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Brochure of Signalling Tester MD8430A · The Signalling Tester MD8430A is a key LTE-Advanced base...

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Product Brochure Signalling Tester MD8430A Rapid Test Designer (RTD) MX786201A
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Product Brochure

Signalling TesterMD8430ARapid Test Designer (RTD) MX786201A

2

LTE-Advanced is faster than LTE and becoming effect radio communications network. The Signalling Tester MD8430A is a key LTE-Advanced base station simulator for developing LTE/LTE-Advanced-compliant chipsets and mobile UEs. Using its extensive experience in 3G markets, Anritsu has developed the MD8430A as a powerful LTE-Advanced protocol R&D test solution to help developers bring LTE-Advanced terminals to market as fast as possible.

Key Features• Earlysupportfor3GPPLTE-AdvancedFDD/TDDCarrierAggregation(CA)2CCsand3CCs

• Earlysupport3GPPLTE-AdvancedFDD/TDDRelease12•TDD-FDDjointoperationincludingCA•DL 256QAM•LTEMTC(MachineTypeCommunication)

• OneMD8430AsupportCAhandover,4×4MIMOand8×2MIMOAvailable to testing of full digital fading

• SupportDL450Mbps,UL100Mbpsthroughputtestat3CCs• Inter-RATtestsmakingeffectiveuseofpreviousMD8480C (UTRAN/GERAN),andMD8475A(CDMA2000)hardwareinvestments

• OptimizedinvestmentfromfirstR&Dtoprotocolconformancetesting• FulldevelopmentandanalysistoolsetcutsL1,L2andL3scenario

development time and costs• SupportUMTSRelease10,HSPAEvolution,GSM/GPRS/EGPRS

Main Applications•Coding/Decodingtests(RF/Baseband)•Protocolsequencetests•Throughoutandstresstests(Performancetest)•Intra-RAT/Inter-RATperformancetests•LTEPre-conformance/Conformancetests•Networkinteroperabilitytests•LTEnetworkoperatoracceptancetests(CAT)•Troubleshootingfieldtestproblems•UEQCinspection• W-CDMA/HSPAprotocolsequencetests

Early Support for Developing LTE-Advanced (CA/MTC) Chipsets and Mobile UEs

MD8430ASignalling Tester

MX786201ARapidTestDesigner(RTD)

Field TestQoS

Management

Integration/Function/

Performance Tests

L1/L2 TestsRF/Baseband

L3 TestsProtocol

Sequence

Pre-conformance/Conformance

Tests

Pre-CAT/CATOperator

AcceptanceTests

3

Main Test Functions•LTE-AdvancedIntra-RATCAhandovertest(Hardhandover)•LTE↔UTRAN/GERANInter-RAThandovertest•eMBMStest•Digitalbasebandslowclocktest•Protocolsequenceanalysis(Loganalysis)•Throughputmonitoring•UESchedulingfunction(Time/MCS/LowestRB/RB)•H-ARQTest(ACK/NACK/DTX)•VoLTEtest(SPS,TTIBundling,DRX,RoHC,CA+VoLTE)•W-CDMA/HSPAhandovertest

Supports Newest UE CategoriesTheMD8430AsupportsUEcategories1to7,9,10andwillsupportallnewfuturecategories.

Basic Functions (LTE-Advanced)•TransmitDownlink(DL)signal(Upto6GHz)•ReceiveUplink(UL)signal(Upto6GHz)•Callprocessing•TransmitPowerControl(TPC)•Basebandinterface• 2×2/4×2MIMO(TestModel:ETM,PTM) 8×2/4×4MIMO(TestModel:ETM)

• CA2CCs,CA3CCs(TestModel:ETM)•Encryption(option)

Please refer to page 6 for specifications of MD8430A models.

3GPPTS36.306v12.1.0(2014-06)LTE(DL)

UECategory

Maximum number ofDL-SCH

transport block bits received withinaTTI

Maximum number ofbitsofaDL-SCH

transport block received within a

TTI

Total number of soft

channel bits

Maximum number of supported

layers for spatial multiplexing in DL

Category1 10296 10296 250368 1

Category2 51024 51024 1237248 2

Category3 102048 75376 1237248 2

Category4 150752 75376 1827072 2

Category5 299552 149776 3667200 4

Category6 301504 149776(4layers)75376(2layers) 3654144 2 or 4

Category7 301504 149776(4layers)75376(2layers) 3654144 2 or 4

Category8 2998560 299856 35982720 8

Category9 452256 149776(4layers)75376(2layers) 5481216 2 or 4

Category10 452256 149776(4layers)75376(2layers) 5481216 2 or 4

LTE(UL)

UECategory

Maximum number ofUL-SCH

transport block bits transmitted withinaTTI

Maximum number of bits of an

UL-SCHtransportblock transmitted

withinaTTI

Support for 64QAM in UL

Category1 5160 5160 No

Category2 25456 25456 No

Category3 51024 51024 No

Category4 51024 51024 No

Category5 75376 75376 Yes

Category6 51024 51024 No

Category7 102048 51024 No

Category8 1497760 149776 Yes

Category9 51024 51024 No

Category10 102048 51024 No

4

Coding/Decoding TestCoding/DecodingtestsofLTE-AdvancedterminalsareperformedbymakingtheRFconnectionsshowninthefollowingdiagram.

