+ All Categories
Home > Documents > Methodology Development for Counterfeit Component...

Methodology Development for Counterfeit Component...

Date post: 06-Mar-2018
Category:
Upload: phamhanh
View: 222 times
Download: 4 times
Share this document with a friend
31
2013 International Conference on Electronic Packaging Technology (ICEPT 2013) August 11 August 14, 2013, Dalian, China Methodology Development for Counterfeit Component Mitigation Present by Jeffrey Lee, iST Martin Huehne, Celestica, Thailand Jeffrey Lee, iST-Integrated Service Technology Inc., Taiwan Harrison Miles, Corelis, USA Mark Schaffer, iNEMI, Virginia, USA Email: [email protected]
Transcript
Page 1: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

2013 International Conference on Electronic Packaging Technology (ICEPT 2013)

August 11 – August 14, 2013, Dalian, China

Methodology Development for Counterfeit

Component Mitigation

Present by Jeffrey Lee, iST

Martin Huehne, Celestica, Thailand

Jeffrey Lee, iST-Integrated Service Technology Inc., Taiwan

Harrison Miles, Corelis, USA

Mark Schaffer, iNEMI, Virginia, USA

Email: [email protected]

Page 2: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging
Page 3: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Counterfeit Components Assessment

Project Members

Page 4: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

What Counterfeit Components Are?

A counterfeit component is a fraudulent part that has been

confirmed to be a copy, imitation, or substitute that has been

represented, identified, or marked as genuine, and/or altered by a

source without legal right with intent to mislead, deceive, or

defraud.

Definition is from Draft SAE 5553 and 6081

Page 5: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Incident Report Data for 2012

• Total of separate verified incidents of counterfeit-part reported 1,336 for transactions of over

834,079 parts that were actually purchased.

• Figures for purchased parts are considered a conservative because purchased parts reflect only

a subset of all reported incidents.

Source: HIS Parts Management, October 2012

Page 6: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Sampling of Counterfeit Device Categories*

1. Cloning – copy that appears operationally and functionally

equivalent

2. Product “skimming”, subcontractors, or second source

suppliers

3. Disposal of scrap and rejects

4. Devices used as qualification samples

5. Reclamation and reuse of component

6. Re-branding and/or Re-marking

7. False claims of conformity to industry certifications (e.g.

RoHS)

8. Devices containing embedded malicious malware - “trojans”

(e.g. flash device with “trojan” software)

Page 7: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Why CC Is an Issue/Why Do You Care?

• 2 problems

– Top line problem from biz perspective – how brand is respected

– Bottom line concern – warranty costs, RMA - impact on profit

• Liability issues

– Expenditure of resources (man-hours) to support field

accidents/failures for products that significantly impact human safety

– Public Safety

Page 8: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Impact of CC in Electronics

• Numbers!

– Field service cost in US is over $1100/incident

– 10 million batches of electronics bought worldwide and 1000 are counterfeit

– The cost of screening parts: To screen a typical lot of 200 or less

components cost between 800 $US to 2,000 $US.

– what are high use, hurting everyone

• DDRx memory, FLASH, SSD, FPGA (field programmable gate arrays)

• Example in FBGA based on experience.

10 batches were bought from brokers (all Xilinx parts), with a total number

of 3667 parts.

2 batches were found to be counterfeit or at least highly suspect, with a total

number of 975 parts.

• Limited Supply of high demand market products and end-of-life

products

– The higher the demand for a product, the more attractive it becomes for

counterfeiting.

Reference : TSIA (Technology Services Industry Association), December 15, 2011

Page 9: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Counterfeiting Components

• Business practices that lend themselves to increased

counterfeit activity, such as: – Lead time reduction or

– Demand pull in,

– Poor planning,

– Multiple emergency supply requests giving a false level of demand etc

• Part of the roadmap should be to address these practices – Either by iNEMI or

– By some other group like the SIA who may be better placed or already

working on that

Page 10: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Industry Sector Desired Product Life-Cycles

Industry Sectors Desired Product Life-cycle

Avionics (Civil) 10 to 20 years

Avionics (Military) 10 to 30 years

Automotive Cars and Trucks 10 to 15 years (warranty)

External Equipment 5 to 10 years

Internal Equipment 7 years

Infrastructure

Equipment

10 to 30 years

Data Center

Equipment

7 to 10 years

High End Servers 7 to 10 years

Industrical Controls 7 to 15 years

Appliances 7 to 15 years

Cell Phones 18 to 36 months

Laptop Computers 24 to 36 months

Desktop Computers 24 to 60 months

Consumer & Portable

Office & Large Business Systems

Netcom ( Telecom & Data)

Medical

Aerospace & Defense

Actual Situation

None of these product sectors is immune from the introduction of counterfeit

components; however, each has its own set of unique requirements.

