Analytical Instruments for Material · PDF fileOptical Emission Spectrometer OES 17 ......

Analytical Instruments for Material Characterizations

Regulated Substances and maximum Allowable Concentration

Levels (Threshold Values)ELV RoHS Remarks

Cadmium (Cd)

Lead (Pb)

Mercury (Hg)

Hexavalent Chromium (Cr6+)

Polybrominated Biphenyls (PBB)

Polybrominated Diphenyl Ethers(PBDE)

100ppm

1000ppm

1000ppm

1000ppm

Exempt

Exempt

100ppm

1000ppm

1000ppm

1000ppm

1000ppm

1000ppm

Excellence in Science 4 Excellence in Science 5

3 - 5Material Characterizations for Compliance with EU Regulations on RoHS

6 - 9Energy Dispersive X-Ray Fluorescence Spectrometer EDX

10 - 11Wavelength Dispersive X-Ray Fluorescence Spectrometer WDX

12 - 16Optical Emission Spectrometer OES

17 - 19Electron Probe Micro Analyser EPMA

20 - 23X-Ray Photoelectron Spectrometer XPS

24 - 26Scanning Probe Microscope SPM

27 - 29

X-Ray Diffractometer XRD

The flowchart is based on the EU administrative test method that was originally proposed by the JBCE (Japan Business Council in Europe) in 2003 to the EU for the public administration of testing the six substances regulated under RoHS.

•Effectofclarificationstoapplicableexemptionstatusofrestrictedbrominatedflameretardants

•Clarificationofcriteriawhenevaluatingbybrominecontentinbrominatedflameretardants

Since RoHS is subject to Article 95 of the EU Treaty, lobbying to harmonize content inspection methods

among all EU member countries continues. However, with little progress from the EU itself, the IEC is

considering standardizing inspection methods.

Three Screening Analysis Kits are available to suitdifferent applications.

RoHS Screening Analysis KitKitforscreeningcadmium,lead,mercury,chromium,andbromine.Polyethylenesamplescontainingthesefiveelementsaresupplied in the kit for instrument management.

RoHS and Halogen Screening Analysis KitIn addition to cadmium, lead, mercury, chromium, and bromine, this kit also supports the screening of chlorine in plastics. Polyethylene samples containing these six elements are supplied in the kit for instrument management.

RoHS, Halogen, and Antimony Screening Analysis KitIn addition to cadmium, lead, mercury, chromium, and bromine, this kit also supports the screening of chlorine and antimony in plastics. Polyethylene samples containing these seven elements are supplied in the kit for instrument management.

Material Characterizations for Compliance with EU Regulations on RoHS

No

Failed

Non-Destructive Simultaneous Screening & Measurements for the six substances

FTIR PBB, PBDE?

ICP-AES/MS, AAPrecise measurement of

Cd, Pb and HgCd<100ppm

Pb, Hg<1000ppm

Confirmation analysis performedwhen necessary

Yes

Yes

YesYes

Yes

YesNo

No

No

No

No

UVSelective measurement of

Cr6+ using diphenylcarbazide method

Cr6+<1000ppm

OK OKFailed

Failed

GCMSPrecise measurement of

PBB and PBDEPBB, PBDE<1000ppm

Total CrCr<1000ppm

EDX

300ppmBr<30000ppm

300ppm>Br Br30000ppm

Total Br

EDX

(PBB/PBDE)

Cd, Pb, HgCd<100ppm

Pb, Hg<1000ppm

EDX

OK

• Ofthe6substancesregulatedbyRoHs,theapplicableexemption status of deca-BDE was decided. (October15,2005)

• Thresholdvaluesweredecidedbythecommittee. ELV (June 29, 2002) and RoHs (August 29, 2002) and RoHs. (August 19, 2005)

• ThethresholdvaluedenominatorforbothELVandRoHsis“homogeneous material”, but this has not been clearly defined.Therefore,separateguidancenotes to provide clarificationforRoHsareexpected.

• BoarddecisionregardingELVappendixIIrevision(September 30, 2005) eliminated the ELV prerequisite prohibiting intentional use, Currently, RoHs does not have regulations prohibiting intentional use.

