KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [1]
Lead-free Silver-paste for Fine-line Printing with Ultra-fine Mesh Screen
Masashi Nakayama1, Nobuo Ochiai1, Kenichi Harigae1,Koji Honda2, Shinya Kitada2, Hideaki Hayashi2, Kyotaro Nakamura3, Mari Aoki3, Isao Sumita3, Yoshio Ohshita3
1Kyoto Elex Co., Ltd. 1,Oogawaracho,Kisshoin,Minami-ku,Kyoto 601-8391, Japan2Asada Mesh Co., Ltd. 23-7, Shindo-4, Matsubara, Osaka 580-0015, Japan3Toyota Technological Institute 2-12-1 Hisakata, Tempaku-ku, Nagoya 468-85111, Japan
セル
写真
Outline
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [2]
■Motivation & Challenges
■Results of under 50μm line
■Comparison (Conventional vs Our Challenges)
■Ultra-fine Mesh Screen
■Lead-Free Ag Paste
■ Results of under 40μm line
■ Results of under 30μm line
■ Results of high sheet resistance emitter cells
■Conclusion
Motivation and Challenges
120Ω/□
http://www.itrpv.net/
30 μm
Finger width
Emitter Sheet Resistance
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [3]
3rd International Technology Roadmap for Photovoltaics (ITRPV) Results 2011
Motivation and Challenges
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [4]
①Fine Line (~30μm)
②Shallow Emitter (~120Ω/□)
③Lead-Free
New Lead-Free Ag Paste
Ultra-Hard HS-D Mesh
Step1: Under 50 μmStep2: Under 40 μmStep3: Under 30 μm
Metallization using screen printingon solar cell already reached the limit?
Leading spec in mass-production
Printed finger width
Around 60μmwith Double Printing
Our Challenges
Asada Mesh
Kyoto Elex
Pb
with Double Printing
Main requirementsfor Front side Ag Paste
Key words
Snap-Off Distance Control for Registration
Cross-
SectionWidth Aspect
Ave. Ave. Ave. Max. Min.
µm2 µm µm µm µm
mc-Si 403 47.2 15.1 18.1 12.1 0.32
CZ-Si 383 47.2 14.5 18.2 11.1 0.31
20μm
pattern
40+40µm
90finger
3busbar
HS-D500φ19
em20µmCL
Height ave.
/Width
Line Height
Cell No.Mesh Emulsion
Fired Finger Line (3D Laser Confocal Microscope OLS4000)
40μm aperture ⇒ Printed line width is under 50μm (45~50μm)
40+40μmDoubleon mc-Si
40+40μmDoubleon CZ-Si
Ag Paste: KYOTO ELEX
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [5]
STEP1: Under 50μm Line (40+40μm aperture printing) with 500 mesh
EL image mc-M552-4 mc-M552-5 mc-M552-6
CZ-M552-4 CZ-M552-5 CZ-M552-6
FF=0.802、η=17.58% FF=0.803、η=17.51% FF=0.797、η=17.54%
FF=0.796、η=18.73% FF=0.803、η=18.88% FF=0.803、η=18.85%
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [6]
STEP1: Under 50μm Line (40+40μm aperture printing) with 500 mesh
IV measurement (※ KYOTO ELEX IV Condition)
【Condition】
・Squeegee Speed:200mm/s・Ag Paste:Kyoto Elex (Lead-Free)※1st Print⇒350Pas、2nd Print⇒250Pas・6inch mc-Si Wafer (70Ω/□)・6inch CZ-Si Wafer (80Ω/□)
・Mesh: HS-D500φ19 CL (Asada Mesh)・Emulsion: 20μm ・Pattern: 40+40μm90finger3busbar・IR furnace:PV309(BTU) ⇒ firing Peak Temp:780℃
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [7]
Wafer
Isc
[A]
Jsc
[mA/cm2]
Voc
[V]
FF
η
[%]
Ag Wet
[g/cell]
8.460 34.77 0.631 0.802 17.58 0.093
8.454 34.74 0.628 0.803 17.51 0.090
8.524 35.03 0.628 0.797 17.54 0.095
8.858 37.22 0.633 0.796 18.73 0.107
8.846 37.17 0.632 0.803 18.88 0.095
8.837 37.13 0.633 0.803 18.85 0.094
Ave.
Wafer
Isc
[A]
Jsc
[mA/cm2]
Voc
[V]
FF
η
[%]
Ag Wet
[g/cell]
mc-Si 8.479 34.84 0.629 0.801 17.54 0.093
CZ-Si 8.847 37.17 0.632 0.801 18.82 0.099
mc-Si
CZ-Si
STEP1: Under 50μm Line (40+40μm aperture printing) with 500 mesh
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [8]
Comparison of Conventional Screen Printing with Our ChallengesConventional screen printing on solar cell
Our Challenges
Screen
Paste
Problem
Screen
Paste
Aims
①Screen life of high open area rate (60%) is short. ②Printing resolutions of high open area rate (60%) is bad.③High viscosity paste can’t print with high-mesh(=low open area rate)④So, we can’t print under 50 μm line in mss-production condition.
Higher open area rate (60%) delivers better paste release.
High viscosity paste has high silver content and gives good aspect rate.