Easy MIMO Test Configuration SettingsTheMD8430Ahas8mainandsubRFconnectorsaswellas8digitalIQconnectorsasstandardequipmentforusewiththeMX843010A/ELTEControlSoftwaretoeasilyconfigureandmonitorvarioussettings,includingRFparameters,channelpower,MIMO,fading,connector selections, frame timing, BTS cell selections, etc.

Fully Versatile L1/L2 Monitoring FunctionsTheMX843010A/EsoftwaresupportsLTEdevelopmentbyprocessing large volumes of low-layer data at very high speeds using a full line of versatile power monitoring, throughput monitoringandloganalysisfunctions.TheMeasure(Counter)functionscanmonitorLayer1/2(L1/L2)throughputsinrealtimebycountingparametervaluessuchasACK/NACK/DTX/CQI.

Setup Screen Example

Measurement (Counter and Throughput) Screens

Monitor Screen Example

Slow Clock Test Setup (Digital Baseband, Fading)

TheMD8430AsupportsdigitalbasebandI/Oasstandardfunctions.Using the baseband interface offers high-reproducibility coding/decodingtestsfreefromtheRFsection,supportingstableevaluation of LTE chipset baseband performance.

Moreover, LTE coding/decoding tests are supported because the baseband chip can be evaluated using a slower clock than the clock frequency.AndconnectingthesecondMD8430Afadingfunctiontothe digital baseband interface supports slow clock evaluations in a fadingenvironment,whicharedifficulttoperformwithanRFfading simulator.

PC Controlling MD8430A

PC Controlling UE

Demodulated Data (DL)Output Data (UL)

Output Data (DL)Demodulated Data (UL)

Two-way Comparison

RF

Control PC

Dedicated cable(LVDS)

UL (Digital IQ)

DL (Digital IQ)

Clock

PC Controlling UE MD8430A

Signalling Tester MD8430A Features

For Developing LTE-Advanced Chipsets and Mobile UEs RF/Baseband Tests

Coding/Decoding Test Example (RF, Patch Test)

L1/L2 TestsRF/Baseband

5

Intelligent Test CreationTheRapidTestDesigner(RTD)MX786201Asoftwaretoolsgivesusers power to create tests that cannot be done with traditional languagebasedtools.RTDSupportsL1/L2/L3testingusingLowerLayerConfigurationlibraryandLayer3procedurelibraryofUEdevelopment.

Moreover, each procedure auto-sets the connection with the lower Layers(L1/L2)basedonfullcompliancewiththe3GPPstandards.RTDcansimulatorLTE↔UMTSInter-RATandLTE↔CDMA2000InterworkingbyconnectingMD8480Cand/orMD8475A.

The Reference Library test cases provides a reference to build the customizedtestcasesandlibrarieswithease.

Cuts Test Case Development TimeTheRTDGUIoffersintuitivetestcasecreationbylinkingprocedures with parameters, such as network conditions and messagedata,ateasy-to-understandsettingscreens,quicklyincreasing the number of working test cases.

Inaddition,theBuilt-inAnalyzerfunctionchecksforprogrammingerrors prior to testing, which can start immediately without recompiling after editing and changing settings.

Flexibility in Testing & AnalysisWhenthetestfinishestheexecution,theRTDprovidesapreliminaryjudgmentagainstpredeterminedcriteria.Thisavoidstheneedtostudycomplexmessagesequencesandcanshowatestoutcomeexplainedinalocallanguage.TheIntegratedprotocolanalyzerwithRTDsupportsverydetailedMessageSequenceAnalysisandprovidesafacilitytoexporttheProtocolTestlogsintoHTMLformatwhichcanbeviewedatanyPCwithaBrowser without a RTD license.

RTD Procedure Block

Test Execution Screen (RTD)

Log Analysis Screen (RTD)

L3 procedure library(UTRAN/GERAN

signalling)

Procedure LibraryCDMA2000

L3 (NAS/RRC/RR) Message procedures for signalling & automatic configuration

Low level libraryUTRAN/GERAN

Low level libraryLTE

L1 & L2 system configuration

L3 procedure library(LTE signalling)

Interworking

RTD

MD8480C* MD8430A MD8475A

Signalling Tester MD8430A Features

Complete LTE-Advanced Protocol Test Environment

L3 TestsProtocol

Sequence

Design Execute Analyze

*:MD8430AcanbeusedonUMTS/GSMtestinplaceofMD8480C.

6

Testing Throughput for Various ConditionsThe MD8430A supports the latest UE categories with download speedsof450Mbpsanduploadsspeedsof100Mbps.

The bundled sample scenarios make it easy to change parameters suchasbandwidth,scheduling,HARQ,etc.,fortestingLTEthroughputs under various conditions.

Inaddition,combinationwithsecondMD8430AfadingfunctionsupportingLTEMIMOviathededicateddigitalinterfacesimplifiescomplex power control procedures for easy throughput testing in a fading environment with simple test setup.

Handover Tests Optimizing Hardware InvestmentTheMD8430Asupportsuptosixcells(Fouractivecells)allowinghandovertestsbetweentwoLTEBTSwithonetester.Inaddition,LTE-UTRAN/GERANInter-RAThandovertestsaresupportedbyconnectingtheW-CDMASignallingTesterMD8480C.AndtheMD8480CisnotlimitedtothegloballydominantW-CDMAtechnologybutalsosupportstheHSPA/HSPAEvolutionandGSM/GPRS/EGPRS technologies.

WhencombinedwiththeSignallingTesterMD8475A,CDMA2000Interworkingtestsaresupportedtoo,maximizingsupportforbothworldwide communications technologies and investment in hardware.

