Detector Monitoring as Detector Monitoring as part of part of VLT Science and Data Flow VLT Science and Data Flow OperationsOperations

Wolfgang Hummel DMO/DFO/QC groupWolfgang Hummel DMO/DFO/QC groupLander de Bilbao, SDD/pipeline groupLander de Bilbao, SDD/pipeline groupAndrea Modigliani, SDD/pipeline groupAndrea Modigliani, SDD/pipeline groupLars Lundin, SDD/pipeline groupLars Lundin, SDD/pipeline groupPaola Amico, LPO/PSOPaola Amico, LPO/PSOPascal Ballester, SDD Pascal Ballester, SDD coordinating chaircoordinating chairGaspare LoCurto, LPO/PSOGaspare LoCurto, LPO/PSOLeonardo Vanzi, LPO/PSOLeonardo Vanzi, LPO/PSO

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

project purpose project purpose

calibration plan reviewcalibration plan review

methods and algorithm selectionmethods and algorithm selection

quality characteristicsquality characteristics

iterative recipe tests iterative recipe tests

deployment and commissioning deployment and commissioning

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

Detector MonitoringDetector Monitoringoutline of the talkoutline of the talk

Detector MonitoringDetector Monitoringproject purposeproject purpose

There is a unified scheme to monitor There is a unified scheme to monitor optical detectors at the ESO LaSilla optical detectors at the ESO LaSilla observatory observatory

A similar scheme should be implemented A similar scheme should be implemented for the Paranal observatory to improve for the Paranal observatory to improve operations within the VLT dataflow (PSO, operations within the VLT dataflow (PSO, QC group, SDD)QC group, SDD)

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

Detector MonitoringDetector Monitoringproject outlineproject outline

review the operational calibrationreview the operational calibration plans for all plans for all optical optical 1212 science detectors (FORS1,2 UVES, science detectors (FORS1,2 UVES, GIRAFFE, VIMOS) and all GIRAFFE, VIMOS) and all 1111 near and mid IR near and mid IR science detectors (ISAAC, CONICA, SINFONI, science detectors (ISAAC, CONICA, SINFONI, CRIRES, AMBER, MIDI, VISIR) CRIRES, AMBER, MIDI, VISIR) design and implement a design and implement a detector monitoring detector monitoring

planplan, and put it in operation., and put it in operation. review outcome: Amico, P. et al. 2008, ‘The review outcome: Amico, P. et al. 2008, ‘The

Detector Monitoring Project’, in ‘The 2007 ESO Detector Monitoring Project’, in ‘The 2007 ESO Instrument Calibration Workshop’ Instrument Calibration Workshop’

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

Detector MonitoringDetector Monitoringreview outcomereview outcome

priority and frequency of detector related QC parameters: priority and frequency of detector related QC parameters: 1. daily: RON and BIAS/DARK level 1. daily: RON and BIAS/DARK level 2. monthly: gain and linearity2. monthly: gain and linearity 3. other: bad pixels, crosstalk, persistence, 3. other: bad pixels, crosstalk, persistence, periodic noiseperiodic noise, shutter error, , shutter error,

correlatedcorrelated noisenoise, odd-even column effect, large scale fixed pattern noise, , odd-even column effect, large scale fixed pattern noise, low scale fixed patternlow scale fixed pattern noisenoise, , contaminationcontamination

RON, BIAS/DARK is in place with inhomogeneous analysisRON, BIAS/DARK is in place with inhomogeneous analysis gain and linearity incomplete -> highest prioritygain and linearity incomplete -> highest priority start with optical CCDs and near IR, complete for MID IR start with optical CCDs and near IR, complete for MID IR

and interferometric instruments laterand interferometric instruments later

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

Detector MonitoringDetector Monitoringgainlingainlin template designtemplate design

calibration templates must be aligned calibration templates must be aligned with data reduction pipeline recipeswith data reduction pipeline recipes no template change required for UVES no template change required for UVES

