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i ANCHORING TRANSITIONS OF NEMATIC LIQUID CRYSTALS ON LARGE ANGLE DEPOSITED SILICON OXIDE THIN FILMS A dissertation submitted to Kent State University in partial fulfillment of the requirements for the Degree of Doctor of Philosophy By Cheng Chen August 2006
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ANCHORING TRANSITIONS OF NEMATIC LIQUID CRYSTALS ON

LARGE ANGLE DEPOSITED SILICON OXIDE THIN FILMS

A dissertation submitted to Kent State University in partial

fulfillment of the requirements for the Degree of Doctor of Philosophy

By

Cheng Chen

August 2006

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UMI Number: 3237852

32378522006

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by ProQuest Information and Learning Company.

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Dissertation written by

Cheng Chen

B.S., Peking University, China. 2001

Ph. D., Kent State University, 2006

Approved by

Chair, Doctoral Dissertation Committee

, Philip J. Bos, Professor of Chemical Physics Interdisciplinary Program

Members, Doctoral Dissertation Committee

, John L. West, Professor of Chemistry Department

, Deng-Ke Yang, Professor of Chemical Physics Interdisciplinary Program

, David W. Allender, Professor of Chemical Physics Interdisciplinary Program

, Kenneth K. Laali, Professor of Chemistry Department

Accepted by

, Oleg D. Lavrentovich, Director, Chemical Physics Interdisciplinary Program

, John R.D. Stalvey, Dean, College of Arts and Sciences

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TABLE OF CONTENTS

TABLE OF CONTENTS................................................................................................... iii

LIST OF FIGURES ............................................................................................................ v

LIST OF TABLES........................................................................................................... xiii

ACKNOWLEDGEMENTS............................................................................................. xiv

Chapter 1 Introduction .............................................................................................................................1

1.1 Liquid Crystalline Materials................................................................................... 1

1.2 Liquid Crystal Displays......................................................................................- 3 -

1.3 Liquid Crystal Alignment and the Method to Achieve the Same ......................- 5 -

1.4 Overview of the Dissertation..............................................................................- 6 -

Chapter 2 Theory .......................................................................................................................................8

2.1 Introduction ............................................................................................................ 8

2.2 Review of Previous Theories ................................................................................. 9

2.2.1 Short Range Interactions ..................................................................................... 9

2.2.2 Long Range van der Waals Potential ................................................................ 10

2.2.3 Competition between Long Range and Short Range Forces............................. 11

2.2.4 Topography ....................................................................................................... 12

2.3 Our Theory ........................................................................................................... 15

2.4 Summary .............................................................................................................. 22

Chapter 3 Physical-chemical properties of LAD-SiOx thin films .............................................23

3.1 Introduction .......................................................................................................... 23

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3.2 Experimental Method........................................................................................... 24

3.2.1 Inorganic Alignment Layer Preparation............................................................ 24

3.2.2 Thin Film Characterization Method.................................................................. 26

3.3 Experimental Results and Discussions................................................................. 29

3.3.1 Surface Topography and Anisotropy ................................................................ 29

3.3.2 Stoichiometry and Surface Properties ............................................................... 30

3.4 Summary .............................................................................................................. 36

Chapter 4 Anchoring Transitions on LAD-SiOx Due to the Change in Liquid Crystal

Composition ..............................................................................................................................................37

4.1 Introduction .......................................................................................................... 37

4.2 Experimental Methods ......................................................................................... 38

4.2.1 Materials............................................................................................................ 38

4.2.2 Sample Preparation ........................................................................................... 39

4.2.3 General Examination Methods and Definition for Alignment Quality............. 39

4.2.4 Pretilt Measurement .......................................................................................... 40

4.2.5 Dielectric Anisotropy Measurement Method.................................................... 40

4.2.6 Birefringence Measurement Method................................................................. 42

4.2.7 Electro-Optical Curve and Response Time Measurement Methods ................. 42

4.3 Experimental Results............................................................................................ 46

4.3.1 The Effect of Large Longitudinal Dipole.......................................................... 46

4.3.2 The Effect of Large Lateral Dipole ................................................................... 49

4.3.3 The effect of varying the molecular structure of the additives ......................... 55

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4.3.4 A Method to Make Improved Liquid Crystal Mixtures for Vertical Alignment

Applications. .............................................................................................................. 60

4.4 Discussions........................................................................................................... 67

4.4.1 The Effect of Large Longitudinal Dipole.......................................................... 67

4.4.2 The Effect of a Large Lateral Dipole ................................................................ 68

4.4.3 The effect of molecular structure on liquid crystal anchoring on SiOx............. 70

4.5 Summary .............................................................................................................. 74

Chapter 5 Temperature Dependence of the Anchoring Transitions on LAD-SiOx..............76

5.1 Introduction .......................................................................................................... 76

5.2 Experimental Methods ......................................................................................... 77

5.2.1 Cell Preparation and Characterization............................................................... 77

5.2.2 Surface Adsorption and Thermal Desorption.................................................... 77

5.3 Results .................................................................................................................. 80

5.3.1 Thermal Induced Anchoring Transitions .......................................................... 80

5.3.2 The Effect of Temperature on the Critical Concentration of 5CB.................... 80

5.3.3 Thermal Desorption........................................................................................... 85

5.4 Discussions........................................................................................................... 89

5.4.1 Thermal Induced Anchoring Transitions .......................................................... 89

5.4.2 The Effect of Temperature on the Critical Concentration of 5CB.................... 90

5.5 Summary .............................................................................................................. 95

Chapter 6 The Effect of LAD-SiOx Thickness on Liquid Crystal Anchoring .......................96

6.1 Introduction .......................................................................................................... 96

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6.2 Experimental Methods ......................................................................................... 97

6.2.1 LAD-SiOx Sample Preparation ......................................................................... 97

6.2.2 Polyimide Sample Preparation .......................................................................... 97

6.2.3 Pretilt Measurement .......................................................................................... 98

6.3 Experimental Results............................................................................................ 98

6.3.1 The Effect of LAD-SiOx Thickness on Liquid Crystal Alignment................... 98

6.3.2 The Effect of LAD-SiOx Thickness on the Critical Concentration of 5CB...... 99

6.3.3 Screening Effect .............................................................................................. 102

6.4 Discussions......................................................................................................... 106

6.4.1 The Effect of LAD-SiOx Thickness on the Alignment of Liquid Crystal....... 106

6.4.2 The Effect of LAD-SiOx Thickness on the Critical Concentration of 5CB.... 108

6.4.3 Screening Effect .............................................................................................. 113

6.5 Summary ............................................................................................................ 114

Chapter 7 Conclusions and Suggestions for Future Work.........................................................115

7.1 Summary of Dissertation Work.......................................................................... 115

7.2 Conclusions ........................................................................................................ 116

7.3 Suggestions for Future Work ............................................................................. 119

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LIST OF FIGURES

Figure 1: Illustration of Dubois-Violette and de Gennes’ model in which long range van

der Waals torque prefers planar alignment while short range forces prefer homeotropic

alignment................................................................................................................................................14

Figure 2: The preference in LC orientation by long-range/short-range forces......................18

Figure 3: The Working Principle of AFM........................................................................................28

Figure 4: The working principle of XPS ..........................................................................................28

Figure 5: AFM images of LAD-SiOx thermally evaporated at a medium angle. (a): 10µm

x 10µm tapping mode 3D image (b): 5µm x 5µm tapping mode 3D image (c): 3µm x

3µm contact mode 2D image of friction (d): Cross-section analysis....................................32

Figure 6: (a): RMS Roughness of LAD-SiOx surface as a function of layer thickness (b):

Anisotropy in surface roughness as a function of layer thickness .........................................33

Figure 7: XPS spectrum of thermally evaporated LAD-SiOx and e-beam evaporated

LAD- SiO2, measured at 45º take-off angle. Atomic ratio of Si and O of the sample can

be calculated from the corresponding area of the peak. Signal of carbon is from the

residual of CO2 or hydrocarbon contaminations on the sample surface. .............................34

Figure 8: XPS spectrum analysis of silicon (Si2p) in (a) e-beam evaporated LAD- SiO2

and (b) thermally evaporated LAD-SiOx. The blue line is the characteristic peak of Si in

SiO2; The cyanic line is the characteristic peak of Si in SiO; The magenta line is the

characteristic peak of Si in Si crystal; The black line is the measured Si peak; The red

line is the synthetic peak based on characteristic Si peak in SiO2, SiO and Si crystal. ...35

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Figure 9: Chemical structure of (a) 5CB and (b) C3.....................................................................45

Figure 10: Anchoring transitions from parallel to homeotropic to parallel again as the

concentration of 5CB in the mixture with LC1 decreases. From top left to bottom right:

pure 5CB, 50% 5CB, 25% 5CB, 10% 5CB, 5% 5CB, and pure LC1. Photo taken with

cells placed between crossed polarizers on a light table. .........................................................47

Figure 11: Anchoring transitions of liquid crystal mixtures (5CB/LC1) on LAD-SiOx due

to the change of the ratio of two components..............................................................................48

Figure 12: The addition of C3 into LC2 leads to an anchoring transition of liquid crystal

on LAD-SiOx from homeotropic to planar ...................................................................................51

Figure 13: The addition of 5CB into the mixture of C3 and LC2 causes an anchoring

transition from planar to homeotropic on LAD-SiOx................................................................52

Figure 14: The correlation between the concentration of C3 and the critical amount of

5CB that is needed to maintain homeotropic alignment of C3/5CB/LC2 mixture on

LAD-SiOx...............................................................................................................................................53

Figure 15: On E-beam evaporated SiO2, more C3 is needed than on thermally evaporated

SiOx to cause its mixture with LC2 to change from homeotropic alignment to planar

alignment ................................................................................................................................................54

Figure 16: Alignment of mixtures with different additives of LC1 on LAD-SiOx,

photographed between crossed polarizers on a light table. From top left to bottom right

cells are filled with: LC1; 10%C5-Ph-Ph-CN (5CB); 10%C5-Ph-Ph-O-C2; 5% C5-Ph-

Ph-Br, 10% C3-Cyclohexyl-Ph-O-C2 (PCH302); 10% C5-Ph-Ph; 10%C6-Ph-Ph-C5. .58

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Figure 17: The effect of cyano groups on the liquid crystal anchoring on LAD-SiOx. Left:

20% C7-Cyclohexyl-Ph-CN; Right: 5% C3 (C3- Cyclohexyl-COO-Ph(-2CN)-O-C2)..59

Figure 18: The addition of 5CB enables the mixture of LC2 and C3 to obtain uniform

vertical alignment on LAD-SiOx with a greater negative dielectric anisotropy. ...............62

Figure 19: The addition of 5CB also allows higher birefringence of the LC2/C3 mixture

to be used for vertical alignment applications on LAD-SiOx..................................................63

Figure 20: E-O curves of two identical LCoS devices filled with LC2 and improved

mixtures (88% LC2, 10% C3 and 2% 5CB) respectively........................................................64

Figure 21: Time response curves of two identical LCoS devices that used LAD-SiOx as

alignment layers and were filled with LC2 and improved mixtures (88% LC2, 10% C3

and 2% 5CB) respectively.................................................................................................................65

Figure 22: The addition of small amount of 5CB into a LC that has a large negative

dielectric anisotropy also helps to produce uniform vertical alignment on polyimide

alignment layers. Photo of SE-7511 coated cells purchased from EHC with ITO

patterns. Left cell was filled with LC1. Right cell was filled with 10% 5CB +90% LC1.

...................................................................................................................................................................66

Figure 23: Dielectric anisotropy of 5CB/LCI mixtures as a function of 5CB concentration

...................................................................................................................................................................71

Figure 24: A cartoon showing the effect of adding 5CB into LC1. Green and orange rods

represent LC1 and 5CB molecules respectively. The blue surface represents the LAD-

SiOx..........................................................................................................................................................72

Figure 25: A cartoon that shows the interaction between the LAD-SiOx and the cyano

groups. .....................................................................................................................................................73

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Figure 26: The working principle of a TDMS (thermal desorption mass spectroscopy) ...79

Figure 27: Microscopic images of a LAD-SiOx cell filled with 1/3 LC1 and 2/3 LC2 at

different temperatures. Left side photos were taken with crossed polarizers. Right side

photos were taken with parallel polarizers. ..................................................................................82

Figure 28: Intensity of transmitted light as a function of temperature. Samples were held

between crossed polarizers with evaporation direction 45º to the polarizer axis. All cells

have the same cell gap ~20µm.........................................................................................................83

Figure 29: Temperature dependence of the anchoring transitions of 5CB/LC1 mixtures on

LAD-SiOx...............................................................................................................................................84

Figure 30: XPS spectrum showing nitrogen atoms of 5CB on LAD-SiOx. On the

spectrum of the original sample and the sample that has been baked at 49.5ºC, a peak of

Nitrogen has been observed. This implies the existence of 5CB on the SiOx surface.

However on the spectrum of the sample that has been baked at 100ºC the nitrogen peak

no longer exists, indicating that the thermal deposption temperature of 5CB is between

49.5ºC and 100ºC.................................................................................................................................87

Figure 31: (a): Thermal desorption curve of 5CB (3 samples of 5CB absorbed on LAD-

SiOx were prepared by the same methods). (b): Thermal desorption curve of C3...........88

Figure 32: The critical concentration of 5CB in the planar-to-homeotropic anchoring

transition of 5CB/LC1 mixtures as a function of temperature................................................94

Figure 33: The effect of LAD-SiOx thickness on the alignment of liquid crystal. A

commercial liquid crystal mixture with a negative dielectric anisotropy was used in the

experiment. ..........................................................................................................................................100

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Figure 34: The anchoring transitions in a 5CB/LC1 mixture depend on the underlying

LAD-SiOx layer thickness...............................................................................................................101

Figure 35: The effect of LAD-SiOx layer thickness on the alignment of 5CB screened by

polyimide that prefers homeotropic anchoring. ........................................................................104

Figure 36: Anchoring Transitions induced by the screening effect of polyimide on top of

LAD-SiOx surface..............................................................................................................................105

Figure 37: Two infinite surfaces separated by distance D.........................................................111

Figure 38. The cross section of a half slab of a liquid crystal cell. .........................................111

Figure 39: The critical concentration of 5CB in the homeotropic-to-planar anchoring

transition of 5CB/LC1 mixtures (shown in Figure 34) depends on the thickness of

underlying LAD-SiOx layer ............................................................................................................112

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LIST OF TABLES

Table 1: The preference in LC orientation by long-range/short-range torques .....................17

Table 2: The refractive index and dielectric constant data of LC1 and LC2 .........................43

Table 3 General Composition of LC1 and LC2. Column 2 and 3 show the gas

chromatography retain time of LC1 and LC2. Void indicates the missing of this

component. Column 4 shows the molecular weight of the component. ..............................44

Table 4: Additives and their effects in determining the anchoring of their mixtures with

LC2 on LAD-SiOx. Here NUP, UVA, UP stand for non-uniform planar, uniform

vertical alignment (homeotropic) and uniform planar respectively................................ 57

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To my family

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ACKNOWLEDGEMENTS

This work is dedicated to my wife Rong Luo and my parents. Without their ceaseless

encouragement and support, the dissertation would not have been possible.

I also feel deeply grateful to Dr. Philip J. Bos who has been my advisor on the

dissertation work. His knowledge and enthusiasm have been a constant source of

motivation to me during this endeavor. Being always very considerate and helpful, Dr.

