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Benefits Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness Fully Characterized Capacitance and Avalanche SOA Enhanced body diode dV/dt and dI/dt Capability
www.irf.com 1
D2PakIRFS4410
TO-220AB
IRFB4410
TO-262IRFSL4410
IRFB4410
IRFS4410IRFSL4410
HEXFET
Power MOSFETApplications High Efficiency Synchronous Rectification in SMPS
Uninterruptible Power Supply High Speed Power Switching Hard Switched and High Frequency Circuits
S
D
G
SD
G
S
D
GS
D
G
VDSS 100VRDS(on) typ. 8.0m max. 10m
ID 96A
Absolute Maximum RatingsSymbol Parameter Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V A
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V
IDM Pulsed Drain Current
PD @TC = 25°C Maximum Power Dissipation W
Linear Derating Factor W/°C
VGS Gate-to-Source Voltage V
dv/dt Peak Diode Recovery V/ns
TJ Operating Junction and °C
TSTG Storage Temperature Range
Soldering Temperature, for 10 seconds
(1.6mm from case)
Mounting torque, 6-32 or M3 screw
Avalanche CharacteristicsEAS (Thermally limited) Single Pulse Avalanche Energy mJ
IAR Avalanche Current A
EAR Repetitive Avalanche Energy mJ
Thermal ResistanceSymbol Parameter Typ. Max. Units
RθJC Junction-to-Case ––– 0.61
RθCS Case-to-Sink, Flat Greased Surface , TO-220 0.50 ––– °C/W
RθJA Junction-to-Ambient, TO-220 ––– 62
RθJA Junction-to-Ambient (PCB Mount) , D2Pak
––– 40
220
See Fig. 14, 15, 16a, 16b
250
19
-55 to + 175
± 20
1.6
10lb
in (1.1N
m)
300
Max.
96
68
380
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Calculated continuous current based on maximum allowable junction
temperature. Package limitation current is 75A.
Repetitive rating; pulse width limited by max. junction
temperature.
Limited by TJmax, starting TJ = 25°C, L = 0.14mH
RG = 25Ω, IAS = 58A, VGS =10V. Part not recommended for use
above this value.
ISD ≤ 58A, di/dt ≤ 650A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
S
D
G
Coss eff. (TR) is a fixed capacitance that gives the same charging time
as Coss while VDS is rising from 0 to 80% VDSS.
Coss eff. (ER) is a fixed capacitance that gives the same energy as
Coss while VDS is rising from 0 to 80% VDSS.
When mounted on 1" square PCB (FR-4 or G-10 Material). For recommend footprint and soldering techniques refer to application note #AN-994.
θ
Static @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. UnitsV(BR)DSS Drain-to-Source Breakdown Voltage 100 ––– ––– V
∆
V(BR)DSS / ∆
TJ Breakdown Voltage Temp. Coefficient ––– 0.094 ––– V/°CRDS(on) Static Drain-to-Source On-Resistance ––– 8.0 10 mΩVGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V
IDSS Drain-to-Source Leakage Current ––– ––– 20 µA
––– ––– 250
IGSS Gate-to-Source Forward Leakage ––– ––– 200 nA
Gate-to-Source Reverse Leakage ––– ––– -200
RG Gate Input Resistance ––– 1.5 ––– Ω f = 1MHz, open drain
Dynamic @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Unitsgfs Forward Transconductance 120 ––– ––– S
Qg Total Gate Charge ––– 120 180 nC
Qgs Gate-to-Source Charge ––– 31 –––Qgd Gate-to-Drain ("Miller") Charge ––– 44 –––
td(on) Turn-On Delay Time ––– 24 ––– ns
tr Rise Time ––– 80 –––
td(off) Turn-Off Delay Time ––– 55 –––
tf Fall Time ––– 50 –––
Ciss Input Capacitance ––– 5150 ––– pF
Coss Output Capacitance ––– 360 –––
Crss Reverse Transfer Capacitance ––– 190 –––
Coss eff. (ER) Effective Output Capacitance (Energy Related) ––– 420 –––
Coss eff. (TR) Effective Output Capacitance (Time Related) ––– 500 –––
Diode CharacteristicsSymbol Parameter Min. Typ. Max. Units
IS Continuous Source Current ––– ––– 96 A
(Body Diode)
ISM Pulsed Source Current ––– ––– 380 A
(Body Diode)
VSD Diode Forward Voltage ––– ––– 1.3 V
trr Reverse Recovery Time ––– 38 56 ns TJ = 25°C VR = 85V,
––– 51 77 TJ = 125°C IF = 58A
Qrr Reverse Recovery Charge ––– 61 92 nC TJ = 25°C di/dt = 100A/µs
––– 110 170 TJ = 125°C
IRRM Reverse Recovery Current ––– 2.8 ––– A TJ = 25°C
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
ConditionsVDS = 50V, ID = 58A
ID = 58A
VGS = 20V
VGS = -20V
MOSFET symbol
showing the
VDS = 80V
Conditions
VGS = 10V
VGS = 0V
VDS = 50V
ƒ = 1.0MHz
VGS = 0V, VDS = 0V to 80V , See Fig.11
VGS = 0V, VDS = 0V to 80V , See Fig. 5
TJ = 25°C, IS = 58A, VGS = 0V
integral reverse
p-n junction diode.