Fading Setting Screen (MF6900A Fading Simulator)

LTE-UTRAN/GERAN Handover Test Setup

Specifications of Signalling Tester MD8430A Models

Model/NameMD8430A-020

LTEStandardTestModel(STM)MD8430A-030

LTEPerformanceTestModel(PTM)MD8430A-035

LTEEnhancedTestModel(ETM)

Interface RF,DigitalIQ RF,DigitalIQ,BasebandFading*1

FrequencyBand Max.20MHz

UECategory Category1,2,3,4,6 Category1,2,3,4,6,7,9*2,10*2

Max.DataRate(DL) 150Mbps(PHY:300Mbps) 450 Mbps

Max.DataRate(UL) 50 Mbps 100Mbps

MIMO 2×2MIMO2×2MIMO4×2MIMO

2×2MIMO4×2MIMO4×4MIMO*3

8×2MIMO*4

Max. No. of Base StationActive+adjacentBTS:4(Max.ActiveBTS:2)

Active+adjacentBTS:6*5

(Max.ActiveBTS:2)Active+adjacentBTS:6

HardHandover(includingatMIMO)Intra-frequency

Inter-frequencyhandover*6Available

2unitsforCAwithInter-frequency

CarrierAggregation:No.ofComponentCarriers(DL)*7 2*8 3*8, *9

CarrierAggregation:No.ofComponentCarriers(UL)*7 2

*1: RequirestwoMD8430Asetsforbasebandfading.

*2: RequirestwoMD8430Asets.

*3: RequiresMD8430A-075.

*4: Twobasestationsmaximumfor8×2MIMO.

*5:For4×2MIMO,themaximumnumberofbasestationsis1,thenumberofactivebasestations+numberofadjacentbasestationsis5.

*6:HandoverofCAisnotsupported.

*7:RequiresMD8430A-085.

*8:Theactivebasestationisusedasthecomponentcarrier.

*9:Oneunitsupports3CAforSISO.RequirestwoMD8430AsetsforMIMO.

RF

Ethernet

MD8430A MD8480C

MD8475A

C-Plane

U-Plane

Signalling Tester MD8430A Features

Efficient UE Integration and Performance Tests

Integration/Function/

Performance Tests

7

Optimized Hardware InvestmentThe MD8430A supports to design for early chipset and mobile UE, function tests, and performance tests ranging from carrier acceptance tests to protocol conformance tests as well as retrofit upgrades between models allows developers to tailor their hardware investment to current needs with future flexible upgrade options.

TheProtocolConformanceTestToolkit(PCT)withMD8430AandGCF/PTCRBapprovedTTCNtestpackageprovideanoptimumenvironmentforLTEprotocolconformancetesting.Hence,aSingleHardwarePlatformthatextendsitsusagefromPlatformdevelopmenttoConformanceTestingandOperatorAcceptanceTest.

Instant Firmware SwitchingBecause the MD8430A saves up to ten firmware versions, the right firmware is selected easily at startup. There is no need to install/uninstall firmware when executing a test case that determines the firmware version.

Powerful Automated TestingThe RTD software supporting the UE control interface makes it easy tosetupautomatedtestsystems.Furthermore,multipletestcasescan be executed continuously and test reports generated automatically, and many functions, including repeat testing under different conditions with multiple settings, can be automated, offering carriers, etc., an ideal turnkey solution for acceptance testing.

Easy Test Case MaintenanceTest cases created by the RTD software can be updated easily when new3GPPstandardevolves,reducingtheneedforre-editing.Inaddition, guaranteed test case compatibility even when the MD8430A firmware version is changed removes the need to recompile, etc., resulting in greatly reduced costs for maintaining test cases to support regression testing when rolling out new terminalsandperformingpre-IOTtoassurecompatibilitywithnetworkequipmentworldwide.

Full Line of Versatile L3 Analysis Tools

Example of Test Case Campaign

Protocol Conformance TestPCTRTD PCT

LTE

RTDProtocol Conformance TestRapid Test DesignerRapid Test Designer

CDMA2000

W-CDMA/HSPAGSM/GPRS/EGPRS

MD8430A

MD8475A

MD8480C

Used as a component for test system

Signalling Tester MD8430A Features

Powerful Platform for Both Conformance and Operator Acceptance Tests

Field TestQoS

ManagementPre-

conformance/Conformance

Tests

Pre-CAT/CATOperator

AcceptanceTests

8

1 MonitorConnectoroutputtingsignalinternaldataandstatustoaccessory Monitor Board

2 Digital IQ InputConnectorforinputtingdigitalIQsignal

3 Digital IQ OutputConnectorforoutputtingdigitalIQsignal

4 Clock InputBNCconnectorforinputtingsystemclocktooperateusing external clock

5 Clock OutputBNCConnectorforoutputtingsystemclock

6 Sync InputBNCConnectorforinputtingandoperatingusingexternal sync signal

7 Sync OutputBNCConnectorforoutputtingsyncsignal

8 Aux InputBNCInputconnectorreservedforaddingfuturefunctions

9 Ethernet(1)EthernetconnectorforconnectingexternalPCcontroller(2) EthernetconnectortocontrolMD8480C,connecting

with‘ControlPC’connectoronMD8480C(3)Ethernetconnectorforserver(4) EthernetconnectorforconnectingMD8480Cusing

‘10/100BASE-T’connector10 Sub (Simplex) Output

NconnectorforRFoutput11 Sub (Simplex) Input

NconnectorforRFinput12 Main (Duplex) Input/Output

NconnectorforRFinput/output13 LCD

Screendisplayingequipmentinformationsuchasfirmwareselectionandmaintenancesoftwarescreens