• BeawarethatbothELVandRoHsincludedefinitionsofapplicable exemption status.

NEW

Key Features and Capabilities •Solid,liquid,powder&thinfilm*•IntuitivesoftwareforRoHS,halogen*,antimony*, tin*screening&generalapplications*•Analysisinairenvironment•Minimummaintenancerequired•Coatingthicknessmeasurement*•NOliquidnitrogenrequired

Measurement Range • EDX-LE 13AIto92U

Detection Limit of EDX Unit : μg/g

It was calculated from standard deviation after 10 repeat measurements using cellulose blank sample.

Assemble Sample Cup Pack Sample Set Sample for Analysis Select Program & Start

6 Excellence in Science

EnergyDispersive

X-RayFluorescenceSpectrometer

EDX

Elemental Analysis

How It Works

An X-ray source irradiates a sample, which in turn emits fluorescent x-rays. The fluorescent X-rays are characteristic of the material. This information is used to identify an unknown sample.

The intensity of the X-rays is indicative of the concentration of the material within a sample. If a standard is available, a calibration curve can be developed to measure the concentration accurately.

On the other hand, it is possible to estimate the concentration using theoretical method in the absence of a standard.

Major Advantages

Unlike ICP analysis or AAS analysiswhich requires meticulous samplepre-treatments, EDX analysis requiresminimum or no sample pre-treatment.Quantitation ispossible in theabsenceofastandard.ThisIsaccomplishedusingtheoreticalapproximation.

Areas of Application

•Electrical&ElectronicMaterials•Chemicalindustry•Petroleum&Petrochemicals•Building&ConstructionMaterials•MedicalSupplies•AgricultureandFoodProducts•Iron,Steel&Non-FerrousMetals•Machinery&Automobiles•Environment EDX-LE

EDX-7000

Key Features and Capabilities •HighperformanceSiliconDriftDetector(SDD)•Highsensitivity,highresolution&highspeed•Sleekdesignwithsmallfootprint•Solid,liquid,powder&thinfilm•Analysisinair,vacuum*,helium-purged*environment•12-sampleturret*forsolid&liquidsamples•NewintuitivesoftwareforRoHS*,halogen*,antimony*, tin*screening&generalapplications•Minimummaintenancerequired•Coatingthicknessmeasurement•NOliquidnitrogenrequired

Measurement Range • EDX-7000 11Nato92U• EDX-8000 6Cto92U

EDX Applications for Pharmaceutical Industry • EDX was adopted as a general analytical method of USP from 1 May 2015. • Described in USP<735> X-Ray Fluorescence Spectrometry• Main focus is analysis of impurity• Advantages: No sample preparation, non-destructive analysis and few easy steps (as shown below)

Security Functions• Unique user authentication by ID/password, operation logging and screen locking.

Operation Log Output Functions• Allows authorized personnel to output history of user operations or changes of system configuration

setting as audit trail logs.

PDF Output Functions

Validation Functions• Integrity-checking software is built-in to identify any tempering.

Integration Time

300sec

1,200sec

Cr

0.4

0.2

Ni

0.4

0.3

As

0.09

0.03

Ru

0.6

0.3

Pd

1.1

0.5

Pt

0.3

0.2

One EDX over all others Meet FDA 21 CFR Part 11 RequirementsEDX-7000/8000 EDX-7000/8000

*OptionalItem

Excellence in Science 9Excellence in Science 7 Excellence in Science 8

Energy Dispersive X-Ray Fluorescence Spectrometer EDX

EDX-LE

Model specifically forRoHS/ELV screening

NO Liquid nitrogen required

NO Liquid nitrogen required

No Experience NecessaryPerfect for Beginners

EDX

NEW

NEW

WINNER OF IBO 2014 GOLD AWARD

√

√

√

√


WavelengthDispersive

X-RayFluorescenceSpectrometer

WDX

High Resolution Elemental Analysis

How It Works

An X-ray source irradiates a sample, which in turn emits fluorescent x-rays. The fluorescent X-rays are characteristic of the material. This information is used to identify an unknown sample. The intensity of the X-rays is indicative of the concentration of the material within a sample. If standards are available, a calibration curve can be developed to measure the concentration accurately. On the other hand, it is possible to use theoretical method to estimate the concentration, if a standard is not available.

