ICEA S-108-720

ICEA S-I 08-720-2004

STANDARD FOR EXTRUDED INSULATION P O M R CABLES

RATED ABOVE 46 THROUGH 345 KV

Publication K E A S-108-720-2004

July 15,2004

0 2004 by

INSULATED CABLE ENGINEERS ASSOCIATION, Inc.

ICEA S-I 08-720-2004

STANDARD FOR

EXTRUDED INSULATION POWER CABLES RATED ABOVE 46 THROUGH 345 KV

Standard ICEA S-108-720-2004

Published By INSULATED CABLE ENGINEERS ASSOCIATION, Inc.

Post Office Box 1568 Carrollton, Georgia 301 12, U.S.A.

Approved by Insulated Cable Engineers Association, Inc.: June 7,2004 Accepted by AEIC: Cable Engineering Committee: February 9,2004 Approved by ANSI:

0 Copyright 2004 by the Insulated Cable Engineers Association, Inc. All rights including translation into other languages, reserved under the Universal Copyright Convention, the Berne Convention for the Protection of Literary and Artistic Works, and the international and Pan American Copyright Conventions.

KEA S-I 08-720-2004

FOREWORD

DATE: 7/15/04

This Standards Publication for Extruded Insulation Power Cables Rated above 46 to 345 kV (ICEA S- 108-720) was developed by the Insulated Cable Engineers Association Inc. (ICEA).

ICEA standards are adopted in the public interest and are designed to eliminate misunderstandings between the manufacturer and the purchaser and to assist the purchaser in selecting and obtaining the proper product for his particular need. Existence of an ICEA standard does not in any respect preclude the manufacture or use of products not conforming to the standard. The user of this Standards Publication is cautioned to observe any health or safety regulations and rules relative to the manufacture and use of cable made in conformity with this Standard.

Requests for interpretation of this Standard must be submitted in writing to the Insulated Cable Engineers Association, Inc., P. O. Box 1568, Carrollton, Georgia 301 12. An official written interpretation will be provided. Suggestions for improvements gained in the use of this Standard will be welcomed by the Association.

The ICEA expresses thanks to the Association of Edison Illuminating Companies, Cable Engineering Committee for providing the basis for some of the matenal included herein through their participation in the Utility Power Cable Standards Technical Advisory Committee (UPCSTAC), and to the Institute of Electrical and Electronics Engineers, Insulated Conductors Committee, Subcommittee A, Discussion Group A-I 4 for providing user input to this Standard.

The members of the ICEA working group contributing to the writing of this Standard consisted of the following:

f. Kuchta, Chairman

E. Bartolucci J. Cancelosi L. Hiivala R. Thrash

R. Bnstoi P. Cinquemani A. Pack E. Walcott

S. Campbell B. Fleming B. Temple N. Ware

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ICEA S-108-720-2004

TABLE OF CONTENTS

DATE: 711 5/04

Part 1 GENERAL .............................................................................................................................................. i 1.1 SCOPE .................................................................................................................................................... 1 1.2 GENERAL INFORMATION ................................................................................................................... 1 1.3 INFORMATION TO BE SUPPLIED BY PURCHASER ........................................................................ 1

1.3.1 1.3.2 1.3.3

Characteristics of Systems on which Cable is to be Used ...................................................... 1 Description of Installation .......................................................................................................... 2 Quantities and Description of Cable ......................................................................................... 2

1.4 INFORMATION TO BE SUPPLIED BY MANUFACTURER ............................................................... 2 1.5 DEFINITIONS AND SYMBOLS ............................................................................................................. 2

Part 2 CONDUCTOR ........................................................................................................................................ 6 2.0 GENERAL .............................................................................................................................................. 6 2.1 PHYSICAL AND ELECTRICAL PROPERTIES ................................................................................... 6

2.1 . 1 Copper Conductors ................................................................................................................... 6 2.1.2 Aluminum Conductors .............................................................................................................. 6 2.1.3 Special Conductors ................................................................................................................... 6

2.1.3.1 Segmental Conductors ................................................................................................ 7 2.2 OPTIONAL SEALANT FOR STRANDED CONDUCTORS ................................................................ 7 2.3 CONDUCTOR SIZE UNITS ................................................................................................................... 7 2.4 CONDUCTOR DC RESISTANCE ......................................................................................................... 7

Direct Measurement of dc Resistance Per Unit Length ........................................................... 7

2.5 CONDUCTOR DIAMETER .................................................................................................................... 8

2.4.1 2.4.2 Calculation of dc Resistance Per Unit Length .......................................................................... 8

CONDUCTOR SHIELD ........................................................................................................................ 14 3.1 MATERIAL ........................................................................................................................................... 14

Part 3

3.2 EXTRUDED SHIELD THICKNESS ..................................................................................................... 14 3.3 PROTRUSIONS AND IRREGULARITIES .......................................................................................... 14 3.4 VOIDS ................................................................................................................................................... 14 3.5 PHYSICAL REQUIREMENTS ............................................................................................................. 15 3.6 ELECTRICAL REQUIREMENTS ........................................................................................................ 15

Extruded Semiconducting Material ......................................................................................... 15 Extruded Nonconducting Material (For EPR Insulation Only) ............................................... 15

3.6.3 Semiconducting Tape ............................................................................................................. 15

3.6.1 3.6.2

3.7 WAFER BOIL TEST ............................................................................................................................. 15

Part 4 INSULATION ........................................................................................................................................ 16 4.1 MATERIAL ........................................................................................................................................... 16 4.2 INSULATION THICKNESS ................................................................................................................. 16

4.2.1 Selection of Proper Thickne sc ................................................................................................ 17 4.2.2 Insulation Eccentricity ............................................................................................................. 18

4.3 INSULATION REQUIREMENTS ......................................................................................................... 18 Physical and Aging Requirements ......................................................................................... 18 Electrical Test Requirements .................................................................................................. 19

4.3.1 4.3.2

4.3.2.1

4.3.2.3 4.3.2.4 4.3.2.5

Partial-Discharge for Discharge-Free Designs only ................................................. 19 4.3.2.2 Voltage Tests ............................................................................................................. 20

Insulation Resistance Test ........................................................................................ 20 Dielectric Constant and Dissipation Factor ............................................................... 21 Discharge (Corona) Resistance fro Discharge-Resistant EPR Designs only ......... 21

I C I 3 S-108-720-2004 DATE: 711 5104

4.3.3 Voids. Ambers. Gels. Agglomerates and Contaminants as Applicable ................................ 21 Crosslinked Polyethylene Insulation (XLPE) ............................................................ 21 Ethylene Propylene Rubber (EPR) ........................................................................... 21

4.3.4 Shnnkback - Crosslinked Polyethyiene Insulation (XLPE) Only ........................................... 22

Part 5 EXTRUDED INSULATION SHIELD .................................................................................................... 23 5.1 MATERIAL ........................................................................................................................................... 23 5.2 THICKNESS REQUIREMENTS .......................................................................................................... 23 5.3 PROTRUSIONS AND IRREGULARITIES .......................................................................................... 23 5.4 SEMICONDUCTING TAPE ................................................................................................................. 23 5.5 INSULATION SHIELD REQUIREMENTS .......................................................................................... 23

5.5.1 Removability ............................................................................................................................ 23 5.5.2 Voids ........................................................................................................................................ 24 5.5.3 Physical Requirements ........................................................................................................... 24 5.5.4 Electrical Requirements .......................................................................................................... 24 5.5.5 Wafer Boil Test ........................................................................................................................ 24

4.3.3.1 4.3.3.2

..

Part 6 METALLIC SHIELDING ....................................................................................................................... 25 6.1 GENERAL ............................................................................................................................................ 25 6.2 SHIELDS .............................................................................................................................................. 25

6.2.1 Helically Applied Tape Shield ................................................................................................. 25 6.2.2 Longitudinally Applied And Overlapped Corrugated Tape Shield ......................................... 25 6.2.3 Wire Shield .............................................................................................................................. 25 6.2.4 Flat Strap Shield ...................................................................................................................... 26

6.3 SHEATHS ............................................................................................................................................. 26 6.3.1 Lead Sheath ............................................................................................................................ 26 6.3.2 Smooth Aluminum Sheath ...................................................................................................... 26 6.3.3 Continuously Corrugated Sheath ........................................................................................... 26

6.4 RADIAL MOISTURE BARRIER .......................................................................................................... 27 6.5 OPTIONAL LONGITUDINAL WATER BLOCKiNG COMPONENTS ............................................... 27

Part 7 JACKET ................................................................................................................................................ 28 7.1 MATERIAL ........................................................................................................................................... 28

7.1 . 1 Polyethylene, Black ................................................................................................................. 28 7.1.2 Polyvinyl Chloride .................................................................................................................... 29

7.2 JACKET APPLICATION AND THICKNESS ...................................................................................... 30 7.2.1 Thickness of Jacket for Tape and Wire Shields ..................................................................... 30 7.2.2 Thickness of Jacket for Sheaths ............................................................................................. 30

7.3 OPTIONAL SEMICONDUCTING COATING ...................................................................................... 30 7.4 JACKET IRREGULARITY INSPECTION ........................................................................................... 30

7.4.1 Jackets without Optional Semiconducting Coating ................................................................ 30 7.4.2 Jackets with Optional Semiconducting Coating ..................................................................... 30

Part 8 CABLE IDENTIFICATION ................................................................................................................... 33 8.1 CABLE IDENTIFICATION ................................................................................................................... 33

8.1 .I Optional Center Strand Identification ..................................................................................... 33 8.1.2 Optional Sequential Length Marking ...................................................................................... 33

Part 9 PRODUCTION TESTS ......................................................................................................................... 34 9.1 TESTING .............................................................................................................................................. 34 9.2 SAMPLING FREQUENCY ................................................................................................................... 34 9.3 CONDUCTOR TEST METHODS ........................................................................................................ 34

Method for DC Resistance Determination ............................................................................. 34 9.3.1

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ICEA S-108-720-2004 DATE: 7/15/04

9.3.2 Cross-sectional Area Determination ...................................................................................... 34 9.3.3 Diameter Detemiination .......................................................................................................... 34

9.4 TEST SAMPLES AND SPECIMENS FOR PHYSICAL AND AGING TESTS .................................. 34 9.4.1 General .................................................................................................................................... 34 9.4.2 Measurement of Thickness .................................................................................................... 34

9.4.2.1 Micrometer Measurements ....................................................................................... 35 Optical Measuring Device Measurements ................................................................ 35

Number of Test Specimens .................................................................................................... 35 Size of Specimens .................................................................................................................. 35

9.4.2.2 9.4.3 9.4.4 9.4.5 9.4.6 9.4.7 9.4.8

Preparation of Specimens of Insulation and Jacket ............................................................... 36 Specimen for Aging Test ........................................................................................................ 36 Calculation of Area of Test Specimens .................................................................................. 36 Unaged Test Procedures ........................................................................................................ 36

Type of Testing Machine ........................................................................................... 36 Tensile Strength Test ................................................................................................ 36

9.4.8.4 Elongation Test .......................................................................................................... 37

9.4.8.1 Test Temperature ...................................................................................................... 36 9.4.8.2 9.4.8.3

9.4.9 Aging Tests ............................................................................................................................. 37 Aging Test Specimens .............................................................................................. 37 Air Oven Test ............................................................................................................. 37

9.4.9.1 9.4.9.2 9.4.9.3 Oil Immersion Test for Polyvinyl Chloride Jacket ..................................................... 37

9.4.10 Hot Creep Test ........................................................................................................................ 38 9.4.1 1 Solvent Extraction ................................................................................................................... 38 9.4.12 Wafer Boil Test for Conductor and Insulation Shields ........................................................... 38

9.4.12.1 Insulation Shield Hot Creep Properties .................................................................... 38 9.4.13 Amber, Agglomerate, Gel, Contaminant, Protrusion, Irregulanty and Void Test .................. 38

9.4.1 3.1 Sample Preparation ................................................................................................... 38 9.4.13.2 Examination ............................................................................................................... 38 9.4.1 3.3 Resampling for Amber, Agglomerate, Gel, Contaminant,

Protrusion, Irregularity and Void Test ....................................................................... 39 9.4.1 3.4 Protrusion and Irregularity Measurement Procedure ............................................... 39

9.4.14 Physical Tests for Semiconducting Material Intended for Extrusion ..................................... 40 9.4.1 4.1 Test Sample ............................................................................................................... 40 9.4.14.2 Test Specimens ......................................................................................................... 40 9.4.14.3 Elongation .................................................................................................................. 40

9.4.15 Retests for Physical and Aging Properties and Thickness .................................................... 40 9.5 DIMENSIONAL MEASUREMENTS OF THE METALLIC SHIELD ................................................... 40

9.5.1 Tape Shield ............................................................................................................................. 40 9.5.2 Wire Shield .............................................................................................................................. 40 9.5.3 Sheath ..................................................................................................................................... 41 9.5.4 Flat Straps ............................................................................................................................... 41

9.6 DIAMETER MEASUREMENT OF INSULATION AND INSULATION SHIELD ............................... 41 9.7 TESTS FOR JACKETS ....................................................................................................................... 41

9.7.1 Heat Shock .............................................................................................................................. 41 Preparation of Test Specimen .................................................................................. 41 Winding of the Test Specimen on Mandrels ............................................................. 41 Heating and Examination .......................................................................................... 42

9.7.2 Heat Distortion ......................................................................................................................... 42

9.7.3.1 Test Temperature ...................................................................................................... 42 9.7.3.2 Type of Testing Machine ........................................................................................... 42 9.7.3.3 Elongation Test .......................................................................................................... 42

9.8 VOLUME RESISTIVITY ....................................................................................................................... 43

9.7.1 .I 9.7.1.2 9.7.1.3

9.7.3 Cold Elongation ....................................................................................................................... 42

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ICEA 8-108-720-2004 DATE 7/15/04

9.8.1 Conductor Shield ..................................................................................................................... 43 9.8.2 Insulation Shield and Semiconducting Extruded Jacket Coating .......................................... 43 9.8.3 Test Equipment ....................................................................................................................... 43 9.8.4 Test Procedure ........................................................................................................................ 44

SHRINKBACK TEST PROCEDURE ............................................................................................. 44 9.9.1 Sample Preparation ................................................................................................................ 44 9.9.2 Test Procedure ........................................................................................................................ 44 9.9.3 Pass/Fail Criteria and Procedure ............................................................................................ 44

RETESTS ON SAMPLES ............................................................................................................... 44 AC VOLTAGE TEST ...................................................................................................................... 45

9.1 1 . 1 General .................................................................................................................................... 45 9.1 1.2 AC Voltage Test ...................................................................................................................... 45

PARTIAL-DISCHARGE TEST PROCEDURE .............................................................................. 45 METHOD FOR DETERMINING DIELECTRIC CONSTANT AND DIELECTRIC STRENGTH OF EXTRUDED NONCONDUCTING POLYMERIC STRESS CONTROL LAYERS ................................................................................ 45

9.14 WATER CONTENT ......................................................................................................................... 45 9.1 4.1 Water Under the Jacket .......................................................................................................... 46 9.14.2 Water in the Conductor ........................................................................................................... 46 9.14.3 Water Expulsion Procedure .................................................................................................... 46 9.14.4 Presence of Water Test .......................................................................................................... 46

PRODUCTION TEST SAMPLING PLANS .................................................................................... 47

9.9

9-10 9.11

9.12 9.13

9.15

Part I O QUALIFICATION TESTS ............................................................................................................... 50 10.0 GENERAL ....................................................................................................................................... 50 10.1 CABLE QUALIFICATION TESTS ................................................................................................. 50

Cable Design Qualification ..................................................................................................... 50 CaMe Bending Procedure ....................................................................................................... 53

10.1.2.1 Bending Diameter ...................................................................................................... 53 Thermal Cycling Procedure .................................................................................................... 53

10.1.3.1 Thermal Cycles .......................................................................................................... 53

10.1.4 Hot Impulse Test Procedure ................................................................................................... 54 10.1.5 AC Voltage Withstand Test Procedure ................................................................................... 10.1.6 Partial Discharge Test Procedure (For Discharge-Free Designs Only) ................................ 54 10.1.7 Measurement of Dissipation Factor ........................................................................................ 54 10.1.8 Dissection and Analysis of Test Specimens .......................................................................... 54

JACKET MATERIAL QUALIFICATION TESTS ........................................................................... 55 10.2.1 Polyethylene Jackets .............................................................................................................. 55

10.2.1.1 Environmental Stress Cracking Test ........................................................................ 55 10.2.1.1.1 Testspecimen .................................................................................................... 55 10.2.1.1.2 Test Procedure ................................................................................................... 55

10.2.1.2 Absorption Coefficient Test ....................................................................................... 55 10.2.2 Semiconducting Extnided Jacket Coatings ........................................................................... 55

10.2.2.1 Brittleness Temperature ............................................................................................ 55 10.2.3 Polyvinyl Chloride .................................................................................................................... 55

10.2.3.1 Sunlight Resistance ................................................................................................... 55 10.2.3.1.1 Test Samples ...................................................................................................... 55 10.2.3.1.2 Test Procedure ................................................................................................... 55

OTHER QUALIFICATION TESTS ................................................................................................. 56 10.3.1 Insulation Resistance .............................................................................................................. 56 10.3.2 Accelerated Water Absorption Tests ...................................................................................... 56 10.3.3 Resistance Stability Test ......................................................................................................... 56

10.1 . 1 10.1.2

1 O . 1.3 10.1.3.2 Voltage During Themal Cycles ................................................................................ 54

10.2

10.3

..

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ICEA S-108-720-2004 DATE: 7/15/04

10.3.4 Brittleness Temperature for Semiconducting Shields ............................................................ 57 10.3.5 Discharge Resistance Test for Discharge-Resistant EPR Designs only .............................. 57

10.3.5.1 Test Specimens ......................................................................................................... 57 10.3.5.2 Test Environment ...................................................................................................... 57 10.3.5.3 Test Electrodes .......................................................................................................... 57

Part 11 APPENDICES ................................................................................................................................. 58 NEMA, ICEA, IEEE, ASTM AND ANSI STANDARDS (Normative) ..................... 58

A l NEMA PUBLICATIONS .......................................................................................................... 58 A2 ICEA PUBLICATIONS ............................................................................................................ 58

IEEE AND ANSI STANDARDS .............................................................................................. 58 A4 ASTM STANDARDS ............................................................................................................... 58

EMERGENCY OVERLOADS (Normative) ............................................................. 61

OF THE INSULATION SHIELD, LEAD SHEATH AND JACKET (Normative) .... 63

D1 CONDUCTOR ......................................................................................................................... 65 D1.l Function ..................................................................................................................... 65 D1.2 Material ...................................................................................................................... 65

02 CONDUCTOR SHIELD .......................................................................................................... 65 D2.1 Function ..................................................................................................................... 65

D2.1.1 Nonconducting .... ............................................................................................... 65 D2.1.2 Semiconducting .................................................................................................. 65

D2.2 Voltage Stress ........................................................................................................... 65 O3 INSULATION ........................................................................................................................... 66 04 INSULATION SHIELD ............................................................................................................ 66

D4.1 Semiconducting Shield .............................................................................................. 67 D4.2 Metallic Shield ............................................................................................................ 67

D5 JACKET ................................................................................................................................... 67 HANDLING AND INSTALLATION PARAMETERS (Informative) ........................ 69

E l INSTALLATION TEMPERATURES .................................................................... .................. 69 E2 RECOMMENDED MINIMUM BENDING RADIUS ................................................................ 69 E3 DRUM DIAMETERS OF REELS ............................................................................................ 69 E4 MAXIMUM TENSION AND SIDEWALL BEARING PRESSURES ....................................... 69 E5 ELECTRICAL TESTS AFTER INSTALLATION .................................................................... 70

E5.1 Insulation .................................................................................................................... 70 E5.2 Jacket ......................................................................................................................... 70

TRADITIONAL INSULATION WALL THICKNESS (Informative) ......................... 71 ADDiTiONAL SHIELD WIRE AND CONDUCTOR INFORMATION (Informative)72 ETHYLENE ALKENE COPOLYMER (EAM) (Informative) ................................... 75 SPECIFICATION FOR ALLOY LEAD SHEATHS (Informative) ........................... 76

Il PURPOSE ............................................................................................................................... 76 12 MATERIAL .............................................................................................................................. 76 13 REQUIREMENTS ................................................................................................................... 76

APPENDIX A

A3

APPENDIX B APPENDIX C

APPENDIX D

PROCEDURE FOR DETERMINING THICKNESS REQUIREMENTS

CABLE COMPONENT FUNCTION (Informative) .................................................. 65

