This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory
quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
CERTIFICATE OF ACCREDITATION ANSI National Accreditation Board
11617 Coldwater Road, Fort Wayne, IN 46845 USA
This is to certify that
Thai Heart Calibration Co., Ltd. 2299/12-13 Moo 4 Theparak
Muang, Samutprakarn 10270 Thailand has been assessed by ANAB and meets the requirements of international standard
ISO/IEC 17025:2017 while demonstrating technical competence in the field of
CALIBRATION Refer to the accompanying Scope of Accreditation for information regarding the types of
activities to which this accreditation applies
AC-2695 Certificate Number
Certificate Valid Through: 08/09/2021
Version No. 001 Issued: 08/09/2019
Version 001 Issued: August 09, 2019 www.anab.org
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SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017
Thai Heart Calibration Co., Ltd. 2299/12-13 Moo 4 Theparak,
Muang, Samutprakarn 10270, Thailand Ekachai Puttitwong, [email protected], 6689-692-1759
CALIBRATION
Valid to: August 9, 2021 Certificate Number: AC-2695
Acoustics and Vibration
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Digital Sound Level Meter 94 dB, 114 dB 0.2 dB
Extech 407766 Sound Level Calibrator
Extech 407736 Sound Level Meter
Chemical Quantities
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Refractometer (Solution) - %Brix
5 %Brix 10 %Brix 20 %Brix 30 %Brix 40 %Brix 50 %Brix 60 %Brix
0.012 %Brix 0.012 %Brix 0.012 %Brix 0.012 %Brix 0.012 %Brix 0.012 %Brix 0.012 %Brix
Sucrose Standard Solution
1Refractometer (Solution)
-Refractive Index
1.340 26 nD 1.347 82 nD 1.363 84 nD 1.381 15 nD 1.399 86 nD 1.420 09 nD 1.441 93 nD
0.000 071 nD 0.000 071 nD 0.000 071 nD 0.000 071 nD 0.000 071 nD 0.000 071 nD 0.000 071 nD
Sucrose Standard Solution
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Chemical Quantities
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Refractometer
(Compare) - %Brix
-Refractive Index
(0 to 60) %Brix
(1.332 99 to 1.441 93) nD
0.1 %Brix
0.000 14 nD
Standard Refractometer
Hydrometer - Specific Gravity
- API
- Baume
- %Alcohol
(0.700 to 1.790) g/cm3
(29 to 70) API
(1 to 63) Baume
(1 to 100) %Alcohol
0.000 86 g/cm3
0.062 API
0.058 Baume
0.58 %Alcohol
Standard Hydrometer
Beaker
(0 to 5) ml (>5 to 10) ml
(>10 to 20) ml (>20 to 50) ml (>50 to 100) ml (>100 to 200) ml (>200 to 500) ml
(>500 to 1 000) ml (>1 000 to 2 000) ml
0.58 µl 1.2 µl 2.3 µl 5.7 µl
0.012 ml 0.024 ml 0.061 ml 0.13 ml 0.24 ml
Analytical Balance
Cylinder
(0 to 10) ml (>10 to 50) ml (>50 to 100) ml (>100 to 500) ml
(>500 to 1 000) ml (>1 000 to 2 000) ml
1.3 µl 6.0 µl
0.012 ml 0.06 ml 0.12 ml 0.24 ml
Analytical Balance
Dispenser
(0 to 1) ml (>1 to 5) ml (>5 to 10) ml (>10 to 25) ml (>25 to 50) ml
(>50 to 100) ml
0.074 µl 0.28 µl 0.55 µl 1.4 µl 2.7 µl 5.4 µl
Analytical Balance
Piston Burette
(0 to 1) ml (>1 to 5) ml (>5 to 10) ml (>10 to 25) ml (>25 to 50) ml
0.074 µl 0.28 µl 0.55 µl 1.4 µl 2.7 µl
Analytical Balance
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Chemical Quantities
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
Micropipette
(0 to10) µl (>10 to 20) µl (>20 to 100) µl
(>100 to 500) µl (>500 to 1 000) µl
(>1 000 to 5 000) µl (>5 000 to 10 000) µl
(>10 000 to 20 000) µl
0.017 µl 0.018 µl 0.019 µl 0.034 µl 0.058 µl 0.27 µl 0.54 µl 1.1 µl
Analytical Balance
1Gas detector, Gas analyzer - Gas detector
Oxygen in nitrogen
1 cmol/mol 18 cmol/mol 21 cmol/mol
1.1 % of reading 1.1 % of reading 1.1 % of reading
Standard Mixture Gas
Carbon monoxide in nitrogen
Methane in air
-Gas analyzer Oxygen in nitrogen
Carbon monoxide in nitrogen
80 µmol/mol 300 µmol/mol
2.2 cmol/mol
1 cmol/mol 18 cmol/mol 21 cmol/mol
80 µmol/mol
300 µmol/mol 1 000 µmol/mol
2.1 % of reading 1.1 % of reading
2.1 % of reading
1.1 % of reading 1.1 % of reading 1.1 % of reading
2.1 % of reading 1.1 % of reading 1.1 % of reading
Standard Mixture Gas
Electrical – DC/Low Frequency
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Oscilloscope
Vertical Deflection (Amplitude)
- Input Impedance 1 MΩ - Input Impedance 50 Ω
Square Wave
1 mV/div to 10 V/div 1 mV/div to 5 V/div
0.052 % of reading 0.052 % of reading
Tektronix CG5010 Calibration Generator
(Volt Mode) Programmable Pulse Head
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Electrical – DC/Low Frequency
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Oscilloscope Horizontal Deflection (Time)
2 ns/div 5 ns/div 10 ns/div 20 ns/div 50 ns/div 100 ns/div 200 ns/div 500 ns/div 1 µs/div 2 µs/div 5 µs/div
10 µs/div 20 µs/div 50 µs/div 100 µs/div 200 µs/div 500 µs/div 1 ms/div 2 ms/div 5 ms/div 10 ms/div 20 ms/div 50 ms/div
100 ms/div 200 ms/div 500 ms/div
1 s/div 2 s/div 5 s/div
0.000 58 ns 0.000 58 ns 0.005 8 ns 0.005 8 ns 0.005 8 ns 0.058 ns 0.058 ns 0.058 ns
0.000 58 µs 0.000 58 µs 0.000 58 µs 0.0058 µs 0.0058 µs 0.0058 µs 0.058 µs 0.058 µs 0.058 µs
