1 Sébastien Boutetsboutet@slac.stanford.edu

1Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

Coherent X-ray Imaging Instrument

Sébastien BoutetCXI Instrument Scientist

June 9, 2009

2 Sébastien Boutetsboutet@slac.stanford.edu

2Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

Outline

Update since the last FACKB mirrorsNew CXI layout

Sample Chamber/KB mirror integration for the 0.1 micron focus

3 Sébastien Boutetsboutet@slac.stanford.edu

3Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

Coherent Diffractive Imaging of Biomolecules

Combine many measurements into 3D dataset

Noisy diffraction pattern

LCLS pulse

Particle injection

One pulse, one measurement

Wavefront sensor or second detector

Data Frames

Combined Data Set

Reconstruction

4 Sébastien Boutetsboutet@slac.stanford.edu

4Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

CXI Instrument Location

XCS

AMO

CXIEndstation

XPP

Near Experimental Hall

Far Experimental Hall

X-ray Transport Tunnel

Source to Sample distance : ~ 440 m

SXR

5 Sébastien Boutetsboutet@slac.stanford.edu

5Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

Far Experimental Hall

Coherent X-ray ImagingInstrument

CXI ControlRoom

Lab Area

X-ray Correlation SpectroscopyInstrument

Hutch #6

XCS Control Room

6 Sébastien Boutetsboutet@slac.stanford.edu

6Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

CXI Instrument Overview

Sample Chamber

Detector Stage(back position)

Particle injector

LCLS Beam

Precision Instrument Stand

Detector Stage(upstream position)

7 Sébastien Boutetsboutet@slac.stanford.edu

7Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

CXI KB Mirrors

CXI has two sets of KB mirrors to produce a 1 micron beam and a 0.1 micron beamDiscussed at last FAC

Coating45 degree geometry

UpdateApply single coating strip (SiC)

But leave space for at least another strip for laterThe 45 degree geometry was abandoned

Benefits were not worth the risks

8 Sébastien Boutetsboutet@slac.stanford.edu

8Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

New CXI Layout

Discussed at last FACPut both sample chambers in series and have each KB system focus at different planes

Put KB1 system first and focus past the KB0.1 system

Place Be lenses between the 2 sample chambers to refocus the 100 nm beam into the second sample chamberKeep ability to use the unfocused beam

UpdateThe new layout was implementedThe unfocused beam can be used in the 1 micron Sample Chamber

9 Sébastien Boutetsboutet@slac.stanford.edu

9Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

CXI with 1 micron and Unfocused Beam

Diagnostics &Wavefront Monitor

1 micron SampleEnvironment

Diagnostics/ Common Optics

1 micron KB

Reference Laser

10 Sébastien Boutetsboutet@slac.stanford.edu

10Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

CXI with 0.1 micron Beam

Diagnostics/ Common Optics

1 micron KB

Reference Laser

0.1 micron KB &Sample Environment

Wavefront Monitor

11 Sébastien Boutetsboutet@slac.stanford.edu

11Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

New Layout AdvantagesAllows serial experiment configurationAllows separation of mirror vacuumAllows the use of a thin window to separate KB0.1 mirror vacuum from 0.1 micron sample chamberAllows the second chamber to be removed without disturbing the mirrors

Allows a user chamber to be attached if needed

12 Sébastien Boutetsboutet@slac.stanford.edu

12Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

CXI 0.1 µm KB Mirrors/Sample Environment

PurposeProduce a ~100 nm focus

Focal lengths0.9 m for M10.5 m for M2

RequirementsIdentical to 1 micron KB System in every way except for the mirror curvature

Integrated system with 0.1 micron Sample Chamber due to close proximityExtend vacuum enclosure by ~600 mm for sample areaSeparate both parts of the vacuum enclosure with valve and window

13 Sébastien Boutetsboutet@slac.stanford.edu

13Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

0.1 micron KB/Sample Chamber

14 Sébastien Boutetsboutet@slac.stanford.edu

14Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

0.1 micron KB/Sample Chamber

15 Sébastien Boutetsboutet@slac.stanford.edu

15Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

0.1 micron KB/Sample Chamber

16 Sébastien Boutetsboutet@slac.stanford.edu

16Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

Custom Valves

2 custom valves will be usedFirst one will hold vacuum in order to vent the Sample ChamberSecond valve will have a very thin x-ray transmissive window to separate UHV in KB tank from poor vacuum (~10-7 Torr) in Sample Chamber

17 Sébastien Boutetsboutet@slac.stanford.edu

17Coherent X-ray Imaging InstrumentFAC Meeting, June 9 2009

SummaryThe CXI KB mirrors will use a SiC coating strip

Space will be left available for another coating strip once some LCLS experiments have occurred

Use 2 sample chambersOne for each KB mirror pair

CXI abandoned the 45 degree KB mirror configurationMaintain the ability to use the direct unfocused beam into the 1 micron Sample ChamberThe 0.1 micron KB/Sample Chamber System will utilize custom valves to allow venting of the Sample Chamber and a thin window to separate the vacuum of the mirrors from the sample