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Copyright Agrawal & Srivath Copyright Agrawal & Srivath s, 2007 s, 2007 Low-Power Design and Test, Lecture Low-Power Design and Test, Lecture 3 1 Test Test Logic-Level Power Logic-Level Power Estimation Estimation Vishwani D. Vishwani D. Agrawal Agrawal Auburn University, Auburn University, USA USA [email protected] [email protected] Srivaths Ravi Srivaths Ravi Texas Instruments Texas Instruments India India [email protected] [email protected] Hyderabad, July 30-31, 2007 http://www.eng.auburn.edu/~vagrawal/hyd.html
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Page 1: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2Copyright Agrawal & Srivaths, 2007007

Low-Power Design and Test, Lecture 3Low-Power Design and Test, Lecture 3 11

Low-Power Design and Low-Power Design and TestTest

Logic-Level Power EstimationLogic-Level Power Estimation

Vishwani D. AgrawalVishwani D. AgrawalAuburn University, USAAuburn University, [email protected]@eng.auburn.edu

Srivaths RaviSrivaths RaviTexas Instruments IndiaTexas Instruments India

[email protected]@ti.com

Hyderabad, July 30-31, 2007http://www.eng.auburn.edu/~vagrawal/hyd.html

Page 2: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 2

Power AnalysisPower Analysis Motivation:Motivation:

SpecificationSpecification OptimizationOptimization ReliabilityReliability

ApplicationsApplications Design analysis and optimizationDesign analysis and optimization Physical designPhysical design PackagingPackaging TestTest

Page 3: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 3

Abstraction, Complexity, Abstraction, Complexity, AccuracyAccuracy

Abstraction levelAbstraction level Computing Computing resourcesresources Analysis accuracyAnalysis accuracy

AlgorithmAlgorithm LeastLeast WorstWorst

Software and Software and systemsystem

Hardware behaviorHardware behavior

Register transferRegister transfer

LogicLogic

CircuitCircuit

DeviceDevice MostMost BestBest

Page 4: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 4

SpiceSpice Circuit/device level analysisCircuit/device level analysis

Circuit modeled as network of transistors, capacitors, Circuit modeled as network of transistors, capacitors, resistors and voltage/current sources.resistors and voltage/current sources.

Node current equations using Kirchhoff’s current law.Node current equations using Kirchhoff’s current law. Average and instantaneous power computed from supply Average and instantaneous power computed from supply

voltage and device current.voltage and device current.

Analysis is accurate but expensiveAnalysis is accurate but expensive Used to characterize parts of a larger circuit.Used to characterize parts of a larger circuit.

Original references:Original references: L. W. Nagel and D. O. Pederson, “SPICE – Simulation L. W. Nagel and D. O. Pederson, “SPICE – Simulation

Program With Integrated Circuit Emphasis,” Memo ERL-Program With Integrated Circuit Emphasis,” Memo ERL-M382, EECS Dept., University of California, Berkeley, Apr. M382, EECS Dept., University of California, Berkeley, Apr. 1973.1973.

L. W. Nagel, L. W. Nagel, SPICE 2, A Computer program to Simulate SPICE 2, A Computer program to Simulate Semiconductor CircuitsSemiconductor Circuits, PhD Dissertation, University of , PhD Dissertation, University of California, Berkeley, May 1975.California, Berkeley, May 1975.

Page 5: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 5

Ca

Logic Model of MOS CircuitLogic Model of MOS Circuit

Cc

Cb

VDD

a

b

c

pMOS FETs

nMOSFETs

Ca , Cb , Cc and Cd are

node capacitances

Dc

Da ca

b

Da and Db are

interconnect or propagation delays

Dc is inertial delay

of gate

Db

Cd

Page 6: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 6

Spice Characterization of a 2-Spice Characterization of a 2-Input NAND GateInput NAND Gate

Input data patternInput data pattern Delay (ps)Delay (ps) Dynamic energy Dynamic energy (pJ)(pJ)

aa = = bb = 0 → 1 = 0 → 1 6969 1.551.55

aa = 1, = 1, bb = 0 → 1 = 0 → 1 6262 1.671.67

a = 0 → 1, b = 1a = 0 → 1, b = 1 5050 1.721.72

aa = = bb = 1 → 0 = 1 → 0 3535 1.821.82

aa = 1, = 1, bb = 1 → 0 = 1 → 0 7676 1.391.39

a = 1 → 0, b = 1a = 1 → 0, b = 1 5757 1.941.94

Page 7: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 7

Spice Characterization Spice Characterization (Cont.)(Cont.)

