EMC TEST SYSTEM FOR AUTOMOTIVE ELECTRONICS ......PULSE VERIFICATION Either for functional checks...

EMC TEST SYSTEM FOR AUTOMOTIVE ELECTRONICS

Real full compliance to the standards, versatile functionality, reliable test results and complete user convenience

The new EMC test system for automotive electronics by EM TEST

TRUST IN LEADING TECHNOLOGYGET INTO THE POLE POSITION

Page 1 ©EM TEST

200 Series RF Test SystemToyota Test System

EM T ES T


TABLE OF CONTENT

Page 2 ©EM TEST

EM TEST: The competent partner of the automotive industry

Multiplicity in standards – a challenge

01 The EMC Test System for conducted immunity – an overview

Highlight manual operation: The operation concept of the series 200

More than anybody else can do: 3 different modes of use

Standalone generators for single test applications and multitasking testing

Multitasking testing and full documentation via EM TEST software

The fully automated EMC test system for conducted immunity

The standalone generators of the 200 series

VDS 200B

PFS 200B

UCS 200M

LD 200B

02 The Toyota Test System for Field Decay and Load Dump tests 1, 2 and 3

The software

03 The Continuous Wave System for RF immunity testing (series CWS 500D)

The accessories

3

4

5

6

7

8

9

10

11

11

12

13

16

17

19

24

32


EM TEST: THE COMPETENT PARTNER OF THE AUTOMOTIVE INDUSTRY

OUR LEADING POSITION IS NOT JUST A MATTEROF CHANCEIt is rather the result of comprehensive consideration ofall important aspects

Page 3

Never before has the automotive market seen suchrapid developments as those experienced over thelast couple of years. The force behind this is thedemand from the market for greater technical featu-res and passenger convenience for all classes ofvehicle.High-energy systems such as air conditioning andhighly sophisticated mobile audio and communica-

tions require a complete new approach in design.As innovations are implemented, technology mustanticipate the future. Innovation has driven EMTEST since its foundation. “Safety and reliability” isnever compromised and all EM TEST EMC testsystems are well prepared for future requirements.The test generators hardware is ready for increasingand changing demands based on the enlarged ran-

ges on all test parameters and power ratings.EM TEST offers an EMC test system that accommo-dates worldwide requirements today and tomorrowand makes investment safe for the future.

Top Performance is built on Know-How

©EM TEST

BMW-Spec.


MULTIPLICITY IN STANDARDS – A CHALLENGE

STANDARD WITH EM TEST:All standards under control

Page 4 ©EM TEST

Despite a worldwide tendency to harmonise standards, the number of test requirements and proceduresincrease constantly. The reality today shows us an increasing number of national, international and mostimportantly, manufacturer specific requirements rather than just one common standard. Moreover, manu-facturer specific requirements mostlyexceed the common standards.

The theory ...

Individual test parameters set by themanufacturers are required to be strictlyobeyed by both the manufacturer and his suppliers. These are the vital basis tosecure the functionality of the vehicles.As a priority EM TEST fully supports thisimportant task.Apart from covering national and inter-national standards such as ISO, SAE,JASO, ETS and DIN using EM TEST EMCequipment for automotive assures yourbeing best equipped to comply withmost of the worldwide manufacturer specifications such as GM, Chrysler,Ford, Audi/Volkswagen, BMW, Renault/Nissan and Toyota to name only some of them.

... and the facts

�

�

SAE J1113 partJASO D001-94

ISO 7637-2:2004

PSA-Spec.

Renault-Spec.Saab-Spec.

Mercedes-Spec.Mitsubishi-Spec.

GM-Spec.

Toyota-Spec.

Chrysler-Spec.Fiat-Spec.

Volvo-Spec. Ford-Spec.

As the leading manufacturer of test equipment for con-ducted EMC, EM TEST is an active member of various

working groups and standards commitees.EM TEST sets the Benchmark

Audi-Spec.


01 THE EMC TEST SYSTEM FOR CONDUCTED IMMUNITY – AN OVERVIEW

THE POWERFUL THREE.And a new star.

Page 5

For Pulses:

2b, 4, Sine wave sweepBattery Supply VariationRamp function

©EM TEST

Voltage Drop Simulator VDS 200B Power Rating:

60 V/15 A to

60 V/200 A

1 2

For Pulses:

Dips andDrops on theBattery Supply

Power Fail Simulator PFS 200B Power Rating:

60 V/30 A to

60 V/200 A

1 2

For Pulses:

1, 2a, 3a, 3b,Nissan, JASO D001,SAE J1455

Highlight:

» 6 modules in1 unit

» FreeStyle mode

1 2

For Pulses:

5a, 5b (clipped), 7,Chrysler, Ford,MBN

Load Dump LD 200B double-exponential waveform generation

Highlight:

» Test voltageup to 200 V

» built-in Ri:0.5 to 10 Ω

1 2

Ultra Compact Simulator UCS 200Mdouble-exponential waveform generation


HIGHLIGHT MANUAL OPERATION:

THE OPERATION CONCEPT OF THE SERIES 200The basis for versatile and multiple application

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Curser keys and rotary knob allowmost convenient operation of thesimulator.

Parameters and complete test routines are selected via functionkeys. Comprehensive navigationmakes operation as easy as possible. Service and self-checkrouines enable the user to verifythe generator.

Every generator is equiped withboth GPIB and RS232 interfacesfor remote control. Fail1 and Fail2input are implemented for DUTmonitoring purposes.

Menus and parameters are comprehensively arranged in the LCD display for quick and accurate programming of tests.

