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    6. Spectral Techniques

    Spectroscopy is the study of

    spectra the quantitative

    measurement of spectral lines:

    their width, depth and shape.

    We measure a line profile - a

    graph of the specific intensity,

    or flux density, of radiationreceived from a source as a

    function of frequency.

    Often the shape of the line profile is simply characterised by a measure of

    its width (e.g. equivalent width see A2 Theoretical Astrophysics).

    Spectroscopy is of fundamental importance to astrophysics because it

    allows us to deduce many physical characteristics of planets, stars and

    galaxies even though we observe them remotely, from enormous distances.

    Intensity

    frequency

    Continuum

    0Schematic diagram of an absorption line

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    From analysis of spectral lines we can learn about:-

    Characteristic from

    1. Chemical elements frequency

    2. Chemical abundances intensity

    3. Bulk velocity (i.e. velocity frequency

    of atmosphere as a whole)

    4. Temperature, pressure, line width

    gravity

    5. Spread of velocities line width

    6. Magnetic and electric field fine structure in lines

    (e.g. Zeeman splitting)

    0

    0

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    We can collect light in a narrow frequency range using a filter

    Effectiveness measured by spectral resolving power,R

    Examples: Dye filter

    Interference filter

    But we need or higher to be useful (i.e. to be

    sensitive to Doppler shifts of a few km/s)

    =

    =

    00R (6.1)

    10010~ R

    410~R

    510~R

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    Much higher spectral resolving powers can be achieved using aPRISM or a DIFFRACTION GRATING

    White light Red light

    Blue light

    White light

    Red light

    Blue light

    Blue light

    Red light

    Note that a prism disperses blue

    light more strongly than red light,while for a diffraction grating red

    light is dispersed more strongly

    than blue light.

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    a

    For an infinite diffraction

    grating with light incident atright angles (normal incidence),

    the dispersed light has an

    intensity maximum when the

    path difference betweenadjacent light rays satisfies

    na =sin (6.2)

    sinaPath difference =

    Constructive interference

    a = spacing between lines of grating

    n = order of the maximum

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    If the light is incident at an

    oblique angle, , maximaoccur at path differences

    which satisfy:-

    ( ) na =+ sinsin

    a

    )sin(sin +aTotal path difference =

    (6.3)

    To determine the angular dispersion

    (i.e. the spread in angular deflection

    corresponding to a given spread in

    wavelength) we differentiate (6.2) or

    (6.3) with respect to wavelength.

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    nd

    da =

    cosDifferentiating

    Hence

    cosa

    n

    d

    d=

    (6.4)

    (requires to be in radians)

    Angular dispersion

    We can achieve a highangular dispersion via:

    o high order

    o small

    o large

    a

    Suppose the dispersed light is focussed on a detector (e.g. a CCD) using a

    lens or mirror of focal length f

    Then

    d

    d

    dfdfdx ==

    Linear separation of lines on detectorActual separation of lines in spectrum

    (6.5)

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    nd

    da =

    cosDifferentiating

    Hence

    cosa

    n

    d

    d= (6.4)

    (requires to be in radians)

    Angular dispersion

    We can achieve a highangular dispersion via:

    o high order

    o small

    o large

    a

    Linear Dispersion

    Often also defined is the Reciprocal Linear Dispersion (RLD)

    d

    df

    d

    dx= (6.6)

    dx

    d=

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    Intensity

    sin

    a a2 a3aa2a30

    Intensity profile from a monochromatic light source, of wavelength ,

    diffracted by an infinite diffraction grating, is a series of infinitely thin

    peaks equally spaced in

    In practice, of course, any grating is finite (i.e. only a finite number of

    lines is illuminated)

    sin

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    Finite diffraction grating

    Consider grating with rules.

