D
S
G
G D S Gate Drain Source
Applications UPS and Inverter applications Half-bridge and full-bridge topologies Resonant mode power supplies DC/DC and AC/DC converters OR-ing and redundant power switches Brushed and BLDC Motor drive applications Battery powered circuits
Benefits Improved Gate, Avalanche and Dynamic dv/dt Ruggedness
Fully Characterized Capacitance and Avalanche SOA
Enhanced body diode dv/dt and di/dt Capability Pb-Free ; RoHS Compliant ; Halogen-Free
Base part number Package Type Standard Pack Form Quantity
IRF200P223 TO-247AC Tube 25 IRF200P223
Orderable Part Number
VDSS 200V
RDS(on) typ. 9.5m max 11.5m
ID 100A
TO-247AC IRF200P223
G
D
S D
Final Datasheet Please read the important Notice and Warnings at the end of this document V1.0 www.infineon.com 2017-02-27
IRF200P223
IR MOSFET - StrongIRFET™
25 50 75 100 125 150 175
TC , Case Temperature (°C)
0
20
40
60
80
100
120
I D, Drai
n Cu
rren
t (A)
Figure 1 Typical On-Resistance vs. Gate Voltage Figure 2 Maximum Drain Current vs. Case Temperature
2 4 6 8 10 12 14 16 18 20
VGS, Gate -to -Source Voltage (V)
5
10
15
20
25
30
35
R DS(o
n),
Drai
n-to
-Sou
rce
On
Resi
stan
ce (m
)
ID = 60A
TJ = 25°C
TJ = 125°C
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
2
Table of Contents
Table of Contents Applications …..………………………………………………………………………...……………..……………1
Benefits …..………………………………………………………………………...……………..…………….1
Ordering Table ….……………………………………………………………………………………………………1
Table of Contents ….………………………………………………………………………………………………...2
1 Parameters ………………………………………………………………………………………………3
2 Maximum ratings, Thermal, and Avalanche characteristics ………………………………………4
3 Electrical characteristics ………………………………………………………………………………5
4 Electrical characteristic diagrams ……………………………………………………………………6
Package Information ………………………………………………………………………………………………14
Qualification Information ……………………………………………………………………………………………15
Revision History …………………………………………………………………………………………..…………16
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
3
1 Parameters
Table1 Key performance parameters
Parameter Values Units
VDS 200 V
RDS(on) max 11.5 m
ID 100 A
Parameters
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
4
Table 2 Maximum ratings (at TJ=25°C, unless otherwise specified) Parameter Symbol Values Unit Continuous Drain Current ID 100
A Continuous Drain Current ID 71 Pulsed Drain Current IDM 400 Maximum Power Dissipation PD 313 W Linear Derating Factor 2.1 W/°C Gate-to-Source Voltage VGS ± 20 V Operating Junction and Storage Temperature Range
TJ TSTG
-55 to + 175 °C Soldering Temperature, for 10 seconds
(1.6mm from case) - 300
Mounting Torque, 6-32 or M3 Screw - 10 lbf·in (1.1 N·m) -
Conditions TC = 25°C, VGS @ 10V
TC = 100°C, VGS @ 10V TC = 25°C TC = 25°C TC = 25°C
-
-
-
-
Notes: Repetitive rating; pulse width limited by max. junction temperature. Limited by TJmax, starting TJ = 25°C, L = 0.24mH, RG = 50, IAS = 60A, VGS =10V. ISD 60A, di/dt 2330A/µs, VDD V(BR)DSS, TJ 175°C. Pulse width 400µs; duty cycle 2%. Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS. Coss eff. (ER) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 to 80% VDSS. R is measured at TJ approximately 90°C. Limited by TJmax, starting TJ = 25°C, L = 1mH, RG = 50, IAS = 33A, VGS =10V.