It is not clear that there is a "one size fits all" solution due to the variations in

requirements.

Page 11: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

What Is this iNEMI Project Doing?

• Develop a methodology to evaluate or assess the risk of

counterfeit use.

• Develop a methodology to evaluate or assess the

aggregated risk of untrusted sources of supply.

• Develop an assessment / mitigation strategy which includes

a methodology to estimate long term cost of ownership.

Page 12: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Project Is / Is Not Analysis

This Project IS: This Project IS NOT:

Project 1: Counterfeit Components - Assessment Methodology and Metric Development

Identify any related research or development within

the industry and academic communities Development of a specific standard(s)

Review and tabulate successes that have worked in

the past (BKM/BKP) Biased towards specific brokers,

suppliers, geographies, or market

segments Develop a methodology to evaluate or assess the risk

of counterfeit use

Assess the aggregated risk of untrusted sources of

supply Repeat of prior or existing work

Develop an assessment / mitigation strategy

Long term cost of ownership

Not focused on quality issues or

standards

Define / develop a metric that can identify the scope of

the problem Missing piece is the history (e.g.,

storage conditions, …) Assess the effectiveness of the methodologies

developed

Review and finalize methodology

How to capture quality information /

data Focused on those attributes which are of most value

to supply chain and the participating project members

Applicable to multiple spaces across the supply chain

Page 13: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Supply Chain Assessment

• iNEMI wants to complement any activities that are being

worked

• Possible Activities: – Assess types of threats and how parts traceability can help mitigate the

risks

– Develop a roadmap to prioritize needs for addressing the threats

– Assess and document industry needs in order to develop a strategy • Increase product/parts/material traceability

• Increase reliability of product authentication information in the supply chain

• Ease process of product authentication for new and legacy product, components,

and materials in the electronics industry supply chain

– Investigate types of information needed for product authentication

– Review existing supply chain data exchange standards to assess the

ability to integrate standards-based unique identification codes

Page 14: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Electronic Manufacturing Workflow Diagram

Key sectors of the electronics supply chain

Wafer Manufacturers

Chip Manufacturers

Board Manufacturers

System Manufacturers

After Market Sales and Refurb Support

Disposal/Recycle

Page 15: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Board Manufacturer Cluster

Wafer

Manufacturer

Raw Material

Manufacturer

Chip

Manufacturer

Mechanical Part

Manufacturer

Board

Manufacturer

System

Manufacturer

After Market

Sales and

Refurb

Support

Recycle/

Disposal

Board

Manufacturer

Chip or Mechanical

Part Manufacturer

Non-

Franchised

Distributor

Broker/

Independents

Franchised

Distributor

System

Manufacturer

Recycle/

Disposal

Excess Inventory

Recycled

Inventory

New

Inventory

A chip mfg relative to board mfg is an open market entry strategy. Multiple channel

Marketing of their product. Driven by economy of scale of the factory/fab.

Scrap

Consigned

Component

s

A

A

Page 16: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Calculating Risk of Counterfeit by Risk Assessment

Calculator

Page 16

Page 17: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

• The profile of the product in question – If a product is in high demand and also the original supply is near end of life, then the product profile

risk of counterfeit is highest.

• The inputs or characteristics of the supplier and supply line – The inputs risk is highest where the supplier is a broker with no controls who has previously supplied

confirmed counterfeit product and cannot confirm the origin of the product in question. Conversely,

the inputs risk is lowest when the product is coming directly from the OCM, there are strong

counterfeit mitigation procedures in place, and there is no know history of counterfeit supply.