0.00058 ms 0.00058 ms 0.00058 ms 0.0058 ms 0.0058 ms 0.0058 ms 0.058 ms 0.058 ms 0.058 ms 0.058 ms 0.058 ms 0.058 ms
Tektronix CG5010 Calibration Generator (Time Maker Mode)
Programmable Pulse Head
1Handheld LCR Meter
(0.01 to 1 000) Ω (1 to 1 000) kΩ (1 to 1 000) MΩ (1 to <10) MΩ
(10 to < 100) MΩ (100 to 1 000) MΩ
0.063 Ω 0.064 kΩ 13 MΩ
0.058 MΩ 1.1 MΩ 13 MΩ
Agilent 3458A Multimeter, Decade Resistance
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Electrical – DC/Low Frequency
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Handheld LCR Meter Capacitance
@ 1 kHz (0 to < 200) pF
(200 to < 400) pF (400 to < 600) pF (600 to < 800) pF (800 to 1000) pF (1 to < 200) nF
(200 to < 400) nF (400 to < 600) nF (600 to < 800) nF
(800 to < 1 000) nF
8.1 pF 17 pF 27 pF 36 pF 45 pF 9.2nF 18 nF 28 nF 37 nF 46 nF
Hewlett Packard 4263B LCR Meter, Capacitance
Standards
1Handheld LCR Meter Inductance
@ 1 kHz (0 to < 20) mH (20 to < 40) mH (40 to < 60) mH (60 to < 80) mH
(80 to < 100) mH (100 to < 200) mH (200 to < 400) mH (400 to < 600) mH (600 to < 800) mH (800 to 1 000) mH
0.44mH 0.9 mH 1.4 mH 1.8 mH 2.3 mH 4.6 mH 9.2 mH 14 mH 18 mH 23 mH
Hewlett Packard 4263B LCR Meter, Inductance
Standards
1Insulation Tester (at 100 V, 250 V, 500 V, and
1,000 V)
100 kΩ to 1 MΩ (>1 to 10) MΩ
(>10 to 100) MΩ >100 MΩ to 1 GΩ
(>1 to 10) GΩ
140 µΩ/Ω 200 µΩ/Ω 700 µΩ/Ω
1 200 µΩ/Ω 2 500 µΩ/Ω
IET HRRS-Q-9-10-10 kV Decade Resistor
1Electrostatic Field Meter
(0 to 2) kV (2 to 4) kV (4 to 6) kV (6 to 8) kV
(8 to 10) kV
0.013 kV 0.024 kV 0.035 kV 0.047 kV 0.058 kV
K Jin R Li KC-2671A Withstanding Voltage
Tester, Kikusui 149-10A Voltmeter
1Inductance Substituter (1 to 1 000) mH 1.07 mH Hewlett Packard 4263B
LCR Meter 16089B Kelvin clip
1Capacitance Substituter (10 to 1 000) pF (1 to 1 000) nF
0.70 pF 0.70 nF
Hewlett Packard 4263B LCR Meter
16089B Kelvin clip
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Electrical – DC/Low Frequency
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1AC/DC Current Source (>0 to 1 500) A 0.3 % of reading Fluke 289 Multimeter,
Fluke 8846A Multimeter Current Shunt
1AC/DC Current Source (>0 to 1500) A @ 50 Hz
0.31 % of reading
Fluke 8846A Multimeter Current Shunt
Electrical – RF/Microwave
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
Bandwidth 100 kHz to 26.5 GHz 0.25 dB
Agilent 8482A Agilent 8485A Power Sensors
Agilent E4418A Power Meter, Agilent 11667B
Splitter 1RF Power - Measure
RF Power Reference at 1 mW 1 mW reference
50 MHz
0.5 % of reading
Agilent 8478B Power Sensor, HP 432A Power
Meter
1RF Power: (-30 to 20) dBm
100 kHz to 4.2 GHz (>4.2 to 18) GHz
(>18 to 26.5) GHz
0.14 dB 0.2 dB
0.25 dB
Agilent 8485A Power Sensor, Agilent E4418A
Power Meter
1,2Tuned RF Power - Measure 100 kHz to 26.5 GHz
0 dBm -10 dBm -20 dBm -30 dBm -40 dBm -50 dBm -60 dBm -70 dBm -80 dBm -90 dBm
0.033 dB+M 0.057 dB+M 0.07 dB+M 0.09 dB+M 0.11 dB+M 0.14 dB+M 0.16 dB+M 0.18 dB+M 0.2 dB+M 0.23 dB+M
HP 8902A Measuring Receiver
HP 11793A Power Sensor HP 11722A Power Sensor HP 11792A Power Sensor
1Frequency Response - Flatness
(-10 to 10) dB 100 kHz to 5 GHz > 5 GHz to 9 GHz > 9 GHz to 17 GHz
>17 GHz to 26.5 GHz
0.17 dB 0.18 dB 0.2 dB
0.22 dB
Agilent 8482A, Agilent 8485A Power Sensors
Agilent E4418A Power Meter, Agilent 11667B
Splitter
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Electrical – RF/Microwave
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Distortion - Measure
Fundamental Frequencies 400 Hz and 1 kHz
(0.01 to 100) %Distortion 0.15 %Distortion HP 8902A Measuring Receiver
1Amplitude Modulation - Measure
150 kHz to 10 MHz 150 kHz to 10 MHz
10 MHz to 1.3 GHz 10 MHz to 1.3 GHz
1.3 GHz to 26.5 GHz
1.3 GHz to 26.5 GHz
Rate: 50 Hz to 10 kHz Rate: 20 Hz to 10 kHz
Depth: 5% to 99% Rate: 50 Hz to 50 kHz Rate: 20 Hz to 100 kHz
Depth: 5% to 99% Rate: 50 Hz to 50 kHz
Depth: 5% to 99% Rate: 20 Hz to 100 kHz
Depth: 5% to 99%
2.2 % Depth 3.2 % Depth
1.2 % Depth 3.2 % Depth
1.7 % Depth
3.2 % Depth
HP 8902A Measuring Receiver
HP 11793A Power Sensor HP 11722A Power Sensor HP 11792A Power Sensor
1Frequency Modulation - Measure
150 kHz to 10 MHz
10 MHz to 1.3 GHz
10 MHz to 1.3 GHz
10 MHz to 26.5 GHz
10 MHz to 26.5 GHz
Rate: 20 Hz to 10 kHz Dev: ≤40 kHzpeak
Rate: 50 Hz to 100 kHz Dev: ≤400 kHzpeak
Rate: 20 Hz to 200 kHz Dev: ≤400 kHzpeak
Rate: 50 Hz to 100 kHz Dev: ≤400 kHzpeak
Rate: 20 Hz to 200 kHz Dev: ≤400 kHzpeak
2.6 % of reading
1.4 % of reading
6.1 % of reading
1.4 % of reading
6.1 % of reading
HP 8902A Measuring Receiver
HP 11793A Power Sensor HP 11722A Power Sensor HP 11792A Power Sensor
Phase Modulation 250 kHz to 10 MHz 10 MHz to 26.5 GHz
Dev: 20 Hz to 10 kHz
Rate: 50 Hz to 100 kHz
5 % of reading
3.8 % of reading
HP 8902A Measuring Receiver
HP 11793A Power Sensor HP 11722A Power Sensor HP 11792A Power Sensor
1RF Power - Source
3 µW 10 µW 30 µW 100 µW 300 µW 1 mW 3 mW 10 mW 30 mW 100 mW
0.01 µW 0.03 µW 0.1 µW 0.3 µW 1 µW
0.003 mW 0.009 mW 0.03 mW 0.1 mW 0.3 mW
