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CSE477 L01 Introduction.1 Irwin&Vijay, PSU, 2002 ECE484 VLSI Digital Circuits Fall 2017 Lecture 01: Introduction Adapted from slides provided by Mary Jane Irwin. [Adapted from Rabaey’s Digital Integrated Circuits, ©2002, J. Rabaey et al.]
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CSE477 L01 Introduction.1 Irwin&Vijay, PSU, 2002

ECE484 VLSI Digital Circuits

Fall 2017

Lecture 01: Introduction

Adapted from slides provided by Mary Jane Irwin.

[Adapted from Rabaey’s Digital Integrated Circuits, ©2002, J. Rabaey et al.]

CSE477 L01 Introduction.2 Irwin&Vijay, PSU, 2002

Course Contents

Introduction to digital integrated circuits

CMOS devices and manufacturing technology. CMOS logic gates and their layout. Propagation delay, noise margins, and power dissipation. Combinational (e.g., arithmetic) and sequential circuit design.

Course goals

Ability to design and implement CMOS digital circuits and optimize them with respect to different constraints: size (cost), speed, power dissipation, and reliability

Course prerequisites

ECE 326. Electronic Circuit Design

ECE 282. Logic Design of Digital Systems

CSE477 L01 Introduction.3 Irwin&Vijay, PSU, 2002

Course Administration

Instructor: George L. Engel [email protected] www.ee.siue.edu/~gengel

TA: Sri Kandula [email protected]

Labs: Need university account.

CSE477 L01 Introduction.4 Irwin&Vijay, PSU, 2002

Background from ECE282 and ECE326

Basic circuit theory

resistance, capacitance, inductance

MOS gate characteristics

Hardware description language

VHDL or verilog

Logic design

logical minimization, FSMs, component design

CSE477 L01 Introduction.5 Irwin&Vijay, PSU, 2002

Transistor Revolution

Transistor –Bardeen (Bell Labs) in 1947

Bipolar transistor – Schockley in 1949

First bipolar digital logic gate – Harris in 1956

First monolithic IC – Jack Kilby in 1959

First commercial IC logic gates – Fairchild 1960

TTL – 1962 into the 1990’s

ECL – 1974 into the 1980’s

CSE477 L01 Introduction.6 Irwin&Vijay, PSU, 2002

MOSFET Technology

MOSFET transistor - Lilienfeld (Canada) in 1925 and Heil (England) in 1935

CMOS – 1960’s, but plagued with manufacturing problems

PMOS in 1960’s (calculators)

NMOS in 1970’s (4004, 8080) – for speed

CMOS in 1980’s – preferred MOSFET technology because of power benefits

BiCMOS, Gallium-Arsenide, Silicon-Germanium

SOI, Copper-Low K, …

CSE477 L01 Introduction.7 Irwin&Vijay, PSU, 2002

Moore’s Law

In 1965, Gordon Moore predicted that the number of transistors that can be integrated on a die would double every 18 to 14 months (i.e., grow exponentially with time).

Amazingly visionary – million transistor/chip barrier was crossed in the 1980’s.

2300 transistors, 1 MHz clock (Intel 4004) - 1971

16 Million transistors (Ultra Sparc III)

42 Million, 2 GHz clock (Intel P4) - 2001

140 Million transistor (HP PA-8500)

CSE477 L01 Introduction.8 Irwin&Vijay, PSU, 2002

Intel 4004 Microprocessor

CSE477 L01 Introduction.9 Irwin&Vijay, PSU, 2002

Intel Pentium (IV) Microprocessor

CSE477 L01 Introduction.10 Irwin&Vijay, PSU, 2002

State-of-the Art: Lead Microprocessors

CSE477 L01 Introduction.11 Irwin&Vijay, PSU, 2002

Moore’s Law in Microprocessors

4004 8008

8080 8085 8086

286 386

486 Pentium® proc

P6

0.001

0.01

0.1

1

10

100

1000

1970 1980 1990 2000 2010

Year

Tra

nsis

tors

(M

T)

2X growth in 1.96 years!

Transistors on lead microprocessors double every 2 years

Courtesy, Intel

CSE477 L01 Introduction.12 Irwin&Vijay, PSU, 2002

64

256

1,000

4,000

16,000

64,000

256,000

1,000,000

4,000,000

16,000,000

64,000,000

10

100

1000

10000

100000

1000000

10000000

100000000

1980 1983 1986 1989 1992 1995 1998 2001 2004 2007 2010

Year

Kb

it c

ap

acit

y/c

hip

Evolution in DRAM Chip Capacity

1.6-2.4 m

1.0-1.2 m

0.7-0.8 m

0.5-0.6 m

0.35-0.4 m

0.18-0.25 m

0.13 m

0.1 m

0.07 m

human memory

human DNA

encyclopedia

2 hrs CD audio

30 sec HDTV

book

page

4X growth every 3 years!

