'HVLJQDQG$QDO\VLVRID*+]/RZ1RLVH$PSOILHU
byJohn Wetherell
andBurcin Baytekin
EE217 ProjectJune 14th 1999
Table of Contents
Section PageI. Introduction 2II. Emitter Degeneration Sizing 3III. Input Parameters 4IV. Process Parameters 5V. Architecture Selection 6VI. Small Signal Analysis 7VII. Scattering Parameter Analysis 8VIII. Stability Analysis 9IX. Ballast Resistor Sizing 10X. Simultaneous Conjugate Matching Analysis 11XI. Noise Analysis 12XII. Equivalent Input Noise Elements 13XIII. Noise Correlation 14XIV. Optimal Source Impedance to Trade of Noise and Power 15XV. Gain Analysis 16XVI. Distortion Analysis 17XVII. LNA Figures of Merit 18XVIII. Optimization 19XIX. Package Deibedding 20XX. Impedance Matching 21XXI. Simulation Procedure 22XXII. Simulation Results 23XXIII. Comparison of Simulation and Calculation Results 24XXIV. Conclusions 25XXV. References 26
IntroductionLow noise amplifiers are useful for a variety of applications, where small signals are received.
This report is written specifically for the application in a IS-95B cellular telephone handset. The routines developed to design an analyze the amplifier are organized in a way so that the design process is completely automated after entry of the process parameters and high level system specifications. Also the procedure is general purpose that keyu equations can be replaced so the routine is suitable for other configurations and devices, such as GaAs and MOSFETs. After the Mathcad automated design is complete, the results are used as a starting point for simulations on a commercial simulation tool. The graphs of performance parameters as a function of device size and current serve as a guideline for the iterations of simulations. The final simulated results for amplifier are summarized and conclusions are made.
The low noise amplifier designed for this project is part of a larger project. The specifications for the amplifier were developed for use in the handset of a 1900MHz CDMA cellular telephone. The actual specifications involve trade-offs with blocks which occur later in the receiver chain. A collection of more than 16 impedance matching routines were also developed in previous project unrelated to the system analysis. These collection of routines are easily available on the following website: http://www.eecs.berkeley.edu/~wetherel/rftoolbox/matcher.html . The system analysis and the impedance matching network design routines were used as a foundation for the automated low noise amplifier design tool.
An interesting comment on the report for this project is that it is written entirely in Mathcad, a tool for simultaneuous word processing and mathematics computation. This combination of features makes the report a "living" document. With a few clicks the reader can modify the LNA design for his/her specific system and process specifications. In a world where processes change every few years and new specifications are needed just as often the design automation of LNAs is a very useful feature. The use of Mathcad also allowed the rapid entering of design equations from available books on radio frequency circuit design. These equations include those for simultaneous conjugate impedance matching [ ] and distortion analysis of common-emitter amplifiers [ ].
a e s [ ]
Emitter Degeneration Sizing
It is known that inductive emitter degeneration is an effective method of making the optimal source impedance for minimum noise figure (noise match) close to the optimal source impedance for conjugate matching (power gain match). Increasing emitter inductance does this by increasing the input impedance, but with little effect on the noise match. Also on the positive side, inductive emitter degeneration also helps to linearize the device and improve high frequency stability. On the minus side emitter degeneration reduces the gain of the amplifier.
Similarly, for a device with fixed lower limit for emitter degeneration, the device size may be changed match the noise and power source impedances. If the required device size to provide simultaneous match is too large, which is indicated by low gain, more inductance can be added to the emitter to provide the simultaneous match. If the device becomes too small to meet noise requirements, a simultaneous match cannot be acheived. For a given noise figure goal, an upper limit is set on emitter degeneration to acheive a simultaneous power and noise match. This upper limit is very frequently exceeded, as is in the case of this design, so a method has been developed to trade off the noise and power matches to find the optimal source impedance for the transistor.
For all fabricated devices, there is some inherent inductance in the emitter of the transistor from the bonding wire which connects the emitter to the pin and the outside of the chip. The value of this inductance is in the range of 0.4nH to 4nH, with a carefully-designed typical value of around 2.2nH. For the following design a low inductance ball grid array package is assumed with an inductance of 1.5nH.
Project To Do List
Units and Constants
Input Parameters
The following list contains the input parameters used to optimize the amplifier. The optimization routine uses these values of intercept point, noise figure, and current as constraints. Ideally the optimal LNA design would ask the user enter in the backend noise figure and intercept point. The routine would then design the LNA for maximum output C/(N+I) (carrier to noise plus interference ratio). This is equivalent to maximizing SNDR (signal to noise plus distortion ratio) for the system. The derivation of C/(N+I) has not been completed so the input parameters are determined from the following system needs:
∆f: The frequency spacing of the undesired signals from the desired signals. This is used for distortion calculations.
S11: The maximum desired S11 is determined by the external filter connected to the LNA. This external filter relies on the low noise amplifier to have a certain impedance to provide given filtering characteristics.
Gain: The minimum and maxmium desired gain constraints are set by the noise of the system behind the amplifier.
VDD: The supply voltage is set by the end-of life voltage of three Lithium Ion AA batteries plus some loss for a voltage regulator. Normally they are 1.5V each, which corresponds to a normal operating voltage of 4.5V. At end of life they are 1V each, which corresponds to a 3V supply. The voltage regulator output can vary up to 10%, which gives a minimum supply voltage of 2.7V.
Temp: The normal operating temperature of the device is a room temperature of 27C plus some die heating of 15C to due nonideal heat sinking. The actual operating temperature in a worst case environment may vary between -30C and 105C, but was not added to the design routine, because of time constraints.
Zbias: The bias impedance is chosen by the practical size limitation of an on-chip inductor to be used as a bias choke. A 50nH inductor is assumed with a Q of 3 at 1.9 GHz.
K Factor: The desired minimum K factor is somewhat of a guess. In order to simultaneously conjugate match the input and output ports of the device, the K factor must be greater than one. If the K factor is set equal to one the real part of the conjugate matching impedance of the source becomes zero ohms, which is infeasible. For this reason the K factor is set to a value somewhat larger than one. Although the value was chosen with an educated guess, a real practical value for K can be calculated by setting a lower limit to the input impedance or an upper limit to the input matching network, and using it to solve for the K.
NF: The noise figure is determined by the value of the received signal when the cellular phone is operated at it’s farthest distance from the base station. Here the noise level of the receiver must be a significant value below the small desired signal.
IP3: The third order intercept point is a measure of the low noise amplifiers ability to reject unwanted signals, such as another cellular phone. When the cellular phone is being used at it’s greatest distance from base station the phone must be able distinguish the desired signal from another cellular phone.∆f 10 MHz Jammer Frequency Spacingf 1900 MHz ω 2 π. f. s j ω. Frequency of Desired SignalS 11goaldB 15 dB Input Match Requirement
IP 3goaldBm 10 dBm 3rd Order Intercept Point Requirement
G goaldB 13.5 dB G min 12 dB G max 15 dB Available Power Gain Requirement
Z bias 100 Ω j 2. π. f. 50. nH Bias Impedance
K val 1.1 Desired In-band Stability Factor
V DD 2.7 V Supply Voltage
Temp 300 K Operating TemperatureN 40 Number of Devices in ParallelI C 10 mA. Bias Current
The optimizer will find the best value for current and area. The entered values are used for function testing purposes and graphing.
C/(N+I) Optimization Inputs
Process DescriptionThe process used to simulate the amplifier is a 0.5 µm Silicon Germanium BiCMOS process.
