Evaluated Surface Drainage Problems with Data

Charles Ellis

Kent Shannon

Ag Engineering Extension Specialists

Yield Map Interpretation

• Man Made Variables– Variety– Planting date– Tillage– Compaction

• Natural Variability– Soil fertility– Soil type– Drainage

Data Sources

• Yield Data

• Aerial Photos

• EC Data

• Soils

Man Made Variables

• Varieties• Tillage• Planting Date• Compaction• Chemical

Applications• Fertilizer

Applications

Man Made Variables

• Varieties• Tillage• Planting Date• Compaction• Chemical

Applications• Fertilizer

Applications

Natural Variables

Soils

Drainage

Soils

Man Made Variables

Fertility

Field History

Aerial Photos

Man made variables– Compaction– Drainage

Natural Variability

Drainage

Aerial Photos

Image• Obtain Aerial Photos• Terraserver• FSA• www.cares.missouri.edu• Show history of field

Soil EC Readings

Surface Drainage

Surface Drainage Affects

• Tillage• Planting Date• Seeding Depth• Emergence• Leaching• Harvesting

97 beans

99 Beans

2003 Beans

Multiple Years of Yield Data

Combining Multiply Years UsingMapCalcExcel

3 yr average bean yield

Combine Elevation

Elevation RTK

Combine and RTK Elevation

Yield and Topography

Pond

Possible Solutions

• Drain Pond• Remove Berm

Around Pond• Drain Field After

Pond Removal• Tillage to help

drainage

2004 corn

Yield variability has diminished.What are the causes?

Bu/A

1997 Corn Grain Yield - ASEQ Field 1; Centralia, MO

Ranking of Yield Variability and Ease of Remedy

Adapted from Larry Lotz, “Yield Monitors and Maps: Making Decisions”, Ohio State Univ.

Cause of Yield VariationLeastlikely

MostlikelyEase o

f R

em

ed

yEasy

Diffi

cu

lt

Mechanical/Equipment Problems

Nitrogen(corn)

TrafficProblems

Hybrid Variety

Field BorderCharacteristics

Organic matter

Disease

Planter color

Seed Depth

Tillage

P & K

CompactionDrainage

Past history

WeatherSoil type

InsectsWeeds

Plant date

pH

Population

Bu/A

Topsoil variation

Low soil P and K

End-row compaction

Soil pH

Historically managed less intensively

Treeline and endrow compaction

Greater weed pressure

Nearly flat, ponding

1997 Corn Grain Yield - ASEQ Field 1; Centralia, MO

RTK GPSElevation Map 1997 Corn Yield Map

Multiple Years of Point Yield Maps

1998 Beans 1999 Corn

Multiple Years of Point Yield Maps

2000 Beans 2001 Corn

Using Delineation of Point Yield Data

113.1

32.5

44.3

23.0

62.2

114.0

31.5

41.737.8

96.5

0.0

20.0

40.0

60.0

80.0

100.0

120.0

1997 1998 1999 2000 2001

Year

Yie

ld i

n b

u/a

cre

Average Yield - Wet Spot

Average Yield - Rest of the Field

RTK GPSElevation Map

1997 Corn Yield Map

Multiple Years of Interpolated Yield Maps

1998 Beans 1999 Corn

Multiple Years of Interpolated Yield Maps

2000 Beans 2001 Corn

Using Delineation of Interpolated (Gridded) Yield Data

114.9

32.3

45.0

34.4

88.2

113.1

31.2

41.237.8

96.2

0.0

20.0

40.0

60.0

80.0

100.0

120.0

1997 1998 1999 2000 2001

Year

Yie

ld i

n b

u/a

cre

Average Yield - Wet Spot

Average Yield - Rest of the Field

Using MapCalc Software to Better Visualize Elevation Difference with Yield Data

Equipment Used for RTK GPS Data

Collection

Use a PocketPCcomputer running

GPS data collectionsoftware

RTK Base Station

Possible Solution with a PTO-Ditchers