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Lecture 1: Introduction
Original Lecture notes © 2010 David Money Harris
Modified by Konstantinos Tatas
1: Introduction 2ACOE419 – Digital IC and VLSI Design
ACOE419 – Digital IC and VLSI Design
ECTS: 5 Conduct hours per week: 3 (2 Lecture – 1 Lab) Evaluation:
– Final Exam: 60%– Laboratory exercises: 20%– Test: 10%– Assignment: 10%
1: Introduction 3ACOE419 – Digital IC and VLSI Design
Course outline and breakdown
Week 1:– Introduction to VLSI Design
Week 2:– Stick diagrams and layout– Lab 1: Basic schematic entry
Week 3:– The ideal MOS transistor– Lab 2: Compound gates
Week 4:– The non-ideal MOS transistor– Lab3: Basic Layout
1: Introduction 4ACOE419 – Digital IC and VLSI Design
Course outline and breakdown
Week 5:– Logical Effort– Lab 4: Advanced Layout
Week 6:– Power Consumption – Lab 5: MOS transistor characteristics
Week 7:– Test– Lab 6: Logical Effort
Week 8:– Simulation– Lab 7: Power Consumption
1: Introduction 5ACOE419 – Digital IC and VLSI Design
Course outline and breakdown
Week 9:– Combinational Circuit Design – Lab 8: Power Consumption
Week 10:– Wires– Lab 9: Combinational Circuit Design
Week 11:– Sequential Circuit Design– Lab 10
Week 12:– Adder Design– Lab 11
1: Introduction 6ACOE419 – Digital IC and VLSI Design
Introduction Integrated circuits: many transistors on one chip. Very Large Scale Integration (VLSI): bucketloads! Complementary Metal Oxide Semiconductor
– Fast, cheap, low power transistors Today: How to build your own simple CMOS chip
– CMOS transistors– Building logic gates from transistors– Transistor layout and fabrication
Rest of the course: How to build a good CMOS chip
1: Introduction 7ACOE419 – Digital IC and VLSI Design
A Brief History 1958: First integrated circuit
– Flip-flop using two transistors– Built by Jack Kilby at Texas
Instruments 2010
– Intel Core i7 processor • 2.3 billion transistors
– 64 Gb Flash memory • > 16 billion transistors
Courtesy Texas Instruments
[Trinh09]
© 2009 IEEE.
1: Introduction 8ACOE419 – Digital IC and VLSI Design
Growth Rate
53% compound annual growth rate over 50 years– No other technology has grown so fast so long
Driven by miniaturization of transistors– Smaller is cheaper, faster, lower in power!– Revolutionary effects on society
[Moore65]
Electronics Magazine
1: Introduction 9ACOE419 – Digital IC and VLSI Design
Annual Sales >1019 transistors manufactured in 2008
– 1 billion for every human on the planet
1: Introduction 10ACOE419 – Digital IC and VLSI Design
Invention of the Transistor Vacuum tubes ruled in first half of 20th century Large,
expensive, power-hungry, unreliable 1947: first point contact transistor
– John Bardeen and Walter Brattain at Bell Labs– See Crystal Fire
by Riordan, Hoddeson
AT&T Archives. Reprinted with
permission.
1: Introduction 11ACOE419 – Digital IC and VLSI Design
Transistor Types Bipolar transistors
– npn or pnp silicon structure– Small current into very thin base layer controls
large currents between emitter and collector– Base currents limit integration density
Metal Oxide Semiconductor Field Effect Transistors– nMOS and pMOS MOSFETS– Voltage applied to insulated gate controls current
between source and drain– Low power allows very high integration
1: Introduction 12ACOE419 – Digital IC and VLSI Design
1970’s processes usually had only nMOS transistors– Inexpensive, but consume power while idle
1980s-present: CMOS processes for low idle power
MOS Integrated Circuits
Intel 1101 256-bit SRAM Intel 4004 4-bit Proc
[Vadasz69]
© 1969 IEEE.
Intel Museum.
Reprinted with permission.