HP 11683A Range Calibrator
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Electrical – RF/Microwave
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Display Average Noise Level
- Average Noise Level (-130 to 0) dBm
9 kHz to 26.5 GHz 12 dB Keysight 85052B
Calibration Kit (50 Ohm Match)
1Input Attenuator Accuracy (0 to 70) dB 9 kHz to 26.5 GHz 1.1 dB Agilent E4421B, HP
8340A Signal Generators Resolution Bandwidth - Bandwidth Switching
(-30 to 10) dB RBW: 300 Hz to 3MHz 0.24 dB Cable and Adapter
Scale Fidelity Accuracy - Logarithmic scale 1 dB/Step - Logarithmic scale 10 B/Step
- Linear scale
(>0 to 80) dB 9 kHz to 26.5 GHz
0.15 dB 0.15 dB
3.5 % of reading
Agilent E4421B, HP 8340A Signal Generators
Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Holtest / Three-Point Internal Micrometer
(6 to 8) mm (8 to 10) mm (10 to 12) mm (12 to 16) mm (16 to 20) mm (20 to 25) mm (25 to 30) mm (30 to 40) mm
1 µm 1.5 µm 1.5 µm 1.2 µm 1.5 µm 1.3 µm 1.2 µm 1.2 µm
Plain Ring Gauge
1Holtest / Three-Point Internal Micrometer
(40 to 50) mm (50 to 63) mm (62 to 75) mm (75 to 88) mm
(87 to 100) mm (100 to 125) mm (125 to 150) mm
1.7 µm 1.1 µm 1.1 µm 1.3 µm 1.6 µm 1.6 µm 1.6 µm
Plain Ring Gauge
1Can Seam Micrometer (0 to 13) mm 0.6 µm Gauge Block Set 1Dial and Digital Test
Indicator Up to 1.6 mm 2.4 µm Dial Gauge Tester
1Dial and Digital Indicator Up to 25 mm 2.4 µm Dial Gauge Tester
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Vernier, Dial and Digital Height Gauge
(0 to 200) mm (>200 to 300) mm (>300 to 450) mm (>450 to 600) mm
(>600 to 1 000) mm
0.78 µm 0.96 µm 1.4 µm 1.7 µm 3.9 µm
Gauge Block Set
1Dial and Digital Thickness Gauge
(0 to 20) mm (>20 to 40) mm (>40 to 50) mm (>50 to 100) mm
0.59 µm 0.6 µm 0.61 µm 0.65 µm
Gauge Block Set
1Vernier, Dial and Digital Depth Gauge
(0 to 20) mm (>20 to 50) mm (>50 to 100) mm (>100 to 150) mm (>150 to 200) mm (>200 to 300) mm (>300 to 600) mm
0.3 µm 0.61 µm 0.65 µm 0.71 µm 2.4 µm 2.5 µm 2.8 µm
Gauge Block Set
1Coating Thickness Gauge
(0 to 0.5) mm (>0.5 to 1) mm
(>1 to 1.25) mm (>1.25 to 1.5) mm
(>1.5 to 3) mm
0.52 µm 0.54 µm 0.55 µm 0.56 µm 0.66 µm
Standard Foils
1Ultrasonic Thickness Gauge
(0 to 20) mm (>20 to 50) mm (>50 to 100) mm
0.59 µm 0.61 µm 0.65 µm
Gauge Block Set
1Micrometer
(0 to 25) mm (>25 to 50) mm (>50 to 75) mm (>75 to 100) mm (>100 to 125) mm (>125 to 150) mm (>150 to 175) mm (>175 to 200) mm (>200 to 250) mm (>250 to 300) mm (>300 to 400) mm (>400 to 500) mm (>500 to 600) mm (>600 to 700) mm (>700 to 800) mm (>800 to 900) mm
(>900 to 1 000) mm
0.12 µm 0.61 µm 0.64 µm 0.65 µm 0.68 µm 0.71 µm 0.75 µm 0.78 µm 0.86 µm 0.96 µm 1.2 µm 1.4 µm 1.7 µm 1.9 µm 2.1 µm 2.4 µm 2.6 µm
Gauge Block Set
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Vernier, Dial and Digital Caliper (External, Internal and Depth Measurement)
(0 to 150) mm (>150 to 200) mm (>200 to 450) mm (>450 to 600) mm
(>600 to 1 000) mm (>1 000 to 1 500) mm (>1 500 to 2 000) mm
3 µm 5.8 µm 5.9 µm 6 µm
6.4 µm 7 µm
7.7 µm
Gauge Block Set
1Roughness Tester
Ra 0.43 µm Ra 1.569 µm Ra 2.93 µm
Rz 1.8 µm
Rz 3.641 µm Rz 11.4 µm
0.044 µm 0.045 µm 0.045 µm
0.16 µm 0.16 µm 0.17 µm
Roughness Specimen
1Bore Gauge / Cylinder Gauge
(0 to 10) mm (> 10 to 18) mm (>18 to 35) mm (>35 to 60) mm
(>60 to 100) mm (>100 to 160) mm (>160 to 250) mm (>250 to 400) mm (>400 to 600) mm (>600 to 800) mm
0.25 µm 0.28 µm 0.26 µm 0.3 µm 0.38 µm 0.52 µm 0.67 µm 1.1 µm 1.6 µm 2.1 µm
Gauge Block Set
1Dial and Digital Caliper Gauge for External
Measurement
(0 to 20) mm (>20 to 40) mm (>40 to 60) mm (> 60 to 70) mm (>70 to 90) mm
(>90 to 100) mm (>100 to 150) mm
0.59 µm 0.6 µm 0.61 µm 0.62 µm 0.64 µm 0.65 µm 0.71 µm
Gauge Block Set
1Dial and Digital Caliper Gauge for Internal
Measurement
(0 to 20) mm (>20 to 40) mm (>40 to 60) mm (> 60 to 70) mm (>70 to 90) mm
(>90 to 100) mm (>100 to 150) mm
0.59 µm 0.6 µm 0.61 µm 0.62 µm 0.64 µm 0.65 µm 0.71 µm
Gauge Block Set
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Depth Micrometer
(0 to 25) mm (>25 to 50) mm (>50 to 75) mm
(>75 to 100) mm (>100 to 125) mm (>125 to 150) mm
0.59 µm 0.61 µm 0.64 µm 0.65 µm 0.68 µm 0.71 µm
Gauge Block Set
Roller Counter
(0 to 100) mm (> 100 to 200) mm (>200 to 300) mm (>300 to 400) mm (>400 to 500) mm (>500 to 600) mm (>600 to 700) mm (>700 to 800) mm (>800 to 900) mm
(>900 to 1 000) mm (>1 000 to 5 000) mm (>5 000 to 9 000) mm (>9 000 to 9 999) mm
0.58 m 1.2 m 1.7 m 2.3 m 2.9 m 3.5 m 4 m
4.6 m 5.2 m 5.8 m 29 m 52 m 58 m
Universal Length Measuring Machine
Surface Plate ≤ 300 mm2 1.4 µm Lever Probe with Display
1Level Gauge (0 to 25) mm 2.9 µm Gauge Block Set
Precision Square
(0 to 150) mm (> 150 to 250) mm (>250 to 300) mm (>300 to 500) mm
1.1 µm 1.6 µm 1.9 µm 3 µm
Gauge Block Set
1Bench Center (0 to 150) mm 2.2 µm Test Bar and Dial Test Indicator
Offset Centerline Caliper (0 to 300) mm 2.7 µm Gauge Block Set and Profile Projector
Indicating Micrometer
(0 to 25) mm (> 25 to 50) mm (>50 to 75) mm (>75 to 100) mm
