsu Electronics Ltd. (Canada)
Anritsu Eletronica Ltda. (Brazil)
Anritsu Ltd. (U.K.)
Anritsu S.A. (France)
Anritsu GmbH (Germany)
Anritsu S.p.A. (Italy)
Anritsu AB (Sweden / Finland / Denmark)
Anritsu Company Ltd. (Hong Kong)
Anritsu Company, Inc. (Taiwan)
Anritsu Corporation,Ltd. (Korea)
Anritsu Private Ltd. (Singapore)
Anritsu Proprietary Ltd. (Australia)
Sales Companies
Anritsu Company (U.S.A.)
Anritsu Limited (U.K.)
Manufacturing & Development
Companies
Anritsu Electronics (Shanghai) Co., Ltd. (P.R.China)
Engineering & Services Company
I International Workshop on Challenges and Trends Beyond LTE-A
Market Trend/ Important Technology Background
I International Workshop on Challenges and Trends Beyond LTE-A
Market Trend – Smartphone user device
• # of LTE Smartphone devices lineup are fivefold increase during a year.
• Smartphone is No.1 share in the LTE user device as of Mar. 2013.
Jan. 2012
Source: GSA
I International Workshop on Challenges and Trends Beyond LTE-A
Market Trend – Mobile operator
I International Workshop on Challenges and Trends Beyond LTE-A
Anritsu Conformance Wireless Portfolio
I International Workshop on Challenges and Trends Beyond LTE-A
Conformance
Test
Operator
Acceptance
Test (IOT)
Production Integration /
System Test
Chipset Design /
Core UE R&D
MS269xA & MS2830A
Signal Analyzer
MG3700A
Signal Generator
MD1230B
Data Quality Analyzer
ME7873L
RF Conformance
Test System (RF CT)
ME7834
Mobile Device Test
Platform (Protocol CT)
MD8430A
Signaling Tester with RTD
(Operator Acceptance Library)
MF6900A
Fading Simulator
MT8820C
Radio Communication
Analyzer
(UE Calibration and
RF Parametric Test)
MT8820C
Radio Communication
Analyzer
(RF Parametric Test) ME7834
Mobile Device Test
Platform (Operator
Acceptance)
MD8475A
Signaling Tester
(Application Test)
MD8430A
Signaling Tester with RTD
(L1/L2, Protocol Stack Test)
NEW
I International Workshop on Challenges and Trends Beyond LTE-A
Market Requirements / Anritsu Portfolio
Chipset / UE
Development
UE
Integration
Carrier Acceptance
Test
Conformance Test
ME7834L
RTD
Radvision ProLab
MD8480C MD8430A
MD8475A
CSCF Function
Flexible test development
to support needs of global carriers / UE venders
IMS Signaling
Interworking
Focused on primarily functional requirements
versus signaling requirements
Focused on acceptance and certification testing
for carrier and GCF/PTCRB
Functional * Audio/ Video
Quality *
Audio/ Video
Quality
Performance *
VoLTE Functional Performance
Interworking VoLTE Functional Performance
(*) Specific test items required by Carrier / CT
Audio Quality IMS Signaling
Sequence Editing IMS Signaling
Interworking
Audio/ Video
Quality
VoLTE Functional Performance
Audio Quality IMS Signaling
Sequence Editing
I International Workshop on Challenges and Trends Beyond LTE-A
Commercial UE Development
Android OS Integration Windows OS Integration Application SW Integration
Built-in Completed OS
North America Group
China Group
Europe Group
Operator
Operator
Operator
Operator
Operator
Protocol Stack
Qualcomm
ST-Ericsson
・・・・・・・
Others
Core / Platform R&D
Chipset Venders
OS / Application SW Group
Regional Group / Localization
System Test, Functional Test
CAT, CT, Field Test Operator Requirement Feedback
Application Test, Throughput Test
Example Model for UE development phase
System Test Functional Test Regression Test
Baseband Development
・・・・・・・
・・・・・・・
H/W Part Development
S/W Part Development
Integration
I International Workshop on Challenges and Trends Beyond LTE-A
Commercial UE R&D – Integration / System Test
Integration / System test Sanity Test Functional Test Stress Test Performance Test Regression Test
Telephony service (voice, video, data, CSFB, VoLTE)
Supplementary service
Messaging service (SMS/MMS, CB-SMS, CMAS)
Data communication applications
Mobile Service / IMS tests
Application Software
Service interruption
Simultaneous multi-call (voice, video, packet, SMS)
Continuous calls, SMS
Semi-normal test, abnormal test
Test automation
Inte
gra
tio
n
System Test
-Functional
verification
-Performance
verification
-Various internal
root checking
-Automated
regression testing
Target Segment and Application
A lot of items need to be
related to IMS type
environment
Call connectivity and stability (CS-FB, SVLTE, VoLTE)
Handover reliability (InterRAT, IntraRAT, SR-VCC)
System determination / roaming reliability
Battery performance test
Data throughput performance
Performance optimization
Bench marking with competition
I International Workshop on Challenges and Trends Beyond LTE-A
Mobile Apps Emulation for
Smartphone & Tablets •
I International Workshop on Challenges and Trends Beyond LTE-A
Wi-fi Offload • WiFi Data off-load test
– Data traffic will grow to very high due to expand smartphones rapidly
• Most of NW operators have to consider to off load data to WiFi access
3G/LTE Access Network
WiFi (LAN) Access Network
Internet
Core Network
To ensure parental control To execute roaming from public wireless LAN Handover between cellular network
3G/LTE Access Network
WiFi (LAN) Access Network
Internet
Core Network
Current Near future
Smartphone developers have to test procedure in authentication of roaming and confirm ciphering condition on user data
I International Workshop on Challenges and Trends Beyond LTE-A
How Does it Work ?
