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ЕВРО-АЗИАТСКОЕ СОТРУДНИЧЕСТВО ГОСУДАРСТВЕННЫХ МЕТРОЛОГИЧЕСКИХ УЧРЕЖДЕНИЙ (KOOMET) EURO-ASIAN COOPERATION OF NATIONAL METROLOGICAL INSTITUTIONS (COOMET) June 2015 COOMET PROJECT NO. 568/UA/12 SUPPLEMENTARY COMPARISON COMPARISONS OF THE REFERENCE MEASURING INSTRUMENTS OF SURFACE PARAMETERS COOMET.L-S13 Comparison of the reference measuring instruments of surface parameters FINAL REPORT Pilot laboratory: Research Laboratory of Geometrical Quantities Measurements. NMI name and abbreviation: National Scientific Center “Institute of Metrology” (NSC IM). Contact person: Kupko Vladimir Semenovich Address: Mironositskaya Str., 42, Kharkov 61002, Ukraine Telephone: (057)700-34-09 Fax: (057)700-34-47 Е-mail: [email protected]
Transcript
Page 1: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

ЕВРО-АЗИАТСКОЕ СОТРУДНИЧЕСТВО ГОСУДАРСТВЕННЫХ МЕТРОЛОГИЧЕСКИХ УЧРЕЖДЕНИЙ (KOOMET)

EURO-ASIAN COOPERATION OF NATIONAL METROLOGICAL INSTITUTIONS (COOMET)

June 2015

COOMET PROJECT NO. 568/UA/12

SUPPLEMENTARY COMPARISON

COMPARISONS OF THE REFERENCE MEASURING INSTRUMENTS OF SURFACE PARAMETERS

COOMET.L-S13 Comparison of the reference measuring instruments of surface parameters

FINAL REPORT

Pilot laboratory: Research Laboratory of Geometrical Quantities Measurements. NMI name and abbreviation: National Scientific Center “Institute of Metrology” (NSC IM). Contact person: Kupko Vladimir Semenovich Address: Mironositskaya Str., 42, Kharkov 61002, Ukraine Telephone: (057)700-34-09 Fax: (057)700-34-47 Е-mail: [email protected]

Page 2: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

1. Participants of the comparisons Table 1 № NMI Address Abbreviation

of NMI Contact person

E-mail, telephone, fax

1 National Scientific Center “Institute of Metrology”, Ukraine

Ukraine, 61002, Kharkov, Mironositskaya Str., 42

NSC IM Kupko Vladimir Semenovich

Tel: +38 057 758 73 03 Fax: +38 057 700 34 47 E-mail: [email protected]

2 All-Russian Scientific Research Institute of Metrological Service, Russia

The Russian Federation, Moscow, 119361, Ozernaya Str., 46

FGUP VNIIMS Lysenko Valeriy Grigorievich

Tel: 8 (495) 665 30 87 Fax: 7 (495) 437 56 66 E-mail: [email protected]

2. Comparisons organization 2.1 The comparisons principle. 2.1.1 The scheme of comparisons – round-robin. 2.1.2 Pilot laboratory – NSC “Institute of Metrology”. 2.1.3 The objectives of comparisons are:

- determination of the equivalency level of the standards; - verification of CMC data.

2.2 The measurement schedule for participants is given in Table 2. Table 2

Date of comparisons NMI Abbreviation According to schedule Actual

NSC IM September 2013 September 2013 FGUP VNIIMS October 2013 October 2013 The comparisons were performed by use of comparison gauge, which is a property of NSC “Institute of Metrology”.