CSE477 L01 Introduction.13 Irwin&Vijay, PSU, 2002

Die Size Growth

4004 8008

8080 8085

8086 286

386 486 Pentium ® proc

P6

1

10

100

1970 1980 1990 2000 2010

Year

Die

siz

e (

mm

)

~7% growth per year

~2X growth in 10 years

Die size grows by 14% to satisfy Moore’s Law

Courtesy, Intel

CSE477 L01 Introduction.14 Irwin&Vijay, PSU, 2002

Clock Frequency

Lead microprocessors frequency doubles every 2 years

P6

Pentium ® proc 486

386 286 8086 8085

8080

8008 4004

0.1

1

10

100

1000

10000

1970 1980 1990 2000 2010

Year

Fre

qu

en

cy (

Mh

z)

2X every 2 years

Courtesy, Intel

CSE477 L01 Introduction.15 Irwin&Vijay, PSU, 2002

Power Dissipation

P6 Pentium ® proc

486

386 286 8086

8085 8080

8008 4004

0.1

1

10

100

1971 1974 1978 1985 1992 2000 Year

Po

wer

(Watt

s)

Lead Microprocessors power continues to increase

Courtesy, Intel

Power delivery and dissipation will be prohibitive

CSE477 L01 Introduction.16 Irwin&Vijay, PSU, 2002

Power Density

4004 8008

8080

8085

8086

286 386

486 Pentium® proc

P6

1

10

100

1000

10000

1970 1980 1990 2000 2010

Year

Po

wer

Den

sit

y (

W/c

m2)

Hot Plate

Nuclear

Reactor

Rocket

Nozzle

Power density too high to keep junctions at low temp

Courtesy, Intel

CSE477 L01 Introduction.17 Irwin&Vijay, PSU, 2002

Design Productivity Trends

2003

19

81

19

83

1985

1987

1989

1991

1993

1995

1997

1999

2001

2005

2007

20

09

Logic Tr./Chip

Tr./Staff Month.

x x x

x x x

x

21%/Yr. compound Productivity growth rate

x

58%/Yr. compounded Complexity growth rate

10,000

1,000

100

10

1

0.1

0.01

0.001

Lo

gic

Tra

ns

isto

r p

er

Ch

ip (M

)

0.01

0.1

1

10

100

1,000

10,000

100,000

Pro

du

cti

vit

y

(K)

Tra

ns

./S

taff

- M

o.

Co

mp

lex

ity

Courtesy, ITRS Roadmap

Complexity outpaces design productivity

CSE477 L01 Introduction.18 Irwin&Vijay, PSU, 2002

Technology Directions: SIA Roadmap

Year 1999 2002 2005 2008 2011 2014

Feature size (nm) 180 130 100 70 50 35

Mtrans/cm2 7 14-26 47 115 284 701

Chip size (mm2) 170 170-214 235 269 308 354

Signal pins/chip 768 1024 1024 1280 1408 1472

Clock rate (MHz) 600 800 1100 1400 1800 2200

Wiring levels 6-7 7-8 8-9 9 9-10 10

Power supply (V) 1.8 1.5 1.2 0.9 0.6 0.6

High-perf power (W) 90 130 160 170 174 183

Battery power (W) 1.4 2.0 2.4 2.0 2.2 2.4

For Cost-Performance MPU (L1 on-chip SRAM cache; 32KB/1999

doubling every two years)

http://www.itrs.net/ntrs/publntrs.nsf

CSE477 L01 Introduction.19 Irwin&Vijay, PSU, 2002

Why Scaling?

Technology shrinks by ~0.7 per generation

With every generation can integrate 2x more functions on a chip; chip cost does not increase significantly

Cost of a function decreases by 2x

But …

How to design chips with more and more functions?

Design engineering population does not double every two years…

Hence, a need for more efficient design methods

Exploit different levels of abstraction

CSE477 L01 Introduction.20 Irwin&Vijay, PSU, 2002

Design Abstraction Levels

SYSTEM

GATE

CIRCUIT

Vout Vin

CIRCUIT

Vout Vin

MODULE

+

DEVICE

n+

S D

n+

G

CSE477 L01 Introduction.21 Irwin&Vijay, PSU, 2002

Major Design Challenges

Microscopic issues

ultra-high speeds

power dissipation and supply rail drop

growing importance of interconnect

noise, crosstalk

reliability, manufacturability

clock distribution

Macroscopic issues

time-to-market

design complexity (millions of gates)

high levels of abstractions

reuse and IP, portability

systems on a chip (SoC)

tool interoperability

Year Tech. Complexity Frequency 3 Yr. Design Staff Size

Staff Costs

1997 0.35 13 M Tr. 400 MHz 210 $90 M

1998 0.25 20 M Tr. 500 MHz 270 $120 M

1999 0.18 32 M Tr. 600 MHz 360 $160 M

2002 0.13 130 M Tr. 800 MHz 800 $360 M


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