0.59 µm 0.61 µm 0.64 µm 0.65 µm
Gauge Block Set
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
Caliper Checker, Check Master, and Step Gauge
(0 to 20) mm (> 20 to 50) mm
(> 50 to 100) mm (> 100 to 150) mm (> 150 to 200) mm (> 200 to 300) mm (> 300 to 400) mm (> 400 to 500) mm (> 500 to 600) mm (> 600 to 700) mm (> 700 to 800) mm (> 800 to 900) mm
(> 900 to 1 000) mm
0.35 µm 0.36 µm 0.4 µm 0.44 µm 0.48 µm 0.59 µm 0.71 µm 0.83 µm 0.91 µm 1.1 µm 1.2 µm 1.3 µm 1.4 µm
Gauge Block and Lever Probe
with Display
Feeler Gauge, Thickness Gauge (0 to 5) mm 0.16 µm Universal Length
Measuring Machine
Micrometer Standard, Setting Rod
(0 to 25) mm (> 25 to 50) mm (> 50 to 75) mm
(> 75 to 100) mm (> 100 to 125) mm (> 125 to 150) mm (> 150 to 175) mm (> 175 to 200) mm (> 200 to 225) mm (> 225 to 250) mm (> 250 to 275) mm (> 275 to 300) mm (> 300 to 325) mm (> 325 to 350) mm (> 350 to 375) mm (> 375 to 400) mm
0.18 µm 0.29 µm 0.39 µm 0.52 µm 0.63 µm 0.74 µm 0.86 µm 0.97 µm 1.1 µm 1.3 µm 1.3 µm 1.5 µm 1.6 µm 1.7 µm 1.9 µm 2 µm
Gauge Block and Universal Length Measuring Machine
Micrometer Standard, Setting Rod
(> 400 to 425) mm (> 425 to 450) mm (> 450 to 475) mm (> 475 to 500) mm
2 µm 2.1 µm 2.4 µm 2.4 µm
Gauge Block and Universal Length Measuring Machine
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment Thread Plug Gauge
(Pitch Dimeter)
(Major Diameter Measurement)
(0 to 10) mm (> 10 to 20) mm (> 20 to 30) mm (> 30 to 40) mm (> 40 to 50) mm (> 50 to 60) mm (> 60 to 70) mm (> 70 to 80) mm (> 80 to 90) mm
(> 90 to 100) mm (> 100 to 125) mm (> 125 to 150) mm
(0 to 10) mm
(> 10 to 20) mm (> 20 to 30) mm (> 30 to 40) mm (> 40 to 50) mm (> 50 to 60) mm (> 60 to 70) mm (> 70 to 80) mm (> 80 to 90) mm
(> 90 to 100) mm (> 100 to 125) mm (> 125 to 150) mm
0.43 µm 0.6 µm 0.61 µm 0.63 µm 0.64 µm 0.66 µm 0.69 µm 0.72 µm 0.89 µm 0.91 µm 0.98 µm 1.1 µm
0.15 µm 0.18 µm 0.22 µm 0.25 µm 0.29 µm 0.34 µm 0.38 µm 0.44 µm 0.48 µm 0.52 µm 0.63 µm 0.74 µm
Gauge Block and Universal Length Measuring Machine
Optical Flat Up to 60 mm diameter (0 to 10) µm 0.09 µm Optical Flat
Optical Parallel (12.00 to 25.37) mm diameter
(Flatness) (Parallelism) (Thickness)
(0 to 10) µm (0 to 20) µm
(0 to 25.37) mm
0.08 µm 0.04 µm 0.24 µm
Gauge Block Comparator, Universal Length
Measuring Machine, and Optical Flat
Height Master (0 to 310) mm
(> 310 to 460) mm (> 460 to 610) mm
0.6 µm 0.77 µm 0.93 µm
Gauge Block and Lever Probe with Display
Sphere and Precision Balls (0 to 10) mm (>10 to 20) mm
0.17 µm 0.27 µm
Universal Length Measuring Machine
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment Thread Ring Gauge
(Pitch Diameter Measurement)
(Minor Diameter
Measurement)
(3 to 50) mm (> 50 to 100) mm (> 100 to 150) mm
(3 to 50) mm
(> 50 to 100) mm (> 100 to 150) mm
0.67 µm 0.93 µm 1.1 µm
0.53 µm 0.67 µm 0.83 µm
Ring Gauge and Universal Length Measuring Machine
Thread Ring Gauge (Minor Diameter
Measurement) (3 to 100) mm 0.82 µm Profile Projector
Depth Micro Checker (Anvil Block) (0 to 25) mm 0.06 µm Gauge Block and Gauge
Block Comparator Depth Micro Checker
(Block Pitch) (0 to 150) mm
(> 150 to 300) mm 0.45 µm 0.59 µm
Gauge Block and Lever Probe with Display
Taper Thread Plug Gauge (0 to 50) mm
(> 50 to 100) mm (> 100 to 150) mm
0.59 µm 0.71 µm 0.87 µm
Ring Gauge and Universal Length Measuring Machine
Taper Thread Ring Gauge (5 to 50) mm
(> 50 to 100) mm (> 100 to 150) mm
0.59 µm 0.71 µm 0.87 µm
Ring Gauge and Universal Length Measuring Machine
Taper Plug Gauge (0 to 50) mm
(> 50 to 100) mm (> 100 to 150) mm
0.33 µm 0.58 µm 0.8 µm
Gauge Block and Universal Length Measuring Machine
Taper Ring Gauge (5 to 50) mm
(> 50 to 100) mm (> 100 to 150) mm
0.55 µm 0.68 µm 0.84 µm
Ring Gauge and Universal Length Measuring Machine
Spline Plug Gauge (Over Pins Measurement)
(Major Diameter Measurement)
(0 to 50) mm (> 50 to 100) mm
(0 to 50) mm
(> 50 to 100) mm
0.4 µm 0.59 µm
0.29 µm 0.52 µm
Gauge Block and Universal Length Measuring Machine
Spline Ring Gauge (Over Pins Measurement)
(Minor Diameter
Measurement)
(15 to 50) mm (> 50 to 100) mm
(15 to 100) mm
0.54 µm 0.68 µm
0.82 µm
Ring Gauge and Universal Length Measuring Machine
Profile Projector
Dial Gauge Tester, Calibration Tester
0 mm to 1 mm > 1 mm to 5 mm > 5 mm to 25 mm
0.15 µm 0.17 µm 0.37 µm
Linear Length Gauge with Display
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment Gauge Block Accessories
(Flatness) (Parallelism)
(Length) (Straightness) (Eccentricity)
(0 to 10) µm (0 to 1) mm
(0 to 200) mm (0 to 100) µm (0 to 1) µm
0.1 µm 0.27 µm 0.23 µm 0.34 µm 0.82 µm
Lever Probe with Display, Universal Length
Measuring Machine, and Profile Projector
Pitch Gauge ≤ 50 mm 0.82 µm Profile Projector
Angle Gauge Block (0 to 90) degree 0.66 s CMM Gear
(External) (Over Pins Measurement)
(Major Diameter Measurement)
(0 to 50) mm
(> 50 to 100) mm
Up to 50 mm (> 50 to 100) mm
0.33 µm 0.43 µm
0.29 µm 0.52 µm
Gauge Block and Universal Length Measuring Machine
