33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
The Mechanism of Electropolishingof Nb in Hydrofluoric-Sulfuric Acid
(HF+H2SO4) Electrolyte
Hui Tian*+, Charles E. Reece+, Michael J. Kelley*+
Applied Science Department, College of William and Mary, Williamsburg, VA + Thomas Jefferson National Accelerator Facility, Newport News, VA
Sean G. Corcoran## MSE Department, Virginia Tech, Blacksburg, VA
This work is supported by the US Dept. of Energy under grant DE-FG02-06ER41434
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
IntroductionElectropolishing seems to be a superior technique to treat
niobium cavity surfaces for achieving high SRF performance SRF and is selected to replace BCP for the highest gradient applications (TESLA, ILC).
The large variation of cavity performance results from the present empirical EP processes. A microscopic understanding of the basic Nb EP mechanism is yet lacking.
The application of electrochemical techniques is needed for the development of a clear picture of the exact role of each parameter involved during the EP process.
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
0 2 4 6 8 10 12 14 16 18 200
5
10
15
20
25
30
35
40
Cur
rent
den
sity
( m
A/c
m2 )
Voltage ( power supply)
T = 31.5 +/- 0.5oC Reactive area = 5.72cm2
Classical “Two-Electrodes” Set-up Is Not Enough to Identify the Local Effect on Nb EP
Nb I-Vpwrsup curve
Vpwsup: 12 ~25 V
25~5
0 m
A/ c
m2
Vpwsup= VNb+Veletrolyte+VAl
I-Vpwsup only is impossible to clearly identify the local effect on NbNb EPEP , such as electrolyte temperature, acid concentrations, viscosity and stirring.
HF: H2SO4=1:9 (volume)
Al is cathode
Nb Cavity is anode
1 r/min
Power supply
Current limited plateau
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
-4 -2 0 2 4 6 8 10 12 14 16 18 200
5
10
15
20
25
30
35
40
Cur
rent
den
sity
( m
A/c
m2 )
Voltage ( vs. MSE )
T = 31.5 +/- 0.5 oC Ref electrode is nearby Nb .Reactive area = 5.72 cm2
Three-Electrode-Setup Improved Electrochemical Characterization of EP
Enables enlightening study of temperature, flow, and composition dependent effects (electrolyte) in detail.
Separating impacts of individual components in EP system.
Cathode: Al I-V
Anode: Nb I-VExample:VPwrSup = 15 V Vcathode : ~ 4 V Velectrolyte: ~ 2 V Vanode:~ 9V
Not Power Supply Voltage
MSE : Mercury / MercurousSulfate Reference Electrode
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
0 2 4 6 8 10 12 14 16 180
20
40
60
80
100
21.3 oC26.3 oC
33.5 oC
45.6 oC
54.6 oC
1 54.6 o C; 3 33.5 o C 2 45.6 o C; 4 26.3 o C 5 21.3 o C
Ano
de C
urre
nt D
ensi
ty (
mA
/cm
2 )
VNb( V ) (vs. MSE )20 30 40 50 60
0
20
40
60
80
100
Ano
de C
urre
nt D
ensi
ty (m
A/c
m2 )
Temperature ( oC )
SNb/ SAl = 10 : 1
Anode Current Density Strongly Depends on Local Temperature
Past studies identified 25-35 ºC for best EP gloss on Nb surface
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
For cavity EP,For cavity EP, electrolyte also serves as the process coolant. Unstable temperatures is expected and particularly hot in no-flow condition and higher heat flux where flow rate is high. NonNon--uniform polishing is uniform polishing is expected.expected.
The output flow temperature is in “within specs”(~35ºC), but the actual cavity wall temperature is out of control (40~56ºC).
R. Geng et. al, internal talk
C. Reece et. al, SRF 2007
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
0.2 0.4 0.6 0.8 1.00
5
10
15
20
25
23.44 mA/cm2
Concentration of HF ( by volume )
5.27 mA/cm2
Anode Current Density Varies Linearly with HF Acid Volume Concentration
0 2 4 6 8 10 12 14 16 180
5
10
15
20
25
30
35
40
0.2:9.8
0.4:9.6
0.6:9.4
0.8:9.2
Ano
de C
urre
nt D
ensi
ty (
mA
/cm
2 )
Voltage ( V ) (vs. MSE)
Area ratio of Nb/Al =10:1T = 31.5+/- 1.5 oC
1:9
HF acid loss may be expected due to evaporation and chemical reaction during process. The understanding of the detailed role of HF involved during the EP process requires further electrochemical studies.
