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Citation for the original published paper (version of record):
Frisk, A., Magnus, F., George, S., Arnalds, U B., Andersson, G. (2016)
Tailoring anisotropy and domain structure in amorphous TbCo thin films through combinatorial
methods.
Journal of Physics D: Applied Physics, 49(3): 035005
http://dx.doi.org/10.1088/0022-3727/49/3/035005
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Tailoring anisotropy and domain stru ture in
amorphous TbCo thin �lms through ombinatorial
methods
Andreas Frisk
1 ‡, Fridrik Magnus
1,2, Sebastian George
1,
Unnar B. Arnalds
2and Gabriella Andersson
1
1Department of Physi s and Astronomy, Uppsala University, Box 516, SE-751
20 Uppsala, Sweden
2S ien e Institute, University of I eland, Dunhaga 3, Reykjavik, IS-107, I eland
Abstra t.
We apply an in-plane external magneti �eld during growth of amorphous
TbCo thin �lms and examine the e�e ts on the magneti anisotropy and domain
stru ture. A ombinatorial approa h is employed throughout the deposition and
analysis to study a ontinuous range of ompositions between 7-95 at.% Tb.
Magnetometry measurements show that all samples have a strong out-of-plane
anisotropy, mu h larger than any in-plane omponents, regardless of the presen e
of a growth �eld. However, magneti for e mi ros opy demonstrates that the
growth �eld does indeed have a large e�e t on the magneti domain stru ture,
resulting in elongated domains aligned along the imprinting �eld dire tion. The
results show that the anisotropy an be tuned in intri ate ways in amorphous
TbCo �lms giving rise to unusual domain stru tures. Furthermore the results
reveal that a ombinatorial approa h is highly e�e tive for mapping out these
material properties.
PACS numbers: 75.30.Gw, 75.50.Kj, 75.70.Ak, 75.70.Kw, 61.43.Dq
Keywords: magneti anisotropy, amorphous magneti materials, magneti properties
of thin �lms, domain stru ture
‡ Corresponding author: andreas.frisk�physi s.uu.se
Tailoring anisotropy and domain stru ture in amorphous TbCo thin �lms through ombinatorial methods 2
1. Introdu tion
Thin �lms of TbCo are well known for their
strong perpendi ular magneti anisotropy (PMA)[1,
2℄ whi h makes them of interest for a range of
magneti storage and spin-valve te hnologies.[3, 4℄
Furthermore, it has re ently been shown that all-
opti al magneti swit hing (AOS)[5℄ an be a hieved
in Tb(Co,Fe) �lms,[6, 7℄ allowing the manipulation
of magneti domains on mu h shorter times ales
than is possible with magneti �elds. AOS relies
on the ferrimagneti nature of the TbCo, where
the anti-aligned Tb and Co magneti sublatti es
ompensate ea h other at a given temperature,
resulting in zero net magnetization. The ompensation
temperature an also allow the generation of domain
walls using thermal or omposition gradients with
potential appli ations in domain wall memories.[8, 9℄
Both the ompensation temperature and PMA an
be engineered by building heterostru tures ombining
TbCo with other materials.[10, 11℄ This allows great
�exibility in tuning the magneti properties and an
even open up new possibilities su h as interlayer
oupling through proximity indu ed magnetism.[12℄
Amorphous �lms are parti ularly interesting in the
ontext of heterostru tures as they form ex eptionally
�at and homogeneous layers[13, 14, 15℄ and di�erent
materials an be ombined without having to onsider
di�eren es in latti e onstants.[12℄ In addition, a
magneti anisotropy an be imprinted in amorphous
�lms in an arbitrary dire tion by applying a magneti
�eld during growth.[16℄ In SmCo (another rare-earth�
transition metal ompound) it has for example been
shown that su h an imprinted anisotropy an be
very large [17℄ and lead to unusual magneti domain
stru tures.[18℄
Here we explore the imprinting of anisotropy in
amorphous TbCo thin �lms and its e�e t on domain
stru ture. We use a ombinatorial approa h[19, 20℄
whereby material is deposited from two separate
sour es on a large wafer under an angle, so that a
ontinuous omposition gradient is a hieved. This
allows us to map out the properties of a ontinuous
range of ompositions mu h more e� iently than
with onventional methods. We �nd that, while the
perpendi ular anisotropy far outweighs the imprinted
anisotropy, the domain stru ture is still very sensitive
to the small imprinted anisotropy omponent.