Bos has given me the most support, not only in my research but also in many other ways.

I would like to thank Dr. James E. Anderson for his collaboration. He has provided

me with numerous insightful suggestions and discussions.

I also want to thank all my colleagues at LCI for their kind help and valuable

discussions.

My committee members deserve special thanks for their willingness to participate

and for their valuable insights.

Funding for my research was provided by HANA Microdisplay Technologies, Inc.

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Chapter 1

Introduction

1.1 Liquid Crystalline Materials

Thanks to the blooming LCD market, the phrase liquid crystal has become more and

more known to the public during the past decade. As told by its name, liquid crystal is an

intermediate phase between isotropic liquid and crystal. Everyday experience has shown

that materials undergo a single transition from solid to liquid. However, there are many

organic materials that exhibit mesophases where the molecular ordering lies between that

of a solid and that of an isotropic liquid. Of all the types of liquid crystal phases, nematic

is one of the most important and also by far the most widely used in the LCD industries.

Generally speaking, a nematic liquid crystal is composed of rod-like organic molecules

trying to align parallel to each other. A nematic liquid crystal has long range orientational

order, but not positional order. The average direction of the molecules is labeled by a unit

vector nρ, called the director. A typical nematic liquid crystal molecule should have a

rigid elongated core and one or two flexible tails.

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The combination of molecular orientational order and fluidity in a single phase

results in remarkable properties unique to liquid crystals. [1] Due to the anisotropy of

nematic liquid crystal molecular shape, and the long range orientational order, the

macroscopic dielectric anisotropy and optical birefringence are prevented from being

averaged to zero. And because of the fluidity (within certain temperature ranges), nematic

molecules are able to realign in an electric field to minimize the free energy. These two

features make nematic liquid crystals very useful in making electrically switchable

optical devices such as LCDs.

Depending on the sign of the dielectric anisotropy, ⊥−=∆ εεε || , nematic liquid

crystals can be divided into two categories. A nematic with a positive dielectric

anisotropy has greater polarizability along the director axis than in the direction

perpendicular to it, and the director tends to align in the direction of the external electric

field. On the contrary, a nematic with a negative dielectric anisotropy is more polarizable

in the direction perpendicular to the director axis, and its director tends to align

perpendicular to the direction of the external electric field.

In regards of optical anisotropy, ∆n = n|| − n⊥ , most nematic liquid crystals are

positive, i.e., light sees a higher refractive index for the electric field of the light along the

director direction than perpendicular to the director direction. When polarized light

passes through a liquid crystal layer it splits into two parts: ordinary light and

extraordinary light. These two may experience different optical retardation because of

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the birefringence of liquid crystals. Also, the output state can be controlled by electrically

adjusting the liquid crystal orientation. Therefore, both phase and amplitude modulation

can be achieved using electrically addressed liquid crystal films.

1.2 Liquid Crystal Displays

Liquid crystals have found applications in many electronic devices because of their

unique electro-optical properties. Among all the applications, the Liquid Crystal Display

(LCD) is no doubt the most famous. Usually an LCD is composed of a thin layer of liquid

crystalline material sandwiched between two glass plates with transparent electrodes. By

controlling the voltage on the electrodes we can control the amount of light transmitted or

reflected by each pixel on the display. Thus, images/text can be produced.

Several liquid crystal modes are commonly used in LCD industries, including TN

(twisted nematic), STN (super twisted nematic), ECB (electrically controlled

birefringence), Pi-Cell, VA (vertical alignment), IPS (in-plane switching) and others.

These names refer to specific liquid crystal director orientation (alignment)

configurations that will be introduced in the next section.

Two very important characteristics for all LCDs are Contrast Ratio and Response

Time. Contrast ratio refers to the ratio of light intensity between a bright state and a dark

state of a LCD. Response time is essentially the time needed to switch the liquid crystal

between bright and dark states. Those two characteristics have been proven to be critical

to the performance of a LCD.

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An LCD can be either transmissive or reflective, or as a combination – transflective.

Direct-view flat panel LCDs in the market are usually transmissive while LCDs on wrist

watches and in Rear Projection TVs (RP-TVs) are reflective. Mobile devices such as cell

phones, MP3 players and PDAs are designed for both indoor and outdoor use so most

likely transflective LCDs are used. For the purpose of this dissertation, I want to

emphasize a type of LCDs called LCoS (Liquid Crystal on Silicon). LCoS is a technology

that incorporates reflective LCD technology onto a silicon chip with a CMOS

(Complimentary Metal Oxide Semiconductor) active matrix lying underneath. LCoS may

enable the industry to manufacture high resolution RP-TVs with lower cost and better

performance. For LCoS technology, a high contrast ratio, a fast response and a long

lifetime with high light throughput are critical. Currently, TN and VA technologies are

the most widely used in LCoS.

In a vertically aligned nematic liquid crystal (VAN) cell, liquid crystals with a

negative dielectric anisotropy are utilized. The inner surfaces of the cell are pretreated

with alignment layers that give a liquid crystal orientation normal to the surface. In a

Normally Black mode, a VAN cell is sandwiched between two crossed polarizers.

Without voltage, light that goes in normal to the surface will not be affected by

birefringence. So, the black state can be really black. With voltage, the director falls

down trying to be perpendicular to the electric field and the effective birefringence

increases. The polarization of the light will be changed when passing through the cell so

that light will pass through the analyzer.

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One major advantage of the VAN mode is its superior high on-axis contrast ratio

even without a retarder. With the help of a negative C plate, a high contrast ratio over big

viewing angle can also be achieved. In most designs, VAN requires a small pretilt angle

from the surface normal to prevent the formation of disclination lines, which seriously

lower the display quality. A larger pretilt angle also allows the liquid crystal device to

work at an increased speed. However, the pretilt angle must be small enough not to

degrade the black state and hence the contrast ratio of the display. So, the pretilt angle has

to be carefully chosen and controlled so that it balances both properties.

1.3 Liquid Crystal Alignment and the Method to Achieve the Same

Traditionally, liquid crystal alignment is achieved by unidirectional rubbing of

polyimide thin films on the surface of the electrodes. Polymer chains are believed to

align along the rubbing direction and provide an anisotropy that aligns the liquid crystal

director. Depending on the type of polyimide used, both planar and vertical alignment

can be obtained. This technique has been widely adopted in LCD manufacturing.

However, rubbing is at the same time thought to be dirty and not preferable in the

clean room because it generates a lot of particles. Rubbing may also produce cosmetic

defects such as scratches on the surface. This is very important to microdisplay

applications where any defect will be magnified, sometimes with a factor of more than 40

when projected. What’s more, the organic nature of the polyimide alignment layer makes

it susceptible to damage from strong light intensity, especially when UV light is

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considered. This leaves the lifetime of the device questionable. Because of all the reasons

above, a rub-free, inorganic alignment layer is highly desired.

In 1971, John L. Janning first reported that obliquely deposited inorganic layers are

able to align liquid crystals. [2] Ever since, the topic has been extensively studied by

numerous researchers. The scope of the research covers many inorganic materials (such

as SiO, SiO2, CaF2, MgF2, metals) and many deposition techniques (such as thermal

evaporation, e-beam evaporation, sputtering, ion-beam etching, and chemical vapor

deposition). The resulting alignments include planar, high pretilt and vertical alignment.

The advantage of using inorganic alignment layers is not limited to a cleaner process and

better UV stability. It also provides a reliable method to produce alignment that is very

difficult to obtain using PI (such as 45° tilt and 3° pretilt of VA). Big efforts have been

spent to understand the mechanism of the alignment, which has been found to be rather

complicated. A detailed literature review of vertical alignment on inorganic layers is

provided in Chapter 2.

1.4 Overview of the Dissertation

In this dissertation we will first review previous work of the alignment of liquid

crystal on inorganic thin films. This includes the methods to produce an alignment layer,

the liquid crystal alignment behavior on inorganic alignment layers, and the mechanism

of the alignment.

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Following the literature review will be a theory section in which we followed and

expanded a model proposed by Dubois-Violette and de Gennes to discuss the competition

between long range van der Waals forces and short range dipolar forces in determining

the liquid crystal alignment on SiOx.

After the discussion of the theory, experimental data on this topic will be presented.

The first part is a study on the physical-chemical properties of SiOx thin films and the

effects on liquid crystal alignment. The second part discusses the how two types of

materials in liquid crystal mixtures affect the alignment by shifting the balance between

long range van der Waals interactions and short range dipolar interactions. Experimental

results on the anchoring transitions caused by the shift of competition balance will be

shown.

The third part reports the temperature dependence of the observed anchoring

transition. Surface adsorption and thermal desorption is believed to cause the change in

short range interaction strength hence the balance between long range van der Waals

potential. Surface thermal desorption experiments were conducted and results are used to

add to our theory to explain the temperature dependence of anchoring transitions.

The dependence of anchoring transition on SiOx thickness is also studied and

explained by the correlation between van der Waals potential and alignment layer

thickness.

Finally, we will summarize all the experimental data and discuss how the theory

explains the phenomena we have considered.

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Chapter 2

Theory

2.1 Introduction

Obliquely evaporated silicon oxide (SiOx) thin films have been of great interest in

the past decades for its use as liquid crystal (LC) alignment layers. It is produced by

evaporating silicon oxide source onto the target surface in vacuum. The obtained silicon

oxide thin film may vary in its Si/O ratio as well as its chemical state so it’s generally

called SiOx. Compared to the traditional rubbed polyimides (PI), SiOx is obtained using a

non-contact method that produces less cosmetic defects as well as fewer particles that can

contaminate the alignment surface. It is more UV stable. It has been found capable of

producing a wide range of pretilt angles. These advantages have caused SiOx to be

considered or implemented in applications like microdisplays and telecommunications

devices. Particularly, Large-Angle-Deposited SiOx (LAD-SiOx) has attracted interests for

its capability of producing vertical (homeotropic) alignment of liquid crystals.

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Along with the increased interest have been efforts to understand the mechanism of

the alignment. In this chapter we will give a review of some work in that area. Based on

those previous theories and the assumptions that we found valid in our particular case

we propose an expansion to a previous model and use it to explain the mechanisms of

liquid crystal anchoring transitions on LAD-SiOx.

2.2 Review of Previous Theories

2.2.1 Short Range Interactions

Surface short range interactions have been found important in liquid crystal

alignment. For example, it was discovered that the 5 degree (shallow angle deposition)

SiOx column structures that stick out from the surface, are important for LC anchoring.

Also important are molecular groups on SiOx that has been coated with alcohol, silane or

other organic materials. The surface has been pictured as a comb with liquid crystal

molecules embedded between the molecular groups sticking out of the surface. 1,2,3 Wu et

al. have reported an interesting alignment phenomenon observed on SiOx and

successfully explained it using this theory. 4

From a more chemical-physical point of view, some other researchers have

demonstrated that the strong interfacial interactions between the surface and the surface

liquid crystal molecules give rise to the anchoring energy that determines the bulk

orientation.5,6 Those interfacial interactions may include steric interaction, charge-charge

interaction, charge-dipole interaction, dipole-dipole interaction, hydrogen bonding or

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even chemical bonding. Since liquid crystals are often polar materials, the coupling

between the permanent dipole of a liquid crystal molecule and the surface dipoles/charges

can be significant. As a result, dipole moments may tend to be normal to the interface to

maximize their interaction. 7 This effect is essentially short range and never goes beyond

a few tens of angstroms but it could be a big contribution to the LC anchoring.

2.2.2 Long Range van der Waals Potential

The van der Waals potential between liquid crystals and an anisotropic medium has

been reviewed by previous researchers. In two classic papers8,9 Dubois-Violette and de

Gennes have shown that the more polarizable axis of liquid crystal will align parallel to

the more polarizable directions of the surface and the angular dependence can be

separated out in the potential by using a simple expression:

θ20 sinUU = (1)

Here U0 denotes the van der Waals potential with liquid crystal aligned in its

preferred direction, and θ is the angle between the two more-polarizable axes. Many

other researchers have followed the same θ2sin model10,11 or P2(cosθ) model12, 13.

More recently Lu14, Vithana15, and Kang16 et al. have shown that LC with a positive

∆ε (dielectric anisotropy) prefers parallel alignment (also called planar) on LAD-SiOx,

while LC with a negative ∆ε prefers perpendicular alignment (also called homeotropic).

Lu et al. have explained the effect by considering the difference in van der Waals

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potential between parallel and perpendicular states, caused by the dielectric anisotropy of

LC.

2.2.3 Competition between Long Range and Short Range Forces

In reference [9], E. Dubois-Violette and P. G. de Gennes discussed the local

Fredericks transitions. A solid/nematic interface was considered, where long range van

der Waals torques favor perpendicular anchoring, while short range effects tend to induce

a parallel anchoring. The final anchoring depends on the relative strength of short range

and long range interaction. The authors proposed to use equation (2.2) to express the total

energy.

0222 sin2)(2sin)(2 θθθ

δ δ

WdzdzdKdzzuF ++−= ∫ ∫

∞ ∞

(2.2)

As shown in Figure 1, z is the distance from surface, δ is a small isotropic gap to

prevent the energy from diverging, which is in the magnitude of the size of a liquid

crystal molecule. 0θ is the angle that director deviates from the short range torque

preferred direction (surface normal) on the interface, θ is the actual anchoring angle. F is

the total free energy; )(zu is the van der Waals potential, K is the elastic constant of

liquid crystal and W is the surface anchoring energy that corresponds to short range

interactions.

Two anchoring transitions were predicted: parallel <—> conical (tilted) and conical

<—> perpendicular. These anchoring transitions are called local Fredericks transitions

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because they are caused by local (short range) forces. Sonin et al. have successfully

demonstrated local Fredericks transitions on mica cleavages covered by an amorphous

film.17, 18

2.2.4 Topography

Topography is an important factor in liquid crystal alignment. A classic view

describes the surface of SiOx as porous columns or periodic structures. LC molecules are

believed to align parallel to the surface everywhere and the orientation of the director is

determined when the elastic distortion energy is minimized.19,20,21,22 A more recent study

by Papanek and Martinot-Lagarde has shown that other factors such as order electricity

are important in the case of porous SiOx surface.23

However, studies have shown that the porous surface morphology exists only when

the evaporation angle (the angle between the SiOx beam and substrate surface) is small.

Evaporation at a medium or larger angle (e.g. >30º) results in a more compact structure

and a smooth surface. 24 , 25 We have confirmed this using AFM (Atomic Force

Microscopy). In this paper we restrict our attention to the particular case of Large Angle

Deposited SiOx (LAD-SiOx), where we found that the elastic energy resulted from the

topography is at least one order of magnitude smaller than the measured anchoring

energy. In this case topography is unlikely to have a significant effect on the liquid

crystal alignment.

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The fact that different liquid crystal materials may choose completely different

orientation on the same SiOx substrate also indicates a mechanism that cannot be

explained solely by the elastic distortions of the director.

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Figure 1: Illustration of Dubois-Violette and de Gennes’ model in which long range van

der Waals torque prefers planar alignment while short range forces prefer homeotropic

alignment.

δ

Z

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2.3 Our Theory

Our ideas are based on the model proposed by de Gennes and Dubois-Violette in

reference [9]. The theory is related to anchoring transitions that are seen on smooth LAD-

SiOx, and is made with three assumptions that have previously been accepted by many

others as discussed in the last section:

a) Short range dipolar interactions tend to align dipole moments perpendicular

to the SiOx surface.

b) Long range van der Waals interaction tends to align the more polarizable

direction of the liquid crystal with those of the alignment layer

c) We can neglect surface topography and resulting steric forces for the case of

large angle deposited SiOx alignment layers used in this study.

