Test Report Number: 3919823EMC01 Rev. 0 Crestron Electronics, Inc. / CENI-GWEXER Page: 1 of 26 Remarks: This report details the results of the testing carried out on one sample, the results contained in this test report do not relate to other samples of the same product. The manufacturer should ensure that all products in series production are in conformity with the product sample detailed in this report. This report may only be reproduced and distributed in full. If the product in this report is used in any configuration other than that detailed in the report, the manufacturer must ensure the new system complies with all relevant standards. Any mention of SGS International Electrical Approvals or Testing done by SGS International Electrical Approvals in connection with distribution or use of the product described in this report must be approved by SGS international Electrical Approvals in writing. EMC Test Report Project Number: 3919823 Report Number: 3919823EMC01 Revision Level: 0 Client: Crestron Electronics, Inc. Equipment Under Test: infiNET EX TM Gateway Model Number: CENI-GWEXER / CEN-GWEXER-PWE Applicable Standards: EN 300 328 v1.9.1 (2015-02) Report issued on: 09 February 2016 Test Result: Compliant Tested by: Jeremy O. Pickens, Senior EMC Engineer Reviewed by: David Schramm, EMC/RF/SAR/HAC Manager
Transcript
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 1 of 26
Remarks: This report details the results of the testing carried out on one sample, the results contained in this test report do not relate to other samples of the same product. The manufacturer should ensure that all products in series production are in conformity with the product sample detailed in this report. This report may only be reproduced and distributed in full. If the product in this report is used in any configuration other than that detailed in the report, the manufacturer must ensure the new system complies with all relevant standards. Any mention of SGS International Electrical Approvals or Testing done by SGS International Electrical Approvals in connection with distribution or use of the product described in this report must be approved by SGS international Electrical Approvals in writing.
EMC Test Report
Project Number: 3919823
Report Number: 3919823EMC01 Revision Level: 0
Client: Crestron Electronics, Inc.
Equipment Under Test: infiNET EXTM Gateway
Model Number: CENI-GWEXER / CEN-GWEXER-PWE
Applicable Standards: EN 300 328 v1.9.1 (2015-02)
Report issued on: 09 February 2016
Test Result: Compliant
Tested by:
Jeremy O. Pickens, Senior EMC Engineer
Reviewed by:
David Schramm, EMC/RF/SAR/HAC Manager
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 2 of 26
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
Member of the SGS Group (SGS SA)
Table of Contents
1 SUMMARY OF TEST RESULTS ..................................................................................................................................... 3
1.1 MODIFICATIONS REQUIRED FOR COMPLIANCE .............................................................................................................. 3
2 GENERAL INFORMATION ............................................................................................................................................. 3
2.1 CLIENT INFORMATION ................................................................................................................................................... 3 2.2 TEST LABORATORY ....................................................................................................................................................... 3 2.3 GENERAL INFORMATION OF EUT .................................................................................................................................. 4 2.4 OPERATING MODES AND CONDITIONS .......................................................................................................................... 4 2.5 RADIATED SYSTEM CONFIGURATION ............................................................................................................................ 4 2.6 EUT CONNECTION BLOCK DIAGRAM CONDUCTED TESTING ........................................................................................ 5 2.7 CONDUCTED SYSTEM CONFIGURATION ......................................................................................................................... 5
3 RF OUTPUT POWER ........................................................................................................................................................ 6
3.1 TEST RESULT ................................................................................................................................................................. 6 3.2 TEST METHOD ............................................................................................................................................................... 6 3.3 TEST EQUIPMENT .......................................................................................................................................................... 6 3.4 TEST DATA .................................................................................................................................................................... 6
4 POWER SPECTRAL DENSITY ....................................................................................................................................... 7