Gear (Internal)
(Over Pins Measurement)
(15 to 50) mm (> 50 to 100) mm
0.55 µm 0.69 µm Ring Gauge and Universal
Gear (Minor Diameter
Measurement) (12 to 100) mm 0.82 µm Length Measuring Machine
Profile Projector
Test Bars (Diameter)
(0 to 25) mm (> 25 to 50) mm (> 50 to 75) mm (> 75 to 100) mm
0.19 µm 0.29 µm 0.38 µm 0.52 µm
Gauge Block and Universal Length Measuring Machine
Test Bars (Total Runout) (0 to 100) mm 0.16 µm Lever Probe with Display
Snap Gauge / Gap Gauge (External Measurement)
(0 to 10) mm (> 10 to 20) mm (> 20 to 30) mm (> 30 to 40) mm (> 40 to 50) mm (> 50 to 60) mm (> 60 to 70) mm (> 70 to 80) mm (> 80 to 90) mm
(> 90 to 100) mm (> 100 to 125) mm (> 125 to 150) mm
0.15 µm 0.18 µm 0.22 µm 0.25 µm 0.29 µm 0.34 µm 0.38 µm 0.44 µm 0.48 µm 0.52 µm 0.63 µm 0.74 µm
Gauge Block and Universal Length Measuring Machine
Version 001 Issued: August 09, 2019 www.anab.org
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
Snap Gauge / Gap Gauge (Internal Measurement)
(1 to 50) mm (> 50 to 100) mm (> 100 to 150) mm
0.47 µm 0.62 µm 0.8 µm
Ring Gauge and Universal Length Measuring Machine
Bevel Protractor, Universal Bevel Protractor
Angle Measurement Scale Measurement
(0 to 360) degree (0 to 200) mm
0.29 minutes 0.71 µm
Angle Block Set and Profile Projector
Radius Gauge (Concave and Convex)
(0.1 mm to 50) mm (>50 mm to 80) mm (>80 mm to 100) mm
1.0 µm 1.2 µm 1.4 µm
Profile Projector
Chamfer Gauge, Chamfer Measuring Gauge (0.1 mm to 50) mm 1.0 µm Profile Projector
Steel Ruler, Metal Rule
(0 to 200) mm (>300 to 400) mm (>400 to 600) mm (>600 to 800) mm
(>800 to 1 000) mm (>1 000 to 1 200) mm (>1 200 to 1 400) mm (>1 400 to 1 600) mm (>1 600 to 1 800) mm (>1 800 to 2 000) mm
0 018 mm 0 019 mm 0 019 mm 0 02 mm 0 02 mm
0 021 mm 0 021 mm 0 022 mm 0 023 mm 0 023 mm
Scale Calibrator
Steel Tape
(0 to 200) mm (>300 to 400) mm (>400 to 600) mm (>600 to 800) mm
(>800 to 1 000) mm (>1 000 to 1 200) mm (>1 200 to 1 400) mm (>1 400 to 1 600) mm (>1 600 to 1 800) mm (>1 800 to 2 000) mm (>2 000 to 4 000) mm (>4 000 to 6 000) mm (>6 000 to 8 000) mm (>8 000 to 10 000) mm
(>10 000 to 12 000) mm (>12 000 to 14 000) mm (>14 000 to 16 000) mm (>16 000 to 18 000) mm
0.019 mm 0.019 mm 0.019 mm 0.02 mm 0.02 mm
0.021 mm 0.021 mm 0.022 mm 0.023 mm 0.024 mm 0.046 mm 0.069 mm 0.091 mm 0.12 mm 0.14 mm 0.16 mm 0.19 mm 0.21 mm
Scale Calibrator
Version 001 Issued: August 09, 2019 www.anab.org
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
Steel Tape
(>18 000 to 20 000) mm (>20 000 to 22 000) mm (>22 000 to 24 000) mm (>24 000 to 26 000) mm (>26 000 to 28 000) mm (>28 000 to 30 000) mm
0.23 mm 0.25 mm 0.28 mm 0.3 mm
0.32 mm 0.34 mm
Scale Calibrator
Textile Tape
(0 to 200) mm (>300 to 400) mm (>400 to 600) mm (>600 to 800) mm
(>800 to 1 000) mm (>1 000 to 1 200) mm (>1 200 to 1 400) mm (>1 400 to 1 600) mm (>1 600 to 1 800) mm (>1 800 to 2 000) mm (>2 000 to 4 000) mm (>4 000 to 6 000) mm (>6 000 to 8 000) mm (>8 000 to 10 000) mm
(>10 000 to 12 000) mm (>12 000 to 14 000) mm (>14 000 to 16 000) mm (>16 000 to 18 000) mm (>18 000 to 20 000) mm (>20 000 to 22 000) mm (>22 000 to 24 000) mm (>24 000 to 26 000) mm (>26 000 to 28 000) mm (>28 000 to 30 000) mm
0.019 mm 0.019 mm 0.019 mm 0.02 mm 0.02 mm
0.021 mm 0.021 mm 0.022 mm 0.023 mm 0.024 mm 0.046 mm 0.069 mm 0.091 mm 0.12 mm 0.14 mm 0.16 mm 0.19 mm 0.21 mm 0.23 mm 0.25 mm 0.28 mm 0.3 mm
0.32 mm 0.34 mm
Scale Calibrator
Taper Gauge (Scale Type) (0 to 50) mm
(>50 to 75) mm (>75 to 100) mm
1 µm 1.2 µm 1.4 µm
Profile Projector
Wet Film Thickness Gauge (0 to 6.5) mm 0.82 µm Profile Projector
1Measuring Microscope (0 to 50) mm
(>50 to 150) mm (>150 to 250) mm
0.58 µm 0.58 µm 0.58 µm
Standard Scale
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Profile Projector
Angle
Linearity
Magnification
Squareness
(0 to 360) degree
(0 to 50) mm
(>50 to 150) mm (>150 to 250) mm
10X
(100 x 70) mm (150 x 100) mm (250 x 165) mm
2.1 minutes
0.58 µm 0.58 µm 0.58 µm
0.25 % of reading
2.8 µm 2.8 µm 3 µm
Overlay Chart
Standard Scale
Standard Scale
Precision Square
2Inside Micro Checker (25 to 600) mm (0.13 + 7.7x10-4L) µm CMM
2Vee Block (0 to 300) mm (0.13 + 7.7x10-4L) µm CMM
2Sine Bars (0 to 300) mm (0.13 + 7.7x10-4L) µm CMM
Length Bar, Setting Rod
(0 to 500) mm (>500 to 600) mm (>600 to 700) mm (>700 to 800) mm (>800 to 900) mm (>900 to 1000) mm
1.6 µm 1.9 µm 2.2 µm 2.5 µm 2.8 µm 3.1 µm
CMM
2Carpenter's Square Perpendicularity/Straightness (900 x 500) mm (0.13 + 7.7x10-4L) µm CMM
Carpenter's Square Linear Scale
(0 to 200) mm (>200 to 400) mm (>400 to 600) mm (>600 to 700) mm (>700 to 900) mm
0.018 mm 0.019 mm 0.019 mm 0.02 mm 0.02 mm
Scale Calibrator
Combination Square Scale Measurement (0 to 300) mm 0.019 mm Scale Calibrator
Combination Square Straightness of protractor
head (0 to 300) mm 3.6 µm Dial test indicator and
Granite Surface Plate
Combination Square Angle of Centering Head
and Squaring Head (45 to 90) degree 2.2 minutes Profile Projector