2. Experimental details
TbCo thin �lms were deposited by a ombinatorial
te hnique using DC magnetron sputtering. The sam-
ples were prepared in an ultra-high va uum hamber,
with a maximum base pressure of 3× 10−9Torr, at
room temperature using 99.999% pure Ar as a sputter-
ing gas at a pressure of 1× 10−3Torr. The �lms were
deposited on 10mm wide strips ut from naturally ox-
idized 3-in h Si(100) wafers whi h were pre-heated, at
base pressure, to 650 ◦C for 20min and ooled down
to room-temperature before deposition. To ensure the
amorphi ity of the �lms, a bu�er layer of amorphous
Al80Zr20 with a nominal thi kness of 3nm was de-
posited on the native oxide of the Si.[15℄ The ham-
ber geometry was su h that Co and Tb targets were
positioned fa ing ea h other at opposite ends of the
substrate. Figure 1(a) shows the target and substrate
on�guration.
By o-sputtering from the Co and Tb targets,
with a non-rotating substrate, a omposition spread
a ross the sample was reated, as shown in �g. 1(a).
In total, a ontinuous omposition range from 7 to
95 at.% Tb was a hieved over three wafer strips ea h
with a nominal �lm thi kness of 50nm at the enter of
ea h sli e. To prote t the TbCo layer from oxidation a
apping layer of 3nm Al80Zr20 was deposited. Both the
bu�er and apping layer were deposited with a rotating
substrate to ensure a homogeneous omposition and
thi kness. One set of �lms was grown in a sample
holder with two permanent magnets reating a nearly
homogeneous stati in-plane magneti �eld of about
130mT, see �g. 1(a), whereas another set of �lms was
grown without this magneti �eld. The magneti �eld
was applied in the dire tion φ = 90◦, perpendi ular to
the omposition gradient dire tion whi h we de�ne as
φ = 0◦.
Rutherford ba ks attering (RBS) measurements
were performed at several points along the Tb-Co
gradient to determine the omposition. The yield of
ea h spe trum was normalized to the total ount of
the spe trum to enable omparison between di�erent
RBS measurements. For ea h spe trum the peaks of
ea h element were integrated giving the yields YTb and
YCo. By simultaneously solving the two equations
YTb(Co)
YTb + YCo=
xTb(Co)Z2Tb(Co)
xTbZ2Tb + xCoZ
2Co
(1)
for ea h element Co and Tb together with the ondition
Tailoring anisotropy and domain stru ture in amorphous TbCo thin �lms through ombinatorial methods 3
Tb
Tb
rich side
Magnet
Magn t
Bg
S
N
S
N
( )
0 10 20 30 40 50 60
Position from sample edge (mm)
0
10
20
30
xT
b(a
t.%
)
(b)
Figure 1. (Color online) (a) A diagram of the target
on�guration and substrate holder. The substrate is mounted
in between two permanent magnets produ ing a growth �eld
Bg ≈130mT at the enter. The omposition gradient is
represented as a olour gradient. The upper right orner shows
the position of the substrate holder with respe t to the targets.
The angle φ is also de�ned. (b) A representative measurement
of the Tb on entration gradient a ross a sample. The markers
are the values measured with RBS and the line is the �t used to
determine ompositions at intermediate points.
that xTb + xCo = 1 the elemental on entrations
xTb(Co) in at.% were determined. Here, ZTb(Co)
are the atomi numbers of ea h spe ies. The
omposition gradient was found to be almost linear
versus position as shown in �g. 1(b). A linear �t was
therefore used to extrapolate the omposition along
the entire sample length giving a omposition gradient
of ∆xTb = 0.4�0.6 at.%/mm. This implies that the
variation in on entration over the probed area of
ea h measurement point (less than 4mm diameter), is
1.5�2.4 at.%. The error bars in �g. 1 represent this
un ertainty, whi h is smaller than the experimental
un ertainty of RBS.