From the first assumption it follows that for an LC with a positive ∆ε (the dipole is

more or less along the long molecular axis); a perpendicular boundary condition is

preferred by short range dipolar interactions, while for an LC with a negative ∆ε a

parallel boundary condition is preferred because the dipole is more or less perpendicular

to the long molecular axis.

The second assumption gives the long range force preference of bulk LC orientation

as a function of dielectric anisotropy. We assume here that the in-plane polarizability of

LAD-SiOx is greater than the out-of-plane polarizability. This assumption is consistent

with the molecular structure of SiOx thin films. According to Philipp26,27 and Hohl et al.28

the molecular structure of SiOx can be described in a Random Binding Model. In the

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model every silicon atom is combined with four other atoms (either oxygen or another

silicon) to form a matrix. Considering the dimensions of this matrix, electrons should be

easier to move in-plane than out-of-plane. Therefore, LAD-SiOx should be more

polarizable in the surface plane than along its normal direction.

As a result, a liquid crystal with a positive ∆ε tends to align parallel to the surface

but a liquid crystal with a negative ∆ε tends to align perpendicular to the surface. In both

cases the electrically more polarizable direction of the liquid crystal is parallel to the

more polarizable direction of SiOx.

The third assumption holds true in our particular case of large angle deposited SiOx.

This allows us to neglect the elastic energy distortion on SiOx surfaces.

Based on the above assumptions we can list the orientational preferences of both the

long range van der Waals forces and short range dipolar forces in Table 1. A cartoon

illustration is also shown in Figure 2. It is clear that long range van der Waals forces and

short range dipolar forces have opposite preference in the liquid crystal orientation

direction. The final liquid crystal anchoring on SiOx is determined by the competition

between the long range van der Waals forces and short range surface dipolar forces.

This hypothesis may explain many effects that were hard to explain before. For

example, it has been found that the orientation of the first layer of liquid crystal can differ

appreciably from the orientation in the bulk. Resinikov et al. reported that the first layer

(or a monolayer) of 5CB aligns perpendicularly at the liquid crystal/quartz surface, but

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the bulk of 5CB shows parallel anchoring.29 Similar phenomena have been reported on

other substrates like polymers, crystals and glass.30,31

Table 1: The preference in LC orientation by long-range/short-range torques

Liquid crystal

dielectric

anisotropy

Long range van der

Waals force preferred

liquid crystal orientation

Short range dipolar force

preferred liquid crystal

orientation

Positive Parallel to the interface Perpendicular to the interface

Negative Perpendicular to the

interface Parallel to the interface

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Figure 2: The preference in LC orientation by long-range/short-range forces

+ LC - LC

Short range forces

+ LC - LC

van der Waals force

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Following the model that Dubois-Violette and de Gennes proposed in reference [9]

we start with equation (2.2) to described the free energy in the situation where long range

van der Waals torque prefers parallel anchoring while short range torques prefer

perpendicular anchoring.

We limit the consideration to either planar or perpendicular anchoring ( θθ =0 ) so

that the more complicated conical situation can be excluded. We further assume that

there’s no deformation of liquid crystal director orientation to eliminate the elastic energy.

This assumption may not be completely true but it should give us a fairly good

approximation since the short range interaction only works on the first layer of liquid

crystal. Therefore, the formula is simplified to:

θθδ

22 sinsin)(2 WdzzuF +−= ∫∞

(2.3)

Let us define ∫∞

dzzuU )( then

θθ 22 sinsin2 WUF +−= (2.4)

Here θ can only be 0 (perpendicular) or 2/π (parallel) from the surface normal.

Let us use superscript + and – to denote the material with positive and negative

dielectric anisotropy respectively. Now consider the following situations:

a) An LC with a positive ∆ε When θ = 0, 0=+F ; when θ = π /2, +++ −= UWF2

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So, when ++ < U W , the system has lower energy in the parallel state and when

++ >U W perpendicular anchoring gives lower energy.

b) An LC with a negative ∆ε Similar to equation 2.4, for a liquid crystal that has a negative ∆ε the total energy

can be written as

θθ 22 coscos2 −−− +−= WUF (2.5)

to reflect the preference of long range and short range torque.

When 0=θ , −−− −= UWF2 , when 2/πθ = , 0=−F

So if the short range interaction is strong enough, i.e., −− > UW , a planar anchoring

is preferred. On another hand if −− < UW and van der Waals wins, a perpendicular

anchoring is preferred.

c) A mixture containing both negative and positive ∆ε LCs In a mixture that contains liquid crystals with both positive and negative ∆ε we

have to take into consideration the distribution of each component in the bulk and on the

surface. A simplified model would be two active components (one positive and one

negative) in a neutral base. Here we use x to denote the concentration of one component

in the mixture.

)/( neutralmmmmx ++= −+++ (2.6)

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)/( neutralmmmmx ++= −+−− (2.7)

Here m is the amount of the component in the mixture.

In a liquid crystal mixture sandwiched between two LAD-SiOx, for any component,

it is safe to assume that the bulk concentration in the cell is the same as x . However, the

surface concentration can deviate from x appreciably. The surface concentration of a

component can be represented by its surface coverage ratio Θ defined as

+++ =Θ Nn / (2.8)

−−− =Θ Nn / (2.9)

Here n is the number of adsorbed molecules and N is the maximum number of the

molecules of this component that can be adsorbed, i.e., the total available sites for this

particular component. As can be seen we have assumed that the total available sites could

be different for different components because of their very different properties.

Therefore, the total energy can be expressed as

θθθθ 2222 sinsincoscos2 ++++−−−− Θ+−Θ+−= WUxWUxF (2.10)

The difference in energy between perpendicular anchoring and parallel anchoring is

++++−−−− Θ−+Θ+−=−=∆ WUxWUxFFF )]2/()0([22 π (2.11)

An anchoring transition takes place at the critical point when 0=∆F , i.e.,

++++−−−− Θ−=Θ− WUxWUx (2.12)

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2.4 Summary

In this chapter we have reviewed some important work regarding the liquid crystal

alignment on SiOx. With certain assumptions we showed that long range van der Waals

forces and short range dipolar interactions have opposite preference in liquid crystal

alignment directions. We expressed the competition between long range and short range

interactions in the form of a model proposed by de Gennes et al. Further we expanded

this model to the case where multiple components were present with different dielectric

anisotropies. The contribution to the energy by long range and short range interactions of

each active component is assumed to be proportional to its bulk concentration and surface

coverage ratio respectively. As a result, change of the concentration or surface adsorption

properties of any component may shift the balance between long range van der Waals

interactions and short range dipolar interactions, leading to anchoring transitions. The

point where an anchoring transition happens has been given in the model as a state where

no energy difference exists between homeotropic alignment and planar alignment.

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Chapter 3

Physical-chemical properties of LAD-SiOx thin films

3.1 Introduction

The history of SiOx as a liquid crystal alignment material started with John Janning’s

report in 1971 that obliquely evaporated SiO films caused 5CB and MBBA to align in a

preferred direction. Later it was discovered that the composition of the resulted thin film

may deviate from SiO and become SiOx where x can be between 1 and 2. Janning’s

discovery inspired great interest in the research of SiOx thin films as alignment layers

both in applications and in scientific understanding. More recently, LAD-SiOx alignment

layers found application in producing high quality VAN (vertically aligned nematic)

microdisplays for rear projection TVs. Companies such as Sony and JVC are using this

technique in mass production of products. Many other companies are trying to develop

new technologies and products using SiOx. After 20 years, SiOx alignment layers have

become a hot spot of research in the display industry.

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SiOx alignment layers possess many unique merits when compared to other

alignment layers. For instance, SiOx layers are able to produce a wide range of pretilt

angle that are extremely difficult to produce on traditional polyimide alignment layers.

Another desirable feature of SiOx alignment layers is that the deposition process is

“clean”. Compared to rubbing polyimides, SiOx deposition doesn’t generate so many

particles that contaminate the alignment surface. A rub-free process also prevents the

devices from cosmetic defects such as scratches that can be disastrous to microdisplay

applications. Thanks to its inorganic nature, SiOx alignment layers are also less sensitive

to UV. Because of these unique advantages, SiOx has been widely considered in

applications such as STN, VAN, pi-cell and dual frequency liquid crystal devices.

For VAN applications, silicon oxide films evaporated at a relatively large angle

(>30º w.r.t. the surface) are normally used. Though applications have been successful, the

properties of the LAD-SiOx alignment layers and their effects on liquid crystal alignment

are still poorly understood.

In this chapter we will discuss the properties of LAD-SiOx thin films used in our

experiments.

3.2 Experimental Method

3.2.1 Inorganic Alignment Layer Preparation

Two types of silicon oxide films were used: thermally evaporated SiOx and e-beam

evaporated SiO2. For the purpose of simplicity, I will hereafter name them as SiOx and

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SiO2 respectively. But they should be strictly differentiated for reasons that will be

discussed later.

SiOx alignment layers were prepared by thermally evaporating silicon monoxide

(SiO) powders (purchased from Kurt J. Lesker Company) onto substrates. Though the

equipment is able to do oblique evaporation with any angle to the substrate surface we

did all our depositions at a large angle of incidence (usually 40°-50° w.r.t. the substrate

surface). This particular range of angles has been shown by previous researchers to be

effective in producing vertical alignment of liquid crystal. The thickness of coating is

measured in-situ by an oscillating quartz crystal thickness monitor. The reading of the

thickness monitor has been calibrated by ellipsometry measurement data. The deposition

rate was controlled to be 2~3Å/s. Residual pressure in the deposition chamber was

controlled by back-bleeding air through a needle valve.

Electron beam (e-beam) provides a source of heat with much higher temperature. So

instead of silicon monoxide, silicon dioxide is typically used as the source of evaporation.

In our experiments, SiO2 films were prepared by evaporating quartz pellets by e-beam

using the same process parameters as those used for thermal evaporation. The e-beam

evaporator we used was of the same basic geometry as the thermal evaporator. Thus the

two evaporators have almost the same geometry and should produce substrates for a fair

comparison. E-beam evaporated SiO2 thin films were used only in a few cases in our

study, mainly to compare with SiOx.

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3.2.2 Thin Film Characterization Method

3.2.2.1 AFM

AFM is a widely used technique for surface characterization. It consists of a micro

scale cantilever with a sharp tip (probe) that is used to scan the specimen surface. When

the tip is brought into proximity of a sample surface, forces between the tip and the

sample lead to a deflection of the cantilever according to Hooke’ Law. Typically, the

deflection is measured using a laser spot reflected from the top of the cantilever into an

array of photodiodes. The sample is mounted on a piezoelectric tube that can move the

sample in the z direction for maintaining a constant force, and the x and y directions for

scanning the sample. The resulting map of s(x,y) represents the topography of the sample.

Usually there are two types of scan methods: contact mode and tapping mode. The

former uses static probe while the latter uses probe oscillating at close to its resonance

frequency.

In our measurements we used both contact and tapping modes to scan fresh thin film

samples in order to obtain clear images of the surface morphology. Then the images were

analyzed by software to obtain cross-section plots and statistical information such as

surface roughness, average horizontal domain size, average peak-to-peak height, etc. In

anisotropy measurement, samples were first scanned along the evaporation direction, then

along the direction perpendicular to it. For each scan, surface roughness was calculated.

Roughness anisotropy is defined as the difference between the results of the two scans.

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3.2.2.2 XPS

The XPS technique is based on the photoelectric effect that electrons eject from a

surface when photons impinge upon it. Al Kα (1486.6eV) or Mg Kα (1253.6eV) are

often the photon energies of choice. The energy of the photoelectrons leaving the sample

is determined using a Concentric Hemispherical Analyzer and this gives a spectrum with

a series of photoelectron peaks. The binding energies of the peaks are characteristic of

each element and its local environment. The peak areas can be used (with appropriate

sensitivity factors) to determine the composition of the material’s surface. The shape of

each peak and the binding energy can be slightly altered by the chemical state of the

emitting atom. Hence, XPS can provide chemical bonding information as well.

The XPS technique is highly surface specific due to the short range of the

photoelectrons that are ejected from the solid. By using different incident angles of X-ray,

photoelectrons excited from different depths under the surface can be collected. Thus a

depth profile of the sample can be obtained using an Angular Resolved XPS.

In our study samples of LAD-SiOx and LAD-SiO2, thin films were deposited on

glass substrates and measured using Al Kα as the photon source. Spectra were analyzed

to give chemical state, atomic ratio and other information. Other than the depth profiling,

all measurements were done using a 45° angle.

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Figure 3: The Working Principle of AFM

Figure 4: The working principle of XPS

Electron Energy Analyzer

X-ray source

Pump

Sample

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3.3 Experimental Results and Discussions

3.3.1 Surface Topography and Anisotropy

Surface topography of obliquely evaporated LAD-SiOx was examined by AFM

(Atomic Force Microscopy). Figure 5 shows some typical AFM images of LAD-SiOx

thermally coated at a large angle of incidence. A few points can be seen from the images.

First, the surface topography suggests that LAD-SiOx thin films are possibly

composed of densely packed column structures and the direction of column growth is

close to the surface normal.

Second, the LAD-SiOx surface is very smooth. The cross section analysis (Figure

5(d)) of the sample shows that a typical topographic feature on the surface is around 5nm

in height but 200nm in width (note that the horizontal and vertical scaling in the figures

are very different). The measured RMS roughness is generally around 1nm. So, it’s more

close to reality to picture the LAD-SiOx surface as a smooth ground with pebbles on it,

rather than hills and valleys that are typically seen in glancing angle (such as 5º)

deposition. On the other hand, a typical liquid crystal molecule is only about 2.5nm in

length and 0.5nm in diameter. With this kind of geometry it is difficult to produce any

significant elastic distortion in LC director field.

We also studied the evolution of surface topography as we increased the LAD-SiOx

layer thickness. The results are shown in Figure 6. Other than a tiny decrease in the low

thickness region, little change has been seen in either surface roughness or anisotropy

(defined as the difference in RMS roughness when sample is scanned along evaporation

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direction and perpendicular to evaporation direction) when the thickness increases from

~30nm to ~350nm.

3.3.2 Stoichiometry and Surface Properties

The stoichiometry of LAD-SiOx/SiO2 thin films was studied by XPS (X-ray

photoelectron spectroscopy ). From each spectrum, atomic ratio of each element in the

sample can be calculated. As shown in Fig. 5(a) e-beam evaporated LAD-SiO2 has an

O/Si atomic ratio very close to 2/1. But for thermally evaporated LAD-SiOx we have seen

ratios from 1.2 to 1.7, depending on the deposition conditions. The data from atomic ratio

shows that thermally evaporated SiOx has an oxygen deficient chemical structure. The

Angle-Resolved XPS also allows us to do a depth profile of the stoichiometry. Increasing

the photoelectron takeoff angle by rotating the sample in the energy dispersive plane of

the analyzer reduces the sampling depth. Using this technique we were able to measure

the atomic ratio from the top of the surface to ~1.5nm underneath. The results we

obtained showed no significant difference in atomic ratio of Si and O.