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Length – Dimensional metrology
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment Combination Square Angle
Measurement (0 to 180) degree 0.58 minutes Angle Block Set and Precision Square
2Jig, Fixture, Mold, and Die
X Axis: 700 mm Y Axis: 1 000 mm Z Axis: 600 mm
(0.13 + 7.7x10-4L) µm CMM
2Straight Edge (0 to 1 000) mm (0.13 + 7.7x10-4L) µm CMM
2Coordinate Measuring Machine
X 500 mm Y 500 mm Z 500 mm
(0.11 + 7.7x10-4L) µm Gauge Blocks
Test Sieve (0 to 50) mm 1.1 µm Profile Projector 2Cylindrical Square
Length Diameter
(0 to 500) mm (0 to 200) mm
(0.13 + 7.7x10-4L) µm CMM
Welding Gauge Scale Measurement
Taper Gauge
(0 to 100) mm (0 to 20) mm
1.5 µm 0.85 µm
Profile Projector
Welding Gauge Depth Gauge (0 to 50) mm 0.24 mm Gauge Block Set
Welding Gauge Angle Measurement (0 to 180) degree 0.58 minutes Angle Block Set and
Precision Square
Mass and Mass Related
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Indirect Verification of Rockwell Hardness Tester
(20 to 40) HRA (40 to 70) HRA (70 to 95) HRA
(10 to 40) HRBW (40 to 70) HRBW (70 to 100) HRBW
(10 to 30) HRC (30 to 40) HRC (40 to 70) HRC
0.4 HRA 0.4 HRA 0.4 HRA
0.4 HRBW 0.4 HRBW 0.4 HRBW
0.4 HRC 0.4 HRC 0.4 HRC
Reference Hardness Test Blocks
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Mass and Mass Related
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Indirect Verification of Brinell Hardness Tester
HBW 10/3000/15
(0 to 200) HBW (200 to 400) HBW (400 to 500) HBW
2 HBW 3 HBW 4 HBW
Reference Hardness Test Blocks
1Hopper Scales/ Tank Scales
Up to 500g >500 g to 1 kg (>1 kg to 2) kg (>2 kg to 5) kg (>5 kg to 10) kg (>10 kg to 20) kg (>20 kg to 50) kg (>50 kg to 100) kg
(>100 kg to 200) kg (>200 kg to 500) kg
(>500 kg to 1 000) kg (>1 000 kg to 2 000) kg (>2 000 kg to 5 000) kg (>5 000 kg to 6 000) kg
0.71 mg 2.1 mg 3.2 mg 7.1 mg 31 mg 54 mg 0.13 g 1.5 g 3.7 g 11 g 23 g 46 g
0.2 kg 0.27 kg
Reference Standard Weights
Durometer (Spring Force Only)
Types A, B, C, D, DO, E, O, OO, OOO
(10 to 90) Duro 0.058 Duro Electronic Balance
Push-Pull Gauge
Up to 10 N (>10 N to 20) N (>20 N to 30) N (>30 N to 50) N (>50 N to 100) N (>100 N to 200) N (>200 N to 300) N (>300 N to 500) N
(>500 N to 1 000) N
0.012 N 0.024 N 0.047 N 0.058 N 0.12 N 0.24 N 0.47 N 0.58 N 1.2 N
Standard Weight
Force Gauge
Up to 5 N (>5 N to 10) N (>10 N to 50) N (>50 N to 100) N (>100 N to 500) N
(>500 N to 1 000) N
0.000 66 N 0.000 87 N 0.006 6 N 0.008 6 N 0.066 N 0.085 N
Standard Weight
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Mass and Mass Related
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
Tension Gauge
Up to 1 N (>1 N to 3) N (>3 N to 5) N (>5 N to 10) N (>10 N to 50) N (>50 N to 200) N (>200 N to 500) N
0.012 N 0.029 N 0.058 N 0.15 N 0.29 N 1.2 N 2.9 N
Standard Weight
1Hand Torque Tool, Torque Wrench, Torque Driver, and Electronic
Torque
(>0 to 2.5) N·m (>2.5 to 17) N·m (>17 to 45) N·m
(>45 to 100) N·m (>100 to 340) N·m
(>340 to 1 500) N·m
0.64 % of reading 0.55 % of reading 0.3 % of reading
0.37 % of reading 0.35 % of reading 0.35 % of reading
Torque Transducer with Indicator
Torque Transducer, Torque Tester, and
Torque Meter
(0.1 to 1) N·m (>1 to 2.5) N·m (>2.5 to 5) N·m (>5 to 10) N·m
(>10 to 20) N·m (>20 to 50) N·m
(>50 to 100) N·m (>100 to 200) N·m (>200 to 340) N·m
0.06 % of reading 0.025 % of reading 0.015 % of reading 0.06 % of reading 0.03 % of reading
0.015 % of reading 0.06 % of reading 0.03 % of reading 0.02 % of reading
Calibration Arm and Weight
1Torque Calibrator, Torque Transducer, Torque Tester, and
Torque Meter
(1 to 20) N·m (>20 to 50) N·m
(>50 to 200) N·m (>200 to 500) N·m
(>500 to 1 000) N·m
0.12 % of reading 0.068 % of reading 0.031 % of reading 0.075 % of reading 0.056 % of reading
Torque Transfer Wrench with Indicator
1Electric Screwdriver and Air Torque Screwdriver
(>0 to 2.5) N·m (>2.5 to 5) N·m (>5 to 10) N·m
(>10 to 15) N·m (>15 to 20) N·m (>20 to 25) N·m
0.4 % of reading 0.35 % of reading 0.29 % of reading 0.5 % of reading
0.42 % of reading 0.57 % of reading
Torque Meter
Load Cell (Tension)
(0.1 to 0.5) kN (>0.5 to 2.5) kN (>2.5 to 5) kN (>5 to 10) kN
(>10 to 50) kN (>50 to 100) kN
0.11 % of reading 0.039 % of reading 0.033 % of reading 0.061 % of reading 0.016 % of reading 0.11 % of reading
Load Cell with Indicator
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Mass and Mass Related
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Load Cell and Force Measurement (Compression)
(0.1 to 0.5) kN (>0.5 to 2.5) kN (>2.5 to 5) kN (>5 to 10) kN
(>10 to 50) kN (>50 to 100) kN
(>100 to 250) kN (>250 to 450) kN
0.14 % of reading 0.039 % of reading 0.036 % of reading 0.06 % of reading
0.015 % of reading 0.24 % of reading
0.062 % of reading 0.073 % of reading
Load Cell with Indicator
1Universal Testing Machine (Tension)
(Compression)
(0.1 to 0.5) kN (>0.5 to 2.5) kN (>2.5 to 5) kN (>5 to 10) kN
