Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corro-sion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical filters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semi-conductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identification • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identificaiton • Geological • Meteorites • Phase boundaries • Mineral identification • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Ce-ment • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analy-sis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identification • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis • Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical filters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • De-fect Analysis • Contaminant Identification • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contami-nation • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Metals/alloys • Soils • Stones • Gun Shot Residue • Material identificaiton • Geological • Meteorites • Phase boundaries • Mineral identification • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Individual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Min-eral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identi-fication • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical filters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applications • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconduc-tor • Electronic Components • Defect Analysis • Contaminant Identification • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consum-er Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science • Glass Chips • Paint Cross Sections • Met-als/alloys • Soils • Stones • Gun Shot Residue • Material identificaiton • Geological • Meteorites • Phase boundar-ies • Mineral identification • Mining test cores • Marine Sediments • Lake Sediment Cores • Rock Structure • Indi-vidual Particles • Mining Exploration • Metals and Alloys • Glasses • Concrete • Cement • Minerals • Additives in Plastics • Inorganics • Semiconductors • Medicine • Biology • Bones • Tissue • Leaves • Plants • Pharmaceuticals • Implants • Medical Wear Debris • Mineral Deposits • Stones • Particle Analysis • Wear Debris • Engine • Brakes • Pharmaceuticals • Contaminant identification • Raw Material Composition • QC/QA • Wear and Failure Analysis • Quantitative Composition Analysis • Automated Multi-Particle Analysis • Imaging for Particle Shape • Corrosion Analysis •Archeology • Museums • Artifacts • Currency • Metals • Alloys • Gemstones • Paints • Inks • Pigments • Corrosion Products • Coastings Analysis • Microelectronics Packaging • Bonding Pads • Biomedical Devices/Implants • Solar cells • Optical filters • Photovoltaics • Anti-corrosion coatings • Wear resistance • RoHS applica-tions • Semiconductors • Contamination • Electronics • Engine wear debris • Food/beverage • Manufacturing • Pathology • Pharmaceuticals • Semiconductor • Electronic Components • Defect Analysis • Contaminant Identifi-cation • RoHS • WEEE • ELV Compliance • Solder Voids • X-ray Imaging of PCBs • Ion Migration • Environmental Analysis • Lead Contamination in Consumer Goods • Packaging • Soil Contamination • Material Characterization for Recycling • MarineSediments • Ocean Sediments • Airborne Particles • Air Filters • Slurry • Forensic Science •

EDXMICROANALYSIS

X-RAY MICROANALYSIS SYSTEMS

OVER THE PAST TWO DECADES, IXRF HAS PROVEN ITSELF AS A LEADER IN X-RAY MICROANALYSIS.IXRF offers an all-inclusive high-end software suite featuring a myriad of spectra,

mapping, imaging, and advanced automation analysis tools. IXRF couples only premium quality detectors with every system and offers industry leading features,

in addition, to unique features no other EDS systems can offer. IXRF offers free software upgrades for the life of the system, so the analyst is never out of date.

HARDWAREOUR ELECTRONICS ARE OPTIMIZED FOR TRUE “DATA STREAMING”AND ULTRA FAST X-RAY PROCESSING

Sensor Area Window Option ResolutioneV (Mn K/C)

10mm2 Light Element (AP3.3) or 8μm Be ≤123-133

30mm2 Light Element (AP3.3) or 8μm Be ≤126-133

60mm2 Light Element (AP3.3) or 8μm Be ≤126-133

100mm2 Light Element (AP3.3) or 8μm Be ≤128-133

TECHNICAL SPECIFICATIONS

IXRF’s range of electronically cooled (LN2 free) Silicon Drift Detectors are optimized when coupled with an innovative ethernet-based digital pulse processor. IXRF SDDs provide exceptional and stable performance over a wide range of input count rates.

Tabletop SEMDetector

Standard SEMDetector

Large Area SEMDetector

SPECTRA

Identifying Elements

Spectrum Processing

Annotations

Spectrum Overlay

Spectrum Reporting

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Kα Energy Markers help easily identify elemental peaks

Identify elements through cursor ID by selecting individual energy channels.

IDENTIFYING ELEMENTS

SPECTRUM REPORTING - create a simple spreadsheet report of multiple spectra’s quantitative analysis

OVERVIEW

SPECTRUM PROCESSING

• Peak separation using Gaussian deconvolution

• Automatic peak-overlap correction• Automatic escape and sum peak

removal• Automatic Standardless

Quantification using ZAF

Selecting Annotations from the Spectrum toolbar opens a new window that allows the user to measure, label, add text, etc. on the spectrum. These annotations are fully customizable and can be exported with the spectrum.

ANNOTATIONS

SPECTRUM OVERLAY

Spectra can be overlaid to easily compare the relative compositions in samples

IMAGING

Image Acquisition

Analysis Suite (Toolbar)

Morphology

Segmentation

Stitching/Montage

Automated Particle & Multi-point Analysis

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The Direct Acquire tools allow for EDS data to be collected by selecting the region of interest from the SEM image. This includes spot/rectangle/free hand spectra as well as maps and linescans on the image.

IMAGE DIRECT ACQUIRE

OVERVIEW

MORPHOLOGY

Image Segmentation provides a visual representation of different phases in an image.

Based upon histogram analysis, you can see the percent area each phase occupies.

SEGMENTATION

Multipart Acquire allows fully automated spectrum analysis with customized EDS settings and automatically generated spectrum analysis reports.

This includes single point, raster area, and freehand line spectrum acquisition.

MULTIPART ACQUIRE

Image Morphology provides particle information through image binarization. Image binarization transforms the image into grayscale based upon histogram data.

This allows you to label and measure pixels to provide an abundance of morphological data.

Mutielement Quantitative Mapping

Overlay Maps

Map Analysis Suite (Toolbar)

Extract Spectra (Freehand, Spot, Area)

Extract Linescan

DataView (Intensity/Concentration)

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MAPPING

Beam Drift Correction

Maximum Pixel Spectrum

Map stitch & montage

Automate Stage and Beam

Composition Mapping

Phase Analysis

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OVERVIEW

Combine X-Ray Map pixels to extract spectra from a region of interestSPECTRA FROM MAP

Selecting Annotations from the Map toolbar opens a new window that allows the user to measure, label, add text, etc. on the map.

MAP ANNOTATIONS

Selecting Element Intensities from the Map tab will open a new window. A spot/rectangle/freehand can be placed on the image to compare the intensity/concentration.

ELEMENTAL INTENSITIES

MAPPING

Composition mapping allows the user to define what compositions they want to display. These compositions can be standard compounds or customer specific materials.

The maps are then reorganized to display the defined compositions.

COMPOSITION MAPPING

Analyze the element ratios in a region of interest and display a comparison of element weight percent ratios.

RATIO MAPS

Quantitative Maps convert the intensity maps to Concentration (wt%).

This feature can display the quantitative maps as either elemental maps or components maps (ie; oxides).

QUANTITATIVE ELEMENT/COMPONENT MAPS

Selecting Phase Maps from the Map tab automatically identifies phases within a sample and quantitatively analyze the elements within each phase.

The different phases will be graphically displayed in a map alongside phase-specific overlaid spectra to provide a qualitative comparison.

PHASE MAPS

LINESCANS

Mutlielement Linescan Acquisition

Linescan Overlay

DataView (Intensity/Concentration)

MultiScan

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OVERVIEW

10421 Old Manchaca Rd., Suite 620 Austin, TX 78748

Telephone: 512.386.6100www.ixrfsystems.com