Signalling Tester MD8430A Panel Layout

Front Panel

1 2 3 4 5

6

7

8

9

101112

13

9

14 Trigger InputBNCConnectorforinputtingatriggersignalfromexternalequipment

15 Trigger OutputBNCConnectorforoutputtingeventtimingtoexternalequipment

16 10 MHz Reference InputBNCConnectorforinputtingexternalreferencesignal

17 10 MHz Buffered OutputBNCConnectorforoutputtingequipmentreferencesignal

18 Detector OutputBNCConnectorforoutputtingprofilesignalofRFsignalpower

19 Sync OutBNCConnectorforoutputtingsyncsignaltoFadingSimulator

20 LVDSConnectorforconnectingFadingSimulatorusingDigitalIQ

Signalling Tester MD8430A Panel Layout

Rear Panel

18 17 16 15 14

19 20

10

Test ModelsMD8430A-020 LTE Standard Test Model (STM)MD8430A-025 Basic Test Model (BTM)MD8430A-030 LTE Performance Test Model (PTM)MD8430A-035 LTE Enhanced Test Model (ETM)Chooseoneoftheabovefourmodels.

*:Pleaserefertopage6formoredetails.

Test Model UpgradeRequiredoptionwhenupgradingtohigherordermodel.

Upgrade from Function Test Model (FTM)Z1342A LTEFTMtoSTMUpgradeKitZ1344A LTEFTMtoPTMUpgradeKitZ1670A LTEFTMtoETMUpgradeKitZ1789A LTEFTMtoETMUpgradeKit(FO)

Upgrade from Standard Test Model (STM)Z1343A LTESTMtoPTMUpgradeKitZ1671A LTESTMtoETMUpgradeKitZ1790A LTESTMtoETMUpgradeKit(FO)

Upgrade from Performance Test Model (STM)Z1672A LTEPTMtoETMUpgradeKitZ1791A LTEPTMtoETMUpgradeKit(FO)

Upgrade from Basic Test modelZ1873A LTEBTMtoETMUpgradeKit

OptionsMD8430A-002 Extended Frequency Range to 3.8 GHzRequiredsoftwareoptionwhenextendingmaximumfrequencyofMD8430A(Tx/Rx)to3.8GHz.

MD8430A-003 Extended Frequency Range to 3.8 GHz HardwareRequiredhardwareoptionwhenextendingmaximumfrequencyofMD8430A(Tx/Rx)to3.8GHz.

MD8430A-005 Extended Frequency Range to 3.8 GHz Hardware 2RequiredhardwareoptionwhenextendingmaximumfrequencyofMD8430A(Tx/Rx)to3.8GHz.(TestModel:BTM,ETM)

MD8430A-006 Extended Frequency Range to 6 GHzRequiredsoftwareoptionwhenextendingmaximumfrequencyofMD8430A(Tx/Rx)to6GHz.

MD8430A-007 Extended Frequency Range to 6 GHz HardwareRequiredhardwareoptionwhenextendingmaximumfrequencyofMD8430A(Tx/Rx)to6GHz.

MD8430A-052 W-CDMA Fading OptionRequiredsoftwareoptionwhenW-CDMAfadingtesting.

MD8430A-055 LTE 2 × 2 MIMO Fading OptionRequiredsoftwareoptionwhenLTE2×2MIMOfadingtesting.

MD8430A-056 LTE 4 × 2 MIMO Fading OptionRequiredsoftwareoptionwhenLTE4×2MIMOfadingtesting.

MD8430A-057 LTE 4 × 4 MIMO Fading OptionRequiredsoftwareoptionwhenLTE4×4MIMOfadingtesting.

MD8430A-058 LTE 8 × 2 MIMO Fading OptionRequiredsoftwareoptionwhenLTE8×2MIMOfadingtesting.

MD8430A-060 LTE FDD OptionRequiredoptionwhensimulating3GPPLTEFDD.

MD8430A-061 LTE TDD OptionRequiredoptionwhensimulatingTD-LTE.

MD8430A-065 W-CDMA OptionRequiredoptionwhensimulatingW-CDMA.

MD8430A-066 GSM OptionRequiredoptionwhensimulatingGSM.

MD8430A-067 RF/Fading Driver OptionRequiredsoftwareoptionwhenextendingRFforMD8430A-025BTMandexecutingthefadingfunction(MD8430A-055,056,057,058)

MD8430A-070 HSPA Multi Carrier OptionRequiredoptionwhenHSPAmulticarriertesting.

MD8430A-071 W-CDMA/GSM Ciphering OptionOptionforaddingcipheringfunctionforW-CDMA,GSMandGPRS.SupportingKASUMIandSNOW3GtoW-CDMA.A5/1,A5/2,A5/3andA5/4toGSM.GEA1,GEA2,GEA3andGEA4toGPRS.

MD8430A-075 LTE DL 4 × 4 MIMO OptionRequiredsoftwareoptionwhenLTE4×4MIMOtesting.

MD8430A-080 LTE Ciphering OptionOptionforaddingcipheringfunctionsupportingEEA0,EEA1,andEEA2(TS33.401,TS36.323)algorithmstoLTE.

MD8430A-081 LTE ROHC OptionOptionforaddingLTEROHCfunctionsupportingRTP/UDP/IP(RFC3095,RFC4815),UDP/IP(RFC3095,RFC4815),ESP/IP(RFC3095,RFC4815),andIP(RFC3843,RFC4815). RequiredthisoptionforVoLTEtesting.

