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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Chapter 9
Electronic Systems
Reliability
© 2012 John Wiley & Sons, Ltd.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.1 Parameter drift.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.2 Temperature vs. reliability for electronic components.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.3 E&a'(le# of electronic co'(onent#. )a*%eadle## chi( ca(acitor )+* ,-ad at (ack /C (ackae
),FP* )co-rte#y Df "ol-tion#* )c* all rid array )3A* /C(ackae.
)a* )+* )c*
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.4 Fi4e #tacked die 53 a#h 'e'ory )(yra'id#tackin 6ith 6ire +ond interconnect#*. e(rod-ced +y
(er'i##ion of Df "ol-tion#.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.5 Micro-hybrid (Courtesy NationalSemiconductor Corporation).
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9. Typical failure density functions of electronic componentswhen no component burn-in has been carried out.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.! o!ic device protection. "iode "# prevents the input volta!e
from risin! above the power supply volta!e. Capacitor C# absorbs hi!h
fre$uency power supply transients. %eproduced by permission of %eliability
&nalysis Center.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9." Transistor protection. %esistor %# limits the base current 'and capacitor C# absorbs power supply hi!h fre$uency transients.
%eproduced by permission of %eliability &nalysis Center.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.9 Temperaturepower deratin!for transistors and diodes (typical).
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.10 "i!ital circuit noise decouplin!.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.11 Snea* analysis basic patterns (hardware).
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.12 Parameter distributions after selection.
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.1# Transpose circuit (from Spence and Soin (#+,,)).
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Practical Reliability Engineering, Fifth Edition. Patrick D. T. O’Connor and Andre Kleyner.© 2012 John iley ! "on#$ %td.
Figure 9.1$ Monte Carlo analysis of filter circuit (from
Spence and Soin (#+,,)).
