MCP3202

MCP32022.7V Dual Channel 12-Bit A/D Converter

with SPI® Serial Interface

FEATURES

• 12-bit resolution• ±1 LSB max DNL

• ±1 LSB max INL (MCP3202-B)• ±2 LSB max INL (MCP3202-C)• Analog inputs programmable as single-ended or

pseudo-differential pairs• On-chip sample and hold

• SPI® serial interface (modes 0,0 and 1,1)• Single supply operation: 2.7V - 5.5V• 100ksps max. sampling rate at VDD = 5V

• 50ksps max. sampling rate at VDD = 2.7V• Low power CMOS technology

- 500nA typical standby current, 5µA max.- 550µA max. active current at 5V

• Industrial temp range: -40°C to +85°C • 8-pin PDIP SOIC and TSSOP packages

APPLICATIONS

• Sensor Interface

• Process Control• Data Acquisition• Battery Operated Systems

DESCRIPTION

The Microchip Technology Inc. MCP3202 is a succes-sive approximation 12-bit Analog-to-Digital (A/D) Con-verter with on-board sample and hold circuitry. TheMCP3202 is programmable to provide a singlepseudo-differential input pair or dual single-endedinputs. Differential Nonlinearity (DNL) is specified at±1 LSB, and Integral Nonlinearity (INL) is offered in±1 LSB (MCP3202-B) and ±2 LSB (MCP3202-C) ver-sions. Communication with the device is done using asimple serial interface compatible with the SPI protocol.The device is capable of conversion rates of up to100ksps at 5V and 50ksps at 2.7V. The MCP3202device operates over a broad voltage range (2.7V -5.5V). Low current design permits operation with typi-cal standby and active currents of only 500nA and375µA, respectively. The MCP3202 is offered in 8-pinPDIP, TSSOP and 150mil SOIC packages.

PACKAGE TYPES

FUNCTIONAL BLOCK DIAGRAM

MC

P3202

1

234

8

765

PDIP

CH0

CH1

VSS

CS/SHDN VDD/VREF

CLK

DOUT

DIN

MC

P3202

1

2

34

8

7

65

CH0

CH1

VSS

VDD/VREF

CLK

DOUT

CS/SHDN

DIN

SOIC, TSSOP

Comparator

Sampleand Hold

12-Bit SAR

DAC

Control Logic

CS/SHDN

VSSVDD

CLK DOUT

ShiftRegister

CH0 ChannelMux

Input

CH1

DIN

1999 Microchip Technology Inc. Preliminary DS21034A-page 1

MCP3202

1.0 ELECTRICAL CHARACTERISTICS

1.1 Maximum Ratings*

VDD.........................................................................7.0VAll inputs and outputs w.r.t. VSS ...... -0.6V to VDD +0.6VStorage temperature ..........................-65°C to +150°CAmbient temp. with power applied......-65°C to +125°CSoldering temperature of leads (10 seconds) .. +300°CESD protection on all pins ...................................> 4kV

*Notice: Stresses above those listed under “Maximum Ratings” maycause permanent damage to the device. This is a stress rating only andfunctional operation of the device at those or any other conditionsabove those indicated in the operational listings of this specification isnot implied. Exposure to maximum rating conditions for extended peri-ods may affect device reliability.

PIN FUNCTION TABLE

NAME FUNCTION

VDD/VREF

CH0

CH1

CLK

DIN

DOUT

CS/SHDN

+2.7V to 5.5V Power Supply andReference Voltage Input

Channel 0 Analog Input

Channel 1 Analog Input

Serial Clock

Serial Data In

Serial Data Out

Chip Select/Shutdown Input

ELECTRICAL CHARACTERISTICSAll parameters apply at VDD = 5.5V, VSS = 0V, TAMB = -40°C to +85°C, fSAMPLE = 100ksps and fCLK = 18*fSAMPLE unless otherwise noted.

PARAMETER SYMBOL MIN. TYP. MAX. UNITS CONDITIONS

Conversion Rate

Conversion Time tCONV 12 clock cycles

Analog Input Sample Time tSAMPLE 1.5 clock cycles

Throughput Rate fSAMPLE 10050

kspsksps

VDD = VREF = 5VVDD = VREF = 2.7V

DC Accuracy

Resolution 12 bits

Integral Nonlinearity INL ±0.75±1

±1±2

LSBLSB

MCP3202-BMCP3202-C

Differential Nonlinearity DNL ±0.5 ±1 LSB No missing codes over temperature

Offset Error ±1.25 ±3 LSB

Gain Error ±1.25 ±5 LSB

Dynamic Performance

Total Harmonic Distortion -82 dB VIN = 0.1V to 4.9V@1kHz

Signal to Noise and Distortion (SINAD)

72 dB VIN = 0.1V to 4.9V@1kHz

Spurious Free Dynamic Range 86 dB VIN = 0.1V to 4.9V@1kHz

Analog Inputs

Input Voltage Range for CH0 or CH1 in Single-Ended Mode

VSS VREF V

Input Voltage Range for IN+ in Pseudo-Differential Mode

IN- VREF+IN- See Sections 3.1 and 4.1

Input Voltage Range for IN- in Pseudo-Differential Mode

VSS-100 VSS+100 mV See Sections 3.1 and 4.1

Leakage Current .001 ±1 µA

Switch Resistance RSS 1K Ω See Figure 4-1

Sample Capacitor CSAMPLE 20 pF See Figure 4-1

DS21034A-page 2 Preliminary 1999 Microchip Technology Inc.