The following process parameters are measured for a single bipolar transistor, whose emitter size measures 5µm by 2.5µm. Although this device size is suitable for prescalers and low frequency operations, larger devices are better suited for low noise amplifiers. Increasing the device size has the beneficial effect of reducing the base resistance, and thus the input referred thermal noise of the amplifier. Increasing the device size has the detrimental effect of reducing the gain, increasing the input referred current noise. A more detailed discussion of these effects is given later.Other process parameters
I S 2.2 10 18 A.Reverse Saturation Current ofBase Emitter Diode
C µ0 3.41 fF. V jc 0.386 V m jc 0.11 x jc 0.82872 Collector Emitter Capacitance Parameters
C cs0 6.47 fF. V js 0.34 V m js 0.178 Collector Substrate CapacitanceParameters
V A 71.87 V Forward Early Voltage
β 0 146.15 DC Beta
τ F 2.15 pS. Base Transit Time
r b0 177.66 ohm R e0 11.71 ohm R c0 75.42 ohm Base, Collector, and Emitter Resistances
C je0 10.82 fF. V je 1.48 V m je 0.679 Base Emitter Capacitance Parameters
Scaling Model Parameters with Device Size
The small signal model used for the transistor is a relatively simple model. The resistances and capacitances of the transistor are assumed to scale linearly with the area of the emitter. The resistances are reduced by a factor of N as the device size increases, and the capacitances are increased by N as the device size increase. In reality, for small devices the base resistance stays relatively constant with device size, because of the added resistance and capacitance associated the contacts. In most practical LNA’s large devices are used so linear scaling is a good assumption.Small-signal parameters
Architecture Selection
Amplifier Evolution
The simplest versions of common emitter and common base amplifiers are shown in the following figure. They are essentially the same amplifier with the ground connection placed on the emitter and the base respectively. The distortion output power of these two amplifiers is identical, but the concept of input referred distortion and noise power is invalid, because the source impedance is zero ohms.
Iout
VS
Iout
VS
Fig. 1: Unmatched Undegenerated Common Emitter and Common Base LNA
All real amplifier have some value for source impedance. For high frequency amplifiers, this impedance is typically provided by a low loss matching network to a 50 ohm input. The value of the source impedance seen by the amplifier is usually somewhere between the optimal value for minimum noise and maximum gain. For a typical common emitter amplifier with good performance, the desired source impedance is close to 50 ohms. For a common base amplifier the desired source impedance is much smaller than 50 ohms. The large impedance difference of a common base amplifier from 50ohms requires a high-Q matching network. High Q matching networks usually have narrower bandwidths, more in-band loss, and are more sensitivity to process variations. This will degrade the performance of the common base amplifier. The distortion performance of the matched undegenerated common emitter and common base are similar.
Iout
VS
Iout
VS
ZS
ZS
Fig. 2: Matched Undegenerated Common Emitter and Common Base LNA
Usually the distortion and stability performance of a undegenerated amplifier is very poor, so it is desirable to place local or global feedback around the amplifier to improve it’s performance. For a bipolar amplifer, this is easily done with some inductance in the emitter of the amplifier. This inductance also helps to make the optimal source impedance for minimum noise figure closer to the conjugate match source impedance. For a common-base it is much more difficult to linearize the amplifier, because impedances in the base have little effect on the amplifier distortion. Furthermore, inductances in the base tend to destabilize the amplifier. Incidentally, inductance in the base is an common effective way to build an oscillator, such as the Colplitt’s oscillator. Our goal here is to build an amplifier, not an oscillator, so inductance in the base is undesirable.
undesirable.Common Emitter Amplifier
For the reasons of stability, low distortion, low noise, and input matching described above, an inductively degenerated common emitter configuration was chosen for the input stage of the amplifier design. The circuit is shown in the following figure. A simplified equation for the intercept point is given in the following equation [2].
Le
Iout
VS
ZS
Fig. 3: Matched Degenerated Common Emitter LNA
IP 3ce 10 10 log8 I Cce
4. ω4. L e4.
V T2
1I C τ F
.
V T C je0. Area.
2
.. Intercept Point of a Common-Emitter LNA
Now that the first stage of the amplifier is chosen, we still have the architectural choice of adding a common base configuration (the cascode) to the output of the common emitter (the driver) configuration. This configuration is also known as a cascode configuration. The cascode configuration has the increased gain and reverse isolation advantages of all cascaded amplifiers. Unfortunately it also has the reduced dynamic range disadvantage of cascaded amplifiers from increased distortion and increased noise.
When the cascode configuration is compared against two cascaded common emitter amplifiers, we see the performance is much worse. This is because first the common emitter is not matched to the common base and second because the second common base stage is not degenerated resulting in higher distortion. This disadvantage is reduced at lower frequencies as will be discussed below. If a primary goal of the amplifier was low noise and high gain it is possible to increase the performance of the amplifier with an impedance matching circuit between the common emitter and common base transistors. Unfortunately, this has the undesirable effect of reducing input referred distortion. This distortion increase comes from two different mechanisms. The first mechanism is from the increased swing at the emitter of the cascode transistor, which increases the distortion in the cascode transistor. The second mechanism comes from saturating the collector of first stage amplifier. The second mechanism can be alieviated with a higher bias for the base of the cascode transistor. In general the distortion of the cascode configuration is pretty bad without matching so it is undesirable to match the cascode and driver.
An important advantage of the cascode configuration is it’s simplicity and it’s inherent bias current sharing, which shows up in cost and area comparisons. Ultimately the system requirements will justify one amplifier over another.
Common Base Amplifier
To find the distortion of the cascode configuration we analyze the distortion due to the driver transistor and the cascode transistor separately. To find the distortion of the common base amplifier, we input-refer the distortion through an linear inductively degenerated transconductor. The result of the distortion from this configuration is given in the following equation.
gm*Vπ
Le
Iout
VS
ZS
Vπ
Fig. 4: Common-base LNA (input-referred through ideal transconductor)
IP 3cb 10 10 log4 I Ccb
3. ω. L e2.
C je0 Area cb. V T
.. Intercept Point of Common-Base LNA
Now the distortion due to the common-emitter device can be compared to the distortion from the common base device in a cascode configuration. The following equation is result of taking the difference between the intercept point. From this difference equation we can see the common base is the dominant source of distortion at high frequencies and for large emitter degeneration. For typical values L e=1.5nH, IC=6mA, f=1.9GHz, fT=20GHz, the common emitter is 5.4dB more linear than the input referred common base. Which reduces the overall distortion of the cascode amplifier to 6.5dB below that of the common emitter alone.
Intercept Point Difference betweenCommon Base and Common Emitter
IP 3ce IP 3cb 3 dB 20 log g m ω. L e.. 10 log
ω
ω T
.
Cascode LNA
LeVS
ZS
Iout
Fig. 5: Cascode LNA
Intercept Point of a Cascode LNAIP 3cascode 10 log 10
IP 3ce
10 10
IP 3cb
10. IP 3ce 10 log 1 10
∆IP 3ce_cb
10.
Small Signal Analysis
A small signal analysis of the network is necessary for noise, gain, and impedance matching calculations. Kirkoff’s Current Laws (KCL) were used to set up a general purpose matrix to solve for the necessary gains. The following figure was used perform the small signal analysis.
ZS
rb
ibn Icn RLgm*vπVS
Ze
Zπ
vnRL
ZbiasZL
Cµ
vnRbias
Fig. 6: Small Signal Model of LNA Circuit
KCL at bias node, Vbias V S
Z S
V bias
Z S
V bias
Z bias
V bias V b
r b
V S V bias
Z S
V bias V nbias
Z bias
V bias V b
r b
KCL at base node, VbV bias V b
r bV b V c j. ω. C µ.
V b V e
Z π0
V b V bias
r bV b V c j. ω. C µ.
V b V e
Z πKCL at collector node, Vc
V b V c j. ω. C µ. g m V b V e.
V c V e
r o
V c
R L
V c V L
Z LV c j. ω. C cs
.
V L
Z LV c V b j. ω. C µ. g m V b V e
.V c V e
r o
V c
R L
V c
Z LV c j. ω. C cs
.
KCL at emitter node, VeV b V e
Z πg m V b V e
.V c V e
r o
V e
Z e0
V e
Z e
V e V b
Z πg m V e V b
.V e V c
r oThese KCL equations are now placed into a KCL matrix
V S
Z S
0
V L
Z L
0
1
Z S
1
Z bias
1
r b
1
r b
0
0
1
r b
1
r bj ω. C µ. 1
Z π
j ω. C µ. g m
1
Z πg m
0
j ω. C µ.
j ω. C µ. 1
Z L
1
r o
1
r o
0
1
Z π
g m1
r o
1
Z e
1
Z πg m
1
r o
V bias
V b
V c
V e
.