X-ray re�e tivity (XRR) and grazing in iden e
X-ray di�ra tion (GIXRD) were measured at several
points along the Tb-Co gradient with Cu Kα radiation
using a Bruker D8 Dis over in a parallel beam
geometry. A Göbel mirror was used on the in ident
side as well as beam-shaper slits to limit the measured
area. The re�e ted/di�ra ted beam was measured
using a Lynx EYE dete tor. For GIXRD an in ident
angle of ω = 1◦ was used. The probed area in ea h
measurement was about 8mm× 10mm, with the long
dimension perpendi ular to the Tb-Co gradient. In this
dire tion the Tb-Co omposition should be onstant,
see �g. 1.
Both longitudinal and polar magneto-opti Kerr
e�e t (L- and P-MOKE) measurements were used to
determine the magneti properties of the samples at
room temperature. The diameter of the laser spot
on the sample was about 1�2mm. An in-plane or
out-of-plane magneti �eld was applied ( ontinuously
measured with a Hall probe) and magnetization loops
were re orded at di�erent points on the samples, along
the Tb-Co gradient. To study the in-plane anisotropy
the samples were also rotated around the azimuthal
angle φ were φ = 0◦ orresponds to the dire tion where
the �eld is applied parallel to the omposition gradient,
�g. 1.
Higher �eld magneti hara terization was arried
out as a fun tion of temperature and omposition using
a Cryogeni Ltd. vibrating sample magnetometer
(VSM). These measurements were performed on
leaved samples, no larger than 6.8mm wide along
the gradient dire tion. Magnetization loops with a
�eld of up to 5 T applied both perpendi ular to
the plane and in the plane of the samples in the
temperature range 10 to 320 K were measured. The
in-plane measurements were performed at φ = 90◦, i.e.
the �eld is applied perpendi ular to the omposition
gradient. The diamagneti ba kground from the
substrate was subtra ted by a linear �t to the high �eld
parts of ea h magnetization s an. Magneti moments
were al ulated using the magneti �lm thi knesses
extra ted from XRR �tting.
Magneti for e mi ros opy (MFM) was performed
with a Nanosurf Mobile S atomi for e mi ros ope and
MFM01 series tips from NT-MDT. All measurements
were done in phase ontrast mode.
3. Results and dis ussion
3.1. Stru tural Properties
Some examples of GIXRD s ans are shown in the inset
in �g. 2. These measurements show that all samples
up to about xTb = 80 at.% Tb are X-ray amorphous
as seen by the presen e of only one broad low-intensity
peak typi al of amorphous samples with a la k of long-
range atomi order.[21℄ The angular position of this
broad peak gives a measure of the average atomi
separation in the �lm, whi h in reases with Tb ontent
onsistent with the larger latti e parameter of h p-Tb
(3.60Å) ompared to that of h p-Co (2.51Å). By
inserting the average atomi spa ing and full-width
at half-maximum (FWHM) into the S herrer formula
[22℄ the orrelation length (sometimes referred to as
the grain size) an be estimated, as shown in the
main panel of �g. 2. For small Tb on entrations the
orrelation length is almost onstant at about 10Å
with only a slight in rease with Tb ontent, whi h
Tailoring anisotropy and domain stru ture in amorphous TbCo thin �lms through ombinatorial methods 4
10 20 30 40 50 60 70 80 90
xTb
(at.%)
10
20
30
40C
orr
ela
tion
len
gth
(Å
)
10 20 30 40 50 60 70 80
2 (°)
0
100
200
300
400
500
600
700
800
Inte
nsi
ty (
CP
S)
93 at.%81 at.%51 at.%18 at.% 9 at.%
Tb
Figure 2. (Color online) X-ray orrelation length versus Tb
omposition for the entire range studied. The inset shows
examples of some GIXRD s ans for di�erent ompositions (o�set
for larity). The broad peak is an indi ation of an amorphous
stru ture. The s an for the highest Tb on entration shows a
sharp peak whi h is a signature of at least partially rystalline
stru ture.