(>10 to 50) kN (>50 to 250) kN
(0.1 to 0.5) kN
(>0.5 to 2.5) kN (>2.5 to 5) kN (>5 to 10) kN
(>10 to 50) kN (>50 to 250) kN
(>250 to 450) kN
0.11 % of reading 0.039 % of reading 0.033 % of reading 0.061 % of reading 0.016 % of reading 0.076 % of reading
0.14 % of reading
0.039 % of reading 0.036 % of reading 0.06 % of reading
0.015 % of reading 0.062 % of reading 0.073 % of reading
Load Cell with Indicator
1Pressure Gauge, Differential Pressure Gauge,
Digital Pressure Gauge, Pressure Recorder, Pressure
Controller, Manometer Pneumatic
(0 to 14) kPa (14 to 2.069) MPa
0.002 kPa 0.069 kPa
Pressure Calibrator, Pressure Module
1Pressure Gauge, Differential Pressure Gauge,
Digital Pressure Gauge, Pressure Recorder, Pressure
Controller, Manometer Hydraulic
(2.069 to 68.947) MPa 0.009 MPa Pressure Calibrator, Pressure Module
1Pressure Transducer, Pressure Transmitter, Vacuum Transmitter
Pneumatic
(–90 to 0) kPa (0 to 14) kPa
(14 to 345) kPa (345 to 690) kPa
(690 to 2.069) MPa
0.01 kPa 0.005 kPa 0.011 kPa 0.08 kPa 0.08 kPa
Pressure Calibrator, Pressure Module
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Mass and Mass Related
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Vacuum Gauge (Analog, Digital) (–90 to 0) kPa 0.009 kPa Pressure Calibrator,
Pressure Module Pressure Calibrator,
Pressure Module, Pressure Transducer, Pressure
Transmitter with Digital Reading/Electrical Output,
Digital Pressure Gauge, Bourdon Tube Pressure
Gauge Positive Gauge Pressure
20 kPa to 3.5 MPa
275 kPa to 14 MPa
(>14 to 110) MPa
1 x 10-4Pe (not less than 0.035 kPa)
9.6 x 10-5Pe (not less than 0.13 kPa)
1 x 10-4 Pe (not less than 1.1 kPa)
Dead Weight Tester
Pressure Calibrator, Pressure Module, Pressure
Transducer, Pressure Transmitter with Digital
Reading/Electrical Output, Digital Pressure Gauge, Bourdon Tube Pressure
Gauge Negative Gauge Pressure
(3.4 to 100) kPa 1.6 x 10-4Pe (not less than 0.001 6 kPa) Dead Weight Tester
Liquid flow meter with indicator
and Liquid flow meter with electrical output -Volume flow
-Volume flow rate
-Mass flow
-Mass flow rate
(>0 to 50) l (>50 l to 300) l
(>300 l to 1 900) l
(>0 to 3) m³/h (>3 to 40) m³/h
(>40 to 300) m³/h
(>0 to 50 kg (>50 to 300) kg
(>300 to 1 900) kg
(>0 to 3) t/h (>3 t/h to 40) t/h
(>40 t/h to 300) t/h
0.015 % of reading 0.017% of reading 0.017 % of reading
0.015 % of reading 0.017 % of reading 0.017% of reading
0.015 % of reading 0.017 % of reading 0.017 % of reading
0.015 % of reading 0.017 % of reading 0.017 % of reading
Electronic Balance, Stopwatch, and
Digital Thermometer with Sensor
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Mass and Mass Related
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Air flow meter, Gas flow
meter, Variable area flow meter
(Rotameter)
(>0 to 200) sccm >200 sccm to 2 slpm
(>2 to 50) slpm (>50 to 250) slpm
0.4 % of reading 0.4 % of reading 0.4 % of reading 0.4 % of reading
Mass Flow Meter
1, 3Liquid flow meter with indicator
and Liquid flow meter with electrical output by Coriolis
Mass Flow Meter
-Volume flow
-Volume flow rate
-Mass flow
-Mass flow rate
(>0 to 30 000) l
(>0 to 200) m³/h
(>0 to 30 000) kg
(>0 to 200) t/h
0.09 % of reading
0.09 % of reading
0.09 % of reading
0.09 % of reading
Coriolis Mass Flow Meter
Liquid Flow Meter with Indicator (0 to 280) m3/h 0.12 % of reading Ultrasonic Flow Meter
Photometry and Radiometry
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Spectrophotometer -Wavelength accuracy
Holmium Filter
279 nm 288 nm 334 nm 361 nm 419 nm 446 nm 454 nm 460 nm 536 nm 638 nm
0.39 nm 0.39 nm 0.39 nm 0.39 nm 0.39 nm 0.39 nm 0.39 nm 0.39 nm 0.39 nm 0.39 nm
Holmium Filter
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Photometry and Radiometry
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Spectrophotometer -Wavelength accuracy
Didymium Filter
431 nm 473 nm 513 nm 529 nm 573 nm 585 nm 684 nm 741 nm 749 nm 807 nm 879 nm
0.35 nm 0.35 nm 0.35 nm 0.35 nm 0.35 nm 0.35 nm 0.35 nm 0.35 nm 0.35 nm 0.35 nm 0.35 nm
Didymium Filter
1Spectrophotometer -Wavelength accuracy -Photometric Accuracy
UV
235 nm 257 nm 313 nm 350 nm
0.002 9 Abs 0.002 9 Abs 0.002 9 Abs 0.002 9 Abs
Potassium Dichromate Filter
1Spectrophotometer -Wavelength accuracy
Visible
440 nm 456 nm
546.1 nm 590 nm 635 nm
0.003 1 Abs 0.003 1 Abs 0.003 1 Abs 0.003 1 Abs 0.003 1 Abs
Neutral Density Filter
Lux Meter
(0 to 10) lux (>10 to 30) lux (>30 to 80) lux (>80 to 500) lux
(>500 to 1 000) lux (>1 000 to 1 500) lux (>1 500 to 3 000) lux (>3 000 to 4 500) lux (>4 500 to 7 000) lux
0.20 lux 0.34 lux 0.73 lux 6.1 lux 13 lux 18 lux 60 lux 54 lux
100 lux
Hioki FT3424 Light Meter Halogen Light
Thermodynamic
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Digital Thermometer with Surface Probe
(35 to 100) °C (>100 to 200) °C (>200 to 300) °C (>300 to 450) °C
0.47 °C 0.93 °C 1.4 °C 2 °C
Surface Calibrator and Standard Thermometer
with Sensor
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Thermodynamic