Table 4 Avalanche characteristics Parameter Symbol Values Unit
Single Pulse Avalanche Energy EAS (Thermally limited) 429 mJ
Single Pulse Avalanche Energy EAS (Thermally limited) 541
Avalanche Current IAR
See Fig 16, 17, 23a, 23b A
Repetitive Avalanche Energy EAR mJ
Table 3 Thermal characteristics Parameter Symbol Conditions Typ. Max. Unit Junction-to-Case RJC TJ approximately 90°C - 0.48
°C/W Case-to-Sink, Flat Greased Surface RCS - 0.24 - Junction-to-Ambient RJA - - 40
Min. - - -
2 Maximum ratings and thermal characteristics
Maximum ratings and thermal characteristics
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
5
D
S
G
Table 6 Dynamic characteristics
Parameter Symbol Conditions Values Unit Min. Typ. Max. Forward Trans conductance gfs VDS = 50V, ID =60A 93 - - S Total Gate Charge Qg - 68 102
nC Gate-to-Source Charge Qgs - 25 - Gate-to-Drain Charge Qgd - 13 - Total Gate Charge Sync. (Qg– Qgd) Qsync - 55 - Turn-On Delay Time td(on) VDD = 130V - 16 -
ns Rise Time tr ID = 60A - 66 - Turn-Off Delay Time td(off) RG = 2.7 - 55 - Fall Time tf VGS = 10V - 62 - Input Capacitance Ciss VGS = 0V - 5094 -
pF
Output Capacitance Coss VDS = 50V - 628 - Reverse Transfer Capacitance Crss ƒ = 1.0MHz, See Fig.7 - 8.7 - Effective Output Capacitance (Energy Related) Coss eff.(ER) VGS = 0V, VDS = 0V to 160V - 537 -
Output Capacitance (Time Related) Coss eff.(TR) VGS = 0V, VDS = 0V to 160V - 783 -
ID = 60A VDS = 100V VGS = 10V
Table 7 Reverse Diode
Parameter Symbol Conditions Values Unit Min. Typ. Max. Continuous Source Current IS
MOSFET symbol - - 100 A (Body Diode) showing the
Pulsed Source Current integral reverse - - 400 (Body Diode) p-n junction diode. Diode Forward Voltage VSD TJ = 25°C, IS = 60A,VGS = 0V - - 1.2 V Peak Diode Recovery dv/dt dv/dt TJ = 175°C, IS = 60A,VDS = 200V - 15 - V/ns
Reverse Recovery Time trr TJ = 25°C - 105 -
ns TJ = 125°C - 150 -
Reverse Recovery Charge Qrr TJ = 25°C - 283 -
nC TJ = 125°C - 580 -
Reverse Recovery Current IRRM TJ = 25°C - 4.1 - A
ISM
VDD = 170V IF = 60A, di/dt = 100A/µs
Table 5 Static characteristics
Parameter Symbol Conditions Values Unit Min. Typ. Max. Drain-to-Source Breakdown Voltage V(BR)DSS VGS = 0V, ID = 1mA 200 - - V Breakdown Voltage Temp. Coefficient V(BR)DSS/TJ Reference to 25°C, ID = 1mA - 0.10 - V/°C Static Drain-to-Source On-Resistance RDS(on) VGS = 10V, ID = 60A - 9.5 11.5 m Gate Threshold Voltage VGS(th) VDS = VGS, ID = 270µA 2.0 - 4.0 V
Drain-to-Source Leakage Current IDSS VDS =160V, VGS =0V - - 1.0
µA VDS =160V,VGS = 0V,TJ =125°C - - 100
Gate-to-Source Forward Leakage IGSS VGS = 20V - - 100 nA Gate Resistance RG - 2.7 -
3 Electrical characteristics
Electrical characteristics
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
6
Electrical characteristic diagrams
4 Electrical characteristic diagrams
Figure 3 Typical Output Characteristics Figure 4 Typical Output Characteristics
Figure 5 Typical Transfer Characteristics Figure 6 Normalized On-Resistance vs. Temperature
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
0.1
1
10
100
1000
I D, Dra
in-t
o-So
urce
Cur
rent
(A)
VGSTOP 15V
10V7.0V6.0V5.5V5.0V4.5V
BOTTOM 4.0V
60µs PULSE WIDTHTj = 25°C
