May 16, 2000 1

May 16, 2000 2

USB 2.0 Compliance And Tools

USB 2.0 Compliance And Tools

Kosta KoemanKosta Koeman

Software EngineerSoftware Engineer

Intel Architecture LabsIntel Architecture Labs

IntelIntel

May 16, 2000 3

AgendaAgenda

HistoryHistory Goal of the programGoal of the program Comparison of USB 1.1 and USB 2.0Comparison of USB 1.1 and USB 2.0 Similarities with USB 1.1 Compliance ProgramSimilarities with USB 1.1 Compliance Program Differences with USB 1.1 Compliance ProgramDifferences with USB 1.1 Compliance Program

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HistoryHistory

USB 1.1 Compliance ProgramUSB 1.1 Compliance Program– Long evolution from 1996 (USB 1.0) to today (2000)Long evolution from 1996 (USB 1.0) to today (2000)

S3

Inrush

Signal Quality, S1

USBCheck, Hidview, Interoperability

Chap 11, OHCI, Current

Chap 9, UHCI, Drop/Droop

S3

Inrush

Signal Quality, S1

USBCheck, Hidview, Interoperability

Chap 11, OHCI, Current

Chap 9, UHCI, Drop/Droop

‘96‘96

YearYear

T e s ting

T e s ting

Level

Level

‘97‘97 ‘98‘98 ‘99‘99 ‘00‘00 ‘01‘01

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Evolution of the ProgramEvolution of the Program

The USB 2.0 Compliance Program is an extension The USB 2.0 Compliance Program is an extension of the USB 1.1 Compliance Program.of the USB 1.1 Compliance Program.– Years of experienceYears of experience– Tools already in placeTools already in place

What this means…What this means…

USB 2.0 Compliance ProgramUSB 2.0 Compliance ProgramWill Start at a High Level!Will Start at a High Level!

USB 2.0 Compliance ProgramUSB 2.0 Compliance ProgramWill Start at a High Level!Will Start at a High Level!

TodayToday TomorrowTomorrow

USB2.0USB2.0

USB1.1USB1.1

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Goal of the ProgramGoal of the Program

Solid, robust testing at a higher frequencySolid, robust testing at a higher frequency How will this be accomplished?How will this be accomplished?

– Leverage the experience and testing infrastructure Leverage the experience and testing infrastructure from the USB 1.1 Compliance Programfrom the USB 1.1 Compliance Program

– Modify current toolsModify current tools– Develop a new tool, couple of test fixturesDevelop a new tool, couple of test fixtures– Perform all tests at full and high speedsPerform all tests at full and high speeds

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Comparison of USB 1.1 / 2.0Comparison of USB 1.1 / 2.0

Tighter timings constraints due toTighter timings constraints due tohigher (40 x) frequency higher (40 x) frequency

Dual speed support - Transaction TranslatorDual speed support - Transaction Translator Defined characteristics of both the transmitterDefined characteristics of both the transmitter

andand receiver receiver New test modesNew test modes Same cablesSame cables

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Similarities & DifferencesSimilarities & Differences

Power requirementsPower requirements USBCheckUSBCheck InteroperabilityInteroperability Almost All Test Almost All Test

FixturesFixtures

ElectricalsElectricals– High Speed Signal QualityHigh Speed Signal Quality

Platform TestingPlatform Testing TDR TestingTDR Testing More Extensive Hub More Extensive Hub

TestingTesting– Transaction TranslatorTransaction Translator

SimilaritiesSimilarities DifferencesDifferences

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SimilaritiesSimilarities

Power MeasurementsPower Measurements USBCheckUSBCheck InteroperabilityInteroperability Almost All Test FixturesAlmost All Test Fixtures

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Power MeasurementsPower Measurements

500 500 a - a - Most devicesMost devices

2.5 ma - 2.5 ma - High powered (> 100 ma)High powered (> 100 ma)

-- Remote wakeup enabled) Remote wakeup enabled)

100 ma - 100 ma - High powered (>100 ma)High powered (>100 ma)