MCP3202

Digital Input/Output

Data Coding Format Straight Binary

High Level Input Voltage VIH 0.7 VDD V

Low Level Input Voltage VIL 0.3 VDD V

High Level Output Voltage VOH 4.1 V IOH = -1mA, VDD = 4.5V

Low Level Output Voltage VOL 0.4 V IOL = 1mA, VDD = 4.5V

Input Leakage Current ILI -10 10 µA VIN = VSS or VDD

Output Leakage Current ILO -10 10 µA VOUT = VSS or VDD

Pin Capacitance (All Inputs/Outputs)

CIN, COUT 10 pF VDD = 5.0V (Note 1)TAMB = 25°C, f = 1 MHz

Timing Parameters

Clock Frequency fCLK 1.80.9

MHzMHz

VDD = 5V (Note 2)VDD = 2.7V (Note 2)

Clock High Time tHI 250 ns

Clock Low Time tLO 250 ns

CS Fall To First Rising CLK Edge

tSUCS 100 ns

Data Input Setup Time tSU 50 ns

Data Input Hold Time tHD 50 ns

CLK Fall To Output Data Valid tDO 200 ns See Test Circuits, Figure 1-2

CLK Fall To Output Enable tEN 200 ns See Test Circuits, Figure 1-2

CS Rise To Output Disable tDIS 100 ns See Test Circuits, Figure 1-2Note 1

CS Disable Time tCSH 500 ns

DOUT Rise Time tR 100 ns See Test Circuits, Figure 1-2Note 1

DOUT Fall Time tF 100 ns See Test Circuits, Figure 1-2Note 1

Power Requirements

Operating Voltage VDD 2.7 5.5 V

Operating Current IDD 375 550 µA VDD = 5.0V, DOUT unloaded

Standby Current IDDS 0.5 5 µA CS = VDD = 5.0V

Note 1: This parameter is guaranteed by characterization and not 100% tested.

Note 2: Because the sample cap will eventually lose charge, effective clock rates below 10kHz can affect linearityperformance, especially at elevated temperatures. See Section 6.2 for more information.

ELECTRICAL CHARACTERISTICS (CONTINUED)All parameters apply at VDD = 5.5V, VSS = 0V, TAMB = -40°C to +85°C, fSAMPLE = 100ksps and fCLK = 18*fSAMPLE unless otherwise noted.

PARAMETER SYMBOL MIN. TYP. MAX. UNITS CONDITIONS


MCP3202

FIGURE 1-1: Serial Timing.

FIGURE 1-2: Test Circuits.

CS

CLK

DIN MSB IN

tSU tHD

tSUCS

tCSH

tHI tLO

DOUT

tEN

tDO tR tF

LSBMSB OUT

tDIS

NULL BIT

VIH

TDIS

CS

DOUT

Waveform 1*

DOUT

Waveform 2†

90%

10%

* Waveform 1 is for an output with internal condi-tions such that the output is high, unless dis-abled by the output control.

† Waveform 2 is for an output with internal condi-tions such that the output is low, unless disabledby the output control.

Voltage Waveforms for tDIS

Test Point

1.4V

DOUT

Load circuit for tR, tF, tDO

3K

CL = 100pF

Test Point

DOUT

Load circuit for tDIS and tEN

3K

100pF

tDIS Waveform 2

tDIS Waveform 1

CS

CLK

DOUT

tEN

1 2

B11

Voltage Waveforms for tEN

tEN Waveform

VDD

VDD/2

VSS

3 4

DOUT

tR

Voltage Waveforms for tR, tF

CLK

DOUT

tDO

Voltage Waveforms for tDO

tF

VOHVOL


MCP3202

2.0 TYPICAL PERFORMANCE CHARACTERISTICSNote: Unless otherwise indicated, VDD = 5V, VSS = 0V, fSAMPLE = 100ksps, fCLK = 18* fSAMPLE,TA = 25°C

FIGURE 2-1: Integral Nonlinearity (INL) vs. SampleRate.

FIGURE 2-2: Integral Nonlinearity (INL) vs. VDD.

FIGURE 2-3: Integral Nonlinearity (INL) vs. Code(Representative Part).

FIGURE 2-4: Integral Nonlinearity (INL) vs. SampleRate (VDD = 2.7V).

FIGURE 2-5: Integral Nonlinearity (INL) vs. VDD.

FIGURE 2-6: Integral Nonlinearity (INL) vs. Code(Representative Part, VDD = 2.7V).

-1.0-0.8-0.6-0.4-0.20.00.20.40.60.81.0

0 25 50 75 100 125 150

Sample Rate (ksps)

INL

(LS

B)

Positive INL

Negative INL

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

3.0 3.5 4.0 4.5 5.0

VDD(V)

INL

(LS

B)

Positive INL

Negative INL

FSAMPLE = 100ksps

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

0 512 1024 1536 2048 2560 3072 3584 4096

Digital Code

INL

(LS

B)

-2.0

-1.5

-1.0

-0.5

0.0

0.5

1.0

1.5

2.0

0 20 40 60 80 100

Sample Rate (ksps)

INL

(LS

B)

VDD = 2.7V

Positive INL

Negative INL

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

2.5 3.0 3.5 4.0 4.5 5.0

VDD(V)

INL

(LS

B)

Positive INL

Negative INL

FSAMPLE = 50ksps

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

0 512 1024 1536 2048 2560 3072 3584 4096

Digital Code

INL

(LS

B)

VDD = 2.7V

FSAMPLE = 50ksps


MCP3202

Note: Unless otherwise indicated, VDD = 5V, VSS = 0V, fSAMPLE = 100ksps, fCLK = 18* fSAMPLE,TA = 25°C

FIGURE 2-7: Integral Nonlinearity (INL) vs.Temperature.