3. The basic characteristics of comparison gauge

Figure 1. Comparison gauge

Silicon plate

Aluminum base

Position of marks

Page 3: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness of 8,5 mm. It has two height differences. The overall dimensions of the gauge are 20409 mm (Figure 1). 3.2 The main characteristics of the gauge are given in Table 3. The nominal height d is 0,25 μm and 49 μm. Passage width 1 is 1,3 μm and 43,3 μm respectively. Passage width 2 is 1,4 μm and 30,8 μm respectively. Bottom width is 192,6 μm and 135,3 μm respectively. Table 3

Characteristic description Height difference I Height difference II Nominal height, μm 0,25 49 Passage width 1, μm 1,3 43,3 Passage width 2, μm 1,4 30,8 Bottom width, μm 192,6 135,3 Factory number 016

4. Measurement method The basis of measurement is the definition of the length unit which is lined up to the helium-

neon laser wavelength. The application of the standard laser source allows direct obtaining of data binding of the

measurement parameters to the unit standard by displacement interferometer and microinterferometer that produces linear conversions of roughness standard profile and gets its image on the fringe pattern. Advanced digital photo/video imaging system of the fringe pattern, algorithm and specific computer programs testing provides required accuracy of the image processing and determination of roughness parameters.

5. Environmental conditions during the comparisons

5.1 Environmental conditions in which gauge measurements were held are given in Table 4.

Table 4

Characteristic description Characteristics value Gauge temperature, С 20 ± 1 Air temperature, С 20 ± 1 Relative humidity, % 58 ± 20 Atmospheric pressure, mm Hg 760 ± 20

6. Measurement instrumentation, conditions and results 6.1. NSC “Institute of Metrology”, Ukraine 6.1.1 Measurement instrumentation

National primary standard of the length unit for measurements of the parameters of roughness Rmax, Rz and Ra in the range from 0,025 μm to 1600 μm (hereinafter referred to as the standard) consists of the complex of such measuring equipment and devices:

Microinterferometric apparatus which includes: a) microinterferometer; b) imaging system for digital photo and video information; c) source of monochromatic radiation – He-Ne gas laser stabilized on He line and the

white radiation source; interferometric displacement controller IP-1; temperature, humidity and air pressure measuring device; management system – calculating device based on computer work;

Page 4: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

software of the standard roughness gauge with the regular profile and one-line degree of roughness height. General view of the type standard is given in the Photo (Figure 2).

Figure 2. Standard DETU 01-04-07

6.1.2 Measurement conditions. The measurements met the following conditions: air temperature (20±0,1) ˚С; absolute air humidity (10±3) mm Hg; atmospheric pressure (98 – 102) kPa. 6.1.3 Measurement results Measurement results of the height differences of the comparison standard hold in NSC “Institute of metrology” are given in Table 5.

Table 5

Research results of gauge No. 016 characteristics

Standard DETU 01-04-07 Observation

Sr.No Rmax area 1, μm Rmax area 2, μm

1 0,254 49,08 2 0,248 49,22 3 0,251 49,23 4 0,248 49,33 5 0,251 49,07 6 0,247 49,36 7 0,250 49,51 8 0,250 49,38 9 0,257 49,14 10 0,246 48,95

Mean value of the depth of graduation mark

0,250 49,227

Standard deviation 0,003 0,169

Page 5: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

Parameter Rmax is calculated according to the formula: Rmax = Hλ / [2g], (1),

where H – the distance between a line of profile peaks and a line of profile valleys;

λ – the radiation wavelength;

g – the width of the interference fringe.

The refraction index of air is calculated according to Edlen equation:

ettppn

88

6

1060794336,5100036610,01

100133,0817,013639197,381 (2);

where: n - the refraction index of air;

p – atmospheric pressure value in mm Hg;

t – air temperature in °С;

е – air humidity in mm Hg.

The calculation of uncertainty budget when measuring the roughness parameter Rmax is

presented in Tables 6-7.

Table 6. The evaluation of measurement uncertainty of roughness parameters Rmax for

0,251 μm.