(ccd_test), GIRAFFE and SINFONI. (ccd_test), GIRAFFE and SINFONI. template upgrade required for FORS1/2, template upgrade required for FORS1/2,

ISAAC, NACO (flat pairs instead of single ISAAC, NACO (flat pairs instead of single flats and include BIAS frames).flats and include BIAS frames). new template for VIMOS, CRIRESnew template for VIMOS, CRIRES

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

ESO common pipeline library (CPL) ESO common pipeline library (CPL) two versions: optical CCD, near IR two versions: optical CCD, near IR

arraysarrays linearity: polynomial, inverse via linearity: polynomial, inverse via

Newton-Raphson (+ FPN, +opt Newton-Raphson (+ FPN, +opt contamination, +nir bad pixel map), an contamination, +nir bad pixel map), an OPT and a NIR version required.OPT and a NIR version required. gain: photon transfer curve and inter-gain: photon transfer curve and inter-

pixel capacitance correction pixel capacitance correction ron: 4 methods (incl. pre+over scan)ron: 4 methods (incl. pre+over scan) bias (median)bias (median)

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

Detector MonitoringDetector Monitoringtools selectiontools selection

Detector MonitoringDetector Monitoringgainlingainlin recipe tests Irecipe tests I

one recipe tested for all detectors one recipe tested for all detectors on (partially interleaved) frame stacks. on (partially interleaved) frame stacks. a) handle conventional fits frames and multi-a) handle conventional fits frames and multi-

detector frames with fits detector frames with fits extensions extensions (CRIRES, (CRIRES, UVES). UVES). b) configurable b) configurable confinementconfinement of the analysis of the analysis

region to handle vignetting (FORS, NACO, region to handle vignetting (FORS, NACO, CRIRES)CRIRES) c) upper threshold for signal level (saturation, c) upper threshold for signal level (saturation,

non-linearity regime)non-linearity regime) d) flux alignment of consecutive flat pairsd) flux alignment of consecutive flat pairs

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

Detector MonitoringDetector Monitoringrecipe tests IIrecipe tests II

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

FORS2 lower mosaic CCD:- saturation and vignetting- both chips in two single fits frames UVES red arm CCD:

both chips in two extensions of one fits frame

- confined analysis region

- option to handle fits extensions

- upper flux threshold option

Detector MonitoringDetector Monitoringrecipe tests IIIrecipe tests III

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

SINFONI:integral field spectrograph:

No imaging flats possible.Regular pattern of 32 pseudo slits

Persistence does not allowfor flats of exactly the sameflux level

Detector MonitoringDetector Monitoringrecipe tests V: PTCrecipe tests V: PTC

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

Detector MonitoringDetector Monitoringinter-pixel capacitanceinter-pixel capacitance

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

From Finger, G. et al, 2005

Smear-out effect. A lower gain is measured

Detector MonitoringDetector Monitoringinter-pixel capacitanceinter-pixel capacitance

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

-Measuring gain from PTC via flat difference frames-Inter-pixel capacitance: PSF > 1 pixel -> lower noise, higher gain.- use flat difference frames ?? Fixed pattern noise ?? - Autocorrelation algorithm Finger, G. et al. 2005 ‘Conversion gain and inter-pixel capacitance …’

giraffe : 1.0009

crires

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

flux aligned flat difference

flat difference, 2% flux difference

bad autocorrelation inter-pixel capacitance PSF

good autocorrelation inter-pixel capacitance PSF

Detector MonitoringDetector Monitoringrecipe tests IVrecipe tests IV

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

SINFONI:Gain correction: 1.09

Detector MonitoringDetector Monitoringprojectproject statusstatus

SPIE Astronomical Instrumentation 2008, Observatory Operations: Strategies, Processes and Systems, Conference 7016, Session 3: Data Management and Quality Control

detector calibration plan in operation for GIRAFFE, UVES, and SINFONI

other detectors coming soon: VIMOS, ISAAC

project completion expected for the end of 2008

future science detectors will benefit: HAWK-I (4), VIRCAM/OCAM (16/32 !!!), X-shooter (3), …

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