FIGURE 2-8: Differential Nonlinearity (DNL) vs.Sample Rate.

FIGURE 2-9: Differential Nonlinearity (DNL) vs. VDD.

FIGURE 2-10: Integral Nonlinearity (INL) vs.Temperature (VDD = 2.7V).

FIGURE 2-11: Differential Nonlinearity (DNL) vs.Sample Rate (VDD = 2.7V).

FIGURE 2-12: Differential Nonlinearity (DNL) vs. VDD.

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

-50 -25 0 25 50 75 100

Temperature (°C)

INL

(LS

B)

Positive INL

Negative INL

-1.0-0.8-0.6-0.4-0.20.00.20.40.60.81.0

0 25 50 75 100 125 150

Sample Rate (ksps)

DN

L (L

SB

) Positive DNL

Negative DNL

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

2.5 3.0 3.5 4.0 4.5 5.0

VDD(V)

DN

L (L

SB

)

Positive DNL

Negative DNL

FSAMPLE = 100ksps

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

-50 -25 0 25 50 75 100

Temperature (°C)

INL

(LS

B)

Positive INL

VDD = 2.7V

FSAMPLE = 50ksps

Negative INL

-2.0

-1.5

-1.0

-0.5

0.0

0.5

1.0

1.5

2.0

0 20 40 60 80 100

Sample Rate (ksps)

DN

L (L

SB

)VDD = 2.7V

Positive DNL

Negative DNL

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

2.5 3.0 3.5 4.0 4.5 5.0

VDD(V)

DN

L (L

SB

) Positive DNL

Negative DNL

FSAMPLE = 50ksps


MCP3202


FIGURE 2-13: Differential Nonlinearity (DNL) vs.Code (Representative Part).

FIGURE 2-14: Differential Nonlinearity (DNL) vs.Temperature.

FIGURE 2-15: Gain Error vs. VDD.

FIGURE 2-16: Differential Nonlinearity (DNL) vs.Code (Representative Part, VDD = 2.7V).

FIGURE 2-17: Differential Nonlinearity (DNL) vs.Temperature (VDD = 2.7V).

FIGURE 2-18: Offset Error vs. VDD.

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

0 512 1024 1536 2048 2560 3072 3584 4096

Digital Code

DN

L (L

SB

)

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

-50 -25 0 25 50 75 100

Temperature (°C)

DN

L (L

SB

) Positive DNL

Negative DNL

-2.0

-1.5

-1.0

-0.5

0.0

0.5

1.0

1.5

2.0

2.5 3.0 3.5 4.0 4.5 5.0

VDD(V)

Gai

n E

rror

(LS

B)

FSAMPLE = 50kspsFSAMPLE = 100ksps

FSAMPLE = 10ksps

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

0 512 1024 1536 2048 2560 3072 3584 4096

Digital Code

DN

L (L

SB

)

VDD = 2.7V

FSAMPLE = 50ksps

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

-50 -25 0 25 50 75 100

Temperature (°C)

DN

L (L

SB

)Positive DNL

VDD = 2.7V

FSAMPLE = 50ksps

Negative DNL

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

2.5 3.0 3.5 4.0 4.5 5.0

VDD(V)

Offs

et E

rror

(LS

B)

FSAMPLE = 10ksps

FSAMPLE = 50kspsFSAMPLE = 100ksps


MCP3202


FIGURE 2-19: Gain Error vs. Temperature.

FIGURE 2-20: Signal to Noise Ratio (SNR) vs. InputFrequency.

FIGURE 2-21: Total Harmonic Distortion (THD) vs.Input Frequency.

FIGURE 2-22: Offset Error vs. Temperature.

FIGURE 2-23: Signal to Noise and Distortion(SINAD) vs. Input Frequency.

FIGURE 2-24: Signal to Noise and Distortion(SINAD) vs. Signal Level.

-1.0

-0.8

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

-50 -25 0 25 50 75 100

Temperature (°C)

Gai

n E

rror

(LS

B)

VDD = 5V

FSAMPLE = 100ksps

VDD = 2.7V

FSAMPLE = 50ksps

0

10

20

30

40

50

60

70

80

90

100

1 10 100

Input Frequency (kHz)

SN

R (

dB)

VDD = 2.7V

FSAMPLE = 50ksps

VDD = 5V

FSAMPLE = 100ksps

-100

-90

-80

-70

-60

-50

-40

-30

-20

-10

0

1 10 100


TH

D (

dB)

VDD = 2.7V

FSAMPLE = 50ksps

VDD = 5V

FSAMPLE = 100ksps

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

-50 -25 0 25 50 75 100

Temperature (°C)

Offs

et E

rror

(LS

B) VDD = 5V

FSAMPLE = 100ksps

VDD = 2.7V

FSAMPLE = 50ksps

0

10

20

30

40

50

60

70

80

90

100

1 10 100


SIN

AD

(dB

)

VDD = 2.7V

FSAMPLE = 50ksps

VDD = 5V

FSAMPLE = 100ksps

0

10

20

30

40

50

60

70

80

-40 -35 -30 -25 -20 -15 -10 -5 0

Input Signal Level (dB)

SIN

AD

(dB

)

VDD = 2.7V

FSAMPLE = 50ksps

VDD = 5V

FSAMPLE = 100ksps


MCP3202


FIGURE 2-25: Effective number of bits (ENOB) vs.VDD.