1: Introduction 13ACOE419 – Digital IC and VLSI Design
Moore’s Law: Then 1965: Gordon Moore plotted transistor on each chip
– Fit straight line on semilog scale– Transistor counts have doubled every 26 months
Integration Levels
SSI: 10 gates
MSI: 1000 gates
LSI: 10,000 gates
VLSI: > 10k gates[Moore65]
Electronics Magazine
1: Introduction 14ACOE419 – Digital IC and VLSI Design
And Now…
1: Introduction 15ACOE419 – Digital IC and VLSI Design
Feature Size
Minimum feature size shrinking 30% every 2-3 years
1: Introduction 16ACOE419 – Digital IC and VLSI Design
Corollaries Many other factors grow exponentially
– Ex: clock frequency, processor performance
1: Introduction 17ACOE419 – Digital IC and VLSI Design
Silicon Lattice Transistors are built on a silicon substrate Silicon is a Group IV material Forms crystal lattice with bonds to four neighbors
Si SiSi
Si SiSi
Si SiSi
1: Introduction 18ACOE419 – Digital IC and VLSI Design
Dopants Silicon is a semiconductor Pure silicon has no free carriers and conducts poorly Adding dopants increases the conductivity Group V: extra electron (n-type) Group III: missing electron, called hole (p-type)
As SiSi
Si SiSi
Si SiSi
B SiSi
Si SiSi
Si SiSi
-
+
+
-
1: Introduction 19ACOE419 – Digital IC and VLSI Design
p-n Junctions A junction between p-type and n-type semiconductor
forms a diode. Current flows only in one direction
p-type n-type
anode cathode
1: Introduction 20ACOE419 – Digital IC and VLSI Design
nMOS Transistor Four terminals: gate, source, drain, body Gate – oxide – body stack looks like a capacitor
– Gate and body are conductors
– SiO2 (oxide) is a very good insulator
– Called metal – oxide – semiconductor (MOS) capacitor
– Even though gate is
no longer made of metal
n+
p
GateSource Drain
bulk Si
SiO2
Polysilicon
n+Body
1: Introduction 21ACOE419 – Digital IC and VLSI Design
nMOS Operation Body is usually tied to ground (0 V) When the gate is at a low voltage:
– P-type body is at low voltage– Source-body and drain-body diodes are OFF– No current flows, transistor is OFF
n+
p
GateSource Drain
bulk Si
SiO2
Polysilicon
n+D
0
S
1: Introduction 22ACOE419 – Digital IC and VLSI Design
nMOS Operation Cont. When the gate is at a high voltage:
– Positive charge on gate of MOS capacitor– Negative charge attracted to body– Inverts a channel under gate to n-type– Now current can flow through n-type silicon from
source through channel to drain, transistor is ON
n+
p
GateSource Drain
bulk Si
SiO2
Polysilicon
n+D
1
S
1: Introduction 23ACOE419 – Digital IC and VLSI Design
pMOS Transistor Similar, but doping and voltages reversed
– Body tied to high voltage (VDD)
– Gate low: transistor ON– Gate high: transistor OFF– Bubble indicates inverted behavior
SiO2
n
GateSource Drain
bulk Si
Polysilicon
p+ p+
1: Introduction 24ACOE419 – Digital IC and VLSI Design
Power Supply Voltage GND = 0 V In 1980’s, VDD = 5V
VDD has decreased in modern processes
– High VDD would damage modern tiny transistors
– Lower VDD saves power
VDD = 3.3, 2.5, 1.8, 1.5, 1.2, 1.0, …
1: Introduction 25ACOE419 – Digital IC and VLSI Design
Transistors as Switches We can view MOS transistors as electrically
controlled switches Voltage at gate controls path from source to drain
g
s
d
g = 0
s
d
g = 1
s
d
g
s
d
s
d
s
d
nMOS
pMOS
OFF ON
ON OFF
1: Introduction 26ACOE419 – Digital IC and VLSI Design
0
VDD
A Y
GND
CMOS Inverter
A Y
0 1
1 0
A Y
OFF
ON 1
ON
OFF
1: Introduction 27ACOE419 – Digital IC and VLSI Design
CMOS NAND Gate
A B Y
0 0 1
0 1 1
1 0 1
1 1 0
OFFOFF
ON
ON
1
1
OFFON
OFF
ON
0
1
ON OFF
ON
OFF
1
0
ON ON
OFF
OFF
0
0A
B
Y
1: Introduction 28ACOE419 – Digital IC and VLSI Design
CMOS NOR Gate
A B Y
0 0 1
0 1 0
1 0 0
1 1 0
A
BY
1: Introduction 29ACOE419 – Digital IC and VLSI Design
