EE141Microelettronica
Microelettronica
J. M. Rabaey,
"Digital integrated circuits: a
design perspective"
EE141Microelettronica
EE141Microelettronica
Introduction
Why is designing digital ICs different
today than it was before?
Will it change in future?
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The First Computer
The BabbageDifference Engine(1832)
25,000 parts
cost: £17,470
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ENIAC - The first electronic computer (1946)
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The Transistor Revolution
First transistor
Bell Labs, 1948
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The First Integrated Circuits
Bipolar logic
1960’s
ECL 3-input Gate
Motorola 1966
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Intel 4004 Micro-Processor
1971
1000 transistors
1 MHz operation
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Intel Pentium (IV) microprocessor
2000
42 M transistors
1.7 GHz clock-rate
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Intel Core I7 Nehalem quad-core
10
2010
1.2 B transistors
(45 nm)
3.2 GHz
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Moore’s Law
In 1965, Gordon Moore noted that the
number of transistors on a chip doubled
every 18 to 24 months.
He made a prediction that
semiconductor technology will double its
effectiveness every 18 months
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Moore’s Law
16
15
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10
9
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4
3
2
1
0
19
59
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LO
G2 O
F T
HE
NU
MB
ER
OF
CO
MP
ON
EN
TS
PE
R I
NT
EG
RA
TE
D F
UN
CT
ION
Electronics, April 19, 1965.
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Trends in logic IC Complexity
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Trends in Memory Complexity
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Moore’s law in Microprocessors
(data from Intel)
Transistors on Lead Microprocessors double every 2 years
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Moore’s Law
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Die Size Growth
40048008
80808085
8086286
386486 Pentium ® proc
P6
1
10
100
1970 1980 1990 2000 2010
Year
Die
siz
e (
mm
)
~7% growth per year
~2X growth in 10 years
Die size grows by 14% to satisfy Moore’s Law
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Power dissipation
Lead Microprocessors power continues to increase
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Power density too high to keep junctions at low temp
Power density
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Trends in high-performance computing
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Moore’s Law
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Why Scaling?
Technology shrinks by 0.7/generation
With every generation can integrate 2x more functions per chip; chip cost does not increase significantly
Cost of a function decreases by 2x
But … How to design chips with more and more functions?
Design engineering population does not double every two years…
Hence, a need for more efficient design methods Exploit different levels of abstraction
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Design Abstraction Levels
n+n+
S
GD
+
DEVICE
CIRCUIT
GATE
MODULE
SYSTEM
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Design Metrics
How to evaluate performance of a digital circuit (gate, block, …)?
Cost
Reliability
Scalability
Speed (delay, operating frequency)
Power dissipation
Energy to perform a function
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Cost of Integrated Circuits
NRE (non-recurrent engineering) costs
design time and effort, mask generation
one-time cost factor
Recurrent costs
silicon processing, packaging, test
proportional to volume
proportional to chip area
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NRE Cost is Increasing
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Cost per Transistor
0.0000001
0.000001
0.00001
0.0001
0.001
0.01
0.1
1
1982 1985 1988 1991 1994 1997 2000 2003 2006 2009 2012
cost: ¢-per-transistor
Fabrication capital cost per transistor (Moore’s law)
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Die Cost
Single die
Wafer
Going up to 12” (30cm)
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Yield
%100per wafer chips ofnumber Total
per wafer chips good of No.Y
yield Dieper wafer Dies
costWafer cost Die
area die2
diameterwafer
area die
diameter/2wafer per wafer Dies
2
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Defects
area dieareaunit per defects1yield die
is approximately 3
4area) (die cost die f
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Reliability―
Noise in Digital Integrated Circuits
i(t)
Inductive coupling Capacitive coupling Power and groundnoise
v(t) VDD