-- Remote wakeup enabled Remote wakeup enabled

-- WOL enabled WOL enabled

SuspendedSuspended

500 ma500 maOperatingOperating

500 ma500 maConfiguredConfigured

100 ma100 maUnconfiguredUnconfigured

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Compliance Tool USBCheckCompliance Tool USBCheck

Small extensions to Chapter 9 & Chapter 11Small extensions to Chapter 9 & Chapter 11– Chapter 9: new descriptorsChapter 9: new descriptors

2 new 2 new Get DescriptorGet Descriptor tests tests Different endpoint constraintsDifferent endpoint constraints

– Chapter 11: new status bits & test modeChapter 11: new status bits & test mode 4 new port tests: Set/Clear Port Feature, PORT_TEST/PORT_INDICATOR 4 new port tests: Set/Clear Port Feature, PORT_TEST/PORT_INDICATOR

Core functionality is already thereCore functionality is already there – Chap 9: No new requests, only function/type extensionsChap 9: No new requests, only function/type extensions– Chap 11: Same events must be handled Chap 11: Same events must be handled

Connects, disconnects, reset, suspend, etc.Connects, disconnects, reset, suspend, etc.

Test at both high and full speedsTest at both high and full speeds

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Get Device Qualifier Screenshot Get Device Qualifier Screenshot

Compliance Tool USBCheckCompliance Tool USBCheck

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Interoperability TestingInteroperability Testing

Co-existence withCo-existence withUSB 1.1 devicesUSB 1.1 devices

Virtually sameVirtually same– All transfer typesAll transfer types– 5 hubs deep with 5 meter 5 hubs deep with 5 meter

cables (i.e. Tier 6)cables (i.e. Tier 6)– Mix of speedsMix of speeds

Test devices at both Full Test devices at both Full and High Speedsand High Speeds

RootRoot

HS HubHS Hub

DUTDUT

HS HubHS Hub

HS HubHS Hub

Other Devices

Other Devices

FS HubFS Hub HS HubHS Hub

HS HubHS Hub

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Similarities – Test FixturesSimilarities – Test Fixtures

CurrentCurrent

InrushInrush DropDrop

DroopDroop

Full/Low Speed Full/Low Speed Signal QualitySignal Quality

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DifferencesDifferences

ElectricalsElectricals– Signal QualitySignal Quality

Time Domain Reflectometer (TDR)Time Domain Reflectometer (TDR) Platform TestingPlatform Testing More Extensive Hub TestingMore Extensive Hub Testing

– Transaction TranslatorTransaction Translator

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Differences in ElectricalsDifferences in Electricals

480 MHz = 40x Frequency480 MHz = 40x Frequency– Smaller margin for error!Smaller margin for error!

Have the process and tools defined earlyHave the process and tools defined early– Oscilloscope characteristicsOscilloscope characteristics– Tools to acquire data from scope to createTools to acquire data from scope to create

eye patternseye patterns– Test modes Test modes

Used to measure, capture eye patternUsed to measure, capture eye pattern Device independent way to test devicesDevice independent way to test devices

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Signal QualitySignal Quality

USB 2.0 spec defines required eye pattern at USB 2.0 spec defines required eye pattern at internal/external connectorsinternal/external connectors– 6 Patterns - Templates6 Patterns - Templates

4 correspond to external connectors (TP2 & TP3)4 correspond to external connectors (TP2 & TP3) 2 correspond to internal connectors (TP1 & TP4)2 correspond to internal connectors (TP1 & TP4)

– Rise / Fall TimesRise / Fall Times– Allowance for jitterAllowance for jitter– Overshoot / undershootOvershoot / undershoot

Testing will be at external connectorsTesting will be at external connectors– New test fixture for high speed signal qualityNew test fixture for high speed signal quality

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Test PointsTest Points

TransmitterTransmitter Receiver (New)Receiver (New)

USB CableUSB Cable

Device Circuit BoardDevice Circuit Board Hub / MotherboardHub / Motherboard

BBConnectorConnector

AAConnectorConnector

TracesTraces TracesTraces

TransceiverTransceiver TransceiverTransceiver

TP4TP4 TP3TP3 TP2TP2 TP1TP1

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Eye Patterns TemplateEye Patterns Template