GPIB AND RS232 INTERFACES FAIL1 AND FAIL2 THE CLEAR DISPLAY

THE CONCLUSIVE OPERATION THE FUNCTION KEYS


3 DIFFERENT MODES OF USE

A CLOSER LOOK AT THE SYSTEMEverything is there, everything is possbile:

Page 7 ©EM TEST

Standalone generators for singletest applications and multitaskingtesting

Multitasking testing andfull documentationvia EM TEST software

The fully automatedEMC test system for conducted immunity

PLUS

PLUS



SINGLE TEST APPLICATION OR MULTI-TASKING TESTING WITH STANDALONE UNITSThe easy way of testing

Page 8

MANUAL OPERATION OF SINGLE UNITSThe easy operation (via cursor keys and rotaryknob) as well as numerous pre-programmedtest routines and the fast Test Mode (selectionof test routines and parameters via functionkeys) allow tests to be performed most eco-nomically.

©EM TEST

U

t

U

t

U

t

U

t

» DUT 1

» DUT 2

» DUT 3

» DUT 4

PORTABLE TESTINGEach generator includes a controller, a userinterface (keyboard and display) and acoupling/decoupling network to work as anindependent complete test facility. Take itanywhere, anytime and do your tests!

MULTITASKING TESTINGEM TEST’s EMC Test System is the one andonly offering the capability to perform diffe-rent tests with different test devices simulta-neously. Long duration tests as specified bysome manufacturer requirements can bedone without any inpact on other testing.This is what EM TEST calls efficient andeconomical use of valuable resources in EMCtesting.

GPIB AND RS232 INTERFACES,FAIL1 AND FAIL2All interfaces are a common part of everygenerator.» GPIB and RS232 for remote control» Fail1 and Fail2 for DUT monitoring

IEEE

ManualTesting

MultitaskingTesting

SequentialTesting

NO SOFTWARE REQUIREDDesigned to work standalone no software isrequired. Still operation is fast and easyusing pre-programmed test routines.



MULTITASKING TESTING AND FULLDOCUMENTATION VIA EM TEST SOFTWAREDo your job 4 times faster

Page 9 ©EM TEST

INTEGRATION OF AN EXTERNAL MEASURINGDEVICE FOR DUT MONITORINGThe EMC Test System provides the capabilityto integrate any GPIB controlled externalmeasuring device for DUT monitoring.

U

t

U

t

U

t

U

t

» DUT 1

» DUT 2

» DUT 3

» DUT 4

IEEE

ManualTesting

MultitaskingTesting

SequentialTesting

GPIB +

RS 232

INTEGRATION OF AN OSCILLOSCOPE FORPULSE VERIFICATIONEither for functional checks prior to testing orfor pulse verification as per ISO 7637-2:2004,Annex D, an oscilloscope is required which canbe integrated into the EMC Test System.

REMOTE CONTROL: ISMISOManual operation or remote control – what’sbetter, what’s more appropriate? This is noquestion with the EMC Test System. The ope-rator determines the mode of operation caseby case depending on the test requirements.

TEST REPORT GENERATIONISMISO records test interruptions, registersDUT conditons (via external measuring device)and adds comments entered by the operatorto the report along with the test parametersand other settings. Screenshots of the oscillo-scope can be transferred and inserted into thetest report as well to show the verification ofthe waveform. Test reports are directly conver-ted into RTF file format and can be post-pro-cessed by any Windows program such asWord, Excel etc. Company logo and furtherinformation can be added manually.

GPIB AND RS232 INTERFACES,FAIL1 AND FAIL2

MULTITASKING TESTING

» Measuring device for DUT monitoring

» Oscilloscopefor pulse verification



THE FULLY AUTOMATED EMC TESTSYSTEM FOR CONDUCTED IMMUNITYThe best you can get for fast results

Page 10 ©EM TEST

AUTO

IEEE

MANUAL OPERATION OF SINGLE UNITS

REMOTE CONTROL: ISMISO

ManualTesting

MultitaskingTesting

SequentialTesting

GPIB +

RS 232

U

t

U

t

U

t

U

t

» DUT

FULLY AUTOMATED TESTING USING PRE-PROGRAMMED TEST ROUTINESISMISO software supports the generation of fullyautomated complete test sequences. Standardtest routines, a Link File generator or even fasterthe Easy Link routine make your job easier.

INTEGRATION OF AN EXTERNAL MEASU-RING DEVICE FOR DUT MONITORING

INTEGRATION OF AN OSCILLOSCOPE FORPULSE VERIFICATION

COMMON DUT CONNECTION PORT:COUPLING NETWORK OF THE UCS 200MThe Ultra Compact Simulator, type UCS 200M,includes a coupling/decoupling network serving as a common DUT connection port. All EM TEST generators such as LD 200Bx, VDS 200Bx and PFS200Bx can be intercon-nected with the UCS 200M and their pulses aremade available at this common DUT output.

GPIB AND RS232 INTERFACES,FAIL1 AND FAIL2

» Measuring device for DUT monitoring

» Oscilloscopefor pulse verification

FULL DOCUMENTATION


THE STANDALONE GENERATORS OF THE 200 SERIES

VDS 200B Voltage Drop Simulator

Page 11 ©EM TEST

GENERATION OF TEST PULSES ON THE BATTERY

SUPPLY SYSTEM

CAN BE USED AS A STANDALONE DC VOLTAGE SOURCE

MANUAL OPERATION

QUICK START TEST MODE

STANDARD TEST ROUTINES AND USER TEST ROUTINES

GPIB AND RS232 INTERFACES

DUT MONITORING CAPABILITY

HIGHLIGHTS

Pulse 2b

Pulse 4

Pulse 4, sinus 2Hz

Pulse 4, sinus 4-5Hz

JASO

Cranking

Sinus

Sweep

Voltage Drop

GENERATED TEST PULSES

VDS 200B 60 V | 15 AVDS 200B1 60 V | 30 A ( 70 A@500 ms)VDS 200B2 60 V | 50 A (100 A@500 ms)VDS 200B3 60 V | 100 A (150 A@500 ms)VDS 200B4 60 V | 150 AVDS 200B5 60 V | 200 A (optional 1,000 A@100 ms)

STANDARD MODELS

The Voltage Drop Simulator VDS 200B generates disturbances appearing on thebattery supply system ocurring from switching and subsequent load changes. A wide range of pre-programmed test routines are available to simulate thevarious phenomenon. For more sophisticated and more complex user specifica-tions an arbitrary generator is available.