!"!#$%&!
'()*+,-*
./
01234
5234
5234
./6-
'(!+,"6%&!#"
'()*+,-*
%234
%234
Figure 3. (Color online) XRR s an (points) and a �tted urve
(solid line) for xTb = 46 at.%. The inset shows the layer model
used to �t the XRR data.
an be attributed to the hange in atomi separation
mentioned above. At approximately xTb = 80 at.%
there is a sudden in rease in the orrelation length
whi h an be interpreted as an onset of rystallization.
GIXRD on the samples grown without a �eld have the
same appearan e and give the same atomi spa ings,
FWHM and orrelation length as the orresponding
�eld-grown samples.
XRR measurements were used to determine the
thi kness and quality of the layering in the samples. A
representative XRR s an an be seen in �g. 3. Clear
interferen e fringes arising from the total thi kness of
the �lms an be observed up to 2θ = 6◦, attesting
to their smoothness. By �tting the data to the layer
model shown in the inset it is possible to extra t
-5 -4 -3 -2 -1 0 1 2 3 4 5
0H (T)
-5
-3
-1
1
3
5
Ma
gn
etiz
atio
n (
A/m
)
105
Out-of-plane
In-plane
Figure 4. (Color online) Room temperature in-plane and
out-of-plane hysteresis loops for xTb = 13 at.%, measured
with VSM. A strong out-of-plane anisotropy is observed. The
slight di�eren e in saturation magnetization an be attributed
to sample alignment. The in-plane angle was φ = 90◦, i.e.
perpendi ular to the omposition gradient.
the layer thi knesses, densities and roughnesses. Low
surfa e roughnesses (root-mean-squared) in the range
0.6�1 nm are obtained for �lms with a total thi kness
of 52�57 nm whi h is similar to other amorphous
rare-earth�transition metal ompound �lms.[17℄ As
for GIXRD, XRR showed no signi� ant di�eren es
between samples grown with and without a magneti
�eld.
3.2. Magneti Properties
A ombination of MOKE and VSM measurements
in di�erent geometries was used to map out the
magneti properties of the TbCo. Films with a
Tb on entration below xTb = 45± 3 at.% were
ferrimagneti at room temperature, whi h is a slightly
larger omposition than the 38 at.% reported by
Betz et al.[23℄ In this omposition range, the �lms
have a strong out-of-plane anisotropy, as seen in the
hara teristi VSM measurements presented in �g. 4.
In the out-of-plane dire tion, the hysteresis loop is
square with a large (temperature dependent) remanent
magnetization whereas in the in-plane dire tion the
loop is smoothly varying with a small remanen e and
large saturation �eld. This is observed for �lms grown
both with and without an applied magneti �eld.
However, subtle di�eren es are seen in the in-plane
magnetization for these two ases. Figure 5 shows
in-plane hysteresis loops along two perpendi ular
dire tions in the plane, for samples grown with and
without �eld. Samples grown without �eld [�g. 5(a)℄
are isotropi in the plane as seen by the identi al loops
along the two dire tions. In ontrast, for samples
grown in a �eld [�g. 5(b)℄ an opening is observed
in the hysteresis loop in the dire tion parallel to the
Tailoring anisotropy and domain stru ture in amorphous TbCo thin �lms through ombinatorial methods 5
-0.5
0.0
0.5
1.0(a) No Growth Field
= 0° = 90°
-800 -400 0 400 800
-0.5
0.0
0.5
(b) Growth Field
= 0° = 90°
0H (mT)
Ma
gn
etiz
atio
n (
arb
. u
nits
)
Figure 5. (Color online) In-plane minor loops measured in the
L-MOKE geometry both parallel (φ = 0◦) and perpendi ular
(φ = 90◦) to the omposition gradient for (a) the sample grown
without an external �eld and (b) the sample grown in an in-
plane magneti �eld along φ = 90◦. The omposition at the
point measured was approximately xTb = 10 at.% for both
samples.
growth �eld whereas perpendi ular to the growth �eld
the hysteresis is identi al to that of the sample grown
without a �eld. This shows that, despite the out-of-
plane dire tion being the overall easy axis, there is
a omponent (of the easy axis) whi h lies along the
growth �eld dire tion. This shows that the external
growth �eld has indeed imprinted a small in-plane
anisotropy omponent.