APPENDIX E

APPENDIX F APPENDIX G APPENDIX H APPENDIX I

LIST OF TABLES

Table 2-1 Table 2-2

Table 2-2 (Metric)

Weight Increment Factors ........................................................................................... 8 Nominal Direct Current Resistance in Ohms Per 1000 Feet at 25 OC of Concentric Lay Stranded and Segmental Conductor ......................................... 9 Nominal Direct Current Resistance in Milliohms Per Meter at 25 OC of Concentric Lay Stranded and Segmental Conductor ....................................... 10

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ICEA S-108-720-2004 DATE: 7/15/04

Table 2-3 Table 2-3 (Metric) Table 2 4 Table 2 3

Table 3-1 Table 4-1 Table 4-2

Table 4-3 Table 4-4 Table 4 5 Table 4-6 Table 4-7 Table 4-8 Table 5-1 Table 6-1 Table 7-1 Table 7-2 Table 7-3 Table 7-4 Table 7 6 Table 9-1 Table 9-2 Table 9-3 Table 9 4 Table 9 5 Table 10-1 Table 10-2 Table D-I Table E-I Table F-I

Table G-1 Table 6-2 Table 6-3 Table 1-1

Nominal Diameters for Round Copper and Aluminum Conductors .................... i1 Nominal Diameters for Round Copper and Aluminum Conductors .................... 12 Nominal Diameters for Segmental Copper and Aluminum Conductors ............. 13 Factors for Determining Nominal Resistance of Stranded Conductors Per 1000 Feet at 25 OC ................................................................................................ 13 Extruded Conductor Shield Thickness .................................................................... 14 Conductor Maximum Temperatures ........................................................................ 16 Conductor Sizes, Maximum Insulation Eccentricity, Insulation Maximum Stress and Test Voltages ........................................................................................... 18 Insulation Physical Requirements ............................................................................ 19 Pattial-Discharge Requirements ............................................................................... 19 Test Voltages for Partial-Discharge Measurements .............................................. 20 Impulse Values ............................................................................................................ 20 Dielectric Constant and Dissipation Factor ............................................................ 21 Shrinkback Test Requirements ................................................................................ 22 Insulation Shield Thickness ...................................................................................... 23 Lead Sheath Thickness .............................................................................................. 26 Polyethylene, Black .................................................................................................... 28 Polyvinyl Chloride ....................................................................................................... 29 Semiconducting Extruded Coating .......................................................................... 31 Jacket Thickness and Test Voltage for Tape or Wire Shield Cables ................... 31 Jacket Thickness and Test Voltage for All Sheath Cables ................................... 32 Test Specimens for Physical and Aging Tests ....................................................... 35 Bending Requirements for Heat Shock Test .......................................................... 42 Summary of Production Tests and Sampling Frequency Requirements ........... 47 Plan E ........................................................................................................................... 49 Plan F ............................................................................................................................ 49 Generic Grouping of Cable Components ................................................................ 51 Accelerated Water Absorption Properties .............................................................. 56 Jacket Functions ........................................................................................................ 67 Recommended Minimum Bending Radius ............................................................. 69 Traditional Insulation Thickness from AEIC CS7-93, Test Voltages and Conductor Sues .................................................................................................. 71 Solid Copper Shield Wires ........................................................................................ 72 Concentric Stranded Class B Aluminum and Copper Conductors ..................... 73 Concentric Stranded Class C and D Aluminum and Copper Conductors .......... 74 Chemical Requirements for Alloy Lead Sheaths ................................................... 76

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ICEA S-108-720-2004 DATE: 7/15/04

Part 1 GENERAL

1 .I SCOPE

This standard applies to materials, constructions, and testing of crosslinked polyethylene (XLPE) and ethylene propylene rubber (EPR) insulated single conductor shielded power cables rated above 46 to 345 kV used for the transmission of electrical energy.

1.2 GENERAL INFORMATION

This publication is arranged to allow for selection of individual components (such as conductors, insulation, semiconducting shields, metallic shields, jackets, etc.) as required for specific installation and service conditions.

Parts 2 to 7 cover the major components of cables:

Part 2 - Conductor Part 3 - Conductor Shield Part 4 - Insulation Part 5 - Extruded Insulation Shield Part 6 - Metallic Shielding Part 7 - Jacket

Each of these parts designates the materials, material characteristics, dimensions, and tests applicable to the particular component.

Part 8 covers identification of cables. Part 9 covers production test procedures applicable to cable component materials and to completed

Part 1 O covers qualification test procedures. Part 11 contains appendices of pertinent information.

cables.

Units in these standards are generally expressed in the Imperial system. For information only, their approximate metric equivalents are included.

1.3 INFORMATION TO BE SUPPLIED BY PURCHASER

When requesting proposals from cable manufacturers, the prospective purchaser should describe the cable desired by reference to pertinent provisions of these standards. To help avoid misunderstandings and possible misapplication of the cable, the purchaser should also furnish the following information:

1.3.1 Characteristics of Systems on which Cable is to be Used

a. Desired ampacity for normal and emergency operation. b. Frequency. c. Nominal phase to phase operating voltage. d. Maximum phase to phase operating voltage. d. Basic Impulse Voltage. e. Symmetrical and asymmetrical fault current and duration for conductor and metallic shieldlsheath. f. Daily load factor.

I

ICEA S-108-720-2004 DATE 7/15/04

1.3.2 Description of Installation

a. Installation method and geometry, for example: 1. In underground ducts. 2. Direct buried in ground. 3. In air and whether the effects of wind andlor solar radiation should be considered. 4. In tunnel and whether there are special fire retardant features. 5. Descriptions other than the foregoing.

1. Ambient air temperature andor ambient ground temperature at burial depth. 2. Minimum temperature at which cable will be installed. 3. Number of loaded cables in direct buried cable chase, duct bank or conduit system. If in cable

chase, describe cable spacing and burial depth. If in conduit, describe size (id and od) type of conduit (metallic or nonmetallic), number of occupied and unoccupied conduits, whether endosed or exposed, spacing between conduits and burial depth of conduits.

b. Installation conditions.

4. Method of bonding and grounding of metallic shieldsheath. 5. Wet or dry location. 6. Thermal resistivity (rho) of coil, concrete andlor thermal backfill.

1.3.3 Quantities and Description of Cable

a. Total cable length, including any special test lengths, and specific shipping lengths if required. b. Nominal phase to phase voltage. c. Type of conductor - copper or aluminum, filled or unfilled strand. d. Size of conductors in circular mils. If conditions require other than standard stranding, a complete

description should be given. e. Type of insulation. f. Type of metallic shieldsheath. g. Type of jacket. h. Maximum allowable overall diameter, if limited by conduit inside diameter or other considerations. i. Method of cable identification.

1.4INFORMATION TO BE SUPPLIED BY MANUFACTURER

When submitting proposals to the prospective purchaser, cable manufacturers shall describe the cable proposed to this standard. To help avoid misunderstandings, the manufacturer shall furnish at least the following information:

a. b.

C. d. e. f. 9.

h. I.

Nominal insulation thickness. A complete description of the cable including dimensions and material description of each layer. This infonation maybe in the form of a drawing. Nominal phase to phase voltage. Normal conductor maximum operation temperature the cable was designed to meet. Emergency conductor maximum operation temperature the cable was designed to meet. Fault capacity as defined by customer parameters. The voltage stress at the conductor shield/insulation interface (maximum stress) and at the insulationíinsulation shield interface (minimum stress). Maximum allowable pulling tension and sidewall bearing pressure. Dielectric constant.

IJDEFINITIONS AND SYMBOLS

Active Length: Length of cable covered by insulation shield and metallic shield.

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ICEA S-108-720-2004 DATE: 7/15/04

Agglomerate: A discernible area of compound constituents in ethylene propylene based insulation which is generally opaque and can be broken apart.

Amber: A localized area in crosslinked polyethylene insulation which is dissimilar in color (ranging from bright yellow to dark red) from the surrounding insulation, which passes light and is not always readily removable from the insulation matrix. This does not include douds, swirls or flow patterns which are normally associated with the extnrsion process.

AWG:

BIL:

Cable Core:

Cable Core Extruder Run:

Certified Test Report:

Contaminant:

Dielectric Constant:

Discharge-Free Cable Design:

DischargeResistant Cable Design:

Dissipation Factor:

Dry Location:

EPR Insulating Compound:

Gel:

High Dielectric Constant Compound:

American Wire Gauge

Basic Impulse insulation Level.

The portion of a cable which includes the conductor, the conductor shield, the insulation and the extruded insulation shield.

A continuous run of cable core with one conductor size, one conductor shield compound, one insulation compound and thickness, and one insulation shield compound.

A report containing the results of producuon tests or qualification tests which dedares that the cable shipped to a customer meets the applicable requirements of this standard.

Any solid or liquid material which is not an intended ingredient.

The ratio of the capacitance of a given configuration of electrodes with the material as a dielectric to the capacitance of the same electrode configuration with a vacuum (or air for most practical purposes) as the dielectric.

A cable designed to eliminate electrical discharge in the insulation system at normal operating voltage.

A cable design capable of withstanding electrical discharge in the insulation system at normal operating voltage.

The cotangent of the dielectric phase angle of a dielectric material or the tangent of the dielectric loss angle. It is often called tan 6.

A location not normally subject to dampness or wetness.

A mixture of ethylene propylene base resin and selected ingredients.

A discernible region of cornpound constituents in ethylene propylene based insulation which is gelatinous, not readily removable from the insulation, and generally translucent.

An extruded compound used for the conductor shield which has a dielectric constant typically between 8 and 200.

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ICEA S-108-720-2004 DATE: 711 5/04

Jacket Extruder Run: A cable with a jacket which was applied in one continuous run with one jacket compound and one jacket thickness.

Thousands of circular mils. kcmil:

Lot (Cable): The quantity of cabie requiring one test.

Lot (Material): A quantity of material used in cable conshction which is produced at the same location under the same manufacturing conditions during the same time period.

A continuous length of cable collected on a reel at the end of an extrusion line. Master Length:

Maximum Conductor Temperatures:

The highest conductor temperature permissible for any part of the cable under normal operating current load.

Normal Operating:

Emergency Overload:

The highest conductor temperature permissible for any part of the cable during emergency overload of specified time, magnitude, and frequency of application.

Short Circuit:

The highest conductor temperature permissible for any part of the cable during a circuit fault of specified time and magnitude.

The value by which a quantity is designated and often used in tables (taking into account specified tolerances).

Nominal Value:

Partial Discharge Level:

The maximum continuous or repetitious apparent charge transfer, measured in picocoulombs, occumng at the test voltage.

pC: picocoulombs

Production Tests: Tests defined in Part 9 of this standard with specific test frequency.

Qualification Tests: Tests defined in Part 1 O of this standard with specific test frequency.

Rated Voltage: Nominal phase to phase operating voltage.

Room Temperature (RT):

25 OC 15 OC air temperature.

Shipping Length: A completed length of cable which has passed all test requirements. It may or may not be cut into shorter lengths before it is supplied to the end use customer.

Shipping Reel:

Translucent:

A completed reel of cable shipped to the end use customer.

A localized area in crosslinked polyethylene insulation dissimilar to the surrounding insulation which passes light and is not readily removable from the insulation matrix. There are no requirements for translucents in this standard.

v: Nominal phase-to-phase operating voltage (Rated Voltage).

4

ICEA S-108-720-2004 DATE: 7/15/04

V,: Nominal phase-to-gmund operating voltage

V,: Phase-to-ground test voltage

Vented Water Tree: A water tree which originates at the conductor shield or insulation shield.

Void: Any cavity in a compound, either within or a t the interface with another extruded layer.

Wet Location: Installations under ground or in concrete slabs or masonry in direct contact with the earth; in locations subject to saturation with water or other liquids and in unprotected locations exposed to weather.

XLPE Insulation: Crosslinked polyethylene insulation.

5

ICE3 S-108-720-2004 DATE: 7115104

Part 2 CONDUCTOR

2.0 GENERAL

Conductors shall meet the requirements of the appropriate ASTM standards referenced in this standard except that resistance shall detemine cross-sectional area as noted in 2.4 and diameters shall be in accordance with 2.5. Requirements of a referenced ASTM standard shall be determined in accordance with the procedure or method designated in the referenced ASTM standard unless othewke specified in this standard.

The following technical infomation on typical conductors may be found in Appendix G:

a. Approximate diameters of individual wires in stranded conductos. b. Approximate conductor weights.

2.1 PHYSICAL AND ELECTRICAL PROPERTIES

The conductors used in the cable shall be copper in accordance with 2.1.1 or aluminum in accordance with 2.1.2, as applicable, except as noted in 2.0. Conductors shall be stranded. The outer layer of a stranded copper conductor may be tin coated to assist with free stripping of the adjacent polymeric layer. There shall be no water in stranded conductors in accordance with 9.14.

2.1 .I

1. 2. 3. 4. 5. 6. 7. 8.

2.1.2

1. 2. 3. 4. 5. 6. 7. 8.

9.

2.i.3

Copper Conductors

ASTM B 3 for soff or annealed uncoated copper. ASTM B 5 for electrical grade copper. ASTM B 8 for Class A, B, C, or D stranded copper conductors. ASTM B 33 for soft or annealed tincoated copper wire. ASTM B 496 for compact-round stranded copper conductors. ASTM B 784 for modified concentric lay stranded copper conductor. ASTM B 787 for 19 wire combination unilay-stranded copper conductors. ASTM B 835 for compact round stranded copper conductors using cingle input wire constructions.

Aluminum Conductors

ASTM B 230 for electrical grade aluminurn 1350-H19. ASTM B 231 for Class A, B, C, or D stranded aluminurn 1350 conductors. ASTM B 233 for electrical grade aluminum 1350 drawing stock. ASTM B 400 for compact-round stranded aluminum 1350 conductors ASTM B 609 for electrical grade aluminum 1350 annealed and intermediate tempers. ASTM B 786 for I 9 wire combination unilay-stranded aluminum 1350 conductors. ASTM B 800 for 8000 series aluminum alloy annealed and intermediate tempers. ASTM B 801 for 8000 series aluminum alloy wires, compad- round, compressed and concentric-lay Class A, B, C and D stranded conductors. ASTM B 836 for compact round stranded aluminum conductors using single input wire constructions.

Special Conductors

Special conductors (segmental, etc.) shall be made up according to characteristics and details of construction as agreed to by the manufacturer and purchaser.

6

9 ICEA S-108-720-2004

2.1.3.1 Segmental Conductors

DATE 7/15/04

Each segment shall conform, as to the number of individual strand splices, to the requirements of ASTM B 8 or B 231 whichever is applicable.

Binder tapes when used, shall be nonmagnetic and shall have sufficient mechanical strength so that they can be applied with tension adequate to minimize the displacement of the segments. Binder tapes shall be applied substantially free of indents, mases, tears or whkles. Defects shall not be such that they protrude through the conductor shield.

The eccentricity of cabled segmental conductors shall be determined from measurement of both maximum callipered and circumference tape diameters taken at five locations spaced approximately one foot (0.3 m) apart along the conductor. The average of the five maximum callipered diameters shall not exceed the average of the five circumference tape diameters by more than 2 percent. At any one location, the maximum callipered diameter shall not exceed the circumference tape diameter by more than 3 percent.

2.2 OPTIONAL SEALANT FOR STRANDED CONDUCTORS

If required by the purchaser, a sealant designed as an impediment to longitudinal water penetration shall be incorporated in the interstices of the stranded conductor. Compatibility with the conductor shield shall be determined in accordance with ICEA Publication T-32-645. Longitudinal water penetration resistance shall be determined in accordance with ICEA Publication T-31-610 and shall meet a minimum requirement of 5 psig.

2.3 CONDUCTOR SIZE UNITS

Conductor size shall be expressed by cross-sectional area in thousand circular mils (kcmil). The metric equivalents for all sizes are described in Table 2-3 (Metric).

2ACONDUCTOR DC RESISTANCE

The dc resistance per unit length of each conductor in a shipping length of completed cable shall not exceed the value 2% greater than the appropriate nominal value specified in Table 2-2. The dc resistance shall be determined in accordance with 2.4.1 or 2.4.2.

For conductor strandings or sizes not listed in Tables 2-2, the nominal direct current resistance per unit length of a completed single conductor cable shall be calculated from the factors given in Table 2-5 using the following formula:

f R = - x 10” A

Where: R = Conductor resistance in Ni000 R. f = Factor from Table 2-5 A = Cross-secîbnal area of conductor in kcmil, determined in accordance with 9.3.2

Where the outer layer of a stranded copper conductor is coated, the direct current resistance of the resulting conductor shall not exceed the value specified for an uncoated conductor of the same size.

2.4.1 Direct Measurement of dc Resistance Per Unit Length

The dc resistance per unit length shall be determined by dc resistance measurements made in accordance with 9.3.1 to an accuracy of 2 percent or better. If measurements are made at a temperature other than 25 OC, the measured value shall be converted to resistance at 25 OC by using either of the following:

7

KEA S-108-720-2004

Conductor TypeiSUe

Ail Sizes

Concentric-lay Strand, Class A, B, C and D

>2000 - 3000 kcmil (>I O1 3 - 1520 mm') 250 - 2000 kcmil (127- I O1 3 mm2)

>3000 - 4000 kcmil (>I 520 - 2027 mm2)

DATE: 7/15/04 4 Y

Weight Factor (K)

1

I .o2 I .O3 1 .o4

1. The appropriate multiplying factor obtained from ICEA T-27-581/NEfvíA WC-53. 2. A multiplying factor calculated using the applicable formula in ICEA T-27-581MEMA WC-53.

I .o2 Concentric-lay Strand 8000 Series Aluminum All Sizes -

If verification is required for the directcurrent resistance measurement made on an entire length of completed cable, a sample at least I foot (0.3 m) long shall be cut from that reel length, and the directcurrent resistance of each conductor shall be measured using a Kelvin-type Bridge or a potentiometer.

2.4.2 Calculation of dc Resistance Per Unit Length

The dc resistance per unit length at 25 OC shall be calculated using the following formula:

R=K.- P A

Where: R = Conductor resistance in Wl O00 ft K = Weight increment factor, as given in Table 2-1. p = volume resistivity in Q-cmil/ft, determined in accordance with ASTM B 193 using round wires (see

A = Cross-sectional area of conductor in kcmil, determined in accordance with 9.3.2. Table 2-5)

When the volume resistivity is expressed in nanoohm meters (rS2.m) and area is expressed in square millimeters (mm') the resistance is expressed in milliohms per meter ( d m ) .

2SCONDUCTOR DIAMETER

The conductor diameter shall be measured in accordance with 9.3.3. The diameter shall not differ from the nominal values shown in Table 2-3 by more than f 2 percent.

Table 2-1 Weight Increment Factor;

1 .oz Combination Unilay Strand All Sizes

8

ICEA S-108-720-2004

Class6

0.0448 0.0374 0.0320

0.0277 0.0246 0.0222 0.0204 0.01 87

0.0171 0.0159 0.0148 0.0139 0.0123

DATE: 7/15/04

ClassC CiassD

0.0448 0.0448 ... 0.0374 0.0374 ... 0.0320 0.0320 ... 0.0280 0.0280 ... 0.0249 0.0249 ... 0.0224 0.0224 ... 0.0204 0.0204 ... 0.01 87 0.01 87 ...

0.0172 0.0173 ... 0.01 60 0.01 60 ... 0.0149 0.0150 ... 0.0140 0.0140 ... 0.0126 0.0126 ...

Table 2-2 Nominal Direct Current Resistance in Ohms Per 1000 Feet at 25 OC

of Concentric Lav Stranded and Seamental Conductor I I Segmental Concentnc Lay Stranded’

0.01 11 0.0101 0.00925 0.00888 0.00854

Conductor Size kcmil

0.01 11 0.0112 0.0177 0.0102 0.0102 0.0161 0.00934 0.00934 0.0147 0.00897 0.00897 0.0141 0.00861 0.00862 0.0136

I Aluminum I Copper I

0.00793 0.00740 0.00694 0.00653 0.00634

Copper

-~ ~~ ~~

0.00793 0.00801 0.0126 0.00740 0.00747 0.0118 0.00700 0.00700 0.0111 0.00659 0.00659 0.0104 0.00640 0.00640 0.0101

Uncoated

~ ~

0.00616 0.00584 0.00555 0.00498 0.00448

0.00408 0.00374 0.00348 0.00323 0.00302 0.00283

coated 1 Aluminum

~ ~~~ -~ ~

0.00616 0.00622 0.00982 0.00584 0.00589 0.00931 0.00555 0.00560 0.00885

... ... 0.00794 .*. ... 0.00715

... ... 0.00650 _.. ... 0.00596 ... ... 0.00555 ... ... 0.00515 ... ... 0.00481 ... ... 0.00451

Class B,C,D class B,C,D Uncoated

...