Note that these equations don’t have RL in them. The necessary RL will be calculated later in the stability section.
KCL N I C, s, Z S, Z L,
1
Z S
1
Z bias
1
r b
1
r b
0
0
1
r b
1
r bj ω. C µ. 1
Z π
j ω. C µ. g m
1
Z πg m
0
j ω. C µ.
j ω. C µ. 1
Z L
1
r o
1
r o
0
1
Z π
g m1
r o
1
Z e
1
Z πg m
1
r o
KCLinv N I C, s, Z S, Z L, KCL N I C, s, Z S, Z L, 1
V bias
V b
V c
V e
KCLinv N I C, s, 50 ohm, 50 ohm,
2
50 ohm
0
ohm
0
ohm
0
ohm
.
V bias
V b
V c
V e
1.537 0.038i
1.498 0.03i
0.129 4.151i
1.467 0.242i
=
Scattering Parameter AnalysisScattering-parameters are the most widely used representation of RF small signal networks.
Their advantages stem from their ease of use for power gain and reflection calculations, and serve as standard output parameters from network analyzers. S parameter values can be calculated for a small signal network using a variety of procedures including calculating other parameters and converting to S parameters, but the following method is chosen for it’s simplicity. The S parameters are referenced to 50 ohms, because it a common value used in test equipment, passive components, such as filters and antennas, and commercially available active components, such as amplifiers and mixers.
2V
1V
S11
S21
Circuit
50 Ω
1 GΩ
50 Ω
2V
1V
S22
S12
Circuit
50 Ω
1 GΩ
50 Ω
Fig. 7: Circuit used for scattering parameter calculations
Sparam N I C, s, V KCLinv N I C, s, 50 ohm, 50 ohm,
2
50 ohm
0
ohm
0
ohm
0
ohm
.
S1 1, V
11
S2 1, V
3
V KCLinv N I C, s, 50 ohm, 50 ohm,
0
ohm
0
ohm
2
50 ohm
0
ohm
.
S2 2, V
31
S1 2, V
1
S
Sparam N I C, s,0.537 0.038i
0.129 4.151i
0.015 0.098i
0.648 0.278i=
0.01 0.1 1 10 1000.01
0.1
1
10
100
| S11 || S21 || S12 || S22 |
Fig. 8: S Parameters vs. Frequency
Stability Analysis
Often it happens a designer designs an amplifier, but he gets an oscillator in return. This scenario typically occurs at frequencies out of the desired band, where the source and load impedances can be unknown. If the out of band source and load impedances are unknown it is desirable to make the amplifier stable for all source and load impedances. This is known as an unconditionaly stable amplifier. If the out-of-band source and load impedances are known it is possible to design a conditionally stable amplifier design. Usually conditionally stable amplifiers can acheive higher performance levels than unconditionally stable amplifiers. This is becuase the amplifier performance must be degraded some with form of ballasting resistor to make it stable.It is desirable to make the stability factor greater than one for another reason other than stability. With a K factor greater than one it is possible to simultaneously conjugate match the input and output impedance of the amplifier. Conjugate matches are desirable, because the filters connected to the amplifier require a conjugate impedance to provide their specified frequency response.
For a K factor of one, the real part of the matching impedances is zero ohms, so it is impossible to match with practical matching networks. For this same reason it is desirable to make the K factor some value significantly larger than one. K S( ) ∆ S
1 1, S2 2,
. S1 2, S
2 1,.
1 ∆( )2
S1 1,
2 S2 2,
2
2 S1 2,
. S2 1,
.
K Sparam N I C, s, 1.016=
The mu factor is often a more desirable parameter to use for stability than K factor. This is because the K factor must be specified with other conditions, such as ∆. In this sense the µ factor is easier to use, because it does not require any other parameters to guarantee unconditional stability. Although the K factor and µ factor curves are different, their values are equal for the transition point between unconditionally stable and conditionally stable regions (K=µ=1).µ S( ) ∆ S
1 1, S2 2,
. S1 2, S
2 1,.
1 S2 2,
2
S1 1, ∆ S
2 2,. S
2 1, S1 2,
.
µ Sparam N I C, s, 1.102=
0.01 0.1 1 10 1000.01
0.1
1
10
K Factormu FactorDesired Stability Factor
Fig. 9: K Stability Factor vs. Frequency
Frequency
K, M
u
0 20 40 60 80 1001
1.05
1.1
1.15
K FactorMu FactorDesired Stability Factor
Fig. 10: K Factor vs. Device Size
Number of Device in Parallel
K, M
u
0 5 10 15 200.4
0.6
0.8
1
K FactorMu FactorDesired Stability Factor
Fig. 11: K Factor vs. Bias Current
Bias Current (mA)
K, M
u
Ballast Resistor SizingThe term ballast is of Swedish origin, where bal means " to bear," and llast means "load."
Thus the term ballast means to bear the load. The load refers to a heavy weight placed at the bottom of ship to stabilize the ship in heavy waves. The term ballast is used here to describe a resistor, which is added to the circuit to provide stability. Most transistors given by a manufacturer are only conditionally stable. For this reason, and the reasons described above a ballast resistor is added to stabilize the transistor
The following procedure is used to find the ballast resistor needed to make the amplifier unconditionally stable, or to provide the desired K factor. First, the procedure involves converting a given set of S parameters to ABCD parameters and multiplying them with the S parameters of a parallel resistor. Then the combination ABCD parameters are converted back into a new set of S parameters, which are used to find the K factor for the device. The value of resistance is swept to find the value need to meet a desired value of K factor.
ABCD Parameters of a Parallel Resistor
ABCD R( )
1
ohm
R
0
1Note: The units are removed, for calculation purposes only
S to ABCD Parameter Calculation
S2ABCD S Z 0,
1 S1 1, 1 S
2 2,. S
1 2, S2 1,
.
2 S2 1,
.
ohm
Z 0
1 S1 1, 1 S
2 2,. S
1 2, S2 1,
.
2 S2 1,
..
Z 0
ohm
1 S1 1, 1 S
2 2,. S
1 2, S2 1,
.
2 S2 1,
..
1 S1 1, 1 S
2 2,. S
1 2, S2 1,
.
2 S2 1,
.
S2ABCD Sparam N I C, s, 50 ohm,0.063 0.013i
1.39 10 4. 1.384i 10 3.
2.099 17.814i
0.013 0.042i=
ABCD to S Parameter CalculationABCD2S ABCD Z 0, A ABCD
1 1,
B ABCD1 2,
C ABCD2 1,
D ABCD2 2,
1
AB ohm.
Z 0C
Z 0
ohm. D
AB ohm.
Z 0C
Z 0
ohm. D
2
2 A D. B C.( ).
AB ohm.
Z 0C
Z 0
ohm. D
.
ABCD2S S2ABCD Sparam N I C, s, 50 ohm, 50 ohm,0.537 0.038i
0.129 4.151i
0.015 0.098i
0.648 0.278i=
KwithR S R,( ) K ABCD2S S2ABCD S 50 ohm,( )
1
ohm
R
0
1. 50 ohm, K Factor with Load Resistor
KwithR Sparam N I C, s, 1000 ohm, 1.082=
µwithR S R,( ) µ ABCD2S S2ABCD S 50 ohm,( )
1
ohm
R
0
1. 50 ohm, µ Factor with Load Resistor
µwithR Sparam N I C, s, 1000 ohm, 1.248=
100 1 .103 1 .1041
1.1
1.2
1.3
K FactorMu FactorDesired K Factor
Fig. 12: K and Mu vs. Ballast Resistor
Ballast Resistance (kohm)
K a
nd M
u Fa
ctor
Rguess 0.1 kΩ
Rneeded N I C, s, Kval, if K Sparam N I C, s, Kval> 100 kΩ, root KwithR Sparam N I C, s, Rguess, Kval Rguess,,
Rneeded2 N I C, s, Kval, if µ Sparam N I C, s, Kval> 100 kΩ, root µwithR Sparam N I C, s, Rguess, Kval Rguess,,
Rneeded2 N I C, s, K val, 100 kΩ=
R L N I C, s, Rneeded N I C, s, K val, R L N I C, s, 773.703 ohm=
It is interesting to plot the ballast resistor needed vs. the device size and current. These curves are shown in the following figures. From these plots we see the stability of the device increases with bias current and decreases with device size. Conversely we see we need a smaller parallel ballast resistor for more potentially unstable devices. Thus a smaller ballast resistor is needed for larger devices and devices with smaller currents.