The analysis software of XPS has the capability to fit the Si2p peak with the

characteristic Si2p peak from crystal SiO2, SiO, and silicon. The results shown in Fig 5(b)

imply that e-beam evaporated LAD-SiO2 is more close to crystal SiO2 in its chemical

structure while thermally evaporated LAD-SiOx has a big contribution from SiO and even

a small contribution from silicon. As we all know in a crystal SiO2 each Si atom bonds

with 4 oxygen atoms to form a network of tetrahedrons. However, in the case of SiOx,

there will be many unoccupied silicon orbits due to the lack of oxygen. Since the depth

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31

profile of atomic ratio shows no obvious difference between the top surface and

underneath, we believe that the LAD-SiOx surface also has many dangling bonds or

empty orbitals that may attract nearby dipoles.

As a summary, the e-beam evaporated LAD-SiO2 surface is more passive compared

to the oxygen-deficient thermally evaporated LAD-SiOx surface, which may have lots of

empty Si orbits and dangling bonds on the surface.

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Figure 5: AFM images of LAD-SiOx thermally evaporated at a medium angle. (a): 10µm

x 10µm tapping mode 3D image (b): 5µm x 5µm tapping mode 3D image (c): 3µm x

3µm contact mode 2D image of friction (d): Cross-section analysis

(a)

(c) (d)

(b)

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Figure 6: (a): RMS Roughness of LAD-SiOx surface as a function of layer thickness (b):

Anisotropy in surface roughness as a function of layer thickness

RMS Roughness Anisotropy(Difference between RMS along and perpendicular to evaporation direction)

-0.5

-0.4

-0.3

-0.2

-0.1

0

0.1

0.2

0.3

0.4

0.5

0 50 100 150 200 250 300 350 400

SiOx Layer Thickness/nm

Delta RMSDelta Ravg

Roughness vs. Thickness

0

0.25

0.5

0.75

1

1.25

1.5

0 50 100 150 200 250 300 350 400

SiOx Layer Thickness/nm

along evaporation

perpendicular toevaporation

(a)

(b)

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Figure 7: XPS spectrum of thermally evaporated LAD-SiOx and e-beam evaporated LAD-SiO2,

measured at 45º take-off angle. Atomic ratio of Si and O of the sample can be calculated from the

corresponding area of the peak. Signal of carbon is from the residual of CO2 or hydrocarbon

contaminations on the sample surface.

SiO1.95

SiO1.50

(a)

(b)

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Figure 8: XPS spectrum analysis of silicon (Si2p) in (a) e-beam evaporated LAD-SiO2

and (b) thermally evaporated LAD-SiOx. The blue line is the characteristic peak of Si in

SiO2; The cyanic line is the characteristic peak of Si in SiO; The magenta line is the

characteristic peak of Si in Si crystal; The black line is the measured Si peak; The red line

is the synthetic peak based on characteristic Si peak in SiO2, SiO and Si crystal.

(b)

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3.4 Summary

AFM data reveals that SiOx thin films evaporated at a medium or large angle exhibit

densely packed columnar structures in the direction close to the surface normal. The

surface roughness and anisotropy are so small that we believe surface topography and

elastic distortion energy is unlikely to have a significant effect on the anchoring of the

liquid crystals on LAD-SiOx thin films. It is also extremely hard to use topography to

explain all the anchoring effects we observed in the experiments. A mechanism that

shows a closer relationship between the physical-chemical properties of SiOx and the

liquid crystal molecules must be considered.

The stoichiometry of SiOx also plays an important role in the liquid crystal anchoring.

Unoccupied orbits or dangling bonds on the LAD-SiOx surface tend to interact with the

dipole moment strongly. So, a saturated surface will be more stable and less interactive to

liquid crystal molecules compared to an unsaturated one. From XPS data we can see that

on thermally evaporated the LAD-SiOx surface, silicon atoms are not saturated with

oxygen, leaving many orbits accessible to liquid crystal dipoles. On the other hand, e-

beam evaporated LAD-SiO2 is more like a crystal structure with each Si bonded to 4

oxygen atoms. As a result we can expect a stronger short range surface interaction

between the alignment layer and the liquid crystal on LAD-SiOx, compared to on LAD-

SiO2.

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Chapter 4

Anchoring Transitions on LAD-SiOx Due to the Change in Liquid Crystal Composition

4.1 Introduction

In the previous chapter we reviewed experimental data on LAD-SiOx alignment

layers and concluded that the topography is unlikely to produce significant effects on

liquid crystal alignment in our particular case of medium angle evaporation. Another

piece of evidence that topography should not be held responsible for the entire alignment

phenomenon on SiOx is the material dependence of the alignment. In other words,

different liquid crystals tend to align in different ways on LAD-SiOx. This cannot be

explained using the model of elastic energy minimization. Here in this chapter we will

report experimental observations of the material dependence of liquid crystal alignment

on SiOx. Further, we will demonstrate anchoring transition phenomena due to the change

of the relative ratio of two components in liquid crystal mixtures.

The effect will be explained using the theory we introduced in Chapter 2, by considering

the competition between the long range van der Waals interactions and the short range

dipolar interactions. A novel method that may produce improved liquid crystal mixtures

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for vertical alignment applications will be proposed based on our discovery involving

anchoring transitions.

4.2 Experimental Methods

4.2.1 Materials

Silicon monoxide powder (EVMSIO-1065B, >99.99% purity) purchased from Kurt J.

Lesker was used for the evaporation.

Commercial liquid crystals from Merck were used in the experiment. LC1 and LC2

(part number intentionally omitted for the proprietary of the research sponsor) are liquid

crystal mixtures with negative dielectric anisotropy. Table 2 lists the refractive index and

dielectric constant of these two mixtures. Table 3 lists the general composition of these

two mixtures. Notice that LC1 has a very large negative value of dielectric anisotropy.

Another liquid crystal known as 5CB or K15 (4-cyano-4-n-pentylbiphenyl), also

purchased from Merck was used. 5CB, as shown in Figure 9(a) is a small linear molecule

with a strong polar group on one end. Therefore, it possesses a strong longitudinal dipole

and a positive dielectric anisotropy. All other materials used in the experiments were

synthesized in-house. Among them, 1 – ethoxy – 4 – (4’ – trans -

propylcyclohexylcarboxy) - 2, 3 - dicyanobenzene (hereinafter referred to as C3) is of

particular importance. As shown in Figure 9(b), each C3 molecule has 2 cyano groups on

one side producing a large dipole moment in the direction perpendicular to the molecular

long axis. Also because of the cyano groups and the conjugation with benzene rings, C3

and compounds that have similar structures have been reported to have huge negative ∆ε

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and are used in commercial liquid crystal mixtures as dopants to increase the magnitude

of the negative dielectric anisotropy. 32,33

4.2.2 Sample Preparation

1350Ǻ-thick SiOx films were deposited onto clean glass substrates at 45º by thermal

evaporation. Residual pressure was controlled to be around 1.0x10-5 torr by back-

bleeding air through a needle valve. Coated substrates were assembled into 20µm-thick

cells with anti-parallel deposition directions on the top and bottom plates. Liquid crystal

was forced into the cell under vacuum by capillary force at room temperature. Following

filling, the cells were sealed.

4.2.3 General Examination Methods and Definition for Alignment Quality

After filling, the liquid crystal cells were first examined on a light table between

crossed polarizers. With vertically aligned liquid crystals, cells should always look dark

when rotated. For planar cells, bright-dark alternation will be observed when rotated. A

cell is defined as uniform if all of following criteria have been satisfied: 1) More than

80% of the cell area has uniform brightness or darkness observed by visually; 2) Choose

5 spots in the uniform area that are at the area’s center and 4 corners. For a planar cell,

measure the extinction angle on each spot. The maximum difference between two

extinction angles should be smaller than 2°. Or, for a vertically aligned cell, measure the

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pretilt angle on each spot. The maximum difference between two pretilt angles should be

smaller than 1°. Otherwise a cell is defined as non-uniform.

4.2.4 Pretilt Measurement

The pretilt angle of liquid crystals confined in a cell was measured by one of two

methods: Conoscopy and Crystal Rotation.

The Conoscopy method was mainly used to measure a homeotropic cell with a small

pretilt in which case an off-centered uniaxial cross can be recognized under conoscopic

observation. There’s a simple relationship that determines the pretilt angle:

(r/R)/N.A. = no sinθ (4.1)

Here r is the distance between the conoscopic image center and the cross center. R is

the diameter of the conoscopy. Detailed discussion of this method can be found in

reference [34].

The Crystal Rotation method has been used in our experiments to measure larger

pretilt angles that the conoscopy method is not capable of measuring due to the limitation

of microscope numerical aperture. Details of this method are available in reference [35].

4.2.5 Dielectric Anisotropy Measurement Method

20µm-thick empty cells with 1.0 cm2 patterned ITO electrodes were made in our lab.

Accurate cell gap thickness was measured from the interference patterns formed by the

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reflection from top and bottom surfaces of the gap. The cell uniformity was also carefully

examined by measuring the gap thickness at the center and at four corners of the

patterned electrode. Only those cells with less than 2% thickness variation were used in

the experiments. Spin-coated polyimides were used as alignment layers using the

standard soft bake-hard bake procedure. For the homeotropic cell, SE-7511 was used, and

for the planar cell, SE-2555 was used. Cells were filled with liquid crystal and then

examined for uniformity. Pretilt angle of each cell was measured on a center-plus-four-

corners basis, as described before. The results show pretilt angle to be less than 1° for

planar cells and greater than 89° for homeotropic cells, all angles measured from the

surface.

For each material, the impedances (real and imaginary parts) of both planar cell and

vertical cell were measured on a Hewlett Packard 4284A 20Hz-1MHz precision LCR

meter as a function of frequency, ranging from 1 kHz to 1 MHz. ∆ε was calculated using

the equations of (2), (3), (4), and (5):

;1

0εεωω Aid

CiiZZZ ir −=−=+= (4.2)

;)(00 ir iZZAi

dZAi

d+

−=−=εωεω

ε (4.3)

)( ;

)( 220

220 ir

ri

ir

ir ZZA

dZZZA

dZ+

=+

=εω

εεω

ε ; (4.4)

)()(|| planarvertical rr εεεεε −=−=∆ ⊥ , (4.5)

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Here Z is the impedance, ω is the angular frequency, C is the capacitance, A is the

area of the electrode, d is the cell gap, ε is the dielectric constant, and ε0 is the dielectric

permittivity of the free space. Subscript r and i stand for real and imaginary part

respectively. And subscript || and ⊥ stand for parallel and perpendicular to molecular

long axis respectively.

4.2.6 Birefringence Measurement Method

Birefringence of the liquid crystal mixtures were obtained from the optical retardation

measurements on the planar cells. The same center-plus-four-corners examination on cell

thickness uniformity and pretilt was performed and only cells with less than 2% thickness

variation and less than 1° pretilt (from the surface) were allowed. The optical retardation

of a cell was measured by the standard Senarmont Technique. Birefringence was

calculated from the optical retardation using equation (4.6):

dn δλ ⋅

=∆ (4.6)

Here λ is the wavelength of light, which is 632.8nm in our case, δ is the optical

retardation and d is the cell gap.

4.2.7 Electro-Optical Curve and Response Time Measurement Methods

Electro-optical curves and response times of tested cells were measured using a

home-built setup and software. The test cell is placed between crossed polarizers with its

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surface projection of the easy axis making a 45º angle with the polarization axis. Light

coming out from a 632.8nm He-Ne laser passed through the setup and passed to a

detector. For the E-O curve, 1 kHz AC was applied to the cell with rms voltage ramping

from 0 to 10V. The transmitted light intensity was detected as a function of the ramping

voltage. For response time, the tested cell was switched between 0 and 5V at 1 kHz. The

detector recorded the transmitted light intensity as a function of time. All measurements

were done at 50°C.

Table 2: The refractive index and dielectric constant data of LC1 and LC2

ne no ∆n ε|| ε┴ ∆ ε

LC1 1.6567 1.4920 0.1647 4.5 10.2 -5.7

LC2 1.6560 1.4920 0.1640 3.7 6.4 -2.7

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Table 3 General Composition of LC1 and LC2. Column 2 and 3 show the gas chromatography retain time of LC1 and LC2. Void indicates the missing of this

component. Column 4 shows the molecular weight of the component.

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Figure 9: Chemical structure of (a) 5CB and (b) C3

C

(a)

N

O

C

O

O

C C

N N

(b)

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4.3 Experimental Results

4.3.1 The Effect of Large Longitudinal Dipole

A commercial mixture LC1, which has a large negative dielectric anisotropy (∆ε = -

5.7) was filled into LAD-SiOx cells. While a liquid crystal with a moderate negative

dielectric anisotropy will typically align vertically on LAD-SiOx, LC1 on the contrary

assumes an orientation parallel to it.

5CB was filled into identical cells and was found to align parallel to the SiOx surface

as well. However in this case 5CB has a positive dielectric anisotropy.

Next we mixed 5CB into LC1 and filled the mixtures into LAD-SiOx cells. At room

temperature, when the mixture contains less than 3% 5CB (by weight, the same in the

following) it aligns parallel to the LAD-SiOx surface. When the concentration of 5CB

reaches about 3% an anchoring transition takes place that brings the mixture into

homeotropic alignment. Not until we increase the concentration of 5CB to about 55%

does another transition happen and switch the LC anchoring to parallel again. Figure 10

shows a photo of cells filled with liquid crystal mixtures of 5CB and LC1, observed

between crossed polarizers on a light table. Figure 11 plots the tilt angle of the LC

director (w.r.t. substrate surface) as a function of 5CB concentration.

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Figure 10: Anchoring transitions from parallel to homeotropic to parallel again as the

concentration of 5CB in the mixture with LC1 decreases. From top left to bottom right:

pure 5CB, 50% 5CB, 25% 5CB, 10% 5CB, 5% 5CB, and pure LC1. Photo taken with

cells placed between crossed polarizers on a light table.

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Figure 11: Anchoring transitions of liquid crystal mixtures (5CB/LC1) on LAD-SiOx due

to the change of the ratio of two components

0 10 20 30 40 50 60 70 80 90 100-10

0

10

20

30

40

50

60

70

80

90

100

Tilt

angl

e fro

m s

urfa

ce

C oncentra tion o f 5C B (w eight% ) in the LC 1/5C B m ix ture

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4.3.2 The Effect of Large Lateral Dipole

As described in 4.2.1 C3 has two cyano groups on one side of the molecule. It also

has a huge negative dielectric anisotropy, which makes it desirable as an additive used in

making negative ∆ε commercial liquid crystal mixtures. A commercial liquid crystal LC2

from Merck (∆ε = - 2.7) was used to mix with C3. The reason we chose LC2 is that C3

has a good solubility in LC2 so the anchoring transitions can be more clearly

demonstrated.

LC2 by itself chooses homeotropic orientation on LAD-SiOx. We were not able to

know how C3 aligns on LAD-SiOx because it doesn’t have a nematic phase by itself. We

increasingly added C3 into LC2 and filled the mixtures into LAD-SiOx cells. When the

concentration of C3 is equal to or less than 5% the mixture still aligns perpendicular to

the surface. However, starting from 6% a transition takes place and finally changes the

LC anchoring into planar when the concentration of C3 is equal to or larger than 8%, as

can be seen in Figure 12. The LC anchoring can also be swung back to homeotropic with

the addition of small amount of 5CB to the mixture composed of LC2 and more than 8%

of C3. Figure 13 shows the transitions indicated by the change of LC tilt angle. Also seen

from the Figure 14 is for mixtures with higher concentration of C3, larger amount of 5CB

is needed to trigger the transition.