Input data patternInput data pattern Static power (pW)Static power (pW)

aa = = bb = 0 = 0 5.055.05

a = 0, b = 1a = 0, b = 1 13.113.1

aa = 1, = 1, bb = 0 = 0 5.105.10

aa = = bb = 1 = 1 28.528.5

Page 8: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 8

Switch-Level PartitioningSwitch-Level Partitioning Circuit partitioned into channel-connected Circuit partitioned into channel-connected

components for Spice characterization.components for Spice characterization. Reference: R. E. Bryant, “A Switch-Level Model and Reference: R. E. Bryant, “A Switch-Level Model and

Simulator for MOS Digital Systems,” Simulator for MOS Digital Systems,” IEEE Trans. IEEE Trans. ComputersComputers, vol. C-33, no. 2, pp. 160-177, Feb. 1984., vol. C-33, no. 2, pp. 160-177, Feb. 1984.

G1

G2

G3

Internal switching nodes not seen by logic simulator

Page 9: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 9

Delay and Discrete-Event Delay and Discrete-Event SimulationSimulation (NAND gate)(NAND gate)

b

a

c (CMOS)

Time units 0 5

c (zero delay)

c (unit delay)

c (multiple delay)

c (minmax delay)

Inp

uts

Log

ic s

imul

atio

n

min =2, max =5

rise=5, fall=5

Transient region

Unknown (X)

X

Page 10: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 10

Event-Driven Simulation Event-Driven Simulation ExampleExample

2

2

4

2

a =1

b =1

c =1→0

d = 0

e =1

f =0

g =1

Time, t 0 4 8

g

t = 0 12345678

Scheduledevents

c = 0

d = 1, e = 0

g = 0

f = 1

g = 1

Activitylist

d, e

f, g

gTim

e s

tack

Page 11: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 11

Time Wheel (Circular Stack)Time Wheel (Circular Stack)

t=0

1

2

3

4

5

6

7

maxCurrenttimepointer Event link-list

Page 12: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 12

Gate-Level Power AnalysisGate-Level Power Analysis Pre-simulation analysis:Pre-simulation analysis:

Partition circuit into channel connected Partition circuit into channel connected gate components.gate components.

Determine node capacitances from layout Determine node capacitances from layout analysis (accurate) or from wire-load analysis (accurate) or from wire-load model* (approximate).model* (approximate).

Determine dynamic and static power from Determine dynamic and static power from Spice for each gate.Spice for each gate.

Determine gate delays using Spice or Determine gate delays using Spice or Elmore delay model.Elmore delay model.

* Wire-load model estimates capacitance of a net by its pin-count. See Yeap, p. 39.

Page 13: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 13

Elmore Delay ModelElmore Delay Model W. Elmore, “The Transient Response of Damped Linear W. Elmore, “The Transient Response of Damped Linear

Networks with Particular Regard to Wideband Amplifiers,” Networks with Particular Regard to Wideband Amplifiers,” J. J. Appl. PhysAppl. Phys., vol. 19, no.1, pp. 55-63, Jan. 1948.., vol. 19, no.1, pp. 55-63, Jan. 1948.

s 1

2

3

4

5

R1

R2

R3

R4

R5

C1

C2

C3

C5

C4

Shared resistance:

R45 = R1 + R3R15 = R1R34 = R1 + R3

Page 14: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 14

Elmore Delay FormulaElmore Delay Formula

NDelay at node k = 0.69 Σ Cj × Rjk

j=1

where N = number of capacitive nodes in the network

Example:

Delay at node 5 = 0.69[R1 C1 + R1 C2 + (R1+R3)C3 + (R1+R3)C4 + (R1+R3+R5)C5]

Page 15: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 15

Gate-Level Power Analysis Gate-Level Power Analysis (Cont.)(Cont.)

