LHC Electronics irradiation tests in the CNGS side gallerySeptember 2009 partial resultsD.Kramer for the RADWG30/9/09report to LMC Thanks to B.Todd, E.Gousiou, E.Calvo, E.Effinger, R.Denz, K.Roeed, J.Lendaro, D.McFarlane, M.Brugger, EN/MEF, DG/SCR, Fluka team and the RadMon team (T.Wijnands, A.Nyul, C.Pignard)*
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OutlineTest facility overview Planning of slotsCalibration of test positionsUser resultsCRYOBIC/PICBLMBPMQPSHTS CL to be presented next timeWorldFip to be presented next timeTE/EPC no data yetSURVEY no data yet 30/9/09report to LMC *
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Testing area in the TSG4 side gallery of CNGS 30/9/09report to LMC Area available after the displacement of the CNGS electronics to the ventilation chamber
*Radiation fields similar to the ones expected in LHC
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2 Test areas High & Low flux and dose rate with multiple calibrated locations30/9/09report to LMC Hottest test area in TSG46:~ 1.5 Gy(SiO2)/week~ 2.6 1010(1MeV n eq.)cm-2/weekHottest test area in TSG45 :~ 12Gy(SiO2)/week~ 2.8 1011(1MeV n eq.)cm-2/weekThis is expected in the LHC arcs* or UJ56/14/16 in 1 nominal year (10Gy/y, 3e11cm-2)New FLUKA simulations are now available thanks to K.RoeedTE/EPCCRYOBLMBIC/PICWorldFipSurveyQPSRadMonHTS CL heatersTarget chamberTarget chamber**Alongside a dipole
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Calibrated radiation field data for all test locations accessible via dedicated Java GUI30/9/09report to LMC Hottest test area TSG46:~ 1.5 Gy(SiO2)/week~ 2.6 1010(1MeV n eq.)cm-2/weekHottest test area TSG45 :~ 12Gy(SiO2)/week~ 2.8 1011(1MeV n eq.)cm-2/week
*
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Calibrated radiation field data for all test locations accessible via dedicated Java GUI30/9/09report to LMC Hottest test area TSG46:~ 1.5 Gy(SiO2)/week~ 2.6 1010(1MeV n eq.)cm-2/weekHottest test area TSG45 :~ 12Gy(SiO2)/week~ 2.8 1011(1MeV n eq.)cm-2/week
Example for the BLM location 1month timeLike it is the case for FLUKA, Safety Factor of 2 should be used for all the CNGS measurements (high gradients, small detector size) By assuming all the devices to be installed in the worst locations, the estimations are more conservative than 2 times (for SEE related failures)*
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Planning for the user tests30/9/09report to LMC Temporary procedure for handling irradiated electronics was put in place for CNGS. Valid until 30/11/09.Radioactive electronics WORKSHOP has to be used afterwards.Additional measurements:
Activation of water samples TLD (Li6 & Li7) Au & Bi activation foils BLMI sensitivity to thermal neutrons
All users requesting beam time in 2009 received a slot
Only the vacuum group didnt receive the turbo pumps -> no tests possible
*
Slot #End in weekTSG45-1TSG45-2TSG46-3TSG46-4
125WorldFipBLM/BPMCRYOQPS229WorldFipBLM/BPMCRYOQPS333WorldFipBLM/BPMCRYOQPS438WorldFip + TE/EPCBLM/BPMBIC/PIC + CRYOQPS541TE/EPCSurvey + BLMBIC/PICQPS647TE/EPCSurveyBIC/PICQPS
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USER test resultsCRYOBIC/PICBLMBPMQPSHTS CL not enough dataWorldFip not enough dataTE/EPC no data yetSURVEY no data yet 30/9/09report to LMC The presented radiation levels are for nominal LHC beam
Estimations for the 2009/10 operation are added when necessary
*
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Tunnel Electronics CRYOTunnel electronics (~9500 channels in LHC tunnel)have received till now a cumulated dose of:
..and the tests are still ongoing.No Single Event Errors
Output accuracy still within specs(
Protected Areas ElectronicsCumulative Effects Failures CRYOQRL electrical Heater AC supply (~45 channels in protected areas):
Failing component: solid state relay.Planning of moving electronics or shielding of protected areas.
Same results for several channels and reproduced in two different CNGS locations.
Insulated Temperature reading (~2400 channels in protected areas):
Failing component: DC-DC converter.Planning of scheduled replacements.
30/9/09report to LMC *Safety factor 2x to be applied
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Same results for 12 channels and reproduced in two different CNGS locations. Insulated Temperature Conditioners (~2400 channels in protected areas):
Failing component: ISO 150 Digital Isolator.Mitigation technique for LHC (in progress): soft reset automatically forced by the control system; No influence on proper operation of the machine.