For the same experiment we have also used e-beam evaporated SiO2 as the alignment

layer. The SiO2 layer was produced with identical thickness and deposition angle to the

thermally evaporated SiOx. Figure 15 shows that on e-beam evaporated SiO2, more C3 is

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needed than on thermally evaporated SiOx to cause its mixture with LC2 to change from

homeotropic alignment to planar alignment.

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Figure 12: The addition of C3 into LC2 leads to an anchoring transition of liquid crystal

on LAD-SiOx from homeotropic to planar

0 5 10 15 20

0

20

40

60

80

100

Tilt

angl

e fo

rm s

ubst

rate

sur

face

Concentration of C3 (weight%) in the mixture of C3 and LC2

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Figure 13: The addition of 5CB into the mixture of C3 and LC2 causes an anchoring

transition from planar to homeotropic on LAD-SiOx

-2 0 2 4 6 8 10 12 14 16

0

20

40

60

80

100

Concentration of 5CB (weight%) in the mixture of C3, 5CB and LC2

Pre

tilt a

ngle

from

sub

stra

te s

urfa

ce/d

egre

e

5.0% C3 7.5% C3 10.0% C3 12.5% C3 15.0% C3

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-2 0 2 4 6 8 10 12 14 16

0

1

2

3

4

5C

ritic

al A

mou

nt o

f 5C

B (w

eigh

t%)

Concentration of C3 (weight%)

Figure 14: The correlation between the concentration of C3 and the critical amount of

5CB that is needed to maintain homeotropic alignment of C3/5CB/LC2 mixture on LAD-

SiOx

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Figure 15: On E-beam evaporated SiO2, more C3 is needed than on thermally evaporated

SiOx to cause its mixture with LC2 to change from homeotropic alignment to planar

alignment

0 5 10 15 20

0

20

40

60

80

100

Tilt

angl

e fro

m s

urfa

ce/d

egre

e

Concentration of C3 (weight% )

Thermal Evaporated SiOx E-Beam Evaporated SiO2

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4.3.3 The effect of varying the molecular structure of the additives

Through our experiments previously described in 4.3.1 and 4.3.2 we found that C3

and 5CB play a keen role in determining the alignment of liquid crystal mixtures on

LAD-SiOx. To understand how the chemical structure and physical properties of the

additives affect the anchoring, several compounds were carefully chosen to use in the

experiments. Their chemical structures are shown in column 2 of Table 4. They have

similarities as well as differences in many ways to 5CB and C3. Specifically, the first 5

compounds have a cyano group along the molecular long axis and thus strong

longitudinal dipole moments; but have different molecular length, shape, number of rings,

and types of linkage groups. Compound 6 has similar structure to compound 5 except that

the cyano groups are in the direction perpendicular to the molecular long axis, so it has a

strong lateral dipole moment. Compound 7 (C3) is the same as compound 6 except that it

has a cyclohexyl ring instead of benzene. Compound 8 to 13 are all similar to compound

1 but their functional groups along the molecular long axis are less polar or even non-

polar. Compound 14 has not only less longitudinal polarity, but also a cyclohexyl ring

instead of benzene. Except 5CB and 8CB (compound 1 and 2), all compounds are

synthesized in our institute. With these dopants, comparisons become possible between

their polarity, molecular shape, dielectric anisotropy, electronic conjugation, and other

properties.

Additives are mixed with LC1 to observe the effect on anchoring. The experimental

results are listed in Table 4.

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Two conclusions can be made from the results. First, a small amount of a material

that has a cyano group at the end of its molecular long axis tends to promote homeotropic

alignment. This is clearly demonstrated in Figure 16 where a bunch of additives that have

similar structure to 5CB were tested for the effects on LC1 alignment. Second, a small

amount of a material that has cyano groups on the side of the molecular axis tends to

promote planar alignment.

Figure 17 shows a photo of two cells observed between cross polarizers. The left one

was filled with a mixture of LC1 and a material that has a longitudinal cyano end-group.

The right hand side one was filled with a mixture of LC1 and a material that contains two

lateral cyano groups. As a result, the left cell is uniform homeotropic and the right cell is

uniform planar.

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Table 4: Additives and their effects in determining the anchoring of their mixtures with

LC2 on LAD-SiOx. Here NUP, UVA, UP stand for non-uniform planar, uniform vertical

alignment (homeotropic) and uniform planar respectively.

Compound Host Liquid Crystal Weight % of dopant Alignment

LC1 0 NUP

Dopant Weight % of dopant Alignment

1 (5CB) CN

From 2.5% to 50% UVA

2 (8CB) CN 5%, 10% UVA

3 CN

20% UVA

4 N CN

O 10% UVA

5 O

O

O CN 10% UVA

6 O C

O

O C

O

O

NC CN

5% UP

7 (C3) O

C

O

O

C C

N N

5%,10% UP

8 Br 5%, 25% NUP

9 O 4%, 10% NUP

10 10%, 33.3% NUP

11 10%, 25% NUP

12 O O

4%, 10% NUP

13 O 5%, 10% NUP

14 O

4%, 10%, 33.3% NUP

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Figure 16: Alignment of mixtures with different additives of LC1 on LAD-SiOx,

photographed between crossed polarizers on a light table. From top left to bottom right

cells are filled with: LC1; 10%C5-Ph-Ph-CN (5CB); 10%C5-Ph-Ph-O-C2; 5% C5-Ph-

Ph-Br, 10% C3-Cyclohexyl-Ph-O-C2 (PCH302); 10% C5-Ph-Ph; 10%C6-Ph-Ph-C5.

Here Ph represents a phenyl (benzene) ring; C stands for carbon; O stands for oxygen and

Br stands for bromine.

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Figure 17: The effect of cyano groups on the liquid crystal anchoring on LAD-SiOx. Left:

20% C7-Cyclohexyl-Ph-CN; Right: 5% C3 (C3- Cyclohexyl-COO-Ph(-2CN)-O-C2)

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4.3.4 A Method to Make Improved Liquid Crystal Mixtures for Vertical Alignment

Applications.

Electro-optical devices using vertically aligned liquid crystals with a negative

dielectric anisotropy (VAN) have been widely used in many applications because of their

high contrast ratio. To achieve lower driving voltage and faster response, liquid crystals

with large ∆ε are preferred. Unfortunately, it is well known that these types of liquid

crystals are very difficult to align vertically on SiOx, sometimes even on polyimides.

However, the experimental discovery we discussed in previous sections points out a

potential way to solve this problem. If an appropriate amount of a positive dielectric

material, such as 5CB is added to the host material that has a large negative dielectric

anisotropy, uniform vertical alignment can be easily achieved.

Commercial liquid crystal mixtures that have negative ∆ε are generally made by

mixing highly negative dopants into a neutral or slightly positive base liquid crystal

mixture. As an example, we will use a mixture of LC2 and C3 to explain how the method

we propose may help to improve the liquid crystal properties for VAN applications.

In section 4.3.2 we discussed the effect of introducing C3 into base material LC2. We

found that if greater than 4% of C3 was added, the alignment of the mixture deviated

from homeotropic toward planar. This effect practically prohibited us from producing

useful liquid crystal mixtures with LC2 and C3 with a larger negative ∆ε. We also

reported that the addition of 5CB allowed mixtures of C3 and LC2 to form vertical

alignment that they couldn’t do originally. Though 5CB exhibits a positive ∆ε itself the

overall effect still shows improved ability to produce vertical alignment with a larger

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negative ∆ε. Figure 18 shows that improvement can be achieved in the magnitude of the

negative value of ∆ε vs. the amount of added 5CB. Also found was an improvement in

the birefringence as shown in Figure 19.

We made two 1.3µm-thick reflective liquid crystal cells using LAD-SiOx as the

alignment layer. One was filled in with LC2. Another was filled with the mixture of 88%

LC2, 10% C3 and 2% 5CB. The electro-optical and time response curves were measured.

As shown in Figure 20, the device with the improved liquid crystal mixture has a lower

threshold voltage and a higher optical retardation. The response times shown in Figure 21

are roughly the same, but since the improved LC has higher birefringence, the device

could be made thinner to achieve a faster response time.

Another interesting disclosure is that the addition of a small amount of 5CB or similar

materials into a liquid crystal with a large negative dielectric anisotropy also helps to

produce uniform vertical alignment on polyimide alignment layers. We used two

identical empty cells from EHC with homeotropic polyimide coatings inside. One was

filled with LC1 and another one was filled with the mixture of 10% 5CB and 90% LC1.

As shown in Figure 22, both cells look like vertical alignment. But closer examination

reveals that the one filled with LC1 has higher pretilt (bright) region around the gasket,

the ITO pattern and at the filling port. But the one filled with the 5CB mixture shows

almost perfect uniform vertical alignment.

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Figure 18: The addition of 5CB enables the mixture of LC2 and C3 to obtain uniform

vertical alignment on LAD-SiOx with a greater negative dielectric anisotropy.

-1 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 162.6

2.8

3.0

3.2

3.4

3.6

3.8

4.0

4.2

4.4

4.6

4.8

5.0

5.2

|∆ε|

Concentration (weight%) of C3 in the mixture of C3, 5CB and LC2

Without 5CB, uniform vertical alignment cannot be achieved for C3 > 4%

With critical amount of 5CB

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-1 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

0.12

0.14

0.16

0.18

Without 5CB, uniform vertical alignment cannot be achieved for C3 > 4%

With critical amount of 5CB

Concentration (weight%) of C3 in the mixture of C3, 5CB and LC2

∆n

Figure 19: The addition of 5CB also allows higher birefringence of the LC2/C3 mixture

to be used for vertical alignment applications on LAD-SiOx

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Figure 20: E-O curves of two identical LCoS devices filled with LC2 and improved

mixtures (88% LC2, 10% C3 and 2% 5CB) respectively.

0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0 7.5 8.0

0

20

40

60

80

100

Nor

mal

ized

Lig

ht In

tens

ity

Voltage/V

LC2 Improved mixture of

10% C3, 2% 5CB and 88% LC2

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Figure 21: Time response curves of two identical LCoS devices that used LAD-SiOx as

alignment layers and were filled with LC2 and improved mixtures (88% LC2, 10% C3

and 2% 5CB) respectively.

-1 0 1 2 3 4 5 6 7 8 9 10 11

0

10

20

30

40

50

60

70

80

90

100

Nor

mal

ized

ligh

t int

ensi

ty

Time/ms

LC2 switch on LC2 switch off Improved mixture switch on Improved mixture switch off

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Figure 22: The addition of small amount of 5CB into a LC that has a large negative

dielectric anisotropy also helps to produce uniform vertical alignment on polyimide

alignment layers. Photo of SE-7511 coated cells purchased from EHC with ITO patterns.

Left cell was filled with LC1. Right cell was filled with 10% 5CB +90% LC1.

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4.4 Discussions

4.4.1 The Effect of Large Longitudinal Dipole

In 4.3.1, we showed that the addition of small amount of 5CB into LC1 (which has a

large negative ∆ε) changes the LC anchoring on SiOx from parallel to vertical. But,

further increasing the amount of 5CB changes the anchoring back to parallel again. We

have discussed the competition between long range van der Waals forces and short range

dipolar forces in the chapter on Theory. Here we continue the discussion to explain the

experimental data.

Liquid crystal mixtures with a negative ∆ε are usually obtained by mixing a base LC

with materials that have very high negative ∆ε, such as C3. Since LC1 has a large

negative ∆ε we expect it to contain a relatively large amount of negative additives. The

effects of doing so on LC anchoring are two-fold. On one hand an increased ∆ε will

increase the anisotropy in van der Waals potential, making vertical alignment a more

preferred LC anchoring on LAD-SiOx. On the other hand, the short range interaction

between LAD-SiOx surface and negative additives such as C3 also increases, but with

parallel orientation as its more favorable anchoring direction. In the case of LC1, short

range dipolar interaction exceeds the long range van der Waals interaction so liquid

crystal aligns parallel to the SiOx surface.

5CB is a small molecule with a large longitudinal dipole moment and a positive ∆ε. It

favors parallel anchoring by van der Waals forces but vertical anchoring by short range

dipolar forces. When a small amount of 5CB is added to LC1 5CB molecules may bind

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with the SiOx surface preferentially, which substantially changes the anchoring

preference of short range forces towards favoring homeotropic alignment. Due to the

limited amount of 5CB in the mixture, bulk properties are unlikely to be noticeably

altered so the long range force still favors homeotropic anchoring. Hence both long range

and short range interactions agree on the anchoring direction homeotropic alignment is

obtained. Further increasing the amount of 5CB makes the ∆ε of the bulk LC more

positive and turns the van der Waals potential preference towards parallel anchoring. This

can be seen in Figure 23, in which dielectric anisotropy of the mixture was measured as a

function of 5CB concentration. However since the SiOx surface becomes more or less

saturated with 5CB molecules the short range interaction doesn’t increase. As a result

long range van der Waals forces eventually prevail and the LC changes back to parallel

anchoring.

This process of anchoring transition is illustrated in the cartoons of Figure 24.

4.4.2 The Effect of a Large Lateral Dipole

In the experiment described in 3.3.1.2, C3 is mixed with LC2 causing an anchoring

transition of the liquid crystal from homeotropic to planar. Adding 5CB into the mixture

shifts the anchoring back towards vertical. This effect can also be explained by the theory

we proposed in Chapter 2.

C3 has a two cyano groups hence a very large dipole moment perpendicular to its

molecular long axis. The addition of C3 into LC2 leads to the increase of short range

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dipolar interaction between the liquid crystal and the LAD-SiOx. It also contributes to

the van der Waals potential due to its negative ∆ε. But the increase in short range

interactions must be more profound to cause the anchoring transition towards planar

alignment.

The effect of adding 5CB afterwards is the same as discussed in the previous section

when 5CB is mixed with LC1. 5CB molecules bind with SiOx surface preferentially and

make the short range dipolar interactions favor an anchoring direction perpendicular to

the LAD-SiOx surface, while in the bulk, C3 still dominates the long range van der Waals

interaction so a homeotropic alignment is preferred. Since both long range and short

range interactions favor homeotropic alignment the anchoring is switched back to

homeotropic.

The reason why critical concentration of 5CB is quasi-proportional to the

concentration of C3 lies in the short range forces. For C3 short range force prefers

parallel anchoring while for 5CB it prefers vertical anchoring. The result is that to keep

the surface short range interaction in favor of homeotropic anchoring the favorable

interaction between 5CB and LAD-SiOx must exceed the unfavorable interaction between

C3 and LAD-SiOx. Therefore, more 5CB is required in a system that contains more C3 to

maintain homeotropic alignment.

In the comparison of SiOx and SiO2 we showed that the critical concentration of C3

needed to trigger the anchoring transition is much higher on LAD-SiO2 than LAD-SiOx.

We believe that this is also because e-beam evaporated LAD-SiO2 has less surface

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polarity than thermally evaporated LAD-SiOx, meaning the short range surface dipolar

interactions (that prefer parallel anchoring) between LAD-SiO2 and C3 is smaller than

that between LAD-SiOx and C3. Therefore, more C3 is needed for LAD-SiO2 to achieve

the same magnitude of short range torque on SiOx to compete with long range van der

Waals torque and change the anchoring direction.