3-input NAND Gate Y pulls low if ALL inputs are 1 Y pulls high if ANY input is 0
A
B
Y
C
1: Introduction 30ACOE419 – Digital IC and VLSI Design
Example
Sketch a 3-input CMOS NOR gate
1: Introduction 31ACOE419 – Digital IC and VLSI Design
Complementary CMOS Complementary CMOS logic gates
– nMOS pull-down network– pMOS pull-up network– a.k.a. static CMOS
pMOSpull-upnetwork
outputinputs
nMOSpull-downnetwork
Pull-up OFF Pull-up ON
Pull-down OFF Z (float) 1
Pull-down ON 0 X (crowbar)
1: Introduction 32ACOE419 – Digital IC and VLSI Design
Series and Parallel nMOS: 1 = ON pMOS: 0 = ON Series: both must be ON Parallel: either can be ON
(a)
a
b
a
b
g1
g2
0
0
a
b
0
1
a
b
1
0
a
b
1
1
OFF OFF OFF ON
(b)
a
b
a
b
g1
g2
0
0
a
b
0
1
a
b
1
0
a
b
1
1
ON OFF OFF OFF
(c)
a
b
a
b
g1 g2 0 0
OFF ON ON ON
(d) ON ON ON OFF
a
b
0
a
b
1
a
b
11 0 1
a
b
0 0
a
b
0
a
b
1
a
b
11 0 1
a
b
g1 g2
1: Introduction 33ACOE419 – Digital IC and VLSI Design
Conduction Complement Complementary CMOS gates always produce 0 or 1 Ex: NAND gate
– Series nMOS: Y=0 when both inputs are 1– Thus Y=1 when either input is 0– Requires parallel pMOS
Rule of Conduction Complements– Pull-up network is complement of pull-down– Parallel -> series, series -> parallel
A
B
Y
1: Introduction 34ACOE419 – Digital IC and VLSI Design
Compound Gates Compound gates can do any inverting function Ex: (AND-AND-OR-INVERT, AOI22)Y A B C D
A
B
C
D
A
B
C
D
A B C DA B
C D
B
D
YA
CA
C
A
B
C
D
B
D
Y
(a)
(c)
(e)
(b)
(d)
(f)
1: Introduction 35ACOE419 – Digital IC and VLSI Design
Example: O3AI Y A B C D
A B
Y
C
D
DC
B
A
1: Introduction 36ACOE419 – Digital IC and VLSI Design
Example
Sketch a transistor-level schematic for a single-stage CMOS logic gate for each of the following functions:– (ABC+D)΄– ((AB+C)D)΄– (AB+(C(A+B)))΄
1: Introduction 37ACOE419 – Digital IC and VLSI Design
Signal Strength Strength of signal
– How close it approximates ideal voltage source VDD and GND rails are strongest 1 and 0
nMOS pass strong 0– But degraded or weak 1
pMOS pass strong 1– But degraded or weak 0
Thus nMOS are best for pull-down network
1: Introduction 38ACOE419 – Digital IC and VLSI Design
Pass Transistors Transistors can be used as switches
g = 0
s d
g = 1
s d
0 strong 0
Input Output
1 degraded 1
g = 0
s d
g = 1
s d
0 degraded 0
Input Output
strong 1
g = 1
g = 1
g = 0
g = 01
g
s d
g
s d
1: Introduction 39ACOE419 – Digital IC and VLSI Design
Transmission Gates Pass transistors produce degraded outputs Transmission gates pass both 0 and 1 well
g = 0, gb = 1
a b
g = 1, gb = 0
a b
0 strong 0
Input Output
1 strong 1
g
gb
a b
a b
g
gb
a b
g
gb
a b
g
gb
g = 1, gb = 0
g = 1, gb = 0
1: Introduction 40ACOE419 – Digital IC and VLSI Design
Tristates Tristate buffer produces Z when not enabled
EN A Y
0 0 Z
0 1 Z
1 0 0
1 1 1
A Y
EN
A Y
EN
EN
1: Introduction 41ACOE419 – Digital IC and VLSI Design
Nonrestoring Tristate Transmission gate acts as tristate buffer
– Only two transistors– But nonrestoring
• Noise on A is passed on to Y
A Y
EN
EN
1: Introduction 42ACOE419 – Digital IC and VLSI Design
Tristate Inverter Tristate inverter produces restored output
– Violates conduction complement rule– Because we want a Z output
A
YEN
A
Y
EN = 0Y = 'Z'
Y
EN = 1Y = A
A
EN
1: Introduction 43ACOE419 – Digital IC and VLSI Design
Multiplexers 2:1 multiplexer chooses between two inputs
S D1 D0 Y
0 X 0 0
0 X 1 1
1 0 X 0
1 1 X 1
0
1
S
D0
D1Y
1: Introduction 44ACOE419 – Digital IC and VLSI Design
Gate-Level Mux Design How many transistors are needed? 20
1 0 (too many transistors)Y SD SD
44
D1
D0S Y
4
2
2
2 Y2
D1
D0S
1: Introduction 45ACOE419 – Digital IC and VLSI Design
Transmission Gate Mux Nonrestoring mux uses two transmission gates
– Only 4 transistorsS
S
D0
D1
YS
