BID FORM - Gautam Buddha University FOR RESEARCH LAB-MECH... · TENDER BID : RESEARCH LAB-MECH....

Gautam Buddha University (Established by the Uttar Pradesh Gautam Buddha University Act 2002

UP Act No. 9 of 2002, passed by the Uttar Pradesh Legislature)

Greater Noida – 201 312 Website : www.gbu.ac.in, Phone No. 0120-2344200

TENDER BID : RESEARCH LAB-MECH. ENGG., SOE (GBU/S&P/02/2015 dt. 19.03.2015) Page 1

BID FORM

FOR THE SUPPLY / INSTALLATION OF LABORATORY

EQUIPMENTS FOR RESEARCH LAB. IN MECH. ENGG. DEPTT.

OF

SCHOOL OF ENGINEERING

http://www.gbu.ac.in/





Tender SUPPLY/INSTALLATION OF LABORATORY EQUIPMENTS

OF RESEARCH LAB IN MECHANICAL ENGINERING

DEPARTMENT. SCHOOL OF ENGINEERING

Opening Date of Bid 19th March 2015

Closing Date & Time of Bid 17th April 2015 upto 3.00 p.m.

Last date & Time of Bid

Submission

17th April 2015 upto 5.00 p.m.

Technical Bid Opening

Date, Time & Place

18th April 2015 at 12.30 P.M.

Venue : Conference Room of the Registrar Office, 1st Floor,

Administrative Building, G.B.U., Gr. Noida.

(Bidder/authorized representative of bidders may attend the

bid opening proceedings on the above mentioned day and

time).

Earnest Money Deposit

Tender Fee

2% (two percent) of total quoted value - (Refundable)

Rs.1050.00 (One Thousand Fifty) - (Non-refundable)

Completion Period Within 8 weeks from the date of Purchase Order issued

Bid System Two Tier : 1) Technical Bid 2) Financial Bid

Technical Bid Shall

Contain

i. Technical specifications of each equipment quoted ii. All documents in support of commercial terms &

conditions and eligibility criteria. iii. Bidders Proforma with Complete Tender set. iv. EMD in form of FDR/BG only

v. Tender Fee in form of demand drafts / pay orders.

Financial Bid The Financial Bid shall contain rate schedule only. The price

shall be in words as well as in numeric numbers.






“TECHNICAL BID (BIDDER’S PROFORMA)”

(To be submitted in separate envelope)

Name of the Organization

Pl. mentioned whether a Government Company /

Public Ltd. / Private Ltd. / Partnership /

Proprietorship

Date of incorporation/registration (pl. enclose

photocopy of cert.)

Specify the number of years in this line of activity by

the company

PAN/TIN registration No. (pl. enclose photocopy of cert.)

Service Tax, Sales Tax/VAT registration No. (pl. enclose photocopy of cert.)

Provide the postal address, telephone & fax

numbers, and email address of the nearest

service center.

Are you the manufacturer / authorized dealer / distributor/ retailer for the product quoted (please attached relevant certificate):

Mention delivery period from the date of the placement of an official purchase order

Whether technical specification are attached with Technical Bid or not.






Deviations in specifications, if yes, please mention

in separate sheet.

Turnover in the last three financial years (Figures should be in Indian Rupees in Lakhs; please attach the certified copies of balance sheet with trading, profit & loss account.

2011-12 2012-13

2013-14

Detail of the item(s) supplied & installed during last three years at IITs, NIT’s or Central /

State Universities or any Academic Institute of National Repute

(please enclose Performance Certificate/Purchase Order/Client List)

Name of the item(s) P.O. Value (Rs.) Name of the Institution, item

supplied.

Whether your firm has been blacklisted by any

Government Organization including Universities,

Institutions and Colleges during last three years.

(Yes / No)






DECLARATION

I/We hereby declare that the information given in the technical bid by the undersigned is correct

and fulfill all conditions as published in the tender document.

(SIGNATURE OF THE BIDDER)

WITH SEAL

NAME: ………………………………………………………………..

ADDRESS : ……………………………………………………………

Tel./Mobile No. : ….......................................................................................






TECHNICAL SPECIFICATION OF RESEARCH LAB

S.

No.

Name of

Equipments

Technical Specifications Qty

1 Weighing Balance Max. Weight 500 g or more

Min. Weight 150 mg or less

Least count less than 0.1 mg

Repeatability 0.1 to 012 mg

Eccentric load 0.4 mg

Settling time 1.6 s

Adjustment with internal weights – proFCAT, fully

automatic time- and temperature- controlled

adjustment.

Approximate size 250 to 300 mm

Smart Grid, Smart Sens, Smart Screen, Control level,

Integrated anti-static kit.