FIGURE 2-26: Spurious Free Dynamic Range(SFDR) vs. Input Frequency.

FIGURE 2-27: Frequency Spectrum of 10kHz input(Representative Part).

FIGURE 2-28: Effective Number of Bits (ENOB) vs.Input Frequency.

FIGURE 2-29: Power Supply Rejection (PSR) vs.Ripple Frequency.

FIGURE 2-30: Frequency Spectrum of 1kHz input(Representative Part, VDD = 2.7V).

9.0

9.5

10.0

10.5

11.0

11.5

12.0

2.0 2.5 3.0 3.5 4.0 4.5 5.0

VDD (V)

EN

OB

(rm

s)

FSAMPLE = 50ksps

FSAMPLE = 100ksps

0

10

20

30

40

50

60

70

80

90

100

1 10 100


SF

DR

(dB

)

VDD = 2.7V

FSAMPLE = 50ksps

VDD = 5V

FSAMPLE = 100ksps

-130-120-110-100

-90-80-70-60-50-40-30-20-10

0

0 10000 20000 30000 40000 50000

Frequency (Hz)

Am

plitu

de (

dB)

VDD = 5V

FSAMPLE = 100ksps

FINPUT = 9.985kHz

4096 points

8.0

8.5

9.0

9.5

10.0

10.5

11.0

11.5

12.0

1 10 100


EN

OB

(rm

s)

VDD = 2.7V

FSAMPLE = 50ksps

VDD = 5V

FSAMPLE = 100ksps

-80

-70

-60

-50

-40

-30

-20

-10

0

1 10 100 1000 10000

Ripple Frequency (kHz)

Pow

er S

uppl

y R

ejec

tion

(dB

)

-130-120-110-100-90-80-70-60-50-40-30-20-10

0

0 5000 10000 15000 20000 25000

Frequency (Hz)

Am

plitu

de (

dB)

VDD = 2.7V

FSAMPLE = 50ksps

FINPUT = 998.76Hz

4096 points


MCP3202


FIGURE 2-31: IDD vs. VDD.

FIGURE 2-32: IDD vs. Clock Frequency.

FIGURE 2-33: IDD vs. Temperature.

FIGURE 2-34: IDDS vs. VDD.

FIGURE 2-35: IDDS vs. Temperature.

FIGURE 2-36: Analog Input leakage current vs.Temperature.

0

50

100

150

200

250

300

350

400

450

500

2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0

VDD (V)

IDD (

µA)

All points at FCLK = 1.8MHz except

at VDD = 2.5V, FCLK = 900kHz

0

50

100

150

200

250

300

350

400

450

500

10 100 1000 10000

Clock Frequency (kHz)

IDD (

µA)

VDD = 5V

VDD = 2.7V

0

50

100

150

200

250

300

350

400

450

500

-50 -25 0 25 50 75 100

Temperature (°C)

IDD (

µA)

VDD = 5V

FCLK = 1.8MHz

VDD = 2.7V

FCLK = 900kHz

0

10

20

30

40

50

60

70

80

2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0

VDD (V)

IDD

S (

pA)

CS = VDD

0.01

0.10

1.00

10.00

100.00

-50 -25 0 25 50 75 100

Temperature (°C)

I DD

S (

nA)

VDD = CS = 5V

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

-50 -25 0 25 50 75 100

Temperature (°C)

Ana

log

Inpu

t Lea

kage

(nA

)

VDD = 5V

FCLK = 1.8MHz


MCP3202

3.0 PIN DESCRIPTIONS

3.1 CH0/CH1

Analog inputs for channels 0 and 1 respectively. Thesechannels can programmed to be used as two indepen-dent channels in single ended-mode or as a singlepseudo-differential input where one channel is IN+ andone channel is IN-. See Section 5.0 for information onprogramming the channel configuration.

3.2 CS/SHDN(Chip Select/Shutdown)

The CS/SHDN pin is used to initiate communicationwith the device when pulled low and will end a conver-sion and put the device in low power standby whenpulled high. The CS/SHDN pin must be pulled highbetween conversions.

3.3 CLK (Serial Clock)

The SPI clock pin is used to initiate a conversion and toclock out each bit of the conversion as it takes place.See Section 6.2 for constraints on clock speed.

3.4 DIN (Serial Data Input)

The SPI port serial data input pin is used to clock ininput channel configuration data.

3.5 DOUT (Serial Data output)

The SPI serial data output pin is used to shift out theresults of the A/D conversion. Data will always changeon the falling edge of each clock as the conversiontakes place.

4.0 DEVICE OPERATIONThe MCP3202 A/D Converter employs a conventionalSAR architecture. With this architecture, a sample isacquired on an internal sample/hold capacitor for1.5 clock cycles starting on the second rising edge ofthe serial clock after the start bit has been received.Following this sample time, the input switch of the con-verter opens and the device uses the collected chargeon the internal sample and hold capacitor to produce aserial 12-bit digital output code. Conversion rates of100ksps are possible on the MCP3202. SeeSection 6.2 for information on minimum clock rates.Communication with the device is done using a 3-wireSPI-compatible interface.