Out-of-plane magnetization measurements by
VSM over the temperature range 10�320 K on�rm the
ferrimagneti ordering in the �lms. A ompensation
temperature Tcomp is observed where the oer ivity
diverges and the magnetization is zero, as shown
in �g. 6. This is due to the di�erent temperature
dependen e of the magnetization of the anti-aligned Tb
and Co magneti sublatti es whi h an el ea h other
out at Tcomp. With in reasing Tb ontent Tcomp is seen
to in rease and for ompositions above 21 at.% Tb,
Tcomp is above room temperature (see inset of �g. 6).
This value orresponds well with previously reported
values.[23, 24℄
The out-of-plane oer ivity is strongly dependent
on temperature and omposition as seen in �g. 6.
For the omposition shown in the main graph
(xTb = 20.2 at.%) the oer ivity is larger at room
temperature sin e it is lose to Tcomp. For the
smaller omposition of xTb = 13 at.% [�g. 4℄,
150 200 250 300
T (K)
0
1
2
3
4
Mr (
A/m
)
105
Tcomp
= 271 K
0
1
2
3
4
0H
c (
T)
Mr
Hc
16 17 18 19 20 21 22 23
xTb
(at.%)
0
100
200
300
Tco
mp (
K)
Figure 6. (Color online) The temperature dependen e of
the out-of-plane remanen e and oer ivity, for a sample pie e
with xTb = 20.2 at.% at the enter, as measured with VSM.
The oer ivity has a singularity and diverges at 271K while
the remanen e goes to zero at this ompensation temperature,
Tcomp. The inset shows the measured Tcomp versus omposition.
the oer ivity is instead quite small. In this ase
the measurement is performed at room temperature
whi h for this omposition is mu h higher than Tcomp.
Generally, for all ompositions the oer ivity de reases
with in reasing temperature above Tcomp while for
de reasing temperatures below Tcomp HC initially
de reases, but eventually rea hes a minimum and for
even lower temperatures in reases slightly on e again.
Magneti for e mi ros opy was used to examine
the magneti domain stru ture of the �lms for several
di�erent ompositions as shown in �g. 7, spe i� ally
to ompare the samples grown with and without an
external �eld. At around 7 at.% Tb (not shown
in �g. 7), the sample grown with an external �eld
exhibits a similar labyrinthine domain stru ture to
that of the sample grown in-�eld at 8 at.% [�g. 7( )℄.
For a slightly higher Tb on entration around 9 at.%,
[�g. 7(b) and (d)℄, there is a lear divergen e in the
domain stru tures between the two samples. For
the sample grown without an external �eld, the
domains begin to align parallel to the omposition
gradient, while for the sample grown in-�eld the
domains start to align parallel to the growth �eld.
This reinfor es the idea that the growth �eld does
indeed in�uen e the zero-�eld magnetization in the
sample, as was suggested by the L-MOKE results,
see �g. 5. To be sure that this e�e t was in fa t
related to the growth �eld, several MFM images were
measured for ea h sample and omposition. Before
ea h measurement, the sample was exposed to an
external in-plane �eld of 700 mT (simulating an L-
MOKE s an) applied either parallel or perpendi ular
to the omposition gradient. However, the trends
des ribed above remained onstant regardless of the
Tailoring anisotropy and domain stru ture in amorphous TbCo thin �lms through ombinatorial methods 6
dire tion of the most re ently applied �eld. This gives
strength to the assertion that the magneti stru ture
of the samples is imprinted during the growth pro ess.
For higher Tb on entrations the domains grow in size.
This evolution is faster for the sample grown with
an external �eld than the sample grown without. At
11 at.% the domains of the �eld-grown sample be ome
so large that several MFM s ans in di�erent surfa e
lo ations failed to ontain any domain boundaries.