MD8430A-082 LTE MBMS OptionOptionforaddingLTEMBMSfunctionsupporting(P)MCHTransmissionScheduling,MCCHMessageTransmission,MSIMACcontrolelementTransmissionandMTCHMessageTransmissiondescribedin3GPP(TS36.211,TS36.221).

MD8430A-083 LTE ZUC Ciphering OptionOptionforaddingcipheringfunctionsupportingEEA3andEIA3 (TS33.401,TS35.221)algorithmstoLTE.

MD8430A-085 LTE Carrier Aggregation OptionOptionforaddingCarrierAggregation(CA)functionsupportingtransmission of up to two component carriers on downlink.

MD8430A-086 Ciphering OptionOptionforaddingcipheringfunctionsupportingEEA0,EEA1,EEA2,EEA3andEIA3(TS33.401,TS35.221,TS36.323)algorithmstoLTE.

MD8430A-087 LTE CoMP OptionRequiredsoftwareoptionwhen3GPPRelease11CoMPfeature.Itis available to test Dynamic Point Selection.

Signalling Tester MD8430A Configurations

Test Models/Options/Software

11

Software Maintenance ContractService Provided Contractforadding/revisingsoftwarefunctionsinlinewith3GPP

revisions Technical support for troubleshooting user problems

Annual Support Service (1 year)Optionproviding1yearofservicesupportforLTEfunctionsincluding web downloads of latest software and technical enquiries.Servicesdependonoptionconfiguration.

MD8430A Support Services

USER WITH CONTRACT

Web downloadOption KeyLicenseCertificate

Supplies latestoption key license

Supplies latestsoftware by Webdownload

Offers technicalsupport

Technical support address

Latest versiondevelopment

Anritsu

Latest softwaredevelopment

MD8430A Support (FDD)MD8430A-SS120 1YearSupportServiceLTEFDD(STM) MD8430A-SS130 1YearSupportServiceLTEFDD(PTM) MD8430A-SS135 1YearSupportServiceLTEFDD(ETM)

MD8430A Support (TDD)MD8430A-SS121 1YearSupportServiceLTETDD(STM) MD8430A-SS131 1YearSupportServiceLTETDD(PTM) MD8430A-SS136 1YearSupportServiceLTETDD(ETM)

MD8430A Support (W-CDMA/GSM)MD8430A-SS170 1YearSupportServiceW-CDMA/GSM

MX843010A LTE Control Software SupportMX843010A-SS120 1YearSupportService

MX843010E LTE Control Software SupportMX843010E-SS120 1YearSupportService(TestModel:ETM)

Signalling Tester MD8430A Configurations

Test Models/Options/Software (Cont’d)

Application ProductsMD8475A Signalling TesterBaseStationSimulatorsupportingCDMA2000MultipleSector/Carrieror1xEV-DORev.A.RealizesInter-workingtestsbetweenLTEandCDMA2000bycontrollingMD8430AandMD8475AsimultaneouslyfromMX786201ARapidTestDesigner(RTD).

MD8480C W-CDMA Signalling TesterBaseStationSimulatorsupportingHSPAEvolutionbasedonthe3GPPRelease8specification,W-CDMAandGSM.RealizesInter-RAThandover tests between LTE and UTRAN/GERAN by controlling MD8430AandMD8480CfromMX786201ARapidTestDesigner(RTD).

CDMA2000®isaregisteredtrademarkoftheTelecommunicationsIndustryAssociation(TIA-USA).

SoftwareMX843010A LTE Control SoftwareSoftwareforsimulatingL1andL2withtestcasesinC.

MX843010E LTE Control SoftwareSoftwareforsimulatingL1andL2withtestcasesinC. (TestModel:ETM)

MX843070E W-CDMA/GSM Control SoftwareSoftwareforsimulatingL1andL2withtestcasesinC. (TestModel:W-CDMA/GSM)

MX786201A Rapid Test Designer (RTD)SoftwareforsimulatingL1toL3withtestcasesdescribedbyGUIforautomatingtesting,analyzingtestcasesandcreatingreports.

12

Signalling Tester MD8430A Specifications

ReferenceOscillator

Referencefrequency:10MHzStart-upcharacteristics: 25°C,referencedtofrequency24-hourafterpower-on

±5×10–7(2min.afterpower-on) ±5×10–8(5min.afterpower-on)

Agingrate: ±1×10–8/day(referencedtofrequency48-hourafterpower-on) ±1×10–7/year(referencedtofrequency10-dayafterpower-on)

Temperaturecharacteristics:±2×10–8 (0° to 45°C,referencedtofrequencyat25°C)InternalreferenceoutputFrequencyadjustedatshipment:10MHz±0.02ppmOutputlevel:≥0dBm(50Ω,ACcoupling)Connector:BNC-J,50Ω(nom.)

External reference inputFrequency:10MHzOperatingrange:±1ppmInputlevel:–15dBm≤level≤+20dBm(50Ω,ACcoupling)Connector:BNC-J,50Ω(nom.)