4.1 Analog Inputs

The MCP3202 device offers the choice of using the ana-log input channels configured as two single-endedinputs or a single pseudo-differential input. Configura-tion is done as part of the serial command before eachconversion begins. When used in the psuedo-differen-tial mode, CH0 and CH1 are programmed as the IN+and IN- inputs as part of the command string transmit-ted to the device. The IN+ input can range from IN- toVREF (VREF + IN-). The IN- input is limited to ±100mVfrom the VSS rail. The IN- input can be used to cancelsmall signal common-mode noise which is present onboth the IN+ and IN- inputs.

For the A/D Converter to meet specification, the chargeholding capacitor (CSAMPLE) must be given enough timeto acquire a 12-bit accurate voltage level during the1.5 clock cycle sampling period. The analog inputmodel is shown in Figure 4-1.

In this diagram, it is shown that the source impedance(RS) adds to the internal sampling switch (RSS) imped-ance, directly affecting the time that is required tocharge the capacitor, CSAMPLE. Consequently, largersource impedances increase the offset, gain, and inte-gral linearity errors of the conversion.

Ideally, the impedance of the signal source should benear zero. This is achievable with an operational ampli-fier such as the MCP601 which has a closed loop out-put impedance of tens of ohms. The adverse affects ofhigher source impedances are shown in Figure 4-2.

When operating in the pseudo-differential mode, if thevoltage level of IN+ is equal to or less than IN-, theresultant code will be 000h. If the voltage at IN+ is equalto or greater than [VREF + (IN-)] - 1 LSB, then the out-put code will be FFFh. If the voltage level at IN- is morethan 1 LSB below VSS, then the voltage level at the IN+input will have to go below VSS to see the 000h outputcode. Conversely, if IN- is more than 1 LSB above VSS,then the FFFh code will not be seen unless the IN+input level goes above VREF level.

4.2 Digital Output Code

The digital output code produced by an A/D Converteris a function of the input signal and the reference volt-age. For the MCP3202, VDD is used as the referencevoltage. As the VDD level is reduced, the LSB size isreduced accordingly. The theoretical digital output codeproduced by the A/D Converter is shown below.

where:

VIN = analog input voltage

VDD = supply voltage

Digital Output Code = 4096 * VIN

VDD


MCP3202

FIGURE 4-1: Analog Input Model.

FIGURE 4-2: Maximum Clock Frequency vs. InputResistance (RS) to maintain less than a 0.1 LSBdeviation in INL from nominal conditions.

CPINVA

RSCHx

7pF

VT = 0.6V

VT = 0.6VILEAKAGE

SamplingSwitch

SS RSS = 1kΩ

CSAMPLE

= DAC capacitance

VSS

VDD

= 20 pF±1nA

= Signal Source

= Source Impedance

= Input Channel Pad

= Input Capacitance

= Threshold Voltage

= Leakage Current at the pin due to various junctions

= Sampling Switch

= Sampling Switch Resistor

= Sample/Hold Capacitance

VA

RS

CHx

CPIN

VT

ILEAKAGE

SS

RSS

CSAMPLE

Legend

0.0

0.2

0.4

0.6

0.8

1.0

1.2

1.4

1.6

1.8

2.0

100 1000 10000

Input Resistance (Ohms)

Clo

ck F

requ

ency

(M

Hz) VDD = 5V

VDD = 2.7V


MCP3202

5.0 SERIAL COMMUNICATIONS

5.1 Overview

Communication with the MCP3202 is done using astandard SPI-compatible serial interface. Initiatingcommunication with the device is done by bringing theCS line low. See Figure 5-1. If the device was poweredup with the CS pin low, it must be brought high and backlow to initiate communication. The first clock receivedwith CS low and DIN high will constitute a start bit. TheSGL/DIFF bit and the ODD/SIGN bit follow the start bitand are used to select the input channel configuration.The SGL/DIFF is used to select single ended orpsuedo-differential mode. The ODD/SIGN bit selectswhich channel is used in single ended mode, and isused to determine polarity in pseudo-differential mode.Following the ODD/SIGN bit, the MSBF bit is transmit-ted to and is used to enable the LSB first format for thedevice. If the MSBF bit is low, then the data will comefrom the device in MSB first format and any furtherclocks with CS low will cause the device to outputzeros. If the MSBF bit is high, then the device will outputthe converted word LSB first after the word has beentransmitted in the MSB first format. See Figure 5-2.Table 5-1 shows the configuration bits for theMCP3202. The device will begin to sample the analoginput on the second rising edge of the clock, after thestart bit has been received. The sample period will endon the falling edge of the third clock following the startbit.

On the falling edge of the clock for the MSBF bit, thedevice will output a low null bit. The next sequential12 clocks will output the result of the conversion with

MSB first as shown in Figure 5-1. Data is always outputfrom the device on the falling edge of the clock. If all 12data bits have been transmitted and the device contin-ues to receive clocks while the CS is held low, (andMSBF = 1), the device will output the conversion resultLSB first as shown in Figure 5-2. If more clocks are pro-vided to the device while CS is still low (after the LSBfirst data has been transmitted), the device will clockout zeros indefinitely.