    For the aperture,

    Phase difference

    By principle of superposition, total wave amplitude diffracted throughan angle is (for an incident wave of unit amplitude)

    (modelling the wave as complex simplifies the algebra)

    1

    2

    3

    4

    5

    N - 1

    NN

    thm

    mamm == sin

    2(6.7)

    )1(2tot 1

    ++++=Niii eee K (6.8)

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    iNiii eeee +++= K2tot

    Multiplying through by

    Subtracting (6.7) from (6.6)

    i.e.

    ie

    (6.9)

    iNi ee = 11 tot (6.10)

    i

    iN

    e

    e

    = 1

    1tot

    (6.11)

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    We can rewrite the RHS as

    i.e.

    using the result

    And the Intensity in direction is then given by

    ( )

    ( )2/2/2/

    2/2/2/

    tot

    iii

    iNiNiN

    eee

    eee

    = (6.12)

    ( )( )2/sin

    2/sin)1(tot

    Ne

    Ni

    = (6.13)

    ixix

    i eex

    = 21sin

    *

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    Thus

    Primary Maxima occur at (same as for infinite grating)

    But maxima are not infinitely narrow.

    Width of maxima

    Also N 2 secondary maxima in between

    ( ) [ ][ ]2/sinsin2/sinsin 2

    2

    0

    kaNkaII =

    Incident intensity

    2=k = wave number

    na =sin

    aN

    W

    ~

    (6.14)

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    Thus

    e.g. For N = 5

    ( ) [ ][ ]2/sinsin2/sinsin 2

    2

    0

    kaNkaII =

    Incident intensity

    2=k = wave number

    sin

    Intensity

    a

    a2

    a

    a2 0

    (6.14)

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    Thus

    e.g. For N = 6

    ( ) [ ][ ]2/sinsin2/sinsin 2

    2

    0

    kaNkaII =

    Incident intensity2

    =k = wave number

    sin

    Intensity

    a

    a2

    a

    a2 0

    (6.14)

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    The finite width of the primary maxima limits the resolving power of

    a diffraction grating.

    Consider two spectral lines,

    of wavelength and

    Lines are observed at order

    light diffracted

    through angles satisfyingsin

    Intensity

    1 22

    1

    n

    a

    n 11sin

    =

    a

    n 22sin

    = (6.15)

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    The finite width of the primary maxima limits the resolving power of

    a diffraction grating.

    We can only resolve the two

    lines provided they are separatedby (at least) their width.

    In other words, the resolution

    limit is

    Or

    sin

    Intensity

    21

    (6.17)

    aNa

    n =

    nNR =

    =

    Can use an echelle grating to

    achieve a high resolving power;

    lines are blazed cut in a

    special pattern to concentrate

    light in high orders

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    The finite width of the primary maxima limits the resolving power of

    a diffraction grating.

    We can only resolve the two

    lines provided they are separatedby (at least) their width.

    In other words, the resolution

    limit is

    Or

    sin

    Intensity

    21

    (6.17)

    aNa

    n =

    nNR =

    =

    Spectral resolving power dependsnot on ruling separation, but onthe total number of lines on the

    grating and the order of the

    maximum observed.

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    Design of a Slit Spectrometer

    Key features of the design are summarised in the following diagram

    Detector

    Focussinglens

    Grating

    CollimatinglensSlitTelescope

    aperture

    The slit cuts out unwanted light. Its angular size at the collimating lens

    defines the range of angles entering the grating

    Diameter of collimating lens width of grating, so that little light is lost

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    Design of a Slit Spectrometer

    Key features of the design are summarised in the following diagram

    Detector

    Focussinglens

    Grating

    CollimatinglensSlitTelescope

    aperture

    Grating response width = width of primary maxima =

    Focussing lens also produces a diffraction pattern (see next section)

    which smears out light, with width

    Choose so that - i.e.

    gratingDNa =

    focusD

    gratingfocus DD

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    Design of a Slit Spectrometer

    Key features of the design are summarised in the following diagram

    Detector

    Focussinglens

    Grating

    CollimatinglensSlitTelescope

    aperture

    Choose focal length of focussing lens so that width of diffraction peak

    at the detector width of pixel on detector.

    i.e. the diffraction maxima cover several pixels