01

2 Simple Optical

Microscope

Simple Optical Microscope

Magnifications 50 to 800X.

02

3 Metallurgical

Optical Microscope

Inverted Metallurgical Moterized Stage Microscope

With Image Analyzer

Viewing Body Seidentopf Binocular Head, inclined

30°, able to rotate a full 360°

Nose Piece Quintuplet

Motorized Stage Integrated mechanical stage size

150mm X 150mm; Range of motion

15mm X 15mm, with single spring

Clip. Stage movement by joy stick.

Focusing Mechanism Adjustable tension control, coarse and

fine knobs with dial markings

Adjustable Up-Stop

Illumination 5 volt or greater, 18 watts or greater

Halogen bulbs with intensity control

Eyepieces Wide field - 10X, 16X, 20X (Each in

pair)

Objective Lens Planchromatic 10X, 20X, 40X, 60X, 100X

Dry

Maximum Magnification 2000X

01


https://www.google.co.in/url?sa=t&rct=j&q=&esrc=s&source=web&cd=2&cad=rja&ved=0CDkQ0gIoADAB&url=http%3A%2F%2Fwww.thefreedictionary.com%2Fquintuplet&ei=TO78UZ3KLInQrQet0YGwBg&usg=AFQjCNH17L9zotmkaANkLut66wgUvTu9Cg&sig2=3LSieRc13uldaSndgeQfTQ&bvm=bv.50165853,d.bmk





Microscope Accessories : Dust cover, color filter set, spare

halogen lamp and fuse.

Advanced Image Analyser

Hardware Digital Color CCD Camera with Hyper EXWAVE

HAD CCD - 1/2" High Resolution Effective picture elements

752 x 582 (H x V), PAL standard, Horizontal resolution 540

TV lines, B/W: 0.005 lx at F1.2 (50 IRE, AGC ON, Turbo

mode), Dimensions (W x H x D) 63 x 57 x 124 mm.

High resolution Scientific Image grabber card with image

grabbing soft ware suitable for the metallography

applications. Spatial Resolution: 640 x 480 (60 Hz); 768 x

576 (50 Hz), Video Format: Composite video

Computer Intel Core2 Duo with 4 GB RAM, 500 GB HDD, 101

key board, Optical Mouse, 52X CD RW Combo Drive DVD

R drive, etc.

HD Monitor –17” LCD monitor

Metallurgical Software Features

Grain size measurement As per ASTM E 112- With

automatic grain cleaning and boundary sharpening (grain

boundary delineation), Grain size distribution with bar chart

representation.

Phase Percentage Analysis (As per ASTM - E – 562

Point count Analysis ( As ASTM - E – 562 )

Linear and serpentine Measurement

Inclusion analysis

As per ASTM E45, E1122, DIN 50602( K-4 Method) – JIS

G0555, IS 4163 standards

Secondary Dendritic Arm Spacing Measurement

Porosity percentage measurement.

Cubboids measurement

Graphite flake analysis ASTM – A 247

Flexible Micron Marker to show the magnification imprint

on image with respect to user

Particle size analysis - All the particles are counted ,

separated as per the segmentations (say 50 – 100

micrometers ) , with different color coding , each particle

shall be marked with ferret dimensions.

Degree of orientation – Banding of pearlite , ferrite, carbide

etc.






Grid Superimpositions – Various grids can be made available

to supereimpose on the live or grabbed images to analyze

them for specific applications.

4 Fully Automatic

Micro Vickers

hardness tester

1. Machine should manufacture under ASTM 384, ISO, IS

Standard

2. Machine should traceable to NABL

3. Test Load Type B-1gf to 2000 gf or higher (minimum 10

Steps or higher)

4. Loading procedure: Automatic with indenter velocity

Settable – 5 µ /sec to 60 µ / sec

5. Selection of indenter: Motorized turret

6. Dwell time: 5 - 100 seconds or less

7. Reading test force: Via PC

8. Standard objectives: N PLAN 10X/0.22, N PLAN 40X/0.65

(should be from Brands – Nikon, Leica, Ziess, Olympus

only for good quality)

