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Cable Testing Report

By: Neetrac 

Presented By: Tapas

Ankit Kumar

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Data Analysis Summary

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CDFI Participants list

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Basic Cable Diagnostic TestingTechnologies

Time omain !eflectometry "T!#Partial ischarge "P# at operating$ elevated % H'$ elevated (ery )ow

*re+uencies "()*# or amped A, "A,# (oltagesTan - .ielectric /pectroscopy at % H'$ ()* or variable fre+uencies!ecovery (oltage

, )eakage ,urrentPolari'ation and epolari'ation ,urrent/imple 0ithstand Tests at 1levated ()*$ % H' A,$ or , (oltagesAcoustic P Techni+ues2onitored 0ithstand Tests at 1levated ()*$ % H' A,$ or , (oltages

with simultaneousmonitoring of P$ Tan -$ or )eakage ,urrent,ombined iagnostic Tests at % H' A,$ (ery )ow *re+uencies "()*#$ or

amped A, "A,#voltages using P and Tan -

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!" A P!"#R CAB$# S%ST#&A'#S( D#'RAD#S( AND FAI$S

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Time)Domain Re*lectometry +TDR,

Test Scope

A time3domain reflectometer locates and characteri'eschanges in impedance in a cable system4

These changes can be caused by:5 faults "shorts#$

5 6oints "splices#$

5 open connections$

5 taps in the circuit$

5 deteriorated neutrals$

5 water ingress into insulation material or 6oints$ and

5 bad "high resistance# connectors4

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&oisture in splice

0ateringresslocation

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Partial Discharge +PD,

A large amount of research published over thepast decade investigates the characteri'ation ofpartial discharge sources in power cable systems47evertheless$ the study of partial discharge incables is empirical due to the comple8ity of thephenomenon However$ P is a powerful

  tool to evaluate the condition of a power cable

system$ especially at H( and for commissioningtests4

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Test Scope

Partial ischarge detects locali'ed 9void type defects$ primarily inthe form of voids in cable or accessories4 (oids in this conte8tcan be:

5 ;uasi3spherical "most often due to manufacturing process

problems#$5 endritic "often due to aging processes that lead to the

development of electrical trees

  resulting from enhanced voltage stresses#$

5

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$imiting -alues o* PD Cable Testing

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Tan . &easurement

Test /copeTan - measurements determine the degree of real power dissipation in a dielectric

material4 A comparison relates this measurement to a known reference value forthe type of dielectric measured4 A 6udgment establishes the condition of the testedcircuit based on how much the dielectric loss differs from the reference value4!eference values can be based on:

(alues measured on ad6acent phases "A$ B$ ,#$

5 (alues measured on cables of the same design and vintage within the samelocation$

5 (alues when new$

5

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o/ it "or0s

Applying an A, voltage and measuring the phasedifference between the voltage waveform and theresulting current waveform provides the Tan -4 This

phase angle is used to resolve the total current "I)into its charging (IC) and loss (IR) components.The Tan δ is the ratio of the loss current to thecharging current4

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Success Criteria

Tan - results appear in terms of the specific lossmeasurement or the increase of loss "=tip up># at selectedapplied voltages "electrical stresses#4 The tip up is morecorrectly a voltage gradient$ however in present day Tan -

terminology it is the difference between the dielectric lossmeasured at ? and @ ?4 The results are often interpretedusing rules such as those in Table @ where test values fallinto two classes: Pass and 7ot Pass4 However$ the basicdata are usually reported4 This feature is powerful andvaluable as it makes it possible to:

5 !einterpret data in the light of new knowledge$

5 Track trends$ and

5 ,ompare with ad6acent cable lengths4

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 IEEE Std. 400™ - 2001 Criteria

As mentioned earlier$ according to

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DC $ea0age Current &easurementTechniue

Test Scope, leakage current tests consist of the application of

, voltage with the simultaneous measurement ofleakage current4

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o/ it "or0s

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Than0 %ou