SUMMARY

Ramp Down/Up

Ramp Up/Down

Ramp Down

Ramp Up

Ramp Down/High

Ramp Low/Up

Overvoltage

Voltage Profile

Reversed Voltage

Jump High

Jump Low

Triangle High

Triangle Low

Overstress


Page 12 ©EM TEST


PFS 200B Power Fail Simulator

GENERATION OF DIPS AND DROPS ON THE BATTERY

SUPPLY SYSTEM

MANUAL OPERATION





HIGHLIGHTS

Dips

Drop Out

Micro Drop

Drop High

Drop Low

Drop Single

Dip (Sag)


PFS 200B1 60 V | 30 A ( 70 A@500 ms)PFS 200B2 60 V | 50 A (100 A@500 ms)PFS 200B3 60 V | 100 A (150 A@500 ms)PFS 200B4 60 V | 150 APFS 200B5 60 V | 200 A (optional 1,000 A@100 ms)

STANDARD MODELS

The Power Fail Simulator PFS 200B generates voltage interruptions (Dropout) and voltage dips occuring in the battery supply system. A wide rangeof pre-programmed test routines are available to easily simulate variouskinds of Dips and Drop Outs.

SUMMARY

Switch Low

Switch High

Dips Single


Page 13 ©EM TEST

DOUBLE-EXPONENTIAL WAVEFORM GENERATION BASED

ON A RLC GENERATOR

TEST VOLTAGE UP TO 1,000 V ± 10 %

MANUAL OPERATION



FREESTYLE-MODE



HIGHLIGHTS GENERATED TEST PULSES

CN 30 60 V | 30 A ( 70 A@500 ms)CN 50 60 V | 50 A (100 A@500 ms)CN 100 60 V | 100 A (150 A@500 ms)CN 150 60 V | 150 ACN 200 60 V | 200 A (optional 1,000 A@100 ms)

STANDARD COUPLER MODELS

The Ultra Compact Simulator UCS 200M generates pulses in the nanose-cond (fast transients) and microsecond range (switching of inductive loads)as required for conducted immunity testing for automotive electronics. TheFreeStyle mode allows the operator to define user specific test pulses withparameters being variable in a wide range. Naturally, programming is easyand does not require specific skills.

SUMMARY

NEW


UCS 200M Ultra Compact SimulatorDouble-exponential waveform generation as per ISO 7637-2:2004 annexes D & E

Pulse 3a

Pulse 3b

Pulse 3a (Sweep)

Pulse 3b (Sweep)

Pulse1 (1/1.000)

Pulse1 (1/2.000)

Pulse1 (1/6.000)

Pulse1 (3/1.000)

Pulse1 (3/2.000)

Pulse 2 (1/50)

Pulse 2 (1/150)

Pulse A2 (JASO)

Pulse B2 (JASO)

Pulse D2 (JASO)

Pulse B2 (Nissan)

Pulse C8 (Nissan)

Pulse C50 (Nissan)

Pulse C300 (Nissan)

Inductive (SAE)

Mutual (SAE)

Freestyle-mode

» Compact and modular design» Configurable according to customer’s requirements» Upgrade and extension for new requirements

possible any time

» Coupling networks available for different power ratings» Coupler extension to integrate multiple Load Dump

generator as per SAE, Nissan and JASO» Best user convenience

» Pulse parameters can be varied over a wide range to create user specific test pulses. Easy to do, nospecial skills required.

» Single DUT connection port for complete test sequences including LD, VDS and PFS pulses.

Overview of highlights

©EM TEST



UCS 200M 6 modules in one box

Page 14

MODULE EFT

(Standard)

ISO 7637-2/-3Pulse 3a, 3b

MODULE CN

(Standard)

Typ CNx• Common DUT

connection port• Coupling of all

test pulses ontothe DUT testsupply lines

MODULE MPG

ISO 7637-2/-3Pulse 1 (12 V/24 V)Pulse 2 (12 V/24 V)all worldwide manu-facturer specific pulse requirements

MODULE JASO

JASO D001Pulse A2, B2 ,D2

JASO recommendsthe pulse circuit and its components

MODULENISSAN

Nissan NDSPulse B2, C8, C50und C300Nissan recommendsthe pulse circuit andits components

MODULE SAE

SAE J1455Mutual PulseInductive Pulse

NEW

©EM TEST

A simple menu structure and a clearly arranged display are the keys to easilyfind your way and access the function you need and to program your own testpulses quickly. Only a few steps and your Freestyle test pulse is created either

in manual operation mode or via ISMISO software.Quick and easy handling



UCS 200M Freestyle-mode

Ua

0

t r

t 1t 2

U s

t d

RISE TIMEfrom 1 µs to 10 µs

tr »PULSE DURATION

from 50 µs to 10,000 µs

td »PEAK VALUEup to 600 V

A »

»

