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Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

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The Road to Tin Whisker Detection Michael Weber SAIC Intern Purdue Technology Center August 10, 2010
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Page 1: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

The Road to Tin Whisker Detection

Michael WeberSAIC Intern

Purdue Technology CenterAugust 10, 2010

Page 2: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

Fisher Scientific Micromaster Microscope

Canon G10 Camera USB Digital Microscope Fiber-Optic Light Source • 360 Ring lamp• Bifurcated light guide

7 In. Tile Wet Saw Hand Dremel tool

Previous Equipment

Page 3: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

Fisher XDAL X-ray Fluorescence Spectrometer

• Perform elemental analysis of samples; returns weight percent of elements

• Design programs to calculate thickness of layers

• Automated arrays of inspection points• Generate tabular and graphical results

New Equipment, cont’d

Page 4: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

New Equipment, cont’d

Page 5: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

Nibbler• Designed for soft sheet metal• Cuts boards well but poor maneuverability

New Equipment

Page 6: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

Diamond Tech DL3000 XL Band Saw• Variable speed, diamond-tipped blade• Integrated water pump with filters

New Equipment, cont’d

Page 7: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

Hitachi TM-1000 Tabletop SEM

• 20x – 10,000x magnification; 15 kV voltage

• 70 mm maximum specimen size• Integrated software for all image

manipulation, capture, editing• Acrylic enclosure with filter-fed air for

clean environment

New Equipment, cont’d

Page 8: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

New Equipment, cont’d

Page 9: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

New Equipment, cont’d

Page 10: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

Well-documented data base of inventory; backlog of parts still needed to be examined

Instruments with sufficient capabilities for elemental analysis, cutting, and inspection

Developed routine for inspection (Logging, XRF, component extraction, SEM)

Conclusions

Page 11: Michael Weber SAIC Intern Purdue Technology Center August 10, 2010.

Continue to search for parts; need a more reliable Pb-free source

Refine methods; namely a method to clean debris from boards without removing whiskers

Continue examination with possible acceleration of commercial whiskers

Path Forward


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