Date post: | 16-Jan-2016 |
Category: |
Documents |
Upload: | oliver-dickerson |
View: | 213 times |
Download: | 0 times |
Detector Monitoring as Detector Monitoring as part of part of VLT Science and Data Flow VLT Science and Data Flow OperationsOperations
Wolfgang Hummel DMO/DFO/QC groupWolfgang Hummel DMO/DFO/QC groupLander de Bilbao, SDD/pipeline groupLander de Bilbao, SDD/pipeline groupAndrea Modigliani, SDD/pipeline groupAndrea Modigliani, SDD/pipeline groupLars Lundin, SDD/pipeline groupLars Lundin, SDD/pipeline groupPaola Amico, LPO/PSOPaola Amico, LPO/PSOPascal Ballester, SDD Pascal Ballester, SDD coordinating chaircoordinating chairGaspare LoCurto, LPO/PSOGaspare LoCurto, LPO/PSOLeonardo Vanzi, LPO/PSOLeonardo Vanzi, LPO/PSO
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
project purpose project purpose
calibration plan reviewcalibration plan review
methods and algorithm selectionmethods and algorithm selection
quality characteristicsquality characteristics
iterative recipe tests iterative recipe tests
deployment and commissioning deployment and commissioning
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector MonitoringDetector Monitoringoutline of the talkoutline of the talk
Detector MonitoringDetector Monitoringproject purposeproject purpose
There is a unified scheme to monitor There is a unified scheme to monitor optical detectors at the ESO LaSilla optical detectors at the ESO LaSilla observatory observatory
A similar scheme should be implemented A similar scheme should be implemented for the Paranal observatory to improve for the Paranal observatory to improve operations within the VLT dataflow (PSO, operations within the VLT dataflow (PSO, QC group, SDD)QC group, SDD)
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector MonitoringDetector Monitoringproject outlineproject outline
review the operational calibrationreview the operational calibration plans for all plans for all optical optical 1212 science detectors (FORS1,2 UVES, science detectors (FORS1,2 UVES, GIRAFFE, VIMOS) and all GIRAFFE, VIMOS) and all 1111 near and mid IR near and mid IR science detectors (ISAAC, CONICA, SINFONI, science detectors (ISAAC, CONICA, SINFONI, CRIRES, AMBER, MIDI, VISIR) CRIRES, AMBER, MIDI, VISIR) design and implement a design and implement a detector monitoring detector monitoring
planplan, and put it in operation., and put it in operation. review outcome: Amico, P. et al. 2008, ‘The review outcome: Amico, P. et al. 2008, ‘The
Detector Monitoring Project’, in ‘The 2007 ESO Detector Monitoring Project’, in ‘The 2007 ESO Instrument Calibration Workshop’ Instrument Calibration Workshop’
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector MonitoringDetector Monitoringreview outcomereview outcome
priority and frequency of detector related QC parameters: priority and frequency of detector related QC parameters: 1. daily: RON and BIAS/DARK level 1. daily: RON and BIAS/DARK level 2. monthly: gain and linearity2. monthly: gain and linearity 3. other: bad pixels, crosstalk, persistence, 3. other: bad pixels, crosstalk, persistence, periodic noiseperiodic noise, shutter error, , shutter error,
correlatedcorrelated noisenoise, odd-even column effect, large scale fixed pattern noise, , odd-even column effect, large scale fixed pattern noise, low scale fixed patternlow scale fixed pattern noisenoise, , contaminationcontamination
RON, BIAS/DARK is in place with inhomogeneous analysisRON, BIAS/DARK is in place with inhomogeneous analysis gain and linearity incomplete -> highest prioritygain and linearity incomplete -> highest priority start with optical CCDs and near IR, complete for MID IR start with optical CCDs and near IR, complete for MID IR
and interferometric instruments laterand interferometric instruments later
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector MonitoringDetector Monitoringgainlingainlin template designtemplate design
calibration templates must be aligned calibration templates must be aligned with data reduction pipeline recipeswith data reduction pipeline recipes no template change required for UVES no template change required for UVES