SOURCE IMPEDANCE2 Ω, 4 Ω, 10 Ω to 100 Ω in stepsof 5 Ω, 200 Ω, 400 Ω and 450 Ω

Ri

STEP 1: SET THE DESIRED PARAMETERS

STEP 2: YOUR OWN TEST PULSE IS READY

FREESTYLE IN MANUAL OPERATION MODE

EM TEST

UCS 200Mautomotive Transient Generator

V 1.00

Micro Pulses 1,2Burst Pulses 3a, 3bFreestyle

SWN: 031016

F1 F2 F3 F4 F5 F6 F7

MAIN MENU

F1 : Pulse 1F2 : Pulse 2F3 : Pulse 3a/3b

F7 : Service

F4 : JASO / Nissan / SAEF5 : ExternalF6 : Freestyle

F1 F2 F3 F4 F5 F6 F7

Pulse FREESTYLE

Start with F1

F1 F2 F3 F4 F5 F6 F7

STANDARD TESTROUTINEV = 100 Vtr = 1us+/- = -t1 = 1.0 stri = Auton = 10000

START CHANGE

FREESTYLEpul = Freetd = 5000usRs = 75 Ohmt2 = 8.0 mscpl = Supply

F1 F2 F3 F4 F5 F6 F7

Technology in vehicles changes very fast. Time to market new models is fasterthan ever before. Test procedures and requirements change according to cope withnew technologies.

Freestyle is the ultimate tool to program individual test pulses easily and quickly tokeep pace with the rapid changes of requirements and to remain flexible and pre-pared for the future.

For the standards of today and tomorrow


Page 16 ©EM TEST

DOUBLE-EXPONENTIAL WAVEFORM GENERATION BASED

ON A RLC GENERATOR

TEST PULSES 5A, 5B AS PER ISO 7637-2:2004

TEST VOLTAGE UP TO 200 V ± 10 %

BUILT-IN COUPLING NETWORK 60V / 30A

MANUAL OPERATION





HIGHLIGHTS GENERATED TEST PULSES

LD 200B ISO 7637-2:2004LD 200B1 ISO, Chrysler, FordLD 200B1S2 ISO, MBN 10284LD 200S2 ISO, SAE J1455LD 200S3 Nissan, Pulses A1, A2, B1LD 200S16 Jaso, Pulses A1, B1, D1

STANDARD MODELS

The Load Dump LD 200Bx generates pulses in the millisecond range asrequired by the EMC standard to test electronic components for vehicles.The pulses are of high energy originating from the sudden disconnection of the battery.

SUMMARY

Pulse 5a

Pulse 5b Clipped

Pulse 5 Chrysler Ramp

Pulse 5 Chrysler

Pulse 5 Chrysler Clipped

Pulse 5 Ford AC

Field-Decay


LD 200B: Load DumpDouble-exponential waveform generation as per ISO 7637-2:2004 annexes D & E


02 THE TOYOTA TEST SYSTEM FOR FIELD DECAY AND LOAD DUMP TESTS 1, 2 AND 3

TSC 7001: FIELD DECAY AND LOAD DUMP TESTINGNothing’s impossible!

Page 17 ©EM TEST

The relevant Toyota Engineering Standards specify Load Dump and Field Decay tests. These are appliedas single pulses but also as a combination of DCovervoltage with superimposed transient pulses.

Field Decay is used to test the immunity of electroniccomponents against transient disturbances.These occur when inductive loads are switched off. Thetest pulse is a combination of a DC overvoltage and a

high-energy transient pulse. The same test is used forthe so called Floating Ground test as well.

The Load Dump tests represent phenomena such asrapid changes of the load on the alternator, suddendisconnetion of the battery while being charged andfast changes of loads in electronic cirucuits while thebattery supply is interrupted.Toyota specifications specify a so called Giant Pulse

with a peak voltage of 110V, a high voltage pulse up to80V peak with a very fast repetition as well as a highvoltage pulse superimposed onto an increased DC supplyvoltage.

The important in short


Page 18 ©EM TEST

THE STANDALONE GENERATORS AS PER TOYOTA

TSC 7001 the Toyota Test System

TSC 3500GTEST METHOD FOR ANALOG READ OUT METER, 12 V

TSC 3590GTEST METHOD FOR CLOCK, 12 V

TSC 7001GBENCH TEST METHOD FOR ELECTRIC NOISE, 12 V/24 V

TSC 7006GBENCH TEST METHOD FOR ELECTROMAGNETIC INTERFERENCESUSCEPTIBILITY, 12 V/24 V

TSC 7203GTEST METHODS FOR ABS-TRC COMPUTERS, 12 V/24 V

HIGHLIGHTS

Field-Decay

Load-Dump 1

Load-Dump 2

Load-Dump 3


RDS 200S1 Remote controlled DC supply, 600 V/3 ALD 200S18 Field Decay TestLD 200S19 Load Dump Tests 1, 2 and 3

COMPLETE SYTEMS CONSISTING OF

The Toyota Test System generates the test pulses as required by variousToyota specifications. The method of pulse generation and the pulse verifi-cation are strictly specified and form an integrated part of the standards.Depending on the application either a pulse amplifier or a RLC pulse for-ming network is used for pulse generation.