9. Measurement - Eyepiece (10 X) with 0.01 Micrometer

accuracy

10. Specimen Stage & Focus

A. X/Y travel: Motorized 100 x 25mm

B. X/Y positioning increment: 1μm

C. Focusing: Autofocusing

11. Camera: 1/2" CCD Camera(Sony(Japan) / JVC(America)

Make) with adaptor and cable

12. Power supply: Wide range power supply: 100V to 240V

AC/50 to 60Hz, CE

13. Software Detection: Auto and semi-auto with cursors

14. Illumination: Computer controlled 6v 20w or better

15. Hardness scale: HV, HK, HRC, HRB, ASTM E-140

16. Diagonals by Measurements: Image Analysis, ASTM E-

384, EN ISO 6507 compliant with Report generation in

MS Excel format and Micron marker

17. Data display: Diagonals d1/d2 (μm), hardness value

HV/HK, test load (N/gf), dwell time (S), XY position

18. Statistics: Mean value, maximum/minimum value,

standard deviation, case depth (5 values), graphical display

19. Interface : RS 232

20. Computer Control : for X Y Stage Z Motion, Dual Time,

Start, Load Selection, Turret required

01






21. Standard Accessories

1 Spare lamps - 2 nos. 2 Spare fuses - 2 nos. 3 Hardness test blocks - 2 nos (Range High & Low Hardness) 4 Indenter - 1 no. Vickers, 1 no. Knoop

5 Computer - Latest Branded (HP/DELL only) with UPS and printer.

22. Installation and training at site

23. Warranty 2 years onsite

24.User base: Suppliers having strong user base in India will

be given priority. The quotation should include complete

details of the user’s supply of similar equipment at different

places of importance (IITs, NITs and Research Laboratories

if any).

25. At least one User/performance certificate for similar

type of machine should be attached to the quotation.

26.Manufacturer of machine providing certificate on their

letter head for ‘spares and parts can be supplied up to 10

years from date of supply’ will be given preference at the

time of evaluation

27. The machine should undergo a standard testing and

quality control procedure before being supplied to Gautam

Buddha University, Greater Noida. The test reports might be

asked for cross verification of various modules.

5 Electro Polisher

Supply Input - Single phase 230 V. A.C.

Polishing Load - 0-110 V, 0 - 10 Amps

variable

Etching Load - 0 -15 V, 0 - 2 Amps variable.

Electrolyte Flow Control - Variable.

Pol. And Etching Current Setting - Variable.

Polishing / Etching Timers - 0 to 99 second,

variable.

Operation Panel - LCD

Touch Screen Panel

For voltage, output current, polishing & etching ,

timing

Programs -

Microprocessor

01






memory programs for parameters like polishing

time & current. Five built-in programs and five

blank for user feeding 9 RS 232 port - for

computerized data logging.

Polishing Cell: Capacity – 2 liters (electrolyte)

1. Pump Motor – 100 watts

2. Process cavity – 27 mm X 65 mm

3. Polishing Masks - with holes of 9.5 mm, 12. 5 mm &

plain - 1 no. each

4. Chiller – to maintain temperature below ambient

temp upto -10 deg C

5. Electrolyte bath capacity – 2 lit External Etching Cell

Standard Accessories

Set of masks, Electrolyte reservoir with protection lid,

Power cable, cables for connection to power control unit,

Electrolyte - 2.5 Liter, fuse - 5 nos, Anode clamps -2 nos,

working / maintenance manual with composition of

electrolyte for various materials.

6 X ray diffractro-

meter

See Annexure 1.1 for detailed Specifications. 01

7 UHR- FESEM See Annexure 2.1 for detailed Specifications (SEM).

See Annexure 2.2 for detailed Specifications (EBSD + EDS).

01

(01+

01)






Annexure 1.1

Specifications: Latest & High end model X-Ray Diffraction (XRD) System for Thin Films and

Powder Samples

S. No. Component Specification

X-Ray Diffraction system for analysis of powder, nanomaterials as well as thin film Samples

with necessary hardware and software

1

Enclosure

Stand alone floor standing cabinet with front access and should

have stringent safety measures with respect to X-ray radiation

ensuring negligible radiation outside the cabinet with less than 1

microsievert/10cm distance. The XRD system should be equipped

with real automatic component recognition features for conflict

detection including X-ray tube, optics along with the detector to be

used.

2

X-Ray Generator

Fully Microprocessor controlled (oil free) X-ray generator with

compatibility of X-ray tube should quote. Preferably single phase

power based & completely maintenance free generator should

quote.

3

X-Ray Tube

(i) Appropriate Cu target based Ceramic X-ray tube , Fine focus

with ceramic insulation tube with K alpha beam.

(ii) Line and point focus should inbuilt in same X-ray tube as well

as capability of change from line focus to point focus without any

need of disconnecting water connections should be available.

(iii) X-Ray tube should be fully synchronize with X-Ray Generator.

(iv) Compatible Ni beta filter should be standard supply.

4

Goniometer

(i) Vertical Goniometer with theta-theta geometry with

independent movements of each theta arm controlled by

computer.

(ii) Goniometer should be completely maintenance free (any

greasing etc.).

(iii) Two theta range: Minimum - (-110 to165 deg.) or better.

