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● Compliant with IEC 62132-4 (DPI method).

● Automatic judgment of IC performance criteria conforming to IEC 62132-1 (Class A/C/D1/D2//E) .

● Enables IC malfunction judgment with flexible combination up to ten judgment conditions (eight types of automatic measuring judgments + one

mask test judgment + one serial decode judgment).

● Applicable to power ON/OFF by multiple DC power source control to reset IC when a malfunction occurs.

● Enables voltage value and reset time setting in accordance with EUT (IC)

● Reduces the test time greatly with the multi-sweep function.

● Capable of both TEM-Cell method (IEC 62132-2) and IC Stripline method (IEC 62132-8) testing.

※ DPI：Direct Power Injection

Item Specifications (example)

Measurement frequency range 150 kHz to 1000 MHz

Test level 10 dBm to 37 dBm

Modulation method AM 1kHz ・ 80%

The DPI immunity test method is an immunity evaluation method for semiconductors (IC) standardized by IEC standards.This test evaluates immunity by directly injecting RF interference power into the IC power supply on the test board on which the IC to be evaluated is mounted.In the test, it is necessary to gradually increase the test level (power) for each test frequency and check the performance of the IC each time.In addition, when a malfunction occurs, it is necessary to record the status of the malfunction, which takes a lot of time and eff ort.The NoiseKen's DPI immunity test system performs tests from the start of the test to malfunction determination consistently. This is a revolutionary automation system that saves test time and testers' hands.

DPI Immunity Testing System

There are a total of Twenty five items that can display in the result data. (frequency, test level, traveling wave power, reflected power, effective power, keyboard, comments, power reflection coefficient, voltage reflection coefficient, standing wave ratio, load impedance (L), load impedance (H), effective voltage (L), effective voltage (H), fail mode, automatic measurement judgment (eight types), mask test judgment, serial decode judgment)

Setting Items for Automatic JudgmentItem Description

Judgment Select whether to use.

Type Up to eight types of automatic measuring judgment designation

(A to H) among total of thirty six types measured values.

(p-p, max, min, amplitude, period, frequency, duty cycle, rise

time, fall time, phase, etc. [total thirty six types])

Source Select a source channel. (CH1, CH2, CH3, CH4)

Judgment

method

Select the judgment method.

(a + b / -c, a + d% /-e%)

Reference

value (a) Enter a value to be used as a criterion.

Upper limit

value (b, d) Enter the upper limit value.

Lower limit

value(c, e) Enter the lower limit.

Signal Generator

Power meter

Digital I/O

DC Power Source (power supply and power reset)

4 ch Max.4 units Max.

Oscilloscope (Malfunction judgment)

IC reset signal

Test Board (EUT)Power AMP

Directional couplerDirectional coupler

PC (System control software)

Enables IC malfunction judgment w i t h u p t o t e n j u d g m e n t condit ions (eight automatic measurement judgments + one mask test judgment + one serial decode judgment)

E M C T E S T S S Y S T E M S C A T A L O G U E

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DPI Immunity Testing System

● International Sales & Marketing SectionTEL : +81-(0)42-712-2051/FAX : +81-(0)42-712-2050

E-mail : sales@noiseken.com

URL : http://www.noiseken.com

1-4-4 Chiyoda, Chuo-ku, Sagamihara City, Kanagawa Pref. 252-0237 Japan

* Designs, appearances and specifications on the products are subject change without notice.* Designs, appearances and specifications on the products are subject change without notice.

30dBm 32.5dBm 35dBm20dBm 30dBm10dBm 37dBm

Malfunction judgmentOK

Malfunction judgmentOK

Malfunction judgmentOK

Malfunction judgmentOK

Malfunction judgmentOK

Malfunction judgmentNG

Malfunction judgmentNG

To check the accuracy of the

malfunction judgment level,

return the check point to the

OK level in step 1 and conduct

a detailed investigation.

OK level in step 1

is 30 dBm.

Level recording

(32.5 dBm)

STEP1(For 10 dB setting)

STEP2 (For 0.25 db setting)

Malfunction check points Malfunction check points

NG occurs between

32.5 dBm and 35 dBm.

NG occurs between

30 dBm and 37 dBm.

Next frequency

Tests are done every 10 dBto confirm general NG points.Tests are done every 10 dB

to confirm general NG points.

Tests are done every 0.25 dB to determine the test level

of the NG point

Tests are done every 0.25 dB to determine the test level

of the NG point

40

35

30

25

20

15

10

40

35

30

25

20

15

10

Judgment based on IEC 62132-1IC performance

criteria

Judgment based on IEC 62132-1IC performance

criteria

【Power reset processing】

【IC reset processing】

SG output OFF time hold

Did the boardreturn to normal

states?

Did the boardreturn to normal

states?

Did the boardreturn to normal

states?

Judged as "Class A"

Judged as "Class C"

Judged as "Class D1"

Judged as "Class D2"

Judged as "Class E"

YES

YES

YES

NO

NO

NO

IC malfunction?

Test Ended

Test Ended

Test Start

Frequency = Start Frequency

Testend level?

Test Level = Start Level

Increase power, Maintain target level

YES

YES

YES

NO

NO

NO

Increased frequency

Test endfrequency?

■ IEC 62132-4 Automatic Measurement Flowchart

■ The Multi-Sweep Function

This product has a function called "multi-sweep mode" to reduce measurement time. When the multi-sweep mode is set to 3 steps, measurement is repeated up to 3 times at 1 frequency. However, if there is no malfunction up to the test end level, it will proceed to the next frequency without repeating. By setting a large step value in step 1 (1st step), a small step value in step 2 (2nd step), and a smaller step value in step 3 (3rd step), this saves time compared to measuring from the start level to the end level with a fi xed step value. The fi gure on the right shows the image of operation when the multi-sweep mode is set to 2 steps. (outline) If a malfunction occurs in step 1, go to step 2 after judging the malfunction class. The start level of step 2 is the same as the test level of the previous OK judgment. If a malfunction occurs in step 2, the malfunction class is judged and then switches to the next frequency.

This system can automatically perform all measurements from the start of the test to the malfunction judgment.* "Class B" judgment not applicable.