Unlike EDX spectrometers, WDX spectrometers use crystals to diffract the wavelengths of fluorescent X-rays before they reach detectors. As a result, the WDX spectrometers typically have better resolution several times over EDX spectrometers.

Major Advantages

Unlike ICP analysis or AAS analysis which requires meticulous sample pre-treatments, WDX analysis requires minimum or no sample pre-treatment. For example, grinding a solid sample to homogenize the compound. Quantitation is possible in the absence of a standard. This Is accomplished using theoretical approximation.


• Electrical & Magnetic Materials• Chemical industry• Petroleum & Coal Industry• Ceramic, Building & Construction Materials• Papers & Pulps• Agriculture and Food Products• Iron, Steel & Non-Ferrous Metals• Environment Pollutants

XRF-1800

MXF-2400

Excellence in Science 11

Wavelength Dispersive X-Ray Fluorescence Spectrometer WDX

Ca

Measurement Range • 4Be to 92U (Maximum)

Measurement Range • Standard 8O to 92U • Optional 4Be to 92U

Key Features and Capabilities

• Solid, liquid, powder & thin film• Air, vacuum and helium-purged* environment• 4kW generator mated to a high performance X-ray tube• Two detectors (ie. Scintillation Counter & Flow Proportion Counter)• Wide-area analysis (ie. 10mm-30mm)• Local-area analysis (ie. 500µm-3mm)

XRF-1800Sequential XRF Spectrometer

• World-first 250µm mapping• Qualitative / quantitative analysis using higher order X-rays• Film thickness measurement• Inorganic component analysis for high-polymer thin film• Integrated instrument and workbench design• High-speed sample loading system


• High throughput with high level of automation• Solid, liquid & powder• Air, vacuum and helium-purged* environment• 4kW generator mated to a high performance X-ray tube• Simultaneous analysis of up to 36 elements• Spectrometer with fixed monochromator-Two types of detector (ie. Gas Sealed Detector & Flow Proportion Counter)

MXF-2400Multi-Channel XRF Spectrometer

• Spectrometer with scanning monochromator*-One detector (ie. Scintillation Counter)• Small foot-print with compact design• High sensitivity• High precision

LaCeBa

Mapping of Rare Earth Ore by XRF-1800Position 1

Position 2


OpticalEmissionSpectrometer

OES

Highly accurate elemental analysis of ferrous & non-ferrous metals

How It Works

This analytical technique is commonly known as “arc spark spectrometry”. This is because it uses a short pulse of electrical spark to transfer energy to the atoms in the metal samples, which in turn emits lights that are characteristic of the material. This information is used to identify its chemical composition. The intensity of the light is indicative of the concentration of the material within a sample. With standard samples available, a calibration curve can be developed to measure the concentration accurately.

Optical emission spectrometers use diffracting grating to diffract the wavelengths of light before they reach detectors. As there is an array of detectors, an analysis of tens of elements can be performed within a minute. Optical emission spectrometers typically are capable of low detection limit. In Shimadzu’s optical emission spectrometers, various unique features, such as the time-resolution analysis and pulse distribution analysis (PDA) photometry, make them the most sensitive and precise OES on the market.

Major Advantages

Unlike ICP analysis or AAS analysis which requires meticulous sample pre-treatments, OES analysis requires minimum sample pre-treatment. Only need to polish the sample surface to make sure it is free from contaminants and is uniformly flat. The analysis is non destructive.