1 10 100100
1 .103
1 .104
1 .105
1 .106
Ballast Resistor Need to make K=KvalBallast Resistor Need to make mu=Kval
Fig 13: Ballast Resistor vs. Device Size
Number of Devices in Parallel
Bal
last
Res
isto
r Si
ze (
ohm
s)
0 5 10 15 200
500
1000
1500
2000
Resistance Needed w/ 25 DevicesResistance Needed w/ 50 DevicesResistance Needed w/ 75 Devices
Fig. 14: Ballast Resistor vs Current
Bias Current (mA)
Bal
last
Res
isto
r (o
hms)
Simultaneous Conjugate Matching AnalysisIt is desirable from a gain perspective to simultaneously conjugate the input and output of the amplifier. This maximizes gain, but may not be optimal for noise as we shall see later. If the device is unilateral (i.e. the reverse isolation, S12, is zero) the conjugate matching impedances can be calculated directly from S11 and S22. In reality S12 is some non-zero value, so matching the input will change the impedance at the output. Simultaneous matching can be done iteratively, which can be tedious and time consuming. An easier method involves solving a second order equation for the desired values. The derivation of Zpopt is done in [4]. To use the equation the S-Parameters must first be recalculated with the necessary ballast resistor.
KCL N I C, s, Z S, Z L,
1
Z S
1
Z bias
1
r b
1
r b
0
0
1
r b
1
r bj ω. C µ. 1
Z π
j ω. C µ. g m
1
Z πg m
0
j ω. C µ.
j ω. C µ. 1
R L
1
Z L
1
r o
1
r o
0
1
Z π
g m1
r o
1
Z e
1
Z πg m
1
r o
KCLinv N I C, s, Z S, Z L, KCL N I C, s, Z S, Z L, 1
Sparam N I C, s, KCLi KCLinv N I C, s, 50 ohm, 50 ohm,
V KCLi
2
50 ohm
0
ohm
0
ohm
0
ohm
.
S1 1, V
11
S2 1, V
3
V KCLi
0
ohm
0
ohm
2
50 ohm
0
ohm
.
S2 2, V
31
S1 2, V
1
S
Sparam N I C, s,0.548 0.015i
0.256 3.975i
5.547 10 3. 0.095i
0.599 0.115i=
Z popt S Z 0, ∆ S1 1, S
2 2,. S
1 2, S2 1,
.
B 1 1 S1 1,
2 S2 2,
2 ∆( )2
B 2 1 S2 2,
2 S1 1,
2 ∆( )2
C 1 S1 1, ∆ S
2 2,.
C 2 S2 2, ∆ S
1 1,.
Γ Spopt
B 1 B 12 4 C 1
2.
2 C 1.
Γ Spopt if Γ Spopt 1< Γ Spopt,B 1 B 1
2 4 C 12.
2 C 1.
,
Γ LpoptB 2 B 2
2 4 C 22.
2 C 2.
Γ Lpopt if Γ Lpopt 1< Γ Lpopt,B 2 B 2
2 4 C 22.
2 C 2.
,
Z Lpopt Z 0
1 Γ Lpopt
1 Γ Lpopt
.
Z Spopt Z 0
1 Γ Spopt
1 Γ Spopt
.
Z Spopt
Z Lpopt
Z L N I C, s, Z popt Sparam N I C, s, 50 ohm,2
Z L N I C, s, 120.278 52.473i ohm= Optimal Load Impedance
Z Sp N I C, s, Z popt Sparam N I C, s, 50 ohm,1
Z Sp N I C, s, 91.811 18.536i ohm= Optimal Source Impedance
0.1 1 10 10010
100
1 .103
Fig. 14: Max Gain Impedaces vs Frequency
Frequency (GHz)
Impe
danc
e (o
hms)
Noise Analysis
Noise analysis for low noise amplifier design is important not only for the definition of the amplifier, but also for it’s application. The noise requirements are determined by the amplitude of the signal being received and the desired signal to noise ratio. It is also important to allow some of the total system noise budget to other elements in the receiver chain. For cellular phones the desired signal amplitude is calculated when the cellular phone is the farthest distance from the base station.
To do the noise calculation we need to include all of the noise sources for the entire low noise amplifier circuit, including noise from the bias circuitry and ballast resistor. To simplify the bias noise calculations we first need to convert the bias circuit into an equivalent parallel resistance and inductance. The current noise from this parallel resistor is added to the input referred current noise of the amplifier and not in the input referred voltage noise. In reality it will also have a small affect on the voltage noise, but since the bias impedance is usually large it is acceptable to model the noise as a current source.
Conversion from Zbias to Lbias and Rbias
Q bias
Im Z bias
Re Z biasQ bias 5.969= Q of an LS in series with RS
L bias if Q bias 0 j 109. H,1 Q bias
2
Q bias2
Im Z bias
ω., L bias 51.403 nH= Equivalent Parallel Inductance
R bias 1 Q bias2 Re Z bias
. R bias 3.663 103. ohm= Equivalent Parallel Bias Resistance
To simplify the noise analysis we neglect C µ. Cµ is only important for stability and gain analysis. KCL analysis of the simplified circuit with noise sources is used to find the gains of the noise sources.at Base NodeV s V b
r b Z S
V b V e
Z πi bn
V s
r b Z S
V b
r b Z S
V b V e
Z π
at Emitter NodeV b V e
Z πi bn g m V b V e
. i cn
V e
Z e0
V b V e
Z πg m V b V e
.V e
Z eat Collector Node
g m V b V e. i cn
V c
Z L0 0 g m V b V e
.V c
Z L
KCLsimpleinv Z S Z L,
1
r b N( ) Z S
1
Z π N I C, s,
g m I C
1
Z π N I C, s,g m I C
0
1
Z L
0
1
Z π N I C, s,
g m I C
1
Z π N I C, s,g m I C
1
Z e N s,( )
1
KCLsimpleinv Z Sp N I C, s, Z L N I C, s,,
79.793 13.307i
377.04 445.504i
76.496 24.317i
0
120.278 52.473i
0
0.301 3.141i
94.09 50.208i
1.793 3.307i
ohm=
Solve r b i bn
. Z e. β. β V s
. Z e. Z S i bn
. Z e. β. i bn Z π. Z S
. i bn Z π. r b. Z π V s
. Z S i cn. Z e
. V s Z e. r b i cn
. Z e.
Z S r b g m Z π. Z e. Z e Z π
Z L
Z S i bn. Z π. g m
. r b i bn. Z π. g m
. Z π V s. g m
. i bn Z π. Z e. g m
. Z S i cn. r b i cn
. i cn Z e. i cn Z π.
Z S r b g m Z π. Z e. Z e Z π
.
Z ei cn Z π. r b i cn
. i bn Z π. Z S i bn. Z π. g m
. r b i bn. Z π. g m
. Z π V s. g m
. Z S i cn. V s
Z S r b g m Z π. Z e. Z e Z π
.