(iv) Angular reproducibility: +/- 0.001 deg. or better.

(v) Minimum step size should be 0.0001 deg or better.

(vi) Goniometer diameter: Minimum 480 mm or above.

(vii) Accuracy of 0.003 deg or better.

5

Sample Stage

(i) Standard Sample stage should quoted for flat and powder

samples (multistage sample holder , minimum 8 Nos.)

(ii) 1 set of sample holders suitable for above measurements for

powder analysis should be quoted.






(iii) Reflection & Transmission Spinning stage with complete

transmission setup including transmission sample holder & foil

should be quoted as additionally. Transmission setup should able

to work in Horizontal and Vertical mode (Both way) as per our

sample analysis requirement.

(iv) Completely Tools- free operation including exchangeable

optics, detector, slits etc for alignment free working.

6

Detector

Solid state detector to be quoted as option having following

features.

1D detector based on Si strip technology should

quote.

All the strips will be working, should be offered in

guarantee in writing.

Detector should work in both scanning and fixed

mode.

Detector should have minimum 150 or more

detection channel and maximum performance

guarantee for detector.

Scintillation detector may quote as an additional/optional, if

available.

7

Beam Optics

Divergent slits for measurable angle from 1 deg to 165 deg two

theta

Receiving Slit & Anti scatter slit for detector in secondary optics

Optionally quote the facility to operate both in conventional Bragg-

Brentano and parallel beam geometry (For Thin Film) is essential.

Parallel beam mirror for thin film analysis with all the required

accessories should quote.

The procedure for changing from Bragg–Brentano geometry to

parallel beam geometry should be completely automatic,

motorized and fully software controlled in primary side as well as

secondary side.

The complete automatic optics including mirror with all

supportive slit sets for powder and thin film analysis as required

for this changeover arrangement should be offer and this offered

optics should be fully software controlled, completely automatic,






motorized.

The working of this attachment should be without using of any

hardware tools and should not required any alignment strictly

time to time after installation in primary side as well as secondary

side and vendor should guarantee it in writing in submission of

quotation.

8

9

Software

Third Party

Software

The system must include powder diffraction and general XRD data

analysis software.

Measuring condition setup (sample name, sampling width,

scanning range, scanning speed, measurement mode etc.), data

smoothing, Kα2 stripping, 2Theta-offset and sample displacement

correction, line profile analysis, integrated area, half width,

Crystallite size determination, degree of crystallinity

determination, cell parameters, lattice strain, ab initio structure

solution for Powder data addition, subtraction, scaling,

normalization and merging of scans, simultaneously evaluation of

multiple scans.

Quantitative phase analysis and crystal structure refinement using

Rietveld method supported by latest ICSD data base, Thin Film and

multilayer analysis, Microstructure analysis software should quote

optionally.

The following software/database should quote: ICSD/ICDD

Database with original license validity for one year in name of

University/Institute.

No company owned/ Vendor owned software, non upgradable is

not allow to quote and subject of rejection of bid. All quoted

software should be equipped with the original company licenses in

the name of the University/Institute.

10

Calibration

Standards

The vendor must provide data quality guarantee on the angular

Position and intensity ratio which is to be carried out on standard

sample Corundum/Silicon. The same standard sample should be in

the scope of supply FOC for evaluation.

11 Documentation The documentation should be provided in Hardcopy and Softcopy.

12

Computer Latest Desktop Computer: Intel Core i7-2600, 3.4 GHz or higher, 8

MB Cache or better 8GB RAM DDR3 and extendable, 1TB Hard






Disk, Graphics card, Microsoft Window 7 or 8 (Compatible with

the software supplied with the XRD), 21” Color LED Monitor,

optional DVD writer Mouse / Keyboard Control,

13

Chiller Unit

Quote the suitable water chillers of an ISO company Indian make

with all the supporting accessories & tubing, if required. The

chiller company should have strong service backup. No foreign

make chiller will be entertained due to later service issues and

costly spares arrangement or non availability of spares. Only

appropriate Indian chiller should quote.

14 Installation &

Commissioning

The instrument to be installed tested and commissioned by Indian

subsidiaries or representative of manufacturer.

15

Training

The supplier should provide the training for Operation, Software,

Handling of Optics / X-Ray Tube / Detector and Maintenance at the

site of installation at least for one week or more as per

requirement of University.

Application training should include all the aspects mentioned

above using real samples, change of optics, equipment

configuration, change of sample stages and other features of the

equipment. On-site training should provide for complete

functioning of the system.

16

Warranty

The vendor should give warranty for the complete system for

minimum 5 years after successful installation/commissioning

with no cost for any repair work/part replacement during this

period. All replacement part during the warranty replacement

should confirm on DDP basis replacement till

university/Institute.