• Steel Industry• Cast Iron Industry• Aluminium Ingot and Rolling Industry• Machinery Manufacturing Industry• Automobile Industry• Ship-building Industry• Testing Service Industry

PDA-8000

PDA-5000

PDA-7000

PDA-5500 S


Wavelength Range

Metal Base

OES

|

|

•120 to 550 nm (ferrous metals) •120 to 700 nm (non-ferrous metals)

• Fe / Al / Cu / Zn / Pb / Sn / Mg / Ni / Ti etc • Single or multi-element base


• Top-tier spectrometer• Paschen-Runge Spectrometer with 1000mm focal length providing high resolution measurements• Time-Resolution PDA Photometry (Patented Technique)• Temperature-controlled chamber for spectrometer• Vacuum spectrometer enhances sensitivity and low running cost• Novel excitation unit with real-time energy monitoring• Ultra-trace Analysis of high purity materials• Feature-rich software with intuitive interface• Energy efficient design with “Eco-friendly” label

PDA-8000Time Resolution Pulse Distribution Analysis (PDA) Photometry

• The discharge conditions to obtain the optimal measurement sensitivity differ for each spectral line• The table below compares the Background Equivalent Concentration (BEC) values for a conventional method and the PDA-series

Newly Designed SpectrometerAchieves Higher Stability

A Novel Excitation Unit Light ReceptorCondensing System

Constant Monitoring ofthe Discharge Status

Ultra Trace Analysis ofHigh Purity Materials

Exit Slit Toroidal Mirror

PhotomultiplierTube Discharge

Defect

Realtime Energy Monitoring

Constant Regulative Spark (CRS)

Conventional Arc-Like Discharge

Element C P S B

Conventional Method (ppm) 160 150 100 80

PDA Method (ppm) 80 75 50 40

Optical Emission Spectrometer


PDA-7000

OES


• Mid-tier spectrometer• Paschen-Runge Spectrometer with 600mm focal length • Vacuum spectrometer enhances sensitivity and low running cost• Time-Resolution PDA Photometry (Patented Technique)• Ultra-trace Analysis of high purity materials• Choice of discharge types to suit elements and analysis ranges• High-sensitivity analysis of nitrogen in steel • Simple operation software with intuitive interface

Wavelength Range

Metal Base

• 121 to 481 nm (ferrous metals) • 121 to 589 nm (non-ferrous metals)

• Fe / Al / Cu / Zn / Pb / Sn / Mg / Ni / Ti etc • Single or multi-element base


OES

TOP-SELLING MODEL

PDA-5500SKey Features and Capabilities

• High performance at affordable price• Great value• Paschen-Runge Spectrometer with 600mm focal length • Vacuum spectrometer enhances sensitivity and low running cost• Time-Resolution PDA Photometry (Patented Technique)• Ultra-trace Analysis of high purity materials• Choice of discharge types to suit elements and analysis ranges• Simple operation software with intuitive interface• Maximum 24 channels of light receptors• Three types of factory calibration

Wavelength Range • 121 to 481 nm (ferrous metals)• 121 to 589 nm (non-ferrous metals)

Metal Base • Fe, AI & Cu based

Optical Emission Spectrometer


NEW

OES


• Trace analysis of steel and cast iron• Software-guided maintenance procedures • High performance at affordable price• Paschen-Runge Spectrometer with 600mm focal length• Vacuum spectrometer enhances sensitivity and low running cost• New digital excitation source with better performance and less maintenance• Maximum 24 channels of light receptor • Simple operation software with intuitive interface

Wavelength Range

Metal Base

• 170 to 485 nm

• Fe

PDA-8000 PDA-7000 PDA-5500S

Focal Length 1000 mm 600 mm 600 mm

Light Receptors (Max) 64 Channels 64 Channels 32 Channels

Gas Channels Available Available Not Available

Wavelength Range120 to 550 nm (Ferrous)

120 to 700 nm(Non ferrous)

121 to 481 and589 nm

121 to 481 and589 nm

Metal Base Single or Multi Single or Multi Fe, Al & Cu

Factory Calibration Various Types Various Types Various Types

Measurement MethodTime-Resolution

PDA MethodTime-Resolution

PDA MethodTime-Resolution

PDA Method

Real-Time Energy Monitoring Available Not Available Not Available

PDA-R Software Available Not Available Not Available

Summary of Comparisons

PDA-5000

600 mm

24 Channels

Not Available

178 to 481 nm

Fe

Various Types

Intensity IntegrationMethod

Not Available

Available

WINNER OF

PDA-5000

Excellence in Science 17 Excellence in Science 17

ElectronProbeMicroAnalyser

EPMA

A powerful tool capable of high resolution imaging and high resolution analysis of chemical composition, chemical state and even crystalline structure. A far more superior instrument than scanning electron microscope with EDX (SEM + EDX).