①Achievement of minimum cross-section for high FF by double printing②Improvement of printing resolutions and optimization of under 50 μm printing
①3 times strength of standard stainless wires②40% open area rate③Ultra-fine mesh (#500/#650/#900) for target finger line width
Low viscosity and various control for screen of 40% open area rate and ultra-fine mesh to print under 50μm finger line
SEM Image of Mesh ①
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [9]
60%
HS-D500φ19CLHS-360φ16CL MS-400φ19CL
50% 40%Open area rate 40% ⇒①Control paste flow ②Printing Resolutions ③Screen Durability
oursolution
Select Lower Open Area Ratio Mesh for Fine Line Printing
Low open area rate = High mesh count
Twill
100μm 100μm 100μm
SEM Image of Mesh ①
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [10]
#500
HS-D500φ19CL
#650 #900Target mask aperture of finger width ≒ Wire Diameter φ×2
HS-D650φ14CL
Select Thinner Wire and Higher Mesh Count for Fine Line Printing
trial stage
MS-D900φ12CL
40μmaperture
30μmaperture
20μmaperture
100μm 100μm 100μm
WaferRsheet
[Ω/□ ]Busbar Finger
number
Printed FingerWidth[μm]
Printing Mesh
60
70
80
90
100
120
conventional
2Bus
3Bus
4Bus
50
5Bus
0Bus
Back contact
MWT/EWT/IBC
72
80
90
120
150
conventional
80
70
60
conventional
Double
Triple?
Single290φ20CL
HS-D500φ19CL
325φ23
325φ16CL
360φ16CL
HS-D650φ14CL
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [11]
210
conventional
MS-D900φ12CL
50
40
30
Total Optimization of Design and Process for Shallow Emitter
Selection of mesh for target finger width
MaskAperture
[μm]20 25 30 35 40 45 50
PrintedWidth[μm]
30 35 40 45 50 55 60
Mesh MS-D900φ12 HS-D650φ14 HS-D500φ19
Emulsion [μm] 10~15 15~20 20~25
Screen Spec
Other Screen Design
・Finger number・Busbar・Taper Spec
mass-production next generation
Ag Paste
・Fire Through・Viscosity・Thixotropy
Wafer Spec
・Sheet resistance(~120Ω/□)・LDE (Low Doped Emitter)・Texture Size・CZ-Si / mc-Si
Total Optimization
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [12]
Target mask aperture of finger width ≒ Wire Diameter φ×2
Fire through control with lead-free glass frit and special other component
Ag Paste Component
Ag Powder
Glass Frit
Organic Vehicle
Solvent
Additive
Front side Ag
BSF(P+ layer)
Si(N layer)
ARC(SiNx)
Rear side AlStructure of c-Si Solar Cell
Si(P layer)
Fire Through
※BSF layer(Back Surface Field)
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [13]
Lead-Free Ag Paste of KYOTO ELEX
~120Ω/□wafer available
mild and selective attack without shunt
■Mission for paste ②
■Mission for paste ①
Severe rheology control of the paste for ultra high mesh under 50μm printing
Pb
Fired Finger Line Ag Paste: KYOTO ELEX
30+30μmDoubleon mc-Si
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [14]
Dried Line
Cross-
SectionWidth Aspect
Ave. Ave. Ave. Max. Min.
µm2 µm µm µm µm
30+30µm
150finger3busbar
HS-D650φ14
em15µmCLmc-Si 305 36.5 12.2 16.4 8.6 0.33
pattern MeshHeight ave.
/Width
Wafer
Line Height
Paste viscosity in 2nd printing of Double Print
Fired Line
250Pas 200Pas
STEP2: Under 40μm Line (30+30μm aperture printing) with 650 mesh
6inch mc-Si Wafer (Z10)
34.2
34.3
34.4
34.5
34.6
34.7
34.8
34.9
Viscosity of the paste for the 2nd printing
Jsc[m
A/cm
2]
250Pas(Ref) 200Pas 150Pas
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [15]
6inch mc-Si Wafer (Z10)
0.775
0.780
0.785
0.790
0.795
0.800
0.805
Viscosity of the paste for the 2nd printing
FF
250Pas(Ref) 200Pas 150Pas
Lower viscosity of paste for 30μm aperture in 2nd printing 250 ⇒ 200 Pas①line forming improvement②FF improvement
STEP2: Under 40μm Line (30+30μm aperture printing) with 650 mesh
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [16]
New lead-free Ag paste is available for 30μm both SP and DP with 900 mesh screen.
STEP3: Under 30μm Line (20+20μm aperture printing) with 900 mesh
【Printed Condition】
Mesh:MS-D900φ12em10μmCLAg Paste:KYOTO ELEX
Squeegee Speed:200mm/sSubstrate:CZ-Si textured wafer
20μm apertureSingle Print
20+20μm apertureDouble Print
(Lead-Free)
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [17]
Test Result High FF for high sheet resistance emitter
【Printed Condition】
Ag Paste:KYOTO ELEX(Lead-Free Ag Paste)Screen:
HS-D650Φ14em15μmCL(Ultra high mesh)Pattern:30+30μm150finger3busbar(Double Printing)
Emitter sheet resistance60⇒120Ω/□
・Keep high FF(≒0.800)・Increase Jsc
Pb
Conclusion
KYOTO ELEX CO., LTD 4th Metallization Workshop in Constance on 7-8 May,2013 [18]
・We’ve been able to achieve under 50μm line screen printing on solar cell wafer with properly tuned combination of ultra-High meshand new lead-free Ag paste.
・Every target line width from mass-production to next-generation, there are 3 steps which we propose the idea of screen specand they gives good fine line printing.
・In addition to ultra fine line, the new lead-free Ag paste suggests potential to be capable of adapting to over 100Ω/□ high sheet resistance cells (~120Ω/□).
・As of today, we get a part of the solutions toward 30μm line screen printing and 120Ω/□ cell available to get high performance solar cells. The end goal requires “ total optimizationof solar cell process”, not only individual improvement.