0 VoltsDifferential

+ 400mVDifferential

- 400mVDifferential

Unit Interval

Level 1

Level 2

Point 1 Point 2

Point 3 Point 4

Point 5 Point 6

0% 100%

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TemplatesTemplates

Receiver sensitivity requirements for device Receiver sensitivity requirements for device without a captive cable with signal applied at without a captive cable with signal applied at TP3 and hub when a signal is applied at TP2TP3 and hub when a signal is applied at TP2

44

Receiver sensitivity requirements for device Receiver sensitivity requirements for device with captive cable with signal applied at TP2with captive cable with signal applied at TP2

33

Transmit waveform requirements for a device Transmit waveform requirements for a device with a captive cable measured at TP2with a captive cable measured at TP2

22

Transmit waveform requirements for hub Transmit waveform requirements for hub measured at TP2 and device measured at TP3measured at TP2 and device measured at TP3

11MeaningMeaningTemplateTemplate

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Test Point ValuesTest Point Values

* First Value in UI Following a Transition, Second Value Applies to All Others* First Value in UI Following a Transition, Second Value Applies to All Others

Template 1Template 1 Template 2Template 2 Template 3Template 3 Template 4Template 4

VoltageVoltage TimeTime VoltageVoltage TimeTime VoltageVoltage TimeTime VoltageVoltage TimeTime

Level 1Level 1525 mV / 525 mV /

425 mV *425 mV *N/AN/A

525 mV / 525 mV /

425 mV *425 mV *N/AN/A 575 mV575 mV N/AN/A 575 mV575 mV N/AN/A

Level 2Level 2-525 mV / -525 mV /

-425 mV *-425 mV *N/AN/A

-525 mV / -525 mV /

-425 mV *-425 mV *N/AN/A -575 mV-575 mV N/AN/A -575 mV-575 mV N/AN/A

TP1TP1 0 V0 V 7.5%7.5% 0 V0 V 12.5%12.5% 0 V0 V 10%10% 0 V0 V 15%15%

TP2TP2 0 V0 V 92.5%92.5% 0 0V0 0V 87.5%87.5% 0 V0 V 90%90% 0 V0 V 85%85%

TP3TP3 300 mV300 mV 37.5%37.5% 175 mV175 mV 35%35% 275 mV275 mV 40%40% 150 mV150 mV 35%35%

TP4TP4 300 mV300 mV 62.5%62.5% 175 mV175 mV 65%65% 275 mV275 mV 60%60% 150 mV150 mV 65%65%

TP5TP5 -300 mV-300 mV 37.5%37.5% -175 mV-175 mV 35%35% -275 mV-275 mV 40%40% -150 mV-150 mV 35%35%

TP6TP6 -300 mV-300 mV 62.5%62.5% -175 mV-175 mV 65%65% -275 mV-275 mV 60%60% -150 mV-150 mV 65%65%

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Sample Eye Pattern (TP2)Sample Eye Pattern (TP2)

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Time Domain ReflectometerTime Domain Reflectometer

Acronym: TDRAcronym: TDR Means of measuring a receiver’s impedanceMeans of measuring a receiver’s impedance

– Receiver idle: D+, D- both at 0 voltsReceiver idle: D+, D- both at 0 volts Requires new test fixtureRequires new test fixture To be run on ALL devices, hubs, and hostsTo be run on ALL devices, hubs, and hosts

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Platform TestingPlatform Testing

Eye Pattern Testing at TP2Eye Pattern Testing at TP2– Template 1 (Transmit)Template 1 (Transmit)– Template 4 (Receive)Template 4 (Receive)

TDR Testing TDR Testing MotherboardMotherboard

A ConnectorA Connector

TransceiverTransceiver

TP2TP2

TP1TP1

PC PlatformPC Platform

TracesTraces

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Extensive Hub TestingExtensive Hub Testing