1: Introduction 46ACOE419 – Digital IC and VLSI Design
Inverting Mux Inverting multiplexer
– Use compound AOI22– Or pair of tristate inverters– Essentially the same thing
Noninverting multiplexer adds an inverter
S
D0 D1
Y
S
D0
D1Y
0
1S
Y
D0
D1
S
S
S
S
S
S
1: Introduction 47ACOE419 – Digital IC and VLSI Design
4:1 Multiplexer 4:1 mux chooses one of 4 inputs using two selects
– Two levels of 2:1 muxes– Or four tristates
S0
D0
D1
0
1
0
1
0
1Y
S1
D2
D3
D0
D1
D2
D3
Y
S1S0 S1S0 S1S0 S1S0
1: Introduction 48ACOE419 – Digital IC and VLSI Design
D Latch When CLK = 1, latch is transparent
– D flows through to Q like a buffer When CLK = 0, the latch is opaque
– Q holds its old value independent of D a.k.a. transparent latch or level-sensitive latch
CLK
D Q
Latc
h D
CLK
Q
1: Introduction 49ACOE419 – Digital IC and VLSI Design
D Latch Design Multiplexer chooses D or old Q
1
0
D
CLK
QCLK
CLKCLK
CLK
DQ Q
Q
1: Introduction 50ACOE419 – Digital IC and VLSI Design
D Latch Operation
CLK = 1
D Q
Q
CLK = 0
D Q
Q
D
CLK
Q
1: Introduction 51ACOE419 – Digital IC and VLSI Design
D Flip-flop When CLK rises, D is copied to Q At all other times, Q holds its value a.k.a. positive edge-triggered flip-flop, master-slave
flip-flop
Flo
p
CLK
D Q
D
CLK
Q
1: Introduction 52ACOE419 – Digital IC and VLSI Design
D Flip-flop Design Built from master and slave D latches
QM
CLK
CLKCLK
CLK
Q
CLK
CLK
CLK
CLK
D
Latc
h
Latc
h
D QQM
CLK
CLK
1: Introduction 53ACOE419 – Digital IC and VLSI Design
D Flip-flop Operation
CLK = 1
D
CLK = 0
Q
D
QM
QMQ
D
CLK
Q
1: Introduction 54ACOE419 – Digital IC and VLSI Design
Race Condition Back-to-back flops can malfunction from clock skew
– Second flip-flop fires late– Sees first flip-flop change and captures its result– Called hold-time failure or race condition
CLK1
D Q1
Flo
p
Flo
p
CLK2
Q2
CLK1
CLK2
Q1
Q2
1: Introduction 55ACOE419 – Digital IC and VLSI Design
Nonoverlapping Clocks Nonoverlapping clocks can prevent races
– As long as nonoverlap exceeds clock skew We will use them in this class for safe design
– Industry manages skew more carefully instead 1
11
1
2
22
2
2
1
QMQD
1: Introduction 56ACOE419 – Digital IC and VLSI Design
CMOS Fabrication CMOS transistors are fabricated on silicon wafer Lithography process similar to printing press On each step, different materials are deposited or
etched Easiest to understand by viewing both top and
cross-section of wafer in a simplified manufacturing process
1: Introduction 57ACOE419 – Digital IC and VLSI Design
Inverter Cross-section Typically use p-type substrate for nMOS transistors Requires n-well for body of pMOS transistors
n+
p substrate
p+
n well
A
YGND VDD
n+ p+
SiO2
n+ diffusion
p+ diffusion
polysilicon
metal1
nMOS transistor pMOS transistor
1: Introduction 58ACOE419 – Digital IC and VLSI Design
Well and Substrate Taps Substrate must be tied to GND and n-well to VDD
Metal to lightly-doped semiconductor forms poor connection called Shottky Diode
Use heavily doped well and substrate contacts / taps
n+
p substrate
p+
n well
A
YGND VDD
n+p+
substrate tapwell tap
n+ p+
1: Introduction 59ACOE419 – Digital IC and VLSI Design
Inverter Mask Set Transistors and wires are defined by masks Cross-section taken along dashed line
GND VDD
Y
A
substrate tap well tapnMOS transistor pMOS transistor
1: Introduction 60ACOE419 – Digital IC and VLSI Design
Detailed Mask Views Six masks
– n-well– Polysilicon– n+ diffusion– p+ diffusion– Contact– Metal
Metal
Polysilicon
Contact
n+ Diffusion
p+ Diffusion
n well
1: Introduction 61ACOE419 – Digital IC and VLSI Design
Fabrication Chips are built in huge factories called fabs Contain clean rooms as large as football fields
Courtesy of InternationalBusiness Machines Corporation. Unauthorized use not permitted.