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
Infrared Thermometer
(35 to 100) °C (>100 to 200) °C (>200 to 300) °C (>300 to 500) °C
0.14 °C 0.14 °C 0.31 °C 0.6 °C
Precision Infrared Calibrator and Standard
Thermometer with Sensor λ = (8 to 14) µm, Ɛ= 0.95
1Temperature & Humidity Chamber
(10 to 50) °C (10 to 95) %RH
0.37 °C 0.84 %RH Data Logger with Sensors
1Temperature Sensor (TC)
(35 to 100 °C (>100 to 400) °C (>400 to 750) °C (>750 to 900) °C
(>900 to 1 050) °C (>1 050 to 1 200) °C
0.01 °C 0.01 °C 1.2 °C 1.2 °C 1.2 °C 1.2 °C
Standard Thermometer with Sensor
Dry Blocks, Liquid Bath
1Temperature Sensor (RTD) (-38to 50) °C
(>50 to 200) °C (>200 to 400) °C
0.004 3 °C 0.004 3 °C 0.004 3 °C
Dry Block/Liquid Bath and Standard
Thermometer with Sensor
Temperature Transmitter (10 to 50) °C 0.37 °C Keithley 2700A Datalogger Chilled-Mirror Hygrometer
Temp/Hum Chamber
Humidity Transmitter (10 to 95) %RH 0.84 %RH Keithley 2700A Datalogger Chilled-Mirror Hygrometer
Temp/Hum Chamber
Thermo-Hygrometer (10 to 50) °C (10 to 95) %RH
0.37 °C 0.84%RH
Chilled-Mirror Hygrometer Temp/Hum Chamber
Thermo-Hygrograph (10 to 50) °C (10 to 95) %RH
0.69 °C 1.1%RH
Chilled-Mirror Hygrometer Temp/Hum Chamber
1Dial Thermometer (-38 to 50) °C
(>50 to 200) °C (>200 to 400) °C
0.02 °C 0.02 °C 0.02 °C
Standard Thermometer with Sensor
Dry Blocks, Liquid Bath
1Digital Thermometer with RTD/TC Sensors
(-38 to 0) °C (>0 to 200) °C
(>200 to 400) °C (>400 to 650) °C (>650 to 800) °C
(>800 to 1 000) °C (>1 000 to 1 200) °C
0.004 3 °C 0.004 3 °C 0.004 3 °C 0.008 2 °C
1.2 °C 1.2 °C 1.2 °C
Standard Thermometer with Sensor
Dry Blocks, Liquid Bath
LIG (Total & Partial Immersion)
(-38 to 50) °C (>50 to 100) °C
(>100 to 150) °C
0.004 9 °C 0.004 9 °C 0.004 9 °C
Semi-SPRT with Indicator Liquid Bath
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Thermodynamic
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1Auto Clave (110 to 130) °C 0.12 °C Data Logger with Sensors
1Liquid Bath (5 positions) (-38 ° to 50) °C (>50 to 200) °C
0.1 °C 0.1 °C Data Logger with Sensors
1Liquid Bath (9 positions) (-38 to 50) °C
(>50 to 200) °C (>200 to 400) °C
0.01 °C 0.01 °C 0.01 °C
Standard Thermometer with Sensor
1Temperature Chamber
(-38 to 50) °C (>50 to 100) °C (>100 to 150) °C (>150 to 200) °C
0.1 °C 0.1 °C 0.1 °C 0.1 °C
Data Logger with Sensors
1Furnace (400 to 1200) °C 1.3 °C Data Acquisition with TC
MIG Thermometer (-38 to 50) °C
(>50 to 100) °C (>100 to 150) °C
0.12 °C 0.12 °C 0.12 °C
Semi-SPRT with Indicator
1COD Reactor (25 to 100) °C (>100 to 200) °C
0.1 °C 0.1 °C Data Logger with Sensors
1Temperature Recorder with Probe (Digital Type)
(-38 to 0) °C (>0 to 200) °C
(>200 to 400) °C
0.007 2 °C 0.007 2 °C 0.007 2 °C
Standard Thermometer with Sensor
1Temperature Recorder with Probe (Graph Type)
(-38 to 0) °C (>0 to 200) °C
(>200 to 400) °C
0.58 °C 0.58 °C 0.58 °C
Standard Thermometer with Sensor
Dry Block
(-38 to 0) °C (>0 to 600) °C
(>600 to 1 000) °C (>1 000 to 1 200) °C
0.15 °C 0.15 °C 1.1 °C 1.3 °C
Standard Thermometer with Sensor
Semi-SPRT/TC
Time and Frequency
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment 1 Frequency - Measure 0.1 Hz to 3 GHz
(> 3 to 26.5) GHz 3 × 10-9 f
1.8 × 10-6 f Agilent 53132A,
HP 5348A Counters
1 Frequency - Measure 0.1 Hz to 26.5 GHz 6.1 × 10-10 f SRS FS725 Frequency
Standard, Agilent 53132A HP 5348A Counters
Version 001 Issued: August 09, 2019 www.anab.org
Page 28 of 28
Time and Frequency
Parameter/Equipment Range Expanded Uncertainty of Measurement (+/-)
Reference Standard, Method, and/or
Equipment
1Frequency - Source 1 kHz to 26.5 GHz 6.1 × 10-10 f
SRS FS725 Frequency Standard, Agilent 33120A,
Agilent E4421B, HP 8340A Signal Generators
1Stroboscope - RPM Speed
(6 to 999.99) RPM (1 000 to 6 000) RPM (6 001 to 15 000) RPM
(15 001 to 59 999) RPM (60 000 to 98 999) RPM (99 000 to 99 999) RPM
0.08 RPM 0.59 RPM 0.82 RPM 0.82 RPM 0.82 RPM 0.82 RPM
PROVA RM-150-1 Tachometer
1Timer - Time Up to 3 600 s 1 s Agilent 53132A Counter
N2862A Probe 1 Centrifuge
- Time (1 to 90) min 1 min Casio HS-80TW Stopwatch
1 Centrifuge - RPM Speed
Up to 999 RPM (1 000 to 9 999) RPM
(10 000 to 15 000) RPM 1 RPM PROVA RM-150-1
Tachometer
Digital Tachometer (Photo & Contact)
(1 to 99.99) RPM (100 to 999.9) RPM
(1 000 to 99 999) RPM
0.005 8 RPM 0.058 RPM 0.6 RPM
Agilent 33120A Waveform Generator and LED
Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%. Notes: 1. On-site calibration service is available for this parameter, since on-site conditions are typically more variable than those in the laboratory, larger measurement
uncertainties are expected on-site than what is reported on the accredited scope 2. f = measured frequency in hertz, L = Length in mm, M = mismatch, Pe = Pressure generated at the reference level 3. Available with Mobile Laboratory for Field Service 4. This scope is formatted as part of a single document including Certificate of Accreditation No. AC-2695.