4.0V
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
I D, Dra
in-t
o-So
urce
Cur
rent
(A)
VGSTOP 15V
10V7.0V6.0V5.5V5.0V4.5V
BOTTOM 4.0V
60µs PULSE WIDTHTj = 175°C
4.0V
2 3 4 5 6 7 8
VGS, Gate-to-Source Voltage (V)
0.10
1.0
10
100
1000
I D, Dra
in-t
o-So
urce
Cur
rent
(A)
TJ = 25°CTJ = 175°C
VDS = 50V
60µs PULSE WIDTH
-60 -20 20 60 100 140 180
TJ , Junction Temperature (°C)
0.0
0.5
1.0
1.5
2.0
2.5
3.0
R DS(o
n) , D
rain
-to-
Sour
ce O
n Re
sist
ance
(
Nor
mal
ized
)
ID = 60A
VGS = 10V
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
7
Electrical characteristic diagrams
Figure 7 Typical Capacitance vs. Drain-to-Source Voltage
Figure 8 Typical Gate Charge vs. Gate-to-Source Voltage
Figure 9 Typical Source-Drain Diode Forward Voltage
0.0 0.4 0.8 1.2 1.6 2.0
VSD, Source-to-Drain Voltage (V)
0.1
1
10
100
1000
I SD, R
ever
se D
rain
Cur
rent
(A)
TJ = 25°C
TJ = 175°C
VGS = 0V
0 10 20 30 40 50 60 70 80 90 100
QG, Total Gate Charge (nC)
0
2
4
6
8
10
12
14
V GS, G
ate-
to-S
ourc
e Vo
ltage
(V)
ID= 60A
VDS= 160V
VDS= 100V
VDS= 40V
1 10 100 1000
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
10000
100000
1000000
C, C
apac
itanc
e (p
F)
VGS = 0V, f = 1 MHZCiss = C gs + Cgd, Cds SHORTEDCrss = Cgd Coss = Cds + Cgd
Coss
Crss
Ciss
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
8
Electrical characteristic diagrams
Figure 10 Maximum Safe Operating Area
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
0.01
0.1
1
10
100
1000
I D, Dr
ain-
to-S
ourc
e Cu
rren
t (A)
Tc = 25°CTj = 175°CSingle Pulse
1msec
10msecOPERATION IN THIS AREA LIMITED BY RDS(on)
100µsec
DC
Figure 11 Drain-to-Source Breakdown Voltage Figure 12 Typical Coss Stored Energy
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
TJ , Temperature ( °C )
195
205
215
225
235
V (BR)
DSS, Dr
ain-
to-S
ourc
e Br
eakd
own
Volta
ge (V
)
Id = 1.0mA
0 20 40 60 80 100 120 140 160 180 200 220
VDS, Drain-to-Source Voltage (V)
0
2
4
6
8
10
Ener
gy (µ
J)
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
9
Electrical characteristic diagrams
Figure 13 Typical On-Resistance vs. Drain Current
Figure 14 Threshold Voltage vs. Temperature
0 25 50 75 100 125 150 175 200
ID, Drain Current (A)
8
10
12
14
16
R DS(o
n),
Drai
n-to
-Sou
rce
On
Resi
stan
ce (m
)
VGS = 6.0VVGS = 7.0VVGS = 8.0VVGS = 10V
-75 -50 -25 0 25 50 75 100 125 150 175
TJ , Temperature ( °C )
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
V GS(t
h), Ga
te th
resh
old
Volta
ge (V
)
ID = 270µA
ID = 1.0mAID = 1.0A
Figure 15 Maximum Effective Transient Thermal Impedance, Junction-to-Case
1E-006 1E-005 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
0.0001
0.001
0.01
0.1
1
Ther
mal
Res
pons
e ( Z
thJC
) °C/
W
0.20
0.10
D = 0.50
0.020.01
0.05
SINGLE PULSE( THERMAL RESPONSE )
Notes:1. Duty Factor D = t1/t22. Peak Tj = P dm x Zthjc + Tc
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
10
Electrical characteristic diagrams
Figure 16 Avalanche Current vs. Pulse Width
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
0.1
1
10
100
Aval
anch
e Cu
rren
t (A)
Allowed avalanche Current vs avalanche pulsewidth, tav, assuming Tj = 25°C and Tstart = 150°C.