MHF: decreases 80% ;
MH2O: decreases 32%
MH2SO4: increases 8.8%
decreases 78%
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
-2 0 2 4 6 8 10 12 14 16 18 200
10
20
30
40
50
60T = 14 +/- 1oCHF: H2SO4: H2O (by volume)1 : 9 -fresh mixed acid1 : 9 : 0.51 : 9 : 21 : 9 : 31 : 9 : 5
Cur
rent
den
sity
( mA
/cm2 )
Voltage (V) vs. MSE
MHF: decreases 33.6%
MH2SO4: decreases 33.4%.
MH2O: increases 235%0 1 2 3 4 5
0
5
10
15
20
25
1
T = 14 +/- 1oC1: Fresh mixed 1:9 eletrolyte + VH2O
2: * Used 1:9 eletrolyte+ VH2O
* Fresh mixture exposured under chemical hood for 5 hrs)
Ano
de P
late
au C
urre
nt D
ensi
ty (
mA
/cm
2 )10
V v
s. M
SEDifferent volume ratio of H2O
2
Additional Volume H2O slightly Increases Anode Current Density
Anode current density slightly increases with additional volume of H2O (38~42%); Compare curve 1 and curve 2( after 5 hrs exposure under chemical hood), current density decreases 30% -HF evaporation
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
0 2 4 6 8 10 12 14 16 18 200
4
8
12
16
20
24
28
32
Area ratio of Nb/ AlT = 20.5 +/- 1.3 o C Cathode area (Al) kept unchanged ( 2.6cm 2 )1 : 1 ; 2 : 1 ; 4 : 16 : 1 ; 8 : 1 ; 10 : 1
Ano
de c
urre
nt d
ensi
ty (m
A/c
m2 )
VNb (V) vs. MSE
a
0 2 4 6 8 10 12 14 16 18 200
4
8
12
16
20
24
28
Area ratio of Nb/ AlT = 19.7 +/- 1.7 o C Anode area(Nb) kept unchanged ( 2.6 cm 2 )1 : 1 ; 1: 2 ; 1 : 41: 6 ; 1 : 8 ; 1 : 10
A
node
cur
rent
Den
sity
( m
A/c
m2 )
VNb( V ) vs. MSE
b
Anode Current Density Does Not Depend on the Relative Area of Anode and Cathode
Anode current density remain constant
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
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Current-Limited Plateau of Nb EP:Mass Transport Mechanism Has Been Unknown
Mass transport limitation for anodic dissolution are generally believed to be responsible for electropolishing, but micro-polishing (brightening) only occurs when the plateau is the result of diffusion-limitation alone.
Possible mass transport limiting species proposed -D. Landolt, Electrochemica Acta, Vol . 32(1)
I) Metal Ions (Mn+aq) II) Acceptor anion (A-) III) H2O
CstCst
Cst
Maq
Maq
MAy
Con
cent
ratio
n
diffusion layerdiffusion layer diffusion layer
)()()()( xCxxCD
RTFz
xxCDxJ iii
iiii υφ
+∂
∂−
∂∂
−=Nernst-Planck equation
Understanding of mass transport mechanism requires further electrochemical study-EIS.
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
Rs: electrolyte, temperature.
What is Electrochemical Impedance Spectroscopy?
Rp: polarization/charger transfer resistor
Cdl : double layer capacitor of electrode surface
Rwarburg: diffusion resistor
Rs: solution resistor
Nb Ref. Elec.Possible equivalent circuit of Nb-acid interface during EP
High Frequency Nyquist Plot
222
2
222 11 pdl
pdls
pdl
p
RCRC
jRRC
RZ
ωω
ω +−+
+=
ReZ
-ImZReZ -ImZ
Rp: temperature, concentration of reaction products, potential.