How It Works

EPMA has an electron gun and a sophisticated optics system. By varying energy of electron beams, interactions between incident electron beam and sample produce signals. These signals are captured with appropriate detectors to yield backscatter images and secondary electron images. With the presence of an optical microscope, optical images complement the information provided by electron images.

Wavelength dispersive X-ray fluorescence (WDX) spectrometry is typically an integral part of EPMA. Instead of X-ray photons as the excitation energy as in the case of a standalone WDX system, EPMA uses electron beams to generate the effects. Additional analytical techniques such as energy dispersive X-ray (EDX) fluorescence spectrometry and cathode-luminescence attachment can be added.

Major Advantages

The superb WDX resolution is the source of EPMA advantages. It enables wide range of elemental analysis and mapping, as well as chemical state analysis. The latter is not possible in a SEM with EDX.


• Metal Industry• Machinery Manufacturing Industry• Ship-building Industry• Chemical Industry• Aerospace Industry• Materials R&D Industry• Resources & Energy Industry• Semiconductor & Electronic Industry EPMA-1720 Series

EPMA-8050G


EPMA

Elemental Range • Standard 5B to 92U • Optional 4Be to 92U

Unprecedented Spatial Resolution Ultra-High Sensitivity

Comparison of Electron Gun Beam Characteristics (10 kV accelerating voltage)Mapping Analysis of 1% Si in Stainless Steel

(10 kV accelerating voltage)

FE

10nA

100nA

1µA

CeB6 Tungsten

This currentcannot be set

This currentcannot be set


• High brightness Schottky electron source (ie. Field Emission or FE)• 3nm - highest Secondary Electron Image resolution for an EPMA• Ultra high sensitivity analysis• Ultra high resolution mapping• Chemical State Analysis• Wavelength Dispersive X-Ray (WDX) Spectrometer• Secondary Electron Imaging• Backscatter Electron Imaging• Optical Microscope Imaging• Mapping• Magnification 400,000x• Cathode-Luminescence attachment*

CUTTING-EDGE FE ELECTRON OPTICAL SYSTEM

EPMA-8050G

100nA

500nA

1.5µA

5µm

5µm

5µm

NEW


EPMA

Analysis data for foreign matter in a pit. ① is the distribution of iron (Fe); ② is the distribution of titanium (Ti). The high take-off angle used by the EPMA-1720 ensures highly accurate analysis of rough samples.

Maintains the 52.5° X-ray take-off angle that is fundamental to analytical performance.


• 5nm - Secondary Electron Image Resolution• High resolution mapping• Chemical State Analysis• Wavelength Dispersive X-Ray (WDX) Spectrometer• Secondary Electron Imaging

EPMA-1720Series

Elemental Range • Standard 5B to 92U • Optional 4Be to 92U

• Backscatter Electron Imaging• Optical Microscope Imaging• Mapping• Magnification 400,000x• Cathode-Luminescence attachment*

SEM Observation

Image of Tin BallsMagnification: 10,000x

Mapping Analysis

Analysis of solderElement: Pb; region 14 × 14 µm

❷❶

Electron Probe Micro Analyser


X-RayPhotoelectronSpectrometer

XPS

Major Advantages

High resolution analysis of surface of materials. Wide applications in various industries.


• Semiconductor• Catalyst• Thin film coating• Polymer & plastic• Magnetic memory• Nanotechnology

AXIS NOVA

X-Ray Photoelectron Spectrometer (XPS) analyses the chemical compositions and chemical state in a material. Sampling depth is typically 10nm. It is a critical tool for material failure analysis as well as cutting-edge material innovation and development. XPS is also known as Electron Spectroscopy for Chemical Analysis (ESCA).

