Sum

mar

y of

ISM

TII’2

005

Jane

Jia

ng

Cen

tre fo

r Pre

cisi

on T

echn

olog

ies

Uni

vers

ity o

f Hud

ders

field

IMS

TII’2

007,

24-

27 S

epte

mbe

r, S

enda

i, Ja

pan

ISM

TII’2

005

Con

fere

nce

Inte

rnat

iona

l Com

mitt

eeC

hair

Dr.

Seto

n B

enne

tt(N

atio

nal P

hysi

cal L

abor

ator

y, U

K)

Pro

f. Zh

u Li

(Hua

zhon

gU

nive

rsity

of S

cien

ce a

nd T

echn

olog

y, C

hina

)P

rof.

Mau

rice

Cox

(Nat

iona

l Phy

sica

l Lab

orat

ory,

UK

)D

r. X

ianp

ing

Liu

(The

Uni

vers

ity o

f War

wic

k, U

K)

Pro

f. V

olke

r Han

s (U

nive

rsity

of D

uisb

urg-

Ess

en, G

erm

any)

Pro

f. B

engt

-Gor

anR

osen

(Hal

mst

adU

nive

rsity

, Sw

eden

)P

rof.

Rys

zard

Jabl

onsk

i(W

arsa

w U

nive

rsity

of T

echn

olog

y, P

olan

d)D

r. S

arw

atZa

hwi(

Nat

iona

l Ins

titut

e fo

r Sta

ndar

ds, E

gypt

)P

rof.

Yur

i Chu

gui(

Tech

nolo

gica

l Des

ign

Inst

itute

of S

cien

tific

In

stru

men

t Eng

inee

ring,

Rus

sia)

Mr.

Jim

Bry

an (U

SA

)P

rof.

Chu

nyon

gY

in (T

sing

hua

Uni

vers

ity, C

hina

)

Inte

rnat

iona

l Sci

entif

ic C

omm

ittee

Cha

ir Pr

of. D

avid

J. W

hite

hous

e(U

nive

rsity

of

War

wic

k, U

K)

Dr.

Ric

hard

Lea

ch (N

atio

nal P

hysi

cal

Labo

rato

ry, U

K)Pr

of. A

lber

t Wec

kenm

ann

(Frie

dric

h-Al

exan

der

Uni

vers

ity-E

rlang

en –

Nur

embe

rg, G

erm

any)

Pro

f. D

erek

Che

twyn

d(U

nive

rsity

of W

arw

ick,

UK

)D

r. M

icha

el K

ryst

ek(P

hysi

kalis

ch-T

echn

isch

eB

unde

sans

talt,

Ger

man

y)D

r. C

hang

Hsu

(Cen

tre fo

r Mea

sure

men

tS

tand

ards

, Tai

wan

, Chi

na)

Dr.

Trev

or E

swar

d(N

atio

nal P

hysi

cal

Labo

rato

ry, U

K)P

rof.

Jiub

inTa

n(H

arbi

n In

stitu

te o

f Tec

hnol

ogy,

Chi

na)

Prof

. Kua

ngch

aoFa

n (N

atio

nal T

aiw

anU

nive

rsity

, Tai

wan

, Chi

na)

Dr.

Tom

izo

Kur

osaw

a (N

atio

nal M

etro

logy

Inst

itute

, Jap

an)

Dr.

Vict

or B

ykov

(Nan

otec

hnol

ogy

MD

T an

dN

anot

echn

olog

y In

stru

men

ts C

o., R

ussi

a)D

r. G

eorg

e J.

Ste

in (S

lova

k A

cade

my

ofS

cien

ces,

Slo

vak)

Pro

f. Ja

y R

aja

(Uni

vers

ity o

f Nor

th C

arol

ina

atC

harlo

tte, U

SA

)P

rof.

Don

Luc

co(O

klah

oma

Sta

te U

nive

rsity

,U

SA

)P

rof.

Yet

aiFe

i(H

efei

Uni

vers

ity o

f Tec

hnol

ogy,

Chi

na)

Pro

f. Y

ongs

heng

Gao

(Hon

g K

ong

Uni

vers

ity o

fS

cien

ce a

nd T

echn

olog

y, C

hina

)D

r. W

ei G

ao(T

ohok

u U

nive

rsity

, Jap

an)

Dr.