SUMMARY


THE SOFTWARE

ISMISO SOFTWARE FORAUTOMOTIVEComprehensive - Convenient - Fast

Page 19 ©EM TEST

STANDARDS LIBRARY: NATIONAL, INTERNATIONAL, WORLDWIDE

CAR AND TRUCK MANUFACTURERS

ADMINISTRATION OF USED ACCESSORIES

IMPLEMENTATION / SELECTION OF MEASURING DEVICES

EASY LINK

LINK FILE GENERATOR

TEST DOCUMENTATION

HIGHLIGHTS

TEST PRODEDURE

01 Selection of standards (Library of standarts)

02 Selection of test pulses03 Used accessories04 Implementation/Selection of

measuring devices05 Easy Link06 Test routine07 Testing08 Test documentation

01

02

03

04

05

06

07

08

TEST PROCEDURE

01 02 03

05 06 07

04

08


Stop searching extensive standards andmanufacturer specifications to set-up yourtest system. EM TEST having done this foryou by creating a comprehensive library ofstandarts.

NATIONAL/ INTERNATIONAL:includes standards like ISO, DIN, ETS(mobile communication), JASO and SAE standards

MANUFACTURER SPECIFICATIONS:offers selection between European,American, Japanese and other Asianmanufacturers specifications.

One click and the pulses of the corre-sponding standard automatically appe-ar on desktop.Ready to test!

For individual requirements based onstandard pulses or user defined pulsesjust a single switch to the device areais required. A list of all accessible testpulses for each test generator isshown. Select one of the predefined

pulses, modify as desired and save itas your own test pulse that may berecalled from the test file administratorat any time.

THE SOFTWARE

ISMISO SOFTWARE FOR AUTOMOTIVEThe fast track to select your test standard

TEST PROCEDURE

03

05 06 07

04

08

Page 20 ©EM TEST

01 SELECTION OF STANDARDS 02 SELECTION OF TEST PULSES

01 02

All standards implemented... All pulses available...


Nowadays electronics can easily beco-me complex systems requiring variousaccessories and auxiliaries to stimula-te and test their functionality. In orderto assure reproducibility of test resultssuch accessories and auxiliary partshave to be seen as a part of the testset-up and thus need to be referenced

in the test documentation. Each acces-sory or auxiliary used in the test set-up can be added to the device libraryaccessible from the desktop menu”Accessories“. Selected from this libra-ry the devices used for a certain testcan be listed and referenced in thetest documentation.

All test accessories listedEither for functional checks prior totesting or for pulse verification as perISO 7637-2:2004, Annex D, an oscil-loscope is required which can be inte-grated into the EMC Test System.ISMISO offers an environment to easi-ly set-up the drivers required in orderto control any oscilloscope or otherexternal measuring device (used for

External measuring equipment – set-up and select

THE SOFTWARE

ISMISO SOFTWARE FORAUTOMOTIVEYour test device administrator

Page 21 ©EM TEST

03 USED ACCESSORIES04 IMPLEMENTATION/

SELECTION OF MEASURING DEVICES

DUT monitoring purposes) beingequipped with a GPIB bus interface.The driver library can manually beextended easily by any device not yet included. The built-in test functionhelps to verify the commands.

TEST PROCEDURE

01

05 06 07

02

08

03 04


For a fully automated test sequencecomposed from the various pulses requi-red by a standard the serial test set-upis preferred. Fully automated testsequences are created by the software,type ISMISO. Easy Link hereby offersthe ability to select the required test pul-ses (transients or battery supply simula-tion) from the library which should beincluded in the test routine and linksthem together in one test procedure.The selected pulses are sequentially applied as selected.

Easy as easy can beThe above diagram shows a fully auto-mated test procedure. According tothis the DUT will be exposed sequenti-ally to all the test pulses included inthis procedure. Such automated testroutines are generated by means ofthe Link File generator. The Link Filegenerator can link various types oftest pulses, standard pulses or userdefined pulses in any way using oneor more test generator.

Fully automatic

THE SOFTWARE

ISMISO SOFTWARE FORAUTOMOTIVEEasy and automatic – a conflict??

05 EASY LINK 06 TEST PROCEDURE

Page 22 ©EM TEST

TEST PROCEDURE

01

07

02

0805 06

03 04


When starting a test the selected testpulse and all its parameters are shownon the screen. Functions like ”Break“and ”Stop“ allow the operator tointerrupt the test, enter comments orstep to the next test pulse etc.

If an external measuring device isused for DUT monitoring this measu-ring device will automaticallyinterrupt the test as preset.

The complete viewISMISO records test interruptions, registers DUT conditions (via externalmeasuring device) and adds commentsentered by the operator to the reportalong with the test parameters andother settings.Screenshots of the oscilloscope can betransferred and inserted into the testreport as well as documenting andverifying the waveform.

Test reports are directly converted intoRTF file format and can be post-proces-sed by any Windows program such asWord, Excel etc. Company logo andfurther information can be addedmanually.

The complete report

THE SOFTWARE

ISMISO SOFTWARE FORAUTOMOTIVEYour online secretary

07 TESTING 08 TEST DOCUMENTATION

Page 23 ©EM TEST

TEST PROCEDURE

01

05

02

06

03 04

07 08


Page 24 ©EM TEST

03 THE CONTINUOUS WAVE SYSTEM FOR RF CONDUCTED IMMUNITY TESTING

CWS 500DRF disturbances are everywhere!!

The phenomenon is well known nowadays: Transmitters and radio receivers,radars and many other sources emitting radio frequency signals cause RF signalsto be induced onto other kinds of lines. As induced distrubances these signalsaffect all kind of electronic devices and systems causing them to fail.

With an increasing number of potential RF sources worldwide, immunity testing(following corresponding mandatory national and international requirements)becomes an ever more important aspect to achieve and secure the performanceand quality of a product for the global market.