A v
β N I C, s, para R L N I C, s, Z L N I C, s,,.
r b N( ) β N I C, s, 1 Z e N s,( ). Z π N I C, s,A v 2.845 5.479i= Zero Source Impedance
Voltage Gain
A i β N I C, s, para R L N I C, s, Z L N I C, s,,. A i 1.438 2.475i kΩ= Infinite Source ImpedanceCurrent Gain
Now we can use the gains we just calculated to find the equivalent input voltage and current sources and the correlation between the two. In order to find the equivalent input noise source, we must first know the magnitude of each of the individual noise sources. These are well known values of 4kTrb for the base resistance thermal noise, 2qI B for the base current shot noise, and 2qIC for the collector current shot noise.v bn N( ) 4 k. Temp. r b N( ). v bn N( ) 0.271
nV
Hz
= Base Thermal Noise Voltage
i cn I C 2 q. I C.
i cn I C 56.604pA
Hz
= Collector Shot Noise Current
i bn I C 2 q.I C
β 0
.i bn I C 4.682
pA
Hz
= Base Shot Noise Current
i biasn R bias 4 k. Temp. 1
R bias
. i biasn R bias 2.126pA
Hz
= Bias Resistor Current Noise
i RLn R L 4 k. Temp. 1
R L N I C, s,. i RLn R L 4.626
pA
Hz
= Load Resistor Current Noise
Equivalent Input Noise ElementsThe equivalent input-referred voltage noise source is found by setting the source impedance
to zero, finding the transfer function of all the noise sources to the output, adding the up all the noise powers at the output, and dividing by the voltage gain from the source itself. Similarly, the equivalent input-referred current noise can be found with an input current source and the source impedance set to infinity.
vn
ZL
Noiseless
ineq
ZL
Noiseless
Fig. 15: Circuit used to find input-referred noise voltage Fig. 16: Circuit used to find input-referred noise current
V neq N I C, s, 4 k. Temp. r b N( ). r b N( ) Z e N s,( ) 2 2. q. I B I C.
r b N( ) Z e N s,( ) Z π N I C, s,
β N I C, s,
2
2. q. I C.+
...
4 k. Temp. 1
R L N I C, s,.
r b N( ) β N I C, s, 1 Z e N s,( ). Z π N I C, s,
β N I C, s,
2
.+
...
V neq N I C, s, 0.317nV
Hz
= Equivalent Input NoiseVoltage
I neq N I C, s, 4 k. Temp
R bias
. 2 q. I B I C.
2 q. I C. 4 k. Temp. 1
R L N I C, s,.
β N I C, ω, 2Equivalent Input NoiseCurrent
I neq N I C, s, 5.764pA
Hz
=
The input referred noise can be represented by two noise resistances and the correlation impedance or admittance. Rn is the value of a resistor whose voltage thermal noise is equal to the equivalent input voltage noise. g n is the value of a resistor whose current thermal noise is equal to the equivalent input current noise.
R n N I C, s,V neq N I C, s, 2
4 k. Temp.R n N I C, s, 6.064 Ω= Equivalent Input Noise
Resistance
g n N I C, s,I neq N I C, s, 2
4 k. Temp.1
g n N I C, s,498.381 Ω= Equivalent Input Noise
Conductance
Noise Correlation
Except in special cases, the optimal noise source impedance will be different from the optimal power source impedance. Thus, when using the optimal noise source impedance, the power gain will not be maximized. On the other hand lower power gain will increase the significance of the noise from later stages on the noise figure of the system. Thus a tradeoff exists between the optimal noise source impedance and optimal power source impedance for minimum overall system noise figure. The optimal source impedance for minimum system noise figure can be found by including the noise of the following stages, such as the mixer, in the optimal noise source impedance calculation. In many optimal source impedance calculations, other sources of noise are also neglected. The noise sources to be included in the source impedance calculation are noise from the bias source, bonding pad series resistance, series resistance of inductor degeneration from bond wires and especially from low-Q on-chip spiral inductors. The series resistance of these spirals tend to increase optimal noise source impedance, when they are used for emitter degneration of common emitter and common source amplifiers.
To find the noise gains, a load impedance is assumed, which will in turn affect the gains and the optimal noise source impedance. The optimal load impedance for maximum power transfer is a good guess for the load impedance. It becomes a better guess as the noise of following stages is increased. Once the optimal source impedance is found using a guess for the load impedance, the load impedance for maximum power transfer should be recalculated from the complex conjugate of the output impedance of the device with the optimal system noise source impedance.
Thus the steps for finding optimal system noise source impedance are as follows:
1. Find S parameters of the circuit directly or indirectly by finding the Y parameters of the device directly.2. Find the optimal load and source impedance with the calculated S parameters.3. Find the gains of all noise sources and an input voltage source to the output with a zero source impedance. Include all noise source gains, including the noise of following stages and bias noise.4. Find the gains of all noise sources and an input current source to the output with a infinite source impedance.5. Use the gains to find the input referred equivalent voltage and noise sources and the correlation impedance.6. Use the equivalent voltage and current noise sources to find the equivalent series and parallel noise resistances. 7. Use the correlation impedance and noise resistances to find the optimal source impedance.8. Recalculate desired output impedance given the optimal system noise source impedance.
VI conj N I C, s, r b N( ) Z e N s,( ) 2. q.I C
β 0
. r b N( ) Z e N s,( ) Z π N I C, s,2 q. I C
.
β N I C, s, 2.
r b N( ) β N I C, s, 1 Z e N s,( ). Z π N I C, s,
4 k. Temp. 1
R L N I C, s,.
β N I C, s, 2.+
...
VI conj N I C, s, 0W
Hz=
γ N I C, s,VI conj N I C, s,
V neq N I C, s, 2 I neq N I C, s, 2.γ N I C, s, 0.111 0.088i= Correlation Coefficient
The correlation impedance is derived from the zero and infinite source impedance noise gains and the equivalent input noise sources. The noise correlation impedance is useful for finding the optimal source impedance for low noise. In the special case, where the input equivalent voltage and noise sources are 100% correlated, the correlation impedance is equal to the input impedance. This ideal scenario allows maximum power transfer to occur simultaneously with minimum noise figure. An example when this situation occurs is when the backend noise, such as the mixer noise, is high.
The correlation impedance or admittance between the input equivalent current and voltage noise can now be calculated as shown in the following equations. Note that the correlation is not equal to the inverse of the correlation impedance, except in the special case, where current and voltage noise is 100% correlated.
ZS
vn
in
ZL
Noiseless
ZS
vneq
in2=Ycorr*Vneq
ZL
Noiseless
in1
Fig. 17: Circuit with correlated noise sources Fig. 18: Circuit used to find Ycorr
Y corr N I C, s, γ N I C, s,I neq N I C, s, 2
V neq N I C, s, 2. 1
Y corr N I C, s,304.9 241.319i Ω= Correlation Conductance
ZS
vn1
ineq
ZL
Noiseless
vn2=Zcorr*Ineq
Fig. 19: Circuit used to find Zcorr
Z corr N I C, s, γ N I C, s,V neq N I C, s, 2
I neq N I C, s, 2. Z corr N I C, s, 6.094 4.823i Ω= Correlation Impedance
rn is the noise resistance representing the portion of V neq2 which is uncorrelated with Ineq2. It is always less than Rn, and in the case where the noise is 100% correlated, it is equal to 0.
r n N I C, s, R n N I C, s, 1 γ N I C, s, 2. r n N I C, s, 5.943 Ω= Correlation Resistance
Gn is the noise resistance representing the portion of Ineq2 which is uncorrelated with Vneq2. It is always greater than gn, and in the case where the noise is 100% correlated, it is equal to infinity.G n N I C, s, g n N I C, s, 1 γ N I C, s, 2. 1
G n N I C, s,508.546 Ω= Correlation Conductance
Optimal Noise Figure and Source Impedance
The optimal source resistance is then given by the following equation, using admittance or impedance noise parameters. Both cases should given the same answer.
Z nopt N I C, s,r n N I C, s,
g n N I C, s,Re Z corr N I C, s, 2 j Im Z corr N I C, s,. Optimal Source Impedance
for Minimal Noise FigureZ nopt N I C, s, 54.761 4.823i ohm=
In the special case, where the noise of the following stages dominates, the optimal noise source impedance will equal the optimal power source impedance. In the special case, where the noise of the following stages is zero, the optimal system source impedance will equal the optimal device source impedance. An optimal system noise figure can be derived by cascading an infinite number of identical devices and finding the optimal source impedance. Friis explored this ideal to derive and optimal system source impedance given a single device charateristics. In reality, all of the devices in a receiver chain will not be the same for distortion purposes.
NF min N I C, s, 10 log 1 2 g n N I C, s, Re Z corr N I C, s,.
g n N I C, s, r n N I C, s,. g n N I C, s, Re Z corr N I C, s,. 2+
.....