Run discrete-event (event-driven) logic Run discrete-event (event-driven) logic simulation with a set of input vectors.simulation with a set of input vectors.

Monitor the toggle count of each net and Monitor the toggle count of each net and obtain capacitive power dissipation:obtain capacitive power dissipation:

PPcapcap == ΣΣ CCk k V V 22 ff all nodes all nodes kk

Where:Where: CCkk is the total node capacitance being switched, as is the total node capacitance being switched, as

determined by the simulator.determined by the simulator. VV is the supply voltage. is the supply voltage. ff is the clock frequency, i.e., the number of vectors is the clock frequency, i.e., the number of vectors

applied per unit timeapplied per unit time

Page 16: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 16

Gate-Level Power Analysis Gate-Level Power Analysis (Cont.)(Cont.)

Monitor dynamic energy events at the Monitor dynamic energy events at the input of each gate and obtain internal input of each gate and obtain internal switching power dissipation:switching power dissipation:

PPintint = = ΣΣ ΣΣ E(g,e) E(g,e) F(g,e)F(g,e)

gates gates g g events events ee WhereWhere

E(g,e) = E(g,e) = energy of event energy of event ee of gate of gate gg, pre-, pre-computed from Spice.computed from Spice.

F(g,e) = F(g,e) = occurrence frequency of the eventoccurrence frequency of the event e e at gateat gate g, g, observed by logic simulationobserved by logic simulation..

Page 17: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 17

Gate-Level Power Analysis Gate-Level Power Analysis (Cont.)(Cont.)

Monitor the static power dissipation state of Monitor the static power dissipation state of each gate and obtain the static power each gate and obtain the static power dissipation:dissipation:

PPstatstat = = ΣΣ ΣΣ P(g,s) T(g,s)/ TP(g,s) T(g,s)/ T gates gates gg states states ss

WhereWhere P(g,s) = P(g,s) = static power dissipation of gatestatic power dissipation of gate g g for statefor state s, s,

obtained from Spiceobtained from Spice.. T(g,s) = T(g,s) = duration of stateduration of state s s at gateat gate g, g, obtained from logic obtained from logic

simulationsimulation.. T = T = vector periodvector period..

Page 18: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 18

Gate-Level Power AnalysisGate-Level Power Analysis Sum up all three components of power:Sum up all three components of power:

P = PP = Pcap cap + P+ Pintint + P + Pstatstat

References:References: A. Deng, “Power Analysis for CMOS/BiCMOS Circuits,” A. Deng, “Power Analysis for CMOS/BiCMOS Circuits,” Proc. Proc.

International Workshop Low Power DesignInternational Workshop Low Power Design, 1994., 1994. J. Benkoski, A. C. Deng, C. X. Huang, S. Napper and J. Tuan, J. Benkoski, A. C. Deng, C. X. Huang, S. Napper and J. Tuan,

“Simulation Algorithms, Power Estimation and Diagnostics “Simulation Algorithms, Power Estimation and Diagnostics in PowerMill,” in PowerMill,” Proc. PATMOSProc. PATMOS, 1995., 1995.

C. X. Huang, B. Zhang, A. C. Deng and B. Swirski, “The C. X. Huang, B. Zhang, A. C. Deng and B. Swirski, “The Design and Implementation of PowerMill,” Design and Implementation of PowerMill,” Proc. Proc. International Symp. Low Power DesignInternational Symp. Low Power Design, 1995, pp. 105-109., 1995, pp. 105-109.

