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DEPLOYMENT OF JTAG BASED
HW SELF-TEST IN RBS 6000
Gunnar Carlsson
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!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
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ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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Outline
› Introduction – Co-operative Development
– Why HW Self-test
› RBS 6000 HW Self-test Approach
› SerDes Test via JTAG
› Functional Operation
› HW Implementation
› System Implementation
› Test Data Structure
› Test Development and Diagnosis
› Conclusion
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!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
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ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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text in the footer area Deployment of JTAG Based HW Self-test in RBS 6000 | © Gunnar Carlsson, Ericsson | 2011-11-22 | Page 3
Co-operative Development
› The development of this Embedded JTAG Test
implementation was done in co-operation between
Ericsson (DU Radio) and SAAB (BA Support and Services)
› It is based on Ericsson concept and HW, and SAAB SW
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!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
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ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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text in the footer area Deployment of JTAG Based HW Self-test in RBS 6000 | © Gunnar Carlsson, Ericsson | 2011-11-22 | Page 4
Why HW Self-test
› HW self-test is mainly intended for use in the field
› Faults we expect in the field
– The HW may have faults that escaped production test
– Faults may occur due to reliability issues and ageing
– Faults may be permanent, trancient or intermittent
› Fault indications
– The HW is continuously supervised by HW and SW, issuing alarms at fault indications
– The operator may observe strange behaviour, not detected by HW supervision, e.g. elevated dropped call rate
› Field test purposes
– Detect latent faults at power-on/restart of boards
– Validate HW faults related to alarms (do we need to replace HW?)
– Avoid non-faulty units being sent to repair (NFF)
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ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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RBS 6000 HW Self-test Approach
› When is HW Self-test used?
– Automatically at power-up and restart
– At automatic recovery attempts (when everything else fails)
– Ordered by operator
– (Also used in production and repair )
› Test and recovery flow
1. JTAG based interconnect test (IEEE 1149.1 and IEEE 1149.6)
2. JTAG based MBIST and LBIST of ASIC’s
3. JTAG based PRBS test of serial links
4. JTAG based MBIST of DSP’s (when supported by vendors)
5. Functional test of serial links
6. Functional memory test
7. Functional Power on Self Test (POST) of DSP’s, provided by vendor
8. (Functional test of other complex devices)
9. Reset, and load & start of application SW
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ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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Typical SerDes with JTAG controlled Test Features
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ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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Functional Operation
› Two Major Modes of Operation:
› System mode
– Automatic test initiated at power-on and restart
– Test controlled via automatic fault escalation (at recovery attempts)
– Operator requested test started from his GUI
– Diagnostics down to replaceable unit (to the operator)
– More fine grained diagnostics in on-board flash log (for repair center)
› Command line mode
– Communication via Ethernet or RS232 link (front panel connector)
– Can be used at RBS level or on separate BB units
– Commands to start test and retrieve diagnostic info for manual analysis (or by
off-line tools)
– Diagnostics down to repair action supported by 3’rd party tool (today SAAB’s
TSTAP)
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!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
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ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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Functional Operation (cont.)
› Generic test execution SW (Scan Engine, SE), works on all boards
with the same execution platform
› Individual board test data (JTAG test vectors), specific to each
board and revision, resident in boot flash
› SE sends JTAG vectors on the JTAG bus, receives response, and
compare against expected data
› SE can handle several different sets of vectors, selected by options
and commands
› SE sends results to System Fault Management, or through the
Command Line Interface (depending on mode of operation)
› Functional tests are now implemented in application SW, but will
be implemented in a single load module resident in flash, reusing
production test routines
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!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
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ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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text in the footer area Deployment of JTAG Based HW Self-test in RBS 6000 | © Gunnar Carlsson, Ericsson | 2011-11-22 | Page 9
HW Implementation
ASIC
B DSP
ASIC
C DSP
ASIC
C DSP
ASIC
C DSP
DSP
DD
R3
DSP
Flash mP
Board Platform
Tra
ffic
Application
De
Se
ria
lize
r
ASIC
C
MTC
Tra
ffic
&
Co
ntr
ol
Syste
m B
scan
BScan
Protocol
Handler
ASIC
D
Scan
Engine
JTAG
Vectors
Support
FPGA
Slide title
minimum 32 pt
(32 pt makes 2 rows
Text and bullet level 1
minimum 24 pt
Bullets level 2-5
minimum 20 pt
!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
ỳ–—‘’‚“”„†‡•…‰‹›⁄€™−≤≥fifl
ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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JTAG Routing
mP
FPGA
MTC
TDI TDO
TMS
TCK
Logic tested via MTC
• At board production test, all devices are in active BScan mode
• At MTC test, mP and FPGA are in BYPASS
• Devlopment and debug of embedded JTAG vectors can be done
with traditional methods and tools
Develo
pm
ent
environm
ent
JTA
G b
oard
test connecto
r
Slide title
minimum 32 pt
(32 pt makes 2 rows
Text and bullet level 1
minimum 24 pt
Bullets level 2-5
minimum 20 pt
!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
ỳ–—‘’‚“”„†‡•…‰‹›⁄€™−≤≥fifl
ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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text in the footer area Deployment of JTAG Based HW Self-test in RBS 6000 | © Gunnar Carlsson, Ericsson | 2011-11-22 | Page 11
System Implementation
CHPI
CHPI
Future external IF
(Only for Scan
Engine tests) TEMI
BTMI
Board Test Manager
Scan Engine
TEM Server
Future test requester
Future test Engine DC power check
Board Manager
CHP Server
Scan Engine Func. Tests
Scan Engine Test Vectors
Resident in flash memory
Slide title
minimum 32 pt
(32 pt makes 2 rows
Text and bullet level 1
minimum 24 pt
Bullets level 2-5
minimum 20 pt
!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
ỳ–—‘’‚“”„†‡•…‰‹›⁄€™−≤≥fifl
ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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text in the footer area Deployment of JTAG Based HW Self-test in RBS 6000 | © Gunnar Carlsson, Ericsson | 2011-11-22 | Page 12
Test Data Structure
IR-Scan DR-Scan IR-Scan DR-Scan IR-Scan DR-Scan IR-Scan DR-Scan
L-BIST
IR-Scan DR-Scan IR-Scan DR-Scan IR-Scan DR-Scan IR-Scan DR-Scan
M-BIST
IR-Scan DR-Scan IR-Scan DR-Scan IR-Scan DR-Scan IR-Scan DR-Scan
Interconnect1
Vector files (bin. SVF)
TLR gen_reset 1 P gp_io 2 P gen_reset 3 P Et_run M-BIST
mbist
TLR gen_reset 0 P gen_reset 2 P gp_io 4 P Et_run L-BIST
lbist
TLR
Et_run Interconnect1
interconnect
Test definitions Sequence definitions
interconnect mbist
GONOGO
lbist
mbist
BIST
lbist
In System mode, the
GONOGO sequence is
selected by default.