NF min N I C, s, 0.949 dB= Optimal Noise Figure
Noise figure will also be increased by a jammer a frequency offset from the desired signal foff+fdesired, mixing with bias noise at the same offset at basband, f off. This derivation is breifly described in the Mathcad file: biasnoise.mcd.
Noise Figure Plots
NF N I C, s, Z S, 10 log 1r n N I C, s,
Re Z S
g n N I C, s,
Re Z SZ S Z corr N I C, s, 2..
0 200 400 6000
1
2
3
4
Fig. 20:Noise Figure vs Source Impedance
Source Resistance (ohms)
Noi
se F
igur
e (d
B)
200 100 0 100 2000
1
2
3
4
5
Fig. 21:Noise Figure vs Source Reactance
Source Reactance (ohms)
Noi
se F
igur
e (d
B)
0 5 10 15 200.6
0.8
1
1.2
1.4
Minimum Noise Figure (dB)
Fig. 22: Min. Noise Figure vs. Current
Bias Current (mA)
Min
imum
Noi
se F
igur
e (d
B)
0 20 40 60 80 1000.5
1
1.5
2
2.5
Minimum Noise Figure (dB)
Fig. 23: Noise Figure vs. Device Size
Number of Devices in Parallel
Min
imum
Noi
se F
igur
e (d
B)
0 5 10 15 2050
0
50
100
150
Imaginary Part of Optimal Source ImpedanceReal Part of Optimal Source Impedance
Fig 24: Optimal Noise Impedance vs Ibias
Bias Current (mA)
Impe
danc
e (o
hms)
0 20 40 60 80 10050
0
50
100
150
Imaginary Part of Optimal Source ImpedanceReal Part of Optimal Source Impedance
Fig. 25:Optimal Source Impedance vs Size
Number of Devices in Parallel
Impe
danc
e (o
hms)
Optimal Source Impedance to Trade-Off Power and NoiseThe following method is a crude, but quick and relatively easy method for finding the optimal
source impedance to trade-off power and noise. A more accurate method is discusses below but not implemented.
Optimal Noise Source Impedance:Zn=rn+jxn,NF=NFmin
Optimal Gain Source ImpedanceZp=rp+jxp,G=Gmax,
S11=0
Desired Source ImpedanceZ=r+jx
S11=Desired Specification
Constant S11 contour
Fig. 26: Figure used to illustrade noise and power trade-off
In the design of a low noise amplifier,LNA, or mixer driver stage there exists an optimal source source impedance to provide the maximum power transfer into the transistor and thus the maximum gain. There also exists an optimal source impedance, Znopt, to provide the minimum noise figure for the circuit. At the maximum power source impedance, Zpopt, the input is matched to the source impedance and no reflections occur. This is desirable, because the filters attached to designed for the LNA or mixer, are designed for a matched load impedance, but can tolerate a certain amount of deviation from it’s desired impedance. The amount of acceptable deviation is usually specified by the maximum return loss, or S11, the filter can handle. The routine below finds the source impedance to the LNA or mixer, which will provide the lowest noise figure and maximum gain, while maintaining a desired S11 specification.
The calculation is performed by drawing a straight line between the optimal noise and power source impedances and finding where it intersects the desired S11 contour. This line intersects the contour at two points, so the point must be chosen, which is closet to the optimal noise source impedance. Sometimes, the desired S11 specification is acheived at the optimal noise source impedance. In this case the optimal noise source impedance is chosen over the intersecting point. This calculation is not optimal in the truest sense, because the noise and power gain circles are not coencentric, but it serves as an good estimate to meet design criteria.
Z Ss11 Z p Z n, S 11goaldB, S 11goal 10
S 11goaldB
20
Z in Z p
r i Re Z in
x i Im Z in
r p Re Z p
x p Im Z p
r n Re Z n
x n Im Z n
S 11n 20 logZ in Z n
Z in Z n
.
g1 S 11goal
2
1 S 11goal2
mx p x n
r p r n
a 1 m2
b 2 x i x n m r n.. m. 2 r i
. g.
c r i2 x i x n m r n
. 2
r 11
2 a.( )b b2 4 a. c..
x 1 m r 1 r n. x n
d 1 r 1 r n2 x 1 x n
2
r 21
2 a.( )b b2 4 a. c..
x 2 m r 2 r n. x n
d 2 r 2 r n2 x 2 x n
2
r if d 1 d 2< r 1, r 2,
x if d 1 d 2< x 1, x 2,
Z Sans if S 11n S 11goaldB< Z n, r 1 x.,
Z Sans
Z Sp N I C, s, 91.811 18.536i ohm= Optimal Source Impedance for Conjugate Matching
Z nopt N I C, s, 54.761 4.823i ohm= Optimal Source Impedance for Minimum Noise Figure
Z S N I C, s, Z Ss11 Z Sp N I C, s, Z nopt N I C, s,, S 11goaldB, Z S N I C, s, 67.707 3.339i ohm=
Optimal Source Impedance to trade-off Noise and Power
Power
Gain Analysis
Z2Γ Z( )Z 50 ohm
Z 50 ohmImpedance to Reflection Coefficient Conversion
G T Γ G Γ L, S,1 Γ L
2S
2 1,2. 1 Γ G
2.
1 S2 2, Γ L
. 1 S1 1, Γ G
.. S1 2, S
2 1,. Γ L
. Γ G. 2
Transducer Gain
Available Power Gain
G avail N I C, s, 10 log G T Z2Γ Z S N I C, s, Z2Γ Z L N I C, s,, Sparam N I C, s,,. G avail N I C, s, 14.166 dB=
0 5 10 15 2012
13
14
15
Available Power Gain (dB)
Fig. 27: Power Gain vs. Bias Current
Bias Current (mA)
Ava
ilab
le P
ower
Gai
n (d
B)
0 20 40 60 80 10010
15
20
25
Available Power Gain (dB)
Fig. 28: Power Gain vs. Device Size
Number of Devices in Parallel
Ava
ilab
le P
ower
Gai
n (d
B)
Distortion Analysis
The distortion analysis routines were copied directly from the thesis of Keng Fong [2]. They are the most inaccurate portion of the design routine as they do not reflect the impact of the input matching network on distortion performance. From comparisions to simulations we see the results differ by 3-9dB. Future work will add the effects of the input matching network and bias circuitry.
Low distortion in a low noise amplifier is important to prevent undesired signals from interfering with the desired signal. The most important measure of distortion performance is the third order intercept point. The scenario where third order distortion is important is when the receiving device is located a distance far from the transmitting device, and two devices are transmitting signals close to the device, spacing at frequencies ∆f and 2*∆f from the desired signal. Through third order distortion, the undesired signals, jammers, mix together to produce a signal in the desired band. To prevent this signal from degradation the performance of the receiver the low noise amplifier must be acceptably linear.
A measure of the third order intercept point is used define at acceptable level of linearity. The third order intercept point is defined the as the jammer power required to make the amplitude of the jammer equal to the power of the undesired signal produced through third order intermodulation. This is shown graphically in the following figure.
Pjammer Pjammer
PIM3
Pdesired
PIM3
f
Am
plitu
de IM3
Fig. 29: Nonlinear LNA Output Spectrum with Undesired Signals
Pjammer
PIM3
Am
plitu
de (
dBm
)
IM3
PjammerIP3
Fig. 30: Intermodulation as a function of Undesired Signal Power
This routine finds the two-tone third-order intermodulation intercept point, IP 3, given device size, current, and base and emitter impedances. The collector base capacitance is neglected for simplicity.
f 1 f ∆f ω 1 2 π. f 1. s 1 j ω 1
. Frequency of First Jammer
f 2 f 2 ∆f. ω 2 2 π. f 2. s 2 j ω 2
. Frequency of Second Jammer
ω 3 2 π. f 1. s 3 j ω 1
. Third Frequency for Distortion Analysis
Z b N Z S, s, r b N( ) Z S Z b N 50 ohm, s,( ) 54.441 ohm= Base Impedance for Distortion CalculationsZ N Z S, s, Z b N Z S, s, Z e N s,( )
A 1 N I C, Z S, s,g m I C
s C je N I C,. Z N Z S, s,. s τ F. g m I C
. Z N Z S, s,. g m I CZ N Z S, s,
β 0
. 1 g m I C Z e N s,( ).