Protect your valuable work

The traditional solutionCOMPLICATED OPERATION

TIME-CONSUMING CABLING

TIME-CONSUMING PREPARATION FOR TESTING

THE COMPLEX TEST SET-UP NEEDS WELL SKILLED

OPERATING PERSONNEL AND REPRESENTS A HIGH

POTENTIAL FOR FAILURES


Page 25 ©EM TEST

NEW

The TEM Cell is a rectangularcoaxial conductor with acharacteristic impedance (e.g.50 Ω). The DUT is exposed to the homogenous field.The CWS500D offers specifictest routines for an automatedcalibration using a field probe.

MODULE 1

MODULE 2

MODULE 3

MODULE 4

MODULE 5

ØTEM Cell

StriplineBCI

THE CONTROLLER

Standards library,RS232&GPIB (IEEE488)interfaces, driver forexternal measuringdevices, test reportgenerator

THE SIGNAL-GENERATOR10kHz – 1GHz; forCW, AM & PM

THE BI-DIRECTIONALCOUPLER10kHz – 1GHz;200W; with taps tomeasure forward andreverse power

THE 3-CHANNELMEASURINGDEVICEconfigurable; e.g. to measure forwardand reverse powerand the induced RFcurrent

THE RF-SWITCHautomatic switch;switches betweeninternal and exter-nal amplifiers (upto two)

100W / 150WAMPLIFIER

MODULE 1 MODULE 2 MODULE 3 MODULE 4 MODULE 5 MODULE 6 (OPTIONAL)

built-in amplifiermodules; 100W,10kHz to 400MHzor 150W, 100kHzto 400MHz

The test signal is induced in thewiring harness by means ofan RF injection probe. The appliedpower is automatically controlledduring test. Two methods are used;Substitution method and Closed-Loopmethod depending on the testspecification.

Using a Stripline, 1meter of thewiring harness is laid under theSeptum (homogenous fieldunderneath the activeconductor).

OVERVIEW OF APPLICATIONS

03 THE CONTINUOUS WAVE SYSTEM FOR RF CONDUCTED IMMUNITY TESTING

CWS 500D: THE ALL-IN-ONE SOLUTIONThe unique 5 plus 1 EM TEST approach


Page 26 ©EM TEST

03 THE CONTINUOUS WAVE SYSTEM FOR RF IMMUNITY TESTING

CWS 500D: THE ALL-IN-ONE SOLUTIONTHERE IS NO COMPARISON!

HIGHLIGHTS

Continuous wave signal (unmodulated signal)

Amplitude modulated signal (car manufacurer require-ments): Frequency 50Hz, 80% AM

Amplitude modulated signal (medical requirements):Frequency 2Hz, 80% AM

Amplitude modulated signal (Telecom applications):Frequency 400Hz, 80% AM

Amplitude modulated signal (IEC 61000-4-6):Frequency 1kHz, 80% AM

Amplitude modulated signal (car manufacurer require-ments): Frequency 1kHz, 95% AM

Pulse modulated signals (alarm systems as per EN50130-4): Frequency 1Hz, 50% duty cycle

Pulse modulated signals (MIL STD 461 and car manu-facurer requirements): Frequency 1kHz, 50% duty cycle

GENERATED TEST SIGNALS

CWS500D-MF Mainframe incl. Modules 1-5AMP1 Optional built-in amplifier 100W / 10kHz – 400MHzAMP2 Optional built-in amplifier 150W / 100kHz – 400MHzExt. AMP max. 200W / max. 1GHzStripline 90 Ω ; 3.2m or 2.7m

STANDARD MODELS

0 % 50 % 100 %

Other Systems

CWS 500D

50% time saving potential

SAVE YOUR TIME

NEW

The intelligent levelling algorithms as well as the compact design and the verylimited number of cables necessary for the test set-up make it possible to test in50% of the time required, when using traditional systems.