...

...

...

...

...

...

...

250 300 350

0.0707 0.0590 0.0505

0.0431 0.0360 0.0308

400 450 500 550 600

0.0442 0.0393 0.0354 0.0321 0.0295

0.0272 0.0253 0.0236 0.0221 0.0196

0.0269 0.0240 0.0216 0.01 96 0.0180

0.0166 0.01 54 0.0144 0.0135 0.01 20

650 700 750 800 900

... I..

...

...

...

1 o00 1100 1200 1250 1300

0.0177 0.0161 0.0147 0.0141 0.0136

0.0108 0.00981 0.00899 0.00863 0.00830

0.0108 0.00981 0.00899 0.00863 0.00830

0.00771 0.00719 0.00674 0.00634 0.00616

1400 1500 1600 1700 1 750

~~

0.0126 0.01 18 0.01 11 0.0104 0.0101

~

0.00771 0.00719 0.00674 0.00634 0.00616

1800 1900 2000 2250 2500

2750 3000 3250 3500 3750 4000

~

0.00982 0.00931 0.00885 0.00794 0.00715

0.00650 0.00596 0.00555 0.00515 0.00481 0.00451

~~

0.00599 0.00568 0.00539 0.00484 0.00436

0.00396 0.00363 0.00338 0.00314 0.00293 0.00275

~

0.00599 0.00568 0.00539 0.00484 0.00436

0.00396 0.00363 0.00338 0.00314 0.00293 0.00275

ConcenMc lay stranded includes compressed and compact conductors.

9

KEA S-I 08-720-2004 DATE: 7/15/04

Nominal Direct Current Resistance in Milliohms Per Meter at of Concentric Lav Stranded and Seamental Conductor

Concentric ay stranded'

Aluminum copper Condudor Size

Uncoated coated kmil mm' ClassB,C,D

UassB,C,D CiassB ClassC ClassD

250 127 0.232 0.141 0.147 0.147 0.147 300 1 52 0.194 0.118 0.123 O. 123 O. 123 350 177 0.166 0.101 0.105 0.105 0.105

400 203 0.145 0.0882 0.0909 0.091 8 0.0918 450 228 0.129 0.0787 0.0807 0.0817 0.081 7 500 253 0.116 0.0708 0.0728 0.0735 0.0735 550 279 0.105 0.0643 0.0669 0.0669 0.0669 600 304 0.0968 0.0590 0.0613 0.0613 0.061 3

650 329 0.0892 0.0544 0.0561 0.0564 0.0567 700 355 0.0830 0.0505 0.0522 0.0525 0.0525 750 380 0.0774 0.0472 0.0485 0.0489 0.0492 800 405 0.0725 0.0443 0.0456 0.0459 0.0459 900 456 0.0643 0.0394 0.0403 0.041 3 0.0413

1 O00 507 0.0581 0.0354 0.0364 0.0364 0.0367 1100 557 0.0528 0.0322 0.0331 0.0335 0.0335 1200 608 0.0482 0.0295 0.0303 0.0306 0.0306 1250 633 0.0462 0.0283 0.0291 0.0294 0.0294 1300 659 0.0446 0.0272 0.0280 0.0282 0.0283

1400 709 0.0413 0.0253 0.0260 0.0260 0.0263 1 500 760 0.0387 0.0236 0.0243 0.0243 0.0245 1600 81 1 0.0364 0.0221 0.0228 0.0230 0.0230 1700 861 0.0341 0.0208 0.0214 0.0216 0.0216 1750 887 0.0331 0.0202 0.0208 0.021 o 0.0210

1800 912 0.0322 0.0196 0.0202 0.0202 0.0204 1900 963 0.0305 0.0186 0.0192 0.0192 0.0193 2000 1013 0.0290 0.0177 0.0182 0.0182 0.0184 2250 1140 0.0260 0.0159 0.0163 ... ... 2500 1266 0.0235 0.0143 0.0147 ... ... 2750 1393 0.0213 0.0130 0.0134 ... _.. 3000 1520 0.0196 0.0119 0.0123 ... -.. 3250 i a 7 0.0182 0.01 11 0.0114 ... ... 3500 1773 0.0169 0.0103 0.01 06 ... ... 3750 1990 0.0158 0.0096 0.0099 ... ... 4000 2027 0.0148 0.0090 0.0093 ... ...

Concentric lay stranded includes compressed and compact condudors.

25 OC

Segmentai

copper

Uncoated

Afuminum

... ...

... ...

... ...

... ...

... ...

... ...

... ...

... ...

... ...

... ...

... ...

... ...

... ...

0.0581 0.0354 0.0528 0.0322 0.0482 0.0295 0.0462 0.0283 0.0446 0.0272

0.0413 0.0253 0.0387 0.0236 0.0364 0.0221 0.0341 0.0208 0.0331 0.0202

0.0322 0.0196 0.0305 0.0186 0.0290 0.0177 0.0260 0.0159 0.0235 0.0143

0.0213 0.0130 0.0196 0.0119 0.0182 0.0111 0.0169 0.0103 0.0158 0.0096 0.0148 0.0090

10

ICEA S-108-720-2004 DATE: 711 5104

Class D

0.576 0.631 0.682

0.729 0.773 0.815 0.855 0.893

Table 2-3 Nominal Diameters for Round Copper and Aluminum Conductors

Combination Unilay Unilay Compressed

0.554 0.542 0.607 0.594 0.656 0.641

0.701 0.685 0.744 0.727 0.784 0.766 ... 0.804 ... 0.840

Nominal Diameters (Inches) Condudor S i e

400 450 500 550 600

I

0.659 0.700 0.736 0.775 0.813

kmil Compact'

0.520 0.570 0.616

650 700 750 800 900

1 O00 1100 1200 1250 1300

1400 1500 1600 1700 1750

1800 1900 2000 2250 2500

0.845 0.877 0.908 0.938 0.999

1 .o60 ... ... ... ... ... ... ... ... ... ... ... ... ... ...

0.901 0.935 0.968 1 .o00 1 .o61

1.117 1.173 1.225 1.251 1.276

1.323 1.370 1.415 1.459 1.480

0.929 0.930 0.964 0.965 0.998 0.999 1.031 1 .O32 1 .o94 1 .O93

1.152 1.153 1.209 1.210 1263 1264 1.289 1.290 1.315 1.316

1.364 1.365 1.412 1.413 1.459 1.460 1.504 1.504 1.526 1.527

concentric Lay stranded

Class C

0.575 0.576 0.61 1 0.630 0.631 0.661 0.681

0.930 0.965 0.998 1 .O32 1 .O95

1.153 1.21 1 1.264 1.290 1.316

1.365 1.413 1.460 1.504 1.527

0.706 0.749 0.789 0.829 0.866

... 0.874

... 0.907

... 0.939

... 0.969

... 1 .O28

... 1 .o84

... 1.137

... 1.187

... 1.212

... 1.236

... 1.282

... 1.327

... 1.371

... 1.413

... 1.434

0.728 0.772 0.813 0.855 0.893

2750 3000 3250 3500 3750 4000

0.729 0.773 0.814 0.855 0.893

...

...

...

...

...

...

1.502 1.542 1.583 1.678 1.769

1.548 1.590 1.632 1.730 1 .a24

1.548 1.590 1.632 1.731 1.824

1 .ô56 1.938 2.018 2.094 2.168 2.240

1.914 1.998 2.081 2.159 2.235 2.309

1.914 1.999 2.081 2.159 2236 2.309

1 .%9 1.591 1.632 1.731 1 .824

...

...

...

...

...

1.454 1.494 1.533

...

...

1.914 1.999 2.081 2.1 58 2.234 2.309

...

...

...

...

...

...

-.. ... ... ... ... ...

Diameters shown are for compact round, compact modified concentric and compact single input wire. Diameters shown are for conœnbic round and mod$ed concentric.

ICEA S-108-720-2004 DATE: 7/15/04

kcmil mm'

250 127 300 152 350 in

400 203 450 228 500 253 550 279 600 304

650 329 700 355 750 380 800 405 900 456

1000 507 1100 557 1200 608 1250 633 1300 659

' 1400 709 1500 760 1600 811 1700 861 1750 887

1800 912 963

2250 1140

' 1013

I 2500 1266

1 2750 1393 1 3000 1520

3250 1647 3500 1773 3750 1990 4000 2027

Diameten shown are ** Diameters shown are

Table 2-3 (Metric) Nominal Diameters for Round Copper and Aluminum Conductors

Concentric Lay Stranded Combination

Compact' Compressed CiassB" Class c class D Unilay

13.2 14.2 14.6 14.6 14.6 14.1 14.5 15.5 16.0 16.0 16.0 15.4 15.6 16.8 17.3 17.3 17.3 16.7

16.7 17.9 18.5 18.5 18.5 17.8 17.8 19.0 19.6 19.6 19.6 18.9 18.7 20.0 20.7 20.7 20.7 19.9 19.7 21.1 21.7 21.7 21.7 ... 20.7 22.0 22.7 22.7 22.7 ... 21.5 22.9 23.6 23.6 23.6 ... 22.3 23.7 24.5 24.5 24.5 1..

23.1 24.6 25.3 25.4 25.3 .. . 23.8 25.4 26.2 26.2 26.2 ... 25.4 26.9 27.8 27.8 27.8 ... 26.9 28.4 29.3 29.3 29.3 ... ... 29.8 30.7 30.7 30.8 ... ... 31.1 32.1 32.1 32.1 ... ... 31.8 32.7 32.8 32.8 ... ... 32.4 33.4 33.4 33.4 ... ... 33.6 34.6 34.7 34.7 ... ... 34.8 35.9 35.9 35.9 ... ... 35.9 37.1 37.1 37.1 ... ... 37.1 38.2 38.2 38.2 ... ... 37.6 38.8 38.8 38.8 ... ... 38.2 39.3 39.3 39.3 ... ... 39.2 40.4 40.4 40.4 ... ... 40.2 41.5 41.5 41.5 ... ... 42.6 43.9 44.0 44.0 ... ... 44.9 46.3 46.3 46.3 ... ... 47.1 48.6 48.6 48.6 _._ ... 49.2 50.7 50.8 50.8 ... ... 51.3 52.9 52.9 52.9 ... ... 53.2 54.8 54.8 54.8 ... ... 55.1 56.8 56.8 56.7 ... .., 56.9 58.6 58.6 58.6 ...

for compact rwnd. compact modified concentric and compact cingle input wire. for concentric round and modified concentric.

I I

I Conductor Sue

Nominal Diameten (mm)

Unilay Compressed

13.8 15.1 16.3

17.4 18.5 19.5 20.4 21.3

22.2 23.0 23.9 24.6 26.1

27.5 28.9 30.1 30.8 31.4

32.6 33.7 34.8 35.9 36.4

36.9 37.9 38.9 ... ...

...

...

...

...

...

...

12

ICEA S-108-720-2004

Copper and

Condudor Sue

kanil mrn’

1 o00 507 1100 557 1200 608 1250 633 1300 659

1400 709 1500 760 1600 81 1 1700 861 1750 887

1800 912 1900 963 2000 1013 2250 1140 2500 1266

DATE: 7/15/04

Aluminum Conductors Segmental Conductor Diameter

(Four segments)

Inches mrn

1.140to 1.152 29.0 to 29.3 1.195to1.209 30.4 to 30.7 1.235 to 1.263 31.4 to 32.1 1.260 to 1.289 32.0 to 32.7 1285 b 1.315 32.6 b 33.4

1.325 to 1.364 33.7 to 34.6 1.375 to 1.412 34.9 to 35.9 1.420 to 1.459 36.1 ta 37.1 1.46oto1.504 37.1 to 38.2 l.Wto1.526 37.6 to 38.8

1.50Oto1.548 38.1 to 39.3 1 S30 to 1.590 38.9 t0 40.4 1.570to1.632 39.9 to 41.5 1.665 to 1.730 42.3 to 43.9 1.740 to 1.824 44.2 to 46.3

46.5 to 48.6

11217

1 1327

~ 11437

96.16

Factorst for Determinina Nominal Resista

All sues

0.460 to 0.290. Indushre

11045

11153

11261

97.66

Table 24‘

undero.290 to 0.103. Indusive

11102

11211

11319

97.1 6

Conductor Size Under 0.0201 to 0.01 11, Indusive

11456

11568

11680

94.16

Under 0.01 11 to 0.0010, Indusive

1 1580

11694

1 1807

93.15

ice of Stranded Conductors Per I000 Feet at 25 OC Diameter of Indidual Coated Copper Wires in Inches

for Stranded Conductors

Concentric Stranded 250-2000kcmi1(127- 1013rnm2)

> 2000 - 3000 kcmil (>lo13 - 1520 mm’)

> 3000 - 4000 kcmil (21520 - 2027 mm’)

Condudiviíy utilized for above fadors, Percent

17692 10786

17865 10892

18309 1 o998

61 1 O0

Under0.103 to 0.0201, Indusive

* The factors given in Table 2-5 shall be based on the following: A. Resistivity 1. A vdurne resistivity of 10.575 QmiVft (0.017580 Qmm’/m) at 25 Oc for uncoated (bare) copper (100% conducuviiy). 2. A 25 OC volume resisüv&y converted from the 20 Oc values specified in ASTM B 33 for tin coated copper. 3. A volume resistivity of 17.345 tLcmiWt (0.028835 Qm2/m) at 25 OC br aluminum (61 .OYO conducuvity). 6. Increase in Resistance Due to Stranding 1. The value of K (weight increment factor) given in Table 2-1.

t See 2.4 for Use of Factors.

13

ICEA S-108-720-2004 DATE: 7/15/04

Part 3 CONDUCTOR SHIELD

3.1 MATERIAL

The conductor shall be covered with an extruded thermosetting conductor shield material. A semiconducting tape may be used between the conductor and the extruded shield in which case it shall not be considered as part of the extruded shield thickness.

The extruded material shall be either semiconducting or nonconducting for ethylene propylene rubber (EPR) type insulation and semiconducting only for crosslinked polyethylene (XLPE) type insulation. The extruded shield shall be compatible with all cable component materials with which it is in contact. The allowable operating temperatures of the conductor shield shall be equal to or greater than those of the insulation. The conductor shield shall be easily removable from the conductor and the outer surface of the extmded shield shall be firmly bonded to the overlying insulation.

3.2 EXTRUDED SHIELD THICKNESS

(See 9.4.2). The extruded conductor shield minimum thickness shall be as follows:

Table 3-1 Extruded Conductor Shield Thickness

3.3 PROTRUSIONS AND IRREGULARITIES

(See 9.4.1 3). The interface between the extruded conductor shield and the insulation shall be cylindrical and free from protrusions and irregularities that extend more than 3 mils (0.076 mm) into the insulation and 3 mils (0.076 mm) into the extruded conductor shield.

3.4VOIDS

(See 9.4.13). The interface between the extruded conductor shield and the insulation shall be free of any voids larger than 2 mils (0.051 mm).

14

DATE: 711 5/04 ICEA S-108-720-2004

3.5 PHYSICAL REQUIREMENTS

The crosslinked material(s) intended for extnision as a conductor shield shall have an elongation of no less than 100 percent after air oven aging for 168 hours at 121 OC 11 OC for insulations rated 90 OC (see 9.4.14). It shall also meet brittleness requirements (see 10.3.4) at temperatures not warmer than -25 OC.

3.6 ELECTRICAL REQUIREMENTS

3.6.1 Extruded Semiconducting Material

(See 9.8.1). The volume resistivity of the extruded semiconducting conductor shield shall not exceed 1000 ohm-meter at the maximum normal operating temperature and emergency operating temperature.

3.6.2 Extruded Nonconducting Material (For EPR Insulation Only)

The extnided nonconducting conductor shield shall withstand a 2.0 kV dc spark test and meet the following requirements at room temperature, at the maximum normal operating temperature, and emergency operating temperature:

Dielectric Constant, range 8 - 200

Minimum 60 Hz ac voltage withstand stress 60

dielectric constant kVlmm=

3.6.3 Semiconducting Tape

If a semiconducting tape is used over the conductor, the dc resistance of the tape at room temperature shall not exceed 10,000 ohms per unit square when determined in accordance with ASTM D 4496.

3.7 WAFER BOIL TEST

(See 9.4.12). The extruded conductor shield shall be crosslinked.

15

ICEA SI 08-720-2004

Rated Insulation Matenalt

DATE: 7/15/04

Normal Emergency Short Circuit* Operation Overload'

Part 4 INSULATION

XLPE and EPR Classes 1, II

4.1 MATERIAL

90 oc 105 to 130 OC 250 OC Greater than 46 through 138 kV

The insulation shall be one of the following materials meeting the dimensional, electrical, and physical requirements specified in this section:

105 OC Greater than 138 through 345 kV oc X P E

. Crosslinked polyethylene (XLPE) with no mineral fillers - Ethylene propylene rubber (EPR)

250 OC

Crosslinked polyethylene is suitable for dry locations and wet locations w-rth radial water bamer at voltages above 46 up to and including 345 kV between phases.

Ethylene propylene rubber insulation has two classifications. Class I is for Discharge-Free and DischargeResistant designs. Class I I is for Discharge-Free designs only. Ethylene propylene rubber insulation is suitable for wet or dry locations at voltages above 46 up to and including 138 kV between phases.

The conductor temperature shall not exceed the following:

Table 4-1 Conductor Maximum Operation Temperatures

I - ~

I I I

*See Appendix 6 Tondudor fault current may be determined in accordance with ICE3 P-32-382. tOther insulation materials composed of Eîhylene and Alkene units, which are designated as EAM, may be available and can meet the same physical and electrical requirements as the insulation materials described in this standard. See AppendM H andlor contad the manufadursr for further information.

4.2 INSULATION THICKNESS

The nominal insulation thicknesses shall be designed based on electrical stress. The electrical stress at the conductor shall not exceed the values given in Table 4-2 or the stress qualified by the manufacturer whichever is lower. The stress limits are based on rated voltage, given in Table 4-2. The manufacturer shall specify the nominal wall to be supplied. The minimum point thickness shall be not less than 90 % of the specified nominal wall thickness.

Gmax = vg I(& x in<?)) Where:

G, = Maximum stress at the conductor shieldlinsulation interface (kVlmm) V' = Nominal voltage to ground (kV)

16

ICEA S-108-720-2004 DATE: 711 5/04

Ri = Nominal radius over the insulation (mm) Rs = Nominal radius of the conductor shield/insulation interface (mm).

Traditional insulation thicknesses are listed in appendix F.

4.2.1 Selection of Insulation Thickness

The nominal insulation thickness is calculated by using the lower value of the maximum voltage stress from Table 4-2 for the appropriate voltage dass or the maximum voltage stress qualified by the manufacturer. Maximum stress levels in Table 4-2 assume the actual operating voltage shall not exceed the rated voltage by more than 5 percent during continuous operation or 10 percent during emergencies lasting not more than 15 minutes.

Either the 15 minute, 30 minute or 60 minute ac test is required. Ac test levels for the appropriate rated voltage are to be used as the basis for ac testing should insulation stresses other than those in Table 4-2 be utilized.

All ac tests shall be conducted at room temperature and at power frequency (49-61 Hz). The waveform shall be substantially sinusoidal. All ac voltages are rms values.

For other voltage ratings and conductor sizes, specific agreement between purchaser and manufacturer in the selection of insulation maximum stress for each application is required. There may also be unusual installations and/or operating conditions where mechanical considerations dictate the use of a larger insulation thickness. When such conditions are anticipated, the purchaser should consult with the cable manufacturer to determine the appropriate insulation thickness.

It is recornmended that the minimum size conductor be in accordance with Table 4-2.

A threshold ac test limit of 27 kV/mm to 30 kV/mm should not be exceeded for some insulations (as specified by the manufacturer), in order to avoid any possible weakening of the insulation prior to delivery which might later cause a failure in service. The voltage maybe lowered, but with a correspondingly longer testing time in order to avoid too high stresses. However, the voltage level shall not be below 1.5 Vg and the duration not longer than 10 hours.