If necessary, it is possible to bring CS low and clock inleading zeros on the DIN line before the start bit. This isoften done when dealing with microcontroller-basedSPI ports that must send 8 bits at a time. Refer toSection 6.1 for more details on using the MCP3202devices with hardware SPI ports.

CONFIG BITS

CHANNELSELECTION

GND

SGL/ DIFF

ODD/ SIGN

0 1

SINGLE ENDED MODE

1 0 + -

1 1 + -

PSEUDO-DIFFERENTIAL

MODE

0 0 IN+ IN-

0 1 IN- IN+

TABLE 5-1: Configuration Bits for the MCP3202.

CS

CLK

DIN

DOUT

MS

HI-Z NullBit B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0*

HI-Z

tSAMPLE tCONV

SGL/DIFF

Start

tCYC

tCSH

tCYC

* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros indefinitely. SeeFigure 5-2 below for details on obtaining LSB first data.

** tDATA: during this time, the bias current and the comparator power down while the reference input becomes a high impedancenode, leaving the CLK running to clock out the LSB-first data or zeros.

tDATA**

tSUCS

ODD/SIGN BF

SGL/DIFF

Start ODD/SIGNDon’t Care


MCP3202

FIGURE 5-1: Communication with the MCP3202 using MSB first format only.

FIGURE 5-2: Communication with MCP3202 using LSB first format.

NullBit

B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 B1 B2 B3 B4 B5 B6 B7 B8 B9 B10 B11

CS

CLK

DOUT

HI-Z HI-Z

(MSB)

tCONV tDATA **

Power Down

tSAMPLE

DIN

tCYC

tCSH

* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros indefinitely.

** tDATA: During this time, the bias circuit and the comparator power down while the reference input becomes a high impedancenode, leaving the CLK running to clock out LSB first data or zeroes.

tSUCSO

DD

/SI

GN

Star

t

SGL/

DIF

F

MSB

F

Don’t Care

*


MCP3202

6.0 APPLICATIONS INFORMATION

6.1 Using the MCP3202 with Microcontroller (MCU) SPI Ports

With most microcontroller SPI ports, it is required tosend groups of eight bits. It is also required that themicrocontroller SPI port be configured to clock out dataon the falling edge of clock and latch data in on the risingedge. Depending on how communication routines areused, it is very possible that the number of clocksrequired for communication will not be a multiple of eight.Therefore, it may be necessary for the MCU to sendmore clocks than are actually required. This is usuallydone by sending ‘leading zeros’ before the start bit,which are ignored by the device. As an example,Figure 6-1 and Figure 6-2 show how the MCP3202 canbe interfaced to a MCU with a hardware SPI port.Figure 6-1 depicts the operation shown in SPI Mode 0,0,

which requires that the SCLK from the MCU idles in the‘low’ state, while Figure 6-2 shows the similar case ofSPI Mode 1,1 where the clock idles in the ‘high’ state.

As shown in Figure 6-1, the first byte transmitted to theA/D Converter contains seven leading zeros before thestart bit. Arranging the leading zeros this way producesthe output 12 bits to fall in positions easily manipulatedby the MCU. The MSB is clocked out of the A/D Con-verter on the falling edge of clock number 12. After thesecond eight clocks have been sent to the device, theMCU receive buffer will contain three unknown bits (theoutput is at high impedance until the null bit is clockedout), the null bit and the highest order four bits of theconversion. After the third byte has been sent to thedevice, the receive register will contain the lowest ordereight bits of the conversion results. Easier manipulationof the converted data can be obtained by using thismethod.

FIGURE 6-1: SPI Communication using 8-bit segments (Mode 0,0: SCLK idles low).

FIGURE 6-2: SPI Communication using 8-bit segments (Mode 1,1: SCLK idles high).

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

CS

SCLK

DIN

X = Don’t Care Bits

17 18 19 20 21 22 23 24

DOUTNULLBIT B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0HI-Z

MCU latches data from A/D Converter

Data is clocked out ofA/D Converter on falling edges

on rising edges of SCLKM

SB

F

Don’t Care

OD

D/

SIG

N

Start

X X X X X X X X X X X X X X X X X X

B7 B6 B5 B4 B3 B2 B1 B0B11 B10 B9 B80X X X X X X X X X X X

1

StartBit

(Null)

MCU Transmitted Data(Aligned with falling

edge of clock)

MCU Received Data(Aligned with rising

edge of clock)

MSBF

SGL/DIFF

X XSGL/DIFF

ODD/SIGN

Data stored into MCU receive register after transmission of first 8 bits

Data stored into MCU receive register after transmission of second 8 bits

Data stored into MCU receive register after transmission of last 8 bits

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

CS

SCLK

DIN

X = Don’t Care Bits

17 18 19 20 21 22 23 24

DOUT

Don’t Care

NULLBIT B11 B10 B9 B8 B6 B5 B4 B3 B2 B1 B0

HI-Z

0 0 0 0 0 0 X X X X X X X X X X X X X

B7 B6 B5 B4 B3 B2 B1 B0B11 B10 B9 B80X X X X X X X X X X X

MCU latches data from A/D Converteron rising edges of SCLK

Data is clocked out ofA/D Converter on falling edges

StartBit

(Null)

Start

MCU Transmitted Data(Aligned with falling

edge of clock)

MCU Received Data(Aligned with rising

edge of clock)