17

UPS

Optionally quote UPS (Min. 10 KVA & 40 KVA) with 30 min. backup

as per the suitable need of XRD system of standard make such as

Emersion Libert. Quote Separately.

18

Supply Under

Warranty

Supply of the failure part under warranty period should be cleared

and supplied by the vendor till the final destination of the

instrument installed, No duties, handling charges or any other

charges will be bearable by the institute.






NOTE:-

** All vendors must quote their most advanced version and certify in the quotation

that the quoted model is the latest and with highest capabilities. Spares availability

of the said model to be supplied for next 10 years. Offer may be rejected if latest &

best available model will not be quoted.






Annexure – 2.1

UHR- FESEM SPECIFICATIONS

Source Gun: Schottky Field Emission Electron Source

Resolution : 0.8 nm or better @ 15 kV

1.4 or better nm or better @ 1 KV in SE imaging mode

Max. Probe Current: From few pA to 200 nA or higher preferred (continuously adjustable)

Accelerating Voltage: 20V to 30 KV continuously adjustable

Max. Magnification: ≥ 800,000

Electron optical system:

Suitable high-resolution field emission scanning electron microscope column with beam source

design for high resolution and high brightness.

The microscope column should have flexible beam deceleration (4 KV or above continuously

variable beam deceleration) near sample surface for ultra high resolution topographical imaging at

low accelerating voltage for high resolution applications for beam sensitive specimens.

Detectors:

(a) In-lens Secondary Electron Detector

(b) In-lens Back-scattered Electron Detector

(c) Everhart-Thornley secondary Electron detector

(d) High angle lens mounted directional Back-scattered Electron solid state detector

Charge Compensation: Suitable charge compensation facility for imaging non-conducting/polymer

samples without any conductive coating.

Max. Specimen Size: ≥ 100 mm dia with full rotation

Specimen Type: Suitable for imaging of Ceramics, thin films, polymers at high resolution and

without any charging effects. Capability to image Magnetic samples without magnetic interference

Chamber:

1. Chamber should have at least 10 or more accessory ports.

2. Chamber design should allow changing of the specimens quickly.

Specimen Stage: PC Controlled Eucentric 5-axis Motorized Stage

Stage movements (mm): X = 100 or better, Y= 80 or better, Z = 25, Tilt = 0° or lower to +70° or

higher, Rotation: 360 Degrees.

The specimen stage should also be controlled through joys t i c k / trac kball s tage

c ontrol ler /equivalent.

Quick-fit specimen holder for holding at least 7 suitable pin-type stubs






Built in Camera: Built in CCD camera with IR illumination for real time specimen chamber viewing

Vacuum System: Fully automatic vacuum system consists of Turbo molecular pump, dry rotary

pump, Ion pump in appropriate quantity along with suitable accessories, suitable for generating

desired vacuum level in microscopic column, source gun chamber and specimen chamber. The

vacuum system should be computer Controlled with pneumatic valves having full safe protection for

mains / high voltage and vacuum failures.

It should have Digital vacuum gauges with readouts, Isolation valves for specimen chamber and high

vacuum system during sample loading and Automatic venting with dry nitrogen

Scan Modes: Fast mode, spot mode, line scan, line profile, scan rotation, Raster rotation, Tilt

compensation, Dynamic focus.

Image processor: Maximum resolution 8192x6144 pixels or better. Continuous averaging for up to

256 frames. Frame averaging up to 256 frames. Line averaging up to 256 lines. Pseudo color displays.

Image post-processing. Clip board facility for transferring any screen display to other with latest

windows application. Output file formats: TIFF, BMP and JPG. Images should also be recorded to

movie format (AVI).

Image/Data display: 19’’ or bigger flat panel LCD monitor for image displayed at 1024X884 pixels

or better, configurable for single frame display or 4-quadrant display. Data-Accelerating voltage,

Magnification, Micron marker with value, Film No, WD, date/time, detector, and user comments etc.

Latest MS Windows based system (graphical user interface, key board, optical mouse). Line profile

display. Comprehensive image annotation facilities with desirable fonts and colors.

Workstation/computer for microscope: A 32-bit graphical user interface with Windows 2007 (or

latest available version), microscope control software, storage of images on compact disk, DVD or

hard disk in various formats (TIFF, JPG, BMP, etc.). The microscope should be controlled from

Windows graphical user interface running at a 1280х1024 screen resolution. The SEM work

station/computer system should be fully compatible with and be able to (seamlessly) talk to the EDS

system so that machine parameters are automatically updated during analysis. The workstation

should include a 19” LCD monitor, standard keyboard and optical mouse, and HP colour laser printer

(CP 2025 or higher version). Manual joystick for stage axis control. A manual control panel to adjust

major parameters like mag. Focus, stig etc

Software: Original licensed software for the comprehensive operation of the microscope, computer,

motorized stage / stage control, CCD camera and vacuum interlocks.