Transmission Signal

FrequencyFrequencyrange:LTE:350MHzto3.0GHz,350MHzto3.8GHz(withMD8430A-002),350MHzto6.0GHz(withMD8430A-006)W-CDMA:400MHzto3.0GHz,400MHzto3.8GHz(withMD8430A-002/006)GSM:400MHzto2.0GHz

Settingresolution:100kHzOutputlevelMaximumoutputlevel: –40dBm(Mainconnector)(Maximumsettinglevel:–20dBm)

0dBm(Subconnector)Levelaccuracy: ±1.5dB(FrequencyRange:≥350MHzto≤3800MHz)

±2.0dB(FrequencyRange:>3800MHzto≤6000MHz) 18°to28°C,afterCal,forcalibrationCW Outputlevel: –113to–40dBm,allportsoutput:≤–40dBm(Mainconnector)

–113to0dBm(Subconnector)Modulation

Access methodLTE:OFDMA,W-CDMA:CDMA,GSM:TDMA

Modulation methodLTE:QPSK,16QAM,64QAM,256QAMW-CDMA:QPSK,16QAM,64QAMGSM:GMSK,8PSK

Modulation accuracyLTE:≤2%,18°to28°C,Suboutput:0dBm,LTE(OFDM,64QAM,20MHzband)W-CDMA:≤3.5%,18°to28°C,Suboutput:0dBm,W-CDMA(transmittingCPICH,ICH)GSM:≤1.5deg.,18°to28°C,Suboutput:0dBm,GMSK

≤3.5%,18°to28°C,Suboutput:0dBm,8PSK

Received Signal

FrequencyFrequencyrangeLTE:350MHzto3.0GHz,350MHzto3.8GHz(withMD8430A-002),350MHzto6.0GHz(withMD8430A-006)W-CDMA:400MHzto3.0GHz,400MHzto3.8GHz(withMD8430A-002/006)GSM:400MHzto2.0GHz

Settingresolution:100kHzInputlevelDemodulationrange: –28to+15dB(QPSK),–21to+15dB(16QAM),–15to+15dB(64QAM)

Referenced to reference power setting value Inputsignal:EVM≤1%,BER≤1×10−12,20MHzband,SC-FDMA ReferencePower:−20to+20dBm,Inputlevel:−30to+35dBm(Mainconnector) Referencepower:−35to+5dBm,Inputlevel:−45to+20dBm(Subconnector)

Levelaccuracy: ±3.0dB 18°to28°C,afterCal,forcalibrationCW Inputlevel: –30to+35dBm(Mainconnector)

–45to+20dBm,Referencepower:±15dB(Subconnector)Modulation

Access methodLTE:SC-FDMA,W-CDMA:CDMA,GSM:TDMA

Modulation methodLTE:QPSK,16QAM,64QAMW-CDMA:BPSK,4PAMGSM:GMSK,8PSK

SynchronizationacquirablerangeLTE:±100μs(PRACH),±30μs(PUSCH)W-CDMA:±100chips(PRACH),±100chips(DPCCH)GSM:0to63symbols(SACCH)

13

Connector

RFConnectorMainConnector:N-J,50Ω(nom.)VSWR: ≤1.3(FrequencyRange:≥350MHzto≤3800MHz)

≤1.4(FrequencyRange:>3800MHzto≤6000MHz)Sub(Downlink)Connector:N-J,50Ω(nom.)VSWR: ≤1.5(FrequencyRange:≥350MHzto≤3800MHz)

≤1.6(FrequencyRange:>3800MHzto≤6000MHz)Sub(Uplink)Connector:N-J,50Ω(nom.)VSWR: ≤1.5(FrequencyRange:≥350MHzto≤3800MHz)

≤1.6(FrequencyRange:>3800MHzto≤6000MHz)OtherDigitalIQ:DigitalIQsignalConnector:DX20(50-pin)×8IQ:16-bit

Monitor:ConnectionwiththeMonitorboard(G0091)Connector:DX20(80-pin)Signallevel:3.3V-CMOS

SyncOutput:InternalsyncstartsignaloutputConnector:BNCSignallevel:3.3V-CMOS

SyncInput:ExternalsyncstartsignaloutputConnector:BNCSignallevel:3.3V-CMOS

ClockOutput:InternalclocksignaloutputConnector:BNCSignallevel:3.3V-CMOS

ClockInput:ExternalclocksignalinputConnector:BNCSignallevel:3.3V-CMOSFrequency:10kHzto30.72MHz

FadingsimulatorinterfaceSyncOut:Connectionwiththefadingsimulator(Syncstartsignal)WithoutMD8430A-008/108/208Connector:BNC×3Signallevel:3.3V-CMOS

WithMD8430A-008/108/208Connector:BNC×2Signallevel:3.3V-CMOS

Port:Connectionwiththefadingsimulator(DigitalIQsignal)WithoutMD8430A-008/108/208Connector:HIB-B16LFYGA×6Signallevel:LVDS

WithMD8430A-008/108/208Connector:HIB-B16LFYGA×2(DigitalIQsignal:2ports/connector)Signallevel:LVDSConnector:HIB-B16LFYGA×4(DigitalIQsignal:8ports/connector)Signallevel:LVDS

Power Supply100V(ac)to120V(ac)/200V(ac)to240V(ac),50Hz/60Hz≤1200VA

Dimensions and Mass426(W)×310(H)×500(D)mm≤40kg

Environmental Conditions

TemperatureOperating: 0°to+45°C,≤90%RH(nocondensation)

0°to+40°C,≤90%RH(nocondensation)(withMD8430A-005/007)Storage:–20°to+60°C,≤85%RH(nocondensation)

EMC:EN61326-1,EN61000-3-2LVD:EN61010-1

Signalling Tester MD8430A Specifications

14

Pleasespecifythemodel/ordernumber,nameandquantitywhenordering.ThenameslistedinthechartbelowareOrderNames.TheactualnameoftheitemmaydifferfromtheOrderName.