(ccd_test), GIRAFFE and SINFONI. (ccd_test), GIRAFFE and SINFONI. template upgrade required for FORS1/2, template upgrade required for FORS1/2,
ISAAC, NACO (flat pairs instead of single ISAAC, NACO (flat pairs instead of single flats and include BIAS frames).flats and include BIAS frames). new template for VIMOS, CRIRESnew template for VIMOS, CRIRES
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
ESO common pipeline library (CPL) ESO common pipeline library (CPL) two versions: optical CCD, near IR two versions: optical CCD, near IR
arraysarrays linearity: polynomial, inverse via linearity: polynomial, inverse via
Newton-Raphson (+ FPN, +opt Newton-Raphson (+ FPN, +opt contamination, +nir bad pixel map), an contamination, +nir bad pixel map), an OPT and a NIR version required.OPT and a NIR version required. gain: photon transfer curve and inter-gain: photon transfer curve and inter-
pixel capacitance correction pixel capacitance correction ron: 4 methods (incl. pre+over scan)ron: 4 methods (incl. pre+over scan) bias (median)bias (median)
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector MonitoringDetector Monitoringtools selectiontools selection
Detector MonitoringDetector Monitoringgainlingainlin recipe tests Irecipe tests I
one recipe tested for all detectors one recipe tested for all detectors on (partially interleaved) frame stacks. on (partially interleaved) frame stacks. a) handle conventional fits frames and multi-a) handle conventional fits frames and multi-
detector frames with fits detector frames with fits extensions extensions (CRIRES, (CRIRES, UVES). UVES). b) configurable b) configurable confinementconfinement of the analysis of the analysis
region to handle vignetting (FORS, NACO, region to handle vignetting (FORS, NACO, CRIRES)CRIRES) c) upper threshold for signal level (saturation, c) upper threshold for signal level (saturation,
non-linearity regime)non-linearity regime) d) flux alignment of consecutive flat pairsd) flux alignment of consecutive flat pairs
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector MonitoringDetector Monitoringrecipe tests IIrecipe tests II
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
FORS2 lower mosaic CCD:- saturation and vignetting- both chips in two single fits frames UVES red arm CCD:
both chips in two extensions of one fits frame
- confined analysis region
- option to handle fits extensions
- upper flux threshold option
Detector MonitoringDetector Monitoringrecipe tests IIIrecipe tests III
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
SINFONI:integral field spectrograph:
No imaging flats possible.Regular pattern of 32 pseudo slits
Persistence does not allowfor flats of exactly the sameflux level
Detector MonitoringDetector Monitoringrecipe tests V: PTCrecipe tests V: PTC
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
Detector MonitoringDetector Monitoringinter-pixel capacitanceinter-pixel capacitance
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
From Finger, G. et al, 2005
Smear-out effect. A lower gain is measured
Detector MonitoringDetector Monitoringinter-pixel capacitanceinter-pixel capacitance
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
-Measuring gain from PTC via flat difference frames-Inter-pixel capacitance: PSF > 1 pixel -> lower noise, higher gain.- use flat difference frames ?? Fixed pattern noise ?? - Autocorrelation algorithm Finger, G. et al. 2005 ‘Conversion gain and inter-pixel capacitance …’
giraffe : 1.0009
crires
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
flux aligned flat difference
flat difference, 2% flux difference
bad autocorrelation inter-pixel capacitance PSF
good autocorrelation inter-pixel capacitance PSF
Detector MonitoringDetector Monitoringrecipe tests IVrecipe tests IV
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
SINFONI:Gain correction: 1.09
Detector MonitoringDetector Monitoringprojectproject statusstatus
SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control
detector calibration plan in operation for GIRAFFE, UVES, and SINFONI
other detectors coming soon: VIMOS, ISAAC
project completion expected for the end of 2008
future science detectors will benefit: HAWK-I (4), VIRCAM/OCAM (16/32 !!!), X-shooter (3), …
last slide