Software for acquiring BSE and SE images. Software for reduction of noise & improvement in

contrast with drift correction during image acquisition .The software should be embedded in the

microscope control software.

Calibration: standards for calibration of magnifications and resolution

Working table: Anti-vibration table for chamber, the microscope column and support for monitor,

optical mouse, keyboard.

Support Kit: Specimen handling tools, stage tools and specimen preparation materials,






Safety devices: Safety devices against power/vacuum/water/air/gas failures

Accessories:

(i) Suitable gas compressor

(ii) water chilled from internationally reputed company as per system requirement

(iii) Five Additional FEG Tip to be supplied as and when required.

Power supply: 230V, 50 Hz

Warranty: Comprehensive warranty for 60 months for the main system and all accessories.

1. Site engineer for maintenance & operation of FEG-SEM

Optional

1. Facility for In-situ, active removal of hydro cabrons using an Integrated Plasma Cleaner

2. 40 KVA UPS with 30 minutes Backup of (standard make such as Emersion Libert). Quote

Separately.

3 Sputter Coater should be able to coat gold, palladium, platinum and carbon (combined sputter

coater and carbon coater) for SEM specimen for EDS and WDS. Precise thickness control using film

thickness monitor control option. Able to automatic recognition of coating inert fitted. Capable of 50

minutes or more of sputtering time without breaking the vacuum. Leaves the process chamber under

vacuum when not in use - improved vacuum performance. 5 years warranty.

Other Terms:

Spares: Availability of spares for Ten years

Compliance statement: With soft copy point wise according to our document

Consumable & spares: List of the consumables and spares to be supplied with the system

User List: Provide user for last 3 years

Manuals: Operation & service manuals with diagram






Annexure 2.2

Optional Attachments:

Integrated EDS+EBSD system :

Fully Integrated EDS-EBSD system running from a single interface with facility to acquire

simultaneous EBSD – ED’s data from a region of interest. The System should offer the highest

precision in orientation measurement, highest indexing accuracy. The system should allow

dynamic map display during collection to ensure data collected matches data needed. System

should be capable of combining EBSD, EDS and SEM maps/images with facility to have time

stamped data to allow user to go back in time to get best data for analysis in case of contamination

problems or beam sensitive samples. The system should automatically identify trace elements and

have ultrafast mapping capabilities.

1) Latest Integrated FET technology based Peltier Cooled Silicon Drift Detector with a sensor size

of 30mm2 or higher detector area and resolution of 129eV or better MnKa @100,000 cps and

capability to be upgraded to WDS from the same manufacturer.

2) The detector should have an Super Ultra-Thin Window for better light element performance

and capability to detect from B to U.

3) The software should have capability to do Real Time Phase Mapping, Phase to Element and

Element to Phase maps, Qualitative & Qualitative Analysis, Peak and Auto ID routine, Spectral

Match Analysis, Database management and reporting, Elemental Mapping, Point Analysis, Line

Scanning, Standard Sample should be provided. Latest Workstation, Monitor and Standard sample

should be provided.

5) High resolution and high senstivity camera with indexing speed of not less than 150 indexed

patterns per second and capability of orientation precision measurement should be less than 0.1

degree.

6) The EBSD camera should have a phosphor screen to allow effective capture of Diffraction bands

without loss in sigal quality at the edges and allows matching with the circular optics of the lenses.

The Phoshor screen should have multisegment FSD for topography, orientation and orientation

contrast.

6)EBSD camera should have feature of automatic optimization of camera settings , automatic

background collection and substraction. The software should offer Triplet indexing for Highest

indexing accuracy and confidence index for quantified measurement of data quality.






7) The EBSD system should allow dymanic map display during collection to ensure data collected

matches data needed. For beam sensitive samples and contamination problem, the system should

offer Time Stamped data to allow user to “go back” in time to select best data.

8) Digital Slide control and touch sensor alarm, camera should have a bellow assembly to avoid

any vacuum leakage

9) EBSD software including EBSD Data Collection, Chemical Scan, Grain Size & Recrystallization

tool, EBSD Analysis Software( 2 Licenses), Advanced Data Manipulation, Advanced Grain

Manipulation, Advanced Boundary Characterization, Advanced Texture Characterization and

Advanced Properties characterization, Latest Workstation with monitor and Standard sample

should be provided.






GENERAL TERMS AND CONDITIONS

1. Detailed information about the items and their specifications are available in tender

document, which can be downloaded from the University website www.gbu.ac.in.