Allowed avalanche Current vs avalanche pulsewidth, tav, assuming Tj = 150°C and Tstart =25°C (Single Pulse)
Figure 17 Maximum Avalanche Energy vs. Temperature
Notes on Repetitive Avalanche Curves , Figures 16, 17: (For further info, see AN-1005 at www.infineon.com) 1.Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 23a, 23b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. DT = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 15, 16). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see Figures 14) PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC Iav = 2T/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav 25 50 75 100 125 150 175
Starting T J , Junction Temperature (°C)
0
100
200
300
400
500
E AR , A
vala
nche
Ene
rgy
(mJ)
TOP Single Pulse BOTTOM 1.0% Duty CycleID = 60A
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
11
Electrical characteristic diagrams
Figure 18 Typical Recovery Current vs. dif/dt Figure 19 Typical Recovery Current vs. dif/dt
100 200 300 400 500 600 700 800 900 1000
diF /dt (A/µs)
0
10
20
30
40
50
I RRM
(A)
IF = 40A
VR = 170V
TJ = 25°C
TJ = 125°C
100 200 300 400 500 600 700 800 900 1000
diF /dt (A/µs)
0
10
20
30
40
50
I RRM
(A)
IF = 60A
VR = 170V
TJ = 25°C
TJ = 125°C
Figure 20 Typical Stored Charge vs. dif/dt Figure 21 Typical Stored Charge vs. dif/dt
100 200 300 400 500 600 700 800 900 1000
diF /dt (A/µs)
0
500
1000
1500
2000
QRR
(nC)
IF = 40A
VR = 170V
TJ = 25°C
TJ = 125°C
100 200 300 400 500 600 700 800 900 1000
diF /dt (A/µs)
0
500
1000
1500
2000
2500
QRR
(nC)
IF = 60A
VR = 170V
TJ = 25°C
TJ = 125°C
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
12
Electrical characteristic diagrams
Figure 22 Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET™ Power MOSFETs
Figure 23a Unclamped Inductive Test Circuit Figure 23b Unclamped Inductive Waveforms
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
13
Electrical characteristic diagrams
Figure 24a Switching Time Test Circuit
Figure 24b Switching Time Waveforms
Figure 25a Gate Charge Test Circuit Figure 25b Gate Charge Waveform
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
14
TO-247AC Package Outline (Dimensions are shown in millimeters (inches))
TO-247AC package is not recommended for Surface Mount Application.
TO-247AC Part Marking Information
YEAR 1 = 2001
DATE CODE
PART NUMBERINTERNATIONAL
LOGORECTIFIER
ASSEMBLY
56 57
IRFPE30
135H
LINE Hindicates "Lead-Free" WEEK 35LOT CODE
IN THE ASSEMBLY LINE "H"
ASSEMBLED ON WW 35, 2001
Note: "P" in assembly line position
EXAMPLE:WITH ASSEMBLY THIS IS AN IRFPE30
LOT CODE 5657
Package Information
5 Package Information
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
15
† Applicable version of JEDEC standard at the time of product release.
Qualification Information
Qualification Level Industrial (per JEDEC JESD47F) †
Moisture Sensitivity Level TO-247AC N/A RoHS Compliant Yes
Qualification Information
6 Qualification Information
Final Datasheet V1.0 2017-02-27
IR MOSFET-StrongIRFET™
IRF200P223
16
Revision History
Revision History
Major changes since the last revision
Page or Reference Revision Date Description of changes
All pages 1.0 2017-02-27 First release data sheet.
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IMPORTANT NOTICE The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”) . With respect to any examples, hints or any typical values stated herein and/or any information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer’s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with
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Edition 2015-05-06 Published by Infineon Technologies AG 81726 Munich, Germany © 2016 Infineon Technologies AG. All Rights Reserved. Do you have a question about this document? Email: [email protected] Document reference