Quantity, symbol Unit Estimation value Interval Sensitivity

coefficient

Contribution to the standard uncertainty

Uncertainty contribution

1 2 3 4 5 6 7

Uncertainty of type A evaluation

The distance between a line of profile peaks and a line of profile valleys, H

px 586 1 Rmax/Н μm/px 0,0017

1·0,0017= 1,7·10-3 μm

The width of the interference fringe, g

px 186 0,6 Rmax/g μm/px

0,00538

0,6·0,00538

=3,2·10-3

μm

Correlation index - 0,9

Roughness parameter Rmax

μm 1,0 0,0029 μm

Uncertainty of type B evaluation

Wavelength, λ μm 0,632990798 1,15·10-8

Rmax/λ=

1,0/0,63299 = 1,58

1,15·10-8· 1,58= =1,82·10-8

μm can be neglected

Page 6: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

The distance between a line of profile peaks and a line of profile valleys, H Uncertainty components:

px

586

Rmax/Н μm/px

uB1 (H) 0,1074

uB2 (H) 0,3406

uB3 (H) 0,2713

uB4 (H) 0,0346

uB5 (H) 0,0981

uB(H) 0,4619 0,00170 0,785·10-3μm

The width of the interference fringe, g, Uncertainty components

px 186 Rmax/g μm/px

uB1 (g) 0,1074

uB2 (g) 0,1074

uB3 (g) 0,0860

uB4 (g) 0,0107

uB5 (g) 0,0981

uB (g) 0,2006 5,38·10-3 1,079·10-3μm

Standard uncertainty of type B UB (Rmax)

μm 1,0 0,0013 μm

Combined standard uncertainty UC (Rmax)

μm 0,0019 μm

Degree of freedom ν 11

Coverage factor К at the level of confidence of 99 %

3,1

Expanded uncertainty UP (Rmax)

μm 0,0059 μm

Table 7. The evaluation of measurement uncertainty of roughness parameters Rmax for 49 μm.

Quantity, symbol Unit Estimation value Interval Sensitivity

coefficient

Contribution to the standard uncertainty

Uncertainty contribution

1 2 3 4 5 6 7

Uncertainty of type A evaluation

Roughness μm 0,169

Page 7: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

parameter Rmax

Uncertainty of type B evaluation

Roughness parameter Rmax, Uncertainty components:

μm 0,002 0,016 2,57 0,006

Component caused by the curvature of interference fringes uB1

0,0003

Component caused by the optical distortion of the optical path uB2

0,0023

Component caused by the different levels of black uB3

0,0018

Component caused by the inclination of the measuring object uB4

0,00023

Component caused by the influence of the aperture uB5

0,00029

Component caused by the thermal displacement of the fringes uB6

3,75·10-6

Component caused by the displacement measurement uncertainty IP-1 uB7

0,0133

Standard uncertainty of type B UB (Rmax)

μm 1,0

0,0149 μm

Combined standard uncertainty UC (Rmax)

μm

0,1697 μm

Degree of freedom ν 11

Coverage factor К at the level of confidence of 99 %

3,1

Expanded uncertainty UP (Rmax)

μm

0,5259 μm

The expanded uncertainty for 0,25 μm is U199 (Rmax) = 0,0059 μm. The expanded uncertainty for 49,0 μm is U299 (Rmax) = 0,5259 μm. 6.2 FGUP VNIIMS, Russia 6.2.1 Measurement instrumentation Metrological instrumental complex for the measurement of the relief and roughness

parameters of nanometer range consists of four types of measuring instruments (MI): contact profilometers, scanning probe microscope (SPM), interference microscope and precision interferometers.

Page 8: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

Heterodyne detectors with resolution up to 0,1 nm are installed into the above mentioned MI, that provides the accuracy requirements that meet international standards of leading countries of the world (PTB – Germany, NIST – USA, NPL – UK).

The indicated MIs are equipped with heterodyne detectors: - heterodyne laser displacement interferometers of Michelson in scanning probe

microscopes; - contact profilometers; - stabilized He-Ne lasers in phase-shifting Fizeau interferometers for relief control and Miro

interferometers in interference microscopes for roughness control of nanometer range

Figure 3 – Contact profilometer with a binding to the wavelength of stabilized laser

radiation

Figure 4 Precision laser Fizeau interferometer for the measurement of relief parameters for nanostructured surfaces

6.2.2 Measurement conditions. The measurements met the following conditions: air temperature (20±0,1) ˚С; absolute air humidity (10±3) mm Hg; atmospheric pressure (98 – 102) kPa. 6.1.3 Measurement results

Laser profilometer “Talystep”

Laser interferometer

profilometer sonde

sonde

base Piezo-table for scanning on XYZ

Page 9: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

Measurement results of the height differences of the comparison standard hold in FGUP VNIIMS are shown in Table 8.