Individual Sequences,
Tests and Vectors can
be run from the
Command Line Interface
One text file
Slide title
minimum 32 pt
(32 pt makes 2 rows
Text and bullet level 1
minimum 24 pt
Bullets level 2-5
minimum 20 pt
!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
ỳ–—‘’‚“”„†‡•…‰‹›⁄€™−≤≥fifl
ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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text in the footer area Deployment of JTAG Based HW Self-test in RBS 6000 | © Gunnar Carlsson, Ericsson | 2011-11-22 | Page 13
Test Development and Diagnosis
Bscan
development
environment
used today
at Ericsson
SVF Commercial
Development
Platform
Other
Development
Platform SVF
Command
Line
Interface
Traditional
Bscan test
RBS 6000 System
controlled test
Ethernet/RS 232
Baseband Board
Embedded
Scan Engine
5-pin
connector
Board Control SW
Commercial
Diagnostic
Tool
PC SW
Bscan prod. test i/f
Slide title
minimum 32 pt
(32 pt makes 2 rows
Text and bullet level 1
minimum 24 pt
Bullets level 2-5
minimum 20 pt
!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
ỳ–—‘’‚“”„†‡•…‰‹›⁄€™−≤≥fifl
ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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text in the footer area Deployment of JTAG Based HW Self-test in RBS 6000 | © Gunnar Carlsson, Ericsson | 2011-11-22 | Page 14
Conclusion
› An improved HW Test strategy for RBS 6000 has been
introduced, based on Embedded JTAG techniques
› A common Scan Engine is used by all products which are
using the same processing platform
› Product unique test vectors are resident on the HW
› Test development is largely simplified, using traditional
JTAG development platform and methods
› Embedded functional test will be the next step, including
methods to reuse production test routines
› The co-operation with SAAB gave us a jump-start into this
concept
Slide title
minimum 32 pt
(32 pt makes 2 rows
Text and bullet level 1
minimum 24 pt
Bullets level 2-5
minimum 20 pt
!"#$%&'()*+,-./0123456789:;<=>?@ABCDEFGHIJKLMNOPQRSTUVWXYZ[\]^_`abcdefghijklmnopqrstuvwxyz{|}~¡¢£¤¥¦§¨©ª«¬®¯°±²³´¶·¸¹º»¼½ÀÁÂÃÄÅÆÇÈËÌÍÎÏÐÑÒÓÔÕÖ×ØÙÚÛÜÝÞßàáâãäåæçèéêëìíîïðñòóôõö÷øùúûüýþÿĀāĂăąĆćĊċČĎďĐđĒĖėĘęĚěĞğĠġĢģĪīĮįİıĶķĹĺĻļĽľŁłŃńŅņŇňŌŐőŒœŔŕŖŗŘřŚśŞşŠšŢţŤťŪūŮůŰűŲųŴŵŶŷŸŹźŻżŽžƒȘșˆˇ˘˙˚˛˜˝ẀẁẃẄẅỲ
ỳ–—‘’‚“”„†‡•…‰‹›⁄€™−≤≥fifl
ĀĀĂĂĄĄĆĆĊĊČČĎĎĐĐĒĒĖĖĘĘĚĚĞĞĠĠĢĢĪĪĮĮİĶĶ
ĹĹĻĻĽĽŃŃŅŅŇŇŌŌŐŐŔŔŖŖŘŘŚŚŞŞŢŢŤŤŪŪŮŮŰŰŲŲŴŴŶŶŹŹŻŻȘș
ΆΈΉΊΌΎΏΐΑΒΓΕΖΗΘΙΚΛΜΝΞΟΠΡΣΤΥΦΧΨΪΫΆΈΉΊΰαβγδεζηθικλνξορςΣΤΥΦΧΨΩΪΫΌΎΏ
ЁЂЃЄЅІЇЈЉЊЋЌЎЏАБВГДЕЖЗИЙКЛМНОПРСТУФХ
ЦЧШЩЪЫЬЭЮЯАБВГДЕЖЗИЙКЛМНОПРСТУФХЦ
ЧШЩЪЫЬЭЮЯЁЂЃЄЅІЇЈЉЊЋЌЎЏѢѢѲѲѴѴҐҐәǽẀẁẂẃẄẅỲỳ№
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text in the footer area Deployment of JTAG Based HW Self-test in RBS 6000 | © Gunnar Carlsson, Ericsson | 2011-11-22 | Page 15