Page 19: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 19

Probabilistic AnalysisProbabilistic Analysis

View signals as a random processesView signals as a random processes

Prob{s(t) = 1} = p1 p0 = 1 – p1

C

0→1 transition probability = (1 – p1) p1

Power, P = (1 – p1) p1 CV2fck

Page 20: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 20

Source of InaccuracySource of Inaccuracy

1/fck

p1 = 0.5 P = 0.5CV 2 fck

p1 = 0.5 P = 0.33CV 2 fck

p1 = 0.5 P = 0.167CV 2 fck

Observe that the formula, Power, P = (1 – p1) p1 C V 2 fck , is notCorrect.

Page 21: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 21

Switching FrequencySwitching Frequency

Number of transitions per unit time:

N(t)T = ───

t

For a continuous signal:

N(t)T = lim ───

t→∞ t

T is defined as transition density.

Page 22: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 22

Static Signal ProbabilitiesStatic Signal Probabilities

Observe signal for interval Observe signal for interval t t 0 + 0 + t t 11 Signal is 1 for duration Signal is 1 for duration t t 11 Signal is 0 for duration Signal is 0 for duration t t 00 Signal probabilities:Signal probabilities:

p p 1 = 1 = t t 1/(1/(t t 0 + 0 + t t 1)1) p p 0 = 0 = t t 0/(0/(t t 0 + 0 + t t 1) = 1 – 1) = 1 – p p 11

Page 23: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 23

Static Transition ProbabilitiesStatic Transition Probabilities

Transition probabilities:Transition probabilities: T T 01 = 01 = p p 0 Prob{signal is 1 | signal was 0} = 0 Prob{signal is 1 | signal was 0} = p p 0 0 pp11 T T 10 = 10 = p p 1 Prob{signal is 0 | signal was 1} = 1 Prob{signal is 0 | signal was 1} = p p 1 1 p p

00 TT = = T T 01 + 01 + T T 10 = 2 10 = 2 p p 0 0 p p 1 = 2 1 = 2 p p 1 (1 – 1 (1 – p p 1)1)

Transition density: Transition density: TT = 2 = 2 p p 1 (1 – 1 (1 – p p 1)1)

Page 24: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 24

Static Transition FrequencyStatic Transition Frequency

0 0.25 0.5 0.75 1.0

0.25

0.2

0.1

0.0

p1

f =

p1

(1 –

p1

)

Page 25: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 25

Inaccuracy in Transition Inaccuracy in Transition DensityDensity

1/fck

p1 = 0.5 T = 1.0

p1 = 0.5 T = 4/6

p1 = 0.5 T = 1/6

Observe that the formula, T = 2 p1 (1 – p1), is not correct.

Page 26: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 26

Cause for Error and Cause for Error and CorrectionCorrection

Probability of transition is not independent Probability of transition is not independent of the present state of the signal.of the present state of the signal.

Determine probability Determine probability p p 01 of a 0→1 01 of a 0→1 transition.transition.

Recognize Recognize p p 01 ≠ 01 ≠ p p 0 × 0 × p p 11 We obtain We obtain p p 1 = (1 – 1 = (1 – p p 1)1)p p 01 + 01 + p p 1 1 p p 1111

p p 0101p p 1 = ─────────1 = ─────────

1 – 1 – p p 11 + 11 + p p 0101

Page 27: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 27

Correction (Cont.)Correction (Cont.)

Since Since p p 11 + 11 + p p 10 = 1, i.e., given that the 10 = 1, i.e., given that the signal was previously 1, its present value signal was previously 1, its present value can be either 1 or 0.can be either 1 or 0.

Therefore,Therefore, p p 0101

p p 1 = ──────1 = ────── p p 10 + 10 + p p 0101

This uniquely gives signal probability as a This uniquely gives signal probability as a function of transition probabilities.function of transition probabilities.