E112
I International Workshop on Challenges and Trends Beyond LTE-A
Anritsu Handhelds Portfolio
BTS Master
VNA Master
Cell Master
PIM Master
Sprectrum Master
I International Workshop on Challenges and Trends Beyond LTE-A
Bench top equipment x Handhelds
Instrument Carts = Bad Idea!
I International Workshop on Challenges and Trends Beyond LTE-A
Product Differentiation
MS202xA/3xA
4/6 GHz VNA
4/7.1 GHz SPA
MS202xB
20 GHz VNA
(No SPA) MS202xB/3xB
4/6 GHz VNA
4/6 GHz SPA
MS202xC/3xC
6/20 GHz VNA !
9/20 GHz SPA !
•C-Series is over 2x
bandwidth of competitive
handhelds
•Freq/Time and now
Distance Domain
•Benchtop in your hand
•B-Series offers:
•AM/FM/PM Demod
•Coverage Mapping
•Freq/Time and now
Distance Domain
•Aggressive pricing
I International Workshop on Challenges and Trends Beyond LTE-A
Passive Intermodulation (PIM) testing
I International Workshop on Challenges and Trends Beyond LTE-A
What is Passive Intermodulation (PIM)
• PIM = interference
• PIM = new frequencies generated by Tx signals at a cell site
when they encounter “non-linear” junctions in the RF path
• PIM falling in an operator’s uplink can elevate the noise
floor:
▪ Dropped calls ▪ Access failures ▪ Slower data rates
F1 F2
IM 3
IM 5
IM 7
IM 9
IM 3
IM 5
IM 7
IM 9
TX signals at site
Passive Intermodulation (PIM) Passive Intermodulation (PIM)
I International Workshop on Challenges and Trends Beyond LTE-A
What is non-linear at a cell site?
• Loose metal-to-metal contacts
– Poorly terminated RF connectors
– Metal flakes inside connectors
– Loose RF connectors
– Metal flashing on rooftops
– Loose rivets, screws, etc.
• Rusty / corroded surfaces
• Non-linear materials
– Nickel / Steel
– Ferrite
Nov-13
I International Workshop on Challenges and Trends Beyond LTE-A
What does PIM look like to the operator?
High
average
noise
level
Lower
average
noise level
QU
IET
BU
SY
QU
IE
T BU
S
Y
PIM
Repair
I International Workshop on Challenges and Trends Beyond LTE-A
First Generation PIM Master
• Introduced PIM Master™ Dec. 2010
• Distance-to-PIM™ technology
• 43 to 46 dBm output power (20 to 40 W)
• Controlled using:
– BTS Master
– Cell Master
– Site Master
– Spectrum Master
Three models:
850 MHz, 900 MHz, 1900/2100 MHz
I International Workshop on Challenges and Trends Beyond LTE-A
New Second Generation PIM Master
• World’s first:
– battery operated
– high power PIM analyzer
• Lightweight / small size
– one-half the weight
– one-forth the size
• 25 to 46 dBm (0.3 to 40
W)
• Distance-to-PIM™
• No external controller
required
Six models:
700 MHz (U/L), 850 MHz, 900 MHz
1800 MHz, 1900 MHz, 1900/2100 MHz, 2600 MHz
I International Workshop on Challenges and Trends Beyond LTE-A
MW82119A – PIM testing at top of the tower
Remote Radio Head (RRH) sites
• Fiber & DC power to RF unit
• RF path is jumper cable + antenna
• PIM sources reduced, but not
eliminated
• Traditional test equipment not
useful:
– Heavy
– No AC power
• MW82119A is the solution:
– Light weight
– Battery operation
– Remote control option
I International Workshop on Challenges and Trends Beyond LTE-A
Adryele Neves – Account Manager [email protected] +55 11 3283-2511 +55 11 99218-8239
Thanks for your attention! Free LTE Trainning avaiable in the link bellow:
http://www.anritsu.com/en-US/Services-Support/Training-Education/index.aspx