B7

1

SG

L/D

IFF

MS

BF

OD

D/

SIG

N

0SGL/DIFF

ODD/SIGN MSBF

Data stored into MCU receive register after transmission of first 8 bits

Data stored into MCU receive register after transmission of second 8 bits

Data stored into MCU receive register after transmission of last 8 bits


MCP3202

6.2 Maintaining Minimum Clock Speed

When the MCP3202 initiates the sample period,charge is stored on the sample capacitor. When thesample period is complete, the device converts one bitfor each clock that is received. It is important for theuser to note that a slow clock rate will allow charge tobleed off the sample cap while the conversion is takingplace. At 85°C (worst case condition), the part willmaintain proper charge on the sample capacitor for atleast 1.2ms after the sample period has ended. Thismeans that the time between the end of the sampleperiod and the time that all 12 data bits have beenclocked out must not exceed 1.2ms (effective clock fre-quency of 10kHz). Failure to meet this criteria mayinduce linearity errors into the conversion outside therated specifications. It should be noted that during theentire conversion cycle, the A/D Converter does notrequire a constant clock speed or duty cycle, as long asall timing specifications are met.

6.3 Buffering/Filtering the Analog Inputs

If the signal source for the A/D Converter is not a lowimpedance source, it will have to be buffered or inaccu-rate conversion results may occur. It is also recom-mended that a filter be used to eliminate any signalsthat may be aliased back into the conversion results.This is illustrated in Figure 6-3 below where an op ampis used to drive the analog input of the MCP3202. Thisamplifier provides a low impedance output for the con-verter input and a low pass filter, which eliminatesunwanted high frequency noise.

Low pass (anti-aliasing) filters can be designed usingMicrochip’s interactive FilterLab™ software. FilterLabwill calculate capacitor and resistor values, as well as,determine the number of poles that are required for theapplication. For more information on filtering signals,see the application note AN699 “Anti-Aliasing AnalogFilters for Data Acquisition Systems.”

FIGURE 6-3: The MCP601 Operational Amplifier isused to implement a 2nd order anti-aliasing filter forthe signal being converted by the MCP3202.

6.4 Layout Considerations

When laying out a printed circuit board for use with ana-log components, care should be taken to reduce noisewherever possible. A bypass capacitor should alwaysbe used with this device and should be placed as closeas possible to the device pin. A bypass capacitor valueof 1µF is recommended.

Digital and analog traces should be separated as muchas possible on the board and no traces should rununderneath the device or the bypass capacitor. Extraprecautions should be taken to keep traces with highfrequency signals (such as clock lines) as far as possi-ble from analog traces.

Use of an analog ground plane is recommended inorder to keep the ground potential the same for alldevices on the board. Providing VDD connections todevices in a “star” configuration can also reduce noiseby eliminating current return paths and associatederrors. See Figure 6-4. For more information on layouttips when using A/D Converters, refer to AN688 “Lay-out Tips for 12-Bit A/D Converter Applications”.

FIGURE 6-4: VDD traces arranged in a ‘Star’configuration in order to reduce errors caused bycurrent return paths.

FilterLab is a trademark of Microchip Technology Inc. inthe U.S.A and other countries. All rights reserved.

MCP3202

VDD

10uF

IN-

IN+

-+

VIN

C1

C2

VREF

4.096VReference

ADIREF198

1µF

1µF0.1µFTant.

0.1µF

MCP601R1

R2

R3

R4

VDDConnection

Device 1

Device 2

Device 3

Device 4


MCP3202

MCP3202 PRODUCT IDENTIFICATION SYSTEM

To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.

Sales and Support

Package: P = PDIP (8 lead)SN = SOIC (150 mil Body), 8 leadST = TSSOP, 8 lead (C Grade only)

Temperature I = –40°C to +85°CRange:

Performance B = ±1 LSB INL (TSSOP not available in this grade)Grade: C = ±2 LSB INL

Device: MCP3202 = 12-Bit Serial A/D ConverterMCP3202T = 12-Bit Serial A/D Converter on tape and reel

(SOIC and TSSOP packages only)

MCP3202 - G T /P

Data SheetsProducts supported by a preliminary Data Sheet may have an errata sheet describing minor operational differences and recom-mended workarounds. To determine if an errata sheet exists for a particular device, please contact one of the following:

1. Your local Microchip sales office2. The Microchip Corporate Literature Center U.S. FAX: (602) 786-7277. After September 1, 1999 (480) 786-72773. The Microchip Worldwide Site (www.microchip.com)

Please specify which device, revision of silicon and Data Sheet (include Literature #) you are using.

New Customer Notification SystemRegister on our web site (www.microchip.com/cn) to receive the most current information on our products.


MCP3202

NOTES:


MCP3202

NOTES:


Information contained in this publication regarding device applications and the like is intended for suggestion only and may be superseded by updates. No representation or warranty is given and no liability is assumedby Microchip Technology Incorporated with respect to the accuracy or use of such information, or infringement of patents or other intellectual property rights arising from such use or otherwise. Use of Microchip’s productsas critical components in life support systems is not authorized except with express written approval by Microchip. No licenses are conveyed, implicitly or otherwise, under any intellectual property rights. The Microchiplogo and name are registered trademarks of Microchip Technology Inc. in the U.S.A. and other countries. All rights reserved. All other trademarks mentioned herein are the property of their respective companies.

1999 Microchip Technology Inc.

All rights reserved. © 1999 Microchip Technology Incorporated. Printed in the USA. 11/99 Printed on recycled paper.