Han

Hai

tjem

a(M

ituto

yoR

esea

rch

Cen

treEu

rope

B.V

., Th

e N

ethe

rland

s)Pr

of. P

. Osa

nna

(Vie

nna

Uni

vers

ity o

fTe

chno

logy

, Aus

tria)

Pro

f. I.

Dud

as(U

nive

rsity

of M

isko

lc, H

unga

ry)

Dr.

G. V

arga

(Uni

vers

ity o

f Mis

kolc

, Hun

gary

)P

rof.

M. N

uman

Dur

akba

sa(V

ienn

a U

nive

rsity

of T

echn

olog

y, A

ustri

a)

Atte

ndan

ces

Mor

e th

an 2

00de

lega

tes

atte

nded

the

conf

eren

ce fr

om e

ight

een

coun

tries

, US

A,

Ger

man

y, N

ethe

rland

s, R

ussi

a, U

nite

d K

ingd

om, I

taly

, Fra

nce,

Aus

tria,

Aus

tralia

n,

Sw

eden

, Pol

and,

Dem

ark,

Jap

an, B

razi

l, Jo

rdan

, Ind

ia, E

gypt

, Chi

na (i

nclu

ding

Hon

g K

ong

and

Taiw

an).

Life

Lec

ture

s

Pro

f. D

avid

Whi

teho

use

Dr.

Erw

in L

oew

en

Mr.

Jim

Bry

an

Ple

nary

Lec

ture

sP

lena

ry L

ectu

re 1

Sta

te-o

f-the

-Art

and

Tren

ds in

the

Dev

elop

men

t of

Inte

llige

nt M

icro

Sen

sor S

yste

ms

Pro

f. D

r. P

eter

R. H

aupt

man

nIn

stitu

te o

f Mic

ro a

nd S

enso

r Sys

tem

s, O

tto-v

on-G

ueric

ke-

Uni

vers

ity M

agde

burg

, Ger

man

y

Ple

nary

Lec

ture

2P

reci

sion

Inte

rfero

met

ric M

etro

logy

Dr.

Chr

is J

. Eva

nsZy

goC

orpo

ratio

n, U

SA

Six

Key

note

Pap

ers

Key

note

1:R

ecen

t adv

ance

s in

trac

eabl

e na

nosc

ale

dim

ensi

on a

nd fo

rce

met

rolo

gy in

the

UK

K

eyno

te 2

:Mea

sure

men

t unc

erta

inty

and

trac

eabi

lity

Key

note

3:P

robi

ng s

yste

ms

for d

imen

sion

al m

icro

and

na

nom

etro

logy

Key

note

4:D

evel

opm

ent o

f a n

ovel

mic

ro-c

mm

for 3

D

mic

ro/n

ano

mea

sure

men

tsK

eyno

te 5

:New

con

cept

s in

spe

cific

atio

ns, o

pera

tors

an

d un

certa

intie

s an

d th

eir i

mpa

ct o

n m

easu

rem

ent a

nd in

stru

men

tatio

nK

eyno

te 6

:Pat

tern

ana

lysi

s an

d m

etro

logy

Pub

licat

ions

23 M

ST P

aper

s10

5 JP

CS

Pape

rs

A L

arge

Indu

stria

l Exh

ibiti

onTh

e fif

teen

com

pani

es, i

nclu

ded

inst

rum

enta

tion,

met

rolo

gy a

nd p

reci

sion

E

ngin

eerin

g co

mpa

nies

from

UK

(R

enis

haw

plc,

Lam

bda

Pho

tom

etric

sLt

d,

Tayl

or H

obso

n Lt

d, Y

orks

hire

For

war

d,

Inte

rfero

met

Ltd,

Sal

artro

nm

etro

logy

Ltd

, ZE

EK

O L

td),

Eur

ope

(IBS

Pre

cisi

on

Eng

inee

ring,

Que

esga

teIn

stru

men

ts),

and

US

A (Z

ygo

Ltd.

) etc

..

Ang

lo-C

hine

se B

ilate

ral E

xcha

nge

Pro

gram

me

on N

anom

etro

logy

Sum

mar

y of

ISM

TII’2

005

Than

k Yo

u

Cen

tre fo

r Pre

cisi

on T

echn

olog

ies

Uni

vers

ity o

f Hud

ders

field

IMS

TII’2

007,

24-

27 S

epte

mbe

r, S

enda

i, Ja

pan

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