1: Introduction 62ACOE419 – Digital IC and VLSI Design
Fabrication Steps Start with blank wafer Build inverter from the bottom up First step will be to form the n-well
– Cover wafer with protective layer of SiO2 (oxide)
– Remove layer where n-well should be built– Implant or diffuse n dopants into exposed wafer
– Strip off SiO2
p substrate
1: Introduction 63ACOE419 – Digital IC and VLSI Design
Oxidation Grow SiO2 on top of Si wafer
– 900 – 1200 C with H2O or O2 in oxidation furnace
p substrate
SiO2
1: Introduction 64ACOE419 – Digital IC and VLSI Design
Photoresist Spin on photoresist
– Photoresist is a light-sensitive organic polymer– Softens where exposed to light
p substrate
SiO2
Photoresist
1: Introduction 65ACOE419 – Digital IC and VLSI Design
Lithography Expose photoresist through n-well mask Strip off exposed photoresist
p substrate
SiO2
Photoresist
1: Introduction 66ACOE419 – Digital IC and VLSI Design
Etch Etch oxide with hydrofluoric acid (HF)
– Seeps through skin and eats bone; nasty stuff!!! Only attacks oxide where resist has been exposed
p substrate
SiO2
Photoresist
1: Introduction 67ACOE419 – Digital IC and VLSI Design
Strip Photoresist Strip off remaining photoresist
– Use mixture of acids called piranah etch Necessary so resist doesn’t melt in next step
p substrate
SiO2
1: Introduction 68ACOE419 – Digital IC and VLSI Design
n-well n-well is formed with diffusion or ion implantation Diffusion
– Place wafer in furnace with arsenic gas– Heat until As atoms diffuse into exposed Si
Ion Implanatation– Blast wafer with beam of As ions
– Ions blocked by SiO2, only enter exposed Si
n well
SiO2
1: Introduction 69ACOE419 – Digital IC and VLSI Design
Strip Oxide Strip off the remaining oxide using HF Back to bare wafer with n-well Subsequent steps involve similar series of steps
p substraten well
1: Introduction 70ACOE419 – Digital IC and VLSI Design
Polysilicon Deposit very thin layer of gate oxide
– < 20 Å (6-7 atomic layers) Chemical Vapor Deposition (CVD) of silicon layer
– Place wafer in furnace with Silane gas (SiH4)
– Forms many small crystals called polysilicon– Heavily doped to be good conductor
Thin gate oxidePolysilicon
p substraten well
1: Introduction 71ACOE419 – Digital IC and VLSI Design
Polysilicon Patterning Use same lithography process to pattern polysilicon
Polysilicon
p substrate
Thin gate oxidePolysilicon
n well
1: Introduction 72ACOE419 – Digital IC and VLSI Design
Self-Aligned Process Use oxide and masking to expose where n+ dopants
should be diffused or implanted N-diffusion forms nMOS source, drain, and n-well
contact
p substraten well
1: Introduction 73ACOE419 – Digital IC and VLSI Design
N-diffusion Pattern oxide and form n+ regions Self-aligned process where gate blocks diffusion Polysilicon is better than metal for self-aligned gates
because it doesn’t melt during later processing
p substraten well
n+ Diffusion
1: Introduction 74ACOE419 – Digital IC and VLSI Design
N-diffusion cont. Historically dopants were diffused Usually ion implantation today But regions are still called diffusion
n wellp substrate
n+n+ n+
1: Introduction 75ACOE419 – Digital IC and VLSI Design
N-diffusion cont. Strip off oxide to complete patterning step
n wellp substrate
n+n+ n+
1: Introduction 76ACOE419 – Digital IC and VLSI Design
P-Diffusion Similar set of steps form p+ diffusion regions for
pMOS source and drain and substrate contact
p+ Diffusion
p substraten well
n+n+ n+p+p+p+
1: Introduction 77ACOE419 – Digital IC and VLSI Design
Contacts Now we need to wire together the devices Cover chip with thick field oxide Etch oxide where contact cuts are needed
p substrate