ConditionsVGS = 0V, ID = 250µA
Reference to 25°C, ID = 1mA
VGS = 10V, ID = 58A
VDS = VGS, ID = 150µA
VDS = 100V, VGS = 0V
VDS = 100V, VGS = 0V, TJ = 125°C
ID = 58A
RG = 4.1Ω
VGS = 10V
VDD = 65V
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Fig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance vs. Temperature
Fig 2. Typical Output Characteristics
Fig 6. Typical Gate Charge vs. Gate-to-Source VoltageFig 5. Typical Capacitance vs. Drain-to-Source Voltage
0.1 1 10 100 1000
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
I D , D r a i n - t o - S o u r c
e C u r r e n t ( A )
4.5V
≤60µs PULSE WIDTH
Tj = 175°C
VGSTOP 15V
10V8.0V6.0V5.5V5.0V4.8V
BOTTOM 4.5V
2 3 4 5 6 7 8 9 10
VGS, Gate-to-Source Voltage (V)
0.1
1
10
100
1000
I D , D r a i n - t o - S o u r c e C u r r e n t ( Α )
TJ = 25°C
TJ = 175°C
VDS = 25V
≤60µs PULSE WIDTH
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
TJ , Junction Temperature (°C)
0.5
1.0
1.5
2.0
2.5
3.0
R D S ( o n ) , D r a i n - t o - S o u r c e O n R e s i s t a n c e
( N o r m a l i z e d )
ID = 58A
VGS = 10V
1 10 100
VDS, Drain-to-Source Voltage (V)
100
1000
10000
100000
C , C a p a c i t a n
c e ( p F )
VGS = 0V, f = 1 MHZ
Ciss = Cgs + Cgd, C ds SHORTED
Crss = CgdCoss = Cds + Cgd
Coss
Crss
Ciss
0 20 40 60 80 100 120
QG Total Gate Charge (nC)
0.0
2.0
4.0
6.0
8.0
10.0
12.0
V G S , G a t e - t o - S o u r c
e V o l t a g e ( V ) VDS= 80V
VDS= 50V
VDS= 20V
ID= 58A
0.1 1 10 100 1000
VDS, Drain-to-Source Voltage (V)
0.1
1
10
100
1000
I D , D r a i n - t o - S o u r c
e C u r r e n t ( A )
VGSTOP 15V
10V8.0V6.0V5.5V5.0V4.8V
BOTTOM 4.5V
≤60µs PULSE WIDTH
Tj = 25°C
4.5V
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Fig 8. Maximum Safe Operating Area
Fig 10. Drain-to-Source Breakdown Voltage
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 11. Typical COSS Stored Energy
Fig 9. Maximum Drain Current vs. Case Temperature
Fig 12. Maximum Avalanche Energy vs. DrainCurrent
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
VSD, Source-to-Drain Voltage (V)
1
10
100
1000
I S D , R e v e r s e D r a
i n C u r r e n t ( A )
TJ = 25°C
TJ = 175°C
VGS = 0V
25 50 75 100 125 150 175
TC , Case Temperature (°C)
010
20
30
40
50
60
70
80
90
100
I D , D r a i n C u r r e n t ( A )
Limited By Package
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
TJ , Temperature ( °C )
100
105
110
115
120
125
130
V ( B R ) D
S S , D r a i n - t o - S o u r c e B r e a k d o w n V o l t a g e (
V )
0 20 40 60 80 100 120
VDS, Drain-to-Source Voltage (V)
0.0
0.5
1.0
1.5
2.0
E n e r g y (
µ J )
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
0
100
200
300
400
500
600
700
800
900
E A S , S i n g l e P u l s e A v a l
a n c h e E n e r g y ( m J )
ID
TOP 6.7A
9.7A
BOTTOM58A
0 1 10 100 1000
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
I D , D r a i n - t o - S o u r
c e C u r r e n t ( A )
OPERATION IN THIS AREALIMITED BY R DS(on)
Tc = 25°CTj = 175°CSingle Pulse
100µsec
1msec
10msec
DC
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Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 14. Typical Avalanche Current vs.Pulsewidth
Fig 15. Maximum Avalanche Energy vs. Temperature
Notes on Repetitive Avalanche Curves , Figures 14, 15:(For further info, see AN-1005 at www.irf.com)1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a temperature far inexcess of T jmax. This is validated for every part type.
2. Safe operation in Avalanche is allowed as long as neither T jmax nor Iav (max) is exceeded.3. Equation below based on circuit and waveforms shown in Figures 16a, 16b4. PD (ave) = Average power dissipation per single avalanche pulse.5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase
during avalanche).6. Iav = Allowable avalanche current.