A 1 N I C, 50 ohm, s, 6.412 48.737imA
V= Linear Term
A 2 N I C, Z S, s 1, s 2, A 1 N I C, Z S, s 1 s 2, A 1 N I C, Z S, s 1,. A 1 N I C, Z S, s 2,.V T
2 I C2.
. 1 s 1 s 2 C je N I C,. Z..
A 2 N I C, 50 ohm, s 1, s 2, 91.636 2.859imA
V2= Second Order Distortion Term
A1A2 N I C, Z S, s 1, s 2, s 3,
A 1 N I C, Z S, s 1, A 2 N I C, Z S, s 2, s 3,.
A 1 N I C, Z S, s 2, A 2 N I C, Z S, s 1, s 3,.+...
A 1 N I C, Z S, s 3, A 2 N I C, Z S, s 1, s 2,.+...
3
A1A2 N I C, 50 ohm, s 1, s 2, s 3, 412.597 3.031i 103. mA2
V3= Second Order Interaction Term
A 3 N I C, Z S, s 1, s 2, s 3, A 1 N I C, Z S, s 1 s 2 s 3,V T
3 I C3.
. A 1 N I C, Z S, s 1, A 1 N I C, Z S, s 2,. A 1 N I C, Z S, s 3,.
3 I C. A1A2 N I C, Z S, s 1, s 2, s 3,.+
.
A 3 N I C, 50 ohm, s 1, s 2, s 3, 8.458 5.157imA
V3= Third Order Distortion Term
Z in N I C, s, r b N( ) Z π N I C, s, 1 g m I C Z π N I C, s,. Z e N s,( ). Input Impedance
Z in N I C, s, 463.053 21.963i ohm=
IP 3 N I C, Z S, f, ∆f, s j 2. π. f.
∆s j 2. π. ∆f.
10 log1
1 mW
4
3.
A 1 N I C, Z S, s,
A 3 N I C, Z S, s, s, s ∆s( ),. 1
8. 1
50 ohm..
IP 3 N I C, Z S N I C, s,, f, ∆f, 12.046 dB= Third Order Intercept Point
0 5 10 15 2010
0
10
20
3rd Order Intercept Point (dBm)
Fig. 31: IP3 vs. Bias Current
Bias Current (mA)
Inte
rcep
t Poi
nt (
dBm
)
0 20 40 60 80 1008
10
12
14
16
Third Order Intercept Point (dBm)
Fig. 32: IP3 vs. Device Size
Number of Devices in Parallel
3rd
Ord
er I
nter
cept
Poi
nt (
dBm
)
It is interesting to understand the shape of the 3 rd order intercept point curve as a function of device size. For small device sizes, as the device size is increased the distortion performance gets worse, but for very large devices the distortion performance gets better as the device size increases. This fact is not explained with the simplified equations for the distortion given above. The simplified equations for distortion given above neglect the resistance of the emitter as a function of device size. The shape can be described better by separating the interept point into it’s two components: The linear term, A1, and the nonlinear term, A3. As we plot A1 and A3 as a function of device size, we notice A3 is a much stronger function of area than A1, but they both have a similar shape. The intercept point reaches it’s minimum about the same time A 1 reaches it’s maximum.
maximum. So why does A1 increase intially for small devices and decrease for large devices? For small
devices the device is operating well below the maximum frequency, f T, for the device. In this region capacitive effects are less significant and resistive effects are more significant. Here A 1 is approximately gm/(1+gm*re0/N). As the device size gets larger the effective degeneration is reduced, which increases the linear gain, A 1. However for large devices, the base emitter capacitance increases to the point, approaching f T, where the capacitive effects become significant, the effective device f T is reduced with increasing device size, and we see losses in the high frequency gain. The resistive and capacitive effects tend to cancel at some point, and which gain only varies slowly as a function of device size.
Now we must answer the more important question: Why does A3 decrease for large devices? If we look carefully at the equations for the intercept point, we notice A 3 is a strong function of A13. If this is true A3 will have a similar shape to A1, except exaggerated more. This is exactly what we see if we plot A1 and A3 independently as a function of frequency.
0 20 40 60 80 1000
0.01
0.02
0.03
0.04
0.05
Linear TermThird Order Term
Fig. 33: A1 and A3 vs. Device Size
Device Size
Lin
ear
and
Thi
rd-O
rder
Ter
ms
Overall LNA Figure of Merit
The input referred minimum detectable signal with an amplifier is defined below for a signal of a given bandwidth and noise figure. The noise figure is given in dB and MDS in dBm.
MDS BW NF,( ) k T. BW. 3 NF
The spurious free dynamic range, DR f, is defined as the ratio between vmax and vmin, where vmax the input signal where the IM3 just breaks the noise floor defined by vmin. IP3 is specified in dBm, G in dB, and MDS in dBm.
DR f IP 3 G, MDS, 2
3IP 3 G MDS.
The dynamic range is defined similarly with the 1dB compression point defined as vmax.
DR P 1dB G, MDS, P 1dB G MDS
Optimizing Area and CurrentI C 0.006 Unitless Guesses at optimal bias current
and device sizeN 50
NF N I C, NF min N I C A., s,
GivenI C 0> Bias Current Constraint
N 0> Device Size Constraints
G avail N I C A., s, G goaldB> Available Power Gain Constraint
IP 3 N I C A., Z nopt N I C A., s,, f, ∆f, IP 3goaldBm> Intercept Point Constraints
P Minimize NF N, I C, P46.572
7.277 10 3.=
N opt P1
N opt 46.572= Optimal Device Size
I Copt P2
A. I Copt 7.277 mA= Optimal Bias Current Size
NF min N opt I Copt, s, 0.84 dB= Optimal Minimum Noise Figure
IP 3 N opt I Copt, Z nopt N opt I Copt, s,, f, ∆f, 10 dBm= Optimal Intercept Point
Z S N opt I Copt, s, 62.211 5.063i ohm= Optimal Source Impedance
Z L N opt I Copt, s, 110.436 61.585i ohm= Optimal Load Impedance
G avail N opt I Copt, s, 13.5 dB= Optimal Gain
Package (Bonding Wire/ Bonding Pad) DeimbeddingThe actual impedance matching network is outside of the chip, but calculations for the desired
source and load impedances were calculated for the device inside the chip. These internal source and load impedances must be transformed into the source and load impedances seen by the matching networks. To find these conversion equations we first write the equation for impedance seen by the device, ZS, given an impedance seen by the outside of the chip, Z Schip. Then we use this equation to solve for Z Schip in terms of ZS.
Source Impedance Bonding Pad/Wire Deimbedding
Lbond
Cpad
ZS
AMP
ZSchip
Fig. 34: Circuit Used to Solve for Source Impedance Bonding Deimbedding
First we write the equation for the impedance seen by transistor. Then use this equation to solve for the desired impedance seen by the chip given the impedance the transistor wants to see.
Z S para1
s C pad.
s L bond. Z Schip,
1
s C pad.
s L bond. Z Schip
.
1
s C pad.
s L bond. Z Schip
Z Schip N opt I Copt, s,
1
s C pad.
Z S N opt I Copt, s,.
1
s C pad.
Z S N opt I Copt, s,s L bond.
Z Schip N opt I Copt, s, 60.362 6.225i Ω=
Load Impedance Bonding Pad/Wire Deimbedding
ZLchip
AMP
ZLLbond
Cpad
Fig. 35: Circuit Used for Solve for Load Impedance Bonding Deimbedding
Z L para1
s C pad.
s L bond. Z Lchip,
1
s C pad.
s L bond. Z Lchip
.
1
s C pad.
s L bond. Z Lchip
Z Lchip N opt I Copt, s,
1
s C pad.
Z L N opt I Copt, s,.
1
s C pad.
Z L N opt I Copt, s,s L bond.