NO TIME-CONSUMING CABLING NECESSARY; NO FAILURE POSSIBLE

MOST COMPACT DESIGN IN MODULAR TECHNOLOGY

INCREASED REPRODUCIBILITY OF TEST RESULTS

EASY AND COMPREHENSIVE OPERATION

PRE-PROGRAMMED CALIBRATION ROUTINES SAVING TIME

RF SWITCH TO SELECT BUILT-IN OR EXTERNAL AMPLIFIER

PRE-PROGRAMMED TEST ROUTINES AS PER MOST USED STANDARDS AND

TEST REQUIREMENTS

IMPLEMENTATION OF UP TO 4 DEVICES FOR MEASUREMENT, CONTROL AND DUT MONITORING

INTEGRATION INTO OTHER SOFTWARE SYSTEMS (VIA RS232): SET-UP, CONTROL

AND DUT MONITORING

ØTEM Cell

Stripline

BCI


SOFTWARE FOR CWS 500D

ICD SOFTWAREBrilliant and simple – simply ingenious

Page 27 ©EM TEST

HIGHLIGHTS

TEST PROCEDURE

01 02 03 04 05 06 07

09 10 11 12 13 14 15

01

02

03

04

05

06

07

08

09

10

11

12

1314

BEST USER CONVENIENCE AND USER GUIDANCE

PRE-PROGRAMMED CALIBRATION ROUTINES

SUPPORTS SUBSTITUTION AND CLOSED-LOOP TEST METHOD

STANDARDS LIBRARY FOR NATIONAL AND INTERNATIONAL

STANDARDS

STANDARDS LIBRARY INCLUDING MOST MANUFACTURER’S

STANDARDS WORLDWIDE

IMPLEMENTATION OF DEVICES FOR MEASUREMENT,

CONTROL AND DUT MONITORING

GRAPHICS AND TABLES SHOWING MEASURING RESULTS

AND IMPEDANCE CHARACTERISTICS

FULL TEST DOCUMENTATION WITH LISTING OF ALL RESULTS,

INDIVIDUAL HEADER INFORMATION AND COMPANY LOGO

IMPLEMENTATION OF ALL DIAGRAMS, IMPEDANCE CHARAC-

TERISTIC AND AUXILIARY EQUIPMENT USED FOR THE TEST

IMPLEMENTATION OF EXCEL SHEETS FOR VERSATILE

APPLICATIONS

ANALYSIS TOOL WITH USER GUIDANCE

FUNCTION FOR AUTOMATIC DETECTION

OF SUSCEPTIBILITY LEVELS

LINK FILE GENERATOR WITH NEW EASY LINK FUNCTION

EXPERT MODE FOR INDIVIDUALLY GENERATED TEST

ROUTINES AS PER SPECIAL REQUIREMENTS

VECTOR MODE TO CREATE NEW TEST ROUTINES

CONSOLE MODE FOR MANUAL OPERATION AND ANALYSIS

OF THE DUT

ANALYSIS TOOL WITH USER GUIDANCE ACCESSIBLE FROM

EACH USER MODE

MODE OF MODULATION AND MODULATION DEPTH ARE

FULLY ADJUSTABLE

15

08


The up-to-date standards library offersyou quick access to the various testroutines and necessary calibrationfunctions. Moreover, this standardslibrary is an extraordinary source

of information about standards, testset-up’s, test modes etc.

The data baseThe operator can individually configurethe conditions under which a measu-ring device detects a DUT failure:Reduction of power and successive

detection of the susceptibility level,starting the ana-lysis tool and continua-tion of the test.

DUT monitoring

SOFTWARE FOR CWS500D

ICD SOFTWAREReady for you!

01 STANDARDS LIBRARY 02 SYSTEM CONFIGURATION: FAIL INPUTS

Page 28 ©EM TEST

The configuration tool helps to easily set-up all the measuring devices used forcalibration or DUT monitoring.

Parameters like trigger conditions,measuring windows, limiters and failconditions can be inserted and activated.

Configuration of the measuring deviceEach time a test routine is opened,the operator can select one of thecalibration files listed or configure anew calibration file for BCI, TEM Cellor Stripline. Thereby the test set-up

and all characteristic parameters areshown on the screen. No need to seeksuch information in the relevant docu-ments (standards etc.).

Calibration set-up

03 CONFIGURATION: EXTERNAL MEASURING DEVICE 04 CALIBRATION SET-UP

TEST PROCEDURE

01 02 03 04 05 06 07

09 10 11 12 13 14 15

08



ICD SOFTWARERoutines to attain the goal

Page 29 ©EM TEST

All measuring devices are set-up asrequired for the test and are configu-red accordingly. The CWS500D willthen automatically acquire the suscep-tibility level of the DUT, show the

result in the corresponding measuringwindows and record the results.

Levelling procedureWhile the calibration is in progress thetest level is determined for each spotfrequency and stored in the database.This ensures that the test is conductedat a constant level.

The software checks all operations.Failures are excluded.

The measuring device administrator

05 CALIBRATION ROUTINE, E.G. AS PER ISO 11452-4 06 IMPLEMENTATION OF MEASURING DEVICES

Tests can be configured with variousvectors. The operator defines the startand stop point of each vector (frequen-cy and amplitude), specifies the modeand depth of the modulation,

frequency step and dwell time etc.Specific test points can also be determi-ned via Excel file, if more convenient.

Individually configured test routineThe operator can follow the progress ofthe test by means of the constantlyupdated measuring windows and gra-phics. Apart from the applied power,the graphics show forward and reversepower and the induced current. The

impedance characteristic is determinedfrom the measured values and shown asa graphic. The operator is given verydetailed information to determine theDUT’s behaviour during test.

The test procedure

07 VECTOR TEST ROUTINE 08 TEST ROUTINE AS PER ISO 11452-4

TEST PROCEDURE

01 02 03 04 05 06 07 08

09 10 11 12 13 14 15



ICD SOFTWAREEverything‘s under control

Page 30 ©EM TEST

In Closed Loop-mode the output poweris constantly controlled. If the appliedcalibrated power is not sufficient toachieve the required test level, theapplied power has to be increaseduntil either the power limit or the

required test level is reached. As soonas the test level is achieved the dwelltime is started.

Closed Loop-modeThe DUT monitor is shown in a separa-te window. The operator can followthe progress of the measuring resultsduring the test.

The monitor

09 TEST ROUTINE AS PER ISO 11452-4 – CLOSED LOOP 10 TEST ROUTINE WITH DUT MONITORING

In this test mode the power havingbeen calibrated prior to the test isapplied at each test freuqency. Thereis no ajustment of the applied power.

This represents the preferred methodfor BCI as well as for TEM Cell andStripline applications.

Open Loop-modeIn order to test level 4 as per PSAstandard, a 150W amplifier is neededto apply the required power for theentire frequency range up to

400MHz. For this application theCWS500D can be equipped eitherwith a built-in 150W amplifier or anamplifier can be connected externally.

Powerful device

11 SUBSTITUTION MODE TEST ROUTINE 12 TEST ROUTINE AS PER PSA STANDARD

TEST PROCEDURE

01 02 03 04 05 06 07 08

09 10 11 12 13 14 15


Once a test is completed all measu-ring data is displayed on the screen.Depending on the settings and confi-guration markers will be set to showwhat limits of applied power or indu-ced current have been reached.The software automatically generatesa complete test report in RTF file for-mat including the details given for theDUT, the header information withthe integrated company logo and the

specific operator entries. The reportcontains all test parameters like app-lied standard, calibration data, thetest curve, diagrams of induced cur-rent, forward and reverse power, theDUT’s impedance characteristic and allmeasured values, a table showing allthe test points as well as a table ofevents with all comments entered bythe operator and finally the test result.