Lower maximum stress may be required because of the type of cable joints and terminations or because of cable environment conditions. Consult cable manufacturer for further information. (See Appendix 04)

The cable insulation stress specified is for application where the system is provided with circuit protection such that ground faults will be cleared as rapidly as possible, but in any case within one minute. While these cables are applicable to installations which are on grounded systems, they may also be used on other cable systems, provided the above deanng requirements are met in completely de-energizing the faulted section. In common with other electrical equipment, the use of cables is not recommended on systems where the ratio of the zero to positive sequence- phase reactance of the system at the point of cable application lies behiveen -1 and 4 0 since excessively high voltages may be encountered in the case of ground faults. r

17

ICEA S-i 08-720-2004 DATE 7/15/04

Rated VomW,

kV

69

Maximum Insulation ac Test Voltaga

60 Min. 30 Min. Test i 5 Min. Test Test 2 5 Vg 3.0 Vg

Condudor conctuáor Innitation Maximum Sire, Size, Eccentricity StressLevel kcmii kv kV nun

kV1mm (Vlmii) 2o vg kW

x 2504000 127-2027 12 6 (152) 80 100 120

~-

Ir 11.5 I 750-4000 I 380-2027 I 12 I 81203) I 135 I -460 1 LO -1

138

161

230

II j I I I I 120 7504000 380-2027 12 8 (203) 140 175 205

750-4000 380-2027 12 8 (203) 160 200 240

7504000 3W2027 10 9 (229) 185 230 280

1 0 0 ~ 507-2027 10 11 1279) 265 330 NIA .r

345 1000-4000 507-2027 10 16 (406) 400 PUA IL . . II

4.2.2 Insulation Eccentricity

The eccentricity of the insulation layer shall not exceed the value given in Table 4-2 when calculated as shown below:

7' max-T min 1 00 T max

Where Tmax and Tmin are maximum and minimum values measured around the same cable cross- cedion.

4.3 INSULATION REQUIREMENTS

4.3.1 Physical and Aging Requirements

When tested in accordance with Part 9, the insulation shall meet the following requirements:

18

ICEA S-108-720-2004

*Elongation, Maximum Percent

*Set, Maximum Percent

Table 4-3 Insulation Physical Requirements

175 50

10 5

DATE: 711 5104

Insulation Type

Physical Requirements EPR Class XLPE

I I II

Unaged Requirements

Tensile Strength, Minimum Psi 1800 700 1200 (MPa) (1 2.5) (4.8) (8-2)

250 250 Elongation at Rupture Minimum Percent

Aging Requirements After Air Oven Aging for 168 hours

Aging Temperature, OC 121 121

75 75 80 Tensile Strength, Minimum Percentage of Unaged Value

Elongation, Minimum Percentage of Unaged Value

Hot CreeD Test at 150 OC I2 OC

75 75 80

'For XLPE insulations if this value is exceeded, the Solvent Extraction Test (ASTM D2765) may be performed and will serve as a referee method to detemine compliance (a maximum of 30 percent weight loss after 20 hour drying time).

4.3.2 Electrical Test Requirements

4.3.2.1 Partial-Discharge for Discharge-Free Designs only

(See 9.12). Each shipping length of completed cable shall be subjected to a partial discharge test. The partial discharge shall not exceed the values in Table 4-4. The test voltages for partial discharge measurements are listed in Table 4-5.

Table 4-4 Partial-Discharge Requirements

19

ICEA S-108-720-2004

Rated Voltage kV

DATE: 711 5/04

BIL kV

Table 4-5 Test Voltages for Partial-Discharge Measurements

120 550

138 650

161 750

230 1050

I 345 1 300

Test Voltages (vt) in kV Corresponding to VtAfg Ratio

Cable Voltage Rating

kV

4.3.2.2 Voltage Tests

(See 9.1 1). Each shipping length of completed cable shall withstand, without failure, the ac test voltages given in Table 4-2. The test voltage shall be selected from the table based on the rated voltage of the cable.

For purposes of this standard, the BIL value shall be in accordance with Table 4-6.

Table 4-6 Impulse Values

II 69 I 350 I H I 550 115

4.3.2.3 Insulation Resistance Test

(See 10.3.1). The insulated conductor shall have an insulation resistance not less than that corresponding to a constant (K) of 20,000 megohrns-1 O00 ft at 15.6 OC.

20

ICEA S-108-720-2004

Properties

Dielectric Constant

DATE: 711 5/04

Insulation Type

EPR Class I, II XLPE

3.5 4.0

4.3.2.4 Dielectric Constant and Dissipation Factor

The insulation shall meet the following maximum requirements for dielectric constant and dissipation factor at room temperature when tested in accordance with ICEA T-27-581/NEMA WC-53.

Table 4-7 Dielectric Constant and Dissipation Factor

Dissipation Factor, Percent I o. 1 l 1.5

4.3.2.5 Discharge (Corona) Resistance for Discharge-Resistant EPR Designs only

(See 10.3.5) The insulation shall be verified as corona discharge resistant using a 21 kV 60 Hz voltage applied for 250 hours. Neither a failure nor surface erosion visible with 15 times magnification shall occur. Partial discharge measurements are not required for DISCHARGE-RESISTANT cables.

4.3.3

4.3.3.1 Crosslinked Polyethylene Insulation (XLPE)

Voids, Ambers, Gels, Agglomerates and Contaminants as Applicable

(See 9.4.13). The insulation of the sample examined shall be free from:

1) Any void larger than 2 mils (0.051 mm). The number of voids larger than 1 mils (0.025 mm) shall not exceed 30 per cubic inch (1.8 per cm’) of insulation.

2) Any contaminant larger than 5 mils (0.127 mm) in its greatest dimension and no more than 10 per cubic inch (0.6 per un3) between 2 and 5 mils (0.051 and 0.127 mm).

3) Any amber that is larger than 10 mils (0.254 mm) in its greatest dimension.

4.3.3.2 Ethylene Propylene Rubber (EPR)

(See 9.4.1 3). The insulation of the sample examined shall be free from:

1) Any void larger than 4 mils (O. 1 O2 mm).

2) Any contaminant, gel, or agglomerate larger than 10 mils (0.254 mm) in its greatest dimension. A distinction between contaminants, gels, and agglomerates is not required.

21

ICEA S-I 08-720-2004 DATE: 7/15/04

I Oven Cycle Total Shrinkback mils (mm) Action

1 O to 20 (0.51) Pass: Teminate Test

2 O to 40 (I .O21 Pass: Teminate Test

3 O to 300 (7.62) Pass: Terminate Test

> 20 (0.51)

> 40 (1.02)

> 300 (7.62)

Record and Continue Cyding Test

Record and Continue Cycling

Fail: Terminate Test 1

4.3.4 Shrinkback - Crosslinked Polyethylene Insulation (XLPE) Oniy

(See 9.9). The conductor shall not protrude beyond the insulation (total of both ends) by more than the amounts shown in Table 4-8.

22

ICEA S-108-720-2004

Diameter Over the Insulation

inches (mm)

DATE: 7/15/04

Minimum Maximum Point Point

mils mm mils mm

Part 5 EXTRUDED INSULATION SHIELD

40 o - 2.000 (O - 50.80)

40 2.001 and larger (50.83 and larger)

5.1 MATERIAL

1 .o2 80 2.03

1 .o2 100 2.54

The insulation shield shall be an extruded thermosetting semiconducting material compatible with all cable components with which it is in contact. The extruded shield shall be readily distinguishable from the insulation and plainly identified as semiconducting.

5.2 THICKNESS REQUIREMENTS

The thickness requirements for the extruded insulation shield are as indicated in Table 51. The minimum point thickness is applicable at all locations.

Table 5-1 Insulation Shield Thickness

11 Calculated Minimum Insulation Shield Thickness 1 I

5.3 PROTRUSIONS AND IRREGULARITIES

(See 9.4.13). The interface between the extruded insulation shield and the insulation shall be cylindrical and free from protrusions and irregularities that extend more than 5 mils (0.1 27 mm) into the insulation and 5 mils (0.127 mm) into the extruded insulation shield.

54SEMICONDUCTING TAPE

If a semiconducting tape is utilized over the extruded insulation shield, the dc resistance of the tape at room temperature shall not exceed 10,000 ohms per unit square when determined in accordance with ASTM D 4496.

5.5 INSULATION SHIELD REQUIREMENTS

5.5.1 Removability

The insulation shield shall be bonded firmly and continuously to the insulation.

23

ICEA S-108-720-2004 DATE: 711 5/04

5.5.2 Voids

(See 9.4.13). The interface between the extruded insulation shield and the insulation shall be free of any voids larger than 2 mils (0.05 mm).

5.5.3 Physical Requirements

The material@) intended for extrusion as an insulation shield shall have an elongation of no less than 100 percent after air oven aging for 168 hours at 121 OC .I1 OC for insulations rated 90 OC (see 9.4.14). It shall also meet brittleness requirements (see 10.3.4) at temperatures not warmer than -25 OC.

5.5.4 Electrical Requirements

(See 9.8.2). The volume resistivity of the extruded insulation shield shall not exceed 500 ohmmeter at the maximum normal operating temperature and at a temperature of 110 OC for cables with an emergency overload temperature rating of 130 OC.

5.5.5 Wafer Boil Test

(See 9.4.1 2). The extruded thermoset insulation shield shall be crosslinked.

24

ICEA S-108-720-2004 DATE: 7/15/04

Part 6 METALLIC SHIELDING

6.1 GENERAL

A nonmagnetic metallic shielding consisting of a shield, sheath or combination thereof shall be applied over the nonmetallic semiconducting layer. The metal shieldsheath shall be electrically continuous and free of burrs throughout each cable length. The metal shieldsheath shall be applied in such a manner that electrical continuity or contiguity will not be distorted or disrupted during normal installation bending. The metal shieldlsheath should be designed to withstand the specified fault current and duration duty of the cable system’s protective relaying and fault interrupting devices (see 1.3.1 .e).

A bedding layer such as semiconducting tapes may be used over the extruded insulation shield to insure cable core expansion without damage to the metallic shield or cable core. The bedding layer shall be Semiconducting and meet the requirements of part 5.

Metallic shielding types indicated as a sheath in 6.3 below are considered to meet the requirement of a radial moisture bamer in 6.4. Metallic shielding types indicated as a shield in 6.2 below are not considered to meet the requirements of a radial moisture bamer in 6.4 without additional sealing components.

Note: The purchaser is cautioned that a metallic shieldlsheath meeting the specified minimum requirements shown in 6.2 and 6.3 below does not necessarily have sufficient fault current withstand capability for all system faults. Coordination is required with worst case protective relaying and circuit breaker performance while considering the cases of a fault within the cable system and external to it. ICEA Publication P-4.5-482 may be used to determine metallic shieldkheath fault-clearing capability.

6.2 SHIELDS

6.2.1 HELICALLY APPLIED TAPE SHIELD

A tin coated or uncoated copper tape shall be at least 0.0045 inches (0.11 mm) thick and applied helically in intimate contact with the underlying semiconducting layer. Other nonmagnetic metal tapes having equivalent conductance may be used upon agreement between the manufacturer and purchaser. Joints in the tape shall be made electrically continuous by welding, soldering, or brazing. Butted tapes shall not be permitted. Tape(s) shall be lapped by at least 10% of the tape width or may be gapped by a maximum of 20% and a minimum of 5 % of the tape width. The direction of lay may be right-hand or left-hand.

6.2.2 LONGITUDINALLY APPLIED AND OVERLAPPED CORRUGATED TAPE

A IOngitUdiMlly applied corrugated tape shield shall be annealed copper. The minimum thickness of the corrugated tape shield before corrugation shall be 0.0075 inches (0.1 9 mm). Joints in the tape shall be made electfically continuous by welding, soldering, or brazing. The width of the corrugated tape shield shall be such that after corrugation the edges shall overlap by not less than 0.375 inches (9.5 mm) when the tape is longitudinally formed over the insulated core. The corrugation shall be at right angles to the axis of the cable, shall coincide exactly at the overlap, and shall be in contact with the underlying semiconducting layer.

6.2.3 WIRE SHIELD

A wire shield shall consist of a serving of tin coated or uncoated copper wires applied helically or longitudinally in intimate contact with the underlying Semiconducting layer. The minimum wire size shall be 18 AWG. The minimum number of wires shall be based on a maximum calculated spacing between wires of

25

ICEA S-108-720-2004 DATE: 7/15/04

0.5 inches (12.7 mm). The length of lay of the helically applied wire shield shall be not less than six times nor greater than ten times the calculated minimum diameter over the wire shield. The diredion of lay may be right-hand or left-hand.

6.2.4 FLAT STRAP SHIELD

A flat strap shield shall consist of a serving of tin coated or uncoated copper straps applied helically in intimate contact with the Underlying semiconducting layer. The minimum thickness of flat straps shall be 0.020 inches (0.51 mm) and the width of the strap shall not be less than three times the strap thickness. The minimum number of flat straps shall be based on a maximum calculated spacing between straps of 0.5 inches (12.7 mm). The length of lay of the flat strap shield shall be not less than six times nor greater than ten times the calcuiated minimum diameter over the flat strap shield. The direction of lay may be right-hand or left-hand.

6.3 SHEATHS

6.3.1 LEAD SHEATH

A sheath of lead alloy (see Appendix I) shall be tightly fonned over the underlying semiconducting layer. The thickness of the lead sheath shall be in accordance with Table 6-1 except when a higher value is required in order to meet the fault current requirement.

Table 6-1

Lead Sheath Thickness

6.3.2 SMOOTH ALUMINUM SHEATH

The sheath shall be aluminum alloy 1060 or 1350 or other alloy having not less than 99.45 % aluminum. The aluminum sheath shall be tightly formed around the core of the cable. A smooth sheath shall be constructed by using a flat metal tape that is longitudinally folded around the cable core and seam welded or by applying over the cable core a seamless sheath or tube. The manufacturer shall determine the alloy unless otherwise agreed upon between the manufacturer and the purchaser. The thickness of the aluminum sheath shall be at least 0.020 inches (0.51 mm).

6.3.3 CONTINUOUSLY CORRUGATED SHEATH

Continuously corrugated sheath shall be constructed by using a flat metal tape that is longitudinally

26

ICEA S-108-720-2004 DATE: 7/15/04

folded around the cable core, seam welded, and corrugated or by applying over the cable core a seamless sheath or tube which is then corrugated. when metal sheath is formed from a flat metal tape, the tapes used shall be aluminum, aluminum alloy having not less than 99.45 % aluminum or copper. When the metal sheath is formed by applying a seamless sheath or tube the metal shall be aluminum or an aluminum alloy having not less than 99.45 % aluminum. The thickness of the aluminum sheath shall be at least 0.032 inches (0.81 mm). The thickness of the copper sheath shall be at least 0.020 inches (0.51 mm).

6.4 RADIAL MOISTURE BARRIER

Crosslinked polyethylene cables with insulations designed by maximum stress criteria that are intended for wet locations shall incorporate a radial moisture bamer. A radial moisture bamer is optional for ethylene propylene rubber insulated cables. Nso, a radial moisture bamer is optional for crosslinked poiyethyiene insulated cables intended for dry locations. Radial moisture bamers include metallic sheaths, bonded metallic foil laminates, or other alternate designs as agreed upon between the purchaser and manufacturer. When requested the manufacturer shall demonstrate the effectiveness of the radial moisture bamer.

6.5 OPTIONAL LONGITUDINAL WATER BLOCKING COMPONENTS

with the approval of the purchaser, any component(s) designed as an impediment to longitudinal water penetration may be incorporated in the interstices andlor the interfaces of the metallic shieldsheath. If the component is a tape and is applied under the metallic shieldlsheath or between different metallic shieldlsheath members for composite metallic shieldsheaths, it must be semiconduciing and meet the requirements of 5.4. Longitudinal water peneíration resistance shall be determined in accordance with ICEA Publication T-34-664 and shall meet a minimum requirement of 5 psig.

27

ICEA S-I 08-720-2004

Tensile Strength, Minimum Percentage of Unaned Value

DATE 7/15/04

75 75 75

Part 7 JACKET

Elongation, Minimum

Heat Distortion, Maximum 30 percent at

Percentage of Unaged Value

Environmental Stress Cracking

Absorption Coefficient Minimum 1 OOO(absorbance/meter)

Base Resin Density (DZx,g/cm3)*

7.1 MATERIAL

~ ~

75 75 75

100 o c I1 o c 11OOC*l oc 110 oc Il oc No Cracks’ No Cracks** No Cracks**

320 320 320

0.910 - 0.925 0.926 - 0.940 0.941 - 0.965

The jacket shall consist of a nonconducting thermoplastic material. Jackets are required for all constructions unless otherwise agreed upon between the purchaser and manufacturer. The jacket matenal shall be compatible with all cable components it contacts. A thermosetting jacket or other jacket materials may be supplied upon consulting the manufacturer. When tested in accordance with Part 9, the jacket shall meet the applicable requirements. There shall be no water between underlying layers and the jacket in accordance with 9.14.

7.1.1 Polyethylene, Black

This jacket shall consist of a black, low density (LDPE), linear low density (LLDPE), medium density (MDPE) or high density (HDPE) polyethylene compound suitable for exposure to sunlight The jacket shall meet the following requirements. Jacket irregularity inspection test shall be performed in accordance with 7.4 (See Tables 7-4 and 7-5).

Table 7-1 Polyethylene, Black

28

ICEA S-108-720-2004 DATE: 7/15/04

Physical Requirements

7.1.2 Polyvinyl Chloride

This jacket shall consist of a black, polyvinyl chloride (PVC) compound suitable for exposure to sunlight. The jacket shall meet the following requirements. Jacket irregularity inspection test shall be performed in accordance with 7.4 (See Tables 7 4 and 7-5).

Values

Table 7-2 Polyvinyl Chloride

Tensile Strength, Minimum Pi ( M W

Elongation at Rupture Minimum Percent

1500 (10.3)

1 O0

Tensile Strength, Minimurn Percentage of Unaged Value

Elongation, Minimum Percentage of Unaged Value

Heat Distortion at 121 OC i1 OC Maximum Percent

11 Heat Shock at 121 OC 11 OC 1 NoCracks

80

60

50

Cold Elongation at -35 OC II Minimum Percent 20 I

29

ICEA S-108-720-2004 DATE 7l15104

7.2 JACKET APPLICATION AND THICKNESS

The jacket material shall be applied over the metallic shieldsheath or a separator tape which is compatible with the other components of the cable. If a separator tape is applied over the metallic shieldkheath, the tape may be either nonconducting or semiconducting. Jacket thickness shall be as stated in 7.2.1 or 7.2.2.

7.2.1 Thickness of Jacket for Tape and Wire Shields

The jacket thickness shall be measured over the outer most point of the metallic shield and shall meet the thickness requirements in Table 7-4. The separator tape, if present, shall not be included as part of,the jacket thickness.

7.2.2 Thickness of Jacket for Sheaths

The jacket thickness shall be measured over the outer most point of the metallic sheath and shall meet the thickness requirements in Table 7-5. The separator tape, if present, shall not be included as part of the jacket thickness.

7.3 OPTIONAL SEMICONDUCTING COATING

An optional semiconducting coating may be applied to the outer surface of nonconducting jackets to aid in performing integrity test of the jacket in the field aíter installation. This coating may be graphite or other suitable material. If this coating is applied, the jacket shall be tested with a dc voltage in lieu of spark testing,

If an extruded semiconducting layer is utilited and the properties of that layer meet either types in Table 7-3 then the thickness of the extruded semiconducting layer can be considered an integral patt of the total jacket thickness provided it does not exceed 20% of the total jacket thickness.

7.4 JACKET IRREGULARITY INSPECTION

7.4.1 Jackets without Optional Semiconducting Coating

A jacket over the metallic shieldsheath without a semiconducting coating shall withstand an alternating current spark test voltage. The test voltage for a given thid<ness and type of jacket shall not be less than indicated in Tables 7-4 and 7-5. The voltage shall be applied between an electrode at the outside surface of the jacket and the metallic shield. The metallic shield shall be connected to ground during the test. The spark test shall be conducted in accordance with ICEA T-27-581/NEMA WC-53.

7.4.2 Jackets with Optional Semiconducting Coating

The jacket shall withstand a dc voltage of 200 Vlmil(8 kV/mrn) of the average value of the specified minimum point and maximum point thickness of the jacket in Tables 7-4 and 7-5 with a maximum of 25 kV between the metallic sheath or shield and the semiconducting outer coating for a period of one minute.