2. Two bids system of tender will be adopted.

(i) The bid containing technical specifications, EMD, Tender Fee and eligibility documents.

(ii) Bid containing financial offer.

Technical and financial bids should be submitted in separate covers. These two envelops shall

be sealed in a common cover and addressed to The Registrar, Gautam Buddha University,

Greater Noida, Gautam Budh Nagar -201312 (U.P.) superscribing “Tender against

Notification Advt. GBU/S&P/02/2015 dt. 19.03.2015, Name of supply: Laboratory

Equipments for Research Lab. In Mechanical Engineering Deptt., School of Engineering” so

as to reach us on or before last date of bid submission.

3. The Technical Bid and Financial Bid should be duly filled-up.

4. These bids will be opened in two stages. The bid containing technical specifications, EMD, TF

and eligibility documents will be opened at first stage and if same is found according to

required specifications, the bid containing financial offer shall be opened in second stage.

5. The “Technical Bid” shal l contain all documents in support of quoted item ,

their specifications, EMD, Tender Fee, terms & conditions and eligibility criteria along with

the page number for cited specifications in the company brochure for the particular item.

6. The “Financial Bid” shall contain price schedule only. The rates and units shall not be

overwritten in the price schedule. The price shall be both in words and figures.

7. Eligibility Criteria: All the participating suppliers/firms or principal manufacturer- should

meet the following qualifying criteria. The firm should be a registered supplier for such

supplies. Following documents are required to be submitted with Technical Bid, to qualify

eligibility criteria:

a) PAN/TIN registration certificate (self attested). b) Service Tax/Sales Tax/VAT registration certificate (self attested). c) Earnest Money Deposit (EMD) in form of FDR/BG only pledged in favour of “Gautam

Buddha University” alongwith the Technical Bid. The FDR/BG should be for one year period validity.

d) Tender Fee in form of DD/Pay Order in favour of “Gautam Buddha University”







alongwith the Technical Bid. e) Audited copy of balance sheet with trading, profit & loss account for the last three

financial years should be submitted (self attested). f) The firm/company should have experience of supplying & installation for

Equipments/Instruments to institutes of National repute. The company should also furnish a list of clients of last 3 years.

g) The bidder must be either sole Manufacturer of the Equipments/Instruments or the authorized agent/representative of the OEM. In the case of agent/representative, certified copy of the agency/authorization issued by the OEM should be enclosed with the tender.

h) Authorized signatory should sign with rubber seal on all pages. Bids without authorized seal and signature will be rejected.

i) The vendor shall submit an affidavit (duly notarized) on Rs.10/- stamp paper to the effect that the firm has never been blacklisted by any Government organization including Universities, Institutions and Colleges. The affidavit must be issued between the tender opening and closing date.

8. Offer should be sent in a sealed envelope, submitted either in person or by post on which name and address of the supplier/firm shall be written. Tenders received through E- mails or FAX will not be considered.

9. The technical bids will be opened on scheduled date and time. Bidders/authorized representatives of the bidders intending to attend the tender opening should intimate in advance.

10. The rate quoted should be F.O.R. Gautam Buddha University (Gautam Budh Nagar, Greater Noida, UP) in rupees/foreign currency inclusive of all charges e.g. packing, forwarding local taxes, railway freight, transit insurance etc. The total price should include all accessories required for final installation of the item. Rates of imported goods should be quoted excluding custom duty, as this University is exempted from payment of custom duty (by letter of Department of Scientific and Industrial Research, Ministry of Science & Technology, GOI).

11. The items should have USEPA/International/National validation certificates, wherever applicable.

12. The cost of the tender is Rs.1050/- (Nonrefundable) and it shall be paid separately in the form of DD/Pay Order drawn in favour of “Gautam Buddha University” payable at “Delhi” and should be attached with technical bid envelope.

13. The EMD of the successful bidder will be refunded after expiry of the warranty period. The EMD of the unsuccessful bidders will be returned to the firm(s) immediately after finalization of the tenders. No interest will be paid on EMD in any case.

14. The Small Scale Units registered with National Small Industries Corporation (NSIC) are exempted from Tender Fee & EMD subject to provide a copy of registration certificate.

15. The required delivery period must be mentioned against each item. Tenders should preferably be given only for those equipments/items/articles, which are available ex- stock.

16. Detailed specifications with the mention of make and model/Version of each item should be clearly given supported by the illustrated pamphlets wherever possible. Quotations without specified make and Model/Version and other particulars may be rejected. The accessories included in the Equipments/Instruments should also be clearly mentioned.






17. Losses or damage in transit will be borne by the Supplier. The supplier may, if he so desires, get the goods insured and include such charges in the tendered rate.