7. ∆T = Allowable rise in junction temperature, not to exceed T jmax (assumed as
25°C in Figure 14, 15).tav = Average time in avalanche.D = Duty cycle in avalanche = tav ·f
ZthJC(D, tav) = Transient thermal resistance, see Figures 13)
PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC
Iav = 2 T/ [1.3·BV·Zth]
EAS (AR) = PD (ave)·tav
1E-006 1E-005 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
0.0001
0.001
0.01
0.1
1
T h e r m a l R e s p o n
s e ( Z t h J C
)0.20
0.10
D = 0.50
0.020.01
0.05
SINGLE PULSE( THERMAL RESPONSE )
Notes:1. Duty Factor D = t1/t22. Peak Tj = P dm x Zthjc + Tc
Ri (°C/W) τi (sec)0.2736 0.000376
0.3376 0.004143
τJ
τJ
τ1
τ1
τ2
τ2
R1
R1
R2
R2
τC
Ci= τi/Ri
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (°C)
0
50
100
150
200
250
E A R
, A v a l a n c h e
E n e r g y ( m J )
TOP Single Pulse
BOTTOM 1% Duty Cycle
ID = 58A
1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
0.1
1
10
100
1000
A v a l a n c h e C u r r e n t ( A )
0.05
Duty Cycle = Single Pulse
0.10
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming ∆Τ j = 25°C and
Tstart = 150°C.
0.01
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming ∆Tj = 150°C andTstart =25°C (Single Pulse)
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Fig 16. Threshold Voltage vs. Temperature
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( °C )
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
V G S ( t h ) G a t e t h r e s
h o l d V o l t a g e ( V )
ID = 150µA
ID = 250µA
ID = 1.0mA
ID = 1.0A
100 200 300 400 500 600 700 800 900 1000
dif /dt (A/µs)
0
5
10
15
20
I R R M (
A )
IF = 38A
VR
= 85V
TJ = 25°C _____
TJ = 125°C ----------
100 200 300 400 500 600 700 800 900 1000
dif /dt (A/µs)
0
5
10
15
20
I R R M ( A )
IF
= 19A
VR = 85V
TJ = 25°C _____
TJ = 125°C ----------
100 200 300 400 500 600 700 800 900 1000
dif /dt (A/µs)
0
50
100
150
200
250
300
350
400
Q r r ( n C )
IF = 19A
VR = 85V
TJ = 25°C _____
TJ = 125°C ----------
100 200 300 400 500 600 700 800 900 1000
dif /dt (A/µs)
0
50
100
150
200
250
300
350
400
Q r r ( n C )
IF
= 38A
VR
= 85V
TJ = 25°C _____
TJ = 125°C ----------
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Fig 22a. Switching Time Test Circuit Fig 22b. Switching Time Waveforms
VGS
VDS
90%
10%
td(on) td(off)tr tf
VGS
Pulse Width < 1µsDuty Factor < 0.1%
VDD
VDS
LD
D.U.T
+
-
Fig 21b. Unclamped Inductive WaveformsFig 21a. Unclamped Inductive Test Circuit
tp
V(BR)DSS
IAS
RG
IAS
0.01Ωtp
D.U.T
LVDS
+
-VDD
DRIVER
15V
20VVGS
Fig 23a. Gate Charge Test Circuit Fig 23b. Gate Charge Waveform
Vds
Vgs
Id
Vgs(th)
Qgs1 Qgs2 Qgd Qgodr
Fig 20. for N-Channel
HEXFET Power MOSFETs
1K
VCCDUT
0
L
•
•
•
P.W.Period
di/dt
Diode Recoverydv/dt
Ripple ≤ 5%
Body Diode Forward Drop
Re-AppliedVoltage
Reverse
RecoveryCurrent
Body Diode ForwardCurrent
VGS=10V
VDD
ISD
Driver Gate Drive
D.U.T. ISD Waveform
D.U.T. VDS Waveform
Inductor Curent
D =P.W.
Period
+
-
+
+
+-
-
-
•
•
•
•
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TO-220AB packages are not recommended for Surface Mount Application.
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TO-262 Part Marking Information
TO-262 Package OutlineDimensions are shown in millimeters (inches)
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Data and specifications subject to change without notice This product has been designed and qualified for the Industrial market
Qualification Standards can be found on IR’s Web site
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903Visit us at www.irf.com for sales contact information. 05/07
3
4
4
TRR
FEED DIRECTION
1.85 (.073)1.65 (.065)
1.60 (.063)1.50 (.059)
4.10 (.161)3.90 (.153)
TRL
FEED DIRECTION
10.90 (.429)10.70 (.421)
16.10 (.634)15.90 (.626)
1.75 (.069)1.25 (.049)
11.60 (.457)11.40 (.449)
15.42 (.609)15.22 (.601)
4.72 (.136)4.52 (.178)
24.30 (.957)23.90 (.941)
0.368 (.0145)0.342 (.0135)
1.60 (.063)
1.50 (.059)
13.50 (.532)12.80 (.504)
330.00(14.173) MAX.
27.40 (1.079)23.90 (.941)
60.00 (2.362) MIN.
30.40 (1.197) MAX.
26.40 (1.039)24.40 (.961)
NOTES :1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.3. DIMENSION MEASURED @ HUB.4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
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