30

ICEA S-108-720-2004

Tensile Strength, Minimum psi (MPa)

Elongation at Rupture Minimum Percent

DATE: 711 5104

1200 1500 (8.27) (10.3)

1 O0 150

Table 7-3 Semiconducting Extruded Jacket Coating

100 OC il OC for 48 hours

12 1 OC II OC for 168 hours

After Air Oven Aging at

75

1 O0

90 oc tl o c

Tensile Strength, Minimum Percentage of Unaged Value

Elongation, Minimum Percentage

75

75

121 oc +_I 'OC ~~

Heat Distortion. Maximum 25 Dercent at

-1 o

~~ ~~

Volume Resistivity At 25 OC i5 OC Maximum ohm-meter

Brittleness Temperature OC, not warmer than

-1 5

L

Diameter Over the Metallic Shield Minimum Point Maximum Point

I I

- for

Noncond"&ng Jacke&

1 O0 I 1 O0

Table 7-4 Jacket Thickness and Test Voltages for Tape or Wire Shield Cables

Calculated Minimum I Jacket Thickness I AC SDark Test Voltaae

Inches mils mm mils mm kV (mm)

1 O0 2.54 150 3.81 10.0 O - 2.500 (O - 63.50)

125 3.18 185 4.70 12.5 2.501 and larger (63.53 and larger)

31

ICEA S-108-720-2004

85 2.251 - 3.000 (57.1 8 - 76.20)

1 O0 3.001 and larger (76.23 and larger)

DATE: 7115l04

2.16 135 3.43 7.5

2.54 160 4.06 10.0 *

32

ICEA S-I 08-720-2004 DATE: 7/15/04

Part 8 CABLE IDENTIFICATION

8.1 CABLE IDENTIFICATION

The outer jacket surface of the cable shall be suitably marked throughout its length by indent print or emboss print to a depth not greater than 15 percent of its thickness or by surface printing, at regular intervals with no more than 6 inches (152 mm) of unmarked space between cable identification, with the following information:

Manufacturer's Identification or trade name Size of Conductor Conductor Material Type of Insulation Voltage Rating Nominal Insulation Thickness Year of Manufacture

8.1.1 Optional Center Strand identification

When center strand identification is requested by the purchaser, the center strand of each conductor shall be indented w*Ni the manufacturets name and year of manufacture. This information shall be marked at regular intervals with no more than 12 inches (305 mm) between repetitions.

8.1.2 Optional Sequential Length Marking

When sequential length marking is requested by the purchaser, the information shall be marked at regular intervals of 2 feet (610 mrn) or 1 meter.

33

ICEA S-108-720-2004 DATE: 711 5/04

Part 9 PRODUCTION TESTS

9.1 TESTING

All cables shall undergo production tests at the factory to determine their compliance with the requirements given in Parts 2, 3, 4, 5, 6, and 7. When there is a conflict between the production test methods given in Part 9 and publications of other organizations to which reference is made, the requirements given in Part 9 shall apply.

The tests in Part 9 may not be applicable to all materials or cables. To determine which tests are to be made, refer to the parts in this publication that set forth the requirements to be met by the particular material or cable.

9.2 SAMPLING FREQUENCY

Sampling frequency shall be as indicated in Table 9-3 “Summary of Production Tests and Sampling Frequency Requirements”.

9.3 CONDUCTOR TEST METHODS

9.3.1 Method for DC Resistance Determination

Measurements shall be made on each chipping length.

Except as noted above, this test shall be performed in accordance with ICEA T-27-581NEMA WC-53.

9.3.2 CroscSectional Area Determination

Cross-Sectional area shall be determined in accordance with ICEA T-27-581/NEMA WC-53.

9.3.3 Diameter Determination

Diameter shall be determined in accordance with ICEA T-27-58VNEMA WC-53.

9.4TEST SAMPLES AND SPECIMENS FOR PHYSICAL AND AGING TESTS

9.4.1 General

Physical and aging tests shall be those required by Parts 3,4, 5, and 7.

9.4.2 Measurement of Thickness

The measurement of thickness for components having no minimum removability tension requirements shall be made with either a micrometer or an optical measuring device. For all other extruded components, the measurement of thickness shall be made only with an optical measuring device. The micrometer and optical measuring device shall be capable of making measurements accurate to at least 0.001 inch (0.025 mm). The nominal thickness of the insulation shall be taken as one-fourth of the sum of four measurements made around the circumference of the same cable cross section. One of the four measurements shall be at the minimum thickness point and one shall be at the maximum thickness point. Two additional measurements shall be made half way between the minimum and maximum measurements around the sample circumference.

34

ICEA S-108-720-2004 DATE: 711 WO4

9.4.2.1 Micrometer Measurements

When a micrometer measuring device is used, the component shall be removed and the minimum and maximum thickness determined.

9.4.2.2 Optical Measuring Device Measurements

from a spechen cut perpendicular to the axis of the sample so as to expose the full cross-section. When an optical measuring device is used, the minimum and maximum thickness shall be determined

9.4.3 Number of Test Specimens

From each of the samples selected, test specimens shall be prepared in accordance with Table 9-1.

Table 9-1 Test Specimens for Physical and Aging Tests

Total Number of Test Specimens

For determination of unaged properties

Tensile strength and ultimate elongation

Permanent set

For accelerated aging te5ts

For oil immersion

Heat shock

Heat distortion

Cold Elongation

Stf¡RRin!l

3t

3t

3t

3t

1

3t

3t

1

tone test specimen out of three shall be tested and the other two specimens held in reserve, except that when only one sample is selected, then ali three test specimens shall be tested and the average of the resulis reported.

9.4.4 Size of Specimens

The test specimens shall be prepared using either ASTM D 41 2 Die B. E, C or D. Specimens from the insulation shall be cut rectangular in section with a cross-section not greater than

0.025 square inch (i 6 mm2). In extreme cases, it may be necessary to use a segmental spechen. Specimens for tests on jacket compounds shall be taken from the completed cable and cut parallel to

the axis of the cable. The test specimen shall be a segment cut with a sharp knife or a shaped specimen cut out with a die and shall have a cross-sectional area not greater than 0.025 square inch (16 mm2) after irregularities, corrugations, and wires have been removed.

35

ICEA S-108-720-2004 DATE 7/15/04

9.4.5 Preparation of Specimens of Insulation and Jacket

The test specimen shall have no surface incisions and shall be as free as possible from other imperfections. Where necessary. surface irregulatities such as corrugations due to stranding shall be removed so that the test specimen will be smooth and of uniform thickness. If a jacket specimen passes the minimum requirement with irregularities, then their removal is not required.

9.4.6 Specimen for Aging Test

Specimens shall not be heated, immersed in water, nor subjected to any mechanical or chemical treatment not specifically described in this standard.

9.4.7 Calculation of Area of Test Specimens

9.4.7.1 Where the total cross-section of the insulation is used, the area shall be taken as the difference between the area of the circle whose diameter is the average outside diameter of the insulation and the area of the cirde whose diameter is the average outside diameter of the conductor shield.

9.4.7.2 Where a slice cut from the insulation by a knife held tangent to the wire is used and when the cross- section of the slice is a segment of a circle, the area shall be calculated as that of the segment of a circle whose diameter is that of the insulation. The height of the segment is the wall of insulation on the side from which the slice is taken.

When the cross-section of the slice is not a segment of a circle, the area shall be calculated from a direct measurement of the volume or from the specific gravity and the weight of a known length of the specimen having a uniform crosssedon.

The values may be obtained from a table giving the areas of segments of a unit cirde for the ratio of the height of the segment to the diameter of the circle.

9.4.7.3 When the conductor is large and the insulation thin and when a portion of a sector of a circle has to be taken, the area shall be calculated as the thickness times the width.

This applies either to a straight test piece or to one stamped out with a die and assumes that corrugations have been removed.

9.4.7.4 When the conductor is large and the insulation thick and when a portion of a sector of a circle has to be taken, the area shall be calculated as the proportional part of the area of the total cross-section.

9.4.7.5 The dimensions of specimens to be aged shall be determined before the aging test.

9.4.8 Unageá Test Procedures

9.4.8.1 Test Temperature

Physical tests shall be made at room temperature. The test specimens shall be kept at room temperature for not less than 30 minutes prior to the test.

9.4.8.2 Type of Testing Machine

The testing machine shall be in accordance with ASTM D 412.

9.4.8.3 Tensile Strength Test

The tensile strength test shall be made with specimens prepared in accordance with 9.4.3 and 9.4.4. The length of all of the specimens for the test shall be equal. Gauge marks shall be 2 inches (50.8 mm)

36

ICEA S-I 08-720-2004 DATE: 7/15/04

apart when using ASTM B or E Die size and 1 inch (25.4 mm) apart when using ASTM C or D Die size except that 1 inch (25.4 mm) gauge marks shall be used for polyethylene regardless of the die size. Specimens shall be placed in the jaws of the testing machine with a maximum distance between jaws of 4 inches (101.6 mm) except 2.5 inches (63.5 mm) for polyethylene. The specimen shall be stretched at the rate of 20 inches (508 mm) per minute jaw speed until it breaks.

The tensile and elongation determinations for cornpounds for which the compound manufacturer certifies that the baselesin content is more than 50 percent by weight of high densw polyethylene (having 3 density of 0.926 g/cm or greater), or total base polyethylene resin content (having a density of 0.926 9/cm or greater), shall be permitted to be tested at a jaw separation rate of 2 inches (51 mm) per minute as an alternate to 20 inches (508 mm) per minute.

Specimens shall break between the gauge marks to be a valid test. The tensile strength shall be calculated based on the area of the unstretched specimen. Specimen length, gauge mark distance, and jaw speed shall be recorded with the results.

9.4.8.4 Elongation Test

Elongation at rupture shall be determined simultaneously with the test for tensile strength and on the same specimen.

The elongation shall be taken as the distance between gauge marks at rupture less the original gauge length of the test specimen. The percentage of elongation at rupture is the elongation in inches divided by the original gauge length and multiplied by 100. Specimen length, gauge mark distance, and jaw speed shall be reported with results.

9.4.9 Aging Tests

9.4.9.1 Aging Test Specimens

Test specimens of similar size and shape shall be prepared from each sample selected, three for the determination of the initial or unaged properties, and three for each aging test required for the insulation or jacket being tested. Simultaneous aging of different compounds should be avoided. One specimen of each three shall be tested and the other two held as spares except that, where only one sample is selected, all three specimens shall be tested and the average of the results reported.

Samples shall be cut from the insulation with a cross-section not greater than 0.025 square inch (16 mm2).

D iea t specimens shall be smoothed before being subjected to the accelerated aging tests wherever the thickness of the specimen will be 90 mils (2.29 mm) or greater before smoothing.

The test specimens shall be suspended vertically in such a manner that they are not in contact with each other or with the side of the oven.

The aged specimens shall have a rest period of not less than 16 hours nor more than 96 hours between the completion of the aging tests and the determination of physical propediec. Physical tests on both the aged and unaged specimens shall be made at approximately the same time.

9.4.9.2 Air Oven Test

The test specimens shall be heated at the required temperature for the specified period in an oven having forced circulation of fresh air. The oven temperature shall be controlled to 11 OC.

9.4.9.3 Oil Immersion Test for Polyvinyl Chloride Jacket

The test specimens shall be immersed in ASTM No. 2 or IRM 902 oil. described in ASTM D 471, at 70 OC 11 OC for 4 hours. At the end of this time, the specimens shall be removed from the oil, blotted to remove excess oil, and allowed to rest at room temperature for a period of 16 to 96 hours. The tensile strength and elongation of the specimens shall then be determined in accordance with 9.4.8 at the same time that the

37

ICE3 S-108-720-2004 DATE: 711 5/04

original properties are determined.

9.4.10 Hot Creep Test

The hot creep test shall be determined in accordance with ICEA Publication T-28-562. The sample shall be taken from the inner 25 percent of the insulation.

9.4.11 Solvent Extracfion

The solvent extraction shall be determined in accordance with ASTM 13 2765.

9.4.12 Wafer Boil Test for Conductor and Insulation Shields

Any outer covering and the conductor shalt be removed. A representative annular cross section containing the extruded conductor shield and insulation shield, shall be cut from the cable. The resuiting wafer shall be at least 25 mils (0.64 mm) thick. The wafer may be further separated into concentric rings by careful separation of the shield from the insulation. This may indude the use of a punch to separate the conductor shield or insulation shield from most of the insulation.

The resulting wafer@) or rings shall then be immersed in boiling decahydronaphthalene with 1 percent by weight Antioxidant 2246 (or other reagents specified in ASTM D 2765, such as xyiene) for 5 hours using the equipment specified in ASTM D 2765. (This solution may be reused for subsequent tests provided that it works as effectively as a fresh solution). The wafer(s) shall then be removed from the solvent and examined for shieldlinsulation interface continuity with a minimum 15-power magnification.

Total or partial separation of the semiconducting shields from the insulation is permissible. Partial loss of the shields is also permissible provided each shield is a continuous ring. If the conductor shield dissolves or cracks such that it does not maintain a continuous ring, the cable lot shall be rejected. If the insulation shield dicsolves or cracks such that it does not maintain a continuous ring, the cable lot shall either be rejected by the manufacturer or a sample of insulation shield from the same lot shall be subjected to the requirements of 9.4.12.1 as a referee test.

9.4.12.1 Insulation Shield Hot Creep Properties

Hot creep and set properties shall be determined at 150 OC +2 OC in accordance with ICEA T-28-562 with the sample removed from the cable core. The degree of crosslinking shall be adequate to limit elongation to a maximum of 100 percent and set to a maximum of 5 percent.

9.4.13 Amber, Agglomerate, Gel, Contaminant, Protrusion, Irregularity and Void Test

9.4.13.1 Sample Preparation

Samples shall be prepared by cutting a suitable length of cable helically or in some other convenient manner to produce 20 consecutive thin wafers consisting of the conductor shield, insulation and insulation shield. Wafers shall be approximately 25 mils (0.64 mm) thick. The cutting blade shall be sharp and shall produce wafers with uniform thickness and with very smooth surfaces. The sample shall be kept clean and shall be handled carefully to prevent surface damage and contamination.

9.4.13.2Examination

The wafers shall be examined with 15 power magnification for voids, contaminants, gels, agglomerates, and ambers, as applicable, in the insulation. They shall also be examined for voids and protrusions between the insulation and the conductor and insulation shields and conductor shield imegularities. Unfilled insulations shall be examined using transmitied light. An optical coupling agent such as mineral oil, glycerin or silicone oil shall be used to enhance the observation of imperfections within the wafers. For EPR and

38

ICEA S-108-720-2004 DATE: 7/15/04

extruded shields, a reflected light method shall be used. For void count, as applicable, the volume of the insulation examined shall be calculated using any convenient technique. The results of this examination shall be recorded as pass or fail in the production test report. .

9.4.13.3 Resampling for Amber, Agglomerate, Gei, Contaminant, Protrusion, Irregularity and Void Test

If after examination according to 9.4.13.2, the size and/or number (as applicable) of voids, contaminants, agglomerates, gels, ambers, irregularities or protrusions exceeds the specified limits, the lot shall be divided into shipping lengths. One sample shall be taken from the beginning and end of each shipping length. For the shipping length to pass, both samples shall meet the requirements of this section. If either of the two samples from the shipping length fails, the shipping length shall be rejected.

9.4.13.4Protrusion and Irregularity Measurement Procedure

To measure the size of protrusions and conductor shield irregularities in wafers examined in 9.4.13.2, the wafers shall be viewed in an optical comparator or similar device which displays the wafer so that a straight edge can be used to facilitate the measurement. Protrusion shall be measured as shown in Figure 9-1. Conductor shield irregularities shall be measured as shown in Figure 9-2. This procedure is used on cable wafers with the conductor, jacket and metallic shield removed.

Figure 9-1 Procedure to Measure Protrusions

Protrusion of

Figure 9-2 Procedure to Measure Irregularities

/- Convolutions

39

ICEA S-108-720-2004 DATE 711 5/04

9.4.14 Physical Tests for Semiconducting Material Intended for Extrusion

9.4.14.1 Test Sample

One test sample shall be molded from each lot of semiconducting material intended for extrusion on the cable.

9.4.14.2Test Specimens

For each test, three test specimens, each approximately 6 inches (152 mm) long and not greater than 0.025 square inch (16 mm2) in crosssedion, shall be cut out of the test sample with a die. All three test specimens shall be tested and the results averaged.

9.4.1 4.3 Elongation

This test shall be conducted in accordance with 9.4.8 and 9.4.9.

9.4.15 Retests for Physical and Aging Properties and Thickness

If any test specimen fails to meet the requirements of any test, either before or after aging, that test shall be repeated on two additional specimens taken from the same sample. Failure of either of the additional specimens shall indicate failure of the sample to conform to this standard.

If the thickness of the insulation or of the jacket of any reel is found to be less than the specified value, that reel shall be considered as not conforming to this standard, and a thickness measurement on each of the remaining reels shall be made.

When ten or more samples are selected from any single lot, all reels shall be considered as not conforming to this standard if more than I O percent of the samples fail to meet the requirements for physical and aging properties and thickness. If 10 percent or less fail, each reel shall be tested and shall be judged upon the results of such individual tests. Where the number of samples selected in any single lot is less than ten, all reels shall be considered as not conforming to this standard if more than 20 percent of the samples fail. If 20 percent or less fail, each reel, or length shall be tested and shall be judged upon the results of such individual tests.

9.5 DIMENSIONAL MEASUREMENTS OF THE METALLIC SHIELD

9.5.1 Tape Shield

Metallic shielding tape shall be removed from no less than 6 inches (152 mm) of the insulated conductor, exœpt for corrugated tape shields where measurements shall be made on tape prior to corrugating and application to cable core. Measurements shall be made with a micrometer readable to at least 0.0001 inch (0.002 mm) having a presser foot 0.25 inch (6.35 mm) i 0.01 inch in diameter and exerting a total force of 3.0 I 0.1 ounces (85 f 3 grams), the load being applied by means of a weight. Five readings shall be taken at different points on the sample, and the average of these readings shall be taken as the thickness of the tape.

9.5.2 Wire Shield

Metallic shielding wire shall be removed from no less than 6 inches (152 mm) of the insulated conductor. Measurements shall be made with a micrometer or other suitable instrument readable to at least 0.0001 inch (0.002 mm). The wires shall be measured at each end of the sample and near the middle of the sample. The average of the three measurements shall be taken as the diameter.

40

ICEA S-I 08-720-2004 DATE: 7/15/04

9.5.3 Sheath

The thickness of the sheath shall be determined by measurements made with a micrometer caliper having a rounded anvil or an optical measuring device. The micrometer and optical measuring device shall be capable of making measurements accurate to at least 0.001 inch (0.025 mm). The measurements shall be made directly on the sheath removed from the cable.

9.5.4 Flat Straps

Metallic shielding strap shall be removed from no less than 6 indies (152 mm) of the insulated conductor. Measurements shall be made with a micrometer or other suitable instrument readable to at least 0.0001 inch (0.002 mm). The straps shall be measured for width and thickness at each end of the sample and near the middle of the sample. The average of the three measurements for each dimension shall be taken as the width and thickness.

9.6 DIAMETER MEASUREMENT OF INSULATION AND INSULATION SHIELD

Measurement of the diameter over the insulation and the insulation shield shall be made with a diameter tape accurate to 0.01 inches (0.25 mm).

When there are questions regarding compliance to this standard, measurements shall be made with an optical measuring device or with calipers with a resolution of 0.0005 inch (0.01 3 mm) and accurate to 0.001 inch (0.025 mm). At any given cross-section, the maximum diameter, minimum diameter, and two additional diameters which bisect the two angles formed by the maximum and minimum diameters shall be measured. The diameter for the cross-section shall be the average of the four values. This average diameter value shall be used to determine if the cable meets the minimum and maximum limits given in Appendix C. Ail diameter measurements shall be made on cable samples that contain the conductor.

9.7 TESTS FOR JACKETS

9.7.1 Heat Shock

9.7.1.1 Preparation of Test Specimen

For jackets with a wall thickness not exceeding 200 mils (5.0 mm), each test specimen shall consist of a strip taken from the jacket, whose width shall be at least I .5 times its thickness but not less than 160 mils (4.0 mm); the strip shall be cut in the direction of the axis of the cable.

For jackets with a wall thickness exceeding 200 mils (5.0 mm), each test specimen shall consist of a strip taken from the jacket, whose width shall be at least 1.5 times its thickness but not less than 160 mils (4.0 rnm) and then ground or cut (avoiding heating) on the outer surface, to a thickness beheen 160 mils (4.0 mm) and 200 mils (5.0 mm). This thickness shall be measured on the thicker part of the strip, whose width shall be at least 1.5 times the thickness.

9.7.1.2 Winding of the Test Specimen on Mandrels

Each test specimen shall be tightly wound and fixed at ambient temperature on a mandrel to form a close helix. The diameter of the mandrel and the number of tums are given in Table 9-2.