Rw: the frequency of potential perturbation
Cdl: electrolyte, temperature, potential, oxide layer
electrode roughness
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
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Zreal (Ω)Rs remains constant
-Zim
ag(Ω
)EIS Study of Constant Current Density
0 2 4 6 8 10 12 14 16 180
5
10
15
20
25Area Ratio of Nb/Al = 10 : 1 (Nb : 26.035 cm 2; Al : 2.6035 cm 2)Ref electrode & Thermal Couple nearby Nb ( < 5 mm ) T = 21.5 o C
Ano
de C
urre
nt D
ensi
ty (
mA
/cm
2 )
Anode Potential ( V )
Rp increases with the potential
0.2 Hz
200 KHz
1.01 KHz =ωmax=1/RpCdl
0.2 Hz
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
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EIS Study of Different Flow Rates
Zreal (Ω)
-Zim
ag(Ω
)
Static (triangle) vs. Agitation ((dot)dot)flow rate ~ 4 ~ 5 cm/sec
T = 9.2± 0.1 ºC
Rs @ at different flow condition remains as constant
3V6V
Static
Flow
Rp decreases with increasing flow
200 KHz
0.2 Hz
0.2 Hz0.2 Hz
0.2 Hz
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
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3 4 5 6 71.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
Cap
acita
nce (μ
F )
Potential ( V )
T = 9.0 +/- 0.2 oC Without agitationwith agitation ( flow rate : v ~ 4 ~ 5 cm/sec)
What We have Learned from EIS Studies?
3 4 5 6 76
8
10
12
14
16
18
20
22
24
T = 9.0 +/- 0.2 oC Without agitationwith agitation ( flow rate : v ~ 4 ~ 5 cm/sec)
Pola
rizat
ion
resi
stan
ce (o
hms)
Potential ( V )
The change of Rs, Rp and Cdl at the different potential regions and flow condition are used to identify the possible mass transport mechanism
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
Constant Rs at different potential regions and flow condition rules out the “porous salt film” model.
Rp increase at different potential regions is inconsistent with the “adsorbatesacceptor” model.
Cdl decrease at different potential regions & Cdl increase at different flow conditions are consistent with the “compact salt film” model.
EIS Indicates “Compact Salt Film” Model
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
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The Diffusion-Limited Access of F- To the Salt Film Produces Best Polishing
Sulfuric acid tends to anodize the Nbunder polarization potential producing the "compact salt film”- “Nb2O5”.
HF acid tends to dissolve the Nb oxide under kinetic control with the "at the surface" concentration of F-
.
F- concentration “at the surface” is limited by how fast it diffuses through the electrolyte ( ~diffusion layer).
The local gradient in F-
concentration produces the desired polishing action.
“Nb2O5”
NbBulk Electrolyte
Diffusion Layer(~ um)
Compact Salt Film(~ nm)
F -
%
F -
%
Distance
DistanceLocal temperature, flow (stirring) & electrolyte composition affect the local F- gradient.
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
EIS Study for ImplicationsSurface Optimization & Quality Control
Preliminary studies show that there is a signature difference in EIS responsebetween rough & smooth surfaces. Potentially useful for on-line process feedback
Mechanical ground sample
Light BCP ( 30 μm removal) 30 mins EP @ 31ºC
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
Summary and Future Work
Quantify the scale-dependant smoothing effects of niobium EP as a function of temperature, electrolyte composition, and flow conditions. Specify optimum processing protocol. Build electrochemical understanding to better appreciate conditions that contribute to smoothing.Identify useful on-line process monitors for process assurance and progress tracking – EIS and etc?Guide the evolution of cavity treatment protocols toward well engineered and controlled conditions for cavity productions.
The first use of “three-electrode-setup” reveals that Nb EP strongly depends on the local electrolyte temperature and HF/H2SO4 volume ratio.
High frequency impedance data provide strong evidence for the presence of a compact salt film (Nb2O5) in the current-limited plateau region.
The results suggest that the diffusion-limited access of the F- anion to the salt film surface limits the local reaction rate, creates the plateau and yields the micropolishing.
33thth international workshop on thin film & new ideas for pushing thinternational workshop on thin film & new ideas for pushing the limits of RF Superconductivitye limits of RF Superconductivity
JJ--lab, Newport News, VA July 22lab, Newport News, VA July 22--25, 200825, 2008
Thank YouThank You