Model/OrderNo Name

MD8430AMD8430A-003MD8430A-020

LTE Standard Test ModelSignalling TesterExtendedFrequencyRangeto3.8GHzHardwareLTEStandardTestModel(STM)

MD8430AMD8430A-003MD8430A-030

LTE Performance Test ModelSignalling TesterExtendedFrequencyRangeto3.8GHzHardwareLTEPerformanceTestModel(PTM)

MD8430AMD8430A-005MD8430A-025

LTE Basic Test ModelSignalling TesterExtendedFrequencyRangeto3.8GHzHardware2BasicTestModel(BTM)

MD8430AMD8430A-005MD8430A-035

LTE Enhanced Test ModelSignalling TesterExtendedFrequencyRangeto3.8GHzHardware2LTEEnhancedTestModel(ETM)

J1440AJ1211J0127AJ0576BJ1398AG0091J1005J1459A

Standard AccessoriesCD-ROM(OperationManualandMaintenanceSoftware): 1pcLANCable: 2pcsPowerCord,3.0m(15A): 1pcCoaxialCord,1.0m(BNC-P·RG58A/U·BNC-P): 1pcCoaxialCord,1.0m(N-P·5D-2W·N-P): 2pcsN-SMAAdaptor: 6unitsMonitorBoard: 1pcMonitorCable80: 1pcDigitalIQCable(50cm): 1pc

MD8430A-002MD8430A-006MD8430A-052MD8430A-055MD8430A-056MD8430A-057MD8430A-058MD8430A-060MD8430A-061MD8430A-065MD8430A-066MD8430A-067MD8430A-070MD8430A-071MD8430A-075MD8430A-080MD8430A-081MD8430A-082MD8430A-083MD8430A-085MD8430A-086MD8430A-087

OptionsExtendedFrequencyRangeto3.8GHzExtendedFrequencyRangeto6GHzW-CDMAFadingOptionLTE2×2MIMOFadingOptionLTE4×2MIMOFadingOptionLTE4×4MIMOFadingOptionLTE8×2MIMOFadingOptionLTEFDDOptionLTETDDOptionW-CDMAOptionGSMOptionRF/FadingDriverOptionHSPAMultiCarrierOptionW-CDMA/GSMCipheringOptionLTEDL4×4MIMOOptionLTECipheringOptionLTEROHCOptionLTEMBMSOptionLTEZUCCipheringOptionLTECarrierAggregationOptionCipheringOptionLTECoMPOption

MD8430A-103

MD8430A-107

MD8430A-117

MD8430A-203

MD8430A-207

MD8430A-217

ExtendedFrequencyRangeto3.8GHzHardwareRetrofit(forAsia,Oceania)ExtendedFrequencyRange3GHzto6GHzHardwareRetrofit (forAsia,Oceania)ExtendedFrequencyRange3.8GHzto6GHzHardwareRetrofit (forAsia,Oceania)ExtendedFrequencyRangeto3.8GHzHardwareRetrofit(FO)ExtendedFrequencyRange3GHzto6GHzHardwareRetrofit (FO)ExtendedFrequencyRange3.8GHzto6GHzHardwareRetrofit (FO)

Model/OrderNo Name

MX843010AMX843010EMX843070EMX786201A

Software OptionsLTEControlSoftwareLTEControlSoftwareW-CDMA/GSMControlSoftwareRapidTestDesigner(RTD)

MD8430A-SS120MD8430A-SS125MD8430A-SS130MD8430A-SS135

Main frame Support Service[FDD]1YearSupportServiceforLTEFDD(STM)1YearSupportServiceforLTEFDD(BTM)1YearSupportServiceforLTEFDD(PTM)1YearSupportServiceforLTEFDD(ETM)

MD8430A-SS121MD8430A-SS126MD8430A-SS131MD8430A-SS136

[TDD]1YearSupportServiceforLTETDD(STM)1YearSupportServiceforLTETDD(BTM)1YearSupportServiceforLTETDD(PTM)1YearSupportServiceforLTETDD(ETM)

MD8430A-SS170[W-CDMA/GSM]1YearSupportServiceforW-CDMA/GSM

MX843010A-SS120MX843010E-SS120

LTE Control Software Support Service1YearSupportService1YearSupportService

Z1342AZ1344AZ1343AZ1670AZ1789AZ1671AZ1790AZ1672AZ1791AZ1873A

Upgrade OptionsLTEFTMtoSTMUpgradeKitLTEFTMtoPTMUpgradeKitLTESTMtoPTMUpgradeKitLTEFTMtoETMUpgradeKitLTEFTMtoETMUpgradeKit(FO)LTESTMtoETMUpgradeKitLTESTMtoETMUpgradeKit(FO)LTEPTMtoETMUpgradeKitLTEPTMtoETMUpgradeKit(FO)LTEBTMtoETMUpgradeKit

MD8475AMD8480CMN8150AJ1416AJ1609A

Application ProductsSignalling TesterW-CDMASignallingTesterRFCombinerUnitLVDSCABLESignal Divider

*: APC*1runningMicrosoftVisualC++2008ExpressEdition,MicrosoftVisualC++2010ExpressEditionorMicrosoftVisualStudioExpress2012isrequiredtousetheMD8430A. Itmustbesuppliedbythecustomer.