Z Lchip N opt I Copt, s, 86.832 53.027i Ω=
Impedance MatchingHigh-pass impedance matching networks are chosen to compensate for the gain loss of the
transistor at higher frequencies. This also helps to stabilize the transistor at lower frequencies.
Highpass L Matching Network
highL Z S Z L, f, ω 2 π. f.
C 1 if Im Z L 0 1000 F, 1
ω Im Z L.
,
R S Re Z L
Q S
Im Z S
Re Z S
R p 1 Q S2 Re Z S
.
L 11 Q S
2
Q S2
Im Z S
ω.
QR p
R S1
L pR p
ω Q.
C S1
Q ω. R S.
CC 1 C S
.
C 1 C S
LL p L 1
.
L 1 L p
L
H
C
F
Source Matching Network #1: Highpass
VS
50 ohms
L
CZS
AMP
Fig. 36: Highpass source matching network
x highL Z S N opt I Copt, s, 50 ohm, f,
L S x1
H. L S 8.985 nH= Source Matching Inductance
C S x2
F. C S 3.334 pF= Source Matching Capacitance
Load Matching Network
50 ohms
L
C
ZL
AMP
Fig. 37: Highpass load matching network
x highL Z L N opt I Copt, s, 50 ohm, f,
L L x1
H. L L 6.269 nH= Load Matching Inductance
C L x2
F. C L 1.217 pF= Load Matching Capacitance
Low Frequency Stabilization
It is desirable to convert the parallel combination of the load matching network inductor and the ballast resistor into a series combination. This has the beneficial effect of improving the stability of the amplifier at lower frequencies, at the expense of stability at higher frequencies. The assumption is that stability is acheived at higher frequencies because of the reduced gain and because the small parasitic losses of the passive elements become significant
50 ohms
Lp
C
AMP
Rp
50 ohms
LS
C
AMP
RS
Ballast Resistor
Fig. 38: Ballast resistor conversion from parallel to series
Q LP R P L P, ω,R P
L P ω.Q of an LP in parallel with R P
LP2S R P L P, ω,
Q LP R P L P, ω, 2
1 Q LP R P L P, ω, 2
L P
H.
1
1 Q LP R P L P, ω, 2
R P
ohm.
Conversion from LP and RP to LS and RS
L LS LP2S R L N opt I Copt, s, L L, ω,1
H. L LS 6.205 nH= Series Load Inductance
R LS LP2S R L N opt I Copt, s, L L, ω,2
ohm. R LS 7.508 ohm= Series Load Resistance
OutputsI Copt 7.277 mA= Optimal Bias CurrentN opt 46.572= Optimal Device SizeL S 8.985 nH= Optimal Source Matching InductanceC S 3.334 pF= Optimal Source Matching CapacitanceC L 1.217 pF= Optimal Load Matching CapacitanceL LS 6.205 nH= Optimal Load Matching InductanceR LS 7.508 ohm= Optimal Series Load Ballast Resistor
Simulation
Fig. 39: Circuit schematic used in Cadence simulations
After the initial design with Mathcad, we simulated the circuit using Cadence. Cadence’s IC design tools allow the LNA design to be taken to the next levels of layout and fabrication. Just like its counterpart, Cadence is also capable of displaying stability, gain and noise figure circles on a Smith chart. However, setting up Cadence requires a considerable amount of time to guarantee reliable results.
The distortion specification for our LNA is the input-referred third-order intercept point, IIP 3, which is measured with a two-tone test. The two tone test is simulated by adding two sinusoidal signals at 1.90 GHz and 1.91 GHz to the input, each having a -20 dBm available input power, Pin(dB). The amplitude of the third order intermodulation, products, IM3(dB), is then measured by performing a discrete-time Fourier transform of the output signal. When plotted in decibels against input power, the output power and IM3 curves are relatively straight lines with slopes of 1 and 3 respectively, which is shown in figure 1 below. IIP 3, is defined as the input power at which the extrapolated IM3 and output power curves intercept. As we know the slope of each curve and a point through which each one passes, we can easily calculate IIP 3 with a single transient simulation with the following formula:
IIP 3 dBm( )IM 3 dB( )
2P in dBm( )
The schematic used for the simulation is presented in figure 39. For additional accuracy in modeling the fabricated amplifier, the inductance of the bonding wires, capacitance of the bonding pads, and the resistance of the bond wires were added to the schematic. The vias from the ground plane of the PC board were calculated to be 0.11nH, and were initially added to the schematic with little effect.
To insure stability over the spectrum, resistors were strategically placed throughout the circuit. The best method to improve low frequency stability is to add a resistance in series with an inductor connected from the signal path to ground. Similarly, high frequency stability is enhanced with a resistance in series with a capacitor connected from the signal path to ground. Resistors degrade the noise and gain performance of the amplifier so it would be desirable to use reactive elements to improve stability. Unfortunately, although reactances affect the input and impedances of the amplifer, they have no effects on the unconditionaly stability factor, K around the K=1 point. In this LNA resistance was intentionally placed in series with the output and input bonding pads to achieve unconditional stability condition at high frequencies. The simulation results for the K-factor of the final version of our circuit have been plotted in Fig. 40 and Fig. 41.
Fig. 40: Simulation results for K-factor
Fig. 41: A closer look at K-factor at high frequencies
After the amplifier was unconditionally stabilized, the input-matching networks were optimized to trade-off gain and noise while meeting the specifications of 12 dB gain and 1.5dB NF. Although including more parasitic elements in our simulations than in the Mathcad calculations prevented us from getting exactly the predicted values, we have happily observed that the general trends stayed the same. The device size, bias current, value of the degeneration inductance and the input-matching network based on our simulations of power gain, noise figure, linearity,
Fig. 42: Input reflection coefficient as a function of frequency
Fig. 43: Transducer power gain vs. frequency
It is possible to use on-chip inductors to increase integration, decrease external component count, thus reducing the price of the overall LNA. Unfortunately, on-chip inductors have a series resistance, which reduces their Q to 3-5 at 1GHz. On-chip inductors were not used for the input-matching network to prevent a noise figure increase, but it is possible to use on-chip inductors for the load inductance without degradation of performance. A load inductance loss is already introduced to stability the amplifier at low frequencies. This resistance of the on-chip inductor can be subtracted from this loss to yield the same performance amplifier. Off-chip inductors manufactured by Toko, with Q values between 30 and 60 at around 2 GHz, were assumed for the input matching network. When compared with an on-chip inductor with a Q value of 3, the input-referred noise power increased by 20%, which would give a large 0.3dB increase in noise figure.
The input-matching network used is a first order high-pass filter. In our final version we used a series input capacitance of 2.5pF and a shunt inductance of 11nH (Q is assumed to be 50). DC coupling between the input and the LNA has been achieved by using a capacitance of 100pF. According to our simulations, this network provides a good compromise between the power and noise source input impedance.
The output-matching network used is a 5.5nH shunt inductor and a series capacitance of 800fF. The inductor is in series with a 10 ballast resistance and both of them are placed between the voltage supply and the output node. The capacitance also enables us to get DC coupling between the amplifier and the output.
Conclusions
A 2.7V 1.9 GHz low noise amplifier with a noise figure of 1.31 dB, transducer power gain of 14.25 dB, an S11 of -14 dB and IIP3 of 7.75dBm has been presented. Unconditional stability at all frequencies with negligible loss in performance has been guaranteed with carefully placed resistances in the load matching networks. An automated LNA design procedure has been developed to optimize and enhance the speed of the designing low noise amplifiers. The design procedure includes a new method for trading the optimal noise and power source impedances of the amplifier.
References [1] Microwave Engineering, 2nd edition, 1998, David M. Pozar, pg. 208.
[2] "Analysis and Design of Monolithic Integrated Mixer," by Keng Fong, U.C. Berkeley Ph. D. thesis, 1997. [3] "The implementation of a High Speed Experimental Transceiver Module with an Emphasis on CDMA Applications," by Arya Reza Behzad, U.C. Berkeley Electronics Research Laboratory Memorandum No. UCB/ERL M95/40[4] "RF Circuit Design," by Chris Bowick, 1982, Butterworth Heinemann Publishers
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