Signal Quality – Eye PatternsSignal Quality – Eye Patterns– At TP3 (downstream) in addition to TP2 (upstream) At TP3 (downstream) in addition to TP2 (upstream) – Both transmitting (Template 1) and receivingBoth transmitting (Template 1) and receiving

(Template 4)(Template 4) Hub specific commandsHub specific commands

– Port test modesPort test modes TDR TestingTDR Testing

– All connectors (upstream B, downstream A)All connectors (upstream B, downstream A) Transaction TranslatorTransaction Translator

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Transaction TranslatorTransaction Translator

What is a Transaction Translator?What is a Transaction Translator?– Component of the hub that handles data transfers Component of the hub that handles data transfers

to/from full and low speed downstream devicesto/from full and low speed downstream devices When is it used?When is it used?

– Active when hub is configured at Active when hub is configured at high speedhigh speed and and fullfull and/or and/or low speedlow speed devices connected devices connected downstreamdownstream Buffers data transfersBuffers data transfers Finite spaceFinite space 2 kind of buffers2 kind of buffers 1 TT per hub OR 1 TT per port1 TT per hub OR 1 TT per port

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Transaction TranslatorTransaction Translator Hub Components Hub Components

HSHS DeviceDevice

LS LS DeviceDevice

Port 1Port 1

480 MHz480 MHz12 MHz12 MHz1.5 MHz1.5 MHz

Port 2Port 2 Port NPort N

FS FS DeviceDevice

Hub Hub RepeaterRepeater

Hub Hub RepeaterRepeater

RoutingLogic

Hub Hub ControllerController

Hub Hub ControllerController

Hub StateHub StateMachinesMachines Hub StateHub StateMachinesMachines

High speed connectionHigh speed connection

TTTT11TTTT11

TTTT22TTTT22

TTTTNNTTTTNN

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Transaction TranslatorTransaction Translator

How will we testHow will we test– Devices & hubs of mixed speeds below hub Devices & hubs of mixed speeds below hub – Set of rigorous tests to test TT using low/full Set of rigorous tests to test TT using low/full

speed devicespeed device Perform loopbackPerform loopback Both periodic & non-periodic transfers Both periodic & non-periodic transfers

(actually all transfer types)(actually all transfer types) Check for isochrony hiccups, data integrity, etc.Check for isochrony hiccups, data integrity, etc.

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Transaction TranslatorTransaction Translator

TT InternalsTT Internals– Separate buffers for Separate buffers for

start/complete split start/complete split (periodic) transfers (periodic) transfers

– Data sent “just in Data sent “just in time” to minimize time” to minimize buffer spacebuffer space

– Minimum 2 buffers Minimum 2 buffers for non-periodic for non-periodic transferstransfers

Start-splitFIFO

Complete-splitFIFO

StartStartHandlerHandler

StartStartHandlerHandler

CompleteCompleteHandlerHandler

CompleteCompleteHandlerHandler

Full/LowFull/LowHandlerHandlerFull/LowFull/LowHandlerHandler

TT Microframe Pipeline for Periodic Split TransactionsTT Microframe Pipeline for Periodic Split Transactions

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Oscilloscope RequirementsOscilloscope Requirements

List of scope / probe capabilities necessaryList of scope / probe capabilities necessary– 5 G Samples/sec5 G Samples/sec– 2 GHz bandwidth2 GHz bandwidth

List of scopes / probes with these capabilitiesList of scopes / probes with these capabilities– Scope: TDS 694C – 10 GS/s, 3 GHzScope: TDS 694C – 10 GS/s, 3 GHz– Probe: P6217 Fet probe – 4 GHz, 0.4 pf typProbe: P6217 Fet probe – 4 GHz, 0.4 pf typ– More scopes and probes to be addedMore scopes and probes to be added

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ConclusionConclusion

Two significant additions for USB2.0 ComplianceTwo significant additions for USB2.0 Compliance– Electrical TestingElectrical Testing– Transaction Translator TestingTransaction Translator Testing

Rest of stuff is the same with only slight Rest of stuff is the same with only slight modificationsmodifications

Start the with the bar Start the with the bar alreadyalready high! high!

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