Thick field oxide
n well
n+n+ n+p+p+p+
Contact
1: Introduction 78ACOE419 – Digital IC and VLSI Design
Metalization Sputter on aluminum over whole wafer Pattern to remove excess metal, leaving wires
p substrate
Metal
Thick field oxide
n well
n+n+ n+p+p+p+
Metal
1: Introduction 79ACOE419 – Digital IC and VLSI Design
Layout Chips are specified with set of masks Minimum dimensions of masks determine transistor
size (and hence speed, cost, and power) Feature size f = distance between source and drain
– Set by minimum width of polysilicon Feature size improves 30% every 3 years or so Normalize for feature size when describing design
rules Express rules in terms of = f/2
– E.g. = 0.3 m in 0.6 m process
1: Introduction 80ACOE419 – Digital IC and VLSI Design
Simplified Design Rules Conservative rules to get you started
1: Introduction 81ACOE419 – Digital IC and VLSI Design
Inverter Layout Transistor dimensions specified as Width / Length
– Minimum size is 4 / 2sometimes called 1 unit– In f = 0.6 m process, this is 1.2 m wide, 0.6 m
long
1: Introduction 82ACOE419 – Digital IC and VLSI Design
Gate Layout Layout can be very time consuming
– Design gates to fit together nicely– Build a library of standard cells
Standard cell design methodology
– VDD and GND should abut (standard height)
– Adjacent gates should satisfy design rules– nMOS at bottom and pMOS at top– All gates include well and substrate contacts
1: Introduction 83ACOE419 – Digital IC and VLSI Design
Example: Inverter
1: Introduction 84ACOE419 – Digital IC and VLSI Design
Example: NAND3 Horizontal N-diffusion and p-diffusion strips Vertical polysilicon gates Metal1 VDD rail at top
Metal1 GND rail at bottom 32 by 40
1: Introduction 85ACOE419 – Digital IC and VLSI Design
Stick Diagrams Stick diagrams help plan layout quickly
– Need not be to scale– Draw with color pencils or dry-erase markers
c
AVDD
GND
Y
AVDD
GND
B C
Y
INV
metal1
poly
ndiff
pdiff
contact
NAND3
1: Introduction 86ACOE419 – Digital IC and VLSI Design
Wiring Tracks A wiring track is the space required for a wire
– 4 width, 4 spacing from neighbor = 8 pitch Transistors also consume one wiring track
1: Introduction 87ACOE419 – Digital IC and VLSI Design
Well spacing Wells must surround transistors by 6
– Implies 12 between opposite transistor flavors– Leaves room for one wire track
1: Introduction 88ACOE419 – Digital IC and VLSI Design
32
40
Area Estimation Estimate area by counting wiring tracks
– Multiply by 8 to express in
1: Introduction 89ACOE419 – Digital IC and VLSI Design
Example: O3AI Sketch a stick diagram for O3AI and estimate area
– Y A B C D
AVDD
GND
B C
Y
D
6 tracks = 48
5 tracks = 40
1: Introduction 90ACOE419 – Digital IC and VLSI Design
Example
Draw a stick diagram and estimate the area for a 4-input NOR gate
1: Introduction 91ACOE419 – Digital IC and VLSI Design
Example
For a compound gate implementing the boolean function F=((A+B)C)΄:– Sketch a transistor-level schematic – Sketch a stick diagram– Estimate the area from the stick diagram
1: Introduction 92ACOE419 – Digital IC and VLSI Design
Summary MOS transistors are stacks of gate, oxide, silicon Act as electrically controlled switches Build logic gates out of switches Draw masks to specify layout of transistors
Now you know everything necessary to start designing schematics and layout for a simple chip!
1: Introduction 93ACOE419 – Digital IC and VLSI Design
Spice netlist
vdd vdd gnd 5
Vin a gnd pwl 0ps 0 10ns 0 10.5ns 5 50ns 5 50.5ns 0
*** TOP LEVEL CELL: myinv2{lay}
Mnmos@0 y a gnd gnd N L=0.8U W=0.8U AS=3.54P AD=1.72P PS=8.15U PD=5.8U
Mpmos@0 vdd a y vdd P L=0.8U W=1.6U AS=5.2P AD=3.54P PS=9.7U PD=8.15U