Page 10: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

Table 8. Research results of gauge No.016 characteristics

FGUP VNIIMS Standard Observation

Sr.No Rmax area 1, μm Rmax area 2, μm

1 0,243 49,072 2 0,248 49,016 3 0,236 49,108 4 0,232 49,100 5 0,247 49,028 6 0,241 49,190 7 0,246 49,063 8 0,232 49,062 9 0,250 49,059 10 0,246 49,096

Mean value of the depth of graduation mark

0,242 49,10

Standard deviation 0,002 0,15 Parameter Rmax is calculated according to the formula

Rmax = Rmaxи + с + Rq + м + о, (11)

where Rmax – the measured value of gauge parameter Ra;

Rmaxu – the arithmetic mean value of ten measurements of gauge parameter Rmax;

с - measurement system correction;

Rq - correction to the inherent noise of the system;

м – standard gauge correction;

о - reading error of last sampling echelon

The calculation of uncertainty budget when measuring the roughness parameter Rmax for the

range from 0 to 0,2 mm is presented in Table 9.

Table 9 Component quantity Characteristics of component quantity

1 2 Rmaxu – the arithmetic mean value of parameter Rmаx grade measurements

Uncertainty of type A Distribution type: normal Standard uncertainty:

1

)maxmax()max( 1

2

nn

RRRu

n

iиi

и

)ma( иxRu = 0,0019 μm

Page 11: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

с - correction for Form Talysurf measurement system

Uncertainty of type B Distribution type: rectangular Estimation value: 0 Interval containing the component quantity value: ± 0,0085 μm Standard uncertainty: 0,0049 μm

Interval containing the component quantity value с determined in the result of the research of the metrological characteristics of the standard. Maximum value of measurement uncertainty Rmax = ± 0,0085 μm obtained on the measurement range 0-0,2 mm.

Standard uncertainty value u(с) is found as the standard deviation with rectangular distribution u(с) = Rmax / 3 =

0,0085/ 3 =0,0049 μm Rq – correction to the inherent noise of the Form Talysurf system

Uncertainty of type B Distribution type: rectangular Estimation value: 0 Interval containing the component quantity value: 0,002 μm Standard uncertainty: 0,00115 μm

Intrval ± аRq containing the component quantity value Rq specified in the calibration certificate issued by calibration laboratory of the company «Taylor Hobson». Inherent system noise Rq = 0,002 μm, it follows that аRq = ± 0,002 μm.

Standard uncertainty value u(Rq) is found as the standard deviation with rectangular distribution u(Rq) = аRq / 3 =

0,002/ 3 = 0,00115 μm м - standard gauge correction Uncertainty of type B

Distribution type: rectangular Estimation value: 0 Interval containing the component quantity value: ± 0,002 μm Standard uncertainty: u (м) = 0,00115 μm

Interval ± аm containing the component quantity value м is determined according to data specified in the passport of the gauge.

Standard uncertainty value u(Rq) is found as the standard deviation with rectangular distribution u(м) = ам / 3 =

0,002/ 3 = 0,00115 μm о – reading error of last sampling echelon Uncertainty of type B

Distribution type: rectangular Estimation value: 0 Interval containing the component quantity value: 0,003 мкм Standard uncertainty: u (о) = 0,00087 м

Interval containing the component quantity value о is determined according to the system capability. On the measurement range 0-0,2 mm system resolution is 0,003 μm. This value is specified in operational documentation of Form Talysurf system.