• The processes used on the product to deter counterfeit use – Where a product requires a large capital investment, is easy to authenticate, and uses a high level of

counterfeit controls, the process risk of counterfeit use is low. On the other hand where there is little

or no investment required to make the product, validation is difficult, and there are no special

counterfeit controls in place, the process risk of counterfeit use is highest.

• The outputs or channel characteristics – The outputs risk is highest when the sales channel is unknown; there is no control or traceability on

excess inventory, prototypes, reworks or scrap; and the end customer is unknown. In contrast, where

the end customer is well known; the sales channel is well defined; and the excess inventory,

prototypes, reworks and scrap are well controlled, the outputs risk is lowest.

Four key elements for the risk assessment of

counterfeit :

Page 18: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Risk Calculator Domains

Page 19: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Counterfeit Detection Method

Minimum Inspections for

receiving parts

Detailed Analytical

Inspection

Non-destructive analysis

Techniques

Optical inspection with stereo

microscope

Scanning acoustic

microscopy

X-Ray Inspection XRF analysis

Electrical Test Functional Test

Gene Test

Destructive Analysis

Techniques

Solvent test Cross sectioning and

microscopic inspection

Decapsulation Test SEM-EDX

ICP/OES

GC/MS

UV-vis spectroscopy

FTIR spectroscopy

Ion chromatography (IC)

Incoming inspection for counterfeit parts 1st stage: Procedures that anyone can execute to provide the minimum level of protection.

2nd stage : Procedures that require more analytical techniques utilizing specialized equipment

and expertise.

Page 20: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

• Optical Inspection under a stereo microscope (2D or 3D OM).

First Stage with Non-destructive analysis

Comparison of package markings on IC Package

Examples of package modification indicators

Page 21: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

• X-ray inspection

First Stage with Non-destructive analysis

Abnormal wire bonding is found

Bonding pad comparison

One can see the ink mark on the outside

of the package but X-ray imaging reveals

reverse polarity.

Page 22: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

First Stage with Destructive analysis

Solvent test

Marking confirmation with acetone.

De-capsulation test

Device name can be checked after decapsulation

Your IC

Page 23: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

• Scanning Acoustic microscopy (C-SAM or TSAM)

2nd Stage with Non-destructive analysis

C-scan of BGA with severe delamination

XRF Analysis (EDXRF) for identifying RoHS substances

Page 24: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

2nd Stage with Non-destructive analysis

Electrical / Functional test

A.C.T

A.C.T(Auto Curve Tracer)

Page 25: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

2nd Stage with Destructive analysis

FTIR spectroscopy

ICP/OES

UVvis spectroscopy

Page 26: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

2nd Stage with Destructive analysis

Ion chromatography (IC) GC/MS

Secondary ion mass spectrometry (SIMS)

Page 27: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Note: Pt coating for SEM inspection

Spectrum P Ni Cu Sn Pt Total

P1 100.00 100.00

P2 15.87 73.21 10.93 100.00

P3 17.23 62.29 20.48 100.00

P4 16.40 66.78 16.82 100.00

P5 7.34 85.74 6.92 100.00

P6 96.18 3.82 100.00

Solder ball cutting

BEI image SEM-EDX

2nd Stage with Destructive analysis

Page 28: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

2nd Stage with Destructive analysis

• Cross sectioning and SEM microscopic inspection

Page 29: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Cross Section with Argon Beam

2nd Stage with Destructive analysis

Page 30: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

Atomic Force Microscopy (AFM)

Conductive Atomic Force Microscopy (CAFM)

2nd Stage with Destructive analysis

Page 31: Methodology Development for Counterfeit Component Mitigationthor.inemi.org/webdownload/Pres/ICEPT_2013/Methodology_Dev_for... · 2013 International Conference on Electronic Packaging

• The project team will consider additional activities that would constitute

follow on work (Phase 2 activities) and will develop an extension of this

effort into a separate project. The development of protocol(s) to assist in

identifying the pedigree of parts in the supply chain would fall outside the

scope of this initial project and would be one possibility for Phase 2. This

would involve definition of protocols for tracking the life of components

such that a pedigree is developed for each part that identifies when,

where, and under what conditions it was manufactured and what paths it

has taken within the supply chain.

Ongoing Activity

Page 31


Recommended