AMERICASCorporate OfficeMicrochip Technology Inc.2355 West Chandler Blvd.Chandler, AZ 85224-6199Tel: 480-786-7200 Fax: 480-786-7277Technical Support: 480-786-7627Web Address: http://www.microchip.com

AtlantaMicrochip Technology Inc.500 Sugar Mill Road, Suite 200BAtlanta, GA 30350Tel: 770-640-0034 Fax: 770-640-0307BostonMicrochip Technology Inc.5 Mount Royal AvenueMarlborough, MA 01752Tel: 508-480-9990 Fax: 508-480-8575ChicagoMicrochip Technology Inc.333 Pierce Road, Suite 180Itasca, IL 60143Tel: 630-285-0071 Fax: 630-285-0075DallasMicrochip Technology Inc.4570 Westgrove Drive, Suite 160Addison, TX 75248Tel: 972-818-7423 Fax: 972-818-2924DaytonMicrochip Technology Inc.Two Prestige Place, Suite 150Miamisburg, OH 45342Tel: 937-291-1654 Fax: 937-291-9175DetroitMicrochip Technology Inc.Tri-Atria Office Building 32255 Northwestern Highway, Suite 190Farmington Hills, MI 48334Tel: 248-538-2250 Fax: 248-538-2260Los AngelesMicrochip Technology Inc.18201 Von Karman, Suite 1090Irvine, CA 92612Tel: 949-263-1888 Fax: 949-263-1338New YorkMicrochip Technology Inc.150 Motor Parkway, Suite 202Hauppauge, NY 11788Tel: 631-273-5305 Fax: 631-273-5335San JoseMicrochip Technology Inc.2107 North First Street, Suite 590San Jose, CA 95131Tel: 408-436-7950 Fax: 408-436-7955

AMERICAS (continued)TorontoMicrochip Technology Inc.5925 Airport Road, Suite 200Mississauga, Ontario L4V 1W1, Canada Tel: 905-405-6279 Fax: 905-405-6253

ASIA/PACIFICHong KongMicrochip Asia PacificUnit 2101, Tower 2Metroplaza223 Hing Fong RoadKwai Fong, N.T., Hong KongTel: 852-2-401-1200 Fax: 852-2-401-3431BeijingMicrochip Technology, Beijing Unit 915, 6 Chaoyangmen Bei Dajie Dong Erhuan Road, Dongcheng District New China Hong Kong Manhattan BuildingBeijing 100027 PRC Tel: 86-10-85282100 Fax: 86-10-85282104IndiaMicrochip Technology Inc.India Liaison OfficeNo. 6, Legacy, Convent RoadBangalore 560 025, IndiaTel: 91-80-229-0061 Fax: 91-80-229-0062JapanMicrochip Technology Intl. Inc.Benex S-1 6F3-18-20, ShinyokohamaKohoku-Ku, Yokohama-shiKanagawa 222-0033 JapanTel: 81-45-471- 6166 Fax: 81-45-471-6122KoreaMicrochip Technology Korea168-1, Youngbo Bldg. 3 FloorSamsung-Dong, Kangnam-KuSeoul, KoreaTel: 82-2-554-7200 Fax: 82-2-558-5934ShanghaiMicrochip Technology RM 406 Shanghai Golden Bridge Bldg.2077 Yan’an Road West, Hong Qiao DistrictShanghai, PRC 200335Tel: 86-21-6275-5700 Fax: 86 21-6275-5060

ASIA/PACIFIC (continued)SingaporeMicrochip Technology Singapore Pte Ltd.200 Middle Road#07-02 Prime CentreSingapore 188980Tel: 65-334-8870 Fax: 65-334-8850Taiwan, R.O.CMicrochip Technology Taiwan10F-1C 207Tung Hua North RoadTaipei, Taiwan, ROCTel: 886-2-2717-7175 Fax: 886-2-2545-0139

EUROPEUnited KingdomArizona Microchip Technology Ltd.505 Eskdale RoadWinnersh TriangleWokingham Berkshire, England RG41 5TUTel: 44 118 921 5858 Fax: 44-118 921-5835DenmarkMicrochip Technology Denmark ApSRegus Business CentreLautrup hoj 1-3Ballerup DK-2750 DenmarkTel: 45 4420 9895 Fax: 45 4420 9910FranceArizona Microchip Technology SARLParc d’Activite du Moulin de Massy43 Rue du Saule TrapuBatiment A - ler Etage91300 Massy, FranceTel: 33-1-69-53-63-20 Fax: 33-1-69-30-90-79GermanyArizona Microchip Technology GmbHGustav-Heinemann-Ring 125D-81739 München, GermanyTel: 49-89-627-144 0 Fax: 49-89-627-144-44ItalyArizona Microchip Technology SRLCentro Direzionale Colleoni Palazzo Taurus 1 V. Le Colleoni 120041 Agrate BrianzaMilan, Italy Tel: 39-039-65791-1 Fax: 39-039-6899883

11/15/99

WORLDWIDE SALES AND SERVICE

Microchip received QS-9000 quality system certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona in July 1999. The Company’s quality system processes and procedures are QS-9000 compliant for its PICmicro® 8-bit MCUs, KEELOQ® code hopping devices, Serial EEPROMs and microperipheral products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001 certified.

Date post:	18-Nov-2014
Category:	Documents
Upload:	luis
View:	86 times
Download:	1 times

MCP3202

Documents