Protected Areas ElectronicsSingle Event Upsets CRYO30/9/09report to LMC *
Cross Section (cm2)2e-9
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USER test resultsCRYOBIC/PICQPSBLMBPM30/9/09report to LMC
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CPLDs Used in the Interlock SystemsXC95288 x 300Beam Interlock SystemXC95288XL x 34XC95144 x 36Power Interlock ControllersUA, UJ, RRUA, UJ, RRUA, SR, TZTE/MPE/MI has installed a Radiation Test Bench in CNGSXC95144 x 32XC95288XL x 32(5V)500nm(3.3V)350nm(5V)500nm95288/144 (5V) failure = maintenance required = not machine critical95288XL (3.3V) failure = can compromise safety*N.B. Whole BIS is redundant = *needs two identical failures during a mission95288XL is used in the control VME chassisAlmost = # in LHC30/9/09report to LMC *
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XILINX CPLD test setup in CNGS for BIS and PICDedicated test setup produced only for the radiation tests
One test card (5V) failed after 77Gy
Setup remains in CNGS to verify total dose resistance of the CPLDs
No destructive Latchup observed so far (to be confirmed)
30/9/09report to LMC *
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XC9500XL (3.3V)[ UAs, SR, TZ76 etc ]Failure (SEE induced) cross-sectionper device = 2.8e-10 cm2 In UA87 one expects high energy hadron fluence less than (conservative!)1e8 cm-2/yThe resulting failure rate for 1 device = 0.025 SEEs/yIf all the 36 CPLDs were in UA87 (not considering the shielding installed last week), we would get 0.9 failures/y, out of which 20% produce loss of redundancy (5.5y MTBF)80% lead to a false dump (1.4y MTBF)
We have to keep in mind that this is a low voltage device and might be sensitive to thermal neutrons. In areas like UAs their fluence could be up to 10xhigher than hadrons>20MeV (Fluka analysis to be performed).If this is true, the 0.9 failures/y is a conservative but not exaggerated estimation.
Tests in thermal neutron beam are being considered30/9/09report to LMC *
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XC9500 (5V)
The device has a very low error cross-section!Failure (SEE) cross-section = 3.8e-13 cm2We can assume conservatively1e9cm-2/y for the high energy hadron fluence in the RRs.We get then 3.8e-4 SEEs/y/device which makes 0.14 SEEs/y for the 366 devices, i.e. 7.2y MTBFIn 10% of cases the SEE produces a False dumpIn 90% of cases the SEE produces a Monitoring problemThese figures are of the same order of magnitude as the Electrical Reliability of the devices (according to Xilinx)In both cases above we dont care about the total dose, one should not reach 1Gy/y for the concerned locations (except the locations below)Relocation from UJ56/UJ14/16 is in preparation (cables placed, new location identified)
30/9/09report to LMC *
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USER test resultsCRYOBIC/PICQPSBLMBPM 30/9/09report to LMC
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Quick report on the early QPS measurements WorldFip problemsField-bus coupler type DQAMGS (new QPS layer)Errors produced by SEUs in the WorldFip partUsing latest MicroFipTM and FIELDRIVETM (line driver) versionData are still readable but no longer updated -> *Access required prior to next fillCross section ~ 2.8x10-10cm2Assuming 4x1010cm-2/y (10Gy/y) in the arcs and 450 devices one gets:14 errors*/dayHardware solution was found and being successfully (so far) tested in CNGSAccelerated SW compatible MicroFipTM and FIELDRIVETM development would be much appreciated not only by the QPS team for any future developmentsThis years tests in CGNS confirmed the radiation tolerance of the detection systems of the new QPS layer including the power supplies. Detailed evaluation still to be done.