4.1 TEST RESULT ................................................................................................................................................................. 7 4.2 TEST METHOD ............................................................................................................................................................... 7 4.3 TEST DATA .................................................................................................................................................................... 7
5.1 TEST METHOD ............................................................................................................................................................... 8 5.2 TEST EQUIPMENT .......................................................................................................................................................... 8 5.3 TEST DATA .................................................................................................................................................................... 9
6 TRANSMITTER UNWANTED EMISSIONS IN THE OUT-OF-BAND DOMAIN .................................................. 10
6.1 TEST RESULT ............................................................................................................................................................... 10 6.2 TEST METHOD ............................................................................................................................................................. 10 6.3 TEST EQUIPMENT ........................................................................................................................................................ 10 6.4 TEST DATA .................................................................................................................................................................. 11
7.1 TEST RESULT ............................................................................................................................................................... 16 7.2 TEST METHOD ............................................................................................................................................................. 16 7.3 TEST EQUIPMENT ........................................................................................................................................................ 16 7.5 TEST DATA .................................................................................................................................................................. 17
8.1 TEST METHOD ............................................................................................................................................................. 21 8.2 TEST EQUIPMENT ........................................................................................................................................................ 21 8.3 TEST DATA .................................................................................................................................................................. 22
9 REVISION HISTORY ...................................................................................................................................................... 26
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 3 of 26
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
Member of the SGS Group (SGS SA)
1 Summary of Test Results Test Description Test Specification Test Result
RF Output Power EN 300 328 5.3.2 Compliant
Duty Cycle / Tx Sequence / Tx-Gap / Medium Utilisation
EN 300 328 5.3.2 NA(1)
Power Spectral Density EN 300 328 5.3.3 Compliant
Accumulated Transmit Time, Frequency Occupation and Hopping Sequence
EN 300 328 5.3.4 NA(2)
Hopping Frequency Separation EN 300 328 5.3.5 NA(2)
Adaptivity(Channel access mechanism) EN 300 328 5.3.7 NA(1)
Occupied Channel Bandwidth EN 300 328 5.3.8 Compliant
Transmitter unwanted emissions in the out-of-band domain
EN 300 328 5.3.9 Compliant
Transmitter unwanted emissions in the spurious domain
EN 300 328 5.3.10 Compliant
Receiver Spurious Emissions EN 300 328 5.3.11 Compliant
NA: (1) Not Applicable to devices where the RF Output power (nominal temperature and voltage) is less than 10 dBm e.i.r.p.
(2) Not Applicable to DTS devices.
1.1 Modifications Required for Compliance None
2 General Information
2.1 Client Information Name: Crestron Electronics, Inc.
Address: 15 Volvo Drive City, State, Zip, Country: Rockleigh, NJ 07647, USA
2.2 Test Laboratory Name: SGS North America, Inc.
Address: 620 Old Peachtree Road NW, Suite 100 City, State, Zip, Country: Suwanee, GA 30024, USA
Accrediting Body: A2LA
Type of lab: Testing Laboratory Certificate Number: 3212.01
Environmental Conditions From: January 22, 2016 February 4, 2016
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
Member of the SGS Group (SGS SA)
2.3 General Information of EUT Type of Product: infiNET EXTM Gateway Model Number: CENI-GWEXER Serial Number: Not labeled
Firmware Version: v1.2869.00000
Test Voltage: 22.8 – 25.2Vdc Extremes, 24Vdc Nominal
Frequency Range: 2405 to 2480 MHz Number of channels: 16
2.4 Operating Modes and Conditions The EUT was configured with software to allow the EUT to be manually placed in continuous transmit mode on any channel (11-26, 2405-2480MHz).
