Date post: | 06-Apr-2018 |
Category: |
Documents |
Upload: | sanjay-garg |
View: | 214 times |
Download: | 0 times |
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 1/24
The Nanofab Group
EE 4345 – Semiconductor Electronics
Design Project – Spring 2002
Kevin Bradford
Corey Clark
Carlos GarciaGuillaume Gbetibouo
Eric Goebel
Fariba Pouya
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 2/24
Technical Project 1.5
ANALOG BiCMOS
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 3/24
Introduction
What is BiCMOS?
BiCMOS technology combines
Bipolar and CMOS transistors onto a
single integrated circuit where theadvantages of both can be utilized.
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 4/24
Advantages of CMOS over Bipolar
• Power dissipation
• Noise margin
• Packing density
• The ability to integrate large comples
functions with high yields
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 5/24
Advantages of Bipolar over CMOS
• Switching speed
• Currents drive per unit area
• Noise perfomance
• Analog capability
• Input/output speed
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 6/24
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 7/24
Analog BiCMOS Complexity
• Higher performance
analog circuits• Reduced design efforts
• Faster design cycles
• Higher wafer cost
• Longer manufacturingtime
• Lower process yields
Analog BiCMOS processes are characterized by their
complexity, most needing15 masks. Some up to 30 masks.
Advantages of complexity Disadvantages of complexity
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 8/24
Evolution of BiCMOS from CMOS
BiCMOS technologies have tended to evolve from CMOS
processes in order to obtain the highest CMOS
performance possible.
The bipolar processing steps have been added to the core
CMOS flow to realize the desired device characteristics.
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 9/24
Fabrication Equipment
Molecular Beam Epitaxy
(MBE)
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 10/24
Fabrication Equipment
Photoresist Spinner Bake-out Ovens
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 11/24
Fabrication Equipment
Mask Aligner Reactive Ion Etching (RIE)
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 12/24
Fabrication Equipment
Chemical Vapor Deposition
(CVD)
Plasma Quest Sputter
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 13/24
Fabrication Equipment
Plasma Sputter Perkin-Elmer MBE
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 14/24
Fabrication Equipment
Probe Station Scanning Electron
Microscope (SEM)
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 15/24
N-well CMOS Structure
• NMOS device, built in a 15um thick P-epitaxial layer on top of
P+substrate
•PMOS transistor, built in an implanted N-well approximately 5um deep
•P+ substrate is used to reduce latch up susceptibility by providing a lowimpedance patch through a vertical PNP device
•Polysilicon gates are used for both the PMOS and NMOS transistors
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 16/24
Adding NPN Bipolar TransistorThe simplest way to add an NPN bipolar transistor to the previous CMOS
structure is by using PMOS N-well as the collector of the Bipolar device
and introducing an additional mask level for the P-base region.
• the P-base is approx 1 um deep with a doping level of about 1e17 atoms/cm^3
• the N+ source/drain ion implantation step is used for the emitter andcollector contact of the bipolar structure
• the P+ source/drain ion implantation step is used to create a P+ base
contact to minimize the base series resistance
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 17/24
Contacts
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 18/24
Contacts
EFn Ec
Ev EFi
qfs,n
qcs
n-type s/c
qfm
EFm
metal
qfBn qVbi
qf’nDepl reg
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 19/24
Pattern Shift – NBL Shadow (1/2)
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 20/24
Pattern Shift – NBL Shadow (2/2)
Stacking faults
• An extra plane of atoms
•The lack of a plane of atoms
Other Causes
• Temprature
•Pressure
•Wafer pre-leaning
•Growth precursor
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 21/24
P Isolation vs. CDI
Collector Diffused IsolationP Isolation
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 22/24
• Key factor in determining overall circuit performance and
density
• Collector Diffused Isolation (CDI)
– N-well used to form collector of NPN transistor
– Base and emitter consist of successive counterdoping of
the well.
– CDI transistors• Saturate prematurely
• Limits low-voltage operation
• Complicates device modeling
• Causes undesired substrate injection
BiCMOS Isolation Consideration
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 23/24
• System-on-a-Chip Technology
– personal Internet access devices
– set-top boxes
– thin clients
Applications of BiCMOS Technology
8/2/2019 L11a_4345_Sp02
http://slidepdf.com/reader/full/l11a4345sp02 24/24
References
• Carter, Ronald. “Lecture 9 – EE 5342” UTA
• Cheung, Nathan “ Lecture 17 – EE 143” UC Berkeley
• http: //et.nmso.edu/ETCLASSES/vlsi/files/CRYSTAL.HTM
• Hastings, Alan “The Art of Analog Layout”, Prentice Hall, NewJersey, 2001
• Campbell, Stephen A. , “The Science and Engineering of
Microelectronic Fabrication”, Oxford University Press, New York,
2001 • Alvarez, Antonio, “BiCMOS Technology and Applications”, Prentice
Hall, New Jersey, 2001