30/9/09report to LMC *
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USER test resultsCRYOBIC/PICQPSBLMBPM 30/9/09report to LMC *
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BLM- System: Installation overviewArc InstallationIn all the arcs from 12L 33L, 12R 34RExpected Radiation levels: worst case Dose = 1-10 Gy/y (1MeV eq. neutrons = 3*1010-3*1011 cm-2/y)360 * BLECF Card (Analogue data acquisition cards)360 * Hand made power supplies
Straight Section InstallationRR13, RR17, UA23, UA27, UJ33, UA43, UA47, RR53, RR57, UJ63, UJ67, RR73, RR77, UA83, UA87Expected Radiation levels: worst case Dose =
BLM- System: test conclusionsPower supplies 5V: 19 years of nominal LHC operation possible
Power supplies 2.5V: 20 years of nominal LHC operation possible
BLECF (Tunnel acquisition card): more than 20 years LHC operation possible1 SEE induced failure (false dump) observedCross section = 2.2x10-13cm2, this means for 600 cards assuming all in the arcs70 days MTBF (fail safe)
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USER test resultsCRYOBIC/PICQPSBLMBPM30/9/09report to LMC *
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1 uFIP controller cardBPM electronics Tested up to 123 Gy (>10 nominal years)Chassis similar to the one installed in LHC.1 uFIP controller card2 WBTNs1 Intensity card1 Power supplyEva Calvo (BI/QP)2160x in LHCOKOKfailedSEEs330x in LHC330x in LHC330x in LHC
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BPM electronics Tested up to 123 Gy (>10 nominal years)Intensity card failed very soonAim of the intensity cards is to detect obstacles in the machine during its initial operation (low intensity beam)3x1010 cm-2 (1MeV n. eq.) means ~ 0.5 nominal LHC yearsMost probably not an issue for 2009/10Measurement corrupted after the event (SEL?, card to be inspected)uFip controller card sensitive to SEEssending the sensitivity settings of the WBTNs, launch calibrations, or monitoring the power suppliesReturn to the default state after SEE (calib. off, high sens.)SEE Cross section = 4x10-12cm2 thus 2.2days MTBF Worst case: 250um offset for 60s for 1 channel can be compensated by orbit feedback -> not an issue for operation 30/9/09report to LMC *
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Summary (detailed report to be written after the end of tests)CRYO tunnel cards perform very well no concernsSome CRYO non-tunnel cards sensitive to total dose, replacements after 0.5y of nominal beam in UJ14/16/56 not critical for operationSome CRYO non-tunnel cards sensitive to SEUs, software mitigation in progress (6 SEUs/h for nominal beam)BIC VME chassis uses sensitive CPLDs but only a small number and not in the most critical areas (5.5y MTBF) very little concernBIC/PIC installations use low cross-section CPLDs which always fail in a safe way (7.2y MTBF) no concerns*
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Summary (detailed report to be written after the end of tests)No cumulative effect problems expected for the BLM systemMarginal sensitivity of tunnel card to SEE means 70 days MTBF (fail safe, handled by remote reset)Very sensitive latest WorldFip chip could compromise the new QPS layer hardware solution looks very promising (450 cards in LHC)If uncorrected, 14 errors/day in nominal conditions (no issue for safety)BPM cards showed no radiation related problems, intensity cards dont stand high intensity (needed for low intensity), uFip card sensitive to SEEs (2.2days MTBF) but handled by the orbit feedbackCNGS side gallery proved to be a very useful facility !!Measurements are still ONGOING*
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Summary failure rates expected for 2009/10* operation **40 times lower losses assumed in the arcs in 2009/10 compared to nominal ( very CONSERVATIVE )
SYSTEMMTBF (system level)MitigationFail-safeBeam dumpCRYO15 daysSoft resetYesNo, access requiredBIC/PIC>100 yearsNo?No QPS3 daysHW modificationYesNo, access requiredBLM7.7 yearsRemote resetYesYesBPM88 daysSoftware YesNo
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Reserve slides CNGS Fluka simulations30/9/09report to LMC *
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Simulated radiation fields of the selected most critical non-tunnel locations30/9/09report to LMC **Assuming 2 shots per week on TED
LHC AreaBeam conditionsHadrons>20MeV [cm-2/y]1MeV n. eq. fluence [cm-2/y]Dose [Gy(air)/y]UJ5609/104x106 .. 4x1074x1080.01UJ56nominal4x109 .. 4x10104x1010 .. 4x10111..10UJ14/1609/104x106 .. 4x1074x1080.01UJ14/16nominal4x109 .. 4x10104x1010 .. 4x10111..10RR13/17nominal3x107 .. 9x1071.5x108 .. 4.5x1080.01..0.2RR77/7309/101068x1060.001RR77/73nominal1x107 ..1x1085x107 .. 8x1080.01..0.1UJ7609/101075x1070.01UJ76nominal1095x1090.001..1UA872x1015 protons on TED/y*1088x1090.1
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BLM- System: Status CNGSRadMon data for the BLM crate positioned in TSG45. Beam intensity data was scaled with the calibration data from 2009. Result power supplies PS1, PS2, PS3 and BLECF
DeviceDate Hadrons>20MeV [1e11*cm-2]1MeV eq. neutrons [1e11*cm-2]Dose [Gy]ObservationPS 1 (5V)(Haltec-USR515-5A) 5.6.09 18:001.592.269.44Voltage starts to increase7.6.09 7:152.293.2513.56Voltage increased by 20% (1V)7.6.09 7:232.303.2613.59Voltage dropped to 0VPS2 (5V)(Haltec-USR515-5A) 5.6.09 21:261.642.339.76Voltage starts to increase7.6.09 5:532.273.2213.43Voltage increased by 11% (0.55V)7.6.09 8:282.313.2913.70Voltage dropped to 0VPS3 (2.5V)(Haltec-USR515S-2A) 6.6.09 6:301.852.6310.96Voltage starts to increase20.6.09 15:406.008.5235.48Voltage increase of 10% (0.25V)19.9.09 1:1042.0160.88252.8Voltage dropped to 0VBLECF_15.8.09 6:3029.6542.08175.2Card stopped19.8.09 13:4532.0645.52190Card reset -> card works again25.9.09 10:3045.7664.95270.4Card still working
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