41

ICEA S-108-720-2004 DATE: 7/15/04

Thickness of Test Specimen

Inches mm

Table 9-2 Bending Requirements for Heat Shock Test

Number of Diameter of Mandrel

Adjacent Turns Inches (mm)

I O - 0.039

0.040 - 0.079

0 - 1 6 0.079 (2)

1.01 -2 6 O. 157 í4ì

0.080 - 0.118

0.119 - 0.157

o. 158 - 0.200

9.7.1.3 Heating and Examination

2.03 - 3 6 0.236 (6)

3.02 - 4 4 0.31 5 (8)

4.01 - 5 2 0.394 (10)

Each test specimen, on its mandrel, shall be placed in an air oven preheated to a temperature of 121 OC +I OC. The test specimen shall be maintained at the specified temperature for I hour. At the end of the test period, the sample shall be examined without magnification.

9.7.2 Heat Distortion

Heat distortion testing shall be performed in accordance with ICEA T-27-581kJEMA WC-53.

9.7.3 Cold Elongation

9.7.3.1 Test Temperature

Physical tests shall be made at -35 "C. Test samples shall be conditioned at the test temperature for 1 hour prior to performing the tensile pull.

9.7.3.2 Type of Testing Machine

The testing machine shall be in accordance with ASTM D 412 and equipped with a cooling device or installed in a cooling chamber. The test area (grips, chamber, extensometer) shall be conditioned at the test temperature for a minimum of 3 hours to ensure stability of the test environment. As an aitemate. the samples may be removed from a cold chamber and tested within 15 seconds on a testing machine at room temperature.

9.7.3.3 Elongation Test

The number of elongation specimens shall be in accordance with 9.4.3. The length of all of the specimens for the test shall be equal. The test specimens shall be prepared using an ASTM D 412 Die D and the gauge marks shall be 1 inch (25.4 mm) apart. Specimens shall be taken from the completed cable and cut parallel to the axis of the cable. The test specimen shall be a segment cut with a sharp knife or a shaped specimen cut out with a die. The wall thickness of the specimen after irregularities, comgations, and wires have been removed shall not exceed 80 mils (2.0 mm) and not less than 30 mils (0.76 mm). Specimens can be ground or cut to meet thickness requirements. Specimens shall be left at ambient temperature after cutting or grinding for at least 16 hours before die cutting.

Specimens shall be placed in the jaws of the testing machine with a maximum distance between jaws of 4 inches (1 01.6 mm) except 2.5 inches (63.5 rnm) for polyethylene. The specimen shall be stretched at the

42

ICEA S-108-720-2004 DATE: 7/15/04

rate of 2 inches (51 mm) per minute jaw speed until it breaks. Specimens shall break between the gauge marks to be a valid test. The elongation shall be taken as the

distance between gauge marks at rupture less the original gauge length of the test specimen. The percentage of elongation at rupture is the elongation in inches divided by the original gauge length and multiplied by 100. Specimen length, gauge mark distance, elongation measurement system, and jaw speed shall be reported with results.

9.8VOLUME RESISTIVITY

9.8.1 Conductor Shield

The samples shall be cut in half longitudinally and the conductor removed. Four silver-painted electrodes shall be applied to the conductor shield. The two potential electrodes (inner) shall be at least 2 inches (50.8 mm) apart. A current electrode shall be placed at least 1 inch (25.4 mm) beyond each potential electrode. When a high degree of accuracy is not required, this test may be made with only two electrodes spaced at least 2 inches (50.8 mm) apart.

The volume resistivity shall be calculated as follows:

R (D2 - d2) p = IOOL

Where: p =Volume resistivity in ohm-meters. R = Measured resistance in ohms. D = Diameter over the conductor stress control layer in inches. d = Diameter over the conductor in inches. L = Distance between potential electrodes in inches.

9.8.2 Insulation Shield and Semiconducting Extruded Jacket Coating

Four annular-ring electrodes shall be applied to the surface of the insulation shield layer or extruded jacket coating. The two potential electrodes (inner) shall be at least 2 inches (50.8 mm) apart. A current electrode shall be placed at least 1 inch (25.4 mm) beyond each potential electrode. When a high degree of accuracy is not required, this test may be made with only two electrodes spaced at least 2 inches (50.8 mm) apart.

The volume resistivity shall be calculated as follows:

2R (D2 - d2) p= IOOL

Where: p = Volume resistivity in ohm-meters. R = Measured resistance in ohms. D = Diameter over the insulation shield or semiconducting extruded jacket coating layer in inches. d = Diameter over the insulation or over the nonconducting jacket in inches. L = Distance between potential electrodes in inches.

9.8.3 Test Equipment

A suitable instrument (e.g., Wheatstone, Kelvin Bridge or Ohmmeter) or instruments (e.g., voltmeter and

43

ICEA S-108-720-2004 DATE: 7/15/04

ammeter) shall be utilized for determining resistance and provide a source of 60 Hz ac or dc voltage. The energy released in the conducting component shall not exceed 100 milli-watts.

A convection-type forceddraft, circulating air oven, shall be utilized capable of maintaining any constant (+ 1 OC) temperature up to 140 OC, e.g., Hot Pack Model 1204-14, Blue M Model OV-490, or Precision Type A

9.8.4 Test Procedure

For the fourelectrode method, connect the two outer electrodes (current) in series with the current source and an ammeter or the current leads of a bridge. Connect the two inner electrodes (potential) to potentiometer leads of a bridge or to a voltmeter. A dc or 60 Hz ac source can be used.

For the twoelectrode method, connect the electrodes to an ohmmeter. The resistance of the conducting component between the electrodes shall be determined at the

specified temperature.

9.9 SHRINKBACK TEST PROCEDURE

9.9.1 Sample Preparation

Five samples, each I .5 feet (0.45 m) are required for the test. A length of the specimen cable 17.5 feet (5.25 m) long shall be laid out and straightened. The sample shall be marked at a point 5.0 feet (1.5 m) from one end and then marked at 1.5 foot (0.45 m) intervals for a distance of 7.5 feet (2.25 m). The cable shall be cut using a fine tooth saw at the 1.5 foot (0.45 m) intervals marked on the sample. The two 5.0 foot (1.5 m) end pieces from the original cable length are to be discarded.

9.9.2 Test Procedure

The five 1.5 foot (0.45 m) long cable samples shall be placed in a forced air convection oven at a temperature of 50 OC FI OC for a period of 2 hourc. After the 2 hour period, the samples shall be removed from the oven and allowed to cool for 2 hours at room temperature. The heating and cooling cyde shall be performed three times, if required.

At the end of each cooling period, the samples shall be measured for shrinkback using a micrometer, or preferably an optical measuring device. The selected measuring device shall have a minimum resolution of 0.001 inch (0.025 mm).

One reading shall be made from each end of ea& sample between the end of the conductor and the edge of the conductor shield interface at the point of circumference of the conductor where shrinkback is maximum.

9.9.3 PasslFail Criteria and Procedure

The measured values shall be in accordance with Tables 4-8 of Part 4. Only the sample with the most shrinkback of the five shall be considered using the total shrinkback of both ends.

9-10 RETESTS ON SAMPLES

Except for physical and aging properties and thickness tests

Except for Amber, Agglomerate, Gei, Contaminant, Protrusion, Irregularity and Void Test

See 9.4.1 5

See 9.4.13.3

44

KEA S-108-720-2004 DATE: 7/15/04

If all of the samples pass the applicable tests described in 9.4 through 9.9 and 9.13, the lot of cable that they represent shall be considered as meeting the requirements of this standard.

If any sample fails to pass these tests, the length of cable from which the sample was taken shall be considered as not meeting the requirements of this standard and another sample shall be taken from each of the two other lengths of the cable in the lot of cable under test. If either of the second samples fails to pass the test, the lot of cable shall be considered as not meeting the requirements of this standard. If both such second samples pass the test, the lot of cable (except the length represented by the first sample), shall be considered as meeting the requirements of this standard.

Failure of any sample shall not predude resampling and retesting the length of cable from which the original sample was taken.

9.11 AC VOLTAGE TEST

9.11.1 General

These tests consist of voltage tests on each shipping length of cable. The voltage shall be applied between the conductor and the metallic shield with the metallic shield grounded. The rate of increase from the initially applied voltage to the specified test voltage shall be approximately uniform and shall be not more than 100 percent in 10 seconds nor less than 100 percent in 60 seconds.

9.11.2 AC Voltage Test

This test shall be made with an alternating potential from a transformer and generator of ample capacity but in no case less than 5 kVA. The frequency of the test voltage shall be nominally between 49 and 61 Hz and shall have a wave shape approximating a sine wave as closely as possible.

The initially applied ac test voltage shall be not greater than the rated ac voltage of the cable under test.

9.12 PARTIAL-DISCHARGE TEST PROCEDURE

Partialdischarge test shall be performed in accordance with ICEA Publication T-24-380. The manufacturer shall wait a minimum of 20 days after the insulation extrusion process before the tests are performed. The 20 day waiting period may be reduced by mutual agreement between the purchaser and manufacturer when effective degassing procedures are used.

9.13 METHOD FOR DETERMINING DIELECTRIC CONSTANT AND DIELECTRIC STRENGTH OF EXTRUDED NONCONDUCTING POLYMERIC STRESS CONTROL LAYERS

Determination of dielectric constant and dielectric strength shall be performed in accordance with ICEA T-27-58 I MEMA WC-53.

9.14 WATER CONTENT

Each end of each shipping length shall be examined for water under the jacket (if the cable is jacketed) and for water in the conductor (if cable does not have a sealant and is stranded).

45

ICEA S-108-720-2004 DATE: 7/15/û4

9.14.1 Water Under the Jacket

If the cable is jacketed, 6 inches (152 rnm) of the jacket shall be removed and the area under the jacket shall be visually examined for the presence of water. If water is present, or there is an indication that it was in contact with water, effective steps shall be taken to assure that the water is removed or that the length of cable containing water under the jacket is discarded.

9.14.2 Water in the Conductor

If the cable has an unsealed, stranded conductor, 6 inches (152 mm) of the conductor shall be exposed on each end. The strands shall be individually separated and visually examined. If water is present, the conductor shall be subjected to 9.14.4.

9.14.3 Water Expulsion Procedure

A suitable method of expelling water from the strands shall be used until the cable passes the Presence of Water Test. As soon as possible after the procedure. both ends of the cable shall be sealed to prevent the ingress of water during shipment and storage.

9.14.4 Presence of Water Test

To venb the presence of water in the conductor, the following steps shall be taken.

Each length of cable to be tested shall be sealed at one end over the insulation shield using a rubber cap filled with anhydrous calcium sulphate granules. The tubber cap shall be ñtted with a valve.

Dry nitrogen gas or dry air shall be applied at the other end until the pressure is 15 psi (100 kPa) gauge. The valve on the rubber cap shall then be opened sufficiently to hear a flow of gas.

After 15 minutes, a check of the change of color of the granules in the rubber cap shall be made.

If the color has not completely changed to pink after 15 minutes, it is an indication that a tolerable amount of moisture is present in the strands. In the case of complete change in color of all granules, the water shall be expelled from the conductor per 9.14.3.

This procedure shall be repeated after placing new granules in the cap.

46

ICEA S-108-720-2004

~ ~~ ~

Shrinkback Test ( W E Only) Pari 4 9.9 Plan C

T h i c k n e s s and Ecœniriaty Pari 4 9.4.2 Plan E

.I NonMetallic Insulation Shield

DATE: 711 5/04

Volume Resistivity

Thickness

Voids and Protrusions

9.15 PRODUCTION TEST SAMPLING PLANS

Pari 5 9.8.2 Plan H

Pari 5 9.4.2 Plan E

Pari 5 9.4.13 Pian A

Table 9-3 Summary of Production Tests and Sampling Frequency Requirements

Wafer Boil

Diameter

MINIMUM TEST MEFHOD STANDARD REFERENCE REFERENCE FREQUENCY TEST

Pari 5 9.4.12 Plan B

Appendix C 9.6 Plan A

Conductor

dc Resistance Pari 2 9.3.1 and ICEAT-27581 100%

Diameter Pari 2 ICEA T-27-581 Plan A

Temper Pari 2 ASTM

M a n w r e r certificabion that required values are met

II NonMetallìc Conductor Shield

Elongation After Aging Part 3 9.4.14 Plan H

Volume ReSküvity Pari 3 9.8.1 Plan H

Thicknecc Pari 3 9.4.2 Plan E

Voids, Protrusions and Inegulanties Pari 3 9.4.13 Plan A

Wafer Boil Pari 3 9.4.12 Plan B

Spark Test ( N m d u c ö n g Layer M Y )

ICEA T-27-581 100% pari

Il insuiation

Pari 4 9.4.8 and 9.4.9 Plan C Unaged and Aged Tensile and Elongation

Hot Creep Part 4 ICEA T-28-562 Plan B

Voids and Contaminants Palt4 9.4.13 Plan A

Diameter ADDendiDc c 9.6 Plan A

II Elongation After Aging Pari 5 9.4.14 Plan H

47

ICEA S-108-720-2004 DATE: 7/15/04

Table 93 Summary of Production Tests and Sampling Frequency Requirements (Continued)

STANDARD TEST MEíHOD MINIMUM REFERENCE REFERENCE FREQUENCY

Meiallfc Shields

Dimensional Measurements Part 6 9.5 Plan E

Jacùeîs

Unaged and Aged Tensile and Uongation

Part 7 9.4.8 and 9.4.9 Plan D ,

Thickness Part7 9.4.2 Plan E

Other Tests Applicable to Jacket Supplied

Heat Distortion Part 7 ICEA T-27-581 Pian H Il I I I 1

Heat S W Part 7 9.7.1 Plan H

Cold Bend Part 7 ICEA T-27-581 Plan F

Oil Immersion Part 7 9.4.9.3 Plan H

Volume Resisüviíy Part 7 9.8.2 Pian O

Electrical lests II ac Whstand Test Part 4 9.11 Plan G

Partial Dischame Test Patt 4 ICEA T-24-380 Plan G

Jacket Spark or W&stand Test Part 7 ICE4 T-27-581 100%

Other Te&

Moisture in Condudor Part 2 9.14 Plan G ~~

Moisture Under Jacket I 9.14 7

Plan A

One sample from each end of a manufacturer's master length. One sample from the outer end of each length is sufficient if at least one sample is taken every 10,000 feet (3.000 m).

Plan B

Three samples shall be taken per cable core extruder run. The samples shall be taken near the beginning, near the middle and near the end of each extruder run. The middle sample shall be eliminated if the extruder run is to be shipped in one continuous length.

Plan C

One test for each 50,000 feet (15,000 m) of cable or at least once per cable core extruder run.

48

ICEA S-108-720-2004

1 - 2

3-19

20 and greater

DATE: 7/15/04

each shipping length

2

10% of shipping lengths (Fractions shall be rounded to the

next higher integer value)

Plan D

Jacket Extruder Run Length-feet (meters)

less than 1,000 (300)

1,000 to 25,000 (300 to 8,000)

each additional 25,000 (8,000)

One test for each 50,000 feet (15,000 m) or at least once per jacket extruder run.

Number of Samples

O

I

1

Plan E

Table 9-4 Pian E

Plan F

Plan G

Quantity of Shipping Lengths Per Extnider Run Number of Tests

Table 9-5 Plan F

One test per shipping length. For multiple conductor assemblies, each conductor of a shipping length shall be tested.

Plan H

Each lot of material used for extrusion on the cable.

49

ICEA S-108-720-2004 DATE: 7115104

Part 10 QUALIFICATION TESTS

10.0 GENERAL

Qualification tests included in this standard are intended to demonstrate the adequacy of designs, manufacturing and materials to be used in high quality cable with the desired performance characteristics.

It is intended that the product furnished under this standard shall consistently comply with all of the qualification test requirements.

The tests are divided into three categories. The first is Cable Qualification. The second is Jacket Material Qualification. The third is ûther Qualification Tests.

If requested by the purchaser, the manufacturer shall furnish the purchaser with a cerîified copy of the qualification tests that represent the cable being purchased.

If a cable design was qualified in accordance with AEIC CS7-93 or AEIC CSô-96 specification, then it does not need to be requalified under this standard. Additional qualification tests in 10.2 and 10.3 are required to be performed, as applicable, in accordance with this standard.

10.1 CABLE QUALIFICATION TESTS

Qualification tests, as outlined in Flow Chart 10-1, shall be performed for each cable design. Samples with suitable conductor sizes (copper or aluminum) and designs shall be tested within a given voltage dass. The cable design passing qualification tests qualifies that voltage level and below, provided that the calculated electrical stresses at the conductor for the designs at lower voltage levels do not exceed the electrical stresses at the conductor calculated for the design selected for qualification purposes.

Qualification of a cable design at one emergency operating temperature (105130 OC). qualifies all similar designs at the same or lower emergency operating temperatures.

10.1.1 Cable Design Qualification

Qualification tests shall be performed for each manufacturing plant and for any changes of the compound compositions for the insulation, the conductor shield or the insulation shield. A qualified semiconducting conductor shield can be used as an insulation shield without requalification.

Qualification tests consist of various electrical tests and conditioning procedures. Cable samples are conditioned by a Cable Bending Procedure (10.1.2) and a Thermal Cycling Procedure (10.1.3). Electrical Tests include a Hot Impulse Test (10.1.4) and an ac Voltage Withstand Test (10.15). Partial Discharge (10.1.6), and Dissipation Factor (lû.1.7) are also measured. A Sample Dissection and Analysis (10.1.8) is also performed in accordance with Flow Chart 10-1. Samples for the Impulse Test and the ac Voltage Withstand Test may be preconditioned as a single long length in the Cable Bending Procedure (10.1.2) and the Thermal Cycling Procedure (10.1.3). Additionally, the Resistance Stability Test 10.3.3 shall be performed on every shield material. The manufacturer has the option to perform all tests on one sample. In this case the Hot Impulse test shall be performed after the Dissipation Factor (10.1.7) is measured and before the Sample Dissection and Analysis (70.1.8)

The Insulation Resistance Test 10.3.1 and Accelerated Water Absorption Test 10.3.2 shall be performed on each insulation material. The Discharge Resistance Test 10.3.5 shall be performed on EPR Class 1 intended for DischargeResistant designs. The Brittleness Tesî 10.3.4 shall be performed on every shield material. The results shall be on file with the manufacturer and are not required to be reported on the Cable Design Qualification Test report unless specifically requested.

50

DATE: 711 5/04 ICEA S-108-720-2004

If a cable design has been qualified, and the metallic shield or sheath, or the jacket generic type is changed while the cable core design, materials and manufacturing plant remains unchanged, the cable may be requalified by completing the Cable Bending Procedure (10.1.2) the Thermal Cycling Procedure (10.1.3) and the Sample Dissection and Analysis (10.1.8). The generic metallic shield, sheath or jacket types are specified in Table 10-1. Tests on the identical maten'als or design are not necessary to demonstrate the desired performance results. For jacket design changes only, the voltage during heat cycle (10.1.3.1) is not required.

Table 10-1 Generic Groupings of Cable Components

Metallic Shield and Sheaths

Longiîudinally Applied and Overlapped Comgated Tape

wire

Fiat Strap

Lead Sheath

II n Smooth Aluminum Sheath

Continuously Corrugated Sheath

Nonconducting Jackets:

b)

c) High density polyethylene

Low, medium and linear low density polyethylene

51

ICEA S-108-720-2004

FLOW CHART 10-1 QUALIFICATION TESTS

DATE: 7/15/04

TWO SAMPLES

I I I I I ONE SAMPLE

u TBST

PERFORM DISSECTION ( l . O + l , 8 )

52

ICEA S-108-720-2004 DATE: 7/15/04

10.1.2 Cable Bending Procedure

The cable sample(s) shall be bent around a cylindrical fixture at least one complete turn (360'). The cable shall be unwound and the bend repeated in the opposite direction. The sample(s) shall be bent at room temperature. A total of three bending cycles (three forward bends and three reverse bends) are required. The portion of the cable that is to be used for terminations need not be bent.

10.1.2.1 Bending Diameter

The cylindrical bending Mure shall have a diameter of:

1. 36(d+D) + 5% for cable designs with non bonded smooth aluminum sheaths or,

2. 25(d+D) + 5% for cable designs with lead, corngated sheaths, bonded smooth aluminum sheaths or longitudinally applied bonded metallic foil laminates (overlapped or welded) or,

3. 20(d+D) + 5% for all other designs.

Where: d is the diameter of the conductor and D is the overall diameter of the compiete cable.