How It Works

An X-ray source imparts photons of energy onto sample. The absorbed energy causes some electrons to break free from its shell and eject out. They are guided and assisted towards a detector by electrostatic and magnetic lens in a ultra high vacuum atmosphere. XPS has spectroscopy and imaging capabilities. It can measure all the elements except hydrogen (Z=1) and helium (Z=2). Modern XPS is also capable of multiple analytical techniques, eg. auger electron spectroscopy (AES) and ultra-violet photoelectron spectroscopy, that increase its functionality.

• Biotechnology• Fabric • Glass• Battery• Cosmetics

Amicus

AXIS SUPRA


XPS


• State-of-the-art specifications in the XPS world• Unrivalled automated sample handling and ease of use• High resolution and high sensitivity spectroscopy• New Windows-based control software - ESCApe• Small spot size: < 15µm• Lateral resolution: 1µm• Delay-Line Detector (DLD) with 128 detector channels• 180º Hemispherical analyser (HSA) for spectroscopy• Spherical mirror analyser (SMA) for parallel imaging• High power Al monochromator X-ray source with 500mm Roland circle• Fully automatic electron-only charge neutralizer• Scanned and snapshot spectroscopy modes• 2D imaging• Multi-technique capabilities including Scanning Auger Microscopy (SAM) Schottky Field Emission Source, Ion Scattering Spectroscopy (ISS), Secondary Ion Mass Spectrometry (SIMS) & Ultraviolet Photoelectron Spectroscopy (UPS)

AXIS SUPRA

X-Ray Photoelectron Spectrometer

NEW

ARGUABLY THE BEST XPSON THE MARKET



• Superb automated sample handling with the best specifications in the world• Ideal for QA and problem solving tasks• Delay-Line Detector with 128 detector channels• 180° Hemispherical analyser (HSA) • Spherical mirror analyser (SMA)• High resolution and high sensitivity spectroscopy• Small spot size, < 15µm• High power Al monochromator with 500mm Rowland circle• Fully automatic charge neutralizer• Scanned & snapshot spectroscopy modes• 2D imaging mode• Compact footprint

AXIS NOVA

XPS



• Compact & versatile XPS ideal for routine laboratory analysis• Rapid sample introduction system• Automated carousel for multiple samples• Dual anode (Mg & Al source)• Single channeltron detector with low/high pass filter• Integrated ion etching source• Single technique system

Amicus

XPSX-Ray Photoelectron Spectrometer

LOW COST, HIGH PERFORMANCE XPS


Scanning

ProbeMicroscope

SPM

Sample observation down to atomic resolution. It is used for surface morphologic and topographic study.

How It Works

SPM consists of a cantilever with a sharp tip at its end that is used to scan the sample surface. When the tip is brought into close range of a surface, forces between the tip and surface cause a deflection of the cantilever. A laser spot is used to measure the deflection by reflecting it off the top surface of the cantilever onto a detector. Several forces can be imaged, measured and even manipulated. Some common examples are mechanical contact force, magnetic force, electric current etc. Measurements can be done in air, vacuum or liquid environment. Effects of temperature, humidity, gas and electrochemistry on samples can be studied.

Major Advantages

Ultra high resolution analysis of surface of materials. A wide variety of sample characteristics can be analysed. Relevant to a big spectrum of industry.


• Living organisms, eg. E.coli bacteria • Metals, eg. boundary surface of plating layer• Non metals, eg. ferroelectric domains• Minerals, eg. observation of calcite in solution• Ceramics, eg. film dispersed with silica• Polymers, eg. Li-ion battery separator• Powders, eg. toner particle• Nanotechnology, eg. rendering images using electric potential • Thin films, eg. cross-section of the film• Semiconductors, eg. electric potential analysis of organic thin film transistor• Coatings, eg. baking finished surface SPM-9700

SPM-8000FM


SPMScanning Probe Microscope


• Highly versatile with a wide range of scanning modes• Headslide mechanism gives high stability • Headslide mechanism enhances efficiency• Design is resistant to vibration, wind & noise without a need for a special external enclosure• Wide variety of 3D rendering functions using mouse operations• SPM observation in liquid medium• SPM observation in humidity, gas, temperature, lighting controlled environment• Small footprint