Page 28: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 28

Transition and Signal Transition and Signal ProbabilitiesProbabilities

1/fck

p01 = p10 = 0.5 p1 = 0.5

p01 = p10 = 1/3 p1 = 0.5

p1 = 0.5p01 = p10 = 1/6

Page 29: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 29

Probabilities: p0, p1, p00, p01, p10, Probabilities: p0, p1, p00, p01, p10, p11p11

p p 01 + 01 + p p 00 =100 =1 p p 11 + 11 + p p 10 = 110 = 1 p p 0 = 1 – 0 = 1 – p p 11

p p 0101

p p 1 = ───────1 = ───────

p p 10 + 10 + p p 0101

Page 30: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 30

Transition DensityTransition Density

TT = 2 = 2 p p 1 (1 – 1 (1 – p p 1) = 1) = p p 0 0 p p 01 + 01 + p p 1 1 p p 1010

= 2 = 2 p p 10 10 p p 01 / (01 / (p p 10 + 10 + p p 01)01)

= 2 = 2 p p 1 1 p p 10 = 2 10 = 2 p p 0 0 p p 0101

Page 31: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 31

Power CalculationPower Calculation

Power can be estimated if transition Power can be estimated if transition density is known for all signals.density is known for all signals.

Calculation of transition density Calculation of transition density requiresrequires Signal probabilitiesSignal probabilities Transition densities for primary inputs; Transition densities for primary inputs;

computed from vector statisticscomputed from vector statistics

Page 32: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 32

Signal ProbabilitiesSignal Probabilities

x1

x2

x1 x2

x1

x2

x1 + x2 – x1x2

x1 1 - x1

Page 33: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 33

Signal ProbabilitiesSignal Probabilities x1

x2 x3

x1 x2

y = 1 - (1 - x1x2) x3 = 1 - x3 + x1x2x3 = 0.625

X1 X2 X3 Y0 0 0 10 0 1 00 1 0 10 1 1 01 0 0 11 0 1 01 1 0 11 1 1 1

0.5

0.5

0.5

0.25 0.625

Ref: K. P. Parker and E. J. McCluskey,“Probabilistic Treatment of General Combinational Networks,” IEEE Trans. on Computers, vol. C-24, no. 6, pp. 668-670, June 1975.

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 34

Correlated Signal Correlated Signal ProbabilitiesProbabilities

x1

x2

x1 x2

y = 1 - (1 - x1x2) x2 = 1 – x2 + x1x2x2 = 1 – x2 + x1x2 = 0.75 (correct value)

X1 X2 Y0 0 10 1 01 0 11 1 1

0.5

0.5 0.25 0.625?

Page 35: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 35

Correlated Signal Correlated Signal ProbabilitiesProbabilities

x1

x2

x1 + x2 – x1x2

y = (x1 + x2 – x1x2) x2 = x1x2 + x2x2 – x1x2x2 = x1x2 + x2 – x1x2 = x2 = 0.5 (correct value)

X1 X2 Y0 0 00 1 11 0 01 1 1

0.5

0.5 0.75 0.375?

Page 36: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 36

ObservationObservation

Numerical computation of signal Numerical computation of signal probabilities is accurate for fanout-probabilities is accurate for fanout-free circuits.free circuits.

Page 37: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 37

RemediesRemedies

Use Shannon’s expansion theorem to Use Shannon’s expansion theorem to compute signal probabilities.compute signal probabilities.

Use Boolean difference formula to Use Boolean difference formula to compute transition densities.compute transition densities.

Page 38: Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.

Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 38

Shannon’s Expansion Shannon’s Expansion TheoremTheorem

C. E. Shannon, “A Symbolic Analysis of Relay C. E. Shannon, “A Symbolic Analysis of Relay and Switching Circuits,” and Switching Circuits,” Trans. AIEETrans. AIEE, vol. 57, , vol. 57, pp. 713-723, 1938.pp. 713-723, 1938.