10.1.3 Thermal Cycling Procedure

After the Cable Bending Procedure (10.1.2), the sample(s) shall be installed in a pipe with a "u" bend (180' bend) sized so that when the cable is lying on the bottom surface of the pipe, there will be approximately 2 inches (51mm) of clearance between the top surface of the cable and the inner surface of the pipe. The "U" bend shall be located near the midpoint of the pipe. The diameter of the "U" bend is specified in 10.1.2.1 of the Cable Bending Procedure. Alternately, the cable may be wrapped with insulating material provided that the cable is formed into a loop with a "U" bend as described above. If thermal insulation is used, the "U" bend must be supported during this test. The sample shall be heated by circulation of current so that the conductor is at the designated emergency operating temperature for the cable design being tested. The temperature profile, as required in 10.1.3.1, shall be reported as part of the test report.

If thermai insulation material is used, it shall have a uniform thermal resistance along the cable length. It shall also yield a temperature gradient across the cable that is within five degrees of the temperature gradient, which would be obtained by placing the cable in a plastic pipe. The thermal gradient is defined as the temperature difference between the conductor and the outside surface of the cable jacket.

To insure that the thermal insulation and the plastic pipe yield a similar temperature gradient, it may be necessary to set up a "dummy" length of cable using a pipe and thermal insulation material to compare the thermal characteristics of each.

10.1.3.1 Thermal Cycles

The thermal cycling shall be as follows:

1. Heating shall be applied for a minimum of 8 hours.

2. The conductor shall be maintained at the specified temperature for the last two hours of the heating period.

3. The heating period shall be followed by a cooling period of not less than 16 hours at room temperature.

4. Twenty (20) complete heating and cooling cycles shall be completed.

53

ICEA S-108-720-2004 DA=. 711 5/04

10.1.3.2Voltage During Thermal Cycles

During the thermal cycling described in 10.1.3.1, the sample(s)shall be energized at 2.0 V,.

10.1.4 Hot Impulse Test Procedure

A hot impulse test shall be made in accordance with IEEE Standard No. 82, "Test Procedure for Impulse Voltage Tests on Insulated Conductors," on one of the preconditioned samples of cable as shown in Flow Chart. The cable sample shall have a minimum active length is 30 feet (9.2 m). Hot impulse tests shall be made with the sample placed in a 15 foot (4.5 rn) long polyethylene or PVC conduit. The conduit diameter shall be such that when the cabie is lying on the bottom of the conduit, there shall be a clearance of approximately 2 inches (51 mm) between the top of the cable and the inner surface of the conduit.

For hot impulse tests, the temperature of the conductor shall be equal to the rated emergency overload temperature of the cable +O/-5 OC. The temperature shall be achieved by circulating current in the conductor. The temperature at which the cables are qualified shall be reported.

Ten impulses of each polarity with magnitude equal to the BIL shown in Table 4-6 shall be applied. The voltage shall then be raised over the BIL values listed in steps of approximately 10% of BIL with three impulses of negative polarity applied at each step and continuing to cable breakdown outside the terminals. The test may be discontinued when the limits of the test equipment are reached provided that the sample has passed the BIL value specified in Table 4-6.

If the test has been discontinued without a cable breakdown, the sample shall be subjected to an ac withstand test at 2.5 V, for a duration of 15 minutes. This test is conducted to verify that the cable has not failed on the last impulse.

impulse breakdown sites shall be dissected and the results shall be recorded and reported in the qualification test report.

10.1.5 AC Voltage Withstand Test Procedure

The second preconditioned cable sample will be given an ac voltage test. The cable sample shall have a minimum active length of 30 feet (9.2 m). The sample, at room temperature, shall withstand an ac voltage of 2.5 V, for 2 hours. The voltage applied to the sample shall be of power frequency (4961 hz) and the waveform shall be substantially sinusoidal.

i 0.1.6 Partial Discharge Test Procedure (For Díscharge-Free Designs Only)

After completion of the ac Voltage Withstand Test, the cable sample shall pass a partial discharge test as described in 4.3.2.1 of this standard except that the upper limit of the applied voltage shall be limited to 2.0 V,. The cable sample may be re-terminated for this test.

10.1.7 Measurement of Dissipation Factor

After completion of the partial discharge test, the sample shall have the dissipation factor measured. The sample shall be heated by circulating current to the specified emergency operation temperature +O/-5 OC in an enclosed conduit. The diameter of the conduit shall be as outlined in 10.1.4. Alternately, the sample may be wrapped in thermal insulation material. The dissipation factor shall be measured at V, while the cable is at the temperature specified above. The dissipation factor shall meet the requirements of Part 4.

10.1.8 Dissection and Analysis of Test Specimens

A dissection of the cabie samples subjected to Tests 10.1.2, 10.1.3 and 10.1.5 through 10.1.7 shall be made upon completion of the testing. The findings of the dissection, including a comparison with an unaged cable specimen of the same cable design shall be included with the qualification test data for information only.

54

ICEA S-108-720-2004 DATE: 7/15/04

10.2 JACKET MATERIAL QUALIFICATION TESTS

The following qualification tests are for specific types of jacketing materials and shall be performed on each compound. The jacket material tests or certification from the material supplier can be used by all cable producers who propose to use the material. The material qualification is valid until the compound is changed.

10.2.1 Polyethylene Jackets

10,2.1.1 Environmental Stress Cracking Test

Except as otherwise specified in 10.2.1.1.1 and 10.2.1.1.2, this test shall be made in accordance with ASTM D 1693.

10.2.1.1.1 Test Specimen

Three test specimens approximately 1.5 inches (38.1 mm) long, 0.5 inch (12.7 mm) wide, and 0.125 inch (3.18 mm) thick from the sample shall be molded from matenal intended for extrusion. The temperature of the molded specimens shall be lowered a t any suitable rate. A slit made with a razor blade, approximately 0.75 inch (19.0 mm) long and from 0.020 to 0.025 inch (0.51 to 0.64 mm) deep, shall be centrally located on one of the 1.5 inch by 0.5 inch (38.1 mm by 12.7 mm) surfaces.

10.2.1.1.2 Test Procedure

The specimens shall be bent with the slit on the outside and placed in a test tube 200 mm long and 32 mm in outside diameter. The cracking agent (Igepal C0-630, made by the GAF Corporation, or its equivalent) shall be added to completely cover the specimen. The test tube, suitably closed by means such as foil-covered cork, shall be placed in an oven at 50 OC +I OC for 48 hours. At the end of this period, the specimens shall be removed, allowed to cool to room temperature, and inspected for cracking.

10.2.1 .2Absorption Coefficient Test

The absorption coefficient of polyethylene jacket compound shall be determined in accordance with ASTM D 3349. Three test specimens shall be tested and the average of the results reported.

10.2.2 Semiconducting Extruded Jacket Coatings

102.2.1 Brittleness Temperature (See 10.3.4)

10.2.3 Polyvinyi Chloride

i 0.2.3.1 Sunlight Resistance

10.2.3.1.1 Test Samples

Five samples shall be prepared from material intended for extrusion or from completed cable.

10.2.3.1.2 Test Procedure

The test may be performed using either a carbon-arc or xenon-arc apparatus. For a carbon-arc apparatus, five samples shall be mounted vertically in the specimen drum of the carbon-arc-radiation and

55

ICEA S-lO8-720-2OO4 DATE 711 5/04

~

I I I I

water-spray exposure equipment per ASTM G 153. For the xenon-arc apparatus, the samples shall be mounted, top and bottom, on a rack of the xenon-awadiation and water-spray exposure equipment per ASTM G 155. The test method shall also be in accordance with ASTM G 153 or ASTM G 155 respectively using Cycle 1 exposure conditions. The exposure time shall be 720 hours. Five die-cut specimens shall be prepared and tested for tensile and elongation from (1) unaged section of the cable jacket and (2) the conditioned samples, one specimen from each sample. The respective averages shall be calculated from the five tensile strength and elongation values obtained for the conditioned samples. These averages shall be divided by the equivalent averages of the five tensile and elongation values obtained for the unaged specimens. This provides the tensile and elongation ratios for the jacket. The jacket is not sunlight resistant if an 80 percent or greater retention for either the tensile or elongation after the 720 hours of exposure is not maintained.

I I 1 Stability Factor after 14 days, maximum* I .o

10.3 OTHER QUALIFICATION TESTS

I 1 Alternate to Stability Factor - Stabiïi Factor I difference, 1 to 14 davs. maximum*

10.3.1 Insulation Resistance

Accelerated Water Absorption Properties

(Electrical Method)

Water Immersion Temwrature. OC

Insulation resistance test shall be performed in accordance with ICEA T-27-581/NEMA WC-53.

Insulation Type EPR

Class I 8 II XìPE

75 75

10.3.2 Accelerated Water Absorption Tests

Dielecîtic Constant afier 24 hours, maximurn

Increase in capacitance, maximum, percent I to 14 days 7 to 14 davs

Accelerated water absorption test shall be performed in accordance with ICEA T-27-581/NEMA WC-53. Cables intended for installation in dry locations or having a radial moisture banier in accordance with paragraph 6.4 do not have to meet the Accelerated Water Absorption Test. The insulation shall meet the following requirements:

~

3.5 4.0

3.0 3.5 I .5 1.5

Table 10-2 Accelerated Water Absorption Properties

0.5 II Only one oí these Co requiremenis need be saüsfied, not both.

10.3.3 Resistance Stability Test

The requirements described in Parts 3 and 5 of this standard and in ICEA T-25425 shall be met.

56

KEA S-108-720-2004 DATE: 711 5/04

10.3.4 Brittleness Temperature for Semiconducting Shields

This test shall be performed on a sample of the matenal(s) intended for extrusion in accordance with ASTM D 746 using a Type I or II Specimen.

10.3.5 Discharge Resistance Test for Discharge-Resistant EPR Designs Only

Compound mixing qualification of the insulation used for discharge-resistant cable designs is required. Once per month a sample of each qualified insulation shall be obtained from each compound mixing line and subjected to this test

The test shall be performed in accordance with ASTM D 2275 using the following standard specimens and conditions.

10.3.5.1 Test Specimens

From each test sample, three test specimens, each having a minimum diameter Of 4 inches (101.6 mm) and a thickness of 0.060 inch +, 0.004 inch (1 5 2 mm f 0.10 mm), shall be molded and suitably cured. The prepared specimens shall be held for a minimum of 72 hours at room temperature followed by 16 hours minimum in the same environment as the electrical discharge test.

10.3.5.2Test Environment

The discharge test shall be performed in an area provided with a controlleddraft flow of conditioned air to maintain the required relative humidity and temperature and with suitable venting to remove ozone and other gasses.

10.3.5.3Test Electrodes

The electrodes shall be of stainless steel Type 309 or 310, with a surface finish of 16 pin (0.406 pm). Each upper electrode, to which the test voltage is applied, shall be a cylindrical rod having a diameter of 0.250 inch +- 0.010 inch (6.35 mm i 0.254 mm) and a length adjusted to provide a contact weight of 30 grams +- 3 grams when positioned vertically atop the center of the insulation specimen. The contacting end shall be flat except for edges rounded to a radius of 0.035 inch i 0.005 inch (0.89 mm H.127 mm). The lower electrode(s) shall be electrically grounded and may be either (1) a common plate under, and extending at least 2 inches (50.8 mm) beyond, the array of upper electrodes or (2) individual flat discs of 1.25 inch (31.75 mm) minimum diameter, centered under each upper electrode.

57

ICEA S-108-720-2004

Part 11 APPENDICES

DATE: 7/15/04

APPENDIX A NEMA, ICEA, IEEE, ASTM AND ANSI STANDARDS (Normative)

A I NEMA PUBLICATIONSt

WC 26/EEMAC 201 Binational Wire and Cable Packaging (2000)

WC 5311CEA T-27-581 (2000)

Standard Test Methods for Extruded Dielectric Power, Control, Instrumentation & Portable Cables for Test

A2 ICEA PUBLICATIONSt

P-32-382-1999 Short Circuit Characteristic of Insulated Cable

P-45482-1999 Short Circuit Performance of Metallic Shields and Sheaths on Insulated Cable

T-24-380-1994 Guide for Partial-Discharge Test Procedure

T-254252003 Guide for Establishing Stahiity of Volume Resistivity for Conducting Polymeric Components of Power Cables

T-28-562-1995 Test Method for Measurement of Hot Creep of Polymeric Insulation

T-31-610-1994 Guide for Conducting a Longitudinal Water Penetration Resistance Test for Sealed Conductor

T-32-645.1993 Guide for Establishing Compatibility of Sealed Conductor Filler Compounds with Conductor Stress Control Materials

T-34-664-1996 Guide for Conducting Longitudinal Water Penetration Resistance Tests on Longitudinal Water Blocked Cables

A3 IEEE AND ANSI STANDARDS$

IEEE Std 82-2002 IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors

IEEWANSI C2-2000 National Electrical Safety Code (NESC)

A4 ASTM STANDARDS*

B 3-01 Soft or Annealed Copper Wire. Specification for

B 500

B û-99

ToughPitch Electrolytic Copper Refinery Shapes, Specification for

Concentric-Lay Stranded Copper Conductors, Hard, Medium-Hard, or Soft, Specification for

58

ICEA S-108-720-2004 DATE: 7/15/04

B 29-92

B 33-00

B 193-02

B 230-99

B 231-99

B 233-97

B 400-01

B 496-01

B 609-99

B 784-01

B 786-02

B 787-01

B 800-00

B 801 -99

B 835-00

B 836-00

D 412-98

D 471-98

D 746-98

D 1693-01

D 227501

D 276501

Refined Lead, Specification for

Tinned Soft or Annealed Copper Wire for Electrical Purposes, Specification for

Resistivity of Electrical Conductor Materials, Test Method for

Aluminum 1350-HI9 Wire, far Eledncal Purposes, Specification for

Concentric-Lay-Stranded Aluminurn 1350 Conductors, Specification for

Aluminum 1350 Drawing Stock for Electrical Purposes, Specification for

Compact Round Concentric-Lay-Stranded Aluminum 1350 Conductors, Specification for

Compact Round ConcenirieLay Stranded Copper Conductors, Specification for

Aluminum 1350 Round Wire, Annealed and Intermediate Tempers, for Electrical Purposes, Specification for

Modified Concentric-Lay-Stranded Copper Conductor for Use in Insulated Electrical Cables, Specification for

19 Wire Combination Unilay-Stranded Aluminum 1350 Conductors for Subsequent Insulation, Specification for

19 Wire Combination Unilay-Stranded Copper Conductors for Subsequent Insulation, Specification for

8000 Series Aluminurn Alloy wire for Electrical Purposes - Annealed and Intermediate Tempers, Specification for

Concentric-Lay-Stranded Conductors of 8000 Series Aluminum Alloy for Subsequent Covering or Insulation, Specification for

Compact Round SIW Stranded Copper Conductors, Specification for

Compact Round SIW Stranded Aluminum Conductors, Specification for

Vulcanized Rubber and Thermoplastic Rubbers and Thermoplastic Elastomers - Tension, Test Methods for

Rubber Properly - Effect of Liquids. Test for

Brittleness Temperature of Plastics and Elastomers by Impact, Test Method for

Environmental Stress - Cracking of Ethylene Plastics, Test Method for

Voltage Endurance of Solid Insulating Materials Subjected to Partial Discharges (Corona) on the Surface, Test Method For

Determination of Gel Content and Swell Ratio of Crosslinked Ethyíene Plastics, Test Methods for

59

ICEA S-108-720-2004 DATE: 7/15/04

D 3349-99 Absorption Coefficient of Ethylene Polymer Material Pigmented with Carbon Black, Test Method for

D 4496-99 DC Resistance or Conductance of Moderately Conductive Materials, Test Method for

G 153-00 Operating Enclosed Carbon Arc Light Apparatus for Exposure of Nonmetallic Materials, Practice for

G 15500 Operating Enclosed Xenon Arc Light Apparatus for Exposure of Nonmetallic Materials, Practice for

t Copies may be obtained from Global Engineering Documents, 15 Inverness Way East, Englewood, CO 801 12, USA.

$ Copies may be obtained from IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854, USA.

Copies may be obtained from the American Society for Testing and Materials, I00 Barr Harbor Drive, West Conshohocken, PA 19429-2959, USA.

60

ICEA 5-108-720-2004 DATE: 7/15/04

APPENDIX B EMERGENCY OVERLOADS (Normative)

Operations at the emergency overload temperature shall not exceed 1500 hours cumulative during the lifetime of the cable. Overload temperatures are 105 to 130 OC for cables rated up to and including 138 kV and 105 OC for cables rated abwe 138 kV.

STATEMENT ON EMERGENCY OPERATING TEMPERATURE

The following discussion is intended to point out some of the factors which should be taken into consideration when operating extruded power cables at conductor temperatures in excess of 105 Oc. It is not intended to be a comprehensive discussion. The cable manufacturer should be contacted for specific details regarding the operation of cables at temperatures above 90 "C.

Extensive tests sponsored by the Electric Power Research Institute (EPRI) have shown that conductive and insulating thermoset materials commonly used in the construction of extruded underground distribution power cables are capable of operating satisfactorily at 130°C or higher. However, some electric power utilities and testing facilities have determined from experience and from tests that the maximum conductor temperature of a composite power cable constructed with these materials may need to be less than 130°C which has been used in the past.

This limitation is necessary because some metallic shield designs are known to cause operating problems when the cable core diameter is large. This problem is primarily the result of thermal expansion of the cable core which can be very significant at conductor temperatures as high as 130 "C. Some metallic shield designs and their effect on cable cores at elevated emergency operating temperatures are discussed below.

Wire Shields

Concentrically applied wire shields can imbed in the insulation shield when the cable core expands. Conductive, cloth-type bedding tapes over the insulation shield and carefully chosen lay factors can be employed to minimize this problem.

Copper Tape Shields

Helically applied copper tape shields may stretch and lose contact with the insulation shield. They can also wrinkle and crack. Properly chosen conductive, cloth-type semiconducting bedding tapes can be used to minimize this problem.

Metallic Sheaths

Lead sheaths have a tendency to stretch and lose contact with the insulation shield. Semiconducting bedding tapes over the insulation shield may be needed to minimize this problem. Cormgated or smooth aluminum or copper sheaths are also available.

Flat Straps Shields

Concentrically applied Rat strap shields can cause severe deformation of the cable core. They can also cause torsional forces which may damage the conductor. Flat strap shields are not recommended for XLPE cables that may operate at conductor temperatures near 130 "C.

61

ICEA S-108-720-2004 DATE: 7/15/04

Longitudinally Folded Corrugated Copper Tape Shields

Longitudinally folded corrugated copper iape shields are capable of expanding and contracting with the cable core with Iìffle or no adverse effects.

Overall Jackets

Commonly used jacketing materials such as low density polyethylene (LDPE) and polyvinyl chloride (PVC) can become soft and deform when the cable conductor is operated at elevated temperatures. Cracking of LDPE jackets has also been observed. Careful jacket extrusion and cooling techniques or other jacket compounds may be useful altematives.

Other Factors

The metallic shield designs mentioned are often used in combination with each other. The ability of these combinations to withstand elevated emergency operating temperatures is very much a function of the specific combination employed.

Joint and termination limitations, cable environmental conditions as well as metallic shield designs may require the use of lower emergency operating temperatures. Consideration of mechanical constraints of cabíe accessories and to the cable installation must be given when cables are to be operated at high temperatures.

Summary

In summary, the ability of a transmission cable system to withstand emergency temperatures is a complex function of all of the materials used in the cable design. In addition, there is a shortage of research and field experience for high voltage extruded insulation transmission cables operating for long periods at temperatures greater than 90°C. The information presented here is only intended to give the cable user a brief review of some of the variables that must be considered before operating a cable system at emergency temperatures above i05 OC. The cable manufacturer should be consulted for verification of the emergency operating temperature of a given cable design.

62

ICEA S-108-720-2004 DATE: 7/15/û4

APPENDIX C PROCEDURE FOR DETERMINING THICKNESS REQUIREMENTS OF THE

INSULATION SHIELD, LEAD SHEATH AND JACKET (Normative)

C I Insulation shield, lead sheath ( i applicable) and jacket thicknesses shall be determined by calculating diameters as follows. This procedure is not intended for determining cable diametee. Ail dimensions are in mils.