ThePCcontrollerfortheMD8430Amustmeetorexceedthefollowingspecifications:

OS:Windows7(64bit)orlater CPU:IntelCorei5processer2.6GHzormore RAM:4GBormore NIC:1000BASE-T

Windows®,VisualC++®isaregisteredtrademarkofMicrosoftCorporationinthe USA and other countries.

Intel®,Core™2DuoisregisteredtrademarksofIntelCorporationoritssubsidiaries in the USA and other countries.

Signalling Tester MD8430A Ordering Information

15

Note:

Anritsu Company 1155 East Collins Blvd., Suite 100, Richardson, TX 75081, U.S.A.Toll Free: 1-800-267-4878Phone: +1-972-644-1777Fax: +1-972-671-1877

• CanadaAnritsu Electronics Ltd.700 Silver Seven Road, Suite 120, Kanata, Ontario K2V 1C3, CanadaPhone: +1-613-591-2003 Fax: +1-613-591-1006

• Brazil Anritsu Eletronica Ltda.

Phone: +55-11-3283-2511Fax: +55-11-3288-6940

• MexicoAnritsu Company, S.A. de C.V.Av. Ejército Nacional No. 579 Piso 9, Col. Granada11520 México, D.F., MéxicoPhone: +52-55-1101-2370Fax: +52-55-5254-3147

• United KingdomAnritsu EMEA Ltd. 200 Capability Green, Luton, Bedfordshire, LU1 3LU, U.K.Phone: +44-1582-433200 Fax: +44-1582-731303

• FranceAnritsu S.A. 12 avenue du Québec, Bâtiment Iris 1- Silic 612,91140 VILLEBON SUR YVETTE, FrancePhone: +33-1-60-92-15-50Fax: +33-1-64-46-10-65

• GermanyAnritsu GmbHNemetschek Haus, Konrad-Zuse-Platz 1 81829 München, Germany Phone: +49-89-442308-0Fax: +49-89-442308-55

• ItalyAnritsu S.r.l.Via Elio Vittorini 129, 00144 Roma, ItalyPhone: +39-6-509-9711 Fax: +39-6-502-2425

• SwedenAnritsu ABKistagången 20B, 164 40 KISTA, SwedenPhone: +46-8-534-707-00Fax: +46-8-534-707-30

• FinlandAnritsu ABTeknobulevardi 3-5, FI-01530 VANTAA, FinlandPhone: +358-20-741-8100Fax: +358-20-741-8111

• DenmarkAnritsu A/SKay Fiskers Plads 9, 2300 Copenhagen S, DenmarkPhone: +45-7211-2200Fax: +45-7211-2210

• RussiaAnritsu EMEA Ltd. Representation Office in RussiaTverskaya str. 16/2, bld. 1, 7th floor.Moscow, 125009, RussiaPhone: +7-495-363-1694Fax: +7-495-935-8962

• SpainAnritsu EMEA Ltd. Representation Office in SpainEdificio Cuzco IV, Po. de la Castellana, 141, Pta. 828046, Madrid, SpainPhone: +34-915-726-761Fax: +34-915-726-621

• United Arab EmiratesAnritsu EMEA Ltd. Dubai Liaison Office

• P.R. China (Shanghai)Anritsu (China) Co., Ltd.Room 2701-2705, Tower A, New Caohejing International Business CenterNo. 391 Gui Ping Road Shanghai, 200233, P.R. ChinaPhone: +86-21-6237-0898Fax: +86-21-6237-0899

• P.R. China (Hong Kong)Anritsu Company Ltd.Unit 1006-7, 10/F., Greenfield Tower, Concordia Plaza,No. 1 Science Museum Road, Tsim Sha Tsui East, Kowloon, Hong Kong, P.R. ChinaPhone: +852-2301-4980Fax: +852-2301-3545

• JapanAnritsu Corporation

Phone: +81-46-296-6509Fax: +81-46-225-8359

8-5, Tamura-cho, Atsugi-shi, Kanagawa, 243-0016 Japan

• KoreaAnritsu Corporation, Ltd.5FL, 235 Pangyoyeok-ro, Bundang-gu, Seongnam-si, Gyeonggi-do, 13494 KoreaPhone: +82-31-696-7750Fax: +82-31-696-7751

• AustraliaAnritsu Pty. Ltd.

Phone: +61-3-9558-8177Fax: +61-3-9558-8255

• TaiwanAnritsu Company Inc.7F, No. 316, Sec. 1, NeiHu Rd., Taipei 114, TaiwanPhone: +886-2-8751-1816Fax: +886-2-8751-1817

1603

Printed on Recycled Paper

• SingaporeAnritsu Pte. Ltd.11 Chang Charn Road, #04-01, Shriro HouseSingapore 159640Phone: +65-6282-2400Fax: +65-6282-2533

• IndiaAnritsu India Private Limited2nd & 3rd Floor, #837/1, Binnamangla 1st Stage,Indiranagar, 100ft Road, Bangalore - 560038, IndiaPhone: +91-80-4058-1300Fax: +91-80-4058-1301

Specifications are subject to change without notice.

• United States

Unit 20, 21-35 Ricketts Road, Mount Waverley, Victoria 3149, Australia

902, Aurora Tower,P O Box: 500311- Dubai Internet CityDubai, United Arab EmiratesPhone: +971-4-3758479Fax: +971-4-4249036

Praça Amadeu Amaral, 27 - 1 Andar01327-010 - Bela Vista - Sao Paulo - SPBrazil

PrintedinJapan28/APR/2016ddcm/CDTCatalogNo.MD8430A-E-A-1-(9.00)


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