4.4.3 The effect of molecular structure on liquid crystal anchoring on SiOx

In section 4.3.3 we tested several compounds for their ability to promote homeotropic

alignment on SiOx. The experimental results show that a molecule with a cyano group at

the end of its molecular axis helps to generate homeotropic alignment, while a molecule

with cyano groups on its side helps to obtain planar alignment. We have already

explained that this effect is due to the short range interactions between liquid crystal

molecules (especially cyano groups) and the LAD-SiOx surface. Though we believe that

any large dipole moment in general will cause similar effect, we give an explanation of

why cyano group looks particularly effective in our experiments. Let us review the

stoichiometry of LAD-SiOx described in the Chapter 2. LAD-SiOx is an oxygen-deficient

structure. According to the random-binding model, an Si atom forms a tetrahedron with 4

randomly selected atoms (Si or O). At the surface, Si has nothing to bind hence has a

vacant orbital. These orbitals are electron acceptors, which makes SiOx a Lewis acid. On

the other hand, a cyano group has a pair of spare electrons, which makes it a strong

electron donor, i.e., a Lewis base. The strong interaction between a Lewis acid and base

makes the cyano-group orientated along surface normal as shown in Figure 25.

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Dielectric Anisotropy of LC1/5CB mixtures

-8

-6

-4

-2

0

2

4

6

8

10

12

0% 20% 40% 60% 80% 100%

5CB concentration (wt%)

die

lectr

ic a

nis

otr

op

y

Figure 23: Dielectric anisotropy of 5CB/LCI mixtures as a function of 5CB concentration

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Figure 24: A cartoon showing the effect of adding 5CB into LC1. Green and orange rods

represent LC1 and 5CB molecules respectively. The blue surface represents the LAD-SiOx.

(a)

(b)

(c)

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Figure 25: A cartoon that shows the interaction between the LAD-SiOx and the cyano

groups.

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4.5 Summary

In this chapter we have shown our experimental results and explanations on the

material dependence of liquid crystal alignment on LAD-SiOx and the anchoring

transitions caused by the material dependence. The experimental results can be concluded

as follow:

• A liquid crystal with a positive ∆ε aligns parallel to LAD-SiOx surface while

that with a moderate negative ∆ε aligns vertical to LAD-SiOx surface.

However, a liquid crystal with a large negative ∆ε aligns parallel to LAD-

SiOx surface.

• The addition of small amount of a material that has a large longitudinal dipole

to a liquid crystal that has a large negative ∆ε promotes perpendicular

anchoring on LAD-SiOx. But further increasing the amount of additive leads

to planar alignment.

• The addition of a material that has a large lateral dipole to a liquid crystal

with a moderate ∆ε leads to an anchoring transition from homeotropic to

planar alignment on LAD-SiOx. Further introduction of a small amount of a

material with a large longitudinal dipole can switch the anchoring back to

vertical.

Results were explained by the following points:

• Dipole moment (or cyano group) tends to align perpendicular to the LAD-

SiOx surface. Therefore, a material with a longitudinal dipole prefers the

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homeotropic boundary condition while a material with a lateral dipole prefers

the planar boundary condition.

• Assuming that the small additive molecules with large longitudinal dipole

moments will bind with the LAD-SiOx surface preferentially, they will

favored in covering the LAD-SiOx surface hence change the overall

orientational preference of surface short range dipolar interactions toward

homeotropic alignment.

• Long range van der Waals interaction between LAD-SiOx and the positive ∆ε

additive favors planar anchoring. Therefore, the addition of the additive with a

large longitudinal dipole also shifts the long range forces towards favoring

planar alignment.

• The final alignment depends on the relative strength of these two opposite

effects.

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Chapter 5

Temperature Dependence of the Anchoring Transitions on LAD-SiOx

5.1 Introduction

Liquid crystal alignment on SiOx has been found to be temperature dependent. But

most commonly pretilt angle of liquid crystal has been mentioned in the literature without

much regard to the influence of temperature. Some work has been published on the

temperature behavior of liquid crystals 36, 37, 38, 39, 40, 41, 42 , most of which proposed to use

the temperature dependence of the order parameter (S) to explain the temperature

dependence of liquid crystal orientation. The temperature-correlated term can come into

the free energy either through the S-dependence of the van der Waals interaction, the S2-

dependent elastic adaptation to the surface topology term, or through the order electricity

term that depends on the gradient of S on the SiOx surface.

Most of the reported experimental results show that anchoring transitions become

obvious only when temperature is about 1°C below the TNI. However, Vithana et al. have

reported that there is a gradual increase in the pretilt angle of homeotropic alignment on

SiOx

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starting from about 30°C below the TNI. 43 We observed similar effects in our

experiments on LAD-SiOx. We found that a smooth anchoring transition from

homeotropic to planar alignment can start at least 20°C below the clearing temperature.

More interestingly, the transition can be in the opposite directions for different nematics.

While the temperature dependence of the order parameter has been successful in

explaining many orientational effects of liquid crystals we propose in this chapter another

possible explanation that we found to be useful in discussing the observed phenomena in

our particular case.

5.2 Experimental Methods

5.2.1 Cell Preparation and Characterization

SiOx was evaporated onto substrates at a large angle of incidence. Cells were

assembled with anti-parallel evaporation directions on the top and bottom substrates. Cell

thickness was ~20µm. Liquid crystals were filled by capillary force under vacuum. Pretilt

angle was measured by conoscopy and crystal rotation.

5.2.2 Surface Adsorption and Thermal Desorption

The combination of Thermal Desorption analysis and Mass Spectroscopy makes an

effective tool for studying the surface interaction between LAD-SiOx and liquid crystal

molecules. The equipment we used was a Thermo Electron Polaris Q GC-MS with Direct

Exposure Probe (DEP). The principle of this method is illustrated in Figure 26. The

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sample is placed on the probe and inserted into a vacuum chamber where the probe is

heated up with a pre-set temperature ramping profile. Molecules that are originally

absorbed on the sample surface are excited by the heat and leave the surface. Then the

free molecules are bombarded by an electron beam and get ionized. Ions fly into the mass

spectrometer and are analyzed. From the measurement, a time dependent mass spectrum

is obtained. This can be translated into the relative abundance of certain chemicals with

evolving temperature, from which we should infer the basic information of the binding

properties between these chemical and the surface.

In the experiments, LAD-SiOx was deposited onto both sides of aluminum foils and

soaked into diluted liquid crystal solutions (0.3% by weight in isopropyl alcohol). After

more than 8 hours the foils were taken out and gently dried. Dried foils were cut into

small pieces around 1mm x 6mm size to be compatible with the crucible in the probe.

This also helps with a good thermal conductivity between sample and the probe hence

accurate temperature control on the samples can be achieved. Sample was heated up at

10°C/min. Real-time temperature measurement was done by a thermal coupler on the

probe. The mass spectra of desorbed materials were recorded as a function of time.

It is true that the LAD-SiOx surface will absorb many things other than the target

liquid crystal molecules during the handling. When heated, all the absorbents tend to be

set free from the surface and will be all recorded by the mass spectrometer. So before the

measurement we had first obtained the standard mass spectrum of each target molecule

so we can look only at their spectral signatures.

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Figure 26: The working principle of a TDMS (thermal desorption mass spectroscopy)

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5.3 Results

5.3.1 Thermal Induced Anchoring Transitions

Several liquid crystals have been found to align on LAD-SiOx according to the

temperature. For example the mixture composed of 1/3 LC1 and 2/3LC2 aligns vertically

on LAD-SiOx at room temperature. But as the temperature increases the liquid crystal

director tilted down towards planar alignment, which can be seen from the microscopic

photos shown in Figure 27.

Cells filled with different liquid crystals were placed between crossed polarizers with

the evaporation direction 45º to the polarizer axis. A He-Ne laser passes through the

polarizers and the sample in the normal direction. We measured the transmitted light

intensity as a function of temperature. For the cells filled with LC1 mixtures we found

that when the cell was heated the intensity of transmitted light went up. This effect

becomes more abrupt when the temperature is beyond ~50°C. Figure 28 shows the

measured results of several mixtures. This data shows that the optical retardation of the

cell increases with the temperature, indicating a deviation of LC director from

perpendicular towards planar orientation.

5.3.2 The Effect of Temperature on the Critical Concentration of 5CB

In the anchoring transitions described in 4.3.1 (Figure 11) we observed a shift of

anchoring transition point due to this temperature dependence effect. As shown in Figure

31 the first anchoring transition (happens at lower concentration of 5CB) is obviously

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shifted due to the temperature change. The concentration of 5CB required to obtain

homeotropic alignment (defined as the critical concentration) ascends when the

temperature increases. On the other side of the plot, since 5CB has a nematic-isotropic

transition temperature as low as ~37°C the anchoring transition points of some mixtures

become unable to be measured when the concentration of 5CB is high. However, judging

from the available data we don’t see any indication of noticeable thermal induced

anchoring shift on the high concentration side.

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Figure 27: Microscopic images of a LAD-SiOx cell filled with 1/3 LC1 and 2/3 LC2 at

different temperatures. Left side photos were taken with crossed polarizers. Right side

photos were taken with parallel polarizers.

Figure 1 : SiO 1/3-2/3, T=84.0 C Figure 2 : SiO 1/3-2/3, Very Big Pretilt T=84.9 C

45deg with crossed polarizers 0deg with crossed polarizersFigure 3 : SiO 1/3-2/3, Planar T=85.0 C

Figure 4 : SiO 1/3-2/3, Planar to Isotropic T=89.0 C Figure 5 : SiO 1/3-2/3, Planar to Isotropic T=90.0 C

Hom

eotropic Planar Isotropic

Figure 1 : SiO 1/3-2/3, T=84.0 C Figure 2 : SiO 1/3-2/3, Very Big Pretilt T=84.9 C

45deg with crossed polarizers 0deg with crossed polarizersFigure 3 : SiO 1/3-2/3, Planar T=85.0 C

Figure 4 : SiO 1/3-2/3, Planar to Isotropic T=89.0 C Figure 5 : SiO 1/3-2/3, Planar to Isotropic T=90.0 C

Figure 1 : SiO 1/3-2/3, T=84.0 C Figure 2 : SiO 1/3-2/3, Very Big Pretilt T=84.9 C

45deg with crossed polarizers 0deg with crossed polarizersFigure 3 : SiO 1/3-2/3, Planar T=85.0 C

Figure 4 : SiO 1/3-2/3, Planar to Isotropic T=89.0 C Figure 5 : SiO 1/3-2/3, Planar to Isotropic T=90.0 C

Figure 1 : SiO 1/3-2/3, T=84.0 C Figure 2 : SiO 1/3-2/3, Very Big Pretilt T=84.9 C

45deg with crossed polarizers 0deg with crossed polarizersFigure 3 : SiO 1/3-2/3, Planar T=85.0 C

Figure 4 : SiO 1/3-2/3, Planar to Isotropic T=89.0 C Figure 5 : SiO 1/3-2/3, Planar to Isotropic T=90.0 C

Hom

eotropic Planar Isotropic

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Figure 28: Intensity of transmitted light as a function of temperature. Samples were held

between crossed polarizers with evaporation direction 45º to the polarizer axis. All cells

have the same cell gap ~20µm.

20 30 40 50 60 70 800.1

1

10

100

1000

Temperature/oC

Inte

nsity

/mV

1/3 LC1 and 2/3 LC2 5% 5CB in LC1 MLC-6609

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Figure 29: Temperature dependence of the anchoring transitions of 5CB/LC1 mixtures on

LAD-SiOx

0 20 40 60 80 100

0

20

40

60

80

100

Tilt

Ang

le fr

om S

urfa

ce

Weight Percentage of 5CB

RT degC40 degC50 degC60

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5.3.3 Thermal Desorption

To understand the temperature dependence of anchoring transitions we have studied

the surface adsorption of LC on LAD-SiOx. In an attempt to measure the binding energy

of different liquid crystals with the LAD-SiOx surface, we tried to measure the thermal

desorption curve of monolayer liquid crystal on LAD-SiOx. 5CB is dissolved into IPA to

make a series of solutions with different concentration ranging from 1% to 0.01%.

Solutions were spin-coated onto LAD-SiOx substrates to make a thin film. Substrates

were then heated at a few degree below the N-I temperature and monitored by measuring

the optical retardation. We believe a monolayer is achieved when the optical retardation

stops decreasing dramatically. Substrates with monolayer liquid crystal were then baked

in a vacuum oven with controlled temperature for 30min. After that, XPS was used to

detect the nitrogen signal from the surface. As shown in Figure 30 we found that the

thermal desorption of 5CB happens between 49.5ºC and 100ºC.

However, the continuation of our study using the XPS has been interrupted by

technical difficulties. First of all, the signal to noise ratio is too small (because it’s a

monolayer), and it becomes difficult to be convinced that we are measuring monolayer

desorption instead of reaching the instrumental limit of signal to noise ratio. Second, the

10-8~9 torr UHV (ultra high vacuum) pulls liquid crystal molecules from the surface very

quickly. We found the signal to be very weak even if we use a very thick liquid crystal

layer. So in principle we should measure as fast as we can once the sample is inside the

chamber. However to get a good S/N ratio we have to repeat the measurements many

times in a period of time around 20 minutes.

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86

Thermal Desorption Mass Spectroscopy (TDMS) provided us with another solution.

Figure 31(a) shows the desorption curve of 5CB measured from 3 samples of LAD-SiOx

that had been soaked in 0.3% 5CB solution of IPA. As can be seen, the thermal

desorption peak is at 55±2.5°C. The error probably comes from the difficulty in

reproducing 5CB monolayer on each sample. We also tried to measure the thermal

desorption curve of C3. Unfortunately, even if we increased the temperature to about

165°C we didn’t see any significant desorption of C3 on any sample, as shown in Figure

31(b). Nevertheless using XPS we have successfully detected nitrogen atoms (in the

cyano groups) on the LAD-SiOx samples prepared by the same method. This indicates

that C3 should be absorbed on the TDMS samples, too. Considering the two lateral cyano

groups on each C3 molecule and its relatively large molecular weight we conclude that

C3 has a very strong surface interaction with LAD-SiOx which prevents it from

desorption at temperatures lower than 165°C.

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Figure 30: XPS spectrum showing nitrogen atoms of 5CB on LAD-SiOx. On the spectrum

of the original sample and the sample that has been baked at 49.5ºC, a peak of Nitrogen

has been observed. This implies the existence of 5CB on the SiOx surface. However on

the spectrum of the sample that has been baked at 100ºC the nitrogen peak no longer

exists, indicating that the thermal deposption temperature of 5CB is between 49.5ºC and

100ºC.

385 390 395 400 405 410 4153800

3850

3900

3950

4000

4050

4100

4150

Bonding energy/ev

Cou

nts

N1s original 49.5OC 30min 100OC 30min

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Figure 31: (a): Thermal desorption curve of 5CB (3 samples of 5CB absorbed on LAD-

SiOx were prepared by the same methods). (b): Thermal desorption curve of C3

0

10

20

30

40

50

60

70

80

90

100

40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 115 120

Temperature / Degree C

Rel

ativ

e A

bund

ance

0

1

2

3

4

5

6

7

8

9

10

40 50 60 70 80 90 100 110 120 130 140 150 160 170

Temperature / Degree C

Rel

ativ

e A

bund

ance

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5.4 Discussions

5.4.1 Thermal Induced Anchoring Transitions

According to our hypothesis, the two major origins of LC alignment are long range

van der Waals interactions and short range dipolar interactions. Thermal induced

anchoring transitions can be viewed as the result of change in their relative strengths.