Standard uncertainty value u(о) is found as standard deviation with rectangular distribution u(о) = 0,003 /2 3 = 0,00087 μm

Expanded uncertainty U max)(R is obtained by multiplying the standard uncertainty state

u max)(R by the coverage factor k = 2 assuming the normal distribution for the 95% confidence

level.

U max)(R = 2 × u max)(R = 0,0056×2 = 0,011 μm.

Page 12: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

The measurement of comparison gauge of NSC “Institute of Metrology” and FGUP VNIIMS on section 1 of gauge No.16

0,225

0,23

0,235

0,24

0,245

0,25

0,255

0,26

Figure 5 – Results of the research of Rmax characteristic on section 1 of gauge No. 016, blue colour – the amount of Rmax of the average measurement value, red colour – the border of expanded measurement uncertainty.

The measurement of comparison gauge of NSC “Institute of Metrology” and FGUP VNIIMS

on section 2 of gauge No.16

48,6

48,8

49

49,2

49,4

49,6

49,8

50

Figure 6 - Results of the research of Rmax characteristic on section 2 of gauge No. 016,

blue colour – the amount of Rmax of the average measurement value, red colour – the border of expanded measurement uncertainty.

7 Results of comparisons and their analysis During comparisons each laboratory-participant carried out 10 measurement of Rmax

parameters on sections 1 and 2 of gauge No. 016 each. Maximum differences of the results of Rmax parameter measurements are given in Table 10.

NSC “Institute of Metrology”

FGUP VNIIMS

Rmax, μm

Rmax, μm

NSC “Institute of Metrology”

FGUP VNIIMS

Page 13: COOMET PROJECT NO. 568/UA/12 …...3.1 Comparison gauge is a roughness gauge of type A1 which represents a silicon slab with thickness of 0,5 mm on the aluminum base with thickness

Table 10 Maximum differences of the results of Rmax parameter measurements on section 1, μm

Maximum differences of the results of Rmax parameter measurements on section 2, μm

NSC "Institute of Metrology"

FGUP VNIIMS NSC "Institute of Metrology"

FGUP VNIIMS

0.011 0.018 0.56 0.174 Maximum differences of the results of Rmax parameter measurements of the comparison

participants on sections 1 and 2 of the measure No. 016 are given in Table 11. Table 11

Maximum differences of the results of Rmax parameter measurements on section 1, μm

Maximum differences of the results of Rmax parameter measurements on section 2, μm

FGUP VNIIMS - NSC "Institute of Metrology" FGUP VNIIMS - NSC "Institute of Metrology" 0.007 0.368

The results of measurements of the comparison participants were verified as per the level of equivalence of the standards.

As only two countries (laboratories) take part in the comparison, the level of equivalence can be expressed quantitively by two following quantities (dj , U(dj)), i.e.

- by deviation from the reference value (RV) of measurement value of each institute dj - by expanded uncertainty U(dj) of this difference at the level of credibility of 95%

RVRd ij max , (4)

jj dudU 2 , (5)

RVRudu ij max22 (6)

jj dud 2 (7) The difference of the results of dj measurements is given in Table 12. Table 12

The difference of the average values results of dj measurements of Rmax parameter on section 1,

μm

The difference of the average values results of dj measurements of Rmax parameter on section

2, μm 0.001 0.019

Expanded uncertainty U(dj) of the results of measurements is given in Table 13. Table 13

Expanded uncertainty U(dj) of the difference of the results of dj measurements of Rmax

parameter on section 1, μm

Expanded uncertainty U(dj) of the difference of the results of dj measurements of Rmax

parameter on section 2, μm 0.025 1.052

As it can be seen from Tables 12 and 13 at comparison of dj and U(dj) there is carries out

condition (7), correspondingly, the standards being compared are equivalent. Conclusions: The results of the comparison conducted for standard instruments of FGUP

VNIIMS and NSC "Institute of Metrology" at height differences of 0.25 μm and 49 μm can be recognized as positive. Comparison of standards of FGUP VNIIMS and NSC "Institute of Metrology" shall be continued within a new project.


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