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Lecture 6 Eric Small

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    Lecture 6

    Introduction to Bipolar Transistor

    Q point analysis

    DC Operating point analysis and mod

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    Some Resources

    Semiconductor Applets http://jas.eng.buffalo.edu/

    Marc E. Herniter: Schematic Capture with

    Cadence PSpice (2nd Edition)

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    Lecture 5 EE171

    ThenpnBJT.

    NPN Bipolar Junction Trans An npnBJT consists of a thin layer of p-typmaterial between two layers of n-type mateshown in the figure.

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    Lecture 5 EE171

    Annpntransistor with variable biasing sources (common-emitter configurati

    In most cases the base-emitter junction is forward and the base-collector junction is reverse biased (aregion).

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    Lecture 5 EE171

    The emitter is heavily doped compared with the baof the current is due to electrons moving from the e

    Base current consists of holes crossing from the bathe emitter and of holes that recombine with electrthe base.

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    Lecture 5 EE171

    Common-emitter characteristics of a typical npnBJT.

    Common-Emitter Characteri

    Input characteristic is similar to the forward biascharacteristic of a pnjunction.

    In the output characteristics, the collector current isindependent of VCE.

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    Lecture 5 EE171

    Secondary EffectsBase-width Modulation

    Collector BreakdownLeakage Current

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    Lecture 5 EE171

    Base-width Modulation:

    As VCE gets larger, depletion region of collector exfarther into the base. This means less recombinatiobase and hence less base current.

    In case of a constant base current, the emitter curre

    should increase to maintain this constant base curre That is why in reality, collector current would incr

    with increasing VCE (next slide).

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    Lecture 5 EE171

    Early Voltage:

    The straight line extension of collector currcurves all meet at a point on the negativeVThe voltage amplitude at the intersection isthe Early voltage.

    Common-emitter characteristics displaying exaggerated secondary effect

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    Lecture 5 EE171

    Collector Breakdown: There are two main reasons for collect

    breakdown:

    -Avalanche Breakdown-Punch-through

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    Lecture 5 EE171

    Leakage Current The reason for this current is reverse

    leakage current of the collector junctio

    At room temperature, the leakage currextremely small, but, as the temperatuincreases so does the leakage current.

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    Lecture 5 EE171

    Load-line analysis of the amplifier

    Load-line analysis

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    Lecture 5 EE171

    Load-line analysis for Example 4.2.

    Lets study Example 4.2 of the book to understandanalysis.

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    Lecture 5 EE171

    Load-line analysis for Example 4.2.

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    Lecture 5 EE171

    Voltage waveforms for the amplifier of Example 4.2.

    Input-output waveforms

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    Lecture 5 EE171

    Load-line analysis for Example 4.2.

    Lets study Example 4.2 of the book to understandanalysis.

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    Lecture 5 EE171

    Load-line analysis for Example 4.2.

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    Lecture 5 EE171

    Output of the amplifier of Example 4.2 for vin (t) =1.2 sin(2000p t) showing gross d

    Distortion Distortion occurs in BJT amplifiers due to nonlinea

    the input characteristic and non-uniform spacing ofoutput characteristic.

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    Lecture 5 EE171

    Amplification occurs in the active region. Clipping occurs when the instantaneous operatinsaturation or cutoff. In saturation,vCE

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