Test results

This mode is used for special testrequirements. For detailed analysisand individual evaluation of thesusceptibility level or in case of failureanalysis, the console mode allows the

operator to select and set all testparameters individually. The format ofthe parameters can be selected andchanged according to the requirements.

Manual operation


ICD SOFTWARELast but not least: The moment of truth

14 TEST COMPLETED!

15 MANUAL TEST – CONSOLE MODE

Page 31 ©EM TEST

TEST PROCEDURE

01 02 03 04 05 06 07 08

09 10 11 12 13 14

In each test mode the operator canopen the analysis tool. Based on itsconfiguration it will open automaticallywhen an ongoing test is interrupted.The operator can then insert anycomment, reduce or increase the testsignal, change the modulation or

frequency etc. to carefully evaluatethe DUT’s behaviour. The test can becontinued both manually or automati-cally or the test can be stopped.

Easy test evaluation

13 ANALYSIS TOOL WITH USER GUIDANCE

15


Page 32 ©EM TEST

ACCESSORIES

EVERYTHING YOU NEED FOR YOUR TEST SET-UP

EMC tests consist of complex test procedures and are conducted on various DUT’swith different battery supply conditions. Different lines require different couplingand decoupling devices. Generated test signals and induced currents need to be verified with high accuracy. Appropriate measuring and control devices, DUTmonitoring and signal recording devices are needed in a test set-up for these

purposes. This means: an extensive range of accessories is required and repre-sents an important part of the test set-up and test procedure.

Surplus requirements


Page 33 ©EM TEST

ACCESSORIES

OUR SUPPORT TO MAKE YOUR LIFE EASY

RDS 200 is a remote controlled DC voltage source with a built-in currentsink and is used to generate battery supply variations. It is controlledvia the 0-10V DC analog signal by the PFS 200B for voltage dips or by an arbitrary generator to generate signals e.g. as required by Ford’sCI 230 specification.

RDS 200

AN 200

RDS 200S1

FORD ES-XW7T CI 230...

RDS 200S1 is a remote controlled DC voltage source with a nominaloutput of 600V / 3A. It is used along with the LD 200S18 for theField Decay test and generates the –600V rectangular pulse.It is controlled via the 0-10V DC analog signal by the LD 200S18 andthus enables fully automatic testing.

TSC 7001G

FIELD DECAY AND SPARK TEST

AN 200 includes a battery switch to perform reproducible disconnectionof inductive loads from the battery supply. The transient voltage occuringdue to switching, can be measured on various load impedances and mustcomply with the limits indicated in the corresponding standards.AN 200 incorporates a semiconductor switch, the artificial networkrequired, the measuring output, internal selectable loads and allows forconnecting additional external loads.

ISO 7637-2:2004 ISO 7637-3:1995

The capacitive coupling clamp, type ACC, is used to induce nanosecond transients and microsecond pulses onto signal and data lines.

ACC CAPACITIVE COUPLING CLAMP


Page 34 ©EM TEST

ACCESSORIES

OUR SUPPORT TO MAKE YOUR LIFE EASY

INDUCTIVE PULSE COUPLING AS PER ISO 7637-3 (DRAFT)

COUPLING DEVICES FOR I/O LINES

CURRENT MONITORING CLAMPS

FOR BCI APPLICATIONS AS PER ISO 11452-4 AND

MANUFACTURER REQUIREMENTS

MATCHED CALIBRATION LOAD 50 Ω AND 1000 Ω FOR

THE VERIFICATION OF PULSES 3A AND 3B AS PER

ISO 7637-2.

BUILT-IN ATTENUATOR 1:100 (KW 50) AND 1:500

(KW 1000).

INCLUDES THE SYSTEM ENGINEERING WITH THE COMPLETE WIRING

OF THE HV PULSE CONNECTION, THE BATTERY SUPPLY DISTRIBUTION,

THE GPIB BUS AND THE GROUNDING SYSTEM WITH A CENTRAL

CONNECTION TO THE GROUND REFERENCE PLANE.

ALL BUILT-IN GENERATORS ARE THUS CONNECTED TO THIS GROUND

REFERENCE PLANE.

IT ALSO INCORPORATES THE WIRING AND CONTROL OF THE

EMERGENCY SWITCH-OFF CAPABILITY.

BCI CLAMPS

ISO RACK

KW 50/KW 1000

»

©EM TEST


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EM TEST AG

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Phone: +41 (0)61/ 7179191Fax: +41 (0)61/ 7179199E-mail: [email protected]

URL: www.emtest.com

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EM TEST GmbH

Lünener Straße 211

59174 Kamen

Phone: +49 (0)2307/260700Fax: +49 (0)2307/17050E-mail: [email protected]

URL: www.emtest.de

France:

EM TEST S.A.R.L.

1, Avenue de Pierre Pflimlin,

Actipolis III,

68390 Sausheim

Phone: +33 (0)3 89 31 23 50Fax: +33 (0)3 89 31 23 55E-mail: [email protected]

URL: www.emtest.fr

China:

EM TEST Representative Office Beijing

Rm 913, Leftbank,

No. 68 Bei Si Huan Xi Lu,

Haidian District,

Beijing 100080, P.R. China

Phone: +86 (0)10 826 76027-29 (three lines)Fax: +86 (0)10 826 76238E-mail: [email protected]

URL: www.emtest.com

Information about scope of deli-

very, visual design and technical

data correspond to the status at

time of printing.

This data is subject to change

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EMC TEST SYSTEM FOR AUTOMOTIVE ELECTRONICS ......PULSE VERIFICATION Either for functional checks...

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