18. Offered prices should be valid for at least 180 days from the last date of receipt of tenders.

19. (a) The items delivery time should be preferably within stipulated period mentioned in

purchase order, if fails

(b) The Penalty Clause is as under:-

Should the bidder fail to deliver the goods within stipulated period, the Competent

Authority may, at his discretion, allow an extension in time subject to recovery from the

bidder as agreed liquidated damages, and not by way of penalty, a sum equal to the

percentage of the value of tender amount which the bidder has failed to supply for period

of delay as stated below:-

i.Delay up to one week 1%

ii.Delay exceeding one week but not 2%

exceeding two weeks

iii.Delay exceeding two weeks but 5%

not exceeding one month

iv.Delay exceeding one month 5% for each month and part there of subject to

maximum 10%

(c) In case of failure to supply the goods within stipulated delivery period and in accordance with the specifications given in the quotations, the University shall be free to cancel the order.

20. Supply of the placed order in part will not be accepted.

21. The University’s term for payment: 90% against delivery of items in good condition,

installation and putting those in satisfactory working conditions; balanced 10% payment

shall be released after 60 days of satisfactory working of the items. No advance payment

shall be released..

22. No revision of price bid will be allowed once the price bids are opened. In case

firm/company quoted in foreign currency the price will be converted into Indian Rupee

at the conversion rate on the basis of the last day of the bid submission.






23. No increase in price will be allowed after our purchase order(s) are placed.

24. Warranty certificate against all the Items/Equipments/Instruments developed defects

covering warranty period, which commences from the date of installation shall be given

at the time of supply of the items.

25. Inspection certificates of the items inspected by the qualified engineer of the

manufacturer and packed in accordance with the terms and conditions of this order must

be enclosed.

26. During the warranty period whenever the firm is called upon to attend to the

rectification of the defects/faults in the consignments, the firm shall attend to the repair

work within a period of a week. They should render timely back up service whenever

called upon. A certificate to the effect should be attached to the tender.

27. A certificate to the effect that items supplied is fully operational and no additional

accessory or space is required to ful ly functio ning the

Equipments/Instruments should be issued along with the delivery challans/invoice. GBU

reserves the right to refuse payment in the event of not furnishing this certificate at the

time of supply.

28. Complete user, technical and service manuals/installation drawings/documentation and

spare parts catalogue are to be provided along with the supply of the item.

29. Failure to comply with all the terms and conditions mentioned herein would result in the tender being summarily rejected.

30. Vendors are informed that once the firms are shortlisted based on the eligibility criteria and technical specifications, only then the financial bids of the firms meeting eligibility criteria, technical specifications / requirements would be opened.

31. Conditional tenders will not be accepted. 32. Any cutting and overwriting in the financial bid will not be accepted. 33. GBU reserves the right to change the order quantity or split the orders among multiple

vendors without assigning any reason (s) whatsoever. 34. GBU reserves the right to reject any or all the tenders without assigning any reasons

whatsoever. 35. All legal proceedings, if necessity arises to the University may be any of the parties (University

or Contractor/Supplier) shall have to be lodged in the courts situated at Distt. Gautam Budh Nagar and not elsewhere.

Registrar

Gautam Buddha University






ACCEPTANCE

I/We accept the above terms and conditions and shall comply with them strictly.

SIGNATURE OF THE BIDDER)

WITH SEAL

NAME: ………………………………………………………………..

ADDRESS : ………………………………………………………..

Tel./Mobile No.: ………………………………………………………..






FINANCIAL BID FOR RESEARCH LAB. IN MECH. ENGG. DEPT., SOE

Sr. Name of the equipment Qty. Model/Make

Unit Price

Total Price

1 Weighing Balance 01

2 Metallurgical Optical Microscope 01

3 Simple Optical Microscope 02

4 Fully Automatic Micro Vickers Hardness Tester 01

5 Electropolisher 01

6 X ray diffractro-meter 01

7 UHR- FESEM 01

Total Price : -

Taxes, If any @...............

Grand Total : -

Warranty Period : ……………………..

Total cost of the offer is Rs._______________ in words (Rupees _______________________________________

___________________________________________________________________________________________. I abide by all the

terms & conditions of the tender.


WITH SEAL






ACCEPTANCE

I/We accept the terms and conditions and shall comply with them strictly.

DECLARATION

1. The rates quoted are inclusive of all and F.O.R University Lab. site.

2. The information given in the financial bid by the undersigned is correct.


WITH SEAL

NAME : ………………………………………………………

ADDRESS : ………………………….…………………..…

Tel./Mobile No. : ………………………..……………….


Date post:	24-Aug-2020
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