In a liquid crystal mixture with a negative dielectric anisotropy such as the mixture

of 1/3LC1 and 2/3LC2 we expect there exist two kinds of LC molecules: molecules with

strong lateral dipole moment (negative material) and molecules with longitudinal dipole

moment (positive material). On the LAD-SiOx surface both types of molecules can be

absorbed and contribute to the short range interactions. Nevertheless the binding

strengths could be very different. Assuming positive materials have a weaker binding

with LAD-SiOx and can be broken at lower temperatures compared to negative materials;

the number of positive material molecules absorbed on LAD-SiOx will decrease more

substantially. Hence the short range interactions will shift towards favoring planar

alignment at a higher temperature, as shown in Figure 28. This effect will be especially

obvious when the temperature is close to the characteristic binding temperature between

positive materials and LAD-SiOx.

Some liquid crystal mixtures do not have obvious temperature dependence in the

anchoring on LAD-SiOx like is shown in Figure 28. There could be a few reasons. Some

mixtures that have a negative ∆ε do not contain (or contain less) materials that have

strong lateral permanent dipoles. So the short range interaction that favors planar

alignment will be minimized. Also if the binding energy between liquid crystal molecules

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and the surface is too strong to break during our measuring temperature range the

anchoring transition will not be obvious either.

5.4.2 The Effect of Temperature on the Critical Concentration of 5CB

In 5.3.2 (Figure 29) we showed the effect of temperature on the critical concentration

of 5CB to sustain homeotropic alignment of 5CB/LC1 mixtures on LAD-SiOx. To

explain this effect let’s look at the surface adsorption and desorption of LC on LAD-SiOx

first. Normally, surface adsorption can be described by the surface coverage ratio Θ ,

which satisfies the following equation44:

TkH

TkH

B

B

eAx

eAx∆

∆−

⋅+

⋅=Θ

1

(5.1)

Here A is a constant; x is the concentration of adsorbent; H∆ is the enthalpy of the

adsorption process; Bk is Boltzman constant; and T is temperature.

Let 0TkH B−=∆ (5.2)

and 0T is the characteristic temperature of the thermal desorption process.

TT

TT

eAx

eAx0

0

1 ⋅+

⋅=Θ (5.3)

Known from the thermal desorption experiment data (Figure 31) the characteristic

temperature is ~55°C for 5CB on LAD-SiOx but higher than 165°C for C3.

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For a mixture of 5CB and LC1 contacting with LAD-SiOx, the surface coverage ratio

of 5CB is:

T

T

CB

TT

CBCB

CB

CB

exA

exA0

5

05

5

55

'1

'

⋅+

⋅=Θ (5.4)

Suppose the original concentration of the C3-like material in LC1 is 03Cx . Its

concentration in the mixture should be )1( 50

33 CBCC xxx −= . The surface coverage ratio of

C3 is therefore:

TT

CBC

TT

CBCC

C

C

exxA

exxA0

3

03

)1(''1

)1(''

50

3

50

33

⋅−+

⋅−=Θ (5.5)

From Equation (2.12) at the critical point where the anchoring transition happens,

CB

TT

criticalCB

TT

criticalCB

CBcriticalCBC

TT

criticalCBC

TT

criticalCBC

CcriticalCBC W

exA

exAUxW

exxA

exxAUxx

CB

CB

C

C

5

5

5553

50

3

50

335

03 0

5

05

03

03

'1

'

)1(''1

)1('')1(

⋅+

⋅−=

⋅−+

⋅−−−

(5.6)

When the concentration of 5CB is relatively small, the coverage ratio of 5CB should

also be small. So,

TT

CB

TT

CB

TT

CBCB

CB

CB

CB

exA

exA

exA0

5

05

05

5

5

55 '

'1

'⋅≈

⋅+

⋅=Θ (5.7)

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Since 5CB concentration is small the concentration of C3 can be treated as constant.

Due to the relatively high thermal desorption temperature of C3 (>165°C), it is

reasonable to assume that the surface coverage ratio is close to 1 and the change in

surface coverage ratio of C3 due to temperature or 5CB concentration is negligible.

So the critical point relies on:

Constant)(' 30

330

35555

05

CWUxWexAUx CCCCCBT

TcriticalCBCB

criticalCB

CB

=Θ−=⋅− (5.8)

)'/(0

5

555T

T

CBCBcriticalCB

CB

eWAUCx −= (5.9)

Since C3 prefers parallel alignment by itself, we know

030

330

3 <Θ−= CCCC WUxC (5.10)

Let CUCWA CBCB /,/' 55 −=−= βα , (5.11)

)/(1 /5

05 βα −⋅= TTcritical

CBCBex (5.12)

where 0, >βα . Now let’s consider the effect of temperature at anchoring transition

point. When T increases, TT CBe /05⋅α decreases, and )/(1 /0

5 βα −⋅ TT CBe increases.

So as a result, the critical concentration of 5CB increases with temperature. Using

Equation (5.12) we were able to fit the critical concentration as a function of temperature

as plotted in Figure 32. This explains why the rising edge (left edge) in Figure 29 has

been shifted by temperature.

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The falling edge (right edge) of Figure 29 does not have complete data showing the

effect of temperature because the clearing point of the mixture drops with the increasing

concentration of 5CB. Nonetheless available data shows no indication of temperature

dependence. We propose to explain this as follows. When the concentration of 5CB is

large from Equation (5.4) we know that the adsorption on SiOx may be saturated

( 15 ≈Θ CB ) even at relatively high temperatures. Hence, there will be no obvious

temperature dependence.

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Figure 32: The critical concentration of 5CB in the planar-to-homeotropic anchoring

transition of 5CB/LC1 mixtures as a function of temperature.

15 20 25 30 35 40 45 50 55 60 65 70

0

2

4

6

8

10

12

14

16

x=1/(αeT0/T-β)

Chi^2/DoF = 0.00009R^2 = 0.96831 T0 55 ±0α 7.21501 ±1.7361β 13.04596 ±5.26203

Crit

ical

Con

cent

ratio

n of

5C

B (w

eigh

t%)

Temperature/ oC

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5.5 Summary

In this chapter we have reported our experimental observations of thermally induced

anchoring transitions on LAD-SiOx. Temperature has also been found to be capable of

changing the transition point in an anchoring transition on LAD-SiOx caused by the

liquid crystal composition change. We propose to explain the observed effects using our

theory of competition between long range and short range interactions. Assuming that the

number of absorbed molecules on the LAD-SiOx surface is proportional to the

contribution of short range interactions to the total free energy we expect the heating will

change the liquid crystal anchoring toward the opposite way short range interactions

prefer. This change will be especially obvious when the binding energy between liquid

crystal and LAD-SiOx is close to the thermal energy. Different liquid crystals may have

very different binding energy with LAD-SiOx. By increasing temperature, the thermal

desorption of each component in a liquid crystal mixture can be very different, too. The

result may be a change in overall short range interaction preference of liquid crystal

orientation, hence an anchoring transition.

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- 96 -

Chapter 6

The Effect of LAD-SiOx Thickness on Liquid Crystal Anchoring

6.1 Introduction

The dependence of liquid crystal alignment on the thickness of inorganic alignment

layer has been discovered by many previous researchers.45,46,47,48 In most of the cases,

authors found a critical thickness of the alignment layer at which the orientational

transition would be observed. In particular reference [Error! Bookmark not defined.]

and [48] reported that pretilt angle (w.r.t. surface normal) of slightly tilted homeotropic

alignment tended to decrease with the increase of alignment layer thickness. This kind of

effect is by all means important but so far only ambiguously explained.

In this chapter we will report our experimental results on the LAD-SiOx thickness-

induced anchoring transitions. We will also show the long range nature of the LAD-SiOx

thickness dependence by the screening effect experimental results. Later we will use the

competition between long range van der Waals interactions and short range dipolar

interactions to explain the results.

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6.2 Experimental Methods

6.2.1 LAD-SiOx Sample Preparation

LAD-SiOx thin films were prepared by thermally evaporating silicon monoxide (SiO)

powders onto substrates at a large angle of incidence. The thickness of coating is

measured in-situ by an oscillating quartz crystal thickness monitor. The reading of the

thickness monitor has been calibrated with ellipsometry measurement data. Coated

substrates were made into anti-parallel cells with ~20µm cell gaps.

6.2.2 Polyimide Sample Preparation

SE-7511L polyamic acid was used to produce polyimide (PI) alignment layers that

gave liquid crystal homeotropic alignment. We diluted SE-7511L into a series of

solutions with different concentrations. These solutions were spin-coated onto substrates

at 3000rpm for 30 seconds followed by the standard procedure of 60 seconds soft bake at

90°C and 1 hour hard bake at 180°C. After bake, no rubbing was performed. Since it’s

difficult to measure the PI thickness on substrates with multiple coatings we used an

identical procedure to coat PI onto blank silicon substrates and measured the PI thickness

by a J.A. Woolam spectroscopic ellipsometer. The thickness values measured on silicon

were used for PI coatings on LAD-SiOx and glass substrates using the same PI solutions.

However, we would rather look at these numbers as a relative values instead of absolute

PI thickness because the wetting properties of silicon could be different from LAD-SiOx

or glass, resulting in coatings with different thicknesses for the same polyamic acid

solution and the same coating process. Cells were made with ~20µm cell gaps.

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6.2.3 Pretilt Measurement

Pretilt angle was calculated from the optical retardation data measured using a

tuneable compensator.

The optical retardation can be expressed as

dnnnd oeff )( −=∆=Λ (6.1)

Here the effective extraordinary refractive index of liquid crystal

θθ 2222 sincos/ oeoeeff nnnnn += (6.2)

θ is the pretilt angle from the surface normal.

From equations (6.1) and (6.2) we get

( )( ) ( )

−+Λ−= 222222 ///arcsin oeooee nnndnnnθ (6.3)

The refractive index ne, no and cell gap d were measured separately.

6.3 Experimental Results

6.3.1 The Effect of LAD-SiOx Thickness on Liquid Crystal Alignment

Cells were made from a series of LAD-SiOx coatings that were identical except for

the thickness. A commercial liquid crystal mixture that has a moderate negative dielectric

anisotropy was used to fill the cells. As shown in Figure 33 the liquid crystal forms a

quasi-homeotropic alignment with a large pretilt angle w.r.t. the surface normal. But the

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pretilt angle decreases as the LAD-SiOx thickness increases until it stabilizes after a

certain thickness.

6.3.2 The Effect of LAD-SiOx Thickness on the Critical Concentration of 5CB

We discovered that anchoring transitions depend on the thickness of the LAD-SiOx

layer. In our experiments LAD-SiOx was thermally evaporated onto 4 identical glass

substrates with identical deposition parameters but increasing layer thickness. Cells were

made from these coated substrates and were filled with mixtures of LC1 and 5CB. As we

described in 3.3.1 we observed planar-to-homeotropic-to-planar anchoring transitions as

the concentration of 5CB increased. But we also found that the anchoring transitions have

different starting and ending points on LAD-SiOx versus thickness. On the first transition

where LC anchoring switches from planar to homeotropic (on the left edge in Figure 34)

we didn’t notice any obvious change of 5CB critical concentration due to LAD-SiOx

thickness. However, on the second transition where LC anchoring switches from

homeotropic to planar (on the right edge of Figure 34) we found that with a thicker LAD-

SiOx layer on the substrate, lower concentration of 5CB is needed to make the transition

happen.

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Figure 33: The effect of LAD-SiOx thickness on the alignment of liquid crystal. A

commercial liquid crystal mixture with a negative dielectric anisotropy was used in the

experiment.

0 20 40 60 80 100 120 140

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16

40o evaporation angle 50o evaporation angle

Pre

tilt A

ngle

w.r.

t. S

urfa

ce N

orm

al/d

egre

e

SiOx Layer Thickness/nm

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101

Figure 34: The anchoring transitions in a 5CB/LC1 mixture depend on the underlying

LAD-SiOx layer thickness.

-10 0 10 20 30 40 50 60 70 80 90 100 110-10

0

10

20

30

40

50

60

70

80

90

100

Tilt

angl

e fro

m s

urfa

ce/d

egre

e

Concentration of 5CB (Weight%)

SiOx thickness 35nm 65nm 130nm 350nm

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102

6.3.3 Screening Effect

The thickness dependence remains even if the LAD-SiOx layer is screened by other

films. To show this effect we put a thin layer of polyimide on top of LAD-SiOx. SE-

7511L polyamic acid is widely used to produce PI alignment layers that give LC

perpendicular anchoring.

In one experiment we fixed the top PI layer thickness and increased the LAD-SiOx

thickness from 0 to 130nm. The cells were filled with 5CB. We found that the pretilt

angle of 5CB (w.r.t. surface) decreased when we increased the LAD-SiOx thickness, even

though LAD-SiOx has been separated from 5CB by the PI layer. The results are shown in

Figure 35.

In another experiment PI 7511 layers with different thickness were coated onto

substrates with fixed LAD-SiOx thickness. 5CB was filled into the cell and tested for its

alignment. The results show that 5CB forms homeotropic alignment when PI 7511 is

thick enough. When the PI layer becomes thinner the pretilt (w.r.t. surface) decreases

accordingly. At a certain point, the 5CB director jumps down and quickly changes into

planar alignment. The experiment has been repeated on bare ITO glass, and ITO glass

coated with 22nm, 65nm, and 130nm LAD-SiOx. Similar results were observed, as shown

in Figure 36.

Significantly, the same experiments using MLC-6609 (which has a negative ∆ε)

instead of 5CB produce no anchoring transition.

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103

We also noticed that the LC on the bare ITO glass (0 nm SiOx) showed tilt angles

very different from the LC on other LAD-SiOx substrates and doesn’t fit into the

transition curve in Figure 35. We believe that this is due to the very different surface

wetting between glass and LAD-SiOx. So the produced PI films are not directly

comparable in thickness and other properties.

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104

Figure 35: The effect of LAD-SiOx layer thickness on the alignment of 5CB screened by

polyimide that prefers homeotropic anchoring.

0 20 40 60 80 100 120 140

20

30

40

50

60

70

80

90

Tilt

Ang

le fr

om S

urfa

ce /

Deg

ree

SiOx Layer Thickness / nm

38.2nm PI 28.1nm PI 16.4nm PI

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105

Figure 36: Anchoring Transitions induced by the screening effect of polyimide on top of

LAD-SiOx surface.

0 10 20 30 40 50 60 70-10

0

10

20

30

40

50

60

70

80

90

100

PI 7511 thickness / nm

Pre

tilt f

rom

sur

face

/ de

gree

5CB/PI 5CB/PI/130nm SiOx 5CB/PI/65nm SiOx 5CB/PI/22nm SiOx MLC-6609/PI/130nm SiOx

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106

6.4 Discussions

6.4.1 The Effect of LAD-SiOx Thickness on the Alignment of Liquid Crystal

We have already shown in Chapter 2 that the LAD-SiOx surface roughness and

anisotropy doesn’t change obviously when the deposition thickness increases from 0 to

130nm. This excludes the topography from causing the LAD-SiOx thickness dependence

effects we have shown. To explain this effect we propose to look at the van der Waals

interactions between LAD-SiOx and liquid crystals.

The van der Waals potential between two infinite flat surfaces (Figure 37) is given as

212/ DAW π−= (6.4)

In ref. [15],[16] de Gennes used this approach by assuming there was a small

distance δ between the alignment layer and liquid crystal layer. However, to understand

the anchoring transition dependence on LAD-SiOx thickness this is inadequate. In this

paper we follow the method described by Israelachvilli49 to deduce the influence of LAD-

SiOx thickness on the van der Waals potential.