2.5 Radiated System Configuration
Device reference
Manufacturer Description Model Number Serial Number
A Crestron infiNET EXTM Gateway CEN-GWEXER Not Labeled
B Crestron 24Vdc Power Supply NBS24J240075D5 Not Labeled
A B
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 5 of 26
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
Manufacturer Description Model Number Serial Number
A Crestron infiNET EXTM Gateway CEN-GWEXER Not Labeled
B Extech DC power supply 382280 EA03
C Rohde & Schwarz Test System TS8997 NSN
A B
C
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 6 of 26
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
Member of the SGS Group (SGS SA)
3 RF Output Power
3.1 Test Result
Test Description Test Specification Test Result
RF Output Power 5.3.2 Compliant
3.2 Test Method The test data was measured using the conducted measurement method as described in clause 5.3.2.2.1. For extreme operating conditions the manufacturers declared environmental operational range of 10˚C to +40˚C and a voltage range of 22.8 – 25.2Vdc was used. Limit The maximum RF output power for non-adaptive equipment shall be declared by the supplier and shall not exceed 20 dBm. This limit shall apply for any combination of power level, intended antenna assembly, and extreme operating condition.
3.3 Test Equipment
Test Start Date: 3-Feb-2016
Test End Date: 4-Feb-2016 Tester: JOP
Equipment Model Manufacturer Asset Number Cal Due Date
SIGNAL ANALYZER FSV30 ROHDE & SCHWARZ B085749 8-Oct-2017
OPEN SWITCH AND CONTROL
PLATFORMOSP120 ROHDE & SCHWARZ S/N: 101182 CNR
SIGNAL GENERATOR SMB-100A ROHDE & SCHWARZ S/N: 107939 CNR
ENVIRONMENTAL TEST
CHAMBERT2RC TENNEY ENVIRONMENTAL B094877 CNR
TRUE RMS MULTIMETER 87V FLUKE B079674 4-Aug-2016
DC POWER SUPPLY 382280 EXTECH EA03 1-Apr-2016
Calibration interval is 1 year. FSV Signal Analyzer was used to validate the OSP and Signal Generator prior to testing. Fluke thermometer used to verify temperature settings in the environmental chamber.
3.4 Test Data
22°C
23.8 25.2 24 23.8 25.2
11 Max 8.2 8.1 7.9 7.6 7.6 0 2.0 10.2 20.0 PASS
18 Max 8.0 8.0 7.8 7.5 7.5 0 2.0 10.0 20.0 PASS
26 Max 7.9 7.9 7.6 7.3 7.3 0 2.0 9.9 20.0 PASS
Pass/Fail
Duty
Cycle
Corr
Ant
Gain
(dBi)
Frequency
MHz
2405
ChannelSetting
(dBm)
10°C 40°C
2480
2440
Measured Power (dBm)
Voltage (Vdc) Highest
EIRP
dBm
Spec
Limit,
dBm
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 7 of 26
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
Member of the SGS Group (SGS SA)
4 Power Spectral Density
4.1 Test Result
Test Description Test Specification Test Result
Power Spectral Density 5.3.3 Compliant
4.2 Test Method Measurements were recorded using an automated Rhode & Schwarz TS8997 Regulatory Test System fitted with a spectrum analyzer. The analyzer was used to collect data points across the entire band (2400-2483.MHz). Each point was summed, and the average was normalized to the measured RF output power. Then each 1 MHz band of points was individually summed and the highest result was recorded as the measured PSD in dBm/MHz.
Limit The maximum e.i.r.p. spectral density is limited to 10dBm/MHz. This limit shall apply for any combination of power level and intended antenna assembly.
4.3 Test Data Because the measured RF output power at nominal temperature and volatge was less than 10dBm EIRP, it was not necessary to perform power spectral density measurements.
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 8 of 26
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
Member of the SGS Group (SGS SA)
5 Occupied Channel Bandwidth Test Description Test Specification Test Result
Occupied channel bandwidth 5.3.8 Compliant
5.1 Test Method Measurements were recorded using an automated Rhode & Schwarz TS8997 Regulatory Test System fitted with a spectrum analyzer. The measurement was performed at the lowest and highest channels for each modulation type using the conducted measurement method defined in Section 5.3.8.2.1. Limit: The Occupied Channel Bandwidth shall fall completely within the band given in clause 1 (2.4 GHz to 2.4835 GHz). For non-adaptive Frequency Hopping equipment with e.i.r.p greater than 10 dBm, the Occupied Channel Bandwidth for every occupied hopping frequency shall be equal to or less than the value declared by the supplier. This declared value shall not be greater than 5 MHz. For non-adaptive systems using wide band modulations other than FHSS and with e.i.r.p greater than 10 dBm, the occupied channel bandwidth shall be less than 20 MHz.