Observation and measurement of hydration / solvation are possible now


• Ultra-high resolution observation in air or liquids• Performance level on par with a vacuum-type SPM• Uses Frequency Modulation method• Headslide mechanism gives stability• Headslide mechanism enhances efficiency• Small footprint

SPM-9700

SPM-8000FMNEW


SPM

3-in-1 Integrated Microscope: Optical / Laser / Probe


• Integrated Optical / Laser Scanning / Scanning Probe Microscope• Seamless Accurate Measurement from millimeters to nanometers• Never lose sight of target when switching from one microscopic observation

to another• Significant reduction in measurement time• Ultra-wide range of observations

OLS-4500

256 µm 640 µm

64 µm 1280 µm

5 µm20 µm

NANO SEARCH MICROSCOPE

NEW

Excellence in Science 27Excellence in Science 27

OneSight

X-RayDiffractometer

XRD

XRD-7000

XRD-6100

To study crystallographic properties such as phases, angles and distance between planes etc. These pieces of information are useful as they indicate properties such as strengths, chemical signature, ease of dissolvation etc.

How It Works

This analytical technique is non destructive. X-rays focused on a sample fixed on the axis of the goniometer are diffracted by the sample. The changes in the diffracted X-ray intensities are measured and plotted against the incident angles of the sample. Qualitative and quantitative analysis can be performed.

Major Advantages

X-Ray diffractometry offers critical information that no other techniques could match. It is easy to set-up and operate. Interpretation of results is boosted with commercially available databases.


• Metal Industry• Machinery Industry• Ship-building Industry• Chemical Industry• Cement, Ceramic & Glass Industry• Pharmaceutical Industry• Resources & Energy Industry• Electrical & Electronic Industry• Construction & Engineering Industry• Environment & Waste Management Industry • Testing Service Industry


High-Speed Detector With 1280 Channels Achieves High-Speed, High-Sensitivity Performance

The OneSight consists of a semiconductor Si sensor array. It achieves an intensity approximately 100 times higher than that obtained by a scintillation detector. The OneSight can also perform wide-angle range measurement without a scanning goniometer for significantly higher throughput. It can be easily mounted on existing XRD-6100/7000 units at customers’ sites*.

ONE SHOT Function Achieves Simultaneous Measurement of Diffration Profile at a Wide Range Angle

The OneSight can perform a simultaneous diffraction profile measurement at more than 10 deg. angle range without a scanning goniometer. This is useful for quantitative when using a specified diffraction peak.

Standard Sample Data of Asbestos (Chrysotile) (30 sec. measurement time per sample)

OneSight Wide-Range High-Speed Detector

*It is necessary to set up the OneSight parameters during the initial installation. It may be necessary to update the software and hardware. For more details, please contact your representative.

High-Speed Quantitative Analysis using Three Types of measurement Modes

The OneSight features three kinds of measurement modes: High Solution, Standard, and Fast. It enables measurement speed 10 times faster (high resolution), 15 times faster (standard), and 25 times faster (fast) than those attained with a scintillation detector.

NEW

XRD


X-Ray Diffractometer


• Theta-Two theta goniometer• High-speed rate (1000°/min)• High-precision angle reproducibility (0.001° for two theta)• X-Rays are turned on during analysis ONLY• Compact design• Simple operation with intuitive interface• Wide range of optional attachments for conceivable applications

XRD-6100


• Theta-theta goniometer• High-speed rate (1000°/min)• Ultra-precision angle reproducibility (0.0002°)• X-Rays are turned on during analysis ONLY• Compact design• Simple operation with intuitive interface• Wide range of optional attachments for conceivable applications

XRD-7000

XRD

XRD-7000 & XRD-6100Meet FDA 21 CFR Part 11 Requirements

NEW


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Notes:

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Analytical Instruments for Material · PDF fileOptical Emission Spectrometer OES 17 ......

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