Consider:Consider: Boolean variables, X1, X2, . . . , XnBoolean variables, X1, X2, . . . , Xn Boolean function, F(X1, X2, . . . , Xn)Boolean function, F(X1, X2, . . . , Xn)

Then F = Xi F(Xi=1) + Xi’ F(Xi=0)Then F = Xi F(Xi=1) + Xi’ F(Xi=0) WhereWhere

Xi’ is complement of X1Xi’ is complement of X1 Cofactors, F(Xi=j) = F(X1, X2, . . , Xi=j, . . , Xn), j = 0 or 1Cofactors, F(Xi=j) = F(X1, X2, . . , Xi=j, . . , Xn), j = 0 or 1

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 39

Expansion About Two InputsExpansion About Two Inputs

F = XiXj F(Xi=1, Xj=1) + XiXj’ F(Xi=1, F = XiXj F(Xi=1, Xj=1) + XiXj’ F(Xi=1, Xj=0)Xj=0)

+ Xi’Xj F(Xi=0, Xj=1)+ Xi’Xj F(Xi=0, Xj=1)

+ Xi’Xj’ F(Xi=0, Xj=0)+ Xi’Xj’ F(Xi=0, Xj=0) In general, a Boolean function can be In general, a Boolean function can be

expanded about any number of input expanded about any number of input variables.variables.

Expansion about k variables will have 2Expansion about k variables will have 2kk terms.terms.

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 40

Correlated Signal Correlated Signal ProbabilitiesProbabilities

X1

X2

X1 X2

X1 X2 Y0 0 10 1 01 0 11 1 1

Y = X1 X2 + X2’

Shannon expansion about the reconverging input, X2:

Y = X2 Y(X2 = 1) + X2’ Y(X2 = 0) = X2 (X1) + X2’ (1)

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 41

Correlated SignalsCorrelated Signals

When the output function is expanded When the output function is expanded about all reconverging input variables,about all reconverging input variables,

All cofactors correspond to fanout-free circuits.All cofactors correspond to fanout-free circuits. Signal probabilities for cofactor outputs can be Signal probabilities for cofactor outputs can be

calculated without error.calculated without error. A weighted sum of cofactor probabilities gives the A weighted sum of cofactor probabilities gives the

correct probability of the output.correct probability of the output.

For two reconverging inputs:For two reconverging inputs:f = xixj f(Xi=1, Xj=1) + xi(1-xj) f(Xi=1, Xj=0)f = xixj f(Xi=1, Xj=1) + xi(1-xj) f(Xi=1, Xj=0)

+ (1-xi)xj f(Xi=0, Xj=1) + (1-xi)(1-xj) f(Xi=0, + (1-xi)xj f(Xi=0, Xj=1) + (1-xi)(1-xj) f(Xi=0, Xj=0)Xj=0)

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 42

Correlated Signal Correlated Signal ProbabilitiesProbabilities X1

X2

X1 X2

X1 X2 Y0 0 10 1 01 0 11 1 1

Y = X1 X2 + X2’

Shannon expansion about the reconverging input, X2:

Y = X2 Y(X2=1) + X2’ Y(X2=0) = X2 (X1) + X2’ (1)

y = x2 (0.5) + (1-x2) (1) = 0.5 (0.5) + (1-0.5) (1) = 0.75

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 43

ExampleExample

Point of reconv.

Supergate0.5

0.5

0.5

0.5

0.25

10

0.50.0

0.01.0

0.51.0

Signal probability for supergate output = 0.5 Prob{rec. signal = 1} + 1.0 Prob{rec. signal = 0} = 0.5 × 0.5 + 1.0 × 0.5 = 0.75

0.375

Reconv. signal

S. C. Seth and V. D. Agrawal, “A New Model for Computation ofProbabilistic Testability in Combinational Circuits,” Integration, the VLSI Journal, vol. 7, no. 1, pp. 49-75, April 1989.

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 44

Probability Calculation AlgorithmProbability Calculation Algorithm

Partition circuit into supergates.Partition circuit into supergates. Definition: A supergate is a circuit partition with a single Definition: A supergate is a circuit partition with a single

output such that all fanouts that reconverge at the output output such that all fanouts that reconverge at the output are contained within the supergate. are contained within the supergate.

Identify reconverging and non-reconverging Identify reconverging and non-reconverging inputs of each supergate.inputs of each supergate.