5.2 Test Equipment
Test Date: 3-Feb-2016 Tester: JOP
Equipment Model Manufacturer Asset Number Cal Due Date
SIGNAL ANALYZER FSV30 ROHDE & SCHWARZ B085749 8-Oct-2017
OPEN SWITCH AND CONTROL
PLATFORMOSP120 ROHDE & SCHWARZ S/N: 101182 CNR
SIGNAL GENERATOR SMB-100A ROHDE & SCHWARZ S/N: 107939 CNR
TRUE RMS MULTIMETER 87V FLUKE B079674 4-Aug-2016
DC POWER SUPPLY 382280 EXTECH EA03 1-Apr-2016
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 9 of 26
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
Member of the SGS Group (SGS SA)
6 Transmitter unwanted emissions in the out-of-band domain
6.1 Test Result
Test Description Test Specification Test Result
OOB Domain 5.3.9 Compliant
6.2 Test Method Measurements were recorded using an automated Rhode & Schwarz TS8997 Regulatory Test System fitted with a spectrum analyzer. The measurement was performed at the lowest and highest channels for each modulation type using the conducted measurement method defined in Section 5.3.9.2.1. Limit
6.3 Test Equipment
Test Start Date: 3-Feb-2016
Test End Date: 4-Feb-2016 Tester: JOP
Equipment Model Manufacturer Asset Number Cal Due Date
SIGNAL ANALYZER FSV30 ROHDE & SCHWARZ B085749 8-Oct-2017
OPEN SWITCH AND CONTROL
PLATFORMOSP120 ROHDE & SCHWARZ S/N: 101182 CNR
SIGNAL GENERATOR SMB-100A ROHDE & SCHWARZ S/N: 107939 CNR
ENVIRONMENTAL TEST
CHAMBERT2RC TENNEY ENVIRONMENTAL B094877 CNR
TRUE RMS MULTIMETER 87V FLUKE B079674 4-Aug-2016
DC POWER SUPPLY 382280 EXTECH EA03 1-Apr-2016
Note: The calibration period equipment is 1 year.
Test Report Number: 3919823EMC01 Rev. 0
Crestron Electronics, Inc. / CENI-GWEXER
Page: 11 of 26
SGS North America Inc. Consumer Testing Services 620 Old Peachtree Road NW, Suite 100, Suwanee, GA 30024 t (770) 570-1800 www.us.sgs.com/cts
7.2 Test Method Initial measurements were taken using the conducted methods defined in clause 5.3.10.2.1.1. Any emissions falling within 6dB of the limit were then measured using the methods in clause 5.3.10.2.1.2. Testing was repeated using the radiated methods defined in clause 5.3.10.2.2. Tests were performed at the lowest and highest channels. Limit
7.3 Test Equipment
Test Date: 22-Jan-2016 Tester: FL
Equipment Model Manufacturer Asset Number Cal Due Date
EMI TEST RECEIVER ESU40 ROHDE & SCHWARZ B079629 4-Aug-2016
8.1 Test Method Using a spectrum analyzer measurements were taken via the radiated method as described in clause 5.3.11.2 of the standard. Tests were performed at the lowest and highest channels.
8.2 Test Equipment
Test Date: 22-Jan-2016 Tester: FL
Equipment Model Manufacturer Asset Number Cal Due Date
EMI TEST RECEIVER ESU40 ROHDE & SCHWARZ B079629 4-Aug-2016