Cl.1 The calculated diameter over the insulation shall be determined as follows:

D, = C + A , + 2 x C S + 2 x T

Where:

DI = C = Al = CS = T = Nominal insulation thickness (Manufacturer to determine)

Calculated diameter over insulation Applicable nominal conductor diameter from Part 2 (for segmental use smallest diameter) Semiconducting tape adder, if applicable (Manufacturer to determine) Minimum point extruded conductor shield thickness from Part 3

C1.2 The calculated diameter under metallic shielding shall be determined as follows:

DA =D,+80+A2

Where:

DA = DI = AZ =

Calculated diameter under metallic shielding Calculated diameter over insulation Semiconducting bedding layer diameter adder, if applicable (Manufacturer to determine)

Cl .3 The calculated diameter under jacket shall be determined as follows:

D B = D A + 2 x T , + A ,

Where:

DB = DA = TS =

Calculated diameter under jacket Calculated diameter under metallic shielding Metallic shield thickness (Manufacturer to determine - Minimum point thickness for lead and smooth aluminum sheath, wire diameter, cormgation height for corrugated sheaths and tape shields, flat strap thickness, equivalent thickness for helically applied tape shield or for combination shieldlsheaths the combined thickness) Bedding layer or separator tape diameter adder, if applicable (Manufacturer to determine) Ag =

Example:

1500 compact segmental conductor, conductor shield, 650 nominal insulation wall, insulation shield, bedding tape, lead sheath and a LLDPE jacket, 138 kV cable.

63

ICEA S-108-720-2004 DATE 7/15/04

Calculate calculated diameter over the insulation:

C AI 2xcs 2 x T DI

= 1375 mils = 48 mils (Manufacturer determined) = 48 mils (CS = 24 from Part 3) = l3QQ mils (T= 650 Manufacturer determined) = 2771 mils

Determine insulation shield thickness requirements:

Based on the calculated diameter over the insulation of 2.771 inches per Table 5-1 insulation shield thicknesses shall be 40 mils minimum point and 100 mils maximum point.

Calculated diameter under metallic shielding:

DI

Az DA

= 2771 mils = 80 mils = i28 mils (Manufacturer determined) = 2979 mils

Determine lead sheath thickness:

Based on the calculated diameter over the insulation of 2.979 inches per Table 6-1 lead sheath thicknesses shall be 100 mils minimum point and 150 mils maximum point.

Calculated diameter under jacket:

= 2979 mils = 200 mils (Ts = 100 from Part 6) = D mils (Manufacturer determined) = 3179 mils

Determine lead sheath thickness:

Based on the calculated diameter over the insulation of 3.179 inches per Table 7-5 jacket thicknesses shall be 100 mils minimum point and 150 mils maximum point.

64

ICEA S-108-720-2004 DATE 7/15/04

APPENDIX D CABLE COMPONENT FUNCTION (Informative)

D I CONDUCTOR

D1.1 Function A wire or combination of wires designed for carrying an electric current. The current could be due to a

normal load, emergency load or from a short-circuit condition. During installation, the conductor typically iS a mechanical load-bearing component of a cable.

01.2 Material

propetties are to be considered when selecting the material of the conductor. Copper and aluminum are the two most commonly used conductor materials. At least the following

Tensile Strength Conductivity Density Specific Heat Flexibility Elongation Coefficient of Expansion Corrosion resistance

D2 CONDUCTOR SHIELD

D2.1 Function

A nonconducting or semiconducting element in direct contact with the conductor and in intimate contact with the inner surface of the insulation that acts as a stress control layer.

D2.1.1 Nonconducting

Its function is to provide uniform voltage stress at the inner surface of the insulating wall.

D2.1.2 Semiconducting

Its function is to eliminate ionization at the conductor and provide uniform voltage stress at the inner surface of the insulating wall. The potential of this element is essentially the same as the conductor.

D2.2 Voltage Stress

according to the following equation: The voltage stress within a cable is highest at the conductor (or semiconducting conductor shield)

V’ = Vg / (R x in($)) Where:

Vs = Radial voltage stress in kV/mm V, = Voltage to ground in kV R = Distance from center of conductor in mm D = Diameter over the insulation d = Diameter over the conductor (or semiconducting conductor shield)

65

ICEA S-108-720-2004 DATE 711 5104

"Since D and d only appear in the ratio Old, their units of measure do not matter as long as they are the same.

From this equation, the radiai voltage stress increases as "f?" approaches "CUY with the voltage stress reaching Ws maximum when R = CV2 at the surface of the conductor or conductor shield. Decreasing the diameter "6 of the conductor increases the radial voltage stresses. Without a smooth cylindrical conductor shield around a stranded conductor (see Figure 0-1). the voltage stresses would be concentrated around the individual conductor strands increasing the potential for insulation breakdown and future faults.

CONDUCTOR

CONDUCTOR SHIELDING

INSULATION

IONIZATION

Conductor Shielding Figure D-1

D3 INSULATION

The next layer of material on the cable is the insulation. It is relied upon to electrically insulate the conductor from other conductors or conducting parts or from ground. The insulation material must be capable of withstanding the electrical stresses that will be distributed across it when the conductor is energized. It also has to withstand the thermal and mechanical forces that occur during installation and operation of the cable.

D4 INSULATION SHIELD

Insulation shields are applied over the insulation material. Insulation shields generally consist of a conductive non-metallic shield and a metallic shield. The purpose of an insulation shield is to confine the electric field within the insulation and to symmetncaliy distribute voltage stresses in the cable insulation. Cables without insulation shields have electric fields that extend partially within the insulation and whatever exists between the insulation and ground. If the field is sufficiently intense, it will cause the air near the cable to ionize and form corona (Figure û-h) which can damage the cable insulation or it can cause the insulation itself to break down. Nonuniform distribution of the electric field causes increased radial stress in portions of the insulation (Figure D-2a). A shield applied over the insulation results in a symmetrically distributed radial stress, thus utilizing the insulation to its greatest efficiency (Figure D2b). The stress at the insulationlinsulaüon shield interface is an important parameter when selecting accessories. This stress can be calculated with the following formula.

G,, = Vg /(Ri x In(%)) Where:

Gdn = Voltage stress at the insulationlinsulation shield interface in kV/mm V, = Voltage to ground in kV Ri = Radius over the insulation in mm Rs = Radius of the conductor shieldlinsulation interface in mm.

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ICEA S-108-720-2004 DATE 711 5/04

Mechanical Protection

Chemical Protection

04.1 Semiconducting Shield

Semiconducting elements applied directly over and in intimate contact with the outer surface of the insulation. When effectively grounded. its function is to confine the dielectric stress to the underlying insulation. Additionally, with discharge free designs, it eliminates ionization at the surface of the insulation.

Jackets provide a certain amount of protection to the cable core from mechanical abuse such as abrasion, scoring and impact and sidewall bearing pressures that occur during handling and installation.

Jackets can provide protection from certain chemicals that might be detrimental to the cable core.

D4.2 Metallic Shield

A nonmagnetic, metallic material applied over the semiconducting shield. The purpose of the metallic shield is to serve as a current-canying medium for charging and leakage currents and to provide a solid ground plane. If the metallic shield is large enough, it can also be used to cany neutral currents, unbalanced phase currents and fault currents. The metallic shield can consist of wires, flat straps, tape, foils or a sheath.

NON-SHIELDED CABLE

CONDUCTOR

EVEN STRESS DISTRIBUTION

HIGH STRESS CONCENTRATION

Figure D-2

D5 JACKETS

The jacket is a covering that provides the functions listed in Table P1.The jacket can either be nonconducting or semiconducting.

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,onFiltratlon

Corrosion Resistance

Research has shown that many of the contaminants found in cable insulations have migrated into the cable from the surrounding soil. Jackets, though not typically designed for this, do filter out some of these ions as moisture migrates into the cable. As a general rule, the ability of the jacket to filter ions will increase as the thickness of the jacket wall increases.

Moisture Migration

Experience has shown that the metallic shields of un-jacketed cables will corrode in many types of coil. The application of a jacket can greatly reduce this corrosion.

Moisture penetration is a major conbibutor to the deterioration of cable insulation. Jackets can reduce the rate at which moisture migrates into the cable core.

Electrical L The jacket sewes a very important electrical function in bonded cable systems such as single-point bonding and cross bonding. To work properly and avoid rapid corrosion phenomena, these bonding systems require that the metallic shield of the cable and joint are electrically isolated from earth ootential.

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ICEA S-108-720-2004 DATE: 7/15/04

Shield or Sheath Type

APPENDIX E HANDLING AND INSTALLATION PARAMETERS (Informative)

Ratio of Bend Radius to Cable O.D.*

1

E I INSTALLATION TEMPERATURES

Helically Applied flat Tape

Longitudinally Applied Corrugated Tape

wires or Flat Straps Shields

All cable manufactured to this standard can be safely handled if not subjected to temperatures lower than -10 OC in the twenty four hour period preceding installation. For installation during colder temperatures contact the cable manufacturer for cable suitability or recommended practices.

20

20

18

E2 RECOMMENDED MINIMUM BENDING RADIUS

Lead Sheath

Non Bonded Smooth Aluminum Sheath

Bonded Smooth Aluminum Sheath

The limits shown in Table E-I may not be suitable for conduit bends, sheaves, or other curved surfaces around which the cable may be pulled under tension while being installed due to sidewall bearing pressure limits of the cable. The minimum radius specified refers to the inner radius of the cable bend and not to the axis of the cable.

18

40

20

Table E4 Recommended Minimum Bending Radius

Corrugated Sheath (copper or aluminum) 20

* For combination shields and/or sheaths use the highest ratio

E3 DRUM DIAMETERS OF REELS

The manufacturer shall determine the minimum diameter of the drum of the reel. Information on reel construction and sizing may be found in NEMA Publication No. WC 26, Binational Wire and Cable Packaging.

E4 MAXIMUM TENSION AND SIDEWALL BEARING PRESSURES

Consult the cable manufacturer for recommended maximum pulling tensions and maximum sidewall bearing pressures.

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ICEA S-108-720-2004 DATE 7115104

E5 ELECTRICAL TESTS AFTER INSTALLATION

E5.1 Insulation

Tests on new installations are camed out when the installation of the cable and itc accessories has been completed. By agreement between the manufacturer and the purchaser, an ac voltage at a frequency between 20 Hz and 300 Hz, in accordance with one of the following may be used:

E5.1 .I Test for 1 hour with a voltage of 1.4 V, to 1.7 V, , depending on practical operational conditions.

E5.1.2 Test for at least 24 hours with the normal operating voltage of the system.

E5.2 Jacket

If a semiconducting coating is applied over the jacket, the jacket maybe tested with a dc voltage. A dc voltage of 150 V/mil (6 kV/mm) of the average value of the specified minimum point and maximum point thickness of the jacket with a maximum of 24 kV between the metallic shieldsheath and the semiconducting outer coating shall be applied for one minute.

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Rated Circuit Voltage,

Phase4oPhase Voltage (kV)

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APPENDIX F TRADITIONAL INSULATION WALL THICKNESS (Informative)

ac Test Voltage

3.0 Vg 25 Vg

Minimum Avenge Conductor Insulation Thickness 15 Min. Test 30 Min. Test

Size, S h ,

Mils (mm) (kv) 0 (kcmil) (mm?

500-2000 253-1013 650 (16.2) 120 1 O0

750-3000 380-1520 800 (20.3) 200 160

750-3000 380-1 520 850 (21.6) 240 200

Table F-I Traditional Insulation Thickness from AEIC CS7-93, Test Voltages and Conductor Sizes

Notes on Table F-I: 1. Either the 15 minute or the 30 minute ac test is required. Ac test levels for the appropriate rated voltage

are to be used as the basis for ac testing should insulation thickness other than those in Table F-I be utilized. All ac tests shall be conducted at room temperature and at power frequency (4461 Hz). The waveform shall be substantially sinusoidal. All ac voltages are mis values.

2. The actual operating voltage shall not exceed the rated circuit voltage by more than (a) 5 percent during continuous operation or @) 10 percent during emergencies lasüng not more than 15 minutes.

3. The cable insulation thickness specified is for application where the system is provided with circuit protection such that ground faults will be deared as rapidly as possible, but in any case within one minute. While these cables are applicable to installations which are on grounded systems, they may also be used on other cable systems, provided the above dearing requirements are met in completely de-energizing the faulted section.

4. For other voltage ratings and conductor sizes, specific agreement between purchaser and manufacturer in the selection of insulation thickness for each application is required. When the purchaser is considering conductor sizes or insulation wall thickness less than the values shown in Table F-I, the effects of maximum voltage stresses should be evaluated.

5. There may be unusual installations and/or operating conditions where mechanical considerations dictate the use of a larger insulation thickness. When such conditions are anticipated, the purchaser should consult with the cable supplier to determine the appropriate insulation thickness.

6. It is recommended that the minimum size conductor be in accordance with Table F-I . 7. AEIC CS7-93 did not include thicknesses for greater than 138 kV class cables. 8. A radial moisture barrier is optional on cables with traditional insulation wall thicknesses as shown in

Table F-I.

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APPENDIX G ADDITIONAL SHIELD WIRE AND CONDUCTOR INFORMATION (Informative)

Table G-1 Solid Comer Shield Wires

Approximate Weight Conductor

Sue, Copper

20 3.10 4.61

19 3.90 5.81

i a 4.92 7.32

17 6.21 9.24

16 7.81 11.6

15 9.87 14.7

14 12.4 18.5

13 15.7 23.4

12 19.8 29.4

11 24.9 37.1

10 31.43 46.77

9 39.62 58.95

a 49.98 74.38

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Table G-2 Concentric Stranded Class B Aluminum and Copper Conductors

Approximate WeigM

Aluminum -pper

Approximate Diameter of Conductor Number of EachStrand

Sue, AWG or Suands

srm Pounds per Slm 1 O00 Feet

Pounds per 1000 Feet mils mm kcmil

250 37 300 37 350 37 400 37 450 37 500 37 550 61 600 61 650 61 700 61 750 61 800 61 900 61 1000 61 1100 91 1200 91 1250 91 1300 91 1400 91 1500 91 1600 127 1700 127 1 750 127 1800 1 27 1900 1 27 2000 1 27 2250 127 2500 127 2750 169 3Ooo 169 3250 169 3500 169 3750 217

822 90.0 97.3

104.0 110.3 116.2 95.0 992

103.2 107.1 110.9 114.5 121.5 128.0 109.9 114.8 117.2 119.5 124.0 128.4 112.2 115.7 117.4 119.1 122.3 125.5 133.1 140.3 127.6 133.2 138.7 143.9 131.5

2.09 235 2.29 282 2.47 329 264 376 2.80 422 2.95 469 2.41 517 2.52 563 2.62 610 2.72 657 2.82 704 2.91 751 3.09 845 3.25 939 2.79 1032 2.92 1126 2.98 1173 3.04 1220 3.15 1313 326 1408 2.85 1501 2.94 1 596 2.98 1643 3.02 1691 3.11 1783 3.19 1877 3.38 2132 3.56 2369 3.24 2607 3.38 2841 3.52 3111 3.66 3348 3.34 3590

349 419 489 559 629 699 768

908 978 1 o50 1120 1260 1400 1540 1680 1750 1820 1960 21 O0 240 2370 2440 251 o 2650 2790 3170 3530 3880 4230 4630 4980 5340

a38

772 925

1080 1236 1390 1542 1700 1850 2006 2160 2316 2469 2780 3086 3394 3703 3859 401 2 4320 4632 4936 5249 5403 5562 5865 6176 701 5 7794 8579 9349 10235 11017 11813

1150 1380 1610 1840 2070 2300 2530 2760 2990 3220 3450 3680 4140 4590 5050 551 o 5740 5970 6430 6890 7350 7810 8040 8270 8730 9190 10440 11600 12770 13910 15230 16400 17580

4000 21 7 135.8 3.45 3829 5700 12598 18750

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Table 63 Concentric Stranded Class C and D Aluminum and Copper Conductors

Class c Class D

Approximate Diameter of Each Approximate Diameter of Each Conductor

Size, AwG or Number of Strand Number of Strand kcmil Strands Strands

mils mm mils mm

250 61 64.0 1.63 91 52.4 1.33 300 61 70.1 1.78 91 27.4 1.46 350 61 75.7 1.92 91 62.0 1.57 400 61 81 .o 2.06 91 66.3 1.68 450 61 85.9 2.18 91 70.3 1.79 500 61 90.5 2.30 91 74.1 1 .a8 550 91 77.7 1.97 1 27 65.8 1.67 600 91 81.2 2.06 127 68.7 1.74 650 91 84.5 2.15 127 71.5 1 .a2 700 91 87.7 2.23 127 74.2 1 .a8 750 91 90.8 2.31 127 76.8 1.95 800 91 93.8 2.38 127 79.4 2.02 900 91 99.4 2.53 1 27 84.2 2.14 1000 91 104.8 2.66 1 27 88.7 2.25 1100 1 27 93.1 2.36 169 80.7 2.05 1200 127 97.2 2.47 169 84.3 2.14 1250 127 99.2 2.52 169 86.0 2.18 1300 127 101.2 2.57 169 87.7 2.23 1400 127 105.0 2.67 169 91 .o 2.31 1500 127 108.7 2.76 169 94.2 2.39 1600 169 97.3 2.47 217 85.9 2.18 1700 1 69 100.3 2.55 217 88.5 2.25 1750 1 69 101.8 2.59 217 89.8 2.28 1800 169 103.2 2.62 21 7 91.1 2.31 1900 169 106.0 2.69 217 93.6 2.38 2000 169 108.8 2.76 217 96.0 2.44 2250 169 115.4 2.93 217 101.8 2.59 2500 169 121.6 3.09 21 7 107.3 2.73 2750 217 112.6 2.86 271 100.7 2.56 3000 21 7 117.6 2.99 271 105.2 2.67 3250 217 122.4 3.11 271 109.5 2.78 3500 217 127.0 3.23 271 113.6 2.89 3750 271 117.6 2.99 271 117.6 2.99 4000 271 121.5 3.09 271 121.5 3.09

The weights of Class C and Class D conductors are the same as for the equivalent Class i3 conductor (see Table G-2). NOTE:

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DATE: 711 5104 ICEA S-108-720-2004

APPENDIX H ETHYLENE ALKENE COPOLYMER (EAM) (Informative)

The purpose of this discussion is to familiarize the reader with the chemical designation, EAM. Cable manufacturers may desire to supply a filled or unfilled EAM compound where specifications require a thennoset material such as XLPE, TRMPE or EPR.

Ethylene alkene copolymer (EAM) is the ASTM nomenclature (E-Ethyiene, A-Alkene and M-repeating CHZ unit of the saturated polymer backbone) for copolymers consisting of ethylene and an alkene comonomer. The chemical nomenclature 'alkene', which includes ethylene. is defined by the International Union of Pure and Applied Chemistry (IUPAC) in its publication Nomenclature of Organic Chemistry as follows:

"Alkenes are hydrocarbons with a carbon-carbon double bond. Specific alkenes are named as a derivative of the parent alkane, which is the saturated form, ¡.e., no carbon-carbon double or triple bonds. Alkanes are named according to the number of carbon atoms in the chain. The first four members of the alkane series (methane, ethane, propane, and butane) came into common use before any attempt was made to systematize nomenclature. Those with 5 and greater carbon atoms are derived from Greek numbers (Penta, hexa, etc.)."

Continuing technological developments in the manufacture of polymers for wire and cable applications have resulted in the ability to polymerize (chemically join) ethylene with other monomers such as butene, hexene and octene rather than the conventional propylene. Polymers can be manufactured in various ways, as can any copolymer of ethylene and an alkene. These variations include the type of polymerization catalystlco-catalyst, process conditions, molecular weight, ethylene/comonomer ratio, and ethylene (or comonomer) distribution. The resultant polymers may provide improvements while complying with applicable requirements in ICEA standards.

As the industry progresses towards performance based standards, it is appropriate to consider a more general material classification such as EAM, rather than create a series of ethylene based polymeric designations, such as EO (Ethylene Octene), EH (Ethylene Hexene) or EB (Ethylene Butene).

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DATE: 7/15/04 ICEA S-108-720-2004

APPENDIX I SPECIFICATION FOR ALLOY LEAD SHEATHS (Informative)

II PURPOSE

The purpose of this appendix is to provide a definition for a number of alloy lead sheaths that have been used with insulated cables. It is not intended to be a comprehensive listing. Other alloy lead sheaths may be furnished if the composition is mutually agreed upon by the purchaser and the manufacturer.

12 MATERIALS

This appendix defines refined lead in pig form for the 1/2C, E, F-3 and copper bearing arsenical alloy lead sheaths as permitted by Part 6 of this standard.

13 REQUIREMENTS

The lead shall meet all requirements of ASTM 6 29 except the chemical composition in percent by weight shall be in accordance with Table 1-1.

TABLE 1-1 CHEMICAL REQUIREMENTS FOR ALLOY LEAD SHEATHS

Note(s):Alloy 1/2C and Alloy E lead types are considered to be "soff alloys. Alloy F-3 and Copper- Bearing Arsenical lead types are considered to be "hard" alloys.

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