Hen e, these images exhibited little ontrast and are
therefore omitted in �g. 7.
The origin of the PMA in Tb-Fe amorphous
�lms has been shown to be related to di�erent pair
orrelations between the Tb-Fe, Tb-Tb and Fe-Fe
atomi pairs in the plane and perpendi ular to the
plane [25℄. These di�eren es are indu ed by the broken
symmetry at the interfa es of the �lm during growth
and it is likely that the same applies to the origin
of the PMA in TbCo. The origins of �eld indu ed
magneti anisotropy in amorphous materials are at
present less well understood. It is thought that the
magneti �eld indu es hanges in the lo al atomi
on�guration [26℄ in the form of alignment of atomi
moment pairs via dipolar e�e ts [27℄, alignment of
atomi lusters via lo al spin-orbit oupling (single-
ion anisotropy) [28℄, or dire tion dependent bonding
between atoms of di�erent elements as des ribed
above [25℄. Imprinted anisotropy has also been
linked with the strain indu ed during growth through
magnetoelasti oupling [28℄. Although we annot
distinguish between these me hanisms here it is lear
that the dire tional dependen e of pair orrelations
indu ed by the �lm surfa es far outweighs the hanges
in the lo al on�guration or the magnetoelasti strain
indu ed by the growth �eld.
4. Con lusions
We have shown how ombinatorial methods are
valuable in mapping out various material properties
su h as amorphi ity and magneti anisotropy versus
omposition. We have furthermore shown that the
magneti properties of TbCo are very sensitive to
omposition and are ontinuously tunable, meaning
that the desired properties an be obtained by
arefully sele ting the omposition. This tunability, in
ombination with the amorphous stru ture and smooth
interfa es, makes amorphous TbCo �lms ideal for
perpendi ular ex hange oupled multilayer stru tures.
Furthermore, these TbCo �lms are a new example of
the possibilities asso iated with imprinting magneti
anisotropy in amorphous alloys. Even though TbCo
exhibits a strong intrinsi out-of-plane anisotropy for
all ompositions, imprinting an in-plane anisotropy
is still possible resulting in a tilt of the easy axis
away from the �lm normal. The dire tion of this
tilt an be ontrolled by the growth �eld and the
omposition gradient. The magneti domain stru ture
is strongly a�e ted by the anisotropy and an thus
be ontrolled by manipulating the omposition and
in-plane growth �eld. The possibility to ontrol the
orientation of the resulting elongated domains an
be useful in appli ations su h as magneti storage,
magneti logi , and magnoni devi es.
A knowledgments
This work was funded by the Swedish Resear h Coun il
(VR), The Swedish Foundation for International
Cooperation in Resear h and Higher Edu ation
(STINT), and UBA a knowledges funding from the
I elandi Resear h Fund grant nr. 141518-051.
The authors thank the IBA group at the Tandem
laboratory at Uppsala University for their help with
RBS measurements and analysis.
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Tailoring anisotropy and domain stru ture in amorphous TbCo thin �lms through ombinatorial methods 7
5 m(a)
5 m(b) 5 m(d)
5 m(c) 5 m(e)
5 m(f)
Grown in Field Grown without FieldG
row
th F
ield
Composition Gradient Axis
Figure 7. (Color online) Domain stru tures for the sample grown in an external �eld (a) and (b), and grown without an external
�eld ( )-(f). The ompositions are (a) 8.5 at.%, (b) 9.2 at.%, ( ) 8.5 at.%, (d) 9.3 at.%, (e) 11.5 at.%, and (f) 13.0 at.% Tb, all with
an un ertainty of ±0.4 at.%. Dark and light regions orrespond to areas where the sample magnetization points into or out of the
sample plane, respe tively. Field-grown samples with ompositions orresponding to (e) and (f) do not show any domain boundaries
in the s ale measured with MFM, and are hen e left out here. The �eld-grown sample with 7 at.% shows a similar pattern to ( ),
i.e., without any elongation. This omposition was not a essible on the sample grown without an external �eld.
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