Let’s start with the basic van der Waals interaction potential between two molecules:

6)(rCrw −= (6.5)

Consider a half slab of a liquid crystal cell as shown in Figure 38

For molecules in a circular ring of cross-sectional area dxdz and radius x, the ring

volume is 2πxdxdz. The number of molecules in the ring will be 2πρxdxdz.

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107

22 zxr += (6.6)

The net interaction for a liquid crystal molecule at a distance h from the LAD-SiOx

surface will therefore be

∫ ∫+=

=

∞=

= +−=

Dhz

hz

x

x xz

xdxdzCDw0

622

2)( ρπ

| 0222 )(1

2∞=

=

+=

= += ∫

x

x

Dhz

hz xzdzCρπ

|34

162

Dh

h

Dhz

hz zC

zdzC +

+=

=

−== ∫ρπρπ

])(

11[6 33 DhhC

+−−=

ρπ (6.7)

Here h is the thickness of distance from the liquid crystal molecule to the SiOx-liquid

crystal interface and D is the thickness of the SiOx layer, as shown in Figure 38.

To calculate the van der Waals potential between the liquid crystal and LAD-SiOx

per unit area, we need to integrate this expression over the thickness of liquid crystal

layer. As de Gennes pointed out, we have to assume a small distance δ between the

alignment layer and liquid crystal layer to prevent the integration from diverging. δ

should be of the magnitude of absorbed monolayer thickness, a good estimation would be

~1nm. Therefore we have

dhDhh

CHDw

Hh

h∫=

= +−−=

δ

ρρπ]

)(11[

6),( 33

21

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108

])(

1211

21[

6 || 2221 HH

DhhC

δδ

ρρπ+

+−−=

]11)(

1)(

1[12 2222

21

HDHDC

+−+

−+

−=δδ

ρρπ (6.8)

In our experiments, H(half cell gap) is about 10 µm, D(LAD-SiOx thickness) is from

0.035 µm to 0.35 µm, δ is about 0.001 µm. Therefore H>>D>> δ and the equation can be

approximated to

∆+−=+−−−≈ 221

222221

12]1111[

12)(

DC

HHDCrw ρρπ

δρρπ (6.9)

Here ∆ is a constant.

From eq. (6.9) we can see that when SiOx thickness increases the van der Waals

potential also increases. For a liquid crystal that has a negative dielectric anisotropy, van

der Waals potential prefers homeotropic alignment. An increase in van der Waals

potential will lead the liquid crystal alignment towards homeotropic as we have seen in

Figure 33.

6.4.2 The Effect of LAD-SiOx Thickness on the Critical Concentration of 5CB

The critical concentration of 5CB in Figure 34 can be regarded as a balance point at

which the relative strength of long range van der Waals torque is the same as short range

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dipolar torques. As we increase the LAD-SiOx thickness we have increased the strength

of the van der Waals interactions, which will cause the balance point to be shifted.

As described in eq. (2.12), at critical point

CBCBCBcriticalCBCCC

criticalCBC WUxWUxx 55553335

03 )1( Θ−=Θ−− (6.10)

Since C3 has very strong bonding (high desorption temperature) we assume that the

coverage ratio of C3 is always 1. When the concentration of 5CB is high, the coverage

ratio of 5CB is also close to 1. As a result we get

CBCBcriticalCBCC

criticalCBC WUxWUxx 555335

03 )1( −=−− (6.11)

CBCC

CBCCB

CBCC

CCBCCcriticalCB UUx

UWWUUx

WWUxx

530

3

535

530

3

3530

35 1

+−−

+=+

−+= (6.12)

Since U is in the form of 1/D2, let 323

3,525

5 CC

CCBCB

CB DU

DU ∆+

Ψ=∆+

Ψ= (6.13)

x5CBcritical =

xC 30 UC 3 + W5CB −WC 3

xC 30 UC 3 + U5CB

=xC 3

0 (ΨC 3

D2 + ∆C 3) + W5CB −WC 3

xC 30 (ΨC 3

D2 + ∆C 3) + (Ψ5CB

D2 + ∆ 5CB )

253

0353

03

2353

033

03

)()()(

DxxDWWxx

CBCCCBCC

CCBCCCC

∆+∆+Ψ+Ψ−+∆+Ψ

= (6.14)

It’s easy to see that x is in the form of

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ϕγξ

++

= 251

Dxcritical

CB (6.15)

Here γ, φ and ξ are positive invariants to SiOx thickness.

From equation 6.15 we know when the thickness of SiOx increases, the critical

concentration of 5CB should decrease. The physical meaning of this effect can be

understood in the following way. At the point of the transition, 5CB has a concentration

of over 50% and we assume that the surface is saturated with absorbed 5CB molecules.

Further we have confirmed in our experiments that the dielectric anisotropy of the

mixture becomes positive when the concentration of 5CB is higher than 33%. So, van der

Waals potential would prefer planar alignment but surface short range interaction prefers

vertical alignment. With the increase of LAD-SiOx thickness more van der Waals

potential is gained to compete with the same amount of short range interactions.

Therefore less 5CB (smaller ∆ε) is needed to cause the transition due to the greater

polarization of the surface for thicker LAD-SiOx. Experimental data has been fitted using

Equation (6.15) as shown in Figure 39.

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Figure 37: Two infinite surfaces separated by distance D

Figure 38. The cross section of a half slab of a liquid crystal cell.

D

D

LC

x

z

H

SiOx

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Figure 39: The critical concentration of 5CB in the homeotropic-to-planar anchoring

transition of 5CB/LC1 mixtures (shown in Figure 34) depends on the thickness of

underlying LAD-SiOx layer

0 50 100 150 200 250 300 350 400

50

52

54

56

58

60

62

64

66

68

70

x=ϕ+1/(ζ+γD2) Chi^2/DoF = 0.00026R^2 = 0.98346 ϕ 0.49864 ±0.01858γ 0.00090 ±0.00049ζ 4.76581 ±0.75567

Crit

ical

Con

cent

ratio

n of

5C

B (w

eigh

t%)

SiOx Layer Thickness / nm

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6.4.3 Screening Effect

Because of its “long range” nature, van der Waals forces originating from SiOx can

be “felt” by liquid crystal molecules even if they are separated by intermediate polyimide

layers. While PI 7511L is known to promote homeotropic anchoring on its surface the

preference of SiOx underneath depends on the dielectric anisotropy of the liquid crystal.

For 5CB, which has a positive ∆ε, the long range van der Waals interactions would prefer

planar alignment on LAD-SiOx, which is different from the homeotropic alignment

favored by PI 7511L. Therefore, anchoring transitions between homeotropic and planar

alignment can take place when the relative strength of long range and short range

interactions changes. In Figure 35 we have shown that with a fixed PI thickness

increasing the LAD-SiOx thickness shifted the anchoring towards planar. We interpret

this as a result of van der Waals potential (that prefers planar alignment) being

strengthened. While in Figure 36 we observed anchoring transitions due to the increased

short range surface interactions resulted from the increased PI thickness. The

experimental data therefore fits with our theory.

On another hand MLC-6609 has a negative ∆ε so the long range van der Waals

interaction between SiOx and liquid crystal prefers homeotropic alignment, which agrees

with short range forces between PI 7511L and the liquid crystal materials. Hence no

anchoring transition was observed in the experiments.

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6.5 Summary

We have observed in our experiments anchoring transitions of liquid crystal

materials on LAD-SiOx alignment layers due to the change of SiOx thickness. For a liquid

crystal with a negative ∆ε that aligns perpendicularly on LAD-SiOx with a small pretilt,

the pretilt angle decreases when the SiOx thickness increases. The thickness of LAD-SiOx

also shifts the critical point of anchoring transitions caused by the addition of additives

that have large longitudinal dipole or lateral dipole, which we have discussed in previous

Chapters. We found that the effect of LAD-SiOx thickness is long range. It can affect the

liquid crystal that has been separated from it by a thin layer of polymer. More specifically,

when the polymer has opposite preference of the liquid crystal orientation, anchoring

transitions can be observed by changing the SiOx thickness; while if the polymer has the

same preference of the liquid crystal orientation no anchoring transition will be observed.

We proposed to explain the observed LAD-SiOx thickness dependence by

considering the van der Waals interactions between the liquid crystal and LAD-SiOx. The

van der Waals potential depends on the LAD-SiOx thickness and is long range in nature.

Our particular experimental results of anchoring transitions can be interpreted as a change

in the relative strength of long range and short range interactions, which, we believe,

have different preference in the liquid crystal orientation.

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- 115 -

Chapter 7

Conclusions and Suggestions for Future Work

7.1 Summary of Dissertation Work

In this dissertation work we have shown an experimental study of the anchoring

transitions of liquid crystal materials on silicon oxide alignment layers coated at a

medium angle of evaporation.

• We have characterized LAD-SiOx thin films and discovered that LAD-SiOx

used in our experiments has little surface topography and is unlikely to have a

significant effect on the liquid crystal anchoring. We also discovered that

thermally evaporated LAD-SiOx has an unsaturated chemical structure with

the atomic ratio of Si and O changing with deposition pressure. On the other

hand, e-beam evaporated LAD-SiO2 shows a saturated structure that is close

to crystalline silica, with a stable atomic ratio of Si to O equal to ½.

• We found that a liquid crystal with a moderate negative ∆ε aligns

perpendicularly on our LAD-SiOx substrates. But, a liquid crystal with a large

negative ∆ε forms planar alignment.

• We found that the addition of a small amount of a positive ∆ε material that

has a large longitudinal dipole into a liquid crystal that has a large negative

∆ε changes the liquid crystal alignment from planar to homeotropic. But

further addition of the positive material will change the alignment back to

planar

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The anchoring transitions we observed were found to be dependent on

temperature and LAD-SiOx thickness.

• We have studied the effect of additive chemical structures on the alignment

of a liquid crystal that has a large negative ∆ε. We found that an additive with

a large lateral dipole moment tended to promote homeotropic alignment

while an additive that had a large lateral dipole moment tended to promote

planar alignment.

• We reported experimental results showing the effect of temperature and SiOx

thickness on the alignment of liquid crystal on LAD-SiOx. The SiOx

thickness dependence was observed even in the case where LAD-SiOx was

screened by another polymer thin film.

Some theoretical work has also been done as part of the dissertation:

• We have reviewed important theoretic works on this topic.

• We adopted the de Gennes model that described competition between long

range van der Waals interactions and short range dipolar interactions that

have opposite preference in liquid crystal orientation, and expanded it to use

in mixtures that contain liquid crystals with both positive and negative ∆ε.

• We have theoretically derived the temperature dependence of anchoring

transitions based on the idea of surface adsorption and thermal desorption

using classic Langmuir isotherm model and the Van’t Hoff equation.

• We also did a theoretical calculation of the SiOx thickness dependence of van

der Waals potential and its effect on anchoring transitions.

7.2 Conclusions

We have seen interesting anchoring transitions of liquid crystal materials on the

LAD-SiOx substrates we produced in our experiments. Based on the experimental data

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117

we reported in this dissertation, we propose that the liquid crystal anchoring phenomenon

we observed on LAD-SiOx can be explained as a result of competition between long

range van der Waals interactions and short range dipolar interactions. The LAD-SiOx we

studied is birefringent. We believe it’s more polarizable in-plane than perpendicular to

the plane. The more polarizable directions of liquid crystals tend to be parallel to those of

SiOx because of van der Waals interactions while the short range dipolar interactions

prefer dipoles to be perpendicular to the surface. As a result, long range and short range

interactions have completely opposite preference in the anchoring direction. The final

alignment of liquid crystal depends on their relative strengths. Any changes in the

balance between long range and short range forces may lead to anchoring transitions.

We also proposed to correlate the magnitude of short range surface interactions with

the number of molecules adsorbed on the surface (or coverage ratio of the first layer). As

a result, the addition of materials that have strong affiliation with the surface can

significantly change the anchoring preference of surface short range interactions hence

affect the bulk alignment on the surface. Certainly the addition of materials may also

change the bulk dielectric properties, thus change the anchoring preference of long range

van der Waals interactions. Therefore, the effects of adding an additive into a base LC

that has opposite dielectric anisotropy are always two-fold. The balance between the

long and short range forces may shift toward different directions during the course of

mixing, causing anchoring transitions.

Based on the surface adsorption and thermal desorption theory we can explain the

temperature dependence of the anchoring on our LAD-SiOx substrates. Thermal

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desorption changes the coverage ratio of liquid crystal on the LAD-SiOx surface, which

leads to a change in the magnitude of short range interactions. If the change is big enough

to shift the balance between long range and short range forces, an anchoring transition

takes place. In a liquid crystal mixture, different components may have different

preference in boundary conditions. Due to the different characteristics of interaction with

LAD-SiOx they may respond to temperature in different ways. The result is that changes

in coverage ratio of each component may be different, which could possibly cause a

change in overall preference in liquid crystal anchoring.

The dependence of liquid crystal anchoring on the thickness of LAD-SiOx is

believed to be a direct result of the r-dependence of van der Waals potential. Varying the

LAD-SiOx thickness in our experiments changes the van der Waals interaction strength in

the competition with short range interactions and may cause anchoring transitions.

Because of its long range nature the effect of LAD-SiOx can be detected when a thin

layer of polymer comes between the LC and the LAD-SiOx.

In the system we studied, the surface properties of LAD-SiOx contribute a lot to the

short range interactions between LAD-SiOx and the liquid crystal. A clean passive

surface with saturated silicon bonds and quartz-like crystal structure tends to have fewer

interactions with dipoles on liquid crystals so the anchoring preference of van der Waals

potential will determine the overall anchoring direction.

The above conclusions are made based on the experimental results and assumptions

that are specific to our LAD-SiOx –liquid crystal system. In some other systems it may be

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119

found that things such as topography are of great importance. So it may be incorrect to

generalize our conclusions to other cases where our assumptions don’t apply.

7.3 Suggestions for Future Work

Though we have successfully used our theory to explain some aspects of the liquid

crystal alignment and anchoring transitions on LAD-SiOx thin films, a comprehensive

understanding that in general explains the fundamentals of the liquid crystal alignment on

inorganic thin films is still not available. I would like to make a few suggestions that

hopefully will be helpful toward a better understanding of this topic.

Monolayer behavior of liquid crystals on LAD-SiOx would be very interesting to

understand. It might allow us to probe the anchoring preference of short range

interactions directly. As a matter of fact, we had an unsuccessful attempt to do this study

using FTIR and ATR. But I believe that with more sophisticated techniques this work

should be doable and will provide valuable information.

It will also be very helpful to understand the optical/dielectric properties of LAD-

SiOx thin films. The optical/dielectric axis direction will be very useful information for a

better understanding of the anisotropy of van der Waals potential.

The topography of SiOx changes a lot when the evaporation angle increases. It would

be very important to understand this evolution and find out how this changes the liquid

crystal alignment on SiOx.

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Lastly, numerous inorganic materials have been found capable of producing uniform

alignment of liquid crystals. Using the same deposition angle, thickness and other process

parameters, different materials still produce different alignment of the liquid crystals. For

example, Janning reported that using 5º evaporation SiO produced planar alignment

while gold produced homeotropic alignment of 5CB.50 It would be very interesting to

understand this phenomenon and correlate the inorganic material properties with the

liquid crystal alignment.

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