Compute signal probabilities from PI to PO:Compute signal probabilities from PI to PO: For a supergate whose input probabilities are knownFor a supergate whose input probabilities are known

Enumerate reconverging input statesEnumerate reconverging input states For each input state do gate by gate probability For each input state do gate by gate probability

computationcomputation Sum up corresponding signal probabilities, weighted by Sum up corresponding signal probabilities, weighted by

state probabilitiesstate probabilities

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 45

Calculating Transition Calculating Transition DensityDensity

Boolean function

1

n

x1, T1..... xn, Tn

y, T(Y) = ?

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 46

Boolean DifferenceBoolean Difference

Boolean diff(Y, Xi) = 1 means that a path is sensitized from Boolean diff(Y, Xi) = 1 means that a path is sensitized from input Xi to output Y.input Xi to output Y.

Prob(Boolean diff(Y, Xi) = 1) is the probability of Prob(Boolean diff(Y, Xi) = 1) is the probability of transmitting a toggle from Xi to Y.transmitting a toggle from Xi to Y.

Probability of Boolean difference is determined from the Probability of Boolean difference is determined from the probabilities of cofactors of Y with respect to Xi. probabilities of cofactors of Y with respect to Xi.

∂YBoolean diff(Y, Xi) = ── = Y(Xi=1) ⊕ Y(Xi=0)

∂Xi

F. F. Sellers, M. Y. Hsiao and L. W. Bearnson, “Analyzing Errors with the Boolean Difference,” IEEE Trans. on Computers, vol. C-17, no. 7, pp. 676-683, July 1968.

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 47

Transition DensityTransition Density

nT(y) = Σ T(Xi) Prob(Boolean diff(Y, Xi) = 1)

i=1

F. Najm, “Transition Density: A New Measure of Activity in DigitalCircuits,” IEEE Trans. CAD, vol. 12, pp. 310-323, Feb. 1993.

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 48

Power ComputationPower Computation For each primary input, determine signal For each primary input, determine signal

probability and transition density for given vectors.probability and transition density for given vectors. For each internal node and primary output Y, find For each internal node and primary output Y, find

the transition density T(Y), using supergate the transition density T(Y), using supergate partitioning and the Boolean difference formula.partitioning and the Boolean difference formula.

Compute power,Compute power,

P =P = ΣΣ 0.5C0.5CYY V V22 T(Y) T(Y)

all Yall Y

where Cwhere CYY is the capacitance of node Y and V is is the capacitance of node Y and V is supply voltage.supply voltage.

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 49

Transition Density and PowerTransition Density and Power

X1

X2 X3

0.2, 1

0.3, 2

0.4, 3

0.06, 0.7

0.436, 3.24

Transition densitySignal probability

YCi

CY

Power = 0.5 V 2 (0.7Ci + 3.24CY)

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 50

Prob. Method vs. Logic Sim. Prob. Method vs. Logic Sim.

CircuitCircuit No. of No. of gatesgates

Probability Probability methodmethod Logic SimulationLogic Simulation

ErrorError

%%Av. Av. densitydensity CPU s*CPU s* Av. Av.

densitydensity CPU s*CPU s*

C432C432 160160 3.463.46 0.520.52 3.393.39 6363 +2.1+2.1

C499C499 202202 11.3611.36 0.580.58 8.578.57 241241 +29.8+29.8

C880C880 383383 2.782.78 1.061.06 3.253.25 132132 -14.5-14.5

C1355C1355 346346 4.194.19 1.391.39 6.186.18 408408 -32.2-32.2

C1908C1908 880880 2.972.97 2.002.00 5.015.01 464464 -40.7-40.7

C2670C2670 11931193 3.503.50 3.453.45 4.004.00 619619 -12.5-12.5

C3540C3540 16691669 4.474.47 3.773.77 4.494.49 10821082 -0.4-0.4

C5315C5315 23072307 3.523.52 6.416.41 4.794.79 16161616 -26.5-26.5

C6288C6288 24062406 25.1025.10 5.675.67 34.1734.17 3105731057 -26.5-26.5

C7552C7552 35123512 3.833.83 9.859.85 5.085.08 27132713 -24.2-24.2* CONVEX c240

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 51

Probability Waveform Probability Waveform MethodsMethods

F. Najm, R. Burch, P. Yang and I. Hajj, “CREST – A F. Najm, R. Burch, P. Yang and I. Hajj, “CREST – A Current Estimator for CMOS Circuits,” Current Estimator for CMOS Circuits,” Proc. IEEE Int. Proc. IEEE Int. Conf. on CADConf. on CAD, Nov. 1988, pp. 204-207., Nov. 1988, pp. 204-207.

C.-S. Ding, C.-S. Ding, et alet al., “Gate-Level Power Estimation using ., “Gate-Level Power Estimation using Tagged Probabilistic Simulation,” Tagged Probabilistic Simulation,” IEEE Trans. on CADIEEE Trans. on CAD, , vol. 17, no. 11, pp. 1099-1107, Nov. 1998.vol. 17, no. 11, pp. 1099-1107, Nov. 1998.

F. Hu and V. D. Agrawal, “Dual-Transition Glitch F. Hu and V. D. Agrawal, “Dual-Transition Glitch Filtering in Probabilistic Waveform Power Estimation,” Filtering in Probabilistic Waveform Power Estimation,” Proc. IEEE Great Lakes Symp. VLSIProc. IEEE Great Lakes Symp. VLSI, Apr. 2005, pp. , Apr. 2005, pp. 357-360.357-360.

F. Hu and V. D. Agrawal,F. Hu and V. D. Agrawal, “ “Enhanced Dual-Transition Enhanced Dual-Transition Probabilistic Power Estimation with Selective Probabilistic Power Estimation with Selective Supergate Analysis,” Supergate Analysis,” Proc. IEEE Int. Conf. Computer Proc. IEEE Int. Conf. Computer DesignDesign, Oct. 2005. pp. 366-369., Oct. 2005. pp. 366-369.

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 52

Problem 1Problem 1For equiprobable inputs analyze the 0→1 transition probabilities of all gates in the two implementations of a four-input AND gate shown below. Assuming that the gates have zero delays, which implementation will consume less average dynamic power?

Chain structure Tree structure

ABCD

EF

G

ABCD

E

F

G

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 53

Problem 1 SolutionProblem 1 SolutionGiven the primary input probabilities, P(A) = P(B) = P(C) = P(D) = 0.5, signal and transition (0→1) probabilities are as follows:

Signalname

Chain Tree

Prob(sig.= 1)

Prob(0→1)

Prob(sig.=1)

Prob(0→1)

E 0.2500 0.1875 0.2500 0.1875

F 0.1250 0.1094 0.2500 0.1875

G 0.0625 0.0586 0.0625 0.0586

Total transitions/vector

0.3555 0.4336

The tree implementation consumes 100×(0.4336 – 0.3555)/0.3555 = 22% more average dynamic power. This advantage of the chain structure may be somewhat reduced because of glitches caused by unbalanced path delays.

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 54

Problem 2Problem 2Assume that the two-input AND gates in Problem 1 each has one unit of delay. Find input vector pairs for each implementation that will consume the peak dynamic power. Which implementation consumes less peak dynamic power?

Chain structure Tree structure

ABCD

EF

G

ABCD

E

F

G

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 55

Problem 2 SolutionProblem 2 SolutionFor the chain structure, a vector pair {A B C D} = {1110},{1011} will produce four gate transitions as shown below.

A

BCD

EF

G

A=11

B=10

E=10

C=11

F=10

D=01

G=00

Time units0 1 2 3

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Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 56

Problem 2 Solution (Cont.)Problem 2 Solution (Cont.)The tree structure has balanced delay paths. So it cannot make more than 3 gate transitions. A vector pair {ABCD} = {1111},{1010} will produce three transitions as shown below.

A

B

C

D

E

F

G

A=11

B=10

E=10

C=11

D=10

F=10

G=10Time units

0 1 2 3

Therefore, just counting the gate transitions, we find that the chain